CN217083960U - spectrometer - Google Patents

Abstract

The embodiment of the application provides a spectrometer. The spectrometer comprises a base, a light input element, a light splitting element, an image sensor and a shielding element. The optical input element is arranged on the base and used for receiving optical signals. The optical splitting element is arranged on the base and used for inputting the optical signal received by the optical input element and separating the optical signal into a plurality of spectral components. The image sensor is arranged on the base and provided with a sensing surface for receiving the spectral components. The sensing surface has a virtual center line extending in the arrangement direction of these spectral components. The shielding element is arranged between the light splitting element and the image sensor according to the optical influence factor and is positioned on the projection path of part of the spectral components to shield part of the spectral components so as to inhibit the part with overhigh light intensity in the spectral components. The shadow produced by the blocking element on the sensing surface does not fall on the virtual center line.

Description

spectrometer

technical field

The present application relates to the technical field of optical measurement devices, and in particular, to a spectrometer.

Background technique

A spectrometer is a scientific instrument that applies optical principles to decompose light with complex components into spectral lines. The spectrometer can observe, analyze and process the structure and composition of substances, and has the advantages of high analysis accuracy, large measurement range, fast speed and less sample consumption. Therefore, the resolution of molecular properties, the measurement of concentration, the identification of substances, and the measurement of celestial spectra all require the assistance of spectrometers. In addition, spectrometers are widely used in metallurgy, geology, petrochemical, medical and health, environmental protection, resources and hydrological surveying and other fields.

However, since the spectrometer is affected by the initial spectrum of the input optical signal, the spectral efficiency of the grating for each wavelength of light, and the photosensitive efficiency of the image sensor for each wavelength of light, etc., there will be a situation where the energy in a specific wavelength range is too strong, which cannot be achieved. Expected measurement results.

Utility model content

The present application provides a spectrometer capable of suppressing a portion of a spectral component with an excessively high light intensity.

The present application provides a spectrometer, which includes a base, a light input element, a light splitting element, an image sensor and a shielding element. The optical input element is arranged on the base for receiving optical signals. The light splitting element is arranged on the base, and is used for incident light to input the optical signal received by the element, so as to separate the optical signal into a plurality of spectral components. The image sensor is disposed on the base and has a sensing surface for receiving the spectral components, wherein the sensing surface has a virtual centerline extending in the arrangement direction of the spectral components. The blocking element is arranged between the spectroscopic element and the image sensor according to the optical influence factor, and is located on the projection path of some of these spectral components, and blocks these spectral components of the part, so as to suppress the part with excessive light intensity in these spectral components, wherein the blocking element The shadow produced by the element on the sensing surface does not fall on the virtual centerline.

In an embodiment of the present application, the sensing surface extends on the base and has two ends, wherein the shadows generated by the shielding element on the sensing surface do not fall on the two ends.

In an embodiment of the present application, the shielding element is directly attached to the image sensor, or is located relatively close to the base or far away from the base.

In an embodiment of the present application, the spectrometer further includes a mounting assembly. The shielding element is arranged on the installation component, and the installation component is arranged on the machine base, so that the shielding element is installed on the machine base through the installation component.

In an embodiment of the present application, the mounting assembly has an adjustment structure for adjusting the setting angle or setting position of the shielding element relative to the base or the cover body, or adjusting the setting position of the shielding element in a direction parallel to the sensing surface, or adjusting the shielding element The setting position of the component between the cover and the base.

In an embodiment of the present application, the optical influencing factors include at least one of the initial spectrum of the optical signal, the spectral efficiency of the light splitting element for each wavelength of light, and the photosensitive efficiency of the image sensor for each wavelength of light.

In an embodiment of the present application, the shielding element is an opaque sheet, a dimming sheet or a filter.

In an embodiment of the present application, the shape of the shielding element is changed according to the optical influence factor.

In an embodiment of the present application, the shielding element includes a plurality of different shielding sheets, which can be alternatively arranged at fixed positions between the spectroscopic element and the image sensor according to optical influencing factors, wherein the shielding sheets are different in shape, size or It is different from the inclination angle relative to the base.

In an embodiment of the present application, the spectrometer further includes an installation component, and the shielding component is disposed on the installation component, wherein the installation component is disposed on the base, so that the shielding component is installed on the base through the installation component. The installation assembly has an adjustment structure, which adjusts the setting angle or setting position of the shielding element relative to the base or the cover, or adjusts the setting position of the shielding element in the direction parallel to the sensing surface, or adjusts the position of the shielding element between the cover and the base. Set the location. The sensing surface extends on the base and has two ends, wherein the shadow generated by the shielding element on the sensing surface does not fall on the two ends. The optical influencing factors include at least one of the source of the optical signal, the spectral efficiency of the spectroscopic element for these spectral components in different wavelength bands, and the photosensitive efficiency of the image sensor for these spectral components in different wavelength bands. The shielding element includes a plurality of different shielding sheets, which can be alternatively arranged at a fixed position between the spectroscopic element and the image sensor according to the optical influencing factors, wherein these shielding sheets are different in shape, size or inclination angle relative to the base. different.

The present application further provides a spectrometer, which includes a base, a light input element, a reflector, a plane grating, a focusing mirror, an image sensor, a shielding element, and a mounting assembly. The optical input element is arranged on the base for receiving optical signals. The reflector is arranged on the base, and is used to reflect the optical signal received by the incident light input element. The plane grating is arranged on the base and is used for the incident optical signal reflected by the mirror to separate the optical signal into a plurality of spectral components. The focusing mirror is arranged on the base to focus the spectral components separated by the plane grating. The image sensor is arranged on the base and has a sensing surface for receiving the spectral components focused by the focusing mirror, wherein the sensing surface extends on the base and has a virtual centerline extending in the arrangement direction of the spectral components and both ends. The shielding element is arranged between the focusing mirror and the image sensor according to the optical influence factor. The shielding element is an opaque sheet and is located on the projection path of some of the spectral components, and shields the spectral components of the partial to suppress the portion of the spectral components with excessive light intensity. The shadow generated by the shielding element on the sensing surface does not fall on the virtual center line and both ends. The installation component is arranged on the machine base, and the shielding element is arranged on the installation component, so that the shielding component is installed on the machine base through the installation component. The installation assembly has an adjustment structure for adjusting the setting angle or setting position of the shielding element relative to the base.

To sum up the above, the spectrometer provided by the present application can block part of the spectral components by means of the shielding element disposed between the spectroscopic element and the image sensor, so as to suppress the part of the spectral components with excessive light intensity.

Description of drawings

The drawings described herein are used to provide further understanding of the present application and constitute a part of the present application. The schematic embodiments and descriptions of the present application are used to explain the present application and do not constitute an improper limitation of the present application. In the attached image:

1 is a perspective view of a spectrometer according to an embodiment of the present application;

FIG. 2 is a top view of the spectrometer of FIG. 1;

(A) in FIG. 3 is a schematic diagram showing the relative relationship between the shielding element of the spectrometer of FIG. 1 and the image sensor;

(B) in FIG. 3 is a side view showing the change of cone angle before and after the blocking element is installed in the spectrometer of FIG. 1;

Fig. 4 is a spectrogram of the spectrometer of Fig. 1;

(A) in FIG. 5 is a top view showing that the spectrometer of FIG. 1 is not provided with a blocking element;

(B) in FIG. 5 is a spectrogram representing the spectrometer of (A) in FIG. 5 ;

(A) in FIG. 6 is a top view showing that the spectrometer of FIG. 1 arranges the shielding element close to the optical sensor;

(B) in FIG. 6 is a spectrogram showing the spectrometer of (A) in FIG. 6 ;

(A) in FIG. 7 is a top view showing that the spectrometer of FIG. 1 disposes the shielding element away from the optical sensor;

(B) in FIG. 7 is a spectrogram representing the spectrometer of (A) in FIG. 7 ;

(A) in FIG. 8 is a side view showing that the spectrometer of FIG. 1 is not provided with a blocking element;

(B) in FIG. 8 is a spectrogram representing the spectrometer of (A) in FIG. 8 ;

(A) in FIG. 9 is a side view showing that the spectrometer of FIG. 1 sets the shielding element to the first height;

