CN217332180U - Novel full-automatic three-dimensional slicing platform - Google Patents
Novel full-automatic three-dimensional slicing platform Download PDFInfo
- Publication number
- CN217332180U CN217332180U CN202220584869.5U CN202220584869U CN217332180U CN 217332180 U CN217332180 U CN 217332180U CN 202220584869 U CN202220584869 U CN 202220584869U CN 217332180 U CN217332180 U CN 217332180U
- Authority
- CN
- China
- Prior art keywords
- sample
- grinding
- guide rail
- polishing
- assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Sampling And Sample Adjustment (AREA)
Abstract
The utility model provides a novel full-automatic three-dimensional slicing platform, include: the device comprises a control system, a first upright post, a second upright post, a sample table, a metallographic microscope, a camera, an X-axis guide rail, a Z-axis guide rail, a grinding and polishing assembly and a spraying assembly, wherein the metallographic microscope, the camera, the X-axis guide rail, the Z-axis guide rail, the grinding and polishing assembly and the spraying assembly are connected with the control system; the metallographic microscope is arranged on the first stand column, and the camera is arranged above the metallographic microscope; the Z-axis guide rail is vertically arranged on the X-axis guide rail and can move in the horizontal direction, the sample stage is arranged on the Z-axis guide rail and can move in the vertical direction, and the sample is fixed on the sample stage; the middle part of the sample table is embedded with a pressure sensor, is positioned below the sample and is used for detecting grinding and polishing pressure; the grinding and polishing assembly and the spraying assembly are arranged on the second stand column, the grinding and polishing assembly is used for grinding and polishing a sample, and the spraying assembly is used for cleaning and blow-drying the grinding and polishing assembly and the sample or is used for corroding the sample. The utility model discloses can realize the thick accurate control of polishing layer, and enlarge application scope, improve work efficiency.
Description
Technical Field
The utility model relates to a material characterization technical field especially relates to a novel full-automatic three-dimensional section platform.
Background
The observation and characterization of three-dimensional tissue structure is the basis and core of material science, and in recent years, three-dimensional reconstruction technology based on continuous slicing technology has become a hot spot for studying three-dimensional structure of material tissue. Three-dimensional reconstruction techniques are a prerequisite for a deep understanding of the relationship between microstructure and material properties. Due to the diversity of the internal structure of the material, the real tissue morphology of the material cannot be reflected by a method for observing a common two-dimensional metallographic phase through surface corrosion. The current methods for obtaining the three-dimensional structure of the microstructure of the material are mainly divided into lossless and lossy methods.
Among them, the nondestructive methods mainly include X-ray tomography (XRT), focused ion beam scanning (FIB), etc., but these methods have limited application range, have certain requirements on materials, and have high cost. The destructive method is mainly a continuous three-dimensional slicing technology, but the three-dimensional slicing technology of polishing and re-etching layer by layer consumes a great deal of time, and the thickness precision of a single layer is low, so that the three-dimensional reconstruction effect of the material tissue is influenced.
Therefore, a three-dimensional slicing platform with a wide application range and capable of improving the precision control of the thickness of the single layer is needed.
SUMMERY OF THE UTILITY MODEL
In view of the above, it is necessary to provide a novel fully automatic three-dimensional slicing platform for solving the above technical problems.
A novel full-automatic three-dimensional slicing platform comprises: the device comprises a control system, a first upright post, a second upright post, a metallographic microscope, a camera, an X-axis guide rail, a Z-axis guide rail, a sample table, a grinding and polishing assembly and a spraying assembly; the control system is connected with the metallographic microscope, the camera, the X-axis guide rail, the Z-axis guide rail, the grinding and polishing assembly and the spraying assembly; the first upright post and the second upright post are connected through an X-axis guide rail; the metallographic microscope is arranged on the first stand column, and the camera is arranged above the metallographic microscope and is connected with the metallographic microscope; the X-axis guide rail is provided with an X-axis sliding block, the X-axis sliding block can reciprocate on the X-axis guide rail, the Z-axis guide rail is vertically arranged on the X-axis sliding block and can move in the horizontal direction under the driving of the X-axis sliding block, the Z-axis guide rail is provided with a Z-axis sliding block, and the Z-axis sliding block can reciprocate on the Z-axis guide rail; the sample stage is arranged on the Z-axis sliding block and can move in the vertical direction under the driving of the Z-axis sliding block, and a sample is fixed on the sample stage and is positioned below the metallographic microscope; the middle part of the sample table is embedded with a pressure sensor, is positioned below the sample and is used for detecting grinding and polishing pressure; the grinding and polishing assembly and the spraying assembly are arranged on the second stand column, the spraying assembly is located below the grinding and polishing assembly, the grinding and polishing assembly is used for grinding and polishing a sample, and the spraying assembly is used for cleaning and blow-drying the grinding and polishing assembly and the sample or is used for corroding the sample.
