CN217133215U - A microwave device test bench - Google Patents

A microwave device test bench Download PDF

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Publication number
CN217133215U
CN217133215U CN202220000925.6U CN202220000925U CN217133215U CN 217133215 U CN217133215 U CN 217133215U CN 202220000925 U CN202220000925 U CN 202220000925U CN 217133215 U CN217133215 U CN 217133215U
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fixedly connected
microwave device
base
screw
electric telescopic
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陈玉山
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Foshan Shunde Sunan Huanshi Power Supply Equipment Co ltd
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Foshan Shunde Sunan Huanshi Power Supply Equipment Co ltd
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Abstract

The utility model discloses a microwave device testboard belongs to radio frequency signal test technical field, the on-line screen storage device comprises a base, base left side fixedly connected with slide bar, surface mounting has servo motor on the base, servo motor power take off end fixedly connected with lead screw, lead screw fixed surface is connected with surface mounting has screw-nut, screw-nut fixed surface is connected with the moving part, moving part right side fixedly connected with crossbeam, the spacing hole an of evenly arranging is seted up on the crossbeam surface, crossbeam fixed surface is connected with sliding connection has the setting element, fixed surface is connected with electric telescopic handle on the base. The utility model has simple fixing process of the microwave device, saves time, has good fixing effect, prevents the surface of the microwave device from being scraped by the contact of the rubber pad and the microwave device, and reduces unnecessary damage; the microwave device can be accurately tested by combining the screw rod and the positioning piece, and the testing efficiency is improved.

Description

一种微波器件测试台A microwave device test bench

技术领域technical field

本实用新型涉及射频信号测试技术领域,尤其涉及一种微波器件测试台。The utility model relates to the technical field of radio frequency signal testing, in particular to a microwave device testing bench.

背景技术Background technique

在现有的微波器件参数测试的常用方法中,目前国内一般的做法是,采用螺钉直接将微波器件固定在测试夹具上,直接螺钉紧固安装对于少量和可靠性要求低的方法被业界通用。利用该方法可以实现对于微波器件微波参数测试的的测试,对于微波器件的生产测试、试验测试等领域具有牢固、简捷、接触良好的作用。但该方法安装螺钉占用时间长,易划伤器件表面,并直接划伤器件底座,留下伤痕,引入测试损伤,多次安装测试后,管底座上留下凹痕,损伤器件,影响外观和交付。同时,对于不同的器件需要拧下螺钉更换不同的器件,并且每次更换器件都要反复松紧多个螺钉,浪费了大量的时间,这大大降低了检测效率。Among the existing common methods for parameter testing of microwave devices, the current general practice in China is to use screws to directly fix the microwave device on the test fixture, and the method of direct screw fastening and installation is commonly used in the industry for small quantities and low reliability requirements. The method can realize the test of the microwave parameter test of the microwave device, and has the functions of firmness, simplicity and good contact in the fields of production test, test test and the like of the microwave device. However, this method takes a long time to install screws, easily scratches the surface of the device, and directly scratches the device base, leaving scars and introducing test damage. After multiple installation tests, dents are left on the tube base, which damages the device and affects the appearance and deliver. At the same time, for different devices, screws need to be unscrewed to replace different devices, and multiple screws must be tightened repeatedly each time a device is replaced, which wastes a lot of time, which greatly reduces the detection efficiency.

