CN217485748U - Conductive connecting sheet and antenna test system - Google Patents

Abstract

The application provides a conductive connecting sheet and an antenna test system, wherein the conductive connecting sheet comprises a main body part and a test part, the main body part is used for being in contact with and electrically connected with a connecting point of an antenna of electronic equipment, and the connecting point is arranged on the side wall of a functional structure of the electronic equipment; the rear end part of the testing part is connected to the main body part, the front end part of the testing part bends and extends towards a plane far away from the main body part, and the front end part of the testing part is used for being in contact with the testing probe and electrically connected. The conductive connecting sheet and the antenna testing system provided by the embodiment of the application enable the probe to be conveniently in electrical contact with the surface of the conductive connecting sheet arranged on the side wall of the functional structure, so that the performance of the antenna can be tested conveniently.

Description

Conductive connecting sheet and antenna test system

Technical Field

The application relates to the technical field of antenna testing, in particular to a conductive connecting sheet and an antenna testing system.

Background

With the development of science and technology, electronic devices with communication functions, such as mobile phones and tablet computers, are increasingly widely used, and antennas are the main components of the electronic devices for realizing the communication functions. The antenna commonly used at present is a middle frame antenna, which takes a metal middle frame as a radiator and has the advantages of large radiation area, compact structure and the like. In the related art, a spring (gold-plated stainless steel sheet) is generally soldered to a connection point such as a feed point/a ground point of an antenna, and the connection point is connected to a main board through the spring, so as to improve chemical stability of an electrical contact surface between the antenna and the main board.

The metal middle frame generally includes a metal frame and a metal middle plate fixed in the metal frame, and the connection point and the reed of the middle frame antenna may be disposed on the surface of the middle plate, and in order to facilitate the connection of the antenna with the circuit board, as shown in fig. 1, the connection point and the reed of the middle frame antenna may also be disposed on the inner side wall of the frame.

In order to improve the product yield of the electronic equipment, the performance of the antenna of the electronic equipment is usually detected before leaving a factory, specifically, the middle frame can be placed on a test bench, and a probe is used to contact the surface of the reed downwards from the top, so that the middle frame antenna is tested.

However, when the middle frame is placed on the test stand, the spring pieces provided on the inner side walls of the frame face the inner circumference of the frame, not the upper side, so that the probe cannot touch the surface of the spring piece downward from the top, and thus it is inconvenient to test the antenna.

SUMMERY OF THE UTILITY MODEL

The application provides a conductive connection piece and antenna test system, makes the probe conveniently with establish the surface electrical contact of the conductive connection piece on the functional structure lateral wall to more be convenient for test the performance of antenna.

In a first aspect, embodiments of the present application provide a conductive tab, which includes a main body portion and a testing portion.

The main body part is used for contacting and electrically connecting with a connection point of an antenna of the electronic equipment, and the connection point is arranged on the side wall of the functional structure of the electronic equipment; the rear end part of the testing part is connected to the main body part, the front end part of the testing part bends and extends towards a plane far away from the main body part, and the front end part of the testing part is used for being in contact with the testing probe and electrically connected.

The main body part and the testing part are both of sheet structures, and the thickness range of the sheet structures can be 0.05-0.15 mm or other thickness ranges.

The main body part and the test part can be of an integrated structure formed by forging, turning, bending and forming and other integrated manufacturing processes, so that the processing process and the structure of the conductive connecting sheet are simpler, the structural reliability is better, the use is more convenient, the structural stability of the conductive connecting sheet is better, the situation of fracture and the like is not easy to occur, and the reliability and the accuracy of the test are higher.

The test part may be connected to the main body part by a connection method such as bonding, welding, or clamping, and the application is not limited to a specific connection method of the test part and the main body part.

In the embodiment of the application, the main body part can be used for being welded with a connecting point of an antenna of electronic equipment or being adhered through conductive adhesive, so that the main body part is in contact with and electrically connected with the connecting point of the antenna. The connection point of the antenna may be a feed or a ground point of the antenna.

The functional structure may be a middle frame of the electronic device, specifically, the functional structure may be a side frame of the middle frame, and the functional structure may also be a middle plate of the middle frame. The functional structure may also be other structures capable of providing a connection point of the antenna, such as an antenna bracket, and the application is not particularly limited.

The side wall of the functional structure faces the inner or outer periphery of the electronic device, but not the front or rear side of the electronic device, so that the connection point of the antenna provided on the side wall of the functional structure also faces the inner or outer periphery of the electronic device, and the conductive connection piece in contact with and electrically connected to the connection point of the antenna also faces the inner or outer periphery of the electronic device.

The connection points of the antenna may in particular be arranged on the inner side wall of the functional structure in order to be electrically connected with a circuit board arranged in the housing of the electronic device.

The front end of the testing part bends and extends towards the plane far away from the main body part, the rear end of the testing part bends and extends towards the plane far away from the main body part, and the front end and the rear end of the testing part are coplanar, so that the front end of the testing part also bends and extends towards the plane far away from the main body part. That is to say, the whole test portion is planar sheet structure, and the whole test portion is whole to being far away from the plane of main part and is buckled the extension. In this case, both the front end portion and the rear end portion of the test portion may be used for contact with the test probe to be electrically connected. The embodiment can make the structure of the testing part simpler, so that the production and the processing of the conductive connecting sheet are simpler and more convenient.

The front end of the testing part is bent and extended towards the plane far away from the main body part, or the rear end of the testing part is coplanar with the main body part, and the front end of the testing part is bent and extended towards the plane far away from the main body part.

In some cases, after the main body part is connected to the connection point of the antenna, there may be a distance between the main body part and the edge of the sidewall of the functional structure, and in this case, the rear end of the testing part may extend to the edge of the sidewall of the functional structure, so as to be flush with the top edge of the sidewall of the functional structure or be higher than the top edge of the sidewall of the functional structure, so that the front end of the testing part can extend to one side of the sidewall of the functional structure, so that the testing probe 10 contacts with the front end of the testing part, and the antenna is tested conveniently.

