CN217060296U - Radio frequency element test fixture - Google Patents

Radio frequency element test fixture Download PDF

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Publication number
CN217060296U
CN217060296U CN202123361496.XU CN202123361496U CN217060296U CN 217060296 U CN217060296 U CN 217060296U CN 202123361496 U CN202123361496 U CN 202123361496U CN 217060296 U CN217060296 U CN 217060296U
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China
Prior art keywords
radio frequency
edge
frequency component
sliding block
slider
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CN202123361496.XU
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Chinese (zh)
Inventor
李小雯
陈洁峰
何志江
陆锦松
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Guangdong Fenghua Advanced Tech Holding Co Ltd
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Guangdong Fenghua Advanced Tech Holding Co Ltd
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Abstract

The utility model belongs to the technical field of radio frequency component testing equipment, and particularly discloses a radio frequency component testing clamp, which comprises an insulating plate and a first sliding block; a plurality of mounting holes are formed in the edge of the insulating plate; a square hole is formed in the middle of the insulating plate; the square hole is provided with a fixed flange, a second edge, a first edge and a third edge which are connected end to end in sequence; the first edge is provided with a first sliding chute with the extending direction parallel to the extending direction of the second edge; the first sliding block is arranged on the first sliding groove in a sliding mode. The insulating board is fixedly arranged on the test board, the edge of the chip radio frequency component is abutted against the fixed flange, the first sliding block is pushed to stretch into the square hole, the first sliding block is matched with the fixed flange to clamp the chip radio frequency component, the chip radio frequency component can be rapidly placed at the correct test position of the test board, the test time of the chip radio frequency component is shortened, and the test efficiency is improved.

