CN217238251U - Multi-load testing device - Google Patents
Multi-load testing device Download PDFInfo
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- CN217238251U CN217238251U CN202220766710.5U CN202220766710U CN217238251U CN 217238251 U CN217238251 U CN 217238251U CN 202220766710 U CN202220766710 U CN 202220766710U CN 217238251 U CN217238251 U CN 217238251U
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Abstract
The application relates to the field of device testing, in particular to a multi-load testing device, wherein the device comprises: a plurality of loads; the switch assembly is respectively connected with the terminal to be tested and each load of the plurality of loads so as to conduct a test circuit of one or more loads; the communication component is arranged on the multi-load testing device and receives a current testing item sent by the external electronic equipment; the testing component is respectively connected with the switch component and the communication component, controls the switch component to conduct a testing circuit of one or more loads according to the current testing item, and tests the peak current consumption of the terminal to be tested under different loads. Therefore, the problem that the peak current consumption difference is large due to the fact that the load needs to be replaced manually in the peak current consumption testing process is solved, the impedance can be automatically adjusted under the control of the testing assembly, automatic testing of the peak current consumption of the terminal to be tested under different loads is achieved, testing accuracy can be improved, the cost is low, and the method is simple and easy to achieve.
Description
Technical Field
The application relates to the technical field of device testing, in particular to a multi-load testing device.
Background
In daily life, when the output signal distortion of a certain device cannot meet the requirements of people, a Power Amplifier (PA) is often installed to generate maximum Power output to drive a load to amplify the captured effective information, which requires verifying the performance of the PA to ensure the sensitivity of the device output. When the performance of the PA needs to be verified, the PA is generally tested for peak current consumption under open circuit, short circuit, 50 Ω, capacitive load, and inductive load, so as to obtain the effective performance of the PA.
In the related art, the way to test the peak current consumption of the PA under different loads is as follows: the PA is not externally connected with an antenna when being tested under the condition of open load, is short-circuited by an external tool when being tested under the condition of short-circuit load, is directly connected with an instrument end when being tested under the condition of 50 omega resistance load, and is mostly replaced by equivalent radio frequency wires with different lengths when being tested under the conditions of capacitive load and inductive load.
However, the sensitivity of the peak current consumption makes the peak current consumption greatly influenced by the load, so that different loads, especially the peak current consumption under the conditions of short-circuit load, capacitive load and inductive load, are greatly different when different operators replace different loads to test, and a solution is needed.
SUMMERY OF THE UTILITY MODEL
The application provides a multi-load testing device, which aims to solve the problems that in the process of testing peak current consumption, the peak current consumption difference is large due to the fact that the load needs to be replaced manually, and the like, can automatically adjust impedance under the control of a testing assembly, achieves automatic testing of the peak current consumption of a terminal to be tested under different loads, can improve testing accuracy, is low in cost, and is simple and easy to achieve. The application provides a multi-load testing device, including following step:
a plurality of loads;
the switch assembly is respectively connected with the terminal to be tested and each load of the plurality of loads so as to conduct a test circuit of one or more loads;
the communication assembly is arranged on the multi-load testing device and receives a current testing item sent by external electronic equipment; and
the testing component is respectively connected with the switch component and the communication component, controls the switch component to conduct the testing circuit of the one or more loads according to the current testing item, and tests the peak current consumption of the terminal to be tested under different loads.
Optionally, the switch assembly comprises:
one end of the first radio frequency seat is connected with a second radio frequency seat on the terminal to be tested through a radio frequency line;
and the test switch is respectively connected with the plurality of loads and the test component, so that the test component controls the test switch to conduct the test circuit of the one or more loads according to the current test item.
Optionally, the switch assembly further includes:
and one end of the matching unit is connected with the other end of the first radio frequency seat, and the other end of the matching unit is connected with the test switch and used for matching the test component to the test parameters which are consistent with the terminal to be tested.
Optionally, the multi-load testing apparatus further includes:
and the third radio frequency base is arranged on the switch assembly and used for controlling the switch assembly to be in an open circuit state when the third radio frequency base is conducted with the test switch.
Optionally, the multi-load testing apparatus further includes:
and the display component is connected with the test component and is used for displaying the peak current consumption of the terminal to be tested under different loads when the test component controls the test switch to conduct the test circuit of one or more loads according to the current test item.
Optionally, the multi-load testing apparatus further includes:
and the alarm component is connected with the test component and used for alarming when the peak current consumption of the terminal to be tested is abnormal.
Optionally, the alarm assembly comprises:
the optical alarm unit is connected with the testing component and used for giving an optical alarm when the peak current consumption of the terminal to be tested is abnormal; and/or
And the at least one acoustic alarm unit is connected with the test component and is used for performing acoustic alarm when the peak current consumption of the terminal to be tested is abnormal.
Optionally, the test component is a single chip microcomputer.
Optionally, the plurality of loads comprises at least two of a 50 Ω resistance, an inductive load, a capacitive load, and a short circuit load.
According to the multi-load testing device, the testing component is respectively connected with the switch component and the communication component, the testing component controls the switch component to conduct a testing circuit of one or more loads according to the current testing item, and peak current consumption of the terminal to be tested under different loads is tested. Therefore, the problem that the peak current consumption difference is large due to the fact that the load needs to be replaced manually in the peak current consumption testing process is solved, the impedance can be automatically adjusted under the control of the testing assembly, automatic testing of the peak current consumption of the terminal to be tested under different loads is achieved, testing accuracy can be improved, the cost is low, and the method is simple and easy to achieve.
Additional aspects and advantages of the present application will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the present application.
Drawings
The foregoing and/or additional aspects and advantages of the present application will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 is an exemplary diagram of a multi-load testing apparatus according to an embodiment of the present application;
FIG. 2 is a diagram illustrating an example of a connection method on a multi-load testing device according to an embodiment of the present application.
Detailed Description
Reference will now be made in detail to the embodiments of the present application, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present application and should not be construed as limiting the present application.
A multi-load test apparatus of an embodiment of the present application is described below with reference to the drawings. In order to solve the problem that peak current consumption difference is large due to the fact that peak current consumption is affected by loads when a test PA is subjected to peak current consumption under open circuit, short circuit, 50 omega, capacitive load and inductive load when loads are replaced manually in the background art, the multi-load test device is provided. Therefore, the problems that in the process of testing the peak current consumption, the peak current consumption difference is large due to the fact that the load needs to be replaced manually and the like are solved, the impedance can be automatically adjusted under the control of the testing assembly, automatic testing of the peak current consumption of the terminal to be tested under different loads is achieved, the testing accuracy can be improved, the cost is low, and the method is simple and easy to achieve.
Specifically, fig. 1 is an exemplary diagram of a multi-load testing apparatus according to an embodiment of the present disclosure.
As shown in fig. 1, the multi-load test apparatus 10 includes: a plurality of loads 100, a switching assembly 200, a communication assembly 300, and a test assembly 400.
Wherein the switching assembly 200 is respectively connected to a terminal to be tested and each of the plurality of loads 100 to turn on a test circuit of one or more loads 100; the communication component 300 is disposed on the multi-load testing apparatus 10, the communication component 300 receives a current test item sent by an external electronic device, the test component 400 is connected to the switch component 200 and the communication component 300, the test component 400 controls the switch component 200 to conduct one or more test circuits of the load 100 according to the current test item, and tests peak current consumption of a terminal to be tested under different loads.
Alternatively, the communication component 300 may be a Serial port, a USB (Universal Serial Bus) communication interface, and the like, and is configured to receive a current test item instruction sent by an external electronic device and extract a current test item from the current test item instruction.
Optionally, in some embodiments, the testing component 400 may be a single-chip microcomputer.