专利号CN209946293U的公布了一种微波器件测试台,包括底座,所述底座的顶部正面上焊接有支撑支柱,所述支撑支柱的顶部焊接有上支撑平台,所述上支撑平台的外壁位开口状,并位于开口处滑动连接位移柱,所述上支撑平台的顶部正面上前端开设有挤压块,所述挤压块的槽口内滑动连接有倾斜块。本实用新型中,通过对排气管进行冲气即可,同理挤压将微波器件挤压在吸盘盘上,进行吸附,但是多余的气体将会进入到排气管内,通过扭动螺栓,将会制动扩盘旋转,扩盘进行向下位移并旋转,并将底部所连接的挤压块也制动向下位移,对排气管的挤压,通过控制位移块向右侧位移,将会把排气管内的气体排出。Patent No. CN209946293U discloses a microwave device test bench, including a base, a support pillar is welded on the top front of the base, an upper support platform is welded on the top of the support pillar, and the outer wall of the upper support platform is in the shape of an opening. , and is slidably connected to the displacement column at the opening, the front end of the top front of the upper support platform is provided with an extrusion block, and the notch of the extrusion block is slidably connected with an inclined block. In the utility model, the exhaust pipe can be inflated, and the microwave device is squeezed on the suction cup for adsorption in the same way, but the excess gas will enter the exhaust pipe, and by twisting the bolt, The brake expansion disc will be rotated, the expansion disc will be displaced downward and rotated, and the extrusion block connected at the bottom will also be braked and displaced downward, and the extrusion of the exhaust pipe will be displaced to the right by controlling the displacement block. The gas in the exhaust pipe will be expelled.

现有技术的微波器件测试台有以下缺点:1、对微波器件固定过程复杂,浪费大量时间,固定效果不够明显,可能会对微波器件表面造成划痕;2、定位不够精准,无法对微波器件进行精确的定位测试,为此,我们提出一种微波器件测试台。The microwave device test bench in the prior art has the following disadvantages: 1. The fixing process of the microwave device is complicated, a lot of time is wasted, the fixing effect is not obvious enough, and scratches may be caused on the surface of the microwave device; To carry out precise positioning test, we propose a microwave device test bench for this purpose.

实用新型内容Utility model content

本实用新型提供一种微波器件测试台,本实用新型对微波器件固定过程简单,节约时间,固定效果好,通过橡胶垫与微波器件接触,防止刮花器件表面,减少不必要的损坏;可通过丝杆和定位件的组合使用,对微波器件进行精确的测试,提高测试效率。The utility model provides a microwave device test bench. The utility model has a simple fixing process for the microwave device, saves time, and has a good fixing effect. The rubber pad contacts the microwave device to prevent scratches on the surface of the device and reduce unnecessary damage; The combination of the screw rod and the positioning piece can accurately test the microwave device and improve the test efficiency.

本实用新型提供的具体技术方案如下:The concrete technical scheme that the utility model provides is as follows:

本实用新型提供的一种微波器件测试台,包括底座,所述底座左侧固定连接有滑杆,所述滑杆顶端固定连接有顶板,所述底座上表面安装有伺服电机,所述伺服电机动力输出端固定连接有丝杆,所述丝杆表面固定连接有表面安装有丝杆螺母,所述丝杆螺母表面固定连接有活动件,所述活动件右侧固定连接有横梁,所述横梁表面开设有均匀排布的限位孔a,所述横梁表面固定连接有滑动连接有定位件,定位件底部固定连接有安装座,所述安装座底部安装有ICT探针,所述横梁一端固定连接有滑块,所述底座右侧固定连接有滑轨,所述滑轨表面滑动连接有滑块,所述底座上表面固定连接有电动伸缩杆且电动伸缩杆为两组。The utility model provides a microwave device test stand, comprising a base, a sliding rod is fixedly connected to the left side of the base, a top plate is fixedly connected to the top of the sliding rod, a servo motor is installed on the upper surface of the base, and the servo motor The power output end is fixedly connected with a screw rod, the surface of the screw rod is fixedly connected with a screw nut mounted on the surface, the surface of the screw rod nut is fixedly connected with a movable piece, the right side of the movable piece is fixedly connected with a beam, and the beam There are evenly arranged limit holes a on the surface, the surface of the beam is fixedly connected with a sliding connection and a positioning piece, the bottom of the positioning piece is fixedly connected with a mounting seat, the bottom of the mounting seat is installed with an ICT probe, and one end of the beam is fixed A sliding block is connected, a sliding rail is fixedly connected to the right side of the base, a sliding block is slidably connected to the surface of the sliding rail, and an electric telescopic rod is fixedly connected to the upper surface of the base, and the electric telescopic rods are divided into two groups.