(B) in FIG. 9 is a spectrogram showing the spectrometer of (A) in FIG. 9 ;

(A) in FIG. 10 is a side view showing that the spectrometer of FIG. 1 sets the blocking element to the second height;

(B) in FIG. 10 is a spectrogram showing the spectrometer of (A) in FIG. 10 ;

11 is a schematic diagram showing that the spectrometer of FIG. 1 replaces the shielding element with another shape;

FIG. 12 is a schematic diagram showing that the spectrometer of FIG. 1 disposes the shielding element outside the image sensor;

13 is a schematic diagram showing that the spectrometer of FIG. 1 rotates the shielding element by a first angle;

14 is a schematic diagram showing that the spectrometer of FIG. 1 sets the shielding element into a plurality of shielding pieces, and wherein the first shielding piece is rotated by a second angle;

FIG. 15 is a schematic diagram showing that the spectrometer of FIG. 1 rotates the shielding element by a third angle; and

FIG. 16 is a flowchart illustrating an assembly method of the spectrometer of FIG. 1 .

Detailed ways

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the protection scope of the present application.

FIG. 1 is a perspective view of a spectrometer according to an embodiment of the present application, and FIG. 2 is a top view of the spectrometer of FIG. 1 . Please refer to FIG. 1 and FIG. 2 , the spectrometer 100 includes a base 110 , a light input element 120 , a light splitting element 130 , an image sensor 140 and a shielding element 150 . The light input element 120 is disposed on the base 110 for receiving the optical signal L. The light splitting element 130 is disposed on the base 110 and is used for the incident light inputting the optical signal L received by the element 120 to separate the optical signal L into a plurality of spectral components S. In this embodiment, the spectrometer 100 may further include a reflecting mirror M1 , which is disposed on the base 110 and is used to reflect the optical signal L received by the light input element 120 to the light splitting element 130 . The light-splitting element 130 is, for example, a plane grating, which is used to enter the optical signal L reflected by the mirror M1 and is used to separate the optical signal L into a plurality of spectral components S. In another embodiment not shown, the light splitting element 130 can also be a concave grating, but not limited to this. The image sensor 140 is disposed on the base 110 and has a sensing surface 142 for receiving the spectral components S. In this embodiment, the spectrometer 100 may further include a focusing mirror M2 disposed on the base 110 for focusing the spectral components S separated by the spectroscopic element 130 . The image sensor 140 can receive the spectral components S focused by the focusing mirror M2. The shielding element 150 is arranged between the spectroscopic element 130 and the image sensor 140 according to the optical influence factor, and is located on the projection path of some of these spectral components S, and shields some of these spectral components S, so as to suppress excessive light intensity in these spectral components S. high part. In this embodiment, the optical influencing factors include the initial spectrum of the optical signal L, the spectral efficiency of the light splitting element 130 for each wavelength of light, the reflectivity of the mirror M1 and the focusing mirror M2, and the photosensitive efficiency of the image sensor 140 for each wavelength of light at least one of them. For example, the spectral component S of which the light intensity is too high refers to the spectral component S of which the light intensity is greater than a certain threshold, and the threshold may be determined according to optical influencing factors.

In detail, the shielding element 150 is located between the focusing mirror M2 and the image sensor 140 , and can be an opaque film, a light-reducing film or a filter to shield the partial spectral component S focused by the focusing mirror M2 . In addition, the spectrometer 100 may further include a mounting assembly 160 . The shielding element 150 is disposed on the mounting assembly 160 , and the mounting assembly 160 is disposed on the base 110 , so that the shielding element 150 is mounted on the base 110 through the mounting assembly 160 . The mounting assembly 160 may also have an adjustment structure 162 for adjusting the setting angle or setting position of the shielding element 150 relative to the base 110 , or adjusting the setting position of the shielding element 150 in a direction parallel to the sensing surface 142 , or adjusting the shielding element 150 away from or away from the base 110 . Proximity to base 110. In this embodiment, the adjusting structure 162 is formed by at least one locking member 162A and at least one guiding groove 162B, so as to guide the blocking member 150 to move and locate in the X direction or the Z direction through the cooperation between the locking member 162A and the guiding groove 162B. fixed. In another not-shown embodiment, the shielding element 150 can be directly attached to the image sensor 140 , or can be moved along the Y direction to be located relatively close to the base 110 or away from the base 110 .