Optionally, in some embodiments, the plurality of loads 100 includes at least two of a 50 Ω resistor, an inductive load, a capacitive load, and a short circuit load, and the other terminals of the plurality of loads 100 are all grounded.
Optionally, in some embodiments, the terminal to be tested may be a power amplifier.
It should be understood that the peak current consumption is a relatively sensitive parameter, and is relatively affected by loads, especially short-circuit loads, capacitive loads and inductive loads, and the peak current consumption varies greatly when different operators perform tests.
Therefore, the multi-load testing apparatus 10 is provided in the embodiment of the present application, and the testing component 400 determines the current test item according to the received test instruction, so as to control the switching component 200 to conduct the testing circuit when one load is used to test the peak current consumption of the terminal to be tested under different loads, or control the switching component 200 to conduct the testing circuits of multiple loads 100 simultaneously to test the peak current consumption of the terminal to be tested under multiple different loads.
Therefore, the impedance is self-adjusted under the control of the test component 400, peak current consumption under different loads is automatically tested, the test accuracy is improved, the whole load board is simple and easy, the cost is low, the accuracy is high, and the peak current consumption automatic test of different loads can be realized.
In order to further understand the multi-load testing device 10 of the present application, the following detailed description is provided with reference to specific embodiments.
Further, in some embodiments, as shown in fig. 2, the switch assembly 200 includes: a first rf block IPEX1 and a test switch 201. One end of the first radio frequency seat IPEX1 is connected with a second radio frequency seat IPEX2 on the terminal to be tested through a radio frequency wire; the test switch 201 is connected to the first rf socket IPEX1, the plurality of loads 100, and the test assembly 400, respectively, such that the test assembly 400 controls the test switch 201 to conduct the test circuit of one or more loads 100 according to the current test item.
Further, in some embodiments, as shown in fig. 2, the switch assembly 200 further comprises: a matching unit 202. One end of the matching unit 202 is connected to the other end of the first rf socket IPEX1, and the other end of the matching unit 202 is connected to the test switch 201, for matching the test component 400 to the test parameters corresponding to the terminal to be tested, such as matching and debugging the parameters at the two ends of the open-circuit channel to 50 Ω, so that the multi-load testing apparatus 10 is in the optimal test environment.
Specifically, as shown in fig. 2, one end of the first radio frequency cradle IPEX1 is connected to one end of the second radio frequency cradle IPEX2 on the terminal to be tested through a radio frequency line, the other end of the first radio frequency cradle IPEX1 is connected to one end of the matching unit 202, and the other end of the matching unit 202 is connected to the test switch 201 to match the test parameters of the test component 400 with the terminal to be tested. The test switch 201 is respectively connected to the plurality of loads 100 and the test assembly 400, such that the test assembly 400 controls the test switch to conduct the test circuit of one or more loads 100 according to the current test item.
Further, in some embodiments, as shown in fig. 2, the multi-load testing device 10 further comprises: the third rf block IPEX 3. The third radio frequency cradle IPEX3 is disposed on the switch assembly 200, and is configured to control the switch assembly 200 to be in an open state when the third radio frequency cradle IPEX3 is conducted with the test switch 201.
Specifically, the states of the test circuits are controlled by the logic level of the switch assembly 200, the logic level is determined by the high-low level of a general purpose input/Output (GPIO) port of the single chip microcomputer GPIO, the switch assembly 200 is in an open-circuit state under the control of the test assembly 400, and the third radio frequency pad IPEX3 is placed in an open-circuit channel.
Further, in some embodiments, the multi-load testing device 10 further comprises: the assembly 500 is shown. The display module 500 is connected to the test module 400, and is configured to display a peak current consumption of the terminal to be tested under different loads when the test module 400 controls the test switch 201 to turn on the test circuit of one or more loads 100 according to the current test item.
Specifically, after the second rf socket IPEX2 in the terminal to be tested is connected to the first rf socket in the switch assembly 200 through the rf line, and when the communication assembly 300 receives a current test item instruction sent by an external electronic device, the test switch 201 is automatically controlled to turn on the test circuit of one or more loads 100 and display the peak current consumption of the terminal to be tested under different loads through the display assembly 500.
