CN217278672U - Aging testing cabinet - Google Patents

Aging testing cabinet Download PDF

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Publication number
CN217278672U
CN217278672U CN202123288129.1U CN202123288129U CN217278672U CN 217278672 U CN217278672 U CN 217278672U CN 202123288129 U CN202123288129 U CN 202123288129U CN 217278672 U CN217278672 U CN 217278672U
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China
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testing
cabinet body
electrically connected
cabinet
test
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CN202123288129.1U
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Chinese (zh)
Inventor
詹焕
张剑勇
黄永明
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Huiju Storage Technology Dongguan Co ltd
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Huiju Electric Technology Dongguan Industrial Co Ltd
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Abstract

The utility model discloses an aging testing cabinet for carry out aging testing work to solid state hard drives, include: the refrigerator comprises a cabinet body, wherein a first partition plate is arranged in the cabinet body; the testing mechanism comprises a plurality of first testing components and a plurality of second testing components, the first testing components and the second testing components are fixedly arranged on two sides of the first partition plate respectively, the first testing components are electrically connected with the tested workpiece respectively, and the second testing components are electrically connected with the first testing components respectively; the thermal circulation mechanism is arranged in the cabinet body and is used for heating the first test assembly; the cooling mechanism is arranged in the cabinet body and used for cooling the second testing assembly; and the control box is electrically connected with the testing mechanism, the thermal circulation mechanism and the cooling mechanism respectively. The utility model discloses multiplicable equipment life reduces the product harmfully.