(A) in FIG. 3 is a schematic diagram showing the relative relationship between the shielding element and the image sensor of the spectrometer of FIG. 1 . Please refer to (A) in FIG. 3 , the sensing surface 142 has a virtual centerline A extending in the arrangement direction of the spectral components S, wherein the shadow generated by the shielding element 150 on the sensing surface 142 does not fall on the virtual centerline A on. Although the virtual center line A in FIG. 3(A) is shown as a straight line, the virtual center line A is a virtual line connecting the centers of the spectral components S of each wavelength, so it can actually be a curved line according to the light type. It is worth mentioning that, since the shadow generated by the shielding element 150 on the sensing surface 142 does not fall on the virtual centerline A with high light intensity, the numerical aperture can be reduced and the resolution of the shielded band can be improved. . In addition, the sensing surface 142 extends on the base 110 and has two end portions 142a. The shadow generated by the shielding element 150 on the sensing surface 142 may not fall on the two end portions 142a. Since the spectral components received on the two ends 142a are generally weak in intensity. Therefore, the shadow generated by the shielding element 150 on the sensing surface 142 does not fall on the feature of the two ends 142a, and the reduction of the resolution can also be avoided.

(B) of FIG. 3 is a side view showing the change of cone angles before and after the shielding element is installed in the spectrometer of FIG. 1 . Please refer to (B) in FIG. 3 , the cone angle θ ₁ of the optical path after the shielding element 150 is installed in the spectrometer 100 is smaller than the cone angle θ ₀ of the optical path before the shielding element 150 is installed, so the optical resolution corresponding to the cone angle θ ₁ will be greater than the corresponding cone angle θ 1 Optical resolution for cone angle θ ₀ . That is to say, in this embodiment (ie, the case where the shielding element 150 is not directly attached to the image sensor 140 ), since the focusing numerical aperture is reduced due to the shielding element 150 , the numerical aperture can be reduced and the imaging aberration can be reduced. Small, the effect of improving the optical resolution of the blocked band.

FIG. 4 is a spectrogram of the spectrometer of FIG. 1 . Please refer to FIG. 4 , the spectrogram includes two spectral curves C0 and C1 , wherein the spectral curve C0 represents the experimental data of the spectrometer 100 without the shielding element 150 , and the spectral curve C1 presents the spectrometer 100 after the shielding element 150 is set. Experimental data. It can be seen from the figure that in the wavelength range Δλ _A (the wavelength range of about 220-280 nm), the part of the spectral curve C1 with excessive light intensity is obviously suppressed relative to the spectral curve C0, and will not exceed the maximum value of the image sensor 140. photosensitive ability. Therefore, the light intensity of other wavelengths can be further increased by means of integration time, thereby improving the balance of the overall light intensity. In addition, outside the range of the wavelength interval Δλ _A , the optical resolutions of the spectral curves C0 and C1 are, for example, both 0.5 nm. However, within the wavelength range Δλ _A , the optical resolution of the spectral curve C0 is, for example, 0.5 nm, and the optical resolution of the spectral curve C1 is, for example, 0.3 nm. That is to say, within the range of the wavelength interval Δλ _A , the optical resolution corresponding to the spectral curve C1 is higher than that of the spectral curve C0.

(A) in FIG. 5 is a top view showing that the spectrometer in FIG. 1 is not provided with a shielding element, and (B) in FIG. 5 is a spectrogram showing the spectrometer in (A) in FIG. 5 . Please refer to (A) in FIG. 5 and (B) in FIG. 5 , for the convenience of description, (A) in FIG. The spectral component S, and the spectral curve C2 in FIG. 5(B) is represented by a straight line (the vertical axis I is the light intensity, and the horizontal axis λ is the wavelength). (A) in FIG. 6 is a top view showing the spectrometer in FIG. 1 with the shielding element disposed close to the optical sensor, and (B) in FIG. 6 is a spectrum diagram showing the spectrometer in (A) in FIG. 6 . Please refer to (A) in FIG. 5 and (A) in FIG. 6 , in (A) in FIG. 6 , a blocking element 150A close to the optical sensor 140 is disposed. Referring again to (B) in FIG. 5 and (B) in FIG. 6 , the result is that, compared with the spectral curve C2, the wavelength interval Δλ ₀ in the spectral curve C3 is suppressed from the light intensity I ₀ to the light intensity I ₁ .