Further, in some embodiments, the multi-load testing device 10 further comprises: and the alarm component 600, the alarm component 600 is connected with the test component 400, and is used for alarming when the peak current consumption of the terminal to be tested is abnormal.
Specifically, when the testing component controls the testing switch 201 to turn on the testing circuit of one or more loads 100 at 300 according to the current testing item, it shows that there is an abnormality in the peak current consumption of the terminal to be tested, and the alarm component 600 gives an alarm.
Further, in some embodiments, alarm assembly 600, comprises: the optical alarm unit is connected with the test component 400 and used for carrying out optical alarm when the peak current consumption of the terminal to be tested is abnormal; and/or at least one acoustic alarm unit, which is connected to the test component 400 and is used for performing acoustic alarm when the peak current consumption of the terminal to be tested is abnormal.
Alternatively, the optical alarm unit may be an LED (Light Emitting Diode) lamp or other alarm device with an optical alarm function, and the acoustic alarm unit may be a buzzer or a warning horn or other alarm device with an acoustic alarm function, which is not limited herein.
Specifically, when the test component 400 controls the test switch 201 to turn on the test circuit of one or more loads 100 according to the current test item, and it is displayed that the peak current consumption of the terminal to be tested is abnormal, at least one optical alarm unit performs optical alarm, or at least one acoustic alarm unit performs acoustic alarm, or at least one optical alarm unit performs optical alarm and at least one acoustic alarm unit performs acoustic alarm.
In one example, the optical alarm is performed by at least one optical alarm unit. When the peak current consumption of the terminal to be tested is abnormal, the LED light can be used for carrying out 5-second cyclic flashing to warn that the peak current consumption is abnormal, and then the peak current consumption is detected again.
In another example, the acoustic alarm is performed by at least one acoustic alarm unit. When the peak current consumption of the terminal to be tested is abnormal, the warning horn can be used for carrying out voice warning to send out a warning of 'please pay attention to, and the peak current consumption detected at this time is abnormal and please detect again', and the warning is broadcast for multiple times in a circulating way to warn that the peak current consumption is abnormal and further detect the peak current consumption again.
In yet another example, the optical alarm is performed by at least one optical alarm unit and the acoustic alert is performed by at least one acoustic alarm unit. When the peak current consumption of the terminal to be tested is abnormal, the LED lamplight can be used for carrying out 5-second cyclic flashing and voice reminding through the warning horn, the reminding of 'please pay attention to that the detected peak current consumption is abnormal and please detect again' is sent out, and the reminding is broadcasted for multiple times in a cyclic mode, so that the aim of multi-azimuth reminding is achieved, and the peak current consumption is detected again.
In summary, as shown in fig. 2, the specific implementation method of the multi-load peak current consumption automatic test is as follows:
(1) the state of each test circuit is controlled by the logic level of the switch assembly 200, the logic level is determined by the high-low level of the GPIO port of the single chip microcomputer, under the control of the test assembly 400, the switch assembly 200 is in an open circuit state, and a third radio frequency seat IPEX3 is placed in an open circuit channel;
(2) under the condition of switching to an open-circuit state channel, parameters at two ends of the debugging channel are matched to 50 omega;
(3) each of the plurality of loads 100 is a capacitive load, an inductive load, a 50 Ω resistor, and a short circuit load, all of which are grounded.
(4) The second radio frequency socket IPEX2 of the terminal to be tested is connected with the first radio frequency socket IPEX1 in the switch assembly 200 through a radio frequency line, and when the load board receives a current test item instruction sent by external electronic equipment through a serial port or a USB communication interface, the test switch 201 is automatically controlled to conduct the test circuit of one or more loads 100 and the peak current consumption of the terminal to be tested under different loads is displayed through the display assembly 500.
