CN217180976U - Chip test pin supporting device and chip test equipment - Google Patents
Chip test pin supporting device and chip test equipment Download PDFInfo
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- CN217180976U CN217180976U CN202123059919.2U CN202123059919U CN217180976U CN 217180976 U CN217180976 U CN 217180976U CN 202123059919 U CN202123059919 U CN 202123059919U CN 217180976 U CN217180976 U CN 217180976U
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- chip
- support bar
- pin
- chip test
- insulating support
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Abstract
The application discloses a chip test pin supporting device and chip test equipment, wherein the chip test pin supporting device comprises a base body which is detachably connected to the chip test equipment; insulating support bar, along vertical direction with the removable cartridge cooperation of pedestal, insulating support bar has the chip pin of vertical setting and slides the face, the lower extreme level that chip pin slideed the face sets up chip pin locating surface. Above-mentioned scheme, insulating support bar and pedestal adopt cartridge complex connected mode in vertical direction, and than adopting sticky connected mode, have the advantage that connection is convenient, connection accuracy is high.
Description
Technical Field
The utility model relates to a chip testing technology field, concretely relates to chip testing pin strutting arrangement and chip test equipment.
Background
In testing a packaged chip, such as but not limited to an SOP (Small Out-Line Package) packaged chip, a chip test pin support device is used to support the chip to be tested.
The existing chip test pin supporting device comprises a metal base and a sapphire supporting strip adhered to the metal base. However, the sapphire support strip is brittle, and the sapphire support strip is easily damaged when the chip to be tested falls to the test position. After the damage appears in the sapphire support bar, need the manual work to carry out the change of sapphire support bar, because at the change in-process, the manual work adopts the mode of bonding to come the sapphire support bar to glue on metal base, has the great problem of bonding position error, hardly satisfies the requirement of precision within 0.02 mm. The assembly precision of sapphire support bar and metal base is poor, can influence the position of chip test, causes because of the chip position is just not just causes the chip test bad, in addition, still can cause the chip to block the material and the problem that chip pin warp at the in-process that falls.
SUMMERY OF THE UTILITY MODEL
The application expects to provide a chip test pin strutting arrangement and chip test equipment for solve current chip test pin strutting arrangement and lead to chip test pin strutting arrangement assembly precision poor because of adopting sticky mode equipment, cause to adopt it to exist and cause the problem that the chip test is bad, chip card material and chip pin warp.
In a first aspect, the utility model provides a chip test pin strutting arrangement, include:
the base body is used for being detachably connected to the chip testing equipment;
insulating support bar, along vertical direction with the removable cartridge cooperation of pedestal, insulating support bar has the chip pin of vertical setting and slides the face, the lower extreme level that chip pin slideed the face sets up chip pin locating surface.
As an implementation mode, a first limiting surface is arranged on the seat body, and a second limiting surface is arranged on the insulating support bar; the second limiting surface is pressed on the first limiting surface from top to bottom.
As an implementation manner, one of the seat body and the insulating support bar is provided with a sliding groove, the other is provided with a sliding block, and the sliding block is in sliding fit with the sliding groove along the vertical direction.
As an implementation manner, the sliding groove is disposed on the seat body, a first protrusion is disposed at a lower end of the sliding groove, and a top surface of the first protrusion is the first limiting surface.
As an implementation mode, the chute penetrates through the seat body from top to bottom; the sliding block extends from the top to the bottom of the insulation supporting bar.
As an implementation manner, the lower end of the insulating support bar is provided with a second protrusion, the top surface of the second protrusion is the chip pin positioning surface, and the bottom surface of the second protrusion is the second limiting surface.
As an implementation manner, the upper end of the insulation support bar is provided with a guide inclined plane.
As an implementation manner, the sliding groove is any one of a dovetail groove, a T-shaped groove and a right-angled trapezoidal groove, and the sliding block is any one of a dovetail block, a T-shaped block and a right-angled trapezoidal block which are correspondingly matched with the sliding groove.
As an implementation manner, the insulating support bar is a ceramic support bar.