可选的,所述滑轨右侧固定连接有控制面板,所述伺服电机、ICT探针和电动伸缩杆通过控制面板与外界电源电连接。Optionally, a control panel is fixedly connected to the right side of the slide rail, and the servo motor, the ICT probe and the electric telescopic rod are electrically connected to an external power source through the control panel.

可选的,所述电动伸缩杆一端固定连接有夹板,所述夹板一侧固定连接有橡胶垫。Optionally, one end of the electric telescopic rod is fixedly connected with a splint, and one side of the splint is fixedly connected with a rubber pad.

可选的,所述定位件表面开设有限位孔b且限位孔b与限位孔a相契合,所述限位孔b内安装有插销且为倒L型,所述插销突出部分与定位件之间固定连接有弹簧。Optionally, a limiting hole b is formed on the surface of the positioning member, and the limiting hole b is matched with the limiting hole a, a plug is installed in the limiting hole b and is an inverted L shape, and the protruding part of the plug is aligned with the positioning hole b. A spring is fixedly connected between the parts.

可选的,所述滑杆表面滑动连接有限位块,所述限位块右侧固定连接有连接杆,所述连接杆右侧固定连接有活动件。Optionally, a limit block is slidably connected to the surface of the sliding rod, a connecting rod is fixedly connected to the right side of the limit block, and a movable piece is fixedly connected to the right side of the connecting rod.

本实用新型的有益效果如下:The beneficial effects of the present utility model are as follows:

本实用新型实施例提供一种微波器件测试台:The embodiment of the present utility model provides a microwave device test bench:

1、将微波器件放置在夹板之间,通过控制面板控制电动伸缩杆运作,电动伸缩杆运作带动夹板移动,夹板移动直至橡胶垫对微波器件进行挤压,从而对微波器件进行夹持固定,橡胶垫与微波器件接触,依靠自身较软的质地和较大的摩擦系数,可以起到更好的固定效果,还能防止夹板刮花微波器件表面,夹板之间可以放置多种型号的微波器件,无需根据微波器件大小进行更换夹持机构,增加装置整实用。1. Place the microwave device between the splints, and control the operation of the electric telescopic rod through the control panel. The operation of the electric telescopic rod drives the splint to move, and the splint moves until the rubber pad squeezes the microwave device, thereby clamping and fixing the microwave device. The pad is in contact with the microwave device. Relying on its soft texture and large friction coefficient, it can play a better fixing effect and prevent the splint from scratching the surface of the microwave device. Various types of microwave devices can be placed between the splints. There is no need to replace the clamping mechanism according to the size of the microwave device, which increases the overall utility of the device.

2、可向上拨动插销突出部分,插销向上运动拉伸弹簧,使得插销脱离限位孔a和限位孔b;然后可横向移动定位件,改变定位件的水平位置,然后松开插销,弹簧失去拉力恢复至初始状态,弹簧拉动插销,插销插入限位孔a和限位孔b内,从而固定住定位件,通过控制面板控制伺服电机运作,伺服电机动力输出端转动带动丝杆转动,丝杆转动为丝杆螺母提供动力,丝杆螺母在丝杆上竖直移动,丝杆螺母竖直移动带动活动件竖直移动,活动件移动带动横梁移动,横梁移动带动定位件移动,直至定位件上的ICT探针与微波器件接触,从而精确的对微波器件进行精确的测试,提高测试效率。2. The protruding part of the pin can be moved upward, and the pin moves upward to stretch the spring, so that the pin is separated from the limit hole a and the limit hole b; then the positioning piece can be moved laterally to change the horizontal position of the positioning piece, and then the pin is released, the spring When the tension is lost, it returns to the initial state, the spring pulls the pin, and the pin is inserted into the limit hole a and limit hole b, thereby fixing the positioning piece, and the operation of the servo motor is controlled through the control panel. The rotation of the rod provides power for the screw nut, the screw nut moves vertically on the screw rod, the vertical movement of the screw nut drives the movable part to move vertically, the movement of the movable part drives the movement of the beam, and the movement of the beam drives the movement of the positioning member until the positioning member moves The ICT probe on the top is in contact with the microwave device, so as to accurately test the microwave device and improve the test efficiency.

