CN217359976U - Dual-port microwave component test fixture - Google Patents

Abstract

The utility model relates to a dual-port microwave components and parts test fixture, which comprises a base frame, decide anchor clamps, move anchor clamps and test carrier, decide anchor clamps, it all installs on the chassis to move anchor clamps and test carrier, decide anchor clamps and move the both sides that anchor clamps set up at the test carrier respectively, decide anchor clamps and chassis fixed connection, set up the guide post of two parallels in the chassis, two guide posts are located same horizontal plane, move anchor clamps and test carrier movable mounting on the guide post, the chassis is provided with the screw rod with moving adjacent one side of anchor clamps, the screw rod runs through the chassis and moves the anchor clamps and be connected, decide anchor clamps and move adjacent one side of anchor clamps and be provided with the connector. The utility model discloses use and decide anchor clamps and move anchor clamps cooperation centre gripping test carrier, move the position of the connector on anchor clamps and the anchor clamps and test the piece phase-match on the test carrier, the error can not appear, the dislocation, the good contact of test piece and connector center needle guarantees the accuracy of test result, has realized the solderless test, reduces test cost.

Description

Double-port microwave component test fixture

Technical Field

The utility model relates to a microwave test fixture technical field especially relates to dual-port microwave components and parts test fixture.

Background

Microwave measurement (microwave measurement) is a measurement of performance and parameters of components, antennas, feeders, circuits, complete machines, systems, propagation media and links working in a microwave band. The microwave measurement is closely related to the scientific research, production, construction, maintenance and other work of microwave communication. Wherein, the S parameter is an extremely important parameter in microwave measurement, and the S12 is a reverse transmission coefficient, i.e. isolation. S21 is the forward transmission coefficient, i.e., the gain. S11 is the input reflection coefficient, i.e., the input return loss, and S22 is the output reflection coefficient, i.e., the output return loss. When a dual-port microwave component is tested, because the dual-port microwave component is smaller and smaller, the pin pitch is limited, and the application range is wider and wider, how to extract the microwave parameters of the micro-component in the application becomes a big difficulty.

SUMMERY OF THE UTILITY MODEL

Therefore, the dual-port microwave component test fixture is needed to be provided for the condition that the parameter measurement of the dual-port microwave component is not easy.

Double-port microwave components and parts test fixture, including the chassis, decide anchor clamps, move anchor clamps and test carrier and all install on the chassis, decide anchor clamps and move anchor clamps and set up respectively test carrier's both sides, decide anchor clamps with chassis fixed connection, set up the guide post of two parallels in the chassis, two the guide post is located same horizontal plane, move anchor clamps and test carrier movable mounting is in on the guide post, the chassis with it is provided with the screw rod to move adjacent one side of anchor clamps, the screw rod runs through the chassis with it connects to move anchor clamps, decide anchor clamps and it is provided with the connector to move adjacent one side of anchor clamps.

Preferably, the test carrier comprises a carrying platform, a back frame, a crank assembly and a pressing block assembly, the carrying platform is movably mounted on the two guide posts, the lower end of the back frame is vertically connected with the side part of the carrying platform, the upper end of the back frame is movably connected with the crank assembly, the pressing block assembly is movably mounted on the back frame, and the output end of the crank assembly is movably connected with the pressing block assembly.

Preferably, the crank assembly comprises a switching block, a crank, a rotating block and a handle, one end of the switching block is connected with the back frame, the other end of the switching block is movably connected with the rotating block, the upper end of the crank is connected with the rotating block, the lower end of the crank is movably connected with the pressing block assembly, and the handle is connected with the rotating block.

Preferably, the pressing block assembly comprises a sliding block, a connecting block and a pressing block, a sliding rail is arranged on the back frame along the vertical direction, the sliding block is movably connected with the sliding rail, the connecting block passes through the sliding block and is connected with the sliding rail, the upper end of the connecting block is movably connected with the crank, and the pressing block is arranged below the connecting block.

Preferably, one side of the fixed clamp adjacent to the movable clamp is further provided with a buffer column and a positioning cone, and the carrier is provided with a depressed area corresponding to the positioning cone.

