CN217332725U - Infrared induction chip testing device - Google Patents
Infrared induction chip testing device Download PDFInfo
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- CN217332725U CN217332725U CN202220472973.5U CN202220472973U CN217332725U CN 217332725 U CN217332725 U CN 217332725U CN 202220472973 U CN202220472973 U CN 202220472973U CN 217332725 U CN217332725 U CN 217332725U
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Abstract
The utility model discloses an infrared induction chip testing arrangement, include: the detection platform is used for containing a sample chip or a chip to be detected, a needle card is arranged on the detection platform and connected with a probe, and the probe can contact the sample chip or the chip to be detected; the test machine is electrically connected with the probe and can acquire the induction data of the sample chip or the chip to be tested through the probe; the light source board set up in examine the top of test table, install the light source on the light source board, the light of light source can shine in examine on the test table, the illumination intensity of light source is adjustable. Use the utility model discloses the test that testing arrangement goes on can high-efficient swiftly detect the infrared induction chip, can improve and detect the accuracy to can guarantee the quality and the uniformity of infrared induction chip product.
Description
Technical Field
The utility model relates to a detect technical field, in particular to infrared induction chip testing arrangement.
Background
The infrared induction chip is an optical sensor, is widely applied to the field of optical instruments, can measure optical performance in the processing process of the infrared induction chip, and needs to illuminate the infrared induction chip to obtain induction data of the infrared induction chip so as to analyze whether the infrared induction chip is qualified or not. The illumination intensity of a light source in the existing infrared induction chip testing device can be gradually attenuated along with the increase of the service time, the testing result and the product quality are influenced, the illumination intensity after attenuation is not easy to be perceived, the product detection structure of each batch can be influenced, the induction data of chips going out in different batches can be deviated, and the product consistency is further influenced.
SUMMERY OF THE UTILITY MODEL
The utility model discloses aim at solving one of the technical problem that exists among the prior art at least. Therefore, the utility model provides an infrared induction chip testing arrangement can improve and detect the accuracy, guarantees the quality and the uniformity of infrared induction chip product.
According to the utility model discloses infrared induction chip testing arrangement, include: the detection platform is used for containing a sample chip or a chip to be detected, a needle card is arranged on the detection platform and connected with a probe, and the probe can contact the sample chip or the chip to be detected; the test machine is electrically connected with the probe and can acquire the induction data of the sample chip or the chip to be tested through the probe; the light source board set up in examine the top of test table, install the light source on the light source board, the light of light source can shine in examine on the test table, the illumination intensity of light source is adjustable.
The method has the following beneficial effects: before detecting a chip to be detected, a sample chip can be firstly placed on a detection table to adjust the illumination intensity until the illumination intensity enables the sample chip to reach an induction value in a corresponding qualified standard, namely, the environmental condition (namely, the illumination intensity) is reversely calibrated according to induction data of the sample chip, and the sample chip can be a qualified chip provided by a manufacturer; and then, keeping the illumination intensity of the light source, taking the sample chip off the detection table, and placing the chip to be detected on the detection table, wherein if the induction data of the chip to be detected can reach the qualified standard under the same illumination intensity, the chip to be detected is qualified. Furthermore, be in the embodiment of the utility model provides an illumination intensity of light source is adjustable on the light source board, can prevent that light source long-term use back illumination intensity from weakening. Use above the utility model discloses the test that testing arrangement goes on can high-efficient swiftly detect the infrared induction chip, can improve and detect the accuracy to can guarantee the quality and the uniformity of infrared induction chip product.
According to some embodiments of the utility model, the light source is provided with a plurality ofly, and is a plurality of the light source matrix arrange in on the light source board.
According to some embodiments of the utility model, still include control system, every the illumination intensity of light source all can pass through control system independent control.
According to the utility model discloses a some embodiments, it installs position control module to examine test table, position control module is steerable the light source board is relative it removes at horizontal direction and vertical direction to examine test table.
According to the utility model discloses a some embodiments, position control module includes X axle module, Y axle module and Z axle module, Z axle module install in examine on the test table, Y axle module set up in on the Z axle module, Y axle module can be relative Z axle module removes along Z axle direction, X axle module set up in on the Y axle module, X axle module can be relative Y axle module removes along Y axle direction, the light source board set up in on the X axle module, the light source board can be relative X axle module removes along X axle direction.
According to some embodiments of the utility model, the outside of light source board is provided with the lens hood.
According to some embodiments of the invention, the light shield is made of a metal material.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The invention will be further described with reference to the following drawings and examples, in which:
fig. 1 is a schematic structural diagram of an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a position adjustment module according to an embodiment of the present invention;
fig. 3 is a schematic structural view of a light source board in an embodiment of the present invention.