附图说明Description of drawings

为了更清楚地说明本实用新型实施例中的技术方案,下面将对实施例描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本实用新型的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to illustrate the technical solutions in the embodiments of the present invention more clearly, the following briefly introduces the accompanying drawings used in the description of the embodiments. Obviously, the drawings in the following description are only some implementations of the present invention. For example, for those of ordinary skill in the art, other drawings can also be obtained based on these drawings without any creative effort.

图1为本实用新型实施例的一种微波器件测试台的整体结构示意图;1 is a schematic diagram of the overall structure of a microwave device test bench according to an embodiment of the present utility model;

图2为本实用新型实施例的一种微波器件测试台的图1中A局部放大的结构示意图。FIG. 2 is an enlarged structural schematic diagram of part A in FIG. 1 of a microwave device test bench according to an embodiment of the present invention.

图中:1、底座;2、滑杆;3、活动件;4、限位块;5、连接杆;6、顶板;7、丝杆;8、丝杆螺母;9、限位孔a;10、横梁;11、滑块;12、ICT探针;13、控制面板;14、滑轨;15、橡胶垫;16、夹板;17、电动伸缩杆;18、伺服电机;19、限位孔b;20、弹簧;21、插销;22、定位件;23、安装座。In the figure: 1. base; 2. sliding rod; 3. movable part; 4. limit block; 5. connecting rod; 6. top plate; 7. lead screw; 8. lead screw nut; 9. limit hole a; 10, beam; 11, slider; 12, ICT probe; 13, control panel; 14, slide rail; 15, rubber pad; 16, splint; 17, electric telescopic rod; 18, servo motor; 19, limit hole b; 20, spring; 21, latch; 22, positioning member; 23, mounting seat.

具体实施方式Detailed ways

为了使本实用新型的目的、技术方案和优点更加清楚,下面将结合附图对本实用新型作进一步地详细描述,显然,所描述的实施例仅仅是本实用新型一部分实施例,而不是全部的实施例。基于本实用新型中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其它实施例,都属于本实用新型保护的范围。In order to make the purpose, technical solutions and advantages of the present utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the present utility model, rather than all the implementations. example. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the protection scope of the present invention.

下面将结合图1~图2对本实用新型实施例的一种微波器件测试台进行详细的说明。A microwave device test bench according to an embodiment of the present invention will be described in detail below with reference to FIGS. 1 to 2 .

参考图1~图2所示,本实用新型实施例提供的一种微波器件测试台,包括底座1,所述底座1左侧固定连接有滑杆2,所述滑杆2顶端固定连接有顶板6,所述底座1上表面安装有伺服电机18,所述伺服电机18动力输出端固定连接有丝杆7,所述丝杆7表面固定连接有表面安装有丝杆螺母8,所述丝杆螺母8表面固定连接有活动件3,所述活动件3右侧固定连接有横梁10,所述横梁10表面开设有均匀排布的限位孔a9,所述横梁10表面固定连接有滑动连接有定位件22,定位件22底部固定连接有安装座23,所述安装座23底部安装有ICT探针12,所述横梁10一端固定连接有滑块11,所述底座1右侧固定连接有滑轨14,所述滑轨14表面滑动连接有滑块11,所述底座1上表面固定连接有电动伸缩杆17且电动伸缩杆17为两组。Referring to FIGS. 1 to 2 , a microwave device test bench provided by an embodiment of the present invention includes a base 1 , a sliding rod 2 is fixedly connected to the left side of the base 1 , and a top plate is fixedly connected to the top of the sliding rod 2 6. A servo motor 18 is installed on the upper surface of the base 1, the power output end of the servo motor 18 is fixedly connected with a lead screw 7, and the surface of the lead screw 7 is fixedly connected with a surface-mounted lead screw nut 8. The surface of the nut 8 is fixedly connected with a movable piece 3, the right side of the movable piece 3 is fixedly connected with a beam 10, the surface of the beam 10 is provided with evenly arranged limit holes a9, and the surface of the beam 10 is fixedly connected with a sliding connection with The positioning member 22, the bottom of the positioning member 22 is fixedly connected with the mounting seat 23, the ICT probe 12 is mounted on the bottom of the mounting seat 23, the sliding block 11 is fixedly connected to one end of the beam 10, and the sliding block 11 is fixedly connected to the right side of the base 1. The rail 14, the sliding block 11 is slidably connected to the surface of the sliding rail 14, and the electric telescopic rod 17 is fixedly connected to the upper surface of the base 1, and the electric telescopic rod 17 is divided into two groups.

