CN217086571U - A chip against reverse power supply - Google Patents

A chip against reverse power supply Download PDF

Info

Publication number
CN217086571U
CN217086571U CN202220780955.3U CN202220780955U CN217086571U CN 217086571 U CN217086571 U CN 217086571U CN 202220780955 U CN202220780955 U CN 202220780955U CN 217086571 U CN217086571 U CN 217086571U
Authority
CN
China
Prior art keywords
chip
power supply
nmos
reference potential
type substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202220780955.3U
Other languages
Chinese (zh)
Inventor
王春华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanjing Qinheng Microelectronics Co Ltd
Original Assignee
Nanjing Qinheng Microelectronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanjing Qinheng Microelectronics Co Ltd filed Critical Nanjing Qinheng Microelectronics Co Ltd
Priority to CN202220780955.3U priority Critical patent/CN217086571U/en
Application granted granted Critical
Publication of CN217086571U publication Critical patent/CN217086571U/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)

Abstract

The utility model discloses a chip for preventing reverse connection of power supply, which comprises a bare chip and a reference potential pin, wherein the bare chip comprises a P-type substrate, a reference potential PAD connection point and an NMOS (N-channel metal oxide semiconductor) with a multi-interdigital structure arranged on the P-type substrate; the source electrode of the NMOS is electrically connected with the P-type substrate, and the drain electrode of the NMOS is electrically connected with a reference potential PAD connection point; the reference potential PAD connecting point is electrically connected with the reference potential pin. The utility model discloses have and prevent the power transposition function, the protection chip is not damaged when the power transposition, has compromise the ESD performance, embedded integral structure, simple structure, the cost is lower.

Description

一种防电源反接的芯片A chip against reverse power supply

技术领域technical field

本实用新型属于集成电路设计领域,尤其涉及一种防电源反接的CMOS工艺芯片和防电源反接的理想二极管芯片的电源结构及成品封装。The utility model belongs to the field of integrated circuit design, in particular to a power supply structure and a finished product package of a CMOS process chip capable of preventing power reverse connection and an ideal diode chip preventing power reverse connection.

背景技术Background technique

常规CMOS工艺的芯片包含P型衬底PSUB和N阱NWELL(主流工艺通常还有P阱PWELL,在无隔离时P阱从电位角度可视同PSUB,本说明中不再区分)。如图1所示,封装底板01与P型衬底02间通过导电胶05形成电连接,正常工作时为正向供电,若干个N阱以及设置于N阱中的若干个普通PMOS管的源端03会接到正电源端VDD,P型衬底02和若干个P阱以及设置于P型衬底或P阱中的若干个普通NMOS的源端04会接到零电压电位端GND(或者负电源端)。图中虚线部分表示标准CMOS工艺天然的寄生器件。当应用或实验中出现连接失误,导致上述正电源端与零电压电位端连接对调时,称为反向供电,即电源反接。由于P型衬底(P阱)与N阱自然形成了阱衬PN结二极管,当电源反接时,反向电压远远超过了上述阱衬二极管的导通电压,所以将产生数安培的大电流,远远超过那些正向供电仅数十mA甚至数uA的芯片的设计参数,功率较大,故短时间内即可烧毁芯片或其封装连接线。A chip of conventional CMOS process includes a P-type substrate PSUB and an N-well NWELL (the mainstream process usually also has a P-well PWELL. When there is no isolation, the P-well can be regarded as a PSUB from the perspective of potential, and will not be distinguished in this description). As shown in FIG. 1 , an electrical connection is formed between the package bottom plate 01 and the P-type substrate 02 through a conductive glue 05, which is a forward power supply during normal operation, and the sources of several N wells and several ordinary PMOS transistors arranged in the N wells The terminal 03 will be connected to the positive power supply terminal VDD, the source terminal 04 of the P-type substrate 02 and several P-wells and several ordinary NMOSs arranged in the P-type substrate or P-well will be connected to the zero-voltage potential terminal GND (or negative power supply terminal). The dashed line in the figure represents the parasitic devices that are native to standard CMOS processes. When there is a connection error in the application or experiment, which causes the connection of the positive power supply terminal and the zero-voltage potential terminal to be reversed, it is called reverse power supply, that is, the power supply is reversed. Since the P-type substrate (P-well) and the N-well naturally form a well-lined PN junction diode, when the power supply is reversely connected, the reverse voltage far exceeds the turn-on voltage of the well-lined diode, so a large voltage of several amperes will be generated. The current far exceeds the design parameters of those chips whose forward power supply is only tens of mA or even several uA, and the power is large, so the chip or its package connection wire can be burned in a short time.

为了避免电源反接时损毁目标芯片,现有的主流解决方案:①是在目标芯片外部增加一个肖特基或硅二极管串联,但由于二极管导通时自身要消耗0.3V到0.8V的压降,所以电能损耗较大。②是在目标芯片外部增加一个理想二极管芯片串联,导通时电压降低于数十mV,至少有3个引脚,分别是输入端(阳极)、输出端(阴极)、零电压电位端GND,理想二极管属于CMOS工艺,其自身的输入端与GND之间仍然存在P型衬底(P阱)与N阱的阱衬二极管,反接电源时自身易损。③是在目标芯片外部增加一个PMOS管,但增加了成本和体积。以一个售价0.2元左右的3脚封装的小功率低压差线性降压器LDO目标芯片为例,再额外增加一个3引脚的PMOS管的方案是缺乏成本竞争力的,并且普通MOS器件的ESD防静电性能(按HBM计1KV左右)仅为集成电路类芯片的ESD性能(最基本2KV)的一半,两者串联使用降低了正常工作时整体方案的ESD性能。In order to avoid damage to the target chip when the power supply is reversely connected, the existing mainstream solutions: ① is to add a Schottky or silicon diode in series outside the target chip, but because the diode itself consumes a voltage drop of 0.3V to 0.8V when it is turned on , so the power loss is large. ② is to add an ideal diode chip in series outside the target chip, the voltage is reduced to several tens of mV when turned on, and there are at least 3 pins, which are the input terminal (anode), the output terminal (cathode), and the zero-voltage potential terminal GND, The ideal diode belongs to the CMOS process, and there are still P-type substrate (P-well) and N-well well-lined diodes between its own input and GND, and it is vulnerable when the power is reversely connected. ③ is to add a PMOS tube outside the target chip, but it increases the cost and volume. Taking a 3-pin packaged low-power low-dropout linear buck LDO target chip that sells for about 0.2 yuan as an example, the solution of adding an additional 3-pin PMOS tube is not cost-competitive, and the cost of ordinary MOS devices is low. The ESD anti-static performance (about 1KV according to HBM) is only half of the ESD performance of integrated circuit chips (the most basic 2KV). The use of the two in series reduces the ESD performance of the overall solution during normal operation.

发明内容SUMMARY OF THE INVENTION

发明目的:为了解决现有技术中,自身正向工作电流不大的CMOS工艺的目标芯片,在电源反接时会因大电流而损毁的问题,本实用新型提供一种防电源反接的芯片。Purpose of the invention: In order to solve the problem in the prior art that the target chip of the CMOS process with a small forward working current itself will be damaged due to a large current when the power supply is reversely connected, the utility model provides a chip that prevents the reverse connection of the power supply .

技术方案:一种防电源反接的芯片,包括裸芯片及参考电位引脚,所述裸芯片包括P型衬底、参考电位PAD连接点及设置在P型衬底上的多叉指结构的NMOS;所述NMOS的源极与P型衬底电连接,所述NMOS的漏极与参考电位PAD连接点电连接;参考电位PAD连接点与参考电位引脚电连接。Technical solution: a chip against reverse power supply, comprising a bare chip and a reference potential pin, the bare chip comprising a P-type substrate, a reference potential PAD connection point and a multi-finger structure arranged on the P-type substrate NMOS; the source of the NMOS is electrically connected to the P-type substrate, the drain of the NMOS is electrically connected to the reference potential PAD connection point; the reference potential PAD connection point is electrically connected to the reference potential pin.

进一步地,所述芯片为理想二极管芯片。Further, the chip is an ideal diode chip.

进一步地,所述参考电位为零电压电位,所述参考电位引脚为成品芯片封装外部的GND引脚。Further, the reference potential is zero voltage potential, and the reference potential pin is a GND pin outside the package of the finished chip.

进一步地,所述NMOS为ESD类型NMOS。Further, the NMOS is an ESD type NMOS.

进一步地,还包括第一电阻,所述NMOS的栅极通过第一电阻连接芯片的正电源端。Further, a first resistor is also included, and the gate of the NMOS is connected to the positive power supply terminal of the chip through the first resistor.

进一步地,还包括二级ESD保护器件,所述二级ESD保护器件一端连接NMOS栅极,另一端连接P型衬底。Further, a secondary ESD protection device is also included, one end of the secondary ESD protection device is connected to the NMOS gate, and the other end is connected to the P-type substrate.

进一步地,还包括第二电阻,所述第二电阻一端连接参考电位PAD连接点,另一端连接P型衬底;所述第二电阻的阻值大于100Ω。Further, it also includes a second resistor, one end of the second resistor is connected to the reference potential PAD connection point, and the other end is connected to the P-type substrate; the resistance value of the second resistor is greater than 100Ω.