Reference numbers:
the detection platform 100, the pin card 110 and the chip to be detected 120;
a testing machine 200;
a light source plate 300, a light source 310, a light shield 320;
a position adjusting module 400, an X-axis module 410, a Y-axis module 420, and a Z-axis module 430.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary only for the purpose of explaining the present invention, and should not be construed as limiting the present invention.
In the description of the present invention, it should be understood that the orientation or positional relationship indicated by referring to the orientation description, such as the X-axis, the Y-axis, the Z-axis, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
In the description of the present invention, unless there is an explicit limitation, the words such as setting, installation, connection, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in combination with the specific contents of the technical solution.
Referring to fig. 1 to 3, the utility model discloses an infrared induction chip testing arrangement, be applicable to and test infrared induction chip optical property before dispatching from the factory, specifically including examining test table 100, test machine 200 and light source board 300, wherein, the sample chip of producer or the chip 120 that awaits measuring can place on examining test table 100, light source board 300 sets up in examining test table 100 top, the light source 310 of installation can shine in examining test table 100 on sample chip or the chip 120 that awaits measuring, test machine 200 can acquire this sample chip or the response data of the chip 120 that awaits measuring, compare through the response data with the chip 120 that awaits measuring and sample chip's response data, judge whether the chip 120 that awaits measuring accords with the factory standard.
Specifically, before detecting the chip 120 to be detected, the sample chip may be first placed on the detection table 100 to adjust the illumination intensity until the illumination intensity makes the sample chip reach the induction value in the corresponding qualified standard, that is, the environmental condition (i.e., the illumination intensity) is calibrated reversely according to the induction data of the sample chip, and the sample chip may be a qualified chip provided by a manufacturer; then, the illumination intensity of the light source 310 is maintained, the sample chip is taken down from the inspection stage 100, and the chip 120 to be tested is placed on the inspection stage 100, and if the sensing data of the chip 120 to be tested can reach the qualified standard under the same illumination intensity, it indicates that the chip 120 to be tested is qualified. In addition, the light intensity of the light source 310 on the light source board 300 in the embodiment of the present invention is adjustable, and the light intensity can be prevented from being weakened after the light source 310 is used for a long time. Use above the utility model discloses the test that testing arrangement goes on can high-efficient swiftly detect the infrared induction chip, can improve and detect the accuracy to can guarantee the quality and the uniformity of infrared induction chip product.
It can be understood that the use of the adjustable light source 310 in conjunction with the sample chip can provide guarantee for the detection precision of the subsequent chip 120 to be detected, and certainly, the illumination intensity does not need to be calibrated before each detection of the chip 120 to be detected, and only the calibration needs to be performed at certain intervals or when different batches of chips 120 to be detected are replaced.
It should be noted that, the probe card 110 is disposed on the detection table 100, the probe card 110 is connected to a probe (not shown in the figure), the probe can contact the sample chip or the chip 120 to be detected, the tester 200 is electrically connected to the probe and can obtain the sensing data of the sample chip or the chip 120 to be detected through the probe, and the technical scheme of detecting the chip and obtaining the data through the probe is a conventional technical means in the art and is not described herein.
Referring to fig. 3, the light source 310 in the embodiment of the present invention may be provided in plurality, and the plurality of light sources 310 may be arranged on the light source board 300 in a matrix form. The plurality of light sources 310 can enlarge the irradiation range, so that the number of chips 120 to be tested can be increased, and the improvement of the detection efficiency and the product consistency is facilitated. It can be understood that the testing device of the present invention can further be provided with a control system, the control system can individually control the illumination intensity of each light source 310, when one of the light sources 310 fails or the illumination intensity is weakened due to long-term use, the brightness of the other light sources 310 around the failed light source 310 can be increased to compensate for the condition of the weakened local illumination intensity.
As shown in fig. 2, the light source board 300 in the embodiment of the present invention can move relative to the inspection table 100 in the horizontal and vertical directions, and in the actual testing process, the illumination intensity of each light source 310 can be adjusted by the control system, and then the coverage area of the light source 310 on the light source board 300 can be adjusted by moving the position of the light source board 300, so that all the chips 120 to be inspected on the inspection table 100 can be covered by the light source 310; simultaneously, when the illumination intensity of light source 310 had been adjusted to the limit, also can further adjust illumination intensity through removing light source board 300 and examining the distance between the test table 100, increased the utility model discloses testing arrangement's adaptability.