示例的,将微波器件放置在夹板16之间,通过控制面板13控制电动伸缩杆17运作,电动伸缩杆17运作带动夹板16移动,夹板16移动直至橡胶垫15对微波器件进行挤压,从而对微波器件进行夹持固定;通过控制面板13控制伺服电机18运作,伺服电机18动力输出端转动带动丝杆7转动,丝杆7转动为丝杆螺母8提供动力,丝杆螺母8在丝杆7上竖直移动,丝杆螺母8竖直移动带动活动件3竖直移动,活动件3移动带动横梁10移动,横梁10移动带动定位件22移动,直至定位件22上的ICT探针12与微波器件接触,从而精确的对微波器件进行精确的测试,提高测试效率。Exemplarily, the microwave device is placed between the clamping plates 16, and the operation of the electric telescopic rod 17 is controlled by the control panel 13. The operation of the electric telescopic rod 17 drives the clamping plate 16 to move, and the clamping plate 16 moves until the rubber pad 15 squeezes the microwave device. The microwave device is clamped and fixed; the operation of the servo motor 18 is controlled by the control panel 13, the rotation of the power output end of the servo motor 18 drives the lead screw 7 to rotate, and the lead screw 7 rotates to provide power for the lead screw nut 8, and the lead screw nut 8 is in the lead screw 7. The vertical movement of the screw nut 8 drives the movable member 3 to move vertically, the movable member 3 moves to drive the beam 10 to move, and the movement of the beam 10 drives the positioning member 22 to move until the ICT probe 12 on the positioning member 22 and the microwave device contact, so as to accurately test the microwave device and improve the test efficiency.

参考图1所示,所述滑轨14右侧固定连接有控制面板13,所述伺服电机18、ICT探针12和电动伸缩杆17通过控制面板13与外界电源电连接。Referring to FIG. 1 , a control panel 13 is fixedly connected to the right side of the slide rail 14 , and the servo motor 18 , the ICT probe 12 and the electric telescopic rod 17 are electrically connected to an external power source through the control panel 13 .

示例的,可通过控制面板13独立控制伺服电机18、ICT探针12和电动伸缩杆17运作,操作性强,操作简单便捷,提高装置整体实用性。For example, the operation of the servo motor 18 , the ICT probe 12 and the electric telescopic rod 17 can be independently controlled through the control panel 13 , the operability is strong, the operation is simple and convenient, and the overall practicability of the device is improved.

参考图1所示,所述电动伸缩杆17一端固定连接有夹板16,所述夹板16一侧固定连接有橡胶垫15。Referring to FIG. 1 , one end of the electric telescopic rod 17 is fixedly connected with a splint 16 , and one side of the splint 16 is fixedly connected with a rubber pad 15 .

示例的,可通过夹板16对微波器件进行夹持,从而对微波器件夹持固定,橡胶垫15与微波器件接触,依靠自身较软的质地和较大的摩擦系数,可以起到更好的固定效果,还能防止夹板16刮花微波器件表面。For example, the microwave device can be clamped by the clamping plate 16, so as to clamp and fix the microwave device, and the rubber pad 15 is in contact with the microwave device, which can be better fixed by virtue of its soft texture and larger friction coefficient. Therefore, the splint 16 can also be prevented from scratching the surface of the microwave device.