When the rear end of the testing part extends towards the top edge of the side wall of the functional structure and is higher than the top edge of the side wall of the functional structure, if the front end bends towards one side where the side wall of the functional structure is located, a gap can exist between the front end and the top edge of the side wall of the functional structure, namely the front end is not in contact with the functional structure, and therefore damage to the surface of the functional structure can be reduced. In this case, a support member may be additionally provided to support the front end portion of the test section so that the test probe is reliably contacted with the front end portion; alternatively, the tip portion may not be supported, so that the test probe 10 can be electrically connected to the tip portion in contact therewith.

The utility model provides a conductive connection piece, because the back end connection of test portion is on the main part, the front end of test portion is to keeping away from the plane at main part place and buckling the extension, thus, when the main part contact and the connection point department of the antenna of electricity on the functional structure lateral wall, the front end of test portion can buckle the extension to the planar outside in lateral wall place of functional structure, thus, after placing electronic equipment on the testboard, the front end of test portion can face the upside, when the test probe is from the downward lower needle in top, can contact the front end of test portion towards the upside very conveniently, thereby make the probe can conveniently with establish the surface electrical contact of conductive connection piece on the functional structure lateral wall, be more convenient for test electronic equipment's antenna, and the detection efficiency is improved.

In addition, since the lower probe position of the test probe is the front end portion of the test section, the test probe does not directly contact the functional structure or other portions of the electronic device, and therefore the structure of the electronic device is not affected. And the contact conductive connecting sheet detects the antenna, namely the connecting point of the contact antenna detects the antenna without influencing the detection accuracy, and the glue overflowing part, the plastic part and the uneven part on the functional structures such as the middle frame do not influence the detection accuracy.

In an alternative design, the test portion is provided at an edge of the body portion.

The testing part is arranged at the edge of the main body part, so that the whole structure of the conductive connecting sheet is simpler, and the production and the manufacture of the conductive connecting sheet are more convenient. In addition, when the main part of the conductive connecting sheet contacts with the connecting point of the antenna on the inner side wall of the functional structure, if the testing part is arranged at the edge of the main part, the testing part can extend to the periphery of the side wall of the functional structure more easily, so that the testing is more convenient.

In an alternative design, the conductive tab further includes: the testing device comprises a main body part and a testing part, wherein the main body part is provided with a testing hole, the testing part is arranged on the main body part, the testing part is arranged on the edge of the main body part, a first pre-pressing line is arranged between the testing part and the main body part, and the first pre-pressing line is convenient to separate from the testing part and the main body part.

The handle portion may be coplanar with the main body portion, or may be located on a different plane from the main body portion, and the present application is not particularly limited. When the handle part and the main body part are coplanar, the structure of the conductive connecting sheet is simpler, and the manufacture is simpler and more convenient.

The testing part and the handle part are arranged on the edge of the same side of the main body part, so that the conductive connecting sheet is more convenient to process and manufacture. In addition, because there is great space outside the outer fringe of functional structure upside, the upside of functional structure is about to the upside of electronic equipment back functional structure of keeping flat, when the electrically conductive connection piece of installation, because test section and handle portion establish on the edge of main part with one side for handle portion and test section homoenergetic stretch out from the edge of functional structure upside, make handle portion and test section all difficult and other components and parts in the electronic equipment take place to interfere during the assembly, the installation and the test of the electrically conductive connection piece of being more convenient for.

In an alternative design, the handle portion is a U-shaped structure, the open end of the handle portion is connected with the main body portion, and the testing portion is arranged in the U-shaped structure.

Because the handle portion needs the bigger bit that sets up usually to in the gripping, and the little that the test portion can set up, the size of test portion can satisfy carry out the demand of good contact with the test probe can, so, the test portion can be established in the U-shaped structure, and this embodiment is located the test portion in the U-shaped structure, can be so that the structure of conductive connection piece is compact enough, reasonable.

In an alternative design, the handle portion is coplanar with the body portion, and the test portion is provided on an edge of the handle portion remote from the body portion.

In some cases, the main part is connected back on the tie point of antenna, and the main part probably has the distance with the edge of the lateral wall of functional structure, and under this condition, handle portion can extend to the edge of the lateral wall of functional structure to with the edge parallel and level of the lateral wall of functional structure or be higher than the edge of the lateral wall of functional structure, thereby make the front end portion of test portion can extend to the lateral buckling at the lateral wall place of functional structure, so that the front end portion contact of test probe and test portion, thereby be convenient for test the antenna.

In an optional design, a second pre-pressing line facilitating separation of the testing part and the main body part is arranged at the joint of the testing part and the main body part.

The second prepressing line at the joint of the testing part and the main body part can be set by referring to the first prepressing line at the joint of the handle part and the main body part, and the second prepressing line is not described again here.

When the handle part and the testing part are both directly connected to the edge of the main body part, a first pre-pressing line and a second pre-pressing line can be respectively arranged at the joint of the handle part and the main body part and the joint of the testing part and the main body part. The first prepressing line and the second prepressing line can form a line so as to be convenient for stamping to form each prepressing line.

When the handle part is directly connected to the main body part and the testing part is directly connected to the handle part to realize indirect connection with the main body part, a first pre-pressing line is arranged at the joint of the handle part and the main body part, and the first pre-pressing line is the second pre-pressing line at the joint of the testing part and the main body part.

This embodiment is through setting up the line ball in advance in the junction of test portion and main part, after installing the main part in the junction of antenna department, can conveniently, swiftly tailor test portion along the line ball in advance to accord with the design requirement.

In an alternative design, the bending angle α of the front end portion of the test section with respect to the main body portion ranges from 80 ° to 0 °.