Further, the metallographic microscope is provided with a CCD sensor, and the sample is automatically focused through the CCD sensor.
Furthermore, the sample stage is also provided with a clamping assembly, and the sample is fixed through the clamping assembly.
Furthermore, the clamping assembly comprises a clamp and a sample preparation cylindrical block, the clamp is fixed on the sample platform and provided with a concentric positioning hole with the sample platform, and the diameter of the first positioning hole of the sample platform is smaller than that of the second positioning hole of the clamp; one end of the sample preparation cylindrical block is embedded in the clamp, the other end of the sample preparation cylindrical block penetrates out of the second positioning hole, and the sample preparation cylindrical block is in clearance fit with the sample through the penetrating part.
Further, the sample stage also comprises a threaded column knob, and the threaded column knob penetrates into the first positioning hole and is used for adjusting the surface height of the sample.
Furthermore, the grinding and polishing assembly comprises a stepping motor and a grinding disc, the grinding disc is connected with the output end of the stepping motor, and the grinding disc is driven to rotate by the stepping motor to grind and polish the sample.
Further, the spraying assembly comprises a spray pipe and a nozzle, the spray pipe is used for spraying water or polishing liquid, and the nozzle is used for cleaning and drying the surface of the sample.
Furthermore, the nozzle also comprises an etching nozzle, and etching liquid is sprayed to the sample through the etching nozzle.
Compared with the prior art, the utility model discloses an advantage and beneficial effect lie in:
1. the utility model can carry out fine grinding and coarse grinding on the sample through the grinding and polishing component, and can corrode the material to be corroded, thereby being applicable to metal or non-metal materials and enlarging the application range; and a pressure sensor is embedded in the sample table, so that the pressure during grinding and polishing can be conveniently determined, the grinding and polishing time can be reasonably controlled according to different materials, and the thickness of the polishing layer can be accurately controlled.
2. The utility model discloses can realize unmanned control automatic operation, reduce manpower and consumptive material cost, save time raises the efficiency.
3. The utility model discloses can throw pressure through pressure sensor and the cooperation adjustment mill of throwing the subassembly to throw pressure and time according to the mill that different material control corresponds, realize the thick accurate control of sample polishing layer.
Drawings
FIG. 1 is a schematic structural diagram of a novel fully automated three-dimensional slicing platform according to an embodiment;
FIG. 2 is a schematic view of the structure of FIG. 1 taken along direction AA';
FIG. 3 is a schematic view of the structure of FIG. 1 along the direction BB' when polishing is required;
fig. 4 is a cross-sectional view and a top view of the sample stage of fig. 1.
In the drawing, a test sample 1, a first upright post 10, a second upright post 20, a metallographic microscope 30, a camera 40, an X-axis guide rail 50, a Z-axis guide rail 60, a sample table 70, a clamp 71, a sample preparation cylindrical block 72, a first positioning hole 731, a second positioning hole 732, a threaded column knob 74, a grinding and polishing assembly 80, a stepping motor 81, a grinding disc 82, a spraying assembly 90, a spray pipe 91 and a spray nozzle 92.
