CN112525344B - Method for assembling and adjusting dispersion type imaging spectrometer - Google Patents
Method for assembling and adjusting dispersion type imaging spectrometer Download PDFInfo
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- 238000003384 imaging method Methods 0.000 title claims abstract description 70
- 238000000034 method Methods 0.000 title claims abstract description 41
- 239000006185 dispersion Substances 0.000 title claims abstract description 13
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 claims abstract description 8
- 229910052753 mercury Inorganic materials 0.000 claims abstract description 8
- 230000005540 biological transmission Effects 0.000 claims abstract description 4
- 238000009966 trimming Methods 0.000 claims description 46
- 238000009434 installation Methods 0.000 claims description 4
- 238000010923 batch production Methods 0.000 abstract description 3
- 230000002349 favourable effect Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 16
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 238000000701 chemical imaging Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/04—Slit arrangements slit adjustment
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- G—PHYSICS
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- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/62—Optical apparatus specially adapted for adjusting optical elements during the assembly of optical systems
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Abstract
The invention discloses an assembling and adjusting device of a dispersion type imaging spectrometer, which comprises a light source, an integrating sphere, an internal focusing collimator and a reading microscope, wherein the light source adopts a monochromatic light source, a mercury lamp or a polychromatic light source; the internal focusing collimator adopts a transmission type, total reflection type or refraction and reflection type structure and consists of a target, a collimating objective and an internal focusing mechanism. The device does not need to design and process redundant auxiliary assembly and debugging components, is fixed by assembling and debugging the components of the instrument in the assembling and debugging process, has low cost, less assembling and debugging steps, high speed and high precision, and is favorable for assembling and debugging the imaging spectrometer in batch production.
Description
Technical Field
The invention relates to the technical field of imaging spectrometers, in particular to an assembling and adjusting method of a dispersion type imaging spectrometer.
Background
The imaging spectrometer can acquire two-dimensional geometric information and spectral information of a detected target, is widely applied to the fields of remote sensing and scientific research, generally comprises a telescopic objective and a spectrometer, and a light splitting element comprises a grating, a prism or a prism and grating assembly. The assembling and adjusting method of the imaging spectrometer is different according to instrument design and assembling and adjusting personnel, some slits are installed on a front telescopic system, some slits are installed on an object surface of the spectrometer, the common assembling and adjusting method comprises the steps of installing the slits on an image surface of the front telescopic system through a collimator, then installing an auxiliary assembling and adjusting component on the object surface of the spectrometer, installing a detector on the image surface of the spectrometer, illuminating the auxiliary assembling and adjusting component through a mercury lamp, adjusting the relative position of the detector and the spectrometer, finally illuminating a polychromatic point light source through the collimator, and installing the front telescopic system on the spectrometer to complete assembling and adjusting of the whole spectrometer.
The main problems of the prior art are as follows: different auxiliary assembly and debugging components need to be designed and processed in the assembly and debugging process of the dispersion type imaging spectrometer with different parameters, the auxiliary assembly and debugging components are low in universality and high in cost, the components of the auxiliary assembly and debugging components and the components of the instrument are still different, when the components of the instrument are reinstalled after the auxiliary assembly and debugging components are removed, the reinstallation possibly influences the precision of the instrument, and the whole assembly and debugging precision is to be improved.
Disclosure of Invention
The invention aims to provide a method for assembling and debugging a dispersion type imaging spectrometer, which does not need to design and process redundant auxiliary assembling and debugging components, is assembled, debugged and fixed by using the components of an instrument in the assembling and debugging process, has low cost, less assembling and debugging steps, high speed and high precision, and is favorable for assembling and debugging the imaging spectrometer in batch production.
The purpose of the invention is realized by the following technical scheme:
an assembly and adjustment method of a dispersion type imaging spectrometer is provided, which utilizes an assembly and adjustment device of the imaging spectrometer to carry out complete machine assembly and adjustment on the dispersion type imaging spectrometer, the device comprises a light source, an integrating sphere, an internal focusing collimator and a reading microscope, wherein:
the light source adopts a monochromatic light source, a mercury lamp or a polychromatic light source;
the internal focusing collimator adopts a transmission type, total reflection type or catadioptric type structure and consists of a target, a collimating objective and an internal focusing mechanism;
aiming at an imaging spectrometer with a slit arranged on a front telescope system, the adjusting method specifically comprises the following steps:
firstly, fine adjustment is carried out on a slit, a fringe plate is selected as a target of the inner focusing collimator, the target is adjusted to be located at the focal plane of the inner focusing collimator, a polychromatic light source is turned on, and after polychromatic light passes through the integrating sphere, light beams enter the inner focusing collimator to illuminate the target; then outputting parallel light after passing through the collimating objective lens; the parallel light is converged by a front telescope of an imaging spectrometer to be adjusted and then imaged on a focal plane of a front telescope system; reading the distance between the image of the target of the fringe plate and the image of the slit by using the reading microscope, trimming the slit and a trimming pad of the front telescopic system according to the distance until the edges of the image of the target and the image of the slit on the reading microscope are sharp and clearly visible at the same time, and fixing the slit to realize fine adjustment of the slit;
then the pre-telescopic system after slit fine adjustment is installed on an imaging spectrometer, the light source is replaced by a monochromatic light source or a mercury lamp, the target in the inner focusing collimator is replaced by a star point plate, after star points are imaged by the pre-telescopic system, the diameter of a star point image is smaller than the width of the slit, and the star point image is imaged on a detector through the spectrometer; adjusting the position of the target, observing the size of a light spot of a star point image on the detector, and recording the defocusing distance of the inner focusing collimator when the light spot is brightest and minimum; calculating the trimming amount of a trimming pad of the detector according to the relation between the focal length of the internal focusing collimator and the focal length of the imaging spectrometer, trimming the trimming pad, and stopping trimming the trimming pad until the star point plate is positioned at the focal plane of the internal focusing collimator; then, the light source is changed into a polychromatic light source, the relative angle between the detector and the spectrometer is adjusted, so that the polychromatic image of the point view field of the light source is sharp and aligned with the detector array, and the detector is fixed at the moment to realize the adjustment of the detector of the imaging spectrometer;
changing the light source to be monochromatic light, adjusting the relative angle between the front telescope system and a spectrometer in the imaging spectrometer to ensure that the slit monochromatic image is sharp and aligned with the detector row, fixing the front telescope system at the moment and realizing the fine adjustment of the front telescope system;
after the fine adjustment of the slit, the adjustment of the detector of the imaging spectrometer and the fine adjustment of the front telescope system by the method, the whole machine adjustment of the imaging spectrometer is realized.
According to the technical scheme provided by the invention, the device does not need to design and process redundant auxiliary assembly and debugging components, and is assembled, debugged and fixed by using the components of the instrument in the assembling and debugging process, so that the device is low in cost, less in assembly and debugging steps, high in speed and high in precision, and is beneficial to the assembly and debugging of mass production imaging spectrometers.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of an adjusting apparatus of a dispersive imaging spectrometer according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a fine adjustment process of a slit when the slit is mounted on a front mirror according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of an adjustment process of a detector of an imaging spectrometer when a slit is mounted on a front mirror according to an embodiment of the present invention;
FIG. 4 is a schematic diagram illustrating a fine adjustment process of the front telescope system when the slit is mounted on the front mirror according to the embodiment of the present invention;
FIG. 5 is a schematic diagram of a detector adjustment process when the slit is mounted on a spectrometer according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a fine adjustment process of a slit when the slit is mounted on a spectrometer according to an embodiment of the present invention;
FIG. 7 is a schematic diagram of a fine adjustment process of a front telescope when the slit is mounted on a spectrometer according to an embodiment of the present invention;
FIG. 8 is a schematic diagram of an optical path of an exemplary setup process according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention are clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present invention without making any creative effort, shall fall within the protection scope of the present invention.
The following will describe the embodiments of the present invention in further detail with reference to the accompanying drawings, and as shown in fig. 1, is a schematic structural diagram of an adjusting device of a dispersive imaging spectrometer provided in the embodiments of the present invention, the device 1 mainly includes a light source 2, an integrating sphere 3, and an internally focusing collimator 4, wherein:
the light source 2 adopts a monochromatic light source, a mercury lamp or a polychromatic light source;
the internal focusing collimator 4 adopts a transmission type, total reflection type or refraction and reflection type structure and consists of a target 5, a collimating objective 7 and an internal focusing mechanism 6, wherein:
the target 5 comprises a star point plate and a stripe plate, the star point plate and the stripe plate can be manufactured in series at one time, and the size of a star point hole and the line width of the stripe plate are selected according to the focal length of the internal focusing collimator 4, the focal length of a front lens and the size of a detector pixel;
as shown in fig. 2, a schematic diagram of a fine adjustment process of a slit when the slit is installed on a front telescope is shown, for an imaging spectrometer with the slit installed on a front telescope, firstly, the slit is finely adjusted, a target 5 of an inner focusing collimator 4 is selected as a fringe plate, the target 5 is adjusted to be located at a focal plane, and after polychromatic light of a light source 2 is turned on and passes through an integrating sphere 3, light beams enter the inner focusing collimator 4 to illuminate the target 5; then, the parallel light is output after passing through the collimating objective 7; the parallel light is converged by a front telescope of an imaging spectrometer to be adjusted and then imaged on a focal plane of a front telescope system; reading the distance between the image of the streak plate target 5 and the image of the slit by using the reading microscope 8, trimming the slit and a trimming pad of the front telescopic system according to the distance until the edges of the image of the target 5 and the image of the slit on the reading microscope 8 are sharp and clear at the same time, and fixing the slit to realize fine adjustment of the slit;
as shown in fig. 3, which is a schematic diagram of an adjustment process of a detector of an imaging spectrometer when a slit is installed on a front mirror according to an embodiment of the present invention, a front telescope system after fine adjustment of the slit is installed on the imaging spectrometer, the light source 2 is replaced by a monochromatic light source or a mercury lamp, the target 5 in the inner focusing collimator 4 is replaced by a star point plate, and after a star point is imaged by the front telescope system, the diameter of a star point image is smaller than the width of the slit, and the star point image is imaged on the detector by the spectrometer; adjusting the position of the target 5, observing the size of a light spot of a star point image on the detector, and recording the defocusing distance of the inner focusing collimator 4 when the light spot is the brightest and minimum; calculating the trimming amount of a trimming pad of the detector according to the relation between the focal length of the internal focusing collimator 4 and the focal length of the imaging spectrometer, trimming the trimming pad until the star point plate is positioned at the focal plane of the internal focusing collimator 4, and stopping trimming the trimming pad when the star point image observed on the detector is brightest and sharpest; then, the light source 2 is replaced by a complex color light source, the relative angle between the detector and the dispersion element is adjusted, so that the point view field complex color image of the light source 2 is sharp and is aligned with the detector row, and the detector is fixed at the moment to realize the adjustment of the imaging spectrometer detector;
as shown in fig. 4, which is a schematic diagram of a fine adjustment process of a front telescope system when a slit is installed on a front mirror according to an embodiment of the present invention, the light source 2 is replaced with monochromatic light, and a relative angle between the front telescope system and a spectrometer in an imaging spectrometer is adjusted, so that the monochromatic light of the slit is sharp and aligned with the detector, and the front telescope system is fixed to realize the fine adjustment of the front telescope system;
the whole machine of the imaging spectrometer is adjusted after the fine adjustment of the device to the slit, the adjustment of the detector of the imaging spectrometer and the fine adjustment of the front telescope system.