Description

Aging test cabinet
Technical Field
The utility model relates to an aging testing technical field specifically is an aging testing cabinet.
Background
The high-temperature aging test equipment is a high-temperature and severe environment test equipment which is simulated aiming at high-performance electronic products, is important experimental equipment for improving the stability and the reliability of products, is an important production process for improving the quality and the competitiveness of products of various production enterprises, and is widely applied to the fields of power electronics, computers, communication, biological pharmacy and the like.
The aging test for the solid state disk is different from the traditional aging test, because the operating environment of the solid state disk is simulated and the performance of the solid state disk during working is tested, the solid state disk is generally assembled to a complete computer and then subjected to the aging test, but other computer accessories are heated in the testing process, so that the performance and the service life of the computer accessories are seriously affected, and therefore improvement needs to be carried out on the problems.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide an aging testing cabinet possesses increase equipment life, reduces the bad advantage of product, has solved the problem of proposing in the above background art.
In order to achieve the above object, the utility model provides a following technical scheme: an aging test cabinet is used for aging test work of a solid state disk and comprises:
the refrigerator comprises a cabinet body, wherein a first partition plate is arranged in the cabinet body;
the testing mechanism comprises a plurality of first testing components and a plurality of second testing components, the plurality of first testing components and the plurality of second testing components are fixedly arranged on two sides of the first partition plate respectively, the plurality of first testing components are electrically connected with a workpiece to be tested respectively, and the plurality of second testing components are electrically connected with the plurality of first testing components respectively;
the thermal circulation mechanism is arranged in the cabinet body and is used for heating the first test assembly;
the cooling mechanism is arranged in the cabinet body and used for cooling the second testing assembly;
and the control box is electrically connected with the testing mechanism, the thermal circulation mechanism and the cooling mechanism respectively.
Preferably, the cabinet body is provided with an inner box, the inner box is fixedly mounted on the first partition plate and contains the plurality of first test assemblies, a first hole plate is arranged on the lower box wall of the inner box, a circulation channel is formed between the inner box and the cabinet body, and the thermal circulation mechanism is communicated with the circulation channel.
Preferably, the thermal cycle mechanism includes a second partition plate, a vent line and two sets of thermal cycle components, the second partition plate is arranged above the inner box and separates the cycle channel, the vent line is arranged above the second partition plate and communicates the cycle channel with the outer side of the cabinet body, and the two sets of thermal cycle components are respectively arranged on two sides of the second partition plate.
Preferably, the thermal cycle subassembly includes wind wheel, driving motor, electrothermal tube and control box, the last case wall of inner box is equipped with the through-hole, the wind wheel is located the through-hole top, just the wind wheel with driving motor transmission is connected, the electrothermal tube is located in the circulation channel, just the electrothermal tube with control box electric connection.
Preferably, the cooling mechanism includes two sets of fans, the cabinet body is equipped with second hole board, and is two sets of the fan with second hole board is all located be close to on the cabinet body one side of second test component, and two sets of the fan with second hole board is located respectively the upper and lower both ends face of the cabinet body.
Preferably, the first partition board is provided with a plurality of mounting brackets, the first testing component comprises a testing jig board, the testing jig board is fixedly mounted on one side of the mounting brackets, and the testing jig board is electrically connected with the second testing component and the tested workpiece respectively.
Preferably, the second testing component includes a power supply, a memory, a CPU and a motherboard, the power supply, the memory, the CPU and the motherboard are all fixedly mounted on the other side of the mounting rack, and the power supply, the memory and the CPU are respectively electrically connected with the motherboard, and the motherboard is electrically connected with the testing jig board.
Compared with the prior art, the beneficial effects of the utility model are as follows:
one, the utility model discloses a set up first baffle, first baffle set up with the cabinet is internal, and will the cabinet body separates for two regions, and first test subassembly and second test subassembly set up respectively in two regions to set up thermal cycle mechanism and cooling body in two regions respectively, influence computer hardware with heat when preventing aging test, reached increase life's effect.
Two, the utility model discloses a set up the inner box, inner box fixed mounting in on the first baffle, and will be a plurality of including first test component holds, just the nowel wall of inner box is equipped with first hole board, the inner box with form a circulation channel between the cabinet body, thermal cycle mechanism with circulation channel is linked together, by the internal case bulk heating of thermal cycle mechanism, avoids the unbalanced product damage that leads to of temperature, has reached the bad effect of reduction product.