In a second aspect, the utility model provides a chip testing equipment, including two foretell chip test pin strutting arrangement, two chip test pin strutting arrangement's insulating support bar interval sets up in opposite directions for form chip whereabouts passageway.
Above-mentioned scheme, insulating support bar and pedestal adopt cartridge complex connected mode in vertical direction, and than adopting sticky connected mode, have the advantage that connection is convenient, connection accuracy is high. Along with the improvement of insulating support bar and pedestal connection accuracy, can avoid influencing the position of chip test because of the assembly accuracy of insulating support bar and metal base is poor, cause because of the chip position not just cause the bad problem of chip test to take place. In addition, due to the improvement of the connection precision of the insulating support bar and the base, the size precision of a falling channel limited by the chip testing pin supporting device is correspondingly higher, and the chip can fall smoothly, so that the problems of material clamping and chip pin deformation of the chip in the falling process can be avoided.
Drawings
Other features, objects and advantages of the present application will become more apparent upon reading of the following detailed description of non-limiting embodiments thereof, made with reference to the accompanying drawings in which:
fig. 1 is a front view of an insulating support bar according to an embodiment of the present invention;
FIG. 2 is a left side view of FIG. 1;
FIG. 3 is a bottom view of FIG. 1;
FIG. 4 is a perspective view of FIG. 1;
fig. 5 is a front view of a seat body provided in an embodiment of the present invention;
FIG. 6 is a right side view of FIG. 5;
FIG. 7 is a left side view of FIG. 5;
FIG. 8 is a cross-sectional view A-A of FIG. 5;
FIG. 9 is a perspective view of FIG. 5;
fig. 10 is a perspective view of a chip test pin supporting device according to an embodiment of the present invention;
fig. 11 is a schematic view of a mounting position of a chip testing pin supporting device of a chip testing apparatus according to another embodiment of the present invention.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the relevant invention and are not to be construed as limiting the invention. It should be noted that, for convenience of description, only the portions related to the present invention are shown in the drawings.
It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.
As shown in fig. 1-10, an embodiment of the present invention provides a chip test pin supporting device, including:
the base body 2 is used for being detachably connected to the chip testing equipment; for example, but not limited to, the base body 2 can be detachably connected to the chip testing apparatus by means of a bolt connection. In order to facilitate the position adjustment of the seat body 2 and improve the assembly precision, the connecting holes 24 formed in the seat body 2 may be elongated holes or waist-shaped holes, and bolts pass through the connecting holes 24 to connect the seat body 2 to the chip testing device.
In the using process, when the chip to be tested falls to the testing position, the pin of the chip to be tested moves downwards along the chip pin sliding surface 16, and when the chip to be tested falls to the chip pin positioning surface 13 and is blocked by the chip pin positioning surface 13 and cannot fall continuously, the chip to be tested can be horizontally pushed, so that the pin of the chip to be tested contacts the corresponding testing position to start testing.
Above-mentioned scheme, insulating support bar 1 and pedestal 2 adopt cartridge complex connected mode in vertical direction, and than adopting sticky connected mode, have the advantage that connection is convenient, connection accuracy is high. Along with the improvement of insulating support bar 1 and pedestal 2 connection accuracy, can avoid influencing the position of chip test because of the assembly accuracy of insulating support bar 1 and metal base is poor, cause because of the chip position not just cause the bad problem of chip test to take place. In addition, because the connection precision of the insulating support bar 1 and the base body 2 is improved, the dimensional precision of a falling channel limited by the chip test pin supporting device is correspondingly higher, and the chip can fall smoothly, so that the problems of material clamping and chip pin deformation of the chip in the falling process can not be caused.
As an implementation manner, in order to improve the assembly precision and the assembly convenience of the insulating support bar 1 in the vertical direction, the seat body 2 is provided with a first limiting surface 22, and the insulating support bar 1 is provided with a second limiting surface 14; the second limiting surface 14 is pressed against the first limiting surface 22 from top to bottom. In the assembling process, the assembly of the insulation support bar 1 and the seat body 2 can be completed only by sliding the insulation support bar 1 to the first limiting surface 22 until the second limiting surface 14 abuts against the first limiting surface 22. The position accuracy of the first position-limiting surface 22 and the second position-limiting surface 14 can be determined by the processing accuracy, and the assembling accuracy of the insulating support bar 1 and the seat body 2 also meets the design requirement under the condition that the processing accuracy of the first position-limiting surface 22 and the second position-limiting surface 14 meets the design requirement, i.e. higher assembling accuracy is achieved.
As an implementation manner, in order to reduce the processing cost and further improve the convenience of assembly and the assembly precision, one of the seat body 2 and the insulating support bar 1 is provided with a sliding groove 25, the other is provided with a sliding block 11, and the sliding block 11 and the sliding groove 25 are in sliding fit in the vertical direction.
As an implementation manner, the sliding groove 25 is disposed on the seat body 2, a first protrusion 21 is disposed at a lower end of the sliding groove 25, and a top surface of the first protrusion 21 is the first limiting surface 22.
As an implementation manner, the sliding groove 25 penetrates through the seat body 2 from top to bottom, the preparation of the sliding groove 25 can be completed through one-time milling, the processing efficiency is high, and the processing cost is low; the sliding block 11 extends from the top to the bottom of the insulation supporting bar 1.
As an implementation manner, the lower end of the insulating support bar 1 is provided with a second protrusion 12, the top surface of the second protrusion 12 is the chip pin positioning surface 13, and the bottom surface of the second protrusion 12 is the second limiting surface 14.
As a practical manner, the upper end of the insulation support bar 1 is provided with a guide slope 15 so as to guide the chip to be tested to enter the chip falling channel 3, as shown in fig. 11, and smoothly fall to the position for testing.
As an implementation manner, the sliding groove 25 is any one of a dovetail groove, a T-shaped groove and a right trapezoid groove, and the sliding block 11 is any one of a dovetail block, a T-shaped block and a right trapezoid block correspondingly matched with the sliding groove 25.
As an implementation manner, in order to ensure the insulating performance and durability of the insulating support bar 1, the insulating support bar 1 is a ceramic support bar. The ceramic support strip has higher strength, and can avoid the damage to the ceramic support strip in the falling process of a chip to be tested.
The chip test pin support apparatus is illustrated in one of its specific implementations, but is not intended to be the only limitation on the chip test pin support apparatus.
This chip test pin strutting arrangement includes pedestal 2, and this pedestal 2 can be metal pedestal 2, like steel pedestal 2, and pedestal 2 can be the lamellar structure, sets up two parallel sand grips 23 at its back, forms the bayonet socket between two sand grips 23 for the card is in the position department of treating the installation, sets up connecting hole 24 in the front, and this connecting hole 24 is the through-hole, fixes this pedestal 2 on the position of treating the installation through the screw that passes this through-hole. The number of the through holes can be set according to actual needs, generally more than two through holes are adopted in the example, the three through holes are all kidney-shaped holes, the extending directions of the kidney-shaped holes at the two ends are perpendicular to the extending direction of the kidney-shaped hole in the middle, so that in the installation process, position adjustment can be carried out in two mutually perpendicular directions, and the installation precision is improved.
A right-angled trapezoidal groove serving as a sliding groove 25 is formed in one side surface of the seat body 2, the right-angled trapezoidal groove penetrates through the seat body 2 from top to bottom, a first protrusion 21 is formed at the lower end of the right-angled trapezoidal groove, and the top surface of the first protrusion 21 is the first limiting surface 22.
On the ceramic support bar as insulating support bar 1, set up the right angle trapezoidal piece as slider 11, the cooperation is inserted with the right angle trapezoidal groove to the right angle trapezoidal piece. The right-angle trapezoidal block extends from the top to the bottom of the insulating support bar 1, namely penetrates through the insulating support bar 1 from top to bottom. The lower end of the ceramic support bar is provided with a second bulge 12, the top surface of the second bulge 12 is a chip pin positioning surface 13, and the bottom surface of the second bulge 12 is a second limiting surface 14. The second position-limiting surface 14 is pressed against the first position-limiting surface 22 from top to bottom.