FIG. 7(A) is a top view showing the spectrometer of FIG. 1 with the shielding element disposed away from the optical sensor, and FIG. 7(B) is a spectrogram showing the spectrometer of FIG. 7(A). Please refer to (A) in FIG. 6 and (A) in FIG. 7 , compared with the shielding element 150A in (A) in FIG. 6 , in (A) in FIG. , which is relatively close to the blocking element 150B of the focusing mirror M2). Please compare and refer to (B) in FIG. 6 and (B) in FIG. 7 , the result is that, compared with the spectral curve C3, the wavelength interval Δλ ₁ in the spectral curve C4 is smaller than the wavelength interval Δλ ₀ in the spectral curve C4 . That is, the shielding element 150A and the shielding element 150B similarly suppress the light intensity I ₀ to the light intensity I ₁ , but the shielded wavelength ranges are different. On the premise that the size and shape of the shielding elements 150A and 150B remain unchanged, the more the shielding elements move toward the focusing mirror M2, the wider the shielded wavelength range (ie, the slower the oblique angle of the spectral shielding), and the higher the shielded light intensity percentage. On the other hand, on the premise that the size and shape of the shielding elements 150A and 150B remain unchanged, the further the shielding elements 150A and 150B move toward the image sensor 140, the narrower and more accurate the shielded wavelength range (that is, the more vertical the oblique angle of the spectral shielding is), and the lower the percentage of shielded light intensity. .

(A) in FIG. 8 is a side view showing that the spectrometer in FIG. 1 is not provided with a shielding element, and (B) in FIG. 8 is a spectrogram showing the spectrometer in (A) in FIG. 8 . For the convenience of description, (A) in FIG. 8 only schematically depicts the focusing mirror M2, the image sensor 140 and the spectral component S focused on the sensing surface 142, and the spectral curve C5 in (B) in FIG. A straight line is shown (the vertical axis I represents the light intensity, and the horizontal axis λ represents the wavelength). (A) in FIG. 9 is a side view showing that the spectrometer of FIG. 1 sets the shielding element to the first height. (B) in FIG. 9 is a spectrogram representing the spectrometer of (A) in FIG. 9 . Please refer to (A) in FIG. 8 and (A) in FIG. 9 , in FIG. 9 (A), the shielding element 150C of the first height (ie, the dimension in the Y direction) is set, and the first height About the same height as the center of the spectral component S. Please refer to (B) in FIG. 8 and (B) in FIG. 9 , the result is that, compared with the spectral curve C5, the wavelength range in the spectral curve C6 is suppressed from the light intensity I ₀ to the light intensity (ie , approximately 50% of the light intensity is suppressed).

(A) in FIG. 10 is a side view showing the spectrometer in FIG. 1 with the blocking element set to the second height, and (B) in FIG. 10 is a spectrogram showing the spectrometer in (A) in FIG. 10 . . Please refer to (A) in FIG. 9 and (A) in FIG. 10 , compared with the shielding element 150C in (A) in FIG. 9 , (A) in FIG. 10 is provided with a second height (ie, Y direction dimension) of the shielding element 150D, wherein the second height of the shielding element 150D is smaller than the first height of the shielding element 150C. Please refer to (B) in FIG. 9 and (B) in FIG. 10 , the result is that in the spectral curve C7 in the wavelength range Δλ ₁ is suppressed as the light intensity I', and the light intensity I' is higher than the spectral curve The light intensity I _50% of C6. That is to say, the shielding element 150C and the shielding element 150D also suppress the light intensity _of the same wavelength range Δλ1, but the percentage of the suppressed light intensity is different. Under the premise that the size, shape and position of the shielding elements 150C and 150D remain unchanged, the first height of the shielding element 150C is higher, and the percentage of light intensity that is shielded is also higher; The strong percentage is also lower. Please refer to (A) in FIG. 9 and (A) in FIG. 10 again, since the spectral component S is focused by the focusing mirror M2, the spectral component S is narrower (ie, the size in the Y direction) as it is closer to the image sensor 140, so As the shielding elements 150C and 150D move toward the image sensor 140 , it is more difficult to adjust the light intensity percentage (eg, 20%) to be suppressed by changing the height.