参考图2所示,所述定位件22表面开设有限位孔b19且限位孔b19与限位孔a9相契合,所述限位孔b19内安装有插销21且为倒L型,所述插销21突出部分与定位件22之间固定连接有弹簧20。Referring to FIG. 2 , a limiting hole b19 is defined on the surface of the positioning member 22 and the limiting hole b19 fits with the limiting hole a9 . A plug 21 is installed in the limiting hole b19 and is an inverted L shape. A spring 20 is fixedly connected between the protruding portion 21 and the positioning member 22 .

示例的,可向上拨动插销21突出部分,插销21向上运动拉伸弹簧20,使得插销21脱离限位孔a9和限位孔b19。然后可横向移动定位件22,改变定位件22的水平位置,然后松开插销21,弹簧20失去拉力恢复至初始状态,弹簧20拉动插销21,插销21插入限位孔a9和限位孔b19内,从而固定住定位件22。For example, the protruding portion of the latch 21 can be pulled upwards, and the latch 21 moves the tension spring 20 upwards, so that the latch 21 is disengaged from the limiting hole a9 and the limiting hole b19. Then the positioning member 22 can be moved laterally to change the horizontal position of the positioning member 22, and then the latch 21 is released, the spring 20 loses its tension and returns to its initial state, the spring 20 pulls the latch 21, and the latch 21 is inserted into the limiting hole a9 and the limiting hole b19 , so as to fix the positioning member 22 .

参考图1所示,所述滑杆2表面滑动连接有限位块4,所述限位块4右侧固定连接有连接杆5,所述连接杆5右侧固定连接有活动件3。Referring to FIG. 1 , a limit block 4 is slidably connected to the surface of the sliding rod 2 , a connecting rod 5 is fixedly connected to the right side of the limit block 4 , and a movable member 3 is fixedly connected to the right side of the connecting rod 5 .

示例的,连接杆5将活动件3和限位块4连接在一起,限位块4只能在滑杆2上竖直滑动,从而保障活动件3的竖直移动。For example, the connecting rod 5 connects the movable member 3 and the limit block 4 together, and the limit block 4 can only slide vertically on the sliding rod 2 , thereby ensuring the vertical movement of the movable member 3 .

使用时,将微波器件放置在夹板16之间,通过控制面板13控制电动伸缩杆17运作,电动伸缩杆17运作带动夹板16移动,夹板16移动直至橡胶垫15对微波器件进行挤压,从而对微波器件进行夹持固定,橡胶垫15与微波器件接触,依靠自身较软的质地和较大的摩擦系数,可以起到更好的固定效果,还能防止夹板16刮花微波器件表面,夹板16之间可以放置多种型号的微波器件,无需根据微波器件大小进行更换夹持机构,增加装置整实用性。可向上拨动插销21突出部分,插销21向上运动拉伸弹簧20,使得插销21脱离限位孔a9和限位孔b19;然后可横向移动定位件22,改变定位件22的水平位置,然后松开插销21,弹簧20失去拉力恢复至初始状态,弹簧20拉动插销21,插销21插入限位孔a9和限位孔b19内,从而固定住定位件22,通过控制面板13控制伺服电机18运作,伺服电机18动力输出端转动带动丝杆7转动,丝杆7转动为丝杆螺母8提供动力,丝杆螺母8在丝杆7上竖直移动,丝杆螺母8竖直移动带动活动件3竖直移动,活动件3移动带动横梁10移动,横梁10移动带动定位件22移动,直至定位件22上的ICT探针12与微波器件接触,从而精确的对微波器件进行精确的测试,提高测试效率。When in use, the microwave device is placed between the clamping plates 16, and the operation of the electric telescopic rod 17 is controlled by the control panel 13. The operation of the electric telescopic rod 17 drives the clamping plate 16 to move, and the clamping plate 16 moves until the rubber pad 15 squeezes the microwave device. The microwave device is clamped and fixed, and the rubber pad 15 is in contact with the microwave device. Relying on its soft texture and large friction coefficient, it can play a better fixing effect, and can also prevent the splint 16 from scratching the surface of the microwave device. The splint 16 Various types of microwave devices can be placed in between, and there is no need to replace the clamping mechanism according to the size of the microwave device, which increases the overall practicability of the device. The protruding part of the latch 21 can be pulled upward, and the latch 21 moves the tension spring 20 upward, so that the latch 21 is separated from the limit hole a9 and the limit hole b19; then the positioning member 22 can be moved laterally to change the horizontal position of the positioning member 22, and then loosen When the latch 21 is opened, the spring 20 loses its tension and returns to its initial state, the spring 20 pulls the latch 21, and the latch 21 is inserted into the limiting hole a9 and the limiting hole b19, thereby fixing the positioning member 22, and controlling the operation of the servo motor 18 through the control panel 13, The rotation of the power output end of the servo motor 18 drives the lead screw 7 to rotate, and the lead screw 7 rotates to provide power for the lead screw nut 8. The lead screw nut 8 moves vertically on the lead screw 7, and the vertical movement of the lead screw nut 8 drives the movable part 3 to stand vertically. Straight movement, the movement of the movable member 3 drives the beam 10 to move, and the movement of the beam 10 drives the positioning member 22 to move until the ICT probe 12 on the positioning member 22 contacts the microwave device, so as to accurately test the microwave device and improve the test efficiency. .