Description

Radio frequency element test fixture
Technical Field
The utility model relates to a radio frequency components and parts test equipment technical field especially relates to a radio frequency components and parts test fixture.
Background
With the rapid development of the society today, people have more and more requirements on radio frequency technology, and many business macros are actively promoting the development and application of radio frequency technology in various industries, so that the requirements of people on radio frequency products are continuously improved. Before the chip radio frequency component is used, impedance parameters, scattering parameters and the like need to be tested so as to test whether the chip radio frequency component is suitable. The chip rf component is usually tested by a pressure test method, that is, the chip rf component is pressed on a joint at the center of the test board by a pressure head, so that the chip rf component is connected to a test circuit of the test board to test impedance parameters and scattering parameters. Each piece of chip radio frequency element needs to be placed at the same testing position, so that the chip radio frequency element is in good contact with the testing connector, the testing result of each piece of chip radio frequency element can be guaranteed to be effective, and then a tester needs to spend a large amount of time and energy to place the chip radio frequency element at the correct testing position during testing, so that the testing time of the chip radio frequency element is too long, and the testing efficiency is low.
SUMMERY OF THE UTILITY MODEL
The utility model aims at: the radio frequency element test fixture is provided to solve the technical problems that in the prior art, a large amount of time and energy are needed to put a chip radio frequency element to a correct test position, so that the test duration of the chip radio frequency element is too long, and the test efficiency is low.
In order to achieve the above object, the present invention provides a test fixture for radio frequency components, which comprises:
the edge of the insulating plate is provided with a plurality of mounting holes for fixing the insulating plate on the test board; a square hole is formed in the middle of the insulating plate; the square hole is provided with a fixed retaining side, a second side, a first side and a third side which are sequentially connected end to end; the first edge is provided with a first sliding groove which is parallel to the extending direction of the second edge and is communicated with the square hole;
and the first sliding block is arranged in the first sliding groove in a sliding manner and is used for extending into the square hole to be matched with the fixed flange to clamp the radio frequency element.
Preferably, the radio frequency component test fixture further comprises a first set screw; the insulation board is provided with a first threaded hole communicated with the first sliding groove, the first set screw is in threaded connection with the first threaded hole, and the first set screw is used for being matched with the first sliding groove to clamp the first sliding block.
Preferably, a first groove is formed in the edge of one side, facing the square hole, of the first sliding block, and a flange groove is formed in the position, corresponding to the first groove, of the fixed flange.
Preferably, the radio frequency element test fixture further comprises a second slider and a third slider; the second edge is provided with a second sliding chute, the extending direction of which is parallel to the extending direction of the first edge and is communicated with the square hole; the third edge is provided with a third sliding chute, the extending direction of which is parallel to the extending direction of the first edge and is communicated with the square hole; the second sliding block is arranged in the second sliding groove in a sliding manner, and the third sliding block is arranged in the third sliding groove in a sliding manner; the second sliding block and the second sliding block are used for extending into the square hole, and the second sliding block and the third sliding block are matched to clamp the radio frequency element.
Preferably, the radio frequency component test fixture further comprises a second set screw; the insulation plate is provided with a second threaded hole communicated with the second chute, and the second set screw is in threaded connection with the second threaded hole; the second set screw is used for being matched with the second sliding groove to clamp the second sliding block.
Preferably, the radio frequency component test fixture further comprises a third set screw; the insulation plate is provided with a third threaded hole communicated with the third chute, and the third set screw is in threaded connection with the third threaded hole; and the third set screw is used for matching with the third sliding chute to clamp the third sliding block.
Preferably, the second slider is provided with the second recess towards a side edge of quad slit, the third slider is provided with the third recess towards a side edge of quad slit.
Preferably, the cross section of the second groove and the cross section of the third groove are semicircular.
Preferably, the insulating plate is made of polytetrafluoroethylene.
Preferably, the inner wall of the mounting hole is provided with threads.