In a second aspect, referring at least to fig. 11, the present invention provides a chip testing apparatus, comprising two of the above chip testing pin supporting devices, two of the chip testing pin supporting devices, the insulating support bars 1 are oppositely spaced to form a chip falling channel 3.
The chip testing device adopts the chip testing pin supporting device of each example, and the structure and the effect of the chip testing device refer to the examples, which are not described again.
It is to be understood that any reference above to the orientation or positional relationship of the terms "central," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," etc., is based on the orientation or positional relationship shown in the drawings and is intended to facilitate the description of the invention and to simplify the description, rather than to indicate or imply that the device or element so referred to must have a particular orientation, be constructed and operated in a particular orientation, and is not to be construed as limiting the invention. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
The above description is only a preferred embodiment of the application and is illustrative of the principles of the technology employed. It will be appreciated by those skilled in the art that the scope of the invention herein disclosed is not limited to the particular combination of the above-described features, but also encompasses other combinations of any of the above-described features or their equivalents without departing from the spirit of the invention. For example, the above features may be replaced with (but not limited to) features having similar functions disclosed in the present application.
Claims (10)
1. A chip test pin support apparatus, comprising:
the base body is used for being detachably connected to the chip testing equipment;
insulating support bar, along vertical direction with the removable cartridge cooperation of pedestal, insulating support bar has the chip pin of vertical setting and slides the face, the lower extreme level that chip pin slideed the face sets up chip pin locating surface.
2. The chip test pin supporting device according to claim 1, wherein the base body is provided with a first limiting surface, and the insulating support bar is provided with a second limiting surface; the second limiting surface is pressed on the first limiting surface from top to bottom.
3. The device as claimed in claim 2, wherein a slide groove is formed on one of the base and the insulating support bar, and a slide block is formed on the other, the slide block being slidably engaged with the slide groove in a vertical direction.
4. The chip testing pin supporting device according to claim 3, wherein the sliding groove is disposed on the base, a first protrusion is disposed at a lower end of the sliding groove, and a top surface of the first protrusion is the first limiting surface.
5. The device according to claim 4, wherein the slot extends through the base from top to bottom; the sliding block extends from the top to the bottom of the insulation supporting bar.
6. The supporting device for the chip testing pins according to claim 3, 4 or 5, wherein the lower end of the insulating supporting bar is provided with a second protrusion, the top surface of the second protrusion is the chip pin positioning surface, and the bottom surface of the second protrusion is the second limiting surface.
7. The chip test pin support apparatus of any one of claims 1 to 5, wherein an upper end of the insulation support bar is provided with a guide slope.
8. The device according to claim 3, 4 or 5, wherein the sliding groove is any one of a dovetail groove, a T-shaped groove and a right trapezoid groove, and the sliding block is any one of a dovetail block, a T-shaped block and a right trapezoid block which are correspondingly matched with the sliding groove.
9. The chip test pin support apparatus of any one of claims 1-5, wherein the insulating support bar is a ceramic support bar.
10. A chip testing apparatus comprising two chip test pin support devices according to any one of claims 1 to 9, wherein the insulating support bars of the two chip test pin support devices are spaced apart from each other to form a chip dropping passage.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123059919.2U CN217180976U (en) | 2021-12-07 | 2021-12-07 | Chip test pin supporting device and chip test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123059919.2U CN217180976U (en) | 2021-12-07 | 2021-12-07 | Chip test pin supporting device and chip test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217180976U true CN217180976U (en) | 2022-08-12 |
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ID=82718093
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202123059919.2U Active CN217180976U (en) | 2021-12-07 | 2021-12-07 | Chip test pin supporting device and chip test equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217180976U (en) |
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2021
- 2021-12-07 CN CN202123059919.2U patent/CN217180976U/en active Active
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