When the electronic device is placed on the placing platform, the side wall of the functional structure is generally vertical upwards, and when the bending angle alpha of the front end part of the testing part relative to the main body part can be 80-100 degrees, the front end part of the testing part can be towards the upper side or inclined towards the upper side, so that the testing probe is more convenient to contact with the testing part when being inserted from the top, and the testing is more convenient.

In an alternative design, the front end portion has a length and width that are both no less than 1.2 millimeters.

Since the diameter of the test probe of the test system is about 1 mm, in order to make the test probe contact the front end of the test portion well and to ensure the test accuracy, when the test probe contacts the front end of the test portion, the tip of the test probe should be located as far as possible inside the front end of the test portion. This embodiment is because the length and the width of the front end portion of test portion are all not less than 1.2 millimeters, can make the syringe needle of test probe can be located the inboard of the front end portion of test portion better, has guaranteed the good contact of test probe with the front end portion of test portion better, has improved the rate of accuracy of test.

In a second aspect, an embodiment of the present application further provides an antenna testing system, including:

a conductive tab according to any of the first aspect;

a test probe for contacting and electrically connecting with the test portion of the conductive connection sheet;

a data analyzer in communication with the test probe.

In an alternative design, the test system further includes:

and the supporting surface of the supporting piece faces the lower needle direction of the test probe and is used for supporting the test part.

In an optional design, the supporting member is a clamp for clamping an electronic device to be tested, a frame of the electronic device to be tested, or a middle plate of the electronic device to be tested.

Because the antenna test system comprises the conductive connecting sheet, the antenna test system has the same technical effect as the conductive connecting sheet, and the description is omitted here.

Drawings

Fig. 1 is a schematic structural diagram of an antenna test system in the related art;

fig. 2 is a schematic view of a structure of a conductive connection pad in the related art;

fig. 3 is a schematic structural diagram of an electronic device in an embodiment of the present application;

FIG. 4 is an exploded schematic view of the electronic device shown in FIG. 3;

FIG. 5 is a schematic structural diagram of an example of a conductive connection pad provided in an embodiment of the present application;

FIG. 6 is a cross-sectional view of the conductive tab shown in FIG. 5 taken from perspective A-A;

FIG. 7 is a schematic structural diagram of another example of a conductive connection pad provided in an embodiment of the present application;

FIG. 8 is a cross-sectional view of the conductive tab shown in FIG. 7 taken from perspective B-B;

fig. 9 is a schematic structural diagram of an example of an antenna test system according to an embodiment of the present application;

FIG. 10 is an enlarged partial view of the antenna test system shown in FIG. 9 at section C;

FIG. 11 is a schematic diagram of another implementation of the structure shown in FIG. 10;

fig. 12 is a schematic structural diagram of another example of an antenna test system provided in an embodiment of the present application;

fig. 13 is a partial enlarged view of the antenna test system shown in fig. 12 at section D.

Reference numerals:

1000. an electronic device;

100. a conductive connecting sheet; 110. a main body portion; 120. a test section; 121. a front end portion; 122. a rear end portion; 130. a handle portion; 150. a first pre-pressing line; 160. a second pre-pressing line;

200. a middle frame; 210. a frame; 211. a connection point; 220. a middle plate;

300. a circuit board; 500. a display screen; 700. a battery; 800. a rear cover;

10. testing the probe; 20. a clamp; 30. a data analyzer; 40. testing the circuit board; 50. a first clamp; 60. and a second clamp.

Detailed Description

The technical solution in the present application will be described below with reference to the accompanying drawings. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments.

In the description of the present application, it should be noted that, unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, a fixed connection, a detachable connection, or an integral connection; may be mechanically connected, may be electrically connected or may be in communication with each other; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.

In the description of the present application, it is to be understood that the terms "upper", "lower", "side", "inner", "outer", "top", "bottom", and the like, indicate orientations or positional relationships based on installation, are only used for convenience in describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present application.

It should be noted that the same reference numerals are used to denote the same components or parts in the embodiments of the present application, and for the same parts in the embodiments of the present application, only one of the parts or parts may be given the reference numeral, and it should be understood that the reference numerals are also applicable to the other same parts or parts.

In the following, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature.

In the description of the present application, it should be noted that the term "and/or" is only one kind of association relationship describing an associated object, and means that three relationships may exist, for example, a and/or B may mean: a exists alone, A and B exist simultaneously, and B exists alone.

It should be noted that the same reference numerals are used to denote the same components or parts in the embodiments of the present application, and for the same parts in the embodiments of the present application, only one of the parts or parts may be given the reference numeral, and it should be understood that the reference numerals are also applicable to the other same parts or parts.

With the development of science and technology, electronic devices with communication functions, such as mobile phones and tablet computers, are increasingly widely used, and antennas are the main components of the electronic devices for realizing the communication functions.

Fig. 1 is a schematic structural diagram of an antenna test system in the related art; fig. 2 is a schematic view of a structure of a conductive connection pad in the related art; FIG. 3 is a schematic structural diagram of an electronic device in an embodiment of the present application; fig. 4 is an exploded schematic view of the electronic device shown in fig. 3.

Taking the electronic device 1000 as a mobile phone for example, as shown in fig. 3 and 4, a common antenna of the electronic device 1000 is a middle frame antenna, the middle frame antenna uses a metal middle frame 200 as a radiator, a conductive connecting sheet 100 (a gold-plated stainless steel sheet) is usually welded at a connecting point 211 such as a feeding point/a ground point of the antenna, and the connecting point 211 is connected with a motherboard through the conductive connecting sheet 100, so as to improve chemical stability of an electrical contact surface between the antenna and the motherboard.