Detailed Description
In order to make the present invention more clearly understood, the following detailed description of the present invention is made with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1 to 4, a novel fully automatic three-dimensional slicing platform is provided, which includes: the device comprises a control system, a first upright post 10, a second upright post 20, a metallographic microscope 30, a camera 40, an X-axis guide rail 50, a Z-axis guide rail 60, a sample table 70, a grinding and polishing assembly 80 and a spraying assembly 90; the control system is connected with the metallographic microscope 30, the camera 40, the X-axis guide rail 50, the Z-axis guide rail 60, the grinding and polishing assembly 80 and the spraying assembly 90; the first upright post 10 and the second upright post 20 are connected through an X-axis guide rail 50; the metallographic microscope 30 is arranged on the first upright post 10, and the camera 40 is arranged above the metallographic microscope 30 and is connected with the metallographic microscope 30; the X-axis guide rail 50 is provided with an X-axis sliding block, the X-axis sliding block can reciprocate on the X-axis guide rail, the Z-axis guide rail 60 is vertically arranged on the X-axis sliding block and can move in the horizontal direction under the driving of the X-axis sliding block, the Z-axis guide rail 60 is provided with a Z-axis sliding block, and the Z-axis sliding block can reciprocate on the Z-axis guide rail 60; the sample stage 70 is arranged on the Z-axis slide block and can move in the vertical direction under the driving of the Z-axis slide block, and the sample 1 is fixed on the sample stage 70 and is positioned below the metallographic microscope 30; a pressure sensor is embedded in the middle of the sample table 70, is positioned below the sample 1 and is used for detecting grinding and polishing pressure; the grinding and polishing assembly 80 and the spraying assembly 90 are both arranged on the second upright post 20, the spraying assembly 90 is positioned below the grinding and polishing assembly 80, the grinding and polishing assembly 80 is used for grinding and polishing a sample, and the spraying assembly 90 is used for cleaning and blow-drying the grinding and polishing assembly and the sample or is used for corroding the sample.
In the embodiment, a metallographic microscope 30, a camera 40, an X-axis guide 50, a Z-axis guide 60, a polishing component 80 and a spraying component 90 are connected through a control system, a first upright column 10 and a second upright column 20 are connected through the X-axis guide 50, the metallographic microscope 30 is arranged on the first upright column 10, the camera 40 is arranged above the metallographic microscope 30 and is connected with the metallographic microscope 30, the Z-axis guide 60 is arranged on the X-axis guide 50, a sample stage 70 is arranged on the Z-axis guide 60, so that the sample stage 70 can move in the horizontal and vertical directions, the sample 1 is fixed on the sample stage 70 and is positioned below the metallographic microscope 30, the sample 1 is convenient to observe the sample 1 through the metallographic microscope 30 and polish and spray the sample 1, a pressure sensor is embedded in the middle of the sample stage 70 and is positioned below the sample 1 for detecting polishing pressure, the polishing component 80 and the spraying component 90 are both arranged on the second upright column 20, the spraying assembly 90 is positioned below the grinding and polishing assembly 80, the grinding and polishing assembly 80 is used for grinding and polishing a test sample, the spraying assembly 90 is used for cleaning and drying the grinding and polishing assembly and the test sample or is used for corroding the test sample, the test sample is finely and coarsely ground through the grinding and polishing assembly 80, meanwhile, the material to be corroded by the spraying assembly 90 can be corroded, the spraying assembly is suitable for metal or nonmetal materials, and the application range is expanded; and a pressure sensor is embedded in the sample table 70, so that the pressure during grinding and polishing can be conveniently determined, the grinding and polishing time can be reasonably controlled according to different materials, and the thickness of the polishing layer can be accurately controlled.
The metallographic microscope 30 is provided with a CCD sensor, and the sample 1 is automatically focused by the CCD sensor.
Specifically, the metallographic microscope 30 adopts the CCD sensor to realize the auto-focusing function, and can also take a photograph of the sample 1 to obtain and store a metallographic photograph, thereby realizing auto-focusing photographing of the sample and improving the work efficiency.
Wherein, the sample stage 70 is further provided with a clamping assembly, and the sample 1 is fixed by the clamping assembly.
Specifically, the clamping assembly is arranged on the sample table 70, and the sample 1 is fixed through the clamping assembly, so that subsequent operations of grinding, polishing, cleaning, photographing and the like on the sample are facilitated.