Drawings
Fig. 1 is one of the schematic structural diagrams of the present invention;
FIG. 2 is a second schematic view of the present invention;
fig. 3 is a third schematic structural diagram of the present invention;
FIG. 4 is a schematic structural diagram of a testing mechanism according to the present invention;
fig. 5 is a second schematic structural diagram of the testing mechanism of the present invention.
The reference numerals and names in the figures are as follows:
1. a cabinet body; 11. a first separator; 111. a mounting frame; 12. an inner box; 121. a first orifice plate; 122. a through hole; 13. a circulation channel; 14. a second hole plate; 2. a testing mechanism; 21. a first test assembly; 211. testing the jig plate; 22. a second test assembly; 221. a power source; 222. a memory; 223. a CPU; 224. a main board; 3. a thermal cycling mechanism; 31. a second separator; 32. a vent line; 33. a thermal cycle assembly; 331. a wind wheel; 332. a drive motor; 333. an electric heating tube; 334. a control box; 4. a cooling mechanism; 41. a fan; 5. and a control box.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1 to 5, the present invention provides an embodiment: an aging test cabinet is used for aging test work of a solid state disk and comprises:
the refrigerator comprises a cabinet body 1, wherein a first partition plate 11 is arranged in the cabinet body 1;
the testing mechanism 2 comprises a plurality of first testing assemblies 21 and a plurality of second testing assemblies 22, the plurality of first testing assemblies 21 and the plurality of second testing assemblies 22 are respectively and fixedly installed on two sides of the first partition plate 11, the plurality of first testing assemblies 21 are respectively and electrically connected with a workpiece to be tested, and the plurality of second testing assemblies 22 are respectively and electrically connected with the plurality of first testing assemblies 21;
the thermal circulation mechanism 3 is arranged in the cabinet body 1, and the thermal circulation mechanism 3 is used for heating the first test assembly 21;
the cooling mechanism 4 is arranged in the cabinet body 1, and the cooling mechanism 4 is used for cooling the second testing component 22;
and the control box 5 is electrically connected with the testing mechanism 2, the thermal circulation mechanism 3 and the cooling mechanism 4 respectively.
More specifically, the cabinet body 1 is equipped with the inner box 12, the inner box 12 fixed mounting in on the first baffle 11, and will be a plurality of including first test component 21 holds, just the lower boxwall of inner box 12 is equipped with first hole board 121, the inner box 12 with form a circulation channel 13 between the cabinet body 1, thermal cycle mechanism 3 with circulation channel 13 is linked together, is heated inner box 12 by thermal cycle mechanism 3 wholly, avoids the temperature imbalance to lead to the product to damage.
More specifically, the thermal circulation mechanism 3 includes a second partition plate 31, an air duct 32 and two sets of thermal circulation assemblies 33, the second partition plate 31 is disposed above the inner box 12 and partitions the circulation passage 13, the air duct 32 is disposed above the second partition plate 31 and connects the circulation passage 13 with the outside of the cabinet 1, and the two sets of thermal circulation assemblies 33 are respectively disposed on two sides of the second partition plate 31.
More specifically, the thermal cycle component 33 includes a wind wheel 331, a driving motor 332, an electric heating tube 333 and a control box 334, a through hole 122 is formed in the upper box wall of the inner box 12, the wind wheel 331 is disposed above the through hole 122, the wind wheel 331 is in transmission connection with the driving motor 332, the electric heating tube 333 is disposed in the circulation channel 13, the electric heating tube 333 is electrically connected with the control box 334, and the wind wheel 331 is configured to extract air in the inner box 12 so as to drive the air heated by the electric heating tube 333 to enter the inner box 12 through the circulation channel 13 and the first hole plate 121, so that the heating effect is more balanced, and the product is prevented from being damaged due to uneven heating.
More specifically, the cooling mechanism 4 includes two sets of fans 41, the cabinet body 1 is equipped with second hole board 14, and is two sets of fan 41 with second hole board 14 all locates be close to on the cabinet body 1 one side of second test component 22, and two sets of fan 41 with second hole board 14 locates respectively the upper and lower both ends face of the cabinet body 1, second hole board 14 are linked together with the equipment external world to improve the heat exchange rate, reduce the operating temperature of second test component 22, prolong its working life.
More specifically, the first partition 11 is provided with a plurality of mounting brackets 111, the first testing component 21 includes a testing jig plate 211, the testing jig plate 211 is fixedly mounted on one side of the mounting brackets 111, and the testing jig plate 211 is electrically connected to the second testing component 22 and the tested workpiece respectively.
More specifically, the second testing component 22 includes a power supply 221, a memory 222, a CPU223 and a motherboard 224, the power supply 221, the memory, the CPU223 and the motherboard 224 are all fixedly mounted on the other side of the mounting frame 111, the power supply 221, the memory 222 and the CPU223 are respectively electrically connected with the motherboard 224, and the motherboard 224 is electrically connected with the testing fixture board 211.
It is obvious to a person skilled in the art that the invention is not restricted to details of the above-described exemplary embodiments, but that it can be implemented in other specific forms without departing from the spirit or essential characteristics of the invention. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims (7)

1. The utility model provides an aging testing cabinet for carry out aging testing work to solid state hard drives, its characterized in that includes:
the refrigerator comprises a cabinet body (1), wherein a first partition plate (11) is arranged in the cabinet body (1);
the testing mechanism (2) comprises a plurality of first testing assemblies (21) and a plurality of second testing assemblies (22), the plurality of first testing assemblies (21) and the plurality of second testing assemblies (22) are fixedly installed on two sides of the first partition plate (11) respectively, the plurality of first testing assemblies (21) are electrically connected with a workpiece to be tested respectively, and the plurality of second testing assemblies (22) are electrically connected with the plurality of first testing assemblies (21) respectively;
the thermal circulation mechanism (3) is arranged in the cabinet body (1), and the thermal circulation mechanism (3) is used for heating the first test assembly (21);
the cooling mechanism (4), the cooling mechanism (4) is arranged in the cabinet body (1), and the cooling mechanism (4) is used for cooling the second testing component (22);
and the control box (5) is electrically connected with the testing mechanism (2), the thermal circulation mechanism (3) and the cooling mechanism (4) respectively.
2. The burn-in test cabinet of claim 1, wherein: the cabinet body (1) is equipped with inner box (12), inner box (12) fixed mounting in on first baffle (11), and will be a plurality of including first test component (21), just the lower box wall of inner box (12) is equipped with first hole board (121), inner box (12) with form a circulation passageway (13) between the cabinet body (1), thermal cycle mechanism (3) with circulation passageway (13) are linked together.
3. The burn-in test cabinet of claim 2, wherein: thermal cycle mechanism (3) include second baffle (31), vent line (32) and two sets of thermal cycle subassembly (33), second baffle (31) are located the top of inner box (12) is separated circulation channel (13), vent line (32) are located second baffle (31) top, and will circulation channel (13) with the cabinet body (1) outside is linked together, and is two sets of thermal cycle subassembly (33) are located respectively the both sides of second baffle (31).
4. The burn-in test cabinet of claim 3, wherein: the heat cycle component (33) comprises a wind wheel (331), a driving motor (332), an electric heating tube (333) and a control box (334), wherein a through hole (122) is formed in the upper box wall of the inner box (12), the wind wheel (331) is arranged above the through hole (122), the wind wheel (331) is in transmission connection with the driving motor (332), the electric heating tube (333) is arranged in the circulation channel (13), and the electric heating tube (333) is electrically connected with the control box (334).
5. The burn-in test cabinet of claim 1, wherein: the cooling mechanism (4) comprises two sets of fans (41), the cabinet body (1) is provided with a second hole plate (14), the fans (41) and the second hole plate (14) are arranged on the cabinet body (1) and close to one side of the second testing assembly (22), and the fans (41) and the second hole plate (14) are arranged on the upper end face and the lower end face of the cabinet body (1) respectively.
6. The aging test cabinet according to any one of claims 1 to 5, wherein: the first partition plate (11) is provided with a plurality of mounting frames (111), the first testing assembly (21) comprises a testing jig plate (211), the testing jig plate (211) is fixedly mounted on one side of the mounting frames (111), and the testing jig plate (211) is electrically connected with the second testing assembly (22) and a tested workpiece respectively.
7. The weathering test cabinet of claim 6, wherein: the second testing component (22) comprises a power supply (221), a memory (222), a CPU (223) and a main board (224), wherein the power supply (221), the memory, the CPU (223) and the main board (224) are fixedly mounted on the other side of the mounting frame (111), the power supply (221), the memory (222) and the CPU (223) are respectively electrically connected with the main board (224), and the main board (224) is electrically connected with the testing jig board (211).
CN202123288129.1U 2021-12-24 2021-12-24 Aging testing cabinet Active CN217278672U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202123288129.1U CN217278672U (en) 2021-12-24 2021-12-24 Aging testing cabinet

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202123288129.1U CN217278672U (en) 2021-12-24 2021-12-24 Aging testing cabinet

Publications (1)

Publication Number Publication Date
CN217278672U true CN217278672U (en) 2022-08-23

Family

ID=82888864

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202123288129.1U Active CN217278672U (en) 2021-12-24 2021-12-24 Aging testing cabinet

Country Status (1)

Country Link
CN (1) CN217278672U (en)

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GR01 Patent grant
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Address after: Room 501, Building 4, No. 3 Yongtai Road, Tangxia Town, Dongguan City, Guangdong Province, 523000

Patentee after: Huiju Storage Technology (Dongguan) Co.,Ltd.

Country or region after: China

Address before: 523000 Building 1, No. 7, Keyuan fifth road, Tangxia Town, Dongguan City, Guangdong Province

Patentee before: Huiju Electric Technology (Dongguan) Industrial Co.,Ltd.

Country or region before: China

CP03 Change of name, title or address