As shown in fig. 2, the conductive connecting piece 100 generally includes a main body portion 110 and a handle portion 130, the main body portion 110 is used for being welded at a connecting point 211 of the antenna to contact with the connecting point 211 of the antenna for electrical connection, the handle portion 130 is convenient for a manipulator, a human hand or other equipment to grab for assembly during the assembly process, and the handle portion 130 can be cut off after the assembly process. After the conductive connecting sheet 100 is assembled, it can be elastically abutted and electrically connected to the elastic sheet soldered on the circuit board, thereby achieving electrical connection with the circuit board.

The metal middle frame 200 generally includes a metal rim 210 and a metal middle plate 220 fixed inside the metal rim 210, and the connection points 211 of the middle frame antenna and the conductive connection pads 100 may be disposed on the surface of the middle plate 220.

In order to meet the requirement of high headroom of the antenna and facilitate the connection between the antenna and the circuit board, as shown in fig. 4, the connection point 211 of the middle frame antenna and the conductive connection piece 100 may also be disposed on the inner side wall of the frame 210, and the conductive connection piece 100 may elastically abut against the circuit board through a spring piece welded on the circuit board, thereby achieving the electrical connection between the conductive connection piece 100 and the circuit board.

In order to improve the yield of the electronic device 1000, the performance of the antenna of the electronic device 1000 is usually tested before the factory leaves, specifically, as shown in fig. 1, the middle frame 200 may be placed on a testing platform, and a probe is used to contact the surface of the conductive connecting sheet 100 from the top to the bottom, so as to test the middle frame antenna.

However, when the middle frame 200 is placed on the test stand, as shown in fig. 1, the conductive tab 100 provided on the inner side wall of the bezel 210 is directed toward the inner circumference of the bezel 210, not toward the upper side, so that the probe cannot contact the surface of the conductive tab 100 from the top downward, thereby making it inconvenient to test the antenna.

In the related art, the test probe 10 may be directly contacted and electrically connected to the metal middle frame 200 to test the middle frame antenna, and the test probe 10 is not contacted to the conductive connecting sheet 100, which may easily damage the middle frame 200 when the test probe 10 contacts the middle frame antenna, and the surface of the metal middle frame 200 may have an adhesive overflow or a plastic part, and the test probe 10 needs to avoid the adhesive overflow or the plastic part, which brings great inconvenience to the measurement. Further, since the test probe 10 is in contact with a position other than the antenna connection point 211, if a defect such as a crack exists between the contact position and the antenna connection point 211, the test probe 10 cannot detect the defect. It can be seen that the accuracy of the test performed by directly contacting the test probe 10 with the metal middle frame 200 is low, the operation is inconvenient, and the middle frame 200 may be damaged.

In order to solve the above problem, the embodiment of the present application provides a conductive connection pad 100, so that a probe can be easily electrically contacted with the surface of the conductive connection pad 100 facing the inner circumference of the frame 210, thereby facilitating the performance test of the antenna.

The conductive connecting piece 100, i.e., a spring, may also be referred to as a tongue or by other names.

FIG. 5 is a schematic structural diagram of an example of a conductive connection pad provided in an embodiment of the present application; FIG. 6 is a cross-sectional view of the conductive tab shown in FIG. 5 taken from perspective A-A;

FIG. 7 is a schematic structural diagram of another example of a conductive connection pad provided in an embodiment of the present application; fig. 8 is a cross-sectional view of the conductive tab shown in fig. 7 taken from a perspective of B-B.

As shown in fig. 5 to 8, the conductive connecting sheet 100 provided in the embodiment of the present application includes a main body portion 110 and a testing portion 120.

As shown in fig. 4 and 5 to 7, the main body 110 is used to be in contact with and electrically connected to a connection point 211 of an antenna of the electronic device 1000, and the connection point 211 is provided on a side wall of a functional structure of the electronic device 1000.

As shown in fig. 5 and 6, the testing unit 120 includes a front end portion 121 and a rear end portion 122, the rear end portion 122 of the testing unit 120 is connected to the main body 110, the front end portion 121 of the testing unit 120 is bent and extended away from the plane of the main body 110, and the testing unit 120 is used for contacting and electrically connecting with the testing probe 10 of the antenna testing system.

In the embodiment of the present application, the main body 110 and the testing portion 120 are both sheet-shaped structures, and the thickness range of the sheet-shaped structures may be 0.05 mm to 0.15 mm, or other thickness ranges. The main body 110 and the testing portion 120 may be an integral structure formed by forging, turning, bending and other integral manufacturing processes, so that the processing process and the structure of the conductive connecting sheet 100 are simpler, the structural reliability is better, the use is more convenient, the structural stability of the conductive connecting sheet 100 is better, the situation of fracture and the like is not easy to occur, and the reliability and the accuracy of the test are higher.

Alternatively, the test section 120 may be connected to the main body 110 by a connection method such as bonding, welding, or clamping, and the application is not limited to a specific connection method of the test section 120 and the main body 110.

The shape of the main body 110 may be rectangular, circular, trapezoidal, rhombic, etc., or may be other regular or irregular shapes, and those skilled in the art can set the specific shape of the main body 110 according to actual situations.

The shape of the testing portion 120 may be rectangular, circular, trapezoidal, prismatic, etc., or may be other regular or irregular shapes, which is not limited herein.

In order to facilitate the processing and installation of the conductive connecting sheet 100, so that the structures of the conductive connecting sheet 100 and the electronic device 1000 on which the conductive connecting sheet 100 is installed are more reasonable, the main body 110 and the testing part 120 may be rectangular.

In this embodiment, the main body portion 110 may be used to be welded to or adhered to the connection point 211 of the antenna of the electronic device 1000 through a conductive adhesive, so that the main body portion 110 is in contact with and electrically connected to the connection point 211 of the antenna. The connection point 211 of the antenna may be a feeding or grounding point of the antenna.

The electronic device 1000 may be a mobile phone (e.g., a normal mobile phone or a foldable mobile phone), a wireless headset, a bracelet, a micro camera, a smart speaker, a tablet computer, a notebook computer, a smart watch, a vehicle-mounted computer, a television, a router, an unmanned aerial vehicle, and other devices including an antenna, but is not limited thereto. In the embodiments of the present application, a mobile phone is taken as an example for description.

