CN217305432U

CN217305432U - Testing device for integrated circuit

Info

Publication number: CN217305432U
Application number: CN202220299805.0U
Authority: CN
Inventors: 陈华龙; 刘子杭; 陈翠丽
Original assignee: Hangzhou Shuhui Information Technology Co ltd
Current assignee: Hangzhou Shuhui Information Technology Co ltd
Priority date: 2022-02-15
Filing date: 2022-02-15
Publication date: 2022-08-26
Anticipated expiration: 2032-02-15

Abstract

The utility model discloses a testing arrangement for integrated circuit, including the tester, the top of tester articulates through the pivot has the notch plate, and the inside sliding connection of notch plate has the sliding sleeve, and the bottom of sliding sleeve is passed the notch plate and is extended to the bottom fixedly connected with of notch plate and accomodates the cover, and the top of accomodating set inner wall articulates through the pivot has the baffle, accomodates the bottom fixedly connected with backing plate of cover inner wall, and the left side of backing plate is passed through the magic and is pasted and the baffle bonding. The utility model discloses pass through the backing plate by the baffle and accomodate the cover and accomodate the protection to the test wire, pass through sliding sleeve and T shape pole drive by the extension spring again and accomodate the cover and compress tightly on the surface of rubber sleeve, seal the protection to the socket face of tester to possessed and be convenient for accomodate the advantage of protection, solved current testing arrangement and after using, can 'T accomodate the test wire, can' T protect simultaneously, the dust gets into the inside of socket easily and causes the problem of influence to the component.

Description

Testing device for integrated circuit

Technical Field

The utility model relates to an integrated circuit technical field specifically is a testing arrangement for integrated circuit.

Background

In the maintenance process of part of integrated circuit boards, a testing device is used for testing, but the existing testing device cannot accommodate a testing wire after being used, and cannot protect the testing wire, and dust easily enters the inside of the socket to influence elements.

SUMMERY OF THE UTILITY MODEL

For solving the problem that provides in the above-mentioned background art, the utility model aims to provide a testing arrangement for integrated circuit has possessed the advantage of being convenient for accomodate the protection, has solved current testing arrangement and has used the back, can't accomodate the test wire, can't protect simultaneously, and the dust gets into the inside of socket easily and causes the problem of influence to the component.

In order to achieve the above object, the utility model provides a following technical scheme: a testing device for integrated circuit comprises a tester, a concave plate hinged to the top of the tester via a shaft pin, the interior of the concave plate is connected with a sliding sleeve in a sliding way, the bottom end of the sliding sleeve penetrates through the concave plate and extends to the bottom of the concave plate to be fixedly connected with a containing sleeve, the top of the inner wall of the containing sleeve is hinged with a baffle plate through a shaft pin, the bottom of the inner wall of the containing sleeve is fixedly connected with a backing plate, the left side of the backing plate is bonded with the baffle plate through a magic tape, the left side of the sliding sleeve is fixedly connected with a tension spring, the left end of the tension spring is fixedly connected inside the concave plate, the front side and the rear side of the top of the concave plate are both hinged with a T-shaped rod through a shaft pin, the front end and the rear end at sliding sleeve top have all been seted up the opening, the bottom of T shape pole extends to the open-ended inside, the right side fixedly connected with of tester is located accomodates the inside rubber sleeve of cover.

As the utility model discloses preferred, the top on tester right side and the equal fixedly connected with kelly in bottom, accomodate the cover and slide and cup joint the surface at the kelly.

As the utility model discloses preferred, the top fixedly connected with stop collar of notch plate, the stop collar slides and cup joints on the surface of T shape pole.

As the utility model discloses preferred, the equal horizontal fixedly connected with slide bar in front side and the rear side of concave plate inner chamber, the sliding sleeve slides and cup joints the surface at the slide bar.

As the utility model discloses preferred, the top of stop collar and the equal fixedly connected with foam-rubber cushion in bottom of notch plate, the bottom of foam-rubber cushion and the top contact of tester.

As the utility model discloses preferred, the left side of baffle and the equal fixedly connected with arm-tie in right side of T shape pole, the shape on rubber sleeve surface is the convex.

Compared with the prior art, the beneficial effects of the utility model are as follows:

1. the utility model discloses pass through the backing plate by the baffle and accomodate the cover and accomodate the protection to the test wire, pass through sliding sleeve and T shape pole drive by the extension spring again and accomodate the cover and compress tightly on the surface of rubber sleeve, seal the protection to the socket face of tester to possessed and be convenient for accomodate the advantage of protection, solved current testing arrangement and after using, can 'T accomodate the test wire, can' T protect simultaneously, the dust gets into the inside of socket easily and causes the problem of influence to the component.