The clamping assembly comprises a clamp 71 and a sample preparation cylindrical block 72, the clamp 71 is fixed on the sample table 70 and is provided with a concentric positioning hole with the sample table 70, and the diameter of a first positioning hole 731 of the sample table 70 is smaller than that of a second positioning hole 732 of the clamp 71; one end of the sample preparation cylindrical block 72 is embedded in the jig 71, and the other end thereof is passed through the second positioning hole 732 and is clearance-fitted to the sample 1 through the passed portion.
Specifically, the clamping assembly comprises a clamp 71 and a sample preparation cylindrical block 72, the clamp 71 is fixed on the sample stage 70, and a concentric positioning hole is formed in the clamp and the sample stage 70, the clamping assembly comprises a first positioning hole 731 corresponding to the sample stage 70 and a second positioning hole 732 corresponding to the clamp 71, the diameter of the first positioning hole 731 is smaller than that of the second positioning hole 732, so that a sample 1 is installed through the second positioning hole 732 with a larger hole diameter, one end of the sample preparation cylindrical block 72 is embedded in the clamp 71, the other end of the sample preparation cylindrical block passes through the second positioning hole 732, and the part where the sample preparation cylindrical block 72 passes through and the sample 1 are in clearance fit, so that the sample 1 is fixed.
The sample stage 70 further includes a threaded stud knob 74, and the threaded stud knob 74 penetrates into the first positioning hole 731 to adjust the surface height of the sample 1.
Specifically, set up the screw thread in first locating hole 731, and with the screw-thread fit of screw thread post knob, penetrate first locating hole 731 with the screw thread end of screw thread post knob 74, through the other end of rotatory screw thread post knob 74, promote sample 1 and move up, realize the fine setting to sample 1 height, be convenient for better observe and shoot sample 1.
The grinding and polishing assembly 80 comprises a stepping motor 81 and a grinding disc 82, the grinding disc 82 is connected with the output end of the stepping motor 81, and the grinding disc 82 is driven to rotate by the stepping motor 81 to grind and polish the sample 1.
Specifically, the grinding and polishing assembly 80 comprises a stepping motor 81 and a grinding disc 82, the grinding disc 82 is connected with the output end of the stepping motor 81, the grinding disc 82 is driven to rotate through the rotation of the stepping motor 81, when the sample 1 needs to be ground and polished, the position of the sample 1 is moved through an X-axis guide rail 50 and a Z-axis guide rail 60, the stepping motor 81 is started again, the sample 1 is ground and polished, meanwhile, a pressure sensor is matched, corresponding grinding and polishing time is set for samples made of different materials, and the control precision of grinding and polishing the thickness of a single layer is improved.
Wherein, spray assembly 90 includes spray tube 91 and nozzle 92, and spray tube 91 is used for spraying water or polishing solution, and nozzle 92 is used for washing and drying sample 1 surface.
Specifically, the spraying assembly 90 may include a plurality of spraying pipes 91 and spraying nozzles 92, and when water is sprayed through the spraying pipes 91, the grinding disc 82 and the sample 1 are cleaned; when the polishing liquid is sprayed out through the spray pipe 91, the functions of brightening and cleaning the sample are realized. The nozzle 92 may be used to clean and dry the surface of the sample 1 for subsequent observation and photographing of the sample surface.
Among them, the nozzle 92 further includes an etching nozzle through which an etching liquid is ejected to the sample.
Particularly, a sample material needing to be corroded is quickly corroded by spraying corrosive liquid through the corrosion nozzle, an electrolytic corrosion function can be realized through the external electrolysis module, and the sample treatment efficiency is improved.
In one embodiment, the use method of the platform is as follows:
step 1: the prepared sample is fastened and fixed in a first positioning hole of the sample table through a clamp, the up-down left-right adjustment of the sample is realized by controlling an X-axis guide rail and a Z-axis guide rail, and meanwhile, the height of the sample is adjusted by rotating a threaded column knob, so that the fine adjustment of the height of the sample is realized.
Step 2: when the first picture is taken, manual grinding and polishing are adopted, a pressure coefficient needs to be determined before grinding and polishing, and pressure calibration is carried out according to the pressure coefficient; and in the pressure calibration mode, placing the prepared balancing weight above the sample, and fitting the prepared balancing weight with a rated pressure coefficient, wherein the rated pressure is equivalent to the weight of the balancing weight.
And step 3: spraying liquid to moisten the grinding disc through a spray pipe; moving a sample table to the position below a grinding disc, performing coarse grinding and fine polishing on a sample, moving the sample table downwards to a nozzle after the sample table is polished for a set time, cleaning and drying the sample, and then moving the sample table to the position below a metallographic microscope; manually focusing through a metallographic microscope to find the optimal focal plane position, and shooting a first picture;
and 4, step 4: recording a focusing position through a control system, adjusting parameters in an automatic mode according to related parameters during manual grinding and polishing, starting automatic grinding and polishing, and repeating the step 3 until a preset number of metallographic pictures are obtained;
and 5: and performing three-dimensional reconstruction on the obtained sequence two-dimensional metallographic picture through software such as ORS Dragonfly or Simpleware and the like to obtain a metallographic structure three-dimensional reconstruction model of the sample.
Through the steps, the grinding and polishing time can be reasonably controlled according to different materials, and the thickness of the polishing layer can be accurately controlled.
The above description is provided for further details of the present invention with reference to specific embodiments, and it should not be construed that the embodiments of the present invention are limited to these descriptions. To the utility model belongs to the technical field of ordinary technical personnel, do not deviate from the utility model discloses under the prerequisite of design, can also make a plurality of simple deductions or replacement, all should regard as belonging to the utility model discloses a protection scope.
Claims (8)
1. The utility model provides a novel full-automatic three-dimensional section platform which characterized in that includes: the device comprises a control system, a first upright post, a second upright post, a metallographic microscope, a camera, an X-axis guide rail, a Z-axis guide rail, a sample table, a grinding and polishing assembly and a spraying assembly;
the control system is connected with the metallographic microscope, the camera, the X-axis guide rail, the Z-axis guide rail, the grinding and polishing assembly and the spraying assembly;
the first upright post and the second upright post are connected through an X-axis guide rail;
the metallographic microscope is arranged on the first stand column, and the camera is arranged above the metallographic microscope and is connected with the metallographic microscope;
the X-axis guide rail is provided with an X-axis sliding block, the X-axis sliding block can reciprocate on the X-axis guide rail, the Z-axis guide rail is vertically arranged on the X-axis sliding block and can move in the horizontal direction under the driving of the X-axis sliding block, the Z-axis guide rail is provided with a Z-axis sliding block, and the Z-axis sliding block can reciprocate on the Z-axis guide rail;
the sample stage is arranged on the Z-axis sliding block and can move in the vertical direction under the driving of the Z-axis sliding block, and a sample is fixed on the sample stage and is positioned below the metallographic microscope;
the middle part of the sample table is embedded with a pressure sensor, is positioned below the sample and is used for detecting grinding and polishing pressure;
the grinding and polishing assembly and the spraying assembly are arranged on the second stand column, the spraying assembly is located below the grinding and polishing assembly, the grinding and polishing assembly is used for grinding and polishing a sample, and the spraying assembly is used for cleaning and blow-drying the grinding and polishing assembly and the sample or is used for corroding the sample.
2. The novel full-automatic three-dimensional slicing platform according to claim 1, wherein said metallographic microscope is provided with a CCD sensor, and the sample is automatically focused by said CCD sensor.
3. The novel full-automatic three-dimensional slicing platform according to claim 1, wherein the sample stage is further provided with a clamping assembly, and the sample is fixed through the clamping assembly.
4. The novel full-automatic three-dimensional slicing platform according to claim 3, wherein the clamping assembly comprises a clamp and a sample preparation cylindrical block, the clamp is fixed on the sample stage and is provided with a concentric positioning hole with the sample stage, and the diameter of the first positioning hole of the sample stage is smaller than that of the second positioning hole of the clamp; one end of the sample preparation cylindrical block is embedded in the clamp, the other end of the sample preparation cylindrical block penetrates out of the second positioning hole, and the sample preparation cylindrical block is in clearance fit with the sample through the penetrating part.
5. The novel full-automatic three-dimensional slicing platform according to claim 4, wherein the sample stage further comprises a threaded post knob penetrating into the first positioning hole for adjusting the surface height of the sample.
6. The novel full-automatic three-dimensional slicing platform according to claim 1, wherein the polishing assembly comprises a stepping motor and a grinding disc, the grinding disc is connected with an output end of the stepping motor, and the grinding disc is driven by the stepping motor to rotate so as to polish the sample.
7. The novel full-automatic three-dimensional slicing platform according to claim 1, wherein said spray assembly comprises a spray pipe and a nozzle, said spray pipe is used for spraying water or polishing liquid, and said nozzle is used for cleaning and drying the surface of the sample.
8. The novel full-automatic three-dimensional slicing platform according to claim 7, wherein the nozzle further comprises a corrosion nozzle, and a corrosion liquid is sprayed to the sample through the corrosion nozzle.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220584869.5U CN217332180U (en) | 2022-03-17 | 2022-03-17 | Novel full-automatic three-dimensional slicing platform |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220584869.5U CN217332180U (en) | 2022-03-17 | 2022-03-17 | Novel full-automatic three-dimensional slicing platform |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217332180U true CN217332180U (en) | 2022-08-30 |
Family
ID=83002275
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202220584869.5U Active CN217332180U (en) | 2022-03-17 | 2022-03-17 | Novel full-automatic three-dimensional slicing platform |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217332180U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116223333A (en) * | 2023-01-06 | 2023-06-06 | 河北农业大学 | Automatic detection system for soil pore structure information |
-
2022
- 2022-03-17 CN CN202220584869.5U patent/CN217332180U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116223333A (en) * | 2023-01-06 | 2023-06-06 | 河北农业大学 | Automatic detection system for soil pore structure information |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN217332180U (en) | Novel full-automatic three-dimensional slicing platform | |
| CN106910665B (en) | A kind of scanning electron microscope and its detection method of full-automation | |
| CN108413892B (en) | Method and device for detecting three-dimensional surface topography of whole circumference of diamond wire saw | |
| CN101839696B (en) | Image-based radius template automatic calibrator | |
| CN209878676U (en) | Internal defect extension detection device for turbine engine rotor | |
| CN104390835B (en) | Three-dimensional atom probe sample preparation first stage polissoir | |
| CN114441359B (en) | Coating accelerated life laser thermal shock test in-situ test equipment | |
| CN108535070A (en) | A kind of laser boring micropore section and inner wall quality analysis sample preparation device and method | |
| CN206480587U (en) | A kind of full-automatic SEM | |
| CN113186588A (en) | Automatic intelligent polishing equipment for preparing metal nanometer needle point sample | |
| CN107560909A (en) | The device for preparing X ray nanometer CT metal micro-test samples based on local electrochemical etching | |
| CN114034998B (en) | Polymer three-dimensional electrical branch and partial discharge multi-channel joint measurement method and device | |
| CN210037436U (en) | In-situ stretching equipment for coating material in-situ stretching observation system | |
| CN111580262B (en) | Piezoelectric driving self-adjusting parallel testing device and method for visual imaging feedback | |
| CN209894601U (en) | In-situ stretching equipment for coating material in-situ stretching observation system | |
| CN211856406U (en) | In-situ electron microscope ion irradiation damage optical characteristic depth distribution analysis device | |
| CN216940053U (en) | Successive layer slicing equipment | |
| US7170075B2 (en) | Inspection tool with a 3D point sensor to develop a focus map | |
| GB2593399A (en) | Visual stereo dynamic 3D detection device for fluid spraying | |
| CN204302078U (en) | Three-dimensional atom probe sample preparation first stage polissoir | |
| CN108982344A (en) | Electrochemical corrosion development process original position micro-image scanning collection platform and method | |
| CN107034352B (en) | A kind of universal fixturing for laser impact intensified plane plate specimen | |
| CN220438179U (en) | Automatic inspection device for die steel annealing pearlite | |
| JPH0989786A (en) | Measuring apparatus for sensitization degree of metal surface | |
| WO2021258503A1 (en) | Fluid ejection visualization stereoscopic and dynamic 3d detection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |