CN217083960U

CN217083960U - Spectrometer

Info

Publication number: CN217083960U
Application number: CN202220337558.9U
Authority: CN
Inventors: 吴浩平; 洪健翔; 张癸五
Original assignee: OTO Photonics Inc
Current assignee: OTO Photonics Inc
Priority date: 2022-02-18
Filing date: 2022-02-18
Publication date: 2022-07-29
Anticipated expiration: 2032-02-18

Abstract

The embodiment of the application provides a spectrometer. The spectrometer comprises a base, a light input element, a light splitting element, an image sensor and a shielding element. The optical input element is arranged on the base and used for receiving optical signals. The optical splitting element is arranged on the base and used for inputting the optical signal received by the optical input element and separating the optical signal into a plurality of spectral components. The image sensor is arranged on the base and provided with a sensing surface for receiving the spectral components. The sensing surface has a virtual center line extending in the arrangement direction of these spectral components. The shielding element is arranged between the light splitting element and the image sensor according to the optical influence factor and is positioned on the projection path of part of the spectral components to shield part of the spectral components so as to inhibit the part with overhigh light intensity in the spectral components. The shadow produced by the blocking element on the sensing surface does not fall on the virtual center line.

Description

Spectrometer

Technical Field

The application relates to the technical field of optical measurement devices, in particular to a spectrometer.

Background

The spectrometer is a scientific instrument which applies an optical principle and decomposes light with complex components into spectral lines. The spectrometer can observe, analyze and process the structure and the components of a substance, and has the advantages of high analysis precision, large measurement range, high speed, small sample consumption and the like. Therefore, the resolution of molecular characteristics, the measurement of concentration, the identification of substances, the measurement of celestial spectra, etc. require the assistance of a spectrometer. In addition, spectrometers are widely used in various fields such as metallurgy, geology, petrochemical, medical and health, environmental protection, resource and hydrological exploration.

However, since the spectrometer is affected by the initial spectrum of the input optical signal, the spectral efficiency of the grating for each wavelength of light, and the photosensitive efficiency of the image sensor for each wavelength of light, the energy in a specific wavelength range is too strong, and the expected measurement result cannot be achieved.

SUMMERY OF THE UTILITY MODEL

The application provides a spectrometer capable of suppressing a part of spectral components where light intensity is too high.

The application provides a spectrometer, including frame, light input element, beam splitting component, image sensor and sheltering from the component. The optical input element is arranged on the base and used for receiving optical signals. The optical splitting element is arranged on the base and used for inputting the optical signal received by the optical input element and separating the optical signal into a plurality of spectral components. The image sensor is arranged on the base and is provided with a sensing surface for receiving the spectral components, wherein the sensing surface is provided with a virtual center line extending in the arrangement direction of the spectral components. The shielding element is arranged between the light splitting element and the image sensor according to optical influence factors and is positioned on a projection path of part of the spectral components to shield the part of the spectral components so as to inhibit the part with overhigh light intensity in the spectral components, wherein the shadow generated on the sensing surface by the shielding element does not fall on the virtual central line.

In an embodiment of the present application, the sensing surface extends on the base and has two end portions, wherein the shadow generated on the sensing surface by the shielding element does not fall on the two end portions.

In an embodiment of the present application, the shielding element is directly attached to the image sensor, or is located relatively close to the base or far away from the base.

In an embodiment of the present application, the spectrometer further includes a mounting assembly. The shielding element is arranged on the mounting assembly, and the mounting assembly is arranged on the base, so that the shielding element is mounted on the base through the mounting assembly.

In an embodiment of the application, the mounting assembly has an adjusting structure for adjusting a setting angle or a setting position of the shielding element relative to the base or the cover, or adjusting a setting position of the shielding element in a direction parallel to the sensing surface, or adjusting a setting position of the shielding element between the cover and the base.

In an embodiment of the present application, the optical influencing factor includes at least one of an initial spectrum of the optical signal, a light splitting efficiency of the light splitting element for each wavelength of light, and a light sensing efficiency of the image sensor for each wavelength of light.

In an embodiment of the present application, the shielding element is an opaque sheet, a dimmer sheet or a filter sheet.

In an embodiment of the present application, the shape of the shielding element varies according to the optical influencing factor.

In an embodiment of the present application, the shielding element includes a plurality of different shielding sheets, which are alternatively disposed at fixed positions between the light splitting element and the image sensor according to the optical influence factor, wherein the shielding sheets are different in shape, size, or inclination angle with respect to the base.

In an embodiment of the application, the spectrometer further includes a mounting assembly, and the shielding element is disposed on the mounting assembly, wherein the mounting assembly is disposed on the base, so that the shielding element is mounted on the base through the mounting assembly. The mounting assembly is provided with an adjusting structure for adjusting the setting angle or the setting position of the shielding element relative to the base or the cover body, or adjusting the setting position of the shielding element in the direction parallel to the sensing surface, or adjusting the setting position of the shielding element between the cover body and the base. The sensing surface extends on the base and is provided with two end parts, wherein the shadow generated on the sensing surface by the shielding element does not fall on the two end parts. The optical influencing factors comprise at least one of the source of the optical signal, the spectral efficiency of the spectral element for the spectral components of different wavebands and the photosensitive efficiency of the image sensor for the spectral components of different wavebands. The shielding element comprises a plurality of different shielding sheets which are arranged at fixed positions between the light splitting element and the image sensor in a replaceable way according to optical influence factors, wherein the shielding sheets are different in shape, size or inclination angle relative to the base.

The application further provides a spectrometer, which comprises a base, a light input element, a reflector, a plane grating, a focusing mirror, an image sensor, a shielding element and an installation assembly. The optical input element is arranged on the base and used for receiving optical signals. The reflector is arranged on the base and used for reflecting the optical signal received by the incident light input element. The plane grating is arranged on the base and used for incidence of the optical signal reflected by the reflector and separating the optical signal into a plurality of spectral components. The focusing lens is arranged on the base and used for focusing the spectral components separated by the plane grating. The image sensor is arranged on the base and is provided with a sensing surface used for receiving the spectral components focused by the focusing lens, wherein the sensing surface extends on the base and is provided with a virtual central line and two end parts, and the virtual central line extends in the arrangement direction of the spectral components. The shielding element is arranged between the focusing mirror and the image sensor according to the optical influence factor. The shielding element is an opaque sheet and is positioned on the projection path of part of the spectral components to shield part of the spectral components so as to inhibit the part of the spectral components with overhigh light intensity. The shadow generated on the sensing surface by the shielding element does not fall on the virtual center line and the two end parts. The mounting assembly is arranged on the base, and the shielding element is arranged on the mounting assembly, so that the shielding element is mounted on the base through the mounting assembly. The mounting assembly is provided with an adjusting structure for adjusting the setting angle or the setting position of the shielding element relative to the base.

In summary, the spectrometer provided by the present application can shield a portion of the spectral component by the shielding element disposed between the spectroscopic element and the image sensor, so as to suppress the portion of the spectral component where the light intensity is too high.

Drawings

The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:

FIG. 1 is a perspective view of a spectrometer according to an embodiment of the present application;

FIG. 2 is a top view of the spectrometer of FIG. 1;

FIG. 3 (A) is a schematic diagram showing the relationship between the shielding element and the image sensor of the spectrometer of FIG. 1;

FIG. 3 (B) is a side view of the spectrometer of FIG. 1 with a varying front and back cone angle of the shielding element;

FIG. 4 is a spectral diagram of the spectrometer of FIG. 1;

FIG. 5 (A) is a top view showing the spectrometer of FIG. 1 without a shielding element;

FIG. 5 (B) is a spectrum diagram showing the spectrometer of FIG. 5 (A);

FIG. 6 (A) is a top view showing the spectrometer of FIG. 1 with a blocking element disposed proximate to the optical sensor;

FIG. 6 (B) is a spectrum diagram showing the spectrometer of FIG. 6 (A);

FIG. 7 (A) is a top view showing the spectrometer of FIG. 1 with a blocking element disposed away from the optical sensor;

FIG. 7 (B) is a spectrum diagram showing the spectrometer of FIG. 7 (A);

FIG. 8 (A) is a side view of the spectrometer of FIG. 1 without a blocking element;

fig. 8 (B) is a spectrum diagram showing the spectrometer of fig. 8 (a);

FIG. 9 (A) is a side view showing the spectrometer of FIG. 1 with the blocking element set to a first height;

fig. 9 (B) is a spectrum diagram showing the spectrometer of fig. 9 (a);

FIG. 10 (A) is a side view showing the spectrometer of FIG. 1 with the blocking element at a second height;

fig. 10 (B) is a spectrum diagram showing the spectrometer of fig. 10 (a);

FIG. 11 is a schematic diagram showing the spectrometer of FIG. 1 with the blocking element replaced with another shape;

FIG. 12 is a schematic diagram illustrating the spectrometer of FIG. 1 with a shielding element disposed outside the image sensor;

FIG. 13 is a schematic diagram showing the spectrometer of FIG. 1 rotating a blocking element by a first angle;

FIG. 14 is a schematic diagram showing the spectrometer of FIG. 1 with the shielding element arranged as a plurality of shielding plates, and with the first shielding plate rotated by a second angle;

FIG. 15 is a schematic diagram showing the spectrometer of FIG. 1 rotating a blocking element by a third angle; and

FIG. 16 is a flow chart of a method of assembling the spectrometer of FIG. 1.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some, but not all, embodiments of the present application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

Fig. 1 is a perspective view of a spectrometer according to an embodiment of the present application, and fig. 2 is a top view of the spectrometer of fig. 1. Referring to fig. 1 and 2, the spectrometer 100 includes a base 110, an optical input device 120, a light splitting device 130, an image sensor 140, and a shielding device 150. The optical input element 120 is disposed on the base 110 for receiving the optical signal L. The optical splitting element 130 is disposed on the base 110, and is configured to receive the optical signal L received by the optical input element 120, so as to split the optical signal L into a plurality of spectral components S. In this embodiment, the spectrometer 100 further includes a mirror M1 disposed on the base 110 for reflecting the optical signal L received by the optical input element 120 to the optical splitting element 130. The light splitting element 130 is, for example, a plane grating, and is configured to enter the optical signal L reflected by the mirror M1 to split the optical signal L into a plurality of spectral components S. In another embodiment, not shown, the light splitting element 130 may also be a concave grating, but not limited thereto. The image sensor 140 is disposed on the base 110 and has a sensing surface 142 for receiving the spectral components S. In this embodiment, the spectrometer 100 further includes a focusing mirror M2 disposed on the base 110 for focusing the spectral components S separated by the splitting element 130. The image sensor 140 receives the spectral components S focused by the focusing lens M2. The shielding element 150 is disposed between the light splitting element 130 and the image sensor 140 according to the optical influence factor, and is located on a projection path of a portion of the spectral components S, so as to shield the portion of the spectral components S with too high light intensity in the spectral components S. In the present embodiment, the optical influencing factors include at least one of the initial spectrum of the optical signal L, the light splitting efficiency of the light splitting element 130 for each wavelength of light, the reflectivity of the reflecting mirror M1 and the focusing mirror M2, and the photosensitive efficiency of the image sensor 140 for each wavelength of light. For example, a spectral component S with too high light intensity refers to a spectral component S with a light intensity greater than a threshold, which may be determined according to optical influences.

In detail, the shielding element 150 is located between the focusing mirror M2 and the image sensor 140, and may be a light-proof sheet, a light-reducing sheet or a filter sheet to shield a part of the spectral component S focused by the focusing mirror M2. In addition, spectrometer 100 may further include a mounting assembly 160. The shielding element 150 is disposed on the mounting assembly 160, and the mounting assembly 160 is disposed on the base 110, such that the shielding element 150 is mounted on the base 110 by the mounting assembly 160. The mounting assembly 160 may also have an adjusting structure 162 for adjusting the installation angle or the installation position of the shielding element 150 relative to the base 110, or adjusting the installation position of the shielding element 150 in the direction parallel to the sensing surface 142, or adjusting the shielding element 150 to move away from or close to the base 110. In the embodiment, the adjusting structure 162 is composed of at least one locking member 162A and at least one guiding groove 162B, so that the blocking element 150 is guided to move, position and fix in the X direction or the Z direction by the cooperation of the locking member 162A and the guiding groove 162B. In another embodiment, not shown, the shielding element 150 may be directly attached to the image sensor 140, or may be moved along the Y direction to be located relatively close to the base 110 or far from the base 110.

Fig. 3 (a) is a schematic diagram showing the relative relationship between the shielding element and the image sensor of the spectrometer of fig. 1. Referring to fig. 3 (a), the sensing surface 142 has a virtual central line a extending in the arrangement direction of the spectral components S, wherein the shadow generated on the sensing surface 142 by the shielding element 150 does not fall on the virtual central line a. Although the virtual center line a in fig. 3 (a) is illustrated as a straight line, the virtual center line a is a virtual line formed by connecting the centers of the spectral components S of the respective wavelengths, and thus may be a curved line in practice depending on the light type. It should be noted that, since the shadow generated on the sensing surface 142 by the shielding element 150 does not fall on the virtual center line a with higher light intensity, the numerical aperture is reduced, and the resolution of the shielded wavelength band is improved. In addition, the sensing surface 142 extends on the base 110 and has two end portions 142 a. The shadow generated on the sensing surface 142 by the shielding member 150 may not fall on the two end portions 142 a. Since the spectral components received at the two end portions 142a are generally weak in intensity. Therefore, the shadow generated on the sensing surface 142 by the shielding member 150 does not fall on the two end portions 142a, and the resolution can be prevented from being lowered.

FIG. 3 (B) is a side view of the spectrometer of FIG. 1 with a varying front and back cone angle of the shielding element. Referring to FIG. 3 (B), spectrometer 100 sets the cone angle θ of the optical path after shielding element 150 ₁ A taper angle theta smaller than that of the light path before the shielding member 150 is disposed ₀ So as to correspond to the taper angle theta ₁ Will be greater than the corresponding cone angle theta ₀ The optical resolution of (2). That is, in the present embodiment (i.e., the shielding element 150 is not directly attached to the image sensor 140), since the focusing numerical aperture is reduced by the shielding element 150, the numerical aperture is reduced, the imaging aberration is small, and the optical resolution of the shielded wavelength band is improved.

Fig. 4 is a spectral diagram of the spectrometer of fig. 1. Referring to FIG. 4, a spectrogram bagTwo spectral curves C0 and C1 are included, where the spectral curve C0 represents experimental data of spectrometer 100 without the shielding element 150, and the spectral curve C1 represents experimental data of spectrometer 100 with the shielding element 150. As can be seen from the figure, in the wavelength interval Δ λ _A (wavelength range of about 220-280 nm), the portion of the spectrum curve C1 with too high light intensity is significantly suppressed relative to the spectrum curve C0 without exceeding the maximum light-sensing capability of the image sensor 140. Therefore, the light intensity of other wavelengths can be further increased in an integral time mode, and the balance of the whole light intensity is further improved. In addition, in the wavelength interval Δ λ _A Outside the range of (1), the optical resolutions of the spectral curves C0 and C1 are both 0.5nm, for example. However, in the wavelength interval Δ λ _A For example, the optical resolution of the spectral curve C0 is 0.5nm, and the optical resolution of the spectral curve C1 is 0.3 nm. That is, in the wavelength interval Δ λ _A The spectral curve C1 has a higher optical resolution than the spectral curve C0.

Fig. 5 (a) is a top view showing the spectrometer of fig. 1 without the shielding element, and fig. 5 (B) is a spectrum diagram showing the spectrometer of fig. 5 (a). Referring to fig. 5 (a) and 5 (B), for convenience of description, fig. 5 (a) schematically depicts only the focusing mirror M2, the image sensor 140 and the spectral component S focused on the sensing surface 142, and the spectral curve C2 in fig. 5 (B) is represented by a straight line (the vertical axis I is light intensity, and the horizontal axis λ is wavelength). Fig. 6 (a) is a top view showing the spectrometer of fig. 1 with a shielding element disposed near the optical sensor, and fig. 6 (B) is a spectral diagram showing the spectrometer of fig. 6 (a). Referring to fig. 5 (a) in comparison with fig. 6 (a), a shielding member 150A is provided near the optical sensor 140 in fig. 6 (a). Referring to fig. 5 (B) and fig. 6 (B), the wavelength interval Δ λ in the spectral curve C3 is compared with the spectral curve C2 ₀ From light intensity I ₀ Is suppressed to light intensity I ₁ 。

FIG. 7 (A) is a top view showing the spectrometer of FIG. 1 with the blocking element disposed away from the optical sensor, and FIG. 7 (B) is a top viewA spectrum chart of the spectrometer of (a) in fig. 7 is represented. Referring to fig. 6 (a) and fig. 7 (a), compared to the shielding element 150A in fig. 6 (a), a shielding element 150B far away from the optical sensor 140 (i.e., relatively close to the focusing mirror M2) is disposed in fig. 7 (a). Referring to fig. 6 (B) and fig. 7 (B), the wavelength interval Δ λ in the spectral curve C4 is compared with the spectral curve C3 ₁ Less than the wavelength interval Δ λ in the spectral curve C4 ₀ . That is, the shielding element 150A emits the light intensity I similarly to the shielding element 150B ₀ Suppression to light intensity I ₁ But the wavelength range blocked is different. On the premise that the sizes and shapes of the

shielding elements

150A and 150B are not changed, the wider the shielding wavelength range (i.e., the slower the oblique angle of the spectrum shielding) and the higher the percentage of the shielding light intensity are as the focusing mirror M2 is moved. On the contrary, under the premise that the size and shape of the

shielding elements

150A and 150B are not changed, the narrower the band range of the shielding moving toward the image sensor 140 is, the more precise the shielding is (i.e., the more vertical the oblique angle of the spectrum shielding), the lower the percentage of the shielding light intensity is.

Fig. 8 (a) is a side view showing the spectrometer of fig. 1 without a shielding element, and fig. 8 (B) is a spectrum diagram showing the spectrometer of fig. 8 (a). For convenience of explanation, fig. 8 (a) schematically shows only the focusing mirror M2, the image sensor 140, and the spectral component S focused on the sensing surface 142, and the spectral curve C5 in fig. 8 (B) is represented by a straight line (the vertical axis I represents light intensity, and the horizontal axis λ represents wavelength). Fig. 9 (a) is a side view showing the spectrometer of fig. 1 with the blocking element set to the first height. Fig. 9 (B) is a graph showing the spectrum of the spectrometer shown in fig. 9 (a). Referring to fig. 8 (a) and fig. 9 (a), a shielding element 150C having a first height (i.e., a dimension in the Y direction) is disposed in fig. 9 (a), and the first height is substantially the same as the height of the center of the spectral component S. Referring to fig. 8 (B) and fig. 9 (B), the result is that the wavelength interval in the spectral curve C6 is compared with the spectral curve C5 from the light intensity I ₀ Is suppressed to light intensity (i.e., approximately 50% of the light intensity is suppressed).

FIG. 10 (A) is a schematic representation of the spectrometer of FIG. 1 with the blocking element set to the secondA high-level side view, fig. 10 (B) shows a spectrum diagram representing the spectrometer of fig. 10 (a). Referring to fig. 9 (a) and fig. 10 (a), compared to the shielding element 150C in fig. 9 (a), a shielding element 150D with a second height (i.e., a dimension in the Y direction) is disposed in fig. 10 (a), wherein the second height of the shielding element 150D is smaller than the first height of the shielding element 150C. Referring to fig. 9 (B) and fig. 10 (B), the spectrum curve C7 shows the wavelength interval Δ λ ₁ Is suppressed to a light intensity I' which is higher than the light intensity I of the spectral curve C6 _50％ . That is, the shielding element 150C suppresses the same wavelength region Δ λ as the shielding element 150D ₁ But the percentage of light intensity suppressed is different. On the premise that the sizes, shapes and positions of the shielding

elements

150C and 150D are not changed, the first height of the shielding element 150C is higher, and the shielding light intensity percentage is higher; conversely, the second height of the shielding element 150D is shorter, and the percentage of the light intensity shielded is also lower. Referring to fig. 9 a and 10 a again, since the spectral component S is focused by the focusing mirror M2, the spectral component S is narrower (i.e., the dimension in the Y direction) as it approaches the image sensor 140, and therefore, the light intensity percentage (e.g., 20%) to be suppressed by the height change is less easy to adjust as the shielding

elements

150C and 150D move toward the image sensor 140.

FIG. 11 is a schematic diagram showing the spectrometer of FIG. 1 replacing the blocking element with another shape. Referring to fig. 3 (a) and fig. 11, compared to fig. 3 (a), the shielding element 150E of fig. 11 is a regular shape, such as a rectangle, and the shielding element 150E is a trapezoid. In addition, the shielding element 150E may also be directly attached to the image sensor 140, or disposed away from or close to the image sensor 140. In another embodiment, not shown, the shielding element 150E may also be selected to have a gradual or other irregular shape according to the optical influence factor.

FIG. 12 is a schematic diagram illustrating the spectrometer of FIG. 1 with a shielding element disposed outside the image sensor. Referring to fig. 12, the shielding element 150F may be disposed on the base 110, extend upward from the outer sides of the base 110 and the image sensor 140, and then extend toward the image sensor 140 until reaching the position corresponding to the wavelength band to be shielded, and then extend downward. It will also be understood by those skilled in the art that the angle of extension need not be perfectly vertical or horizontal, but may be determined depending on optical considerations.

FIG. 13 is a schematic diagram illustrating the spectrometer of FIG. 1 rotating a shielding element by a first angle. Referring to fig. 3 (a) and fig. 14, the shielding element 150G is rectangular as the shielding element 150 of fig. 3 (a), but the shielding element 150G is rotated by a first angle on the X-Y plane relative to the shielding element 150, wherein the first angle is a multiple of other than 90 degrees. FIG. 14 is a schematic diagram showing the spectrometer of FIG. 1 with the shielding element arranged as a plurality of shielding plates, and with the first shielding plate rotated by a second angle. Referring to fig. 14, the shielding element 150H may include a first shielding plate 150H1 and a second shielding plate 150H 2. In this embodiment, the first shutter 150H1 rotates by a second angle in the X-Z plane. The closer the shielding element 150H is to the image sensor 140, the more precise the band range of the shielded portion of the spectral component S, and the closer the shielding element 150H is to the focusing mirror M2, the easier the adjustment of the percentage of the light intensity to be suppressed is. Therefore, by disposing the first shielding piece 150H1 and the second shielding piece 150H2 at different positions between the focusing mirror M2 and the image sensor 140, the optical image can be adjusted coarsely and finely according to the optical image factors and the requirements, so as to obtain the desired effect. In another embodiment, not shown, the shielding element 150H may comprise a plurality of different shielding sheets, and may be alternatively disposed at a fixed position between the light splitting element 130 and the image sensor 140 according to the optical influence factor. These different shielding sheets are different in shape, size, or inclination angle with respect to the housing, for example. When different shielding sheets are replaced to obtain a desired optical effect, the shielding sheets can be fixed on the base 110 by dispensing or locking, so as to ensure that the uniform optical effect can be maintained in subsequent use.

FIG. 15 is a schematic diagram showing the spectrometer of FIG. 1 rotating a shielding element by a third angle. Referring to fig. 10 (a) and 15, the height of the shielding element 150I is similar to that of the shielding element 150D of fig. 10 (a), but the shielding element 150I is tilted with respect to the base 110 (i.e., rotated by a third angle with respect to the Y-Z plane). Although fig. 13 to 15 respectively illustrate the case that the shielding element rotates with respect to different single planes, in still another embodiment, not shown, the shielding element may be tilted or rotated at different angles on more than two planes according to the optical influence factors and requirements, and not limited thereto.

FIG. 16 is a flow chart of a method of assembling the spectrometer of FIG. 1. It will be appreciated by those skilled in the art that variations of the spectrometer 100 of the above embodiments can be generalized to a method of assembling a spectrometer, and the design or adjustment can be changed according to the requirement, but not limited thereto. Referring to fig. 16 and fig. 1, the assembly process of fig. 16 will be described with reference to spectrometer 100 of fig. 1, and the assembly details are described in the foregoing embodiments and will not be repeated herein. First, step S110 is performed to provide the spectrometer 100, which includes a base 110, a light input device 120, a light splitting device 130, and an image sensor 140. In this embodiment, in step S110, the above or other optical elements may be assembled and positioned first. Then, step S120 is performed to provide the optical signal L into the optical input element 120, wherein the optical input element 120 separates the optical signal L into spectral components S, and the image sensor 140 receives the spectral components S to generate a spectral signal (not shown), which reflects the optical influence factor. Next, step S130 is performed, and the shielding element 150 is disposed between the light splitting element 130 and the image sensor 140 and located on the projection path of part of the spectral components S. Then, step S140 is performed to adjust the position of the shielding element 150 or replace the shielding element 150 with another shielding element (not shown) different from the shielding element 150 according to the spectrum signal, so as to suppress the portion of the spectrum signal with too high light intensity and prevent the shadow generated on the sensing surface 142 by the shielding element 150 from falling on the virtual center line a. In the present embodiment, the position of the shielding element 150 can be adjusted by the mounting assembly 160 shown in fig. 1, or can be adjusted directly by a person or a jig, which is not limited to this. It is worth mentioning that, because the spectrum appearance can produce individuation difference based on each batch of component difference, this embodiment reflects the actual optics influence factor of spectrum appearance through spectral signal, and the suitable part that shelters from the component and restrain the light intensity too high in spectral signal is adjusted or changed in the deuterogamy, and can reduce the influence of individuation difference of spectrum appearance.

Optionally, the step S150 is continued, and the shielding element 150 or another shielding element is fixed on the base 110. That is, after the position of the shielding element 150 is adjusted or different shielding elements are replaced to obtain the desired optical effect, the optical effect can be maintained by dispensing or locking the adhesive on the base 110. Of course, the shielding element 150 or another shielding element can be directly or indirectly fixed to the base 110 through the mounting assembly 160, and the like, which is not limited herein.

To sum up, the spectrometer that this application provided can shelter from partial spectral component through setting up the component that shelters from between beam splitting component and image sensor to restrain the too high part of light intensity in the spectral component. In addition, the application can overcome the adverse effect in various optical influence factors through different arrangement modes of the shielding element, and effectively achieve the required optical effect.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

While the present embodiments have been described with reference to the accompanying drawings, it is to be understood that the present invention is not limited to the above-described embodiments, which are intended to be illustrative rather than restrictive, and that various changes and modifications may be effected therein by one of ordinary skill in the pertinent art without departing from the scope of the present invention as defined by the appended claims.

Claims

1. A spectrometer, comprising:

a machine base;

the optical input element is arranged on the base and used for receiving optical signals;

the optical splitting element is arranged on the base, is used for incidence of the optical signal received by the optical input element and is used for separating the optical signal into a plurality of spectral components;

the image sensor is arranged on the base and provided with a sensing surface used for receiving the plurality of spectral components, wherein the sensing surface is provided with a virtual center line extending in the arrangement direction of the plurality of spectral components; and

a shielding element disposed between the light splitting element and the image sensor according to an optical influence factor and located on a projection path of a portion of the plurality of spectral components to shield the portion of the plurality of spectral components to suppress a portion of the plurality of spectral components where light intensity is too high,

wherein a shadow produced by the blocking element on the sensing face does not fall on the virtual center line.

2. The spectrometer of claim 1, wherein the sensing surface extends on the housing and has two ends, wherein the shadow generated on the sensing surface by the shielding element does not fall on the two ends.

3. The spectrometer of claim 1, wherein the shielding element is attached directly to the image sensor or is located relatively close to the housing or away from the housing.

4. The spectrometer of claim 1, further comprising a mounting assembly on which the shielding element is disposed, wherein the mounting assembly is disposed on the base such that the shielding element is mounted on the base by the mounting assembly.

5. The spectrometer of claim 4, wherein the mounting assembly has an adjustment structure for adjusting the setting angle or setting position of the shielding element relative to the base, or adjusting the setting position of the shielding element in a direction parallel to the sensing surface, or adjusting the shielding element to be relatively far away from or close to the base.

6. The spectrometer of claim 5, wherein the optical influencing factors comprise at least one of an initial spectrum of the optical signal, a spectral efficiency of the light splitting element for each wavelength of light, and a photosensitive efficiency of the image sensor for each wavelength of light.

7. The spectrometer of claim 1, wherein the shielding element is an opaque sheet, a dimmer sheet, or a filter sheet; or,

wherein the shape of the shielding element corresponding to the optical influence factor is rectangular, trapezoidal or gradually changed; or,

the shielding element comprises a plurality of different shielding sheets which can be alternatively arranged on a fixed position between the light splitting element and the image sensor according to the optical influence factors, wherein the plurality of shielding sheets are different in shape, size or inclination angle relative to the base.

8. The spectrometer of claim 1, further comprising a mounting assembly on which the shielding element is disposed, wherein the mounting assembly is disposed on the base such that the shielding element is mounted on the base by the mounting assembly;

the mounting assembly is provided with an adjusting structure, and the setting angle or the setting position of the shielding element relative to the base is adjusted, or the setting position of the shielding element is adjusted in the direction parallel to the sensing surface, or the shielding element is adjusted to be relatively far away from or close to the base;

wherein the sensing surface extends on the base and has two ends, wherein the shadow generated on the sensing surface by the shielding element does not fall on the two ends;

wherein the optical influencing factor comprises at least one of a source of the optical signal, a spectral efficiency of the light-splitting element for the plurality of spectral components of different wavelength bands, and a photosensitive efficiency of the image sensor for the plurality of spectral components of different wavelength bands; and

9. The spectrometer of claim 1, further comprising a focusing lens disposed on the base and between the spectroscopic element and the image sensor for focusing the plurality of spectral components separated by the spectroscopic element onto the image sensor, wherein the shielding element is directly attached to the focusing lens.

10. A spectrometer, comprising:

a machine base;

the reflecting mirror is arranged on the base and used for incidence and reflection of the optical signal received by the optical input element;

the plane grating is arranged on the base and used for incidence of the optical signal reflected by the reflecting mirror and separating the optical signal into a plurality of spectral components;

the focusing mirror is arranged on the base and used for focusing the plurality of spectral components separated by the plane grating;

the image sensor is arranged on the base and provided with a sensing surface used for receiving the plurality of spectral components focused by the focusing mirror, wherein the sensing surface extends on the base and is provided with a virtual central line extending in the arrangement direction of the plurality of spectral components and two end parts;

a shielding element disposed between the focusing mirror and the image sensor according to an optical influence factor, wherein the shielding element is a light-tight sheet and located on a projection path of a portion of the plurality of spectral components, and shields the portion of the plurality of spectral components to suppress a portion of the plurality of spectral components with too high light intensity, and a shadow generated by the shielding element on the sensing surface does not fall on the virtual center line and the two end portions; and

the installation component is arranged on the base, the shielding element is arranged on the installation component, so that the shielding element passes through the installation component and is arranged on the base, the installation component is provided with an adjusting structure, and the shielding element is adjusted to be opposite to the setting angle or the setting position of the base.