2. The utility model discloses a set up the kelly, can carry out spacingly to accomodating the cover, improved the stability of accomodating the cover.

3. The utility model discloses a set up the stop collar, can increase the area of contact between T shape pole and the concave plate, improved the support intensity of T shape pole.

4. The utility model discloses a set up the slide bar, can carry on spacingly to the sliding sleeve, avoided the sliding sleeve to appear wobbling phenomenon when removing.

5. The utility model discloses a set up the foam-rubber cushion, can protect the notch plate, avoided notch plate and tester phenomenon that the collision appears, improved the life of notch plate.

6. The utility model discloses a set up the arm-tie, can the convenient to use person stimulate the baffle, avoided the phenomenon that the user can't effectively stimulate the baffle.

Drawings

FIG. 1 is a schematic structural view of the present invention;

FIG. 2 is an enlarged structural view of the point A in FIG. 1 according to the present invention;

FIG. 3 is a schematic top view of the T-bar of the present invention;

fig. 4 is a schematic perspective view of the sliding sleeve of the present invention.

In the figure: 1. a tester; 2. a concave plate; 3. a sliding sleeve; 4. a storage sleeve; 5. a baffle plate; 6. a base plate; 7. a tension spring; 8. a T-shaped rod; 9. an opening; 10. a rubber sleeve; 11. a clamping rod; 12. a limiting sleeve; 13. a slide bar; 14. a sponge cushion; 15. and (5) pulling the plate.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

As shown in fig. 1 to 4, the utility model provides a pair of testing arrangement for integrated circuit, including tester 1, tester 1's top is articulated to have concave plate 2 through the pivot, the inside sliding connection of concave plate 2 has sliding sleeve 3, concave plate 2 and the bottom fixedly connected with that extends to concave plate 2 are passed to sliding sleeve 3's bottom and accomodate cover 4, it has baffle 5 to accomodate the top of cover 4 inner wall through the pivot is articulated, accomodate the bottom fixedly connected with backing plate 6 of cover 4 inner wall, magic subsides and baffle 5 bonding are passed through in backing plate 6's left side, sliding sleeve 3's left side fixedly connected with extension spring 7, the left end fixed connection of extension spring 7 is in concave plate 2's inside, the front side at concave plate 2 top all articulates through the pivot with the rear side has T shape pole 8, opening 9 has all been seted up to the front end at sliding sleeve 3 top and rear end, the bottom of T shape pole 8 extends to opening 9's inside, tester 1's right side fixedly connected with is located accomodates the inside rubber sleeve 10 of cover 4.

Referring to fig. 2, the top and the bottom on the right side of the tester 1 are fixedly connected with a clamping rod 11, and the containing sleeve 4 is slidably sleeved on the surface of the clamping rod 11.

As the utility model discloses a technical optimization scheme through setting up kelly 11, can carry on spacingly to accomodating cover 4, has improved the stability of accomodating cover 4.

Referring to fig. 2, a position-limiting sleeve 12 is fixedly connected to the top of the concave plate 2, and the position-limiting sleeve 12 is slidably sleeved on the surface of the T-shaped rod 8.

As the utility model discloses a technical optimization scheme, through setting up stop collar 12, can increase the area of contact between T shape pole 8 and the notch plate 2, improved T shape pole 8's support intensity.

Referring to fig. 2, a sliding rod 13 is fixedly connected to both the front side and the rear side of the cavity of the concave plate 2, and the sliding sleeve 3 is slidably sleeved on the surface of the sliding rod 13.

As a technical optimization scheme of the utility model, through setting up slide bar 13, can carry on spacingly to sliding sleeve 3, avoided sliding sleeve 3 to appear wobbling phenomenon when removing.

Referring to fig. 2, a sponge mat 14 is fixedly connected to the top of the position-limiting sleeve 12 and the bottom of the concave plate 2, and the bottom of the sponge mat 14 is in contact with the top of the tester 1.

As the utility model discloses a technical optimization scheme through setting up foam-rubber cushion 14, can protect notch plate 2, has avoided notch plate 2 and tester 1 phenomenon that the collision appears, has improved notch plate 2's life.

Referring to fig. 2, a pulling plate 15 is fixedly connected to both the left side of the baffle 5 and the right side of the T-shaped rod 8, and the surface of the rubber sleeve 10 is convex.

As a technical optimization scheme of the utility model, through setting up arm-tie 15, can the person of facilitating the use stimulate baffle 5, avoided the unable phenomenon of effectively stimulating baffle 5 of user.

The utility model discloses a theory of operation and use flow: when the tester is used, a user firstly presses the T-shaped rod 8, the T-shaped rod 8 can push the sliding sleeve 3 rightwards through the opening 9 while rotating, the sliding sleeve 3 drives the containing sleeve 4 to move rightwards, when the clamping rod 11 is separated from the containing sleeve 4, the concave plate 2 is rotated anticlockwise, the containing sleeve 4 can be opened, then the baffle 5 is opened, a test lead is placed in the containing sleeve 4, the containing sleeve 4 is protected by the baffle 5 contacting with the backing plate 6, finally the concave plate 2 is rotated clockwise, the concave plate 2 drives the containing sleeve 4 to move to the right side of the tester 1 through the sliding sleeve 3, then the T-shaped rod 8 is loosened, the tension spring 7 drives the sliding sleeve 3 to move leftwards through tension, the sliding sleeve 3 can push the T-shaped rod 8 to reset, because the right side of the tester 1 is a socket surface, the sliding sleeve 3 can drive the containing sleeve 4 to be tightly pressed on the surface of the rubber sleeve 10 for sealing protection, thereby reach and be convenient for accomodate the protection.

In summary, the following steps: this testing arrangement for integrated circuit, accomodate the protection through backing plate 6 and accomodate cover 4 to the test wire by baffle 5, it compresses tightly on the surface of rubber sleeve 10 to drive to accomodate cover 4 through sliding sleeve 3 and T shape pole 8 by extension spring 7 again, sealed protection is carried out to the socket face of tester 1, thereby possessed and be convenient for accomodate the advantage of protection, solved current testing arrangement after using, can 'T accomodate the test wire, can' T protect simultaneously, the dust gets into the inside of socket easily and causes the problem of influence to the component.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. A test apparatus for an integrated circuit, comprising a tester (1), characterized in that: the tester comprises a tester body, wherein the top of the tester body (1) is hinged with a concave plate (2) through a shaft pin, the inner part of the concave plate (2) is connected with a sliding sleeve (3) in a sliding manner, the bottom of the sliding sleeve (3) penetrates through the concave plate (2) and extends to the bottom of the concave plate (2) to be fixedly connected with a containing sleeve (4), the top of the inner wall of the containing sleeve (4) is hinged with a baffle (5) through the shaft pin, the bottom of the inner wall of the containing sleeve (4) is fixedly connected with a backing plate (6), the left side of the backing plate (6) is adhered with the baffle (5) through a magic tape, the left side of the sliding sleeve (3) is fixedly connected with a tension spring (7), the left end of the tension spring (7) is fixedly connected inside the concave plate (2), the front side and the rear side of the top of the concave plate (2) are both hinged with T-shaped rods (8) through the shaft pin, openings (9) are formed in the front end and the rear end of the top of the sliding sleeve (3), the bottom of T shape pole (8) extends to the inside of opening (9), the right side fixedly connected with of tester (1) is located accomodate inside rubber sleeve (10) of cover (4).

2. A test apparatus for an integrated circuit as defined in claim 1, wherein: the top and the bottom on the right side of the tester (1) are fixedly connected with clamping rods (11), and the accommodating sleeve (4) is sleeved on the surface of the clamping rods (11) in a sliding mode.

3. A test apparatus for an integrated circuit as defined in claim 1, wherein: the top of the concave plate (2) is fixedly connected with a limiting sleeve (12), and the limiting sleeve (12) is sleeved on the surface of the T-shaped rod (8) in a sliding mode.

4. A test apparatus for an integrated circuit as defined in claim 1, wherein: the front side and the rear side of the inner cavity of the concave plate (2) are transversely and fixedly connected with sliding rods (13), and the sliding sleeve (3) is sleeved on the surface of the sliding rods (13) in a sliding mode.

5. A test apparatus for an integrated circuit as defined in claim 3, wherein: the top of the limiting sleeve (12) and the bottom of the concave plate (2) are fixedly connected with a sponge cushion (14), and the bottom of the sponge cushion (14) is in contact with the top of the tester (1).

6. A test apparatus for an integrated circuit as defined in claim 1, wherein: the left side of baffle (5) and the equal fixedly connected with arm-tie (15) in right side of T shape pole (8), the shape on rubber sleeve (10) surface is the convex.