The utility model discloses an useful part lies in: the fixed clamp and the movable clamp are matched to clamp the test carrier, the position of the connector on the movable clamp and the fixed clamp is matched with the test piece on the test carrier, errors and dislocation cannot occur, the test piece is in good contact with the central needle of the connector, the accuracy of a test result is guaranteed, welding-free testing is achieved, and the test cost is reduced.

Drawings

FIG. 1 is a schematic perspective view of a dual-port microwave component test fixture according to an embodiment;

fig. 2 is an explosion schematic diagram of a dual-port microwave component test fixture.

Detailed Description

In order to make the above objects, features and advantages of the present invention more comprehensible, embodiments of the present invention are described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein, as those skilled in the art will be able to make similar modifications without departing from the spirit and scope of the present invention.

It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

As shown in fig. 1-2, a dual-port microwave component testing fixture comprises a bottom frame 1, a fixed fixture 2, a movable fixture 3 and a testing carrier 4, wherein the fixed fixture 2, the movable fixture 3 and the testing carrier 4 are all installed on the bottom frame 1, the fixed fixture 2 and the movable fixture 3 are respectively arranged on two sides of the testing carrier 4, the fixed fixture 2 is fixedly connected with the bottom frame 1, two parallel guide posts 5 are arranged in the bottom frame 1, the two guide posts 5 are located on the same horizontal plane, the movable fixture 3 and the testing carrier 4 are movably installed on the guide posts 5, a screw rod 11 is arranged on one side, adjacent to the movable fixture 3, of the bottom frame 1, the screw rod 11 penetrates through the bottom frame 1 and the movable fixture 3, and a connector 21 is arranged on one side, adjacent to the movable fixture 3, of the fixed fixture 2 and the movable fixture 3. Specifically, in this embodiment, the bottom frame 1 is square, and the upper portion thereof is provided with a groove for filling and installing the fixed fixture 2, the movable fixture 3 and the test carrier 4, thereby reducing the overall height of the fixture. The fixed clamp 2 is fixedly arranged on the left side of the underframe 1 through bolts, and the movable clamp 3 and the test carrier 4 are movably arranged in the underframe 1. During the test, install the test piece on test carrier 4, the operator rotates screw rod 11, can drive and move anchor clamps 3 and draw close to 2 one side of deciding anchor clamps, it can be understood, when moving anchor clamps 3 and removing, with test carrier 4 butt, drive test carrier 4 synchronous displacement, lay the test piece above test carrier 4 and can be decided anchor clamps 2 cooperation and move anchor clamps 3 and centre gripping, because move anchor clamps 3 and test carrier 4 and move along the guide post 5 displacement in chassis 1, the precision is high, when making the test piece overlap joint with deciding anchor clamps 2 and moving the connector 21 on anchor clamps 3, be difficult to the deviation appears, keep good electric connection performance.

As shown in fig. 1-2, the test carrier 4 includes a carrier 41, a back frame 42, a crank assembly 43 and a press block assembly 44, the carrier 41 is movably mounted on two guide posts 5, the lower end of the back frame 42 is vertically connected with the side of the carrier 41, the upper end of the back frame 42 is movably connected with the crank assembly 43, the press block assembly 44 is movably mounted on the back frame 42, and the output end of the crank assembly 43 is movably connected with the press block assembly 44. Specifically, during the test, lay the test piece on microscope carrier 41, decide when anchor clamps 2 cooperation moves 3 centre grippings of anchor clamps, the test piece receives the extrusion, there is a process of lifting a little upwards, in order to make the test piece be connected well with the connector 21 electricity of both sides, be provided with back of the body frame 42 at microscope carrier 41 lateral part, be used for installation crank subassembly 43 and briquetting subassembly 44, during the test, operating personnel rotates crank subassembly 43, make briquetting subassembly 44 push down along back of the body frame 42, act on the test piece, thereby guaranteed the test piece little with the good contact of connector 21 center needle, guarantee the accuracy of test result.

As shown in fig. 1-2, the crank assembly 43 includes a transfer block 431, a crank 432, a rotary block 433 and a handle 434, one end of the transfer block 431 is connected to the back frame 42, the other end of the transfer block 431 is movably connected to the rotary block 433, the upper end of the crank 432 is connected to the rotary block 433, the lower end of the crank 432 is movably connected to the press block assembly 44, and the handle 434 is connected to the rotary block 433. Specifically, handle 434 is spherical handle, and it is better to hold the sense, and operating personnel holds handle 434, can drive crank 432 through rotatory piece 433 and move from top to bottom, and then makes briquetting subassembly 44 move from top to bottom, and with test piece butt or separate.

As shown in fig. 1-2, the pressing block assembly 44 includes a sliding block 441, a connecting block 442 and a pressing block 443, the back frame 42 is provided with a sliding rail 421 along a vertical direction, the sliding block 441 is movably connected with the sliding rail 421, the connecting block 442 is connected with the sliding rail 421 through the sliding block 441, an upper end of the connecting block 442 is movably connected with the crank 432, and the pressing block 443 is disposed below the connecting block 442. Specifically, the slider 441 is movably clamped with the slide rail 421, when the crank 432 is connected with the connecting block 442 through the pin shaft, the pressing block 443 can be driven to move up and down, the slider 441 is limited by the slide rail 421, so that the pressing block 443 can only vertically move up and down, the pressing block 443 cannot deviate and always acts on the same point, the pressing block 443 compresses the microwave component during testing, and good contact of the testing component is ensured. A spring can be arranged in the pressing block 443 and has elasticity, so that the test piece is prevented from being crushed due to excessive pressing force.

As shown in fig. 1-2, a buffer column 22 and a positioning cone 23 are further disposed on one side of the fixed clamp 2 adjacent to the movable clamp 3, and a concave area is disposed at a position of the carrier 41 corresponding to the positioning cone 22. Specifically, the cushion post 22 is made of rubber, and is prevented from colliding with the fixed clamp 2, the carrier 41 and the movable clamp 3 during abutting, and the positioning cone 23 assists the positioning of the guide post 5, so that the test piece on the carrier 41 is lapped with the center pins of the two connectors 21 on the two sides, and accurate positioning is realized.

The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only represent some embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, without departing from the spirit of the present invention, several variations and modifications can be made, which are within the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the appended claims.

Claims (5)

1. Double-port microwave components and parts test fixture, its characterized in that: including the chassis, decide anchor clamps, move anchor clamps and test carrier and all install on the chassis, decide anchor clamps and move anchor clamps and set up respectively the both sides of test carrier, decide anchor clamps with chassis fixed connection, set up the guide post of two parallels in the chassis, two the guide post is located same horizontal plane, move anchor clamps and test carrier movable mounting be in on the guide post, the chassis with it is provided with the screw rod to move adjacent one side of anchor clamps, the screw rod runs through the chassis with it connects to move anchor clamps, decide anchor clamps reach it is provided with the connector to move adjacent one side of anchor clamps.

2. A dual-port microwave component test fixture as claimed in claim 1, wherein: the test carrier comprises a carrying platform, a back frame, a crank assembly and a pressing block assembly, wherein the carrying platform is movably mounted on two guide columns, the lower end of the back frame is vertically connected with the side part of the carrying platform, the upper end of the back frame is movably connected with the crank assembly, the pressing block assembly is movably mounted on the back frame, and the output end of the crank assembly is movably connected with the pressing block assembly.

3. A dual port microwave component test fixture as claimed in claim 2, wherein: the crank assembly comprises a switching block, a crank, a rotating block and a handle, wherein one end of the switching block is connected with the back frame, the other end of the switching block is movably connected with the rotating block, the upper end of the crank is connected with the rotating block, the lower end of the crank is movably connected with the pressing block assembly, and the handle is connected with the rotating block.

4. A dual port microwave component test fixture as claimed in claim 3, wherein: the briquetting subassembly is including the slider, connecting block and briquetting, the back of the body frame is provided with the slide rail along vertical direction, the slider with slide rail swing joint, the connecting block passes through the slider with slide rail joint, the connecting block upper end with crank swing joint, the briquetting sets up the connecting block below.

5. A dual-port microwave component test fixture as claimed in claim 4, wherein: and one side of the fixed clamp adjacent to the movable clamp is also provided with a buffer column and a positioning cone, and the carrying platform is provided with a depressed area corresponding to the positioning cone.

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