As shown in fig. 3 and 4, the electronic device 1000 may include a housing, the housing includes a rear cover 800 and a middle frame 200, the middle frame 200 includes a frame 210 and a middle plate 220 disposed in the frame 210, an accommodating space is provided between the rear cover 800 and the middle plate 220, the accommodating space is used for mounting electronic components such as a battery 700 and a circuit board 300, a display screen 500 is disposed on a side of the middle plate 220 facing away from the rear cover 800, the middle frame 200 is made of a metal material, the middle frame 200 serves as an antenna radiator of the electronic device 1000, a connection point 211 of an antenna is disposed on an inner side wall of the frame 210, and the conductive connection piece 100 is in contact with and electrically connected to the connection point 211 of the antenna.

The antenna of the electronic device 1000 may be a middle frame antenna as shown in fig. 4, or may be a bracket antenna, an attached antenna, or another type of antenna, which is not particularly limited in the embodiments of the present application.

As shown in fig. 4, the functional structure may be the middle frame 200 of the electronic device 1000, specifically, the functional structure may be the border 210 of the middle frame 200, and the functional structure may also be the middle plate 220 of the middle frame 200. The functional structure may be another structure capable of providing the connection point 211 of the antenna, such as an antenna bracket, and the application is not particularly limited.

The side wall of the functional structure faces the inner or outer circumference of the electronic device 1000, but not the front or rear side of the electronic device 1000, so that the connection point 211 of the antenna provided on the side wall of the functional structure also faces the inner or outer circumference of the electronic device 1000, and the conductive connection piece 100 contacting and electrically connecting with the connection point 211 of the antenna also faces the inner or outer circumference of the electronic device 1000.

The connection points 211 of the antenna may in particular be arranged on an inner side wall of the functional structure in order to facilitate an electrical connection with a circuit board 300 arranged inside the housing of the electronic device 1000.

In the embodiment of the present application, after the main body 110 of the conductive connecting piece 100 is connected to the connection point 211 of the antenna of the electronic device 1000, the front end 121 of the testing portion 120 may be bent and extended toward the inner circumference of the sidewall of the functional structure, or may be bent and extended toward the outer circumference of the sidewall of the functional structure.

Fig. 9 is a schematic structural diagram of an example of an antenna test system according to an embodiment of the present application; fig. 10 is a partial enlarged view of the antenna test system shown in fig. 9 at section C.

Since the space of the outer periphery of the functional structure is larger and is not affected by the interference of each component in the electronic device 1000, for the convenience of testing, after the main body 110 of the conductive connecting piece 100 is connected to the connection point 211 of the antenna of the electronic device 1000, as shown in fig. 9 and 10, the front end 121 of the testing part 120 may be bent and extended toward the outer periphery of the side wall of the functional structure. In addition, the front end 121 of the test part 120 extends to the periphery of the sidewall of the functional structure, and the front end 121 of the test part 120 can be supported on the edge of the sidewall of the functional structure, so that the front end 121 of the test part 120 is not easily deformed downward when the test probe 10 contacts, and the test is more convenient.

In an embodiment, as shown in fig. 7 and 10, the front end portion 121 of the testing part 120 bends and extends away from the plane of the main body part 110, or the rear end portion 122 of the testing part 120 bends and extends away from the plane of the main body part 110, and the front end portion 121 and the rear end portion 122 of the testing part 120 are coplanar, so that the front end portion 121 of the testing part 120 also bends and extends away from the plane of the main body part 110. That is, as shown in fig. 7 and 10, the entire test section 120 has a planar sheet-like structure, and the entire test section 120 is bent and extended away from the plane of the main body 110. In this case, both the front end portion 121 and the rear end portion 122 of the test part 120 may be used to contact and electrically connect with the test probe 10. The present embodiment may make the structure of the test part 120 simpler, thereby making the manufacturing process of the conductive connection pad 100 simpler and more convenient.

In another embodiment, as shown in fig. 5 and 6, the front end 121 of the testing part 120 is bent and extended towards a plane away from the main body 110, or the rear end 122 of the testing part 120 is coplanar with the main body 110, and the front end 121 of the testing part 120 is bent and extended towards a plane away from the main body 110, in this case, the testing part 120 is entirely L-shaped, that is, the front end 121 and the rear end 122 of the testing part 120 form an L-shaped structure, the front end 121 of the testing part 120 is used for contacting and electrically connecting with the testing probe 10, and the rear end 122 of the testing part 120 is used for bending and extending the front end 121 towards a side where a side wall of the functional structure is located.

In some cases, after the main body 110 is connected to the connection point 211 of the antenna, there may be a distance between the main body 110 and the edge of the sidewall of the functional structure, and in this case, the rear end portion 122 of the testing portion 120 may extend toward the edge of the sidewall of the functional structure to be flush with or higher than the top edge of the sidewall of the functional structure, so that the front end portion 121 of the testing portion 120 can extend to be bent toward the side where the sidewall of the functional structure is located, so that the testing probe 10 is in contact with the front end portion 121 of the testing portion 120, thereby facilitating the testing of the antenna.

FIG. 11 is a schematic diagram of another implementation of the structure shown in FIG. 10; fig. 12 is a schematic structural diagram of another example of an antenna test system provided in an embodiment of the present application; fig. 13 is a partial enlarged view of the antenna test system shown in fig. 12 at section D.