The utility model provides a radio frequency component test fixture, its beneficial effect is: the insulation board of the radio frequency element test fixture is fixedly arranged on the test board, so that the test connector on the test board falls into the square hole, namely, the distance between the fixed flange and the test connector is unchanged, the chip radio frequency element can be grabbed and placed into the square hole, the edge of the chip radio frequency element is abutted against the fixed flange, the first sliding block is pushed to extend into the square hole, the first sliding block is matched with the fixed flange to clamp the chip radio frequency element, and the chip radio frequency element is fixed on the test board. Because the distance between the fixed flange and the test joint is unchanged, the positions of each chip radio frequency component attached to the fixed flange and the test joint are determined, so that the chip radio frequency component can be quickly placed at the correct test position of the test bench, the chip radio frequency component is in good contact with the test joint, the test results of the impedance parameters and the scattering parameters of the chip radio frequency component are more accurate, the test duration of the chip radio frequency component is shortened, and the test efficiency is improved.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
Fig. 1 is a schematic structural diagram of a test fixture for a radio frequency device according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of the first slider, the second slider, and the third slider of the embodiment of the present invention extending into the square hole.
Fig. 3 is a schematic cross-sectional structure diagram of a first slider according to an embodiment of the present invention;
fig. 4 is a schematic cross-sectional view of a second slider according to an embodiment of the present invention;
fig. 5 is a schematic cross-sectional view of a third slider according to an embodiment of the present invention.
In the figure, 100, insulating plates; 110. mounting holes; 120. a square hole; 130. fixing the flanges; 131. a flange groove; 140. a second edge; 141. a second chute; 150. a first side; 151. a first chute; 160. a third side; 161. a third chute; 200. a first slider; 210. a first groove; 300. a first set screw; 400. a second slider; 410. a second groove; 500. a third slider; 510. a third groove; 600. a second set screw; 700. and a third set screw.
Detailed Description
Reference will now be made in detail to the embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary only for explaining the present invention, and should not be construed as limiting the present invention.
In the description of the present invention, it should be understood that the orientation or positional relationship indicated with respect to the orientation description, such as up, down, front, rear, left, right, etc., is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention.
In the description of the present invention, a plurality of means are one or more, a plurality of means are two or more, and the terms greater than, less than, exceeding, etc. are understood as not including the number, and the terms greater than, less than, within, etc. are understood as including the number. If there is a description of first and second for the purpose of distinguishing technical features only, this is not to be understood as indicating or implying a relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of technical features indicated.
In the description of the present invention, unless there is an explicit limitation, the words such as setting, installation, connection, etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above words in combination with the specific contents of the technical solution.
Referring to fig. 1 to 5, a test fixture for a radio frequency device according to an embodiment of the present invention will be described. The radio frequency element test fixture is used for clamping a sheet type radio frequency element and used on a test board for testing the sheet type radio frequency element, and a test joint is arranged at the center of the test board.
As shown in fig. 1 and fig. 2, a radio frequency component testing jig according to an embodiment of the present invention includes an insulating plate 100 and a first slider 200; the edge of the insulating plate 100 is provided with a plurality of mounting holes 110 for fixing on a test stand; a square hole 120 is formed in the middle of the insulating plate 100; the square hole 120 is provided with a fixed retaining edge 130, a second edge 140, a first edge 150 and a third edge 160 which are connected end to end in sequence; the first side 150 is provided with a first sliding slot 151 which extends in a direction parallel to the second side 140 and is communicated with the square hole 120; the first sliding block 200 is slidably disposed in the first sliding groove 151; the first slider 200 is adapted to extend into the square hole 120 to cooperate with the retaining rib 130 to clamp the rf component. I.e., the sliding direction of the first slider 200 is perpendicular to the first edge 150, and can be vertically close to or far away from the fixed rib 130.
The mounting holes 110 are internally threaded, that is, the mounting holes 110 are threaded holes, and the insulating plate 100 can be fixed on the test table by screws or bolts penetrating through the mounting holes 110. In addition, the test board can be fixed on the test board through pins, rivets and the like. When insulating plate 100 is installed in a test station, the test joints of the test station are located in square holes 120. That is, the distance between the fixed flange 130 and the test connector is not changed, when the chip rf component is positioned, the chip rf component can be placed on the fixed flange 130 as a reference. The chip rf component is generally square, and when the chip rf component is placed on the testing platform, the chip rf component can be clamped and placed in the square hole 120, so that one side of the chip rf component is attached to the edge of the fixing rib 130, thereby achieving the purpose of preliminary positioning. Then, the operator pushes the first sliding block 200 to approach the fixed rib 130, so that the first sliding block 200 cooperates with the fixed rib 130 to clamp the chip rf component, so that the chip rf component is fixed in the square hole 120, and at this time, the chip rf component is fixed on the testing platform. Because the distance between the fixed flange 130 and the test connector is not changed, the positions of each chip radio frequency component attached to the fixed flange 130 and the test connector are determined, so that the chip radio frequency component can be quickly placed at the correct test position of the test bench, the contact between the chip radio frequency component and the test connector is good, and the test results of the impedance parameters and the scattering parameters of the chip radio frequency component are more accurate. It should be noted that the size of the square hole 120 is larger than that of the chip rf component, so that the chip rf component can be placed in the square hole 120.
The insulating board 100 of the rf component testing fixture of this embodiment is installed and fixed on the testing platform, so that the testing connector on the testing platform falls into the square hole 120, i.e. the distance between the fixed flange 130 and the testing connector is not changed, and then the sheet-type rf component can be grabbed and put into the square hole 120, the edge of the sheet-type rf component is abutted against the fixed flange 130, and the first slider 200 is pushed to extend into the square hole 120, so that the first slider 200 cooperates with the fixed flange 130 to clamp the sheet-type rf component, and at this time, the sheet-type rf component is fixed on the testing platform. Because the distance between the fixed flange 130 and the test connector is unchanged, the positions of each chip radio frequency component attached to the fixed flange 130 and the test connector are determined, so that the chip radio frequency component can be quickly placed at the correct test position of the test bench, the chip radio frequency component is in good contact with the test connector, the test results of the impedance parameters and the scattering parameters of the chip radio frequency component are more accurate, the test duration of the chip radio frequency component is shortened, and the test efficiency is improved.
It should be noted that, after the testing table tests the chip rf component located in the square hole 120, the first slider 200 is pushed away from the fixed baffle, so that the chip rf component is released from the first slider 200 and the fixed baffle, so as to conveniently place another chip rf component into the square hole 120, and facilitate testing another undetected chip rf component.
In a preferred embodiment of the present embodiment, referring to fig. 1, 2 and 3, the radio frequency component test fixture further comprises a first set screw 300; the insulation board 100 is provided with a first threaded hole communicated with the first sliding groove 151, a first set screw 300 is in threaded connection with the first threaded hole, and the first set screw 300 is used for being matched with the first sliding groove 151 to clamp the first sliding block 200. The first set screw 300 is in threaded connection with the first threaded hole, an insertion end of the first set screw 300 is used for extending into the first sliding groove 151, and the insertion end of the first set screw 300 abuts against the first sliding block 200 in the first sliding groove 151 so as to cooperate with the first sliding groove 151 to clamp the first sliding block 200, so that the first sliding block 200 can be fixed. As shown in fig. 3, the two sides of the first sliding block 200 have side wings, a containing cavity for containing the side wings is provided in the first sliding groove 151, the containing cavity is communicated with the square hole 120, the first threaded hole is communicated with the containing cavity, and the insertion end of the first set screw 300 can be extended into the containing cavity to abut against the first sliding block 200. That is, after the first slider 200 moves towards the fixed stop and clamps the chip rf component, the first set screw 300 is screwed into the first threaded hole, so that the insertion end of the first set screw 300 abuts against the first slider 200, and the first set screw 300 cooperates with the first sliding groove 151 to clamp the first slider 200, thereby fixing the position of the first slider 200 and preventing the chip rf component from shifting during testing.
When the chip rf component needs to be loosened, the first set screw 300 is loosened to separate the insertion end of the first set screw 300 from the first slider 200, and then the first slider 200 can move; the first sliding block 200 is pushed to be far away from the fixed baffle, so that the chip rf component can be taken away from the square hole 120, and another chip rf component which is not detected can be conveniently placed for detection.
In addition, in some specific embodiments of the present invention, the first slider 200 can be driven to slide by a spring so as to clamp the chip rf device.
In the preferred embodiment of the present invention, referring to fig. 1 and 2, a side edge of the first slider 200 facing the square hole 120 is provided with a first groove 210, a position of the fixed flange 130 corresponding to the first groove 210 is provided with a flange groove 131, the first groove 210 facilitates the tweezers to extend into the gap between the chip-type rf component and the first slider 200, the flange groove 131 facilitates the clamping jaw of the tweezers to extend into the gap between the chip-type rf component and the fixed flange 130, and the operator can grasp the chip-type rf component with the tweezers.
In a preferred embodiment of the present invention, referring to fig. 1, 2, 4 and 5, the radio frequency component test fixture further comprises a second slider 400 and a third slider 500; the second side 140 is provided with a second sliding groove 141 with the extending direction parallel to the extending direction of the first side 150; the third side 160 is provided with a third sliding groove 161, the extending direction of which is parallel to the extending direction of the first side 150; the second slide block 400 is slidably arranged on the second slide groove 141, and the third slide block 500 is slidably arranged on the third slide groove 161; the second slider 400 and the second slider 400 are both used for extending into the square hole 120, and the second slider 400 and the third slider 500 are matched to clamp the sheet type radio frequency component. The second slider 400 is located at one end of the second side 140 close to the fixed rib 130, and the third slider 500 is located at one end of the third side 160 close to the fixed rib 130, so that the third slider 500 and the second slider 400 can better clamp the chip rf component. After the first slider 200 is matched with the fixing rib 130 to clamp the chip rf component, the second slider 400 and the third slider 500 can be pushed to be matched with the two sides of the chip rf component to clamp the chip rf component, so that the chip rf component can be conveniently and omnidirectionally fixed, the fixing effect of the chip rf component is better, and the chip rf component is prevented from being displaced in the testing process. And through setting up first slider 200, second slider 400, third slider 500, can fix in the quad slit 120 and press from both sides the piece formula radio frequency component of multiple different sizes tightly, enlarge the application range of test fixture.
In a preferred embodiment of the present invention, referring to fig. 1, 2 and 4, the radio frequency component testing jig further includes a second set screw 600; the insulation plate 100 is provided with a second threaded hole communicated with the second chute 141, and the second set screw 600 is in threaded connection with the second threaded hole; the second set screw 600 is used to clamp the second slider 400 in cooperation with the second sliding groove 141. As shown in fig. 4, the two sides of the second slider 400 have side wings, the second sliding groove 141 has a cavity for accommodating the side wings, the cavity is communicated with the square hole 120, the second threaded hole is communicated with the cavity, and the insertion end of the second set screw 600 can extend into the cavity and abut against the second slider 400. The principle of the second set screw 600 fixing the second slider 400 is the same as the principle of the first set screw 300 fixing the first slider 200, that is, the second set screw 600 is inserted into the second threaded hole to abut against the second slider 400, so that the second set screw 600 cooperates with the second sliding groove 141 to clamp the second slider 400, the second slider 400 can be fixed when clamping the chip rf component, the second slider 400 is prevented from shifting, and the chip rf component is prevented from shifting during testing. When the second slider 400 needs to be moved, the second set screw 600 can be unscrewed, so that the insertion section of the second set screw 600 is separated from the second slider 400, and then the second slider 400 can slide along the second sliding groove 141, thereby facilitating the adjustment of the position of the second slider 400.
In a preferred embodiment of the present invention, referring to fig. 1, 2 and 5, the radio frequency component test fixture further comprises a third set screw 700; the insulation board 100 is provided with a third threaded hole communicated with the third chute 161, and a third set screw 700 is in threaded connection with the third threaded hole; the third set screw 700 is used to clamp the third slider 500 in cooperation with the third sliding slot 161. As shown in fig. 5, the two sides of the third slider 500 have side wings, the third sliding groove 161 has accommodating cavities for accommodating the side wings, the accommodating cavities are communicated with the square hole 120, the third threaded hole is communicated with the accommodating cavities, and the insertion end of the third set screw 700 can extend into the accommodating cavities to abut against the third slider 500. The principle of fixing the third slider 500 by the third set screw 700 is the same as the principle of fixing the third slider 500 by the third set screw 700, that is, the insertion end of the third set screw 700 inserted into the third threaded hole is abutted against the third slider 500, so that the third set screw 700 is matched with the third sliding groove 161 to clamp the third slider 500, the third slider 500 can be fixed when clamping the chip rf component, the third slider 500 is prevented from shifting, and the chip rf component is prevented from shifting during testing. When the third sliding block 500 needs to be moved, the third set screw 700 can be unscrewed, so that the insertion section of the third set screw 700 is separated from the third sliding block 500, and at this time, the third sliding block 500 can slide along the third sliding groove 161, thereby facilitating the adjustment of the position of the third sliding block 500.
In a preferred embodiment of the present invention, referring to fig. 1 and 2, the second slider 400 is provided with a second groove 410 toward one side edge of the square hole 120, and the third slider 500 is provided with a third groove 510 toward one side edge of the square hole 120. The second groove 410 and the third groove 510 are disposed correspondingly, and the second groove 410 and the third groove 510 are used for allowing tweezers to extend into, so that the tweezers can conveniently clamp the chip radio frequency component.
In a preferred embodiment of the present invention, referring to fig. 1 and 2, the cross-section of the second groove 410 and the cross-section of the third groove 510 are both semicircular. The semicircular groove is convenient to process, is convenient to process and form on the second sliding block 400 and the third sliding block 500, and is convenient to manufacture.
In a preferred embodiment of the present invention, the insulating plate 100 is made of teflon. The polytetrafluoroethylene parts have low cost, easy processing and manufacturing, and insulating energy consumption, and are suitable for being used as the insulating plate 100 of the utility model.
The above is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, a plurality of modifications and replacements can be made without departing from the technical principle of the present invention, and these modifications and replacements should also be considered as the protection scope of the present invention.

Claims (10)

1. A radio frequency component test fixture, comprising:
the edge of the insulating plate is provided with a plurality of mounting holes for fixing the insulating plate on the test board; a square hole is formed in the middle of the insulating plate; the square hole is provided with a fixed retaining side, a second side, a first side and a third side which are sequentially connected end to end; the first edge is provided with a first sliding groove which is parallel to the extending direction of the second edge and is communicated with the square hole;
and the first sliding block is arranged in the first sliding groove in a sliding manner and is used for extending into the square hole to be matched with the fixed flange to clamp the radio frequency element.
2. The radio frequency component test fixture of claim 1, wherein: further comprising: a first set screw; the insulation board is provided with the intercommunication first screw hole of first spout, first holding screw with first screw hole threaded connection, first holding screw is used for cooperating first spout presss from both sides tightly first slider.
3. The radio frequency component test fixture of claim 1, wherein: a first groove is formed in the edge, facing the square hole, of one side of the first sliding block, and a retaining groove is formed in the position, corresponding to the first groove, of the fixed retaining edge.
4. The radio frequency component test fixture of claim 1, wherein: further comprising: a second slider and a third slider; the second edge is provided with a second sliding chute, the extending direction of which is parallel to the extending direction of the first edge and is communicated with the square hole; the third edge is provided with a third sliding chute, the extending direction of which is parallel to the extending direction of the first edge and is communicated with the square hole; the second sliding block is arranged in the second sliding groove in a sliding manner, and the third sliding block is arranged in the third sliding groove in a sliding manner; the second sliding block and the second sliding block are used for extending into the square hole, and the second sliding block and the third sliding block are matched to clamp the radio frequency element.
5. The radio frequency component test fixture of claim 4, wherein: further comprising: a second set screw; the insulation plate is provided with a second threaded hole communicated with the second chute, and the second set screw is in threaded connection with the second threaded hole; the second set screw is used for being matched with the second sliding groove to clamp the second sliding block.
6. The radio frequency component test fixture of claim 4, wherein: further comprising: a third set screw; the insulation plate is provided with a third threaded hole communicated with the third chute, and the third set screw is in threaded connection with the third threaded hole; and the third set screw is used for matching with the third sliding chute to clamp the third sliding block.
7. The radio frequency component test fixture of claim 4, wherein: the second slider orientation one side edge of quad slit is provided with the second recess, the third slider orientation one side edge of quad slit is provided with the third recess.
8. The radio frequency component test fixture of claim 7, wherein: the cross section of the second groove and the cross section of the third groove are both semicircular.
9. The radio frequency component test fixture of any one of claims 1-8, wherein: the insulation board is made of polytetrafluoroethylene.
10. The radio frequency component test fixture of any one of claims 1-8, wherein: and the inner wall of the mounting hole is provided with threads.
CN202123361496.XU 2021-12-28 2021-12-28 Radio frequency element test fixture Active CN217060296U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202123361496.XU CN217060296U (en) 2021-12-28 2021-12-28 Radio frequency element test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202123361496.XU CN217060296U (en) 2021-12-28 2021-12-28 Radio frequency element test fixture

Publications (1)

Publication Number Publication Date
CN217060296U true CN217060296U (en) 2022-07-26

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ID=82478558

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202123361496.XU Active CN217060296U (en) 2021-12-28 2021-12-28 Radio frequency element test fixture

Country Status (1)

Country Link
CN (1) CN217060296U (en)

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