Further, for an imaging spectrometer with a slit installed on the spectrometer, the process of using the device for adjustment specifically comprises:
fig. 5 is a schematic diagram illustrating a process of adjusting a detector when a slit is installed on a spectrometer according to an embodiment of the present invention, where the detector is installed at the rear end of the imaging spectrometer, a front telescope is installed at the front end of the imaging spectrometer, a target 5 of an inner focusing collimator 4 is a star point plate, the target 5 is first adjusted to be located at a focal plane, a light source 2 is turned on and illuminates the star point plate target 5 through an integrating sphere 3, and then parallel light is output through a collimator lens 7 of the inner focusing collimator 4; images formed by the star point plate are focused by the front telescope and then imaged on a focal plane, and then imaged on the detector by the spectrometer; adjusting the position of the target 5, observing the size of a light spot of a star point plate on the detector, and recording the defocusing distance of the inner focusing collimator 4 when the size of the light spot is minimum, sharpest and brightest; calculating the trimming amount of a trimming pad of the detector according to the relation between the focal length of the inner focusing collimator 4 and the focal length of the imaging spectrometer, trimming the trimming pad until the target 5 is positioned at the focal plane of the inner focusing collimator 4, and stopping trimming the trimming pad when the star point plate image seen on the detector is brightest and sharpest; then, the light source 2 is replaced by a polychromatic light source, the relative angle between the detector and a spectrometer in the imaging spectrometer is adjusted, so that the polychromatic image of the point view field of the light source 2 is sharp and is aligned with the detector row, and the detector is fixed at the moment to realize the adjustment of the detector of the imaging spectrometer;
as shown in fig. 6, which is a schematic diagram of a fine adjustment process of a slit when the slit is installed on a spectrometer according to an embodiment of the present invention, the front telescope is detached, the slit is installed at the front end of an imaging spectrometer, and the light source 2 is replaced by a monochromatic light source; the monochromatic light source 2 uniformly irradiates the slit after passing through the integrating sphere 3, and then images on the detector after passing through the spectrometer; the slit monochromatic image edge is sharp by adjusting the front-back distance between the slit and the front end face of the spectrometer, then the slit is rotated to enable the monochromatic image of the slit on the detector to be sharp and to be aligned with the detector row, and the slit is fixed at the moment to realize fine adjustment of the slit;
fig. 7 is a schematic diagram illustrating a fine adjustment process of a front telescope when a slit is installed on a spectrometer according to an embodiment of the present invention, in which the front telescope is installed at the front end of the spectrometer, the target 5 is replaced by a fringe plate, and the light source 2 is replaced by polychromatic light; firstly, adjusting a target 5 to be positioned at a focal plane, turning on the light source 2 to illuminate the target 5 after passing through an integrating sphere 3, and outputting parallel light after passing through a collimating mirror 7 of the inner focusing collimator 4; an image formed by the target 5 is focused by the front telescope and then is imaged on a focal plane, and then is imaged on the detector through the slit and the spectrometer; adjusting the position of the target 5, observing the stripe contrast of a stripe plate image, and recording the defocusing distance of the inner focusing collimator 4 when the stripe is sharpest; calculating the trimming amount of a trimming pad of the front telescope according to the relation between the focal length of the inner focusing collimator 4 and the focal length of the imaging spectrometer, trimming until the target 5 is positioned at the focal plane of the inner focusing collimator 4, and stopping trimming of the trimming pad if the streak plate image observed on the detector is brightest and sharpest, and fixing the front telescope to realize fine adjustment of the front telescope;
the whole machine of the imaging spectrometer is adjusted by adjusting the detector of the imaging spectrometer, finely adjusting the slit and finely adjusting the front telescope through the device.
In a specific implementation, the imaging spectrometer is a dispersion system based on an area array detector; the inner focusing collimator 4 can be realized by modifying a collimator commonly used in a laboratory.