When the rear end portion 122 of the testing portion 120 extends toward the top edge of the sidewall of the functional structure and is higher than the top edge of the sidewall of the functional structure, if the front end portion 121 extends to the side where the sidewall of the functional structure is located, a gap can exist between the front end portion 121 and the top edge of the sidewall of the functional structure, that is, the front end portion 121 does not contact with the functional structure, so that damage to the surface of the functional structure can be reduced. In this case, as shown in fig. 12, a supporter may be additionally provided to support the front end portion 121 of the test part 120 so that the test probe 10 is reliably contacted with the front end portion 121; alternatively, the tip portion 121 may not be supported, and thus, the contact electrical connection of the test probe 10 to the tip portion 121 may be achieved.

The test probe 10 is a test probe 10 of a test system, the test system may include a data analyzer 30 communicatively connected to the test probe 10, in addition to the test probe 10, the test probe 10 transmits data obtained by testing from the connection point 211 of the antenna to the data analyzer 30, and the data analyzer 30 may analyze the performance of the antenna according to the received data.

According to the conductive connection sheet 100 provided by the embodiment of the application, the rear end portion 122 of the test portion 120 is connected to the main body portion 110, and the front end portion 121 of the test portion 120 is bent and extended towards the plane far away from the main body portion 110, so that when the main body portion 110 contacts and is electrically connected to the connection point 211 of the antenna on the side wall of the functional structure, the front end portion 121 of the test portion 120 can be bent and extended towards the outer side of the plane where the side wall of the functional structure is located, and thus, after the electronic device 1000 is placed on the test bed, the front end portion 121 of the test portion 120 can face the upper side, and when the test probe 10 is inserted downwards from the top, the front end portion 121 of the test portion 120 facing the upper side can be conveniently contacted, so that the antenna of the electronic device 1000 can be tested more conveniently, and the detection efficiency is improved.

In addition, since the lower probe position of the test probe 10 is the tip end portion 121 of the test section 120, the test probe 10 does not directly contact the functional structure or other portions of the electronic apparatus 1000, and therefore, the structure of the electronic apparatus 1000 is not affected. And the contact conductive connecting sheet 100 detects the antenna, that is, the connection point 211 of the contact antenna detects the antenna, so that the detection accuracy is not affected, and the glue overflow part, the plastic part and the uneven part on the functional structures such as the middle frame 200 and the like do not affect the detection accuracy.

In one embodiment, as shown in fig. 5 and 6, the test part 120 may be provided on an edge of the main body part 110.

The testing portion 120 is disposed at the edge of the main body portion 110, so that the overall structure of the conductive connecting sheet 100 is simpler, and the production and manufacturing of the conductive connecting sheet 100 are facilitated. In addition, when the main body 110 of the conductive connecting sheet 100 contacts with the connection point 211 of the antenna on the inner side wall of the functional structure, if the testing portion 120 is provided at the edge of the main body 110, the testing portion 120 can extend toward the outer periphery of the side wall of the functional structure more easily, thereby facilitating the testing.

When the conductive patch 100 is mounted at the connection point 211 of the antenna on the functional structure sidewall, as shown in fig. 10 to 13, the edge of the main body portion 110 where the test portion 120 is provided may be disposed adjacent to the top edge of the functional structure sidewall so that the test portion 120 extends to the outside of the plane of the functional structure sidewall.

In other embodiments, the testing part 120 may be disposed near the middle or other edge of the main body 110, so that the testing part 120 faces the lower needle direction of the test probe 10 after the main body 110 is connected to the connection point 211 of the antenna, for testing.

In one embodiment, as shown in fig. 7 and 8, the conductive connecting sheet 100 may further include a handle portion 130 disposed at an edge of the main body portion 110, a first pre-pressing line 150 is disposed between the handle portion 130 and the main body portion 110 for facilitating separation of the handle portion 130 and the main body portion 110, and the testing portion 120 and the handle portion 130 are disposed at an edge of the same side of the main body portion 110.

The handle portion 130 has a sheet-like structure. The shape of the handle portion 130 may be regular, such as rectangular, trapezoidal, rhombic, or irregular, and the shape of the handle portion 130 may be convenient for a human hand, a manipulator, or the like to grasp, and the specific shape is not limited.

The first pre-pressing line 150 may also be referred to as a pre-punching line, the first pre-pressing line 150 between the handle portion 130 and the main body portion 110 is disposed at a connection portion of the handle portion 130 and the main body portion 110, and the first pre-pressing line 150 may be formed through a punching process. After the main body 110 is mounted at the connection point 211 of the antenna by grasping the handle portion 130, the handle portion 130 can be cut out conveniently and quickly along the first pre-pressing line 150 to meet the design requirements.

The handle portion 130 may be coplanar with the main body portion 110, or may be located on a different plane from the main body portion 110, and the present application is not particularly limited thereto. When the handle portion 130 is coplanar with the body portion 110, the conductive connecting sheet 100 can be made simpler in structure and simpler and more convenient to manufacture.

In the embodiment of the present application, the handle portion 130 and the testing portion 120 may be directly connected to the edge of the same side of the main body portion 110; the handle portion 130 may be directly connected to the edge of the main body portion 110, and the testing portion 120 may be connected to the handle portion 130, so that the testing portion 120 is indirectly connected to the edge of the main body portion 110 where the handle portion 130 is provided; alternatively, the testing part 120 may be directly connected to the edge of the main body part 110, and the handle part 130 may be connected to the testing part 120, so that the handle part 130 is indirectly connected to the edge of the main body part 110 where the testing part 120 is provided; these ways can all be realized in such a way that the testing portion 120 is located on the same edge of the main body portion 110 as the handle portion 130.

In the present embodiment, the testing portion 120 and the handle portion 130 are disposed on the same side of the main body portion 110, which is more convenient for manufacturing the conductive connecting sheet 100. In addition, because there is a relatively large space outside the outer edge of the upper side of the functional structure, the upper side of the functional structure is the upper side of the functional structure after the electronic device 1000 is placed flatly, when the conductive connecting sheet 100 is installed, because the testing part 120 and the handle part 130 are arranged on the edge of the same side of the main body part 110, the handle part 130 and the testing part 120 can both extend out from the edge of the upper side of the functional structure, so that the handle part 130 and the testing part 120 are not easy to interfere with other components in the electronic device 1000 during assembly, and the installation and the test of the conductive connecting sheet 100 are more convenient.

In one embodiment, as shown in fig. 5, the handle portion 130 may have a U-shaped structure, the open end of the handle portion 130 is connected to the main body portion 110, and the test portion 120 is disposed in the U-shaped structure.

Since the handle portion 130 is usually required to be larger than the test probe 10 for grasping, and the test portion 120 is smaller than the test probe 120, the size of the test portion 120 can meet the requirement of good contact with the test probe 10, the test portion 120 can be disposed in the U-shaped structure, and the test portion 120 is disposed in the U-shaped structure in this embodiment, so that the structure of the conductive connecting piece 100 can be compact and reasonable.

In one embodiment, as shown in fig. 7 and 8, the handle portion 130 and the body portion 110 may be coplanar, and the testing portion 120 is disposed on an edge of the handle portion 130 away from the body portion 110. That is, the main body 110 and the test part 120 are respectively located on two opposite edges of the handle part 130.

In some cases, after the main body 110 is connected to the connection point 211 of the antenna, there may be a distance between the main body 110 and the edge of the sidewall of the functional structure, in which case, the handle 130 may extend toward the edge of the sidewall of the functional structure to be flush with or higher than the edge of the sidewall of the functional structure, so that the front end 121 of the testing part 120 can be bent and extended toward the side where the sidewall of the functional structure is located, so that the testing probe 10 is in contact with the front end 121 of the testing part 120, thereby facilitating the testing of the antenna.

In one embodiment, as shown in fig. 5, the joint of the testing part 120 and the main body part 110 may be provided with a second pre-pressing line 160 for facilitating separation of the two.

The second pre-pressing line 160 at the connection between the testing portion 120 and the main body portion 110 may be set with reference to the first pre-pressing line 150 at the connection between the handle portion 130 and the main body portion 110, and will not be described herein again.

In the embodiment of the present application, when the handle portion 130 and the testing portion 120 are directly connected to the edge of the main body portion 110, a first pre-pressing line 150 and a second pre-pressing line 160 may be respectively disposed at the connection between the handle portion 130 and the main body portion 110 and at the connection between the testing portion 120 and the main body portion 110. The first pre-pressing line 150 and the second pre-pressing line 160 may form a line to facilitate stamping to form each pre-pressing line.

When the handle portion 130 is directly connected to the main body portion 110 and the testing portion 120 is directly connected to the handle portion 130 to realize indirect connection with the main body portion 110, a first pre-pressing line 150 is disposed at a connection position of the handle portion 130 and the main body portion 110, and the first pre-pressing line 150 is a second pre-pressing line 160 at a connection position of the testing portion 120 and the main body portion 110.

In the embodiment, the pre-pressing line is disposed at the connection position between the testing portion 120 and the main body portion 110, so that after the main body portion 110 is mounted at the connection point 211 of the antenna, the testing portion 120 can be cut out conveniently and quickly along the pre-pressing line to meet the design requirement.

In one embodiment, as shown in fig. 6 to 8, the bending angle α of the front end portion 121 of the test section 120 with respect to the main body portion 110 may range from 80 ° to 100 °. For example, the bending angle α may be 80 °, 90 °, or 100 °, but is not limited thereto.

When the electronic device 1000 is placed on the placing platform, the side walls of the functional structure are generally vertically upward, and when the bending angle α of the front end portion 121 of the testing part 120 relative to the main body portion 110 can range from 80 ° to 100 °, the front end portion 121 of the testing part 120 can be directed upward or inclined toward the upper side, which further facilitates the contact of the testing probe 10 with the testing part 120 when the testing probe is inserted from the top, thereby further facilitating the testing.

The range of the bending angle α of the distal end portion 121 of the test piece 120 with respect to the body 110 may be other degrees, and the present application is not particularly limited.

In one embodiment, the length and width of the front end 121 of the test section 120 may be no less than 1.2 mm.

The length and width of the front end 121 of the test part 120 may be equal or different.

For example, the front end portion 121 of the test part 120 may have a length and a width each of which is 1.2 mm, 1.5 mm, 2 mm, 2.5 mm, and the like. For another example, the front end portion 121 of the test portion 120 has a length of 1.2 mm and a width of 1.4 mm, or the front end portion 121 has a length of 1.5 mm and a width of 1.2 mm. The present application does not specifically limit the specific dimensions of the front end portion 121 and the rear end portion 122.

Since the diameter of the test probe 10 of the test system is about 1 mm, in order to make the test probe 10 contact the front end 121 of the test part 120 well and ensure the test accuracy, when the test probe 10 contacts the front end 121 of the test part 120, the tip of the test probe 10 should be located as far as possible inside the front end 121 of the test part 120. In this embodiment, since the length and the width of the front end 121 of the testing part 120 are not less than 1.2 mm, the tip of the testing probe 10 can be located inside the front end 121 of the testing part 120, so as to ensure good contact between the testing probe 10 and the front end 121 of the testing part 120, and improve the accuracy of the test.

It is understood that the length and width of the front end portion 121 of the test portion 120 are not necessarily too large, which can satisfy good contact with the test probe 10, and the excessive size of the test portion 120 may cause material waste.

An embodiment of the present application further provides an antenna testing system, as shown in fig. 9 to 13, the antenna testing system includes: the conductive tab 100, test probe 10 and data analyzer 30 of any of the embodiments described above.

Test probes 10 are adapted to be in electrical contact with test portions 120 of conductive bond pads 100 and data analyzer 30 is communicatively coupled to test probes 10.

The test probe 10 may be specifically adapted to be electrically connected in contact with the front end 121 of the test portion 120 of the conductive connection pad 100.

The test probe 10 may be a Radio Frequency (RF) probe, a semiconductor high frequency probe, or other test probes 10 capable of testing antenna performance. The test probe 10 and the data analyzer 30 may be connected through a communication cable such as a radio frequency cable or a high frequency cable, and the test probe 10 and the data analyzer 30 may be connected through a wireless communication.

The test probe 10 may include one, and the test probe 10 may also include a plurality, for example, the test system includes two, three or other more test probes 10, in order to improve the test efficiency.

The data analyzer 30 may be a vector network analyzer, a spectrum analyzer, or other radio frequency measurement instrument.

As shown in fig. 9 and 12, the antenna test system may further include a test circuit board 40, and the test probe 10 may be mounted on the test circuit board 40 and electrically connected to the test circuit board 40. The test circuit board 40 may also be electrically connected to a processor, a memory, and other devices. The processor is electrically connected with the test probe 10 through the test circuit board 40 to control the working states of the test probe 10, such as on-off state, voltage and the like.

In the antenna testing system provided in the embodiment of the present application, since the conductive connecting piece 100 described in any one of the above embodiments is used, the antenna testing system has similar technical effects to the conductive connecting piece 100, and details are not repeated here.

The antenna test system may further include a first clamp 50 for clamping the test circuit board 40 and the test probe 10.

In one embodiment, the antenna test system may further include a support having a supporting surface facing the lower needle direction of the test probe 10, and the supporting surface of the support is used for supporting the test part 120.

The supporting member may be a fixture 20 or a placing table on which the electronic device 1000 to be tested is placed, a frame 210 of the electronic device 1000 to be tested, or a middle plate 220 of the electronic device 1000 to be tested, or may be a supporting block, a supporting frame, a supporting plate, or the like for supporting the testing unit 120.

In the embodiment, the supporting surface of the supporting member supports the testing portion 120, so that the testing portion 120 is not easily deformed when the testing probe 10 contacts the testing portion 120, thereby ensuring reliable contact between the testing probe 10 and the testing portion 120 and improving accuracy of antenna testing.

As shown in fig. 10, the front end portion 121 of the test part 120 may be completely supported by the supporting surface of the supporter, i.e., each part of the front end portion 121 of the test part 120 is supported by the supporting surface. As shown in fig. 11, the distal end portion 121 of the test part 120 may be supported by the support surface portion of the support member, that is, a part of the distal end portion 121 of the test part 120 may be supported by the support surface and another part may not be supported by the support surface, and in this case, the distal end portion 121 of the test part 120 may be supported relatively reliably and be less likely to deform, and the reliability of contact between the distal end portion 121 and the test probe 10 may be high. It can be seen that, in the embodiment of the present application, the supporting surface of the supporting member can be flexibly disposed, so that the structural design of the antenna testing system or the electronic device 1000 is more flexible.

Optionally, the antenna test system may further include a second fixture 60 for positioning the electronic device 1000 to be tested, and the second fixture 60 may be a positioning plate, a positioning column, or the like. The electronic equipment 1000 to be tested is positioned through the second clamp 60, so that the electronic equipment 1000 to be tested can be prevented from moving in the antenna testing process, and the accuracy of antenna testing is improved.

The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present application, and shall be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims (13)

1. A conductive tab, comprising:

a main body part (110) which is in contact with and electrically connected to a connection point (211) of an antenna of an electronic device (1000), wherein the connection point (211) is provided on a side wall of a functional structure of the electronic device (1000);

the testing device comprises a testing part (120), wherein the rear end part (122) of the testing part (120) is connected to the main body part (110), the front end part (121) of the testing part (120) bends and extends towards a plane far away from the main body part (110), and the front end part (121) of the testing part (120) is used for being in contact with and electrically connected with a testing probe (10).

2. The conductive tab of claim 1 wherein the test portion (120) is provided at an edge of the body portion (110).

3. The conductive tab of claim 2, further comprising: the testing device comprises a handle part (130) arranged at the edge of the main body part (110), a first pre-pressing line (150) convenient for the separation of the handle part (130) and the main body part (110) is arranged between the handle part (130) and the main body part (110), and the testing part (120) and the handle part (130) are arranged on the edge of the same side of the main body part (110).

4. The conductive tab of claim 3 wherein the handle portion (130) is a U-shaped structure, the open end of the handle portion (130) being connected to the body portion (110), the test portion (120) being disposed within the U-shaped structure.

5. The conductive tab of claim 4 wherein the test portion (120) is generally L-shaped in configuration with the rear end portion (122) being coplanar with the body portion (110).

6. A conductive tab according to claim 3, wherein the handle portion (130) is coplanar with the body portion (110), and the test portion (120) is provided on an edge of the handle portion (130) remote from the body portion (110).

7. The conductive tab of claim 1 wherein the junction of the test portion (120) and the body portion (110) is provided with a second pre-press line (160) to facilitate separation of the two.

8. The conductive tab according to any of claims 1 to 7, wherein the bending angle α of the front end portion (121) of the test section (120) with respect to the body portion (110) is in the range of 80 ° to 100 °.

9. Conductive tab according to any of claims 1 to 7, characterized in that the length and width of the front end (121) are not less than 1.2 mm.

10. Conductive tab according to any of claims 1 to 7, characterized in that the functional structure is a middle frame (200).

11. An antenna test system, comprising:

a conductive connection pad (100) according to any of claims 1 to 10;

a test probe (10) for making contact with and electrically connecting to a test portion (120) of the conductive connection pad (100);

a data analyzer (30) communicatively coupled to the test probe (10).

12. The antenna test system of claim 11, further comprising:

a support having a support surface facing a lower needle direction of the test probe (10), the support surface being for supporting the test part (120).

13. The antenna test system of claim 12, wherein the support is a clamp (20) for holding an electronic device under test, a bezel (210) of the electronic device under test, or a midplane (220) of the electronic device under test.

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