According to the multi-load testing device, the testing component is respectively connected with the switch component and the communication component, the testing component controls the switch component to conduct a testing circuit of one or more loads according to the current testing item, and peak current consumption of the terminal to be tested under different loads is tested. Therefore, the problem that the peak current consumption difference is large due to the fact that the load needs to be replaced manually in the peak current consumption testing process is solved, the impedance can be automatically adjusted under the control of the testing assembly, automatic testing of the peak current consumption of the terminal to be tested under different loads is achieved, testing accuracy can be improved, the cost is low, and the method is simple and easy to achieve.
In the description herein, reference to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or N embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present application, "N" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more N executable instructions for implementing steps of a custom logic function or process, and alternate implementations are included within the scope of the preferred embodiment of the present application in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the embodiments of the present application.
It should be understood that portions of the present application may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the N steps or methods may be implemented in software or firmware stored in a memory and executed by a suitable instruction execution system. If implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried out in the method for implementing the above embodiment may be implemented by hardware that is related to instructions of a program, and the program may be stored in a computer readable storage medium, and when executed, the program includes one or a combination of the steps of the method embodiment.
Claims (9)
1. A multi-load testing apparatus, comprising:
a plurality of loads;
the switch assembly is respectively connected with the terminal to be tested and each load of the plurality of loads so as to conduct a test circuit of one or more loads;
the communication assembly is arranged on the multi-load testing device and receives a current testing item sent by external electronic equipment; and
the testing component is respectively connected with the switch component and the communication component, controls the switch component to conduct the testing circuit of the one or more loads according to the current testing item, and tests the peak current consumption of the terminal to be tested under different loads.
2. The apparatus of claim 1, wherein the switch assembly comprises:
one end of the first radio frequency seat is connected with a second radio frequency seat on the terminal to be tested through a radio frequency line;
and the test switch is respectively connected with the plurality of loads and the test component, so that the test component controls the test switch to conduct the test circuit of the one or more loads according to the current test item.
3. The apparatus of claim 2, wherein the switch assembly further comprises:
and one end of the matching unit is connected with the other end of the first radio frequency seat, and the other end of the matching unit is connected with the test switch and used for matching the test component to the test parameters which are consistent with the terminal to be tested.
4. The apparatus of claim 3, further comprising:
and the third radio frequency base is arranged on the switch assembly and used for controlling the switch assembly to be in an open circuit state when the third radio frequency base is conducted with the test switch.
5. The apparatus of claim 4, further comprising:
and the display component is connected with the test component and used for displaying the peak current consumption of the terminal to be tested under different loads when the test component controls the test switch to conduct the test circuit of the one or more loads according to the current test item.
6. The apparatus of claim 5, further comprising:
and the alarm component is connected with the test component and is used for alarming when the peak current consumption of the terminal to be tested is abnormal.
7. The apparatus of claim 6, wherein the alarm assembly comprises:
the optical alarm unit is connected with the testing component and used for giving an optical alarm when the peak current consumption of the terminal to be tested is abnormal; and/or
And the at least one acoustic alarm unit is connected with the test component and is used for performing acoustic alarm when the peak current consumption of the terminal to be tested is abnormal.
8. The apparatus of claim 7, wherein the test component is a single chip.
9. The apparatus of claim 8, wherein the plurality of loads comprises at least two of a 50 Ω resistance, an inductive load, a capacitive load, and a short circuit load.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220766710.5U CN217238251U (en) | 2022-03-31 | 2022-03-31 | Multi-load testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220766710.5U CN217238251U (en) | 2022-03-31 | 2022-03-31 | Multi-load testing device |
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| Publication Number | Publication Date |
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| CN217238251U true CN217238251U (en) | 2022-08-19 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202220766710.5U Active CN217238251U (en) | 2022-03-31 | 2022-03-31 | Multi-load testing device |
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- 2022-03-31 CN CN202220766710.5U patent/CN217238251U/en active Active
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