需要说明的是,本实用新型为一种微波器件测试台,包括1、底座;2、滑杆;3、活动件;4、限位块;5、连接杆;6、顶板;7、丝杆;8、丝杆螺母;9、限位孔a;10、横梁;11、滑块;12、ICT探针;13、控制面板;14、滑轨;15、橡胶垫;16、夹板;17、电动伸缩杆;18、伺服电机;19、限位孔b;20、弹簧;21、插销;22、定位件;23、安装座,部件均为通用标准件或本领域技术人员知晓的部件,其结构和原理都为本技术人员均可通过技术手册得知或通过常规实验方法获知。It should be noted that the utility model is a microwave device test bench, comprising: 1. a base; 2. a sliding rod; 3. a movable part; 4. a limit block; 5. a connecting rod; 6. a top plate; 7. a screw rod ;8, screw nut; 9, limit hole a; 10, beam; 11, slider; 12, ICT probe; 13, control panel; 14, slide rail; 15, rubber pad; 16, splint; 17, Electric telescopic rod; 18, servo motor; 19, limit hole b; 20, spring; 21, latch; 22, positioning part; The structure and principle are all known to those skilled in the art through technical manuals or through routine experimental methods.

显然,本领域的技术人员可以对本实用新型实施例进行各种改动和变型而不脱离本实用新型实施例的精神和范围。这样,倘若本实用新型实施例的这些修改和变型属于本实用新型权利要求及其等同技术的范围之内,则本实用新型也意图包含这些改动和变型在内。Obviously, those skilled in the art can make various changes and modifications to the embodiments of the present invention without departing from the spirit and scope of the embodiments of the present invention. Thus, if these modifications and variations of the embodiments of the present utility model fall within the scope of the claims of the present utility model and their equivalents, the present utility model is also intended to include these modifications and variations.

Claims (5)