FIG. 11 is a schematic diagram showing that the spectrometer of FIG. 1 replaces the shielding element with another shape. Please refer to FIG. 3(A) and FIG. 11 . Compared with FIG. 3(A) , the shielding element 150 has a regular shape, such as a rectangle, and the shielding element 150E of FIG. 11 is a trapezoid. In addition, the shielding element 150E can also be directly attached to the image sensor 140 , or disposed away from or close to the image sensor 140 . In another non-illustrated embodiment, the shielding element 150E can also choose a gradient or other irregular shape according to the optical influence factor.

FIG. 12 is a schematic diagram showing that the spectrometer of FIG. 1 disposes the shielding element outside the image sensor. Referring to FIG. 12 , the shielding element 150F can be disposed on the base 110 , and extends upward from the outside of the base 110 and the image sensor 140 , and then extends toward the image sensor 140 until it corresponds to the position of the wavelength segment to be shielded, and then extends toward the image sensor 140 . Extend down. Those skilled in the art can also understand that the extension angle does not necessarily have to be completely vertical or horizontal, and the extension angle can also be determined according to optical influencing factors.

FIG. 13 is a schematic diagram showing that the spectrometer of FIG. 1 rotates the shielding element by a first angle. Please refer to FIG. 3 (A) and FIG. 14 , the shielding element 150G is the same as the shielding element 150 in FIG. 3 (A) , but the shielding element 150G is rotated on the X-Y plane relative to the shielding element 150 by the first angle, where the first angle is not a multiple of 90 degrees. FIG. 14 is a schematic diagram showing that the spectrometer of FIG. 1 sets the shielding element into a plurality of shielding pieces, and wherein the first shielding piece is rotated by a second angle. Referring to FIG. 14 , the shielding element 150H may include a first shielding piece 150H1 and a second shielding piece 150H2 . In this embodiment, the first blocking piece 150H1 is rotated by a second angle on the X-Z plane. The closer the shielding element 150H is to the image sensor 140, the more accurate the wavelength range of the shielded partial spectral component S is, and the closer to the focusing mirror M2, the easier it is to adjust the light intensity percentage to be suppressed. Therefore, by arranging the first shielding piece 150H1 and the second shielding piece 150H2 at different positions between the focusing mirror M2 and the image sensor 140 , coarse adjustment and fine adjustment can be performed according to optical image factors and requirements, and the obtained desired effect. In addition, in another not-shown embodiment, the shielding element 150H may include a plurality of different shielding sheets, and may be alternatively disposed at a fixed position between the light splitting element 130 and the image sensor 140 according to optical influencing factors. These different shielding sheets are different in shape, size or inclination angle relative to the base, for example. After replacing the different shielding sheets to obtain the desired optical effect, it can also be fixed on the base 110 by dispensing or locking, so as to ensure that the same optical effect can be maintained in subsequent use.

FIG. 15 is a schematic diagram showing that the spectrometer of FIG. 1 rotates the shielding element by a third angle. 10(A) and FIG. 15, the height dimension of the shielding element 150I is similar to that of the shielding element 150D in (A) of FIG. 10, but the shielding element 150I is inclined relative to the base 110 (ie, relative to Y-Z plane rotation by a third angle). Although FIGS. 13 to 15 respectively illustrate the case where the shielding element is rotated relative to different single planes, in another embodiment not shown, the shielding element can also be arranged on more than two planes according to optical influencing factors and requirements. It is not limited to tilt or rotate at different angles.

FIG. 16 is a flowchart illustrating an assembly method of the spectrometer of FIG. 1 . Those skilled in the art can understand that the variations of the spectrometer 100 in the foregoing embodiments can be summarized into a method of assembling the spectrometer, and the design or adjustment can be changed according to the requirements, which are not limited thereto. Please refer to FIG. 16 and FIG. 1 . The assembly process of FIG. 16 will be described below in conjunction with the spectrometer 100 of FIG. 1 . The assembly details have been described in the foregoing embodiments and will not be repeated here. First, step S110 is performed to provide a spectrometer 100 , including a stand 110 , a light input element 120 , a spectroscopic element 130 and an image sensor 140 . In this embodiment, in step S110, the above-mentioned or other optical components may be assembled and positioned first. Next, step S120 is performed to provide the optical signal L into the light input element 120, wherein the light input element 120 separates the optical signal L into spectral components S, and the image sensor 140 receives these spectral components S to generate a spectral signal (not shown), and the spectral signal Reflects the optical influence factors. Next, step S130 is performed, and the shielding element 150 is arranged between the light splitting element 130 and the image sensor 140 and is located on the projection path of some of the spectral components S. Then, step S140 is performed to adjust the position of the shielding element 150 or replace the shielding element 150 with another shielding element (not shown) different from the shielding element 150 according to the spectral signal, so as to suppress the part of the spectral signal with excessive light intensity , and the shadow generated by the shielding element 150 on the sensing surface 142 does not fall on the virtual center line A. In this embodiment, the position of the shielding element 150 can be adjusted through the installation component 160 in FIG. 1 , or directly adjusted manually or by a jig, which is not limited thereto. It is worth mentioning that since the spectrometer will produce individual differences based on the difference of each batch of components, this embodiment reflects the actual optical influencing factors of the spectrometer through the spectral signal, and then adjusts or replaces the appropriate blocking element to suppress the light in the spectral signal. The intensity of the part is too high, and the influence of individual differences of the spectrometer can be reduced.

Optionally, proceed to step S150 to fix the shielding element 150 or another shielding element on the base 110 . That is to say, after adjusting the position of the shielding element 150 or replacing the different shielding elements to obtain the desired optical effect, it can also be fixed on the base 110 by dispensing or locking to ensure that it can be maintained during subsequent use. Consistent optics. Of course, the shielding element 150 or another shielding element can be directly or indirectly fixed to the base 110 through components such as the mounting assembly 160 , which is not limited herein.

To sum up, the spectrometer provided by the present application can block part of the spectral components through the shielding element disposed between the spectroscopic element and the image sensor, so as to suppress the part of the spectral components with excessive light intensity. In addition, the present application can overcome the adverse effects of various optical influencing factors and effectively achieve the required optical effects through different arrangement of the shielding elements.

It should be noted that, herein, the terms "comprising", "comprising" or any other variation thereof are intended to encompass a non-exclusive inclusion, such that a process, method, article or device comprising a series of elements includes not only those elements, It also includes other elements not expressly listed or inherent to such a process, method, article or apparatus. Without further limitation, an element qualified by the phrase "comprising a..." does not preclude the presence of additional identical elements in a process, method, article or apparatus that includes the element.

The embodiments of the present application have been described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific embodiments, which are merely illustrative rather than restrictive. Under the inspiration of this application, without departing from the scope of protection of the purpose of this application and the claims, many forms can be made, which all belong to the protection content of this application.

Claims (10)

1. a spectrometer, is characterized in that, comprises: Machine base; an optical input element, arranged on the base, for receiving optical signals; a light splitting element, arranged on the base, for incident on the optical signal received by the light input element, and used for separating the optical signal into a plurality of spectral components; an image sensor, disposed on the base, and having a sensing surface for receiving the plurality of spectral components, wherein the sensing surface has a virtual centerline extending in the arrangement direction of the plurality of spectral components; as well as A shielding element is arranged between the spectroscopic element and the image sensor according to the optical influence factor, and is located on the projection path of the plurality of spectral components of a part, and shields the plurality of spectral components of the part to suppress a portion of the plurality of spectral components having an excessively high light intensity, The shadow generated by the shielding element on the sensing surface does not fall on the virtual center line. 2. The spectrometer according to claim 1, wherein the sensing surface extends on the base and has two ends, wherein the shielding element generates the Shadows do not fall on the two ends. 3 . The spectrometer according to claim 1 , wherein the shielding element is directly attached to the image sensor, or is located relatively close to the base or far away from the base. 4 . 4 . The spectrometer according to claim 1 , further comprising an installation component, the shielding component is arranged on the installation component, wherein the installation component is arranged on the base, so that the shielding component passes through the The mounting assembly is mounted on the base. 5 . The spectrometer according to claim 4 , wherein the mounting assembly has an adjustment structure, which adjusts the setting angle or setting position of the shielding element relative to the base, or is parallel to the sensing surface. 6 . Adjust the setting position of the shielding element in the direction, or adjust the shielding element to be relatively far away from or close to the machine base. 6 . The spectrometer according to claim 5 , wherein the optical influencing factors include the initial spectrum of the optical signal, the spectral efficiency of the spectroscopic element for each wavelength of light, and the image sensor for each wavelength of light. 7 . at least one of the photosensitive efficiencies. 7. The spectrometer according to claim 1, wherein the shielding element is an opaque sheet, a light reduction sheet or a filter sheet; or, The shape of the shielding element corresponding to the optical influence factor is a rectangle, a trapezoid or a gradient shape; or, The shielding element includes a plurality of different shielding sheets, which can be alternatively arranged at a fixed position between the spectroscopic element and the image sensor according to the optical influence factor, wherein the plurality of shielding sheets are in shape , size or inclination angle relative to the base. 8 . The spectrometer according to claim 1 , further comprising a mounting assembly, the shielding element is disposed on the mounting assembly, wherein the mounting assembly is disposed on the base, so that the shielding element passes through the mounting assembly. 9 . the mounting assembly is mounted on the base; The mounting assembly has an adjustment structure, which adjusts the setting angle or setting position of the shielding element relative to the base, or adjusts the setting position of the shielding element in a direction parallel to the sensing surface, or adjusts the setting position of the shielding element. The shielding element is relatively far away from or close to the base; wherein the sensing surface extends on the base and has two ends, wherein the shadow generated by the shielding element on the sensing surface does not fall on the two ends; The optical influencing factors include the source of the optical signal, the spectral efficiency of the spectroscopic element for the multiple spectral components in different wavelength bands, and the photosensitive efficiency of the image sensor for the multiple spectral components in different wavelength bands. at least one of them; and The shielding element includes a plurality of different shielding sheets, which can be alternatively arranged at a fixed position between the spectroscopic element and the image sensor according to the optical influence factor, wherein the plurality of shielding sheets are in shape , size or inclination angle relative to the base. 9 . The spectrometer according to claim 1 , further comprising a focusing mirror, which is arranged on the base and is located between the spectroscopic element and the image sensor, and is used for focusing the separation of the spectroscopic element. 10 . the plurality of spectral components to the image sensor, wherein the shielding element is directly attached to the focusing mirror. 10. A spectrometer, comprising: Machine base; an optical input element, arranged on the base, for receiving optical signals; a reflector, arranged on the base, for incident and reflection of the optical signal received by the light input element; a plane grating, arranged on the base, for incident on the optical signal reflected by the reflector, for separating the optical signal into a plurality of spectral components; a focusing mirror, arranged on the base, for focusing the plurality of spectral components separated by the plane grating; an image sensor, disposed on the base, and having a sensing surface for receiving the plurality of spectral components focused by the focusing mirror, wherein the sensing surface extends on the base and has a sensing surface on the base a virtual center line and both ends extending in the arrangement direction of the plurality of spectral components; A shielding element is arranged between the focusing mirror and the image sensor according to an optical influence factor, wherein the shielding element is an opaque sheet and is located on the projection path of a part of the plurality of spectral components, and all the shielding part is the plurality of spectral components to suppress the part of the plurality of spectral components whose light intensity is too high, wherein the shadow generated by the shielding element on the sensing surface does not fall on the virtual center line and the two ends Department; and an installation assembly, the installation assembly is arranged on the base, and the shielding element is arranged on the installation assembly, so that the shielding element is installed on the base through the installation assembly, wherein the installation assembly An adjustment structure is provided to adjust the setting angle or setting position of the shielding element relative to the base.

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