Referring to fig. 1 and 2, the position of the light source board 300 with respect to the inspection stage 100 may be adjusted by a position adjustment module 400, and specifically, the position adjustment module 400 includes an X-axis module 410, a Y-axis module 420, and a Z-axis module 430. The Z-axis module 430 is mounted on the inspection table 100, the Y-axis module 420 is disposed on the Z-axis module 430, and a driving member on the Z-axis module 430 can drive the Y-axis module 420 to move along the Z-axis direction; the X-axis module 410 is arranged on the Y-axis module 420, and a driving piece on the Y-axis module 420 can drive the X-axis module 410 to move along the Y-axis direction; the light source board 300 is disposed on the X-axis module 410, and the driving member on the X-axis module 410 can drive the light source board 300 to move along the X-axis direction. The light source board 300 can be moved in the directions of the X axis, the Y axis and the Z axis by controlling the movement of the light source board 300 through the position adjusting module 400, wherein driving pieces on the X axis module 410, the Y axis module 420 and the Z axis module 430 can be motors, so that the automatic adjustment of the position of the light source board 300 can be realized, the adjusting precision can be improved, and the detection efficiency can be improved.
Referring to fig. 2 and 3, the light source board 300 of the embodiment of the present invention may be covered with a light shielding cover 320, and the light shielding cover 320 may block light outside the light source board 300 to reduce the influence of the external environment on the light source 310. In addition, the light shield 320 can also perform a light condensing function, so that light rays of the light source 310 can be prevented from being diffused out of the light shield 320, and the loss of the light source 310 can be reduced. It is understood that the light shield 320 may be made of a metal material such as aluminum alloy, which makes the light shield 320 more portable and facilitates the adjustment module 400 to move the light source board 300.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The present invention is not limited to the above embodiments, and those skilled in the art can make equivalent modifications or substitutions without departing from the spirit of the present invention, and such equivalent modifications or substitutions are included in the scope of the present invention defined by the claims.
Claims (7)
1. An infrared induction chip testing device is characterized by comprising:
the detection platform is used for containing a sample chip or a chip to be detected, a needle card is arranged on the detection platform and connected with a probe, and the probe can contact the sample chip or the chip to be detected;
the test machine is electrically connected with the probe and can acquire the induction data of the sample chip or the chip to be tested through the probe;
the light source board set up in examine the top of test table, install the light source on the light source board, the light of light source can shine in examine on the test table, the illumination intensity of light source is adjustable.
2. The apparatus as claimed in claim 1, wherein a plurality of the light sources are arranged on the light source board in a matrix.
3. The infrared induction chip testing device as claimed in claim 2, further comprising a control system, wherein the illumination intensity of each of said light sources can be individually controlled by said control system.
4. The device of claim 1, wherein a position adjustment module is mounted on the inspection table, and the position adjustment module controls the light source board to move in a horizontal direction and a vertical direction relative to the inspection table.
5. The IR sensor chip testing device according to claim 4, wherein said position adjustment module comprises an X-axis module, a Y-axis module and a Z-axis module, said Z-axis module is mounted on said testing table, said Y-axis module is disposed on said Z-axis module, said Y-axis module is movable in the Z-axis direction relative to said Z-axis module, said X-axis module is disposed on said Y-axis module, said X-axis module is movable in the Y-axis direction relative to said Y-axis module, said light source board is disposed on said X-axis module, and said light source board is movable in the X-axis direction relative to said X-axis module.
6. The infrared induction chip testing device as claimed in claim 1, wherein a light shield is disposed outside the light source board.
7. The IR chip testing device according to claim 6, wherein the light shield is made of a metallic material.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220472973.5U CN217332725U (en) | 2022-03-03 | 2022-03-03 | Infrared induction chip testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220472973.5U CN217332725U (en) | 2022-03-03 | 2022-03-03 | Infrared induction chip testing device |
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| Publication Number | Publication Date |
|---|---|
| CN217332725U true CN217332725U (en) | 2022-08-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN202220472973.5U Active CN217332725U (en) | 2022-03-03 | 2022-03-03 | Infrared induction chip testing device |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116298819A (en) * | 2023-04-19 | 2023-06-23 | 无锡兴华衡辉科技有限公司 | Imaging testing device of infrared detector chip |
-
2022
- 2022-03-03 CN CN202220472973.5U patent/CN217332725U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116298819A (en) * | 2023-04-19 | 2023-06-23 | 无锡兴华衡辉科技有限公司 | Imaging testing device of infrared detector chip |
| CN116298819B (en) * | 2023-04-19 | 2023-09-15 | 无锡兴华衡辉科技有限公司 | Imaging testing device of infrared detector chip |
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