1.一种微波器件测试台,包括底座(1),其特征在于,所述底座(1)左侧固定连接有滑杆(2),所述滑杆(2)顶端固定连接有顶板(6),所述底座(1)上表面安装有伺服电机(18),所述伺服电机(18)动力输出端固定连接有丝杆(7),所述丝杆(7)表面固定连接有表面安装有丝杆螺母(8),所述丝杆螺母(8)表面固定连接有活动件(3),所述活动件(3)右侧固定连接有横梁(10),所述横梁(10)表面开设有均匀排布的限位孔a(9),所述横梁(10)表面固定连接有滑动连接有定位件(22),定位件(22)底部固定连接有安装座(23),所述安装座(23)底部安装有ICT探针(12),所述横梁(10)一端固定连接有滑块(11),所述底座(1)右侧固定连接有滑轨(14),所述滑轨(14)表面滑动连接有滑块(11),所述底座(1)上表面固定连接有电动伸缩杆(17)且电动伸缩杆(17)为两组。1. A microwave device test bench, comprising a base (1), characterized in that a sliding rod (2) is fixedly connected to the left side of the base (1), and a top plate (6) is fixedly connected to the top of the sliding rod (2). ), a servo motor (18) is installed on the upper surface of the base (1), a screw (7) is fixedly connected to the power output end of the servo motor (18), and a surface-mounted screw (7) is fixedly connected to the surface of the screw (7). There is a screw nut (8), a movable piece (3) is fixedly connected to the surface of the screw nut (8), a beam (10) is fixedly connected to the right side of the movable piece (3), and the surface of the transverse beam (10) is fixedly connected. Limit holes a (9) that are evenly arranged are opened, the surface of the beam (10) is fixedly connected with a sliding connection and a positioning member (22), and the bottom of the positioning member (22) is fixedly connected with a mounting seat (23). An ICT probe (12) is installed at the bottom of the mounting seat (23), a slider (11) is fixedly connected to one end of the beam (10), and a slide rail (14) is fixedly connected to the right side of the base (1). A slider (11) is slidably connected to the surface of the slide rail (14), and an electric telescopic rod (17) is fixedly connected to the upper surface of the base (1), and the electric telescopic rods (17) are divided into two groups. 2.根据权利要求1所述的一种微波器件测试台,其特征在于,所述滑轨(14)右侧固定连接有控制面板(13),所述伺服电机(18)、ICT探针(12)和电动伸缩杆(17)通过控制面板(13)与外界电源电连接。2 . The microwave device test bench according to claim 1 , wherein a control panel ( 13 ) is fixedly connected to the right side of the slide rail ( 14 ), the servo motor ( 18 ), the ICT probe ( 12) and the electric telescopic rod (17) are electrically connected to the external power supply through the control panel (13). 3.根据权利要求1所述的一种微波器件测试台,其特征在于,所述电动伸缩杆(17)一端固定连接有夹板(16),所述夹板(16)一侧固定连接有橡胶垫(15)。3. A microwave device test bench according to claim 1, wherein one end of the electric telescopic rod (17) is fixedly connected with a splint (16), and one side of the splint (16) is fixedly connected with a rubber pad (15). 4.根据权利要求1所述的一种微波器件测试台,其特征在于,所述定位件(22)表面开设有限位孔b(19)且限位孔b(19)与限位孔a(9)相契合,所述限位孔b(19)内安装有插销(21)且为倒L型,所述插销(21)突出部分与定位件(22)之间固定连接有弹簧(20)。4 . The microwave device test bench according to claim 1 , wherein a limit hole b ( 19 ) is provided on the surface of the positioning member ( 22 ), and the limit hole b ( 19 ) and the limit hole a ( 4 . 9) Matching, a plug (21) is installed in the limiting hole b (19) and is an inverted L shape, and a spring (20) is fixedly connected between the protruding part of the plug (21) and the positioning member (22). . 5.根据权利要求1所述的一种微波器件测试台,其特征在于,所述滑杆(2)表面滑动连接有限位块(4),所述限位块(4)右侧固定连接有连接杆(5),所述连接杆(5)右侧固定连接有活动件(3)。5 . The microwave device test bench according to claim 1 , wherein a limit block ( 4 ) is slidably connected on the surface of the sliding rod ( 2 ), and a right side of the limit block ( 4 ) is fixedly connected with a A connecting rod (5) is fixedly connected with a movable piece (3) on the right side of the connecting rod (5).
CN202220000925.6U 2022-01-04 2022-01-04 A microwave device test bench Expired - Fee Related CN217133215U (en)

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