进一步地,还包括电容,所述电容一端连接芯片正电源端,另一端连接P型衬底。Further, it also includes a capacitor, one end of the capacitor is connected to the positive power supply terminal of the chip, and the other end is connected to the P-type substrate.

进一步地,还包括封装底板,所述封装底板与裸芯片的P型衬底间通过非导电黏结材料连接,相互绝缘。Further, a package bottom plate is also included, and the package bottom plate and the P-type substrate of the bare chip are connected by a non-conductive adhesive material and are insulated from each other.

进一步地,所述芯片为理想二极管芯片时,还包括低导通电阻的MOS管、运放、第一电阻、输入引脚和输出引脚;低导通电阻的MOS管的输入端连接输入引脚,输出端连接输出引脚,驱动端连接运放的输出端;运放的负电源端连接NMOS的源极及P型衬底;所述参考电位引脚为芯片的公共端引脚,连接NMOS的漏极;所述NMOS的栅极通过第一电阻连接芯片的输入引脚。Further, when the chip is an ideal diode chip, it also includes a low on-resistance MOS tube, an operational amplifier, a first resistor, an input pin and an output pin; the input end of the low on-resistance MOS tube is connected to the input lead. pin, the output terminal is connected to the output pin, and the driving terminal is connected to the output terminal of the operational amplifier; the negative power supply terminal of the operational amplifier is connected to the source of the NMOS and the P-type substrate; the reference potential pin is the common terminal pin of the chip, connected to The drain of the NMOS; the gate of the NMOS is connected to the input pin of the chip through the first resistor.

相比较现有技术,本实用新型提供一种防电源反接的芯片,具有以下有益效果:Compared with the prior art, the utility model provides a chip for preventing the reverse connection of the power supply, which has the following beneficial effects:

(1)摒弃了常规芯片设计中P型衬底默认就是零电压参考电位的电源架构,而是通过新增多叉指结构的ESD类型NMOS器件和参考电位PAD连接点,将此NMOS的漏极作为整个芯片的零电压参考电位并连接到芯片封装对外的GND引脚;(1) Abandoning the power supply structure of the P-type substrate in the conventional chip design, which is a zero-voltage reference potential by default, but by adding an ESD-type NMOS device with a multi-finger structure and a reference potential PAD connection point, the drain of the NMOS is connected. As the zero-voltage reference potential of the entire chip and connected to the GND pin outside the chip package;

(2)兼顾了ESD性能,无论是电源正接还是反接,均具有远超外置MOS管的ESD指标的优点;(2) Taking into account the ESD performance, whether the power supply is connected directly or reversely, it has the advantage of far exceeding the ESD index of the external MOS tube;

(3)进一步通过第二电阻降低了衬底寄生三极管效应和LATCH电流闩锁效应;(3) The parasitic triode effect of the substrate and the latch-up effect of the LATCH current are further reduced by the second resistance;

(4)嵌入式一体化结构,结构简单,成本较低;(4) Embedded integrated structure, simple structure and low cost;

(5)避免了当芯片电源反接时造成大电流,尤其适用于自身正向工作电流不大、且工作电流变化较为平缓的CMOS工艺的目标芯片;(5) Avoid the large current caused by the reverse connection of the chip power supply, especially suitable for the target chip of the CMOS process whose forward working current is not large and the working current changes relatively gently;

(6)提供一种防电源反接的理想二极管芯片,自身具有防电源反接的功能,还可以串联在目标芯片的正电源端以保护目标芯片不被电源反接而损坏。(6) To provide an ideal diode chip with anti-power reverse connection, which has the function of anti-power reverse connection, and can also be connected in series with the positive power supply terminal of the target chip to protect the target chip from being damaged by the reverse power connection.

附图说明Description of drawings

图1为现有技术CMOS工艺芯片的结构示意图;1 is a schematic structural diagram of a prior art CMOS process chip;

图2为实施例一防电源反接的芯片的结构示意图;FIG. 2 is a schematic structural diagram of a chip for preventing power reverse connection in Embodiment 1;

图3为实施例一防电源反接的芯片的原理图;FIG. 3 is a schematic diagram of a chip for preventing reverse connection of the power supply in the first embodiment;

图4为实施例二防电源反接的芯片的最简结构图;Fig. 4 is the simplest structure diagram of the chip for preventing the reverse connection of the power supply in the second embodiment;

图5为实施例三防电源反接的理想二极管芯片的原理图。FIG. 5 is a schematic diagram of an ideal diode chip for preventing reverse connection of the power supply according to the third embodiment.

具体实施方式Detailed ways

下面结合附图和具体实施例,对本实用新型作进一步解释说明。The present utility model will be further explained below in conjunction with the accompanying drawings and specific embodiments.

实施例一:Example 1:

一种防电源反接的芯片,如图2所示,包括封装底板11、裸芯片及成品芯片封装外部的参考电位引脚,所述裸芯片包括P型衬底12、参考电位PAD连接点及设置在P型衬底上的多叉指结构的NMOS;如图2中QFN封装底板,该封装底板11与裸芯片的P型衬底12间通过非导电黏结材料15连接,二者相互绝缘,而非传统产品中P型衬底与封装底板通过导电胶实现电连接;所述NMOS的源极14与P型衬底连接到同一电位,如图3中的PSUB,所述NMOS的漏极16与参考电位PAD连接点电连接,参考电位PAD连接点与参考电位引脚电连接,根据应用需求可以再与封装底板11电连接,另外有些封装形式则将封装底板11作为参考电位引脚。图中虚线部分表示产生的寄生器件。A chip for preventing reverse power connection, as shown in FIG. 2, includes a package bottom plate 11, a bare chip and reference potential pins outside the package of the finished chip, and the bare chip includes a P-type substrate 12, a reference potential PAD connection point and a reference potential pin. An NMOS with a multi-finger structure arranged on a P-type substrate; as shown in the QFN package bottom plate in Figure 2, the package bottom plate 11 and the P-type substrate 12 of the bare chip are connected by a non-conductive adhesive material 15, and the two are insulated from each other. In non-traditional products, the P-type substrate and the package bottom plate are electrically connected through conductive glue; the source electrode 14 of the NMOS and the P-type substrate are connected to the same potential, such as the PSUB in FIG. 3, the drain electrode 16 of the NMOS It is electrically connected to the reference potential PAD connection point, the reference potential PAD connection point is electrically connected to the reference potential pin, and can be electrically connected to the package bottom plate 11 according to application requirements. In other package forms, the package bottom plate 11 is used as the reference potential pin. The dotted line in the figure represents the resulting parasitic device.

该芯片中的参考电位为零电压电位GND,所述参考电位引脚为成品芯片封装外部的GND引脚,或者是负电源VSS引脚,用于连接供电系统的零电压端或负电压端。The reference potential in the chip is zero voltage potential GND, and the reference potential pin is the GND pin outside the package of the finished chip, or the negative power VSS pin, which is used to connect the zero voltage terminal or the negative voltage terminal of the power supply system.

所述NMOS优选采用ESD类型NMOS。其漏极CONTACT孔到栅极GATE之间的距离较大,通常大于普通的最小设计规则的NMOS的相关尺寸的3倍以上。例如3.3V普通NMOS漏孔与栅极间距为0.3um左右,先进工艺可达到0.1um,而ESD类NMOS漏孔与栅极间距为1.2um以上,甚至3um,通常由多个叉指结构的NMOS构成,单位NMOS的W不小于20um,叉指对数不小于6。就ESD类型NMOS的结构和性能而言,当芯片被正向电压的ESD冲击时,NMOS的存在相当于在原ESD结构中串联了一个正向二极管(来自NMOS的漏极与衬底的寄生),众所周知,二极管正向时ESD性能极佳;当芯片被反向电压的ESD冲击时,ESD器件为NMOS与阱衬等二极管的串联,NMOS工作于GGNMOS或GRNMOS模式,具有较好的ESD性能,阱衬二极管处于正向工作状态,ESD性能极佳。无论正反ESD冲击,均有远超外置MOS管的ESD指标。The NMOS is preferably an ESD type NMOS. The distance between the drain CONTACT hole and the gate GATE is large, usually more than 3 times larger than the relative size of the NMOS of the common minimum design rule. For example, the distance between the drain and gate of 3.3V ordinary NMOS is about 0.3um, and the advanced process can reach 0.1um, while the distance between the drain and gate of ESD NMOS is more than 1.2um, or even 3um, which is usually composed of multiple interdigitated NMOS structures. Composition, the W of the unit NMOS is not less than 20um, and the interdigital logarithm is not less than 6. As far as the structure and performance of ESD type NMOS are concerned, when the chip is impacted by ESD with forward voltage, the existence of NMOS is equivalent to connecting a forward diode in series in the original ESD structure (parasitic from the drain of NMOS and the substrate), As we all know, the ESD performance of the diode is excellent in the forward direction; when the chip is impacted by the ESD of the reverse voltage, the ESD device is a series connection of NMOS and a diode such as a well liner. The NMOS works in the GGNMOS or GRNMOS mode and has good ESD performance. The liner diode is in forward operation and has excellent ESD performance. Regardless of the positive and negative ESD impact, there are far more ESD indicators than the external MOS tube.

如图3,该芯片还可包括第一电阻R1,所述NMOS的栅极通过第一电阻R1连接芯片的正电源端。所述第一电阻R1用于NMOS栅极保护,进一步还可包含一个二级ESD保护器件,连接于NMOS栅极与P型衬底之间。栅极除了接正电源VDD,也可以接其它等效的相对较高电位,其目的就是当正向供电时能让NMOS开启,使P型衬底的电位尽可能地等同于成品芯片封装外部的的参考电位。As shown in FIG. 3 , the chip may further include a first resistor R1, and the gate of the NMOS is connected to the positive power supply terminal of the chip through the first resistor R1. The first resistor R1 is used for NMOS gate protection, and further includes a secondary ESD protection device connected between the NMOS gate and the P-type substrate. In addition to the positive power supply VDD, the gate can also be connected to other equivalent relatively high potentials. The purpose is to enable the NMOS to turn on when the power is forwarded, so that the potential of the P-type substrate is as equal as possible to that outside the finished chip package. the reference potential.

如图3,还可包括第二电阻R2,所述第二电阻R2一端连接参考电位PAD连接点,另一端连接P型衬底。所述第二电阻的阻值为数百欧至数十千欧,本实施例中采用5kΩ,用于当正向供电时,尽量让电流流经此电阻,避免在NMOS漏极与衬底寄生的正向二极管上产生过多压降,引起衬底寄生三极管电流甚至LATCH效应。当意外电源反接时,第二电阻的存在会产生微安或者毫安级的电流,但是符合芯片设计参数,功率也小,不会造成永久性的损毁。As shown in FIG. 3 , a second resistor R2 may also be included, one end of the second resistor R2 is connected to the reference potential PAD connection point, and the other end is connected to the P-type substrate. The resistance value of the second resistor is hundreds of ohms to tens of thousands of ohms. In this embodiment, 5kΩ is used to allow the current to flow through this resistor as much as possible when the power is forwarded, so as to avoid parasitics between the NMOS drain and the substrate. Excessive voltage drop is generated on the forward diode, causing substrate parasitic triode current and even LATCH effect. When the accidental power supply is reversed, the existence of the second resistor will generate a current of microampere or milliampere level, but it conforms to the design parameters of the chip, and the power is also small, which will not cause permanent damage.

如图3,还可包括电容,所述电容一端连接芯片正电源端,另一端连接P型衬底。该电容用于降低芯片正电源相对P型衬底的电压纹波,改善弱信号处理时的模拟芯片的性能。As shown in FIG. 3 , a capacitor may also be included, one end of the capacitor is connected to the positive power supply terminal of the chip, and the other end is connected to the P-type substrate. The capacitor is used to reduce the voltage ripple of the chip's positive power supply relative to the P-type substrate, and to improve the performance of the analog chip during weak signal processing.

本实施例为考虑到封装底板的情况,即当存在封装底板时,需要将封装底板11与裸芯片的P型衬底12间通过非导电黏结材料15连接,使封装底板11与P型衬底12相互绝缘,而非传统产品中P型衬底与封装底板通过导电胶实现电连接。然而在有些应用中,可能不存在封装底板或者封装底板已经对外部绝缘,就不需要考虑其连接方式。In this embodiment, considering the situation of the package bottom plate, that is, when there is a package bottom plate, it is necessary to connect the package bottom plate 11 and the P-type substrate 12 of the bare chip through a non-conductive adhesive material 15, so that the package bottom plate 11 and the P-type substrate are connected 12. They are insulated from each other, and the P-type substrate and the package bottom plate are electrically connected through conductive glue in non-traditional products. However, in some applications, there may not be a package backplane or the package backplane is already insulated from the outside, and the connection method does not need to be considered.

实施例二:Embodiment 2:

实施例二与实施例一相比,为一种简洁结构的防电源反接的芯片,包括裸芯片及成品芯片封装外部的参考电位引脚,所述裸芯片包括P型衬底、参考电位PAD连接点及设置在P型衬底上的多叉指结构的NMOS;所述NMOS的源极与P型衬底连接到同一电位,所述NMOS的漏极与参考电位PAD连接点电连接,参考电位PAD连接点与参考电位引脚电连接。Compared with the first embodiment, the second embodiment is a chip with a simple structure to prevent the reverse connection of the power supply, including a bare chip and reference potential pins outside the package of the finished chip, and the bare chip includes a P-type substrate and a reference potential PAD. The connection point and the NMOS of the multi-finger structure arranged on the P-type substrate; the source of the NMOS and the P-type substrate are connected to the same potential, and the drain of the NMOS is electrically connected to the reference potential PAD connection point, refer to The potential PAD connection point is electrically connected to the reference potential pin.

如图4所示,该芯片中的参考电位为零电压电位GND,所述参考电位引脚为成品芯片封装外部的GND引脚,或者是负电源VSS引脚,用于连接供电系统的零电压端或负电压端。As shown in Figure 4, the reference potential in the chip is zero voltage potential GND, and the reference potential pin is the GND pin outside the package of the finished chip, or the negative power VSS pin, which is used to connect the zero voltage of the power supply system terminal or negative voltage terminal.

为了对NMOS栅极进行保护,还包括第一电阻R1,所述NMOS的栅极通过第一电阻R1连接芯片的正电源端。In order to protect the gate of the NMOS, a first resistor R1 is also included, and the gate of the NMOS is connected to the positive power supply terminal of the chip through the first resistor R1.

实施例三:Embodiment three:

实施例三与实施例一或实施例二相比,区别在于,实施例一和实施例二不限制芯片的具体功能,只要是含有以上结构,该芯片即具有防电源反接功能,而实施例三进一步限制了该芯片为理想二极管芯片。The difference between Embodiment 3 and Embodiment 1 or Embodiment 2 is that Embodiment 1 and Embodiment 2 do not limit the specific functions of the chip. Three further restricts the chip to an ideal diode chip.

传统的理想二极管芯片能以极低的电压降实现单向导电,但其自身却不具防电源反接功能。本实施例的防电源反接的理想二极管芯片,基于本实用新型的防电源反接的电源架构,与理想二极管的单向导电相结合,实现内嵌防电源反接的理想二极管,其自身具有防电源反接功能,也可以用于串联在自身不防反接的第三方目标芯片的正电源端,避免目标芯片电源反接造成损坏。The traditional ideal diode chip can realize unidirectional conduction with a very low voltage drop, but it does not have the function of preventing power reverse connection. The ideal diode chip with anti-power reverse connection in this embodiment is based on the power supply structure with anti-power reverse connection of the present invention, combined with the unidirectional conduction of the ideal diode, to realize the embedded ideal diode for anti-power reverse connection, which itself has The anti-power reverse connection function can also be used to connect in series with the positive power supply terminal of a third-party target chip that does not prevent reverse connection itself, so as to avoid damage caused by reverse power supply of the target chip.

实施例三的防电源反接的理想二极管芯片,包括如实施例一所示的封装底板、裸芯片及成品芯片封装外部的参考电位引脚、第一电阻。如图5所示,还包括低导通电阻的MOS管Q1、运放、内部电源二选一单元、成品封装后对外的输入引脚、输出引脚及公共端引脚,所述公共端引脚即为参考电位引脚。The ideal diode chip with anti-power reverse connection in the third embodiment includes the package base plate shown in the first embodiment, the bare chip and the reference potential pins outside the package of the finished chip, and the first resistor. As shown in Figure 5, it also includes a low on-resistance MOS transistor Q1, an operational amplifier, an internal power supply unit selected from two alternatives, external input pins, output pins and common terminal pins after the finished product is packaged. The common terminal leads to The pin is the reference potential pin.

进一步地,还可以包括第二电阻、二级ESD保护单元,其连接方式与作用和实施例一中的相同。Further, a second resistor and a second-level ESD protection unit may also be included, and the connection method is the same as that in the first embodiment.

NMOS的源极及P型衬底连接至运放的负电源端,NMOS的漏极与参考电位PAD连接点连接,再与成品封装后对外的公共端引脚连接。NMOS的栅极通过第一电阻连接芯片的输入引脚;二级ESD保护器件一端连接NMOS栅极,另一端连接P型衬底;第二电阻一端连接参考电位PAD连接点,另一端连接P型衬底。The source of the NMOS and the P-type substrate are connected to the negative power supply terminal of the operational amplifier, the drain of the NMOS is connected to the reference potential PAD connection point, and then connected to the external common terminal pin after the finished product is packaged. The gate of the NMOS is connected to the input pin of the chip through the first resistor; one end of the secondary ESD protection device is connected to the NMOS gate, and the other end is connected to the P-type substrate; one end of the second resistor is connected to the reference potential PAD connection point, and the other end is connected to the P-type substrate.

低导通电阻的MOS管Q1的输入端连接输入引脚,输出端连接输出引脚,驱动端连接运放的输出端。本实施例中Q1是很大尺寸的低导通电阻的MOS管,通态阻抗在数mΩ到数百mΩ。图5中Q1是PMOS,结构简单但面积大,Q1也可以换成NMOS,并增加电荷泵升压电路并调整运放极性以便驱动NMOS的栅极。本实施例中,设有两处防倒灌单元,如低导通电阻的MOS管Q1的阱设有阱防倒灌单元,以确保Q1源漏与阱之间的寄生二极管不影响整体的单向导电功能,图5中用两个对接二极管仅为示意,实际电路有多种可用结构。其次,低导通电阻的MOS管Q1的栅设有栅防倒灌单元,以确保反向供电时Q1关闭,图5中用Q2和限流保护电阻R3仅为示意,反向供电时VOUT电压高于VIN,故Q2导通确保Q1栅极为高电位以关闭Q1。所述的防倒灌单元的具体实现电路有多种可用结构,在此不做限制。The input end of the low on-resistance MOS transistor Q1 is connected to the input pin, the output end is connected to the output pin, and the drive end is connected to the output end of the operational amplifier. In this embodiment, Q1 is a MOS transistor with a large size and low on-resistance, and the on-state impedance ranges from several mΩ to several hundreds of mΩ. In Figure 5, Q1 is a PMOS, with a simple structure but a large area. Q1 can also be replaced with an NMOS, and a charge pump boost circuit is added and the polarity of the op amp is adjusted to drive the gate of the NMOS. In this embodiment, two anti-backflow units are provided. For example, the well of the MOS transistor Q1 with low on-resistance is provided with a well anti-backflow unit to ensure that the parasitic diode between the source and drain of Q1 and the well does not affect the overall unidirectional conduction. Function, the use of two butted diodes in Figure 5 is for illustration only, and there are many available structures in the actual circuit. Secondly, the gate of the low on-resistance MOS transistor Q1 is provided with a gate anti-backflow unit to ensure that Q1 is turned off during reverse power supply. In Figure 5, Q2 and current limiting protection resistor R3 are used for illustration only, and the VOUT voltage is high during reverse power supply. At VIN, so Q2 turns on ensuring that the gate of Q1 is high to turn off Q1. The specific implementation circuit of the anti-backflow unit has various available structures, which are not limited here.

如图5本实施例中的内部电源二选一单元用两个对接二极管仅为示意,实际电路有多种可用结构,通常用比较器及MOS实现切换。本实施例中二级ESD保护单元仅为示意,实际电路有多种可用结构。As shown in FIG. 5 , the use of two butt diodes for the internal power supply two-to-one unit in this embodiment is only for illustration. There are many available structures in the actual circuit, and the switching is usually realized by a comparator and a MOS. The secondary ESD protection unit in this embodiment is only for illustration, and there are many available structures in the actual circuit.

在应用中,自身不防电源反接的第三方目标芯片的正电源端连接该防电源反接的理想二极管的输出端。当输入端VIN电压为0、输出端VOUT有电压时,此时Q1关闭,整个理想二极管芯片的消耗电流在数mA甚至1uA以下,电阻R2用于在P型衬底与外部GND之间提供这种小电流通道。当理想二极管的输入端与所有芯片公共GND之间的电源反接时,不但理想二极管自身不会损坏,并且它还关断了输出端与输入端的电流,避免了第三方目标芯片因内部的阱衬二极管过流而损坏。In the application, the positive power supply terminal of the third-party target chip that is not protected against reverse power supply is connected to the output terminal of the ideal diode that is protected against reverse power supply. When the input terminal VIN voltage is 0 and the output terminal VOUT has voltage, Q1 is turned off at this time, the consumption current of the entire ideal diode chip is several mA or even 1uA or less, and the resistor R2 is used to provide this between the P-type substrate and the external GND. a small current channel. When the power supply between the input terminal of the ideal diode and the common GND of all chips is reversed, not only the ideal diode itself will not be damaged, but it also turns off the current between the output terminal and the input terminal, avoiding the third-party target chip due to internal wells. The liner diode is damaged due to overcurrent.

Claims (10)

1. A chip for preventing reverse connection of a power supply comprises a bare chip and a reference potential pin, wherein the bare chip comprises a P-type substrate, a reference potential PAD connection point and an NMOS (N-channel metal oxide semiconductor) with a multi-interdigital structure, wherein the NMOS is arranged on the P-type substrate; the source electrode of the NMOS is electrically connected with the P-type substrate, and the drain electrode of the NMOS is electrically connected with a reference potential PAD connection point; the reference potential PAD connecting point is electrically connected with the reference potential pin.
2. The chip for preventing reverse connection of power supply of claim 1, wherein the chip is an ideal diode chip.
3. The chip for preventing reverse connection of power supply as claimed in claim 1 or 2, wherein the reference potential is zero voltage potential, and the reference potential pin is a GND pin outside the finished chip package.
4. The chip for preventing reverse connection of power supply as claimed in claim 1 or 2, wherein the NMOS is an ESD type NMOS.
5. The chip for preventing reverse connection of power supply of claim 1 or 2, further comprising a first resistor, wherein the gate of the NMOS is connected to the positive power supply terminal of the chip through the first resistor.
6. The chip for preventing reverse connection of power supply of claim 5, further comprising a secondary ESD protection device, wherein one end of the secondary ESD protection device is connected with the NMOS grid electrode, and the other end of the secondary ESD protection device is connected with the P-type substrate.
7. The chip for preventing reverse connection of power supply of claim 1 or 2, further comprising a second resistor, wherein one end of the second resistor is connected with a reference potential PAD connection point, and the other end is connected with a P-type substrate; the resistance value of the second resistor is larger than 100 omega.
8. The chip for preventing reverse connection of power supply of claim 1 or 2, further comprising a capacitor, wherein one end of the capacitor is connected with a positive power supply end of the chip, and the other end of the capacitor is connected with the P-type substrate.
9. The chip for preventing reverse connection of power supply of claim 1 or 2, further comprising a package base plate, wherein the package base plate and the P-type substrate of the bare chip are connected through a non-conductive adhesive material and are insulated from each other.
10. The chip for preventing reverse connection of power supply of claim 2, further comprising a MOS tube with low on-resistance, an operational amplifier, a first resistor, an input pin and an output pin; the input end of the MOS tube with low on-resistance is connected with the input pin, the output end of the MOS tube with low on-resistance is connected with the output pin, and the drive end of the MOS tube with low on-resistance is connected with the output end of the operational amplifier; the negative power supply end of the operational amplifier is connected with the source electrode of the NMOS and the P-type substrate; the reference potential pin is a common terminal pin of the chip and is connected with a drain electrode of the NMOS; and the grid electrode of the NMOS is connected with an input pin of the chip through a first resistor.
CN202220780955.3U 2022-04-06 2022-04-06 A chip against reverse power supply Active CN217086571U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202220780955.3U CN217086571U (en) 2022-04-06 2022-04-06 A chip against reverse power supply

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202220780955.3U CN217086571U (en) 2022-04-06 2022-04-06 A chip against reverse power supply

Publications (1)

Publication Number Publication Date
CN217086571U true CN217086571U (en) 2022-07-29

Family

ID=82555142

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202220780955.3U Active CN217086571U (en) 2022-04-06 2022-04-06 A chip against reverse power supply

Country Status (1)

Country Link
CN (1) CN217086571U (en)

Similar Documents

Publication Publication Date Title
CN101930974B (en) Bottom-Source NMOS-triggered Zener Clamp for Configuring Ultra-Low Voltage Transient Voltage Suppressors
US8373956B2 (en) Low leakage electrostatic discharge protection circuit
CN108807376B (en) A Bidirectional Transient Voltage Suppressor Using Low-Voltage MOS Assisted Trigger SCR
JP2015211463A (en) Electrostatic discharge protection circuit
US20130099297A1 (en) Electrostatic discharge protection device
CN211238251U (en) Electrostatic protection circuit
US8208234B2 (en) Circuit with ESD protection for a switching regulator
CN102761109B (en) Power management circuit and high voltage device therein
US8730624B2 (en) Electrostatic discharge power clamp with a JFET based RC trigger circuit
CN110198029A (en) A kind of chip power over-voltage and reverse-connection protection circuit and method
CN104867922B (en) Conductor integrated circuit device and the electronic equipment for using the device
CN106876389B (en) ESD protection device with auxiliary trigger SCR structure of resistance-capacitance diode
CN113839374B (en) ESD power protection circuit, working power supply and chip
WO2016017386A1 (en) Protection element, protection circuit, and semiconductor integrated circuit
TW201314869A (en) Semiconductor device
TWI784502B (en) Electrostatic discharge protection circuit
Kwon et al. Design of LDO regulator with high reliability ESD protection circuit using analog current switch structure for 5-V applications
CN217086571U (en) A chip against reverse power supply
CN105895631B (en) A kind of high-voltage LDMOS electrostatic protection circuit structure
TWI718611B (en) High voltage circuitry device and its ring circuitry layout
JP6405986B2 (en) Electrostatic protection circuit and semiconductor integrated circuit device
CN112687680A (en) Low-trigger SCR (silicon controlled rectifier) structure for ESD (electro-static discharge) protection of low-voltage integrated circuit
CN210926016U (en) High-voltage electrostatic protection device and circuit
CN115864348A (en) Multi-channel bidirectional electrostatic surge protection circuit suitable for communication chip
CN109979929B (en) A high-voltage electrostatic discharge clamp protection element and integrated circuit chip

Legal Events

Date Code Title Description
GR01 Patent grant
GR01 Patent grant