The following will explain the assembling process of the above device in detail by using a specific example, in this example, a visible near infrared imaging spectrometer with a slit installed on the spectrometer is assembled, the detector scale is 2048 × 2048, the detector pixel size is 11um × 11um, and the technical indexes are as shown in table 1:
TABLE 1 System index requirements
According to the indexes of the imaging spectrometer to be adjusted, the adjusting process by using the device specifically comprises the following steps:
1. internal focusing collimator focal length f 1 600mm, and the focal plane adjustable range is +/-50 mm. According to the focal length of the internally focusing collimator, the focal length of the front mirror and the size and width of the detector pixel, a star point plate with the diameter smaller than (11 um multiplied by 600 mm)/100mm =66um and a stripe plate with the stripe interval larger than 66um are selected. In the embodiment, a star point plate with the diameter of 50um and a stripe plate with the stripe interval of 100um are selected for adjustment.
2. As shown in fig. 8, which is a schematic diagram of an optical path during the installation and adjustment process of the embodiment of the present invention, the initial adjustment of the detector is performed first, the detector is installed at the rear end of the spectrometer, and the front telescope is installed at the front end of the spectrometer. The target of the internal focusing collimator is selected as a star point plate, the target of the internal focusing collimator is adjusted to be positioned at the focal plane, a laser light source with the wavelength of 632.8nm is turned on to illuminate the star point target of the internal focusing collimator after passing through an integrating sphere, parallel light is output through a collimating lens of the internal focusing collimator, an image formed by the star point plate is focused by a front telescope and then is imaged on the focal plane of a front telescope system, and an image of the star point plate is imaged on a detector through a spectrometer; adjusting the position of a target of the inner focusing collimator, observing the size of a light spot of a star point plate of an imaging spectrometer, recording the defocusing distance d of the inner focusing collimator as-18 mm when the light spot is the sharpest and brightest and smallest, and focusing according to the focal length f of the inner focusing collimator 1 And focal length f of imaging spectrometer 2 The trimming amount of the trimming pad of the detector is calculated according to the relationship between the two
Trimming the trimming pad until the star of the internally focusing collimatorWhen the point plate is positioned on the focal plane of the inner focusing collimator, the starpoint plate image seen on the detector is brightest and sharpest, and the trimming of the trimming pad is stopped at the moment, so that the initial adjustment of the detector is realized.
3. The light source is replaced by a double-color light source tungsten lamp, the relative angle between the detector and the spectrometer is adjusted, so that the point view field double-color image of the light source is sharp and is aligned with the detector row, the detector is fixed, and the detector is accurately adjusted.
4. The front telescope is detached, the slit is arranged at the front end of the spectral imaging system, the light source is replaced by a laser with a monochromatic light source of 632.8nm, the monochromatic light source is uniformly irradiated on the slit after passing through the integrating sphere, and the slit is imaged on the detector after passing through the spectrometer; the slit monochromatic image edge is sharp by adjusting the front-back distance delta x between the slit and the front end face of the spectrometer, then the slit is rotated, the monochromatic image of the slit on the detector is sharp and aligned with the detector row, the slit is fixed, and the fine adjustment of the slit is realized.
5. Installing a front telescope at the front end of a spectrometer, wherein a replacement target is a fringe plate, a replacement light source is a polychromatic light tungsten lamp, adjusting a target of an inner focusing collimator tube to be positioned at a focal plane, turning on a polychromatic light source 2, illuminating a fringe plate target 5 after passing through an integrating sphere 3, outputting parallel light after passing through a collimating lens 7, converging an image formed by the fringe plate through the front telescope of the imaging spectrometer, imaging the image on the focal plane of a front telescope system, and imaging the image on a detector after passing through a slit and the spectrometer; adjusting the position of the target 5, observing the stripe contrast of the stripe image of the stripe plate of the imaging spectrometer, recording the defocusing distance d of the inner focusing collimator 5 as-3 mm when the stripe is sharpest, and according to the relationship between the focal length of the inner focusing collimator and the focal length of the imaging spectrometer
And calculating the trimming amount of the front-mounted lens trimming pad, trimming until the fringe plate is positioned at the focal plane of the inner focusing collimator, and stopping trimming of the trimming pad when the fringe plate image seen on the detector is brightest and sharpest, and fixing the front-mounted telescope to realize fine adjustment of the front-mounted telescope.
After the adjustment, the whole machine of the imaging spectrometer can be adjusted.
It is noted that those skilled in the art will be familiar with the art to which this invention relates.
In conclusion, the assembling and adjusting device disclosed by the invention does not need to design and process redundant auxiliary assembling and adjusting components, such as a common auxiliary diaphragm process slit, and is completely assembled, adjusted and fixed by the components of the instrument in the assembling and adjusting process, so that the condition that the components of the instrument are reinstalled after the auxiliary assembling and adjusting components are removed does not exist, the cost is low, the assembling and adjusting steps are few, the speed is high, the precision is high, and the assembling and adjusting device is beneficial to the assembling and adjusting of the imaging spectrometers in batch production.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.
Claims (3)
1. An installation and adjustment method of a dispersion type imaging spectrometer is characterized in that an installation and adjustment device of the imaging spectrometer is used for complete installation and adjustment of the dispersion type imaging spectrometer, the device comprises a light source, an integrating sphere, an internal focusing collimator and a reading microscope, wherein:
the light source adopts a monochromatic light source, a mercury lamp or a polychromatic light source;
the internal focusing collimator adopts a transmission type, total reflection type or catadioptric type structure and consists of a target, a collimating objective and an internal focusing mechanism;
aiming at an imaging spectrometer with a slit arranged on a front telescope system, the adjusting method specifically comprises the following steps:
firstly, finely adjusting a slit, selecting a fringe plate as a target of the inner focusing collimator, adjusting the target to be positioned at the focal plane of the target, turning on a polychromatic light source, and enabling polychromatic light to enter the inner focusing collimator after passing through an integrating sphere to illuminate the target; then outputting parallel light after passing through the collimating objective lens; the parallel light is focused by a front telescope of an imaging spectrometer to be adjusted and then imaged on a focal plane of a front telescope system; reading the distance between the image of the target of the fringe plate and the image of the slit by using the reading microscope, trimming the slit and a trimming pad of the front telescopic system according to the distance until the edges of the image of the target and the image of the slit on the reading microscope are sharp and clearly visible at the same time, and fixing the slit to realize fine adjustment of the slit;
then, the front telescope system after slit fine adjustment is installed on an imaging spectrometer, the light source is replaced by a monochromatic light source or a mercury lamp, the target in the inner focusing collimator is replaced by a star point plate, after star points are imaged by the front telescope system, the diameter of a star point image is smaller than the width of the slit, and the star point image is imaged on a detector through the spectrometer; adjusting the position of the target, observing the size of a light spot of a star point image on the detector, and recording the defocusing distance of the inner focusing collimator when the light spot is brightest and minimum; calculating the trimming amount of a trimming pad of the detector according to the relation between the focal length of the internal focusing collimator and the focal length of the imaging spectrometer, trimming the trimming pad, and stopping trimming the trimming pad until the star point plate is positioned at the focal plane of the internal focusing collimator; then, the light source is changed into a polychromatic light source, the relative angle between the detector and the spectrometer is adjusted, so that the polychromatic image of the point view field of the light source is sharp and aligned with the detector array, and the detector is fixed at the moment to realize the adjustment of the detector of the imaging spectrometer;
changing the light source to be monochromatic light, adjusting the relative angle between the front telescope system and a spectrometer in the imaging spectrometer to ensure that the slit monochromatic image is sharp and aligned with the detector row, fixing the front telescope system at the moment and realizing the fine adjustment of the front telescope system;
after the fine adjustment of the slit, the adjustment of the detector of the imaging spectrometer and the fine adjustment of the front telescope system by the method, the whole machine adjustment of the imaging spectrometer is realized.
2. The method for tuning a dispersive imaging spectrometer according to claim 1,
the sizes of star point holes and the line width of the stripe plate are selected according to the focal length of the internal focusing collimator, the focal length of the front lens and the size of the detector pixel.
3. The method for tuning a dispersive imaging spectrometer according to claim 1,
the imaging spectrometer is a dispersion system based on an area array detector;
the internal focusing collimator is realized by modifying a collimator commonly used in a laboratory.
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