CN217034152U

CN217034152U - Circuit board test jig with buffer structure

Info

Publication number: CN217034152U
Application number: CN202123299436.XU
Authority: CN
Inventors: 彭华
Original assignee: Shenzhen Shunchengyi Electronics Co ltd
Current assignee: Shenzhen Shunchengyi Electronics Co ltd
Priority date: 2021-12-27
Filing date: 2021-12-27
Publication date: 2022-07-22
Anticipated expiration: 2031-12-27

Abstract

The utility model discloses a circuit board testing frame with a buffering structure, which comprises a fixed bottom frame and side plates, wherein the side plates are arranged on two sides of the fixed bottom frame, bottom feet are arranged at the bottom ends of the side plates, guide rods are fixedly connected to the top ends of the bottom feet, a buffering plate is arranged above the fixed bottom frame, and guide grooves are formed in four corners of the buffering plate. This circuit board test jig with buffer structure is crossed and is provided with the buffer board, buffer spring, the guide bar, go up the inserted bar, lower hollow post, place the buffer board department with the test line board, when the test, the test line board is pressed by the survey needle of test machine, reach abundant current contact, thereby carry out circuit board signal test, the buffer board is under buffer spring's effect, go up the inserted bar embedding under in the hollow post, the buffer board cup joints and pushes down in the guide bar outside, can provide the buffering of pushing down for the test line board, the problem of no buffering of circuit board pushing down has been solved.

Description

Circuit board test jig with buffer structure

Technical Field

The utility model relates to the technical field of circuit board testing, in particular to a circuit board testing frame with a buffer structure.

Background

The PCB circuit board needs to be subjected to current and voltage testing when leaving a factory, and an online testing machine is mostly adopted for testing to automatically judge each pin on the circuit board, so that defective products are eliminated. At present, a plurality of existing circuit board test racks are too simple in structure, only one group of insulating plate pads are adopted under the circuit boards, the circuit boards are fed into the position of the test pins, the circuit boards are not buffered when being pressed down by the test pins and are easy to damage by impact, and meanwhile, the circuit boards can be deviated or fall off when being taken due to manual feeding. A circuit board testing frame with a buffer structure is designed to solve the problems.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a circuit board test rack with a buffer structure, which is used for solving the problems that a circuit board is not buffered when being pressed by a test pin and is easy to damage under impact in the background technology.

In order to achieve the purpose, the utility model provides the following technical scheme: the utility model provides a circuit board test jig with buffer structure, includes fixed chassis and curb plate, the both sides of fixed chassis all are provided with the curb plate, the bottom of curb plate all is provided with the footing, the equal fixedly connected with guide bar in top of footing, the top of fixed chassis is provided with the buffer board, the four corners of buffer board all is provided with the guide way, the guide bar cup joints in the buffer board four corners through the guide way, be provided with buffer spring between the bottom of buffer board and the footing, buffer spring's bottom is provided with the fixed block.

Preferably, the inside top of buffer spring is provided with the inserted bar, the inside bottom of buffer spring is provided with the fixed block, the inside bottom of buffer spring is provided with down hollow post, go up the inserted bar and empty hollow post size phase-match down.

Preferably, the inside of curb plate is provided with the spout, the inside of spout is provided with the rack, the top meshing of rack is connected with the gear, the sliding sleeve has been cup jointed in the inside activity of gear.

Preferably, the push rod has been inlayed to the inside of sliding sleeve, be provided with four groups around the sliding sleeve inner wall and prevent changeing the lug, the push rod outer wall is provided with four groups all around and prevents changeing the recess, prevent changeing the lug and prevent changeing the recess gomphosis matching.

Preferably, the end face of the push rod is fixedly connected with a corner protector, the corner protector is L-shaped, and the corner protector is made of rubber.

Preferably, the top of buffer board is provided with the test wiring board, the buffer board adopts insulating PVC material.

Compared with the prior art, the utility model has the beneficial effects that: the circuit board testing frame with the buffer structure not only avoids damage to a testing circuit board caused by excessive pressure of the testing pin, and prevents the circuit board displacement from influencing the accuracy of data during testing, but also realizes more convenient and faster operation, and improves the overall testing efficiency;

(1) the testing circuit board is placed at the position of the buffer board through the arrangement of the buffer board, the buffer spring, the guide rod, the upper insertion rod and the lower hollow column, when the testing machine is used for testing, the testing circuit board is pressed down by a measuring pin of a testing machine, so that sufficient current contact is achieved, and therefore signal testing of the circuit board is carried out;

(2) through the arrangement of the sliding sleeve, the sliding groove, the gear, the rack, the corner protector and the push rod, after the test circuit board is placed, the sliding sleeve is moved in the sliding groove in the vertical direction through the four groups of movable sliding sleeves so as to be close to the circuit board, the gear is meshed with the rack, certain meshing damping is provided to prevent the sliding sleeve from loosening, then the push rod is transversely moved in the sliding sleeve through the push rod, the corner protector is pushed to abut against the four corners of the test circuit board, the circuit board displacement is prevented from influencing the accuracy of data during testing, and the testing accuracy is improved;

(3) through the arrangement of the sliding sleeve, the push rod, the anti-rotation lug and the anti-rotation groove, when the push rod in the sliding sleeve pushes the corner protector, the anti-rotation lug and the anti-rotation groove are correspondingly embedded, the situation that the position of the corner protector is overturned due to the fact that the push rod and the sliding sleeve rotate relatively when manual operation is carried out is avoided, horizontal clamping of the corner protector is kept, rotation adjustment is not needed, operation is more convenient and faster, and the whole testing efficiency is improved.

Drawings

FIG. 1 is a schematic front sectional view of the present invention;

FIG. 2 is a schematic top view of the testing jig of the present invention;

FIG. 3 is a front view of the buffer spring of the present invention;

fig. 4 is a side view of the lower hollow column according to the present invention.

In the figure: 1. a fixed chassis; 2. a buffer spring; 3. a chute; 4. a sliding sleeve; 5. a push rod; 6. a side plate; 7. a guide bar; 8. testing the circuit board; 9. a buffer plate; 10. protecting the corner; 11. a guide groove; 12. an upper insertion rod; 13. a fixed block; 14. a footing; 15. a gear; 16. a lower hollow column; 17. an anti-rotation groove; 18. an anti-rotation projection; 19. a rack.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, belong to the protection scope of the present invention.

Example 1: referring to fig. 1-4, a circuit board testing jig with a buffering structure comprises a fixed chassis 1 and side plates 6, wherein the side plates 6 are respectively arranged on two sides of the fixed chassis 1, bottom ends of the side plates 6 are respectively provided with a footing 14, top ends of the footings 14 are respectively fixedly connected with a guide rod 7, a buffering plate 9 is arranged above the fixed chassis 1, four corners of the buffering plate 9 are respectively provided with a guide groove 11, the guide rods 7 are sleeved at four corners of the buffering plate 9 through the guide grooves 11, a buffering spring 2 is arranged between the bottom end of the buffering plate 9 and the footing 14, the bottom end of the buffering spring 2 is provided with a fixed block 13, the top end of the buffering spring 2 is provided with an upper insertion rod 12, the bottom end of the buffering spring 2 is provided with a fixed block 13, the bottom end of the buffering spring 2 is provided with a lower hollow column 16, the upper insertion rod 12 is matched with the lower hollow column 16 in size, the top end of the buffering plate 9 is provided with a testing circuit board 8, the buffer plate 9 is made of insulating PVC material;

specifically, as shown in fig. 1, fig. 2 and fig. 3, place test circuit board 8 in buffer board 9, when testing, test circuit board 8 is pressed down by the survey pin of the testing machine, reach abundant current contact, thereby carry out circuit board signal test, buffer board 9 is under buffer spring 2's effect, go up in the hollow post 16 under the inserted bar 12 embedding, buffer board 9 cup joints and pushes down in the guide bar 7 outside, can provide the buffering of pushing down for test circuit board 8, avoid survey pin pressure excessively to cause the damage to test circuit board 8, better safeguard effect has.

Example 2: the inner part of the side plate 6 is provided with a sliding chute 3, the inner part of the sliding chute 3 is provided with a rack 19, the top end of the rack 19 is engaged and connected with a gear 15, the inner part of the gear 15 is movably sleeved with a sliding sleeve 4, the end surface of the push rod 5 is fixedly connected with a corner protector 10, the corner protector 10 is in an L shape, and the corner protector 10 is made of rubber;

specifically, as shown in fig. 1, fig. 2 and fig. 4, after the test circuit board 8 is placed, through four groups of movable sliding sleeves 4, the sliding sleeves 4 move in the sliding grooves 3 in the vertical direction, so as to be close to the circuit board, the gear 15 is meshed with the rack 19, certain meshing damping is provided to prevent the sliding sleeves 4 from loosening, the push rod 5 is pushed to transversely move in the sliding sleeves 4, the corner protectors 10 are pushed to abut against four corners of the test circuit board 8, the accuracy of data influenced by the displacement of the circuit board during testing is prevented, and the testing accuracy is improved.

Example 3: a push rod 5 is embedded in the sliding sleeve 4, four groups of anti-rotation lugs 18 are arranged around the inner wall of the sliding sleeve 4, four groups of anti-rotation grooves 17 are arranged around the outer wall of the push rod 5, and the anti-rotation lugs 18 are embedded and matched with the anti-rotation grooves 17;

specifically, as shown in fig. 1, fig. 2 and fig. 4, when the push rod 5 in the sliding sleeve 4 pushes the corner protector 10, the anti-rotation protrusion 18 and the anti-rotation groove 17 are correspondingly embedded, so that the situation that the position of the corner protector 10 is turned over due to the relative rotation of the push rod 5 and the sliding sleeve 4 during manual operation is avoided, the horizontal clamping of the corner protector 10 is maintained, the rotation adjustment is not needed, the operation is more convenient and faster, and the overall testing efficiency is improved.

The working principle is as follows: when the utility model is used, the test frame is placed below a measuring pin of a test instrument, a test circuit board 8 is placed at a buffer plate 9, when in test, the test circuit board 8 is pressed down by the measuring pin of a test machine to achieve sufficient current contact, thereby carrying out circuit board signal test, the buffer plate 9 is embedded into a lower hollow column 16 by an upper inserted rod 12 under the action of a buffer spring 2, the buffer plate 9 is sleeved outside a guide rod 7 to press down, thereby providing press-down buffer for the test circuit board 8, avoiding damage to the test circuit board 8 caused by excessive measuring pin pressure, after the test circuit board 8 is placed, the slide sleeve 4 moves in a slide groove 3 in the vertical direction through four groups of movable slide sleeves 4, thereby approaching the circuit board, a gear 15 is meshed with a rack 19, has certain meshing damping to prevent the slide sleeve 4 from loosening, and then the push rod 5 transversely moves in the slide sleeve 4 through the push rod 5, the four corners of the protection corner 10 are pushed to abut against the four corners of the test circuit board 8, the data accuracy caused by circuit board displacement during testing is prevented, when the protection corner 10 is pushed, the anti-rotation protruding blocks 18 and the anti-rotation grooves 17 are correspondingly embedded when the push rod 5 in the sliding sleeve 4 is pushed, when manual operation is avoided, the push rod 5 and the sliding sleeve 4 rotate relatively to cause the position of the protection corner 10 to overturn, the horizontal clamping of the protection corner 10 is kept, rotation adjustment is not needed, and the operation is more convenient and faster.

It will be evident to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.

Claims

1. The utility model provides a circuit board test jig with buffer structure, includes fixed chassis (1) and curb plate (6), its characterized in that: the utility model discloses a buffer structure, including fixed chassis (1), curb plate (6), lateral plate (6), footing (14), the equal fixedly connected with guide bar (7) in top of footing (14), the top of fixed chassis (1) is provided with buffer board (9), the four corners of buffer board (9) all is provided with guide way (11), guide bar (7) cup joint in buffer board (9) four corners through guide way (11), be provided with buffer spring (2) between the bottom of buffer board (9) and footing (14), the bottom of buffer spring (2) is provided with fixed block (13).

2. The circuit board test rack with the buffer structure according to claim 1, wherein: the top of buffer spring (2) inside is provided with inserted bar (12), the bottom of buffer spring (2) inside is provided with fixed block (13), the bottom of buffer spring (2) inside is provided with down hollow post (16), go up inserted bar (12) and hollow post (16) size phase-match down.

3. The circuit board test rack with the buffer structure as claimed in claim 1, wherein: the inside of curb plate (6) is provided with spout (3), the inside of spout (3) is provided with rack (19), the top meshing of rack (19) is connected with gear (15), sliding sleeve (4) have been cup jointed in the inside activity of gear (15).

4. The circuit board test rack with the buffer structure as claimed in claim 3, wherein: push rod (5) have been inlayed to the inside of sliding sleeve (4), be provided with four groups around sliding sleeve (4) inner wall and prevent changeing lug (18), push rod (5) outer wall is provided with four groups all around and prevents changeing recess (17), prevent changeing lug (18) and prevent changeing recess (17) gomphosis matching.

5. The circuit board test rack with the buffer structure as claimed in claim 4, wherein: the end face of the push rod (5) is fixedly connected with a corner protector (10), the corner protector (10) is L-shaped, and the corner protector (10) is made of rubber.

6. The circuit board test rack with the buffer structure as claimed in claim 1, wherein: the test circuit board (8) is arranged at the top end of the buffer board (9), and the buffer board (9) is made of insulating PVC materials.