CN217034016U - Chip testing seat - Google Patents

Chip testing seat Download PDF

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Publication number
CN217034016U
CN217034016U CN202122383969.XU CN202122383969U CN217034016U CN 217034016 U CN217034016 U CN 217034016U CN 202122383969 U CN202122383969 U CN 202122383969U CN 217034016 U CN217034016 U CN 217034016U
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Prior art keywords
groove
chip
testing
disposed
elastic member
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CN202122383969.XU
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Chinese (zh)
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张彤
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Jiangsu Jiecechuang Electronic Technology Co ltd
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Jiangsu Jiecechuang Electronic Technology Co ltd
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Abstract

The utility model belongs to the technical field of semiconductor testing, and discloses a chip testing seat which comprises a testing mechanism and a testing base, wherein the testing mechanism comprises an elastic component and a spring piece arranged on the elastic component, the testing base is provided with a positioning groove arranged along a first direction and a mounting groove communicated with the positioning groove, the testing mechanism is mounted in the mounting groove, and a chip can penetrate through the positioning groove so that a pin of the chip can abut against the spring piece. When the chip testing seat provided by the utility model is used for testing a chip, pressure is applied to the chip along the first direction, the conduction of the chip pins and the spring piece is ensured, the elastic assembly is forced to accumulate elastic force, and when the pressure applied to the chip is relieved, the elastic assembly releases the accumulated elastic force and ejects the testing chip out of the positioning groove.

Description

Chip test seat
Technical Field
The utility model relates to the technical field of semiconductor testing, in particular to a chip testing seat.
Background
The chip typically includes a body and a plurality of pins attached to the body, each of which is soldered to a circuit on the circuit board when assembled to the circuit board. In order to ensure that the chip can be used normally, it is necessary to test the performance of the chip during the assembly process of the chip.
In the prior art, usually test the chip performance through testing arrangement, during the test, need press the chip in testing arrangement's chip test seat, the chip is when pressing to chip test seat, in order to make the chip pin align with the electric conductor of chip test seat, can be equipped with a constant head tank on the chip test seat usually and make the pin on the chip just to the electric conductor, because of there is not the clearance between constant head tank and the chip almost, after the test is accomplished, hardly take out the chip.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a chip testing seat, which is convenient for taking out a chip after the test of the chip is finished.
In order to achieve the purpose, the utility model adopts the following technical scheme:
a chip test socket, comprising:
the testing mechanism comprises an elastic component and a spring piece arranged on the elastic component;
the testing mechanism is arranged in the mounting groove, and the chip can penetrate through the positioning groove so that the pin of the chip abuts against the spring piece;
when the chip is pressed along the first direction, the pin is abutted against the spring piece and presses the spring piece, the elastic component is forced to accumulate elastic force, and when the pressure applied to the chip is relieved, the elastic component releases the accumulated elastic force and ejects the chip out of the positioning groove.
Optionally, the elastic assembly comprises:
the first elastic piece is arranged in the mounting groove, the spring piece is arranged on the first elastic piece, and the spring piece forms a lever structure by taking the first elastic piece as a fulcrum;
the floating ring is movably arranged in the mounting groove and can move along a first direction, a first end of the spring piece is connected with the floating ring, and a second end of the spring piece can abut against the pin;
and the second elastic piece is arranged between the floating ring and the test base.
Optionally, the test base includes an upper base and a lower base connected to the upper base, and the upper base is provided with a positioning groove.
Optionally, one side of the floating ring is provided with a first groove, the second elastic member is installed in the first groove, the other side of the floating ring is provided with a first protrusion, and the first protrusion penetrates through the lower base and is connected with the spring piece.
Optionally, the first end of the spring plate is provided with a second groove, and the first protrusion is arranged in the second groove.
Optionally, the mounting groove includes that the first appearance groove that sets up in the upper base holds the groove and sets up in the second appearance groove of lower base, and first appearance groove holds the groove intercommunication setting with the second, and the floating ring is installed one side of second elastic component and is arranged in first appearance inslot, and the second elastic component supports and leans on in the first tank bottom of holding the groove, and first arch is worn to establish the second and is held the groove and be connected with the spring leaf, and first appearance groove and second hold the groove and all communicate with the constant head tank.
Optionally, the mounting groove further comprises a third accommodating groove arranged on the lower base, the spring piece is arranged in the third accommodating groove, and the third accommodating groove, the positioning groove and the second accommodating groove are communicated with each other.
Optionally, the mounting groove further includes a fourth accommodating groove communicated with the third accommodating groove, the fourth accommodating groove is disposed on one side of the lower base, which faces away from the upper base, and the first elastic member is disposed in the fourth accommodating groove.
Optionally, the first elastic member is cylindrical, a third groove is formed in the middle of the spring piece, the first elastic member is arranged in the third groove, and the spring piece can rotate around the first elastic member.
Optionally, a second protrusion connected to the pin of the chip in a matching manner is disposed at the second end of the spring plate, and the second protrusion extends to the inner side of the positioning groove.
The utility model has the beneficial effects that:
according to the chip testing seat provided by the utility model, the chip penetrates through the positioning groove so that the pins of the chip are abutted against the spring piece, when the chip is tested, pressure is applied to the chip along the first direction to ensure that the pins of the chip are conducted with the spring piece, the elastic assembly is forced to accumulate elastic force, when the pressure applied to the chip is relieved, the elastic assembly releases the accumulated elastic force and ejects the testing chip out of the positioning groove, the chip is conveniently taken out after the test is finished, and the operation is simple.
Drawings
FIG. 1 is a cross-sectional view of a chip test socket provided in the present invention;
FIG. 2 is a schematic diagram of a chip test socket according to the present invention;
FIG. 3 is a schematic view of a testing mechanism provided by the present invention;
FIG. 4 is a cross-sectional view of a floating ring provided by the present invention;
FIG. 5 is an enlarged schematic view of the utility model at A in FIG. 1;
FIG. 6 is a schematic view of a mounting groove structure provided by the present invention;
FIG. 7 is a schematic view of the spring plate structure provided by the present invention.
In the figure:
100. an elastic component; 110. a first elastic member; 120. a floating ring; 121. a first groove; 122. a first protrusion; 130. a second elastic member; 140. a spring plate; 141. a second groove; 142. a third groove; 143. a second protrusion;
200. a test base; 210. an upper base; 211. positioning a groove; 212. a first vessel; 220. a lower base; 221. a second vessel; 222. a third containing groove; 223. a fourth accommodating groove; 230. mounting grooves;
300. and (3) a chip.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the utility model and are not to be construed as limiting the utility model. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
In the description of the present invention, unless otherwise explicitly specified or limited, the terms "connected," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integral to one another; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or may be connected through the use of two elements or the interaction of two elements. The specific meanings of the above terms in the present invention can be understood in a specific case to those of ordinary skill in the art.
In the present invention, unless expressly stated or limited otherwise, the recitation of a first feature "on" or "under" a second feature may include the recitation of the first and second features being in direct contact, and may also include the recitation that the first and second features are not in direct contact, but are in contact via another feature between them. Also, the first feature "on," "above" and "over" the second feature may include the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is at a higher level than the second feature. "beneath," "under" and "beneath" a first feature includes the first feature being directly beneath and obliquely beneath the second feature, or simply indicating that the first feature is at a lesser elevation than the second feature.
In the description of the present embodiment, the terms "upper", "lower", "right", etc. are used in an orientation or positional relationship based on that shown in the drawings only for convenience of description and simplicity of operation, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used only for descriptive purposes and are not intended to be limiting.
Referring to fig. 1 to 2, the present embodiment provides a chip testing socket, which includes a testing mechanism and a testing base 200, wherein the testing mechanism includes an elastic component 100 and a spring plate 140 disposed on the elastic component 100, the testing base 200 is provided with a positioning slot 211 disposed along a first direction and a mounting slot 230 communicated with the positioning slot 211, the testing mechanism is mounted in the mounting slot 230, and a chip 300 can be inserted into the positioning slot 211 so that a pin of the chip 300 abuts against the spring plate 140. When the chip 300 is pressed in the first direction, the pins abut on the spring strips 140 and press the spring strips 140, the elastic member 100 is forced to accumulate elastic force, and when the pressure applied to the chip 300 is released, the elastic member 100 releases the accumulated elastic force and ejects the chip 300 out of the positioning groove 211.
The chip 300 is disposed through the positioning groove 211 to make the pins of the chip 300 abut against the spring plate 140, when the chip 300 is tested, the chip 300 is pressed along the first direction, so as to ensure the conduction between the pins of the chip 300 and the spring plate 140, and the elastic component 100 is forced to accumulate elastic force, when the pressure applied to the chip 300 is relieved, the elastic component 100 releases the accumulated elastic force and ejects the tested chip 300 out of the positioning groove 211, after the test is completed, the chip 300 is conveniently taken out, and the operation is simple.
Further, the first direction is a vertical direction of the test base 200.
The chip testing seat is installed on a testing device for testing a chip 300, furthermore, the spring pieces 140 are provided in a plurality, the spring pieces 140 are in one-to-one correspondence with a plurality of pins of the chip 300, the spring pieces 140 are used for electrically connecting the testing device, and the chip 300 is conducted with the testing device through the spring pieces 140.
Further, the test base 200 includes an upper base 210 and a lower base 220 connected to the upper base 210, and the upper base 210 is provided with a positioning groove 211. Specifically, the upper base 210 and the lower base 220 may be connected by screws. In the present embodiment, the test base 200 is separated into the upper base 210 and the lower base 220, so as to facilitate the detachment and installation of the elastic assembly 100.
In this embodiment, referring to fig. 3, the elastic assembly 100 includes a first elastic member 110, a floating ring 120 and a second elastic member 130, the first elastic member 110 is installed in the installation groove 230, the spring plate 140 is disposed on the first elastic member 110, and the spring plate 140 forms a lever structure with the first elastic member 110 as a fulcrum; the floating ring 120 is movably arranged in the mounting groove 230, the floating ring 120 can move along a first direction, a first end of the spring piece 140 is connected with the floating ring 120, and a second end of the spring piece 140 can abut against the pin; the second elastic member 130 is disposed between the floating ring 120 and the test base 200. In this embodiment, when the chip 300 is pressed in the first direction, the spring 140 moves and compresses the first elastic member 110 and simultaneously rotates around the first elastic member 110 as a pivot, so as to drive the floating ring 120 to move, the floating ring 120 compresses the second elastic member 130, when the pressure applied to the chip 300 is released, the spring 140 moves in the opposite direction under the elastic driving of the first elastic member 110, the floating ring 120 moves in the opposite direction under the elastic driving of the second elastic member 130, so as to drive the spring 140 to rotate in the opposite direction, and the chip 300 pops up the positioning groove 211 under the dual elastic driving of the first elastic member 110 and the second elastic member 130. Further, the spring plate 140 and the first elastic member 110 are disposed in the lower base 220, the floating ring 120 and the second elastic member 130 are disposed in the upper base 210, and the floating ring 120 is disposed around the positioning groove 211.
Further, referring to fig. 4, one side of the floating ring 120 is provided with a first groove 121, the second elastic member 130 is installed in the first groove 121, the other side of the floating ring 120 is provided with a first protrusion 122, and the first protrusion 122 penetrates through the lower base 220 and is connected with the spring plate 140.
Specifically, the floating ring 120 is provided with a plurality of first protrusions 122 along the circumferential direction, each first protrusion 122 is connected with a plurality of spring pieces 140, and the plurality of spring pieces 140 are arranged at intervals along the circumferential direction of the floating ring 120. Preferably, the floating ring 120 is a square ring, each side of the floating ring 120 is provided with a first protrusion 122, the first protrusion 122 extends along both ends of each side of the floating ring 120, and each first protrusion 122 is connected with 2 spring leaves 140.
Specifically, the floating ring 120 is provided with a plurality of first grooves 121 along the circumferential direction, and the plurality of first grooves 121 and the plurality of second elastic members 130 are arranged in a one-to-one correspondence. Further, the first grooves 121 and the first protrusions 122 are disposed on both sides of the floating ring 120 in a one-to-one correspondence. Preferably, the second elastic member 130 has a cylindrical shape. Further, each side of the floating ring 120 is provided with a first groove 121, the first grooves 121 extend along two ends of each side of the floating ring 120, and a second elastic member 130 is disposed in each first groove 121. Further, the second elastic element 130 may also have other shapes, which are not described in detail herein.
In the present embodiment, referring to fig. 5 to 6, the mounting groove 230 includes a first accommodating groove 212 disposed on the upper base 210 and a second accommodating groove 221 disposed on the lower base 220, the first accommodating groove 212 and the second accommodating groove 221 are communicated, one side of the floating ring 120 where the second elastic member 130 is mounted is disposed in the first accommodating groove 212, the second elastic member 130 abuts against the bottom of the first accommodating groove 212, the first protrusion 122 penetrates the second accommodating groove 221 and is connected to the spring plate 140, and the first accommodating groove 212 and the second accommodating groove 221 are both communicated with the positioning groove 211. Further, the first accommodating groove 212 and the second accommodating groove 221 are both arranged along the first direction, and the floating ring 120 is slidably arranged in a cavity body communicated with the first accommodating groove 212 and the second accommodating groove 221. In this embodiment, the floating ring 120 can slide along the cavity body communicating the first and second grooves 212 and 221, compressing the second elastic member 130.
Further, the mounting groove 230 further includes a third receiving groove 222 disposed on the lower base 220, the spring plate 140 is disposed in the third receiving groove 222, and the third receiving groove 222, the positioning groove 211 and the second receiving groove 221 are communicated with each other. Specifically, the third receiving slot 222 is a through slot, and an edge of the spring plate 140 facing the lower base 220 and facing away from the upper base 210 can be electrically connected to the testing device of the testing chip 300.
Further, the mounting groove 230 further includes a fourth accommodating groove 223 communicated with the third accommodating groove 222, the fourth accommodating groove 223 is disposed on one side of the lower base 220 back to the upper base 210, and the first elastic element 110 is disposed in the fourth accommodating groove 223. Specifically, the first elastic member 110 is cylindrical in shape, the profile of the fourth pocket 223 is matched with the profile of the first elastic member 110, and the width of the notch of the fourth pocket 223 is smaller than the diameter of the first elastic member 110. In the embodiment, the first elastic member 110 can be jammed into the fourth groove 223 from the notch of the fourth groove 223 and can be stably placed in the fourth groove 223, and the pressure given to the first elastic member 110 by the spring plate 140 is not enough to disengage the first elastic member 110 from the notch of the fourth groove 223.
Further, referring to fig. 7, the first end of the spring plate 140 is provided with a second groove 141, the first protrusion 122 is disposed in the second groove 141, the second end of the spring plate 140 is provided with a second protrusion 143 which is connected with the pins of the chip 300 in a matching manner, and the second protrusion 143 extends to the inside of the positioning groove 211. Further, a third groove 142 is disposed in the middle of the spring plate 140, the first elastic element 110 is disposed in the third groove 142, the spring plate 140 can rotate around the first elastic element 110, the second protrusion 143 and the second groove 141 are disposed on the same side of the spring plate 140, the third groove 142 is disposed on the other side of the spring plate 140, and the spring plate 140 forms a lever structure with the first elastic element 110 as a fulcrum.
Illustratively, the positioning groove 211 enables the leads on the chip 300 to be precisely attached to the second protrusions 143 of the spring plate 140 in a one-to-one correspondence manner, when the leads on the chip 300 are attached to the second protrusions 143 in a one-to-one correspondence manner, and the chip 300 is pressed in the first direction, the second protrusions 143 pierce the oxide layer on the surfaces of the leads on the chip 300, so as to effectively prevent the oxide layer on the surfaces of the leads from interfering with the test, the second protrusions 143 are forced to move in the first direction, and the spring plate 140 compresses the first elastic member 110, through the lever principle, the spring plate 140 rotates around the first elastic member 110, so that the first groove 121 moves in a direction opposite to the movement of the second protrusions 143, and drives the floating ring 120 to move towards the bottom of the first accommodating groove 212, so that the floating ring 120 compresses the second elastic member 130, when the pressure applied to the chip 300 is released, the spring plate 140 moves in a reverse direction under the elastic force of the first elastic member 110, and the floating ring 120 moves in a reverse direction under the elastic force of the second elastic member 130 and drives the spring plate 140 to move in a reverse direction around the first elastic member 110 When the chip 300 is rotated, the chip is ejected out of the positioning groove 211 by the elasticity of the first elastic member 110 and the second elastic member 130.
It should be understood that the above-described embodiments of the present invention are merely examples for clearly illustrating the present invention and are not intended to limit the embodiments of the present invention. Numerous obvious variations, adaptations, and substitutions will occur to those skilled in the art without departing from the scope of the present invention. This need not be, nor should it be exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.

Claims (10)

1. A chip test socket, comprising:
the testing mechanism comprises an elastic component (100) and a spring piece (140) arranged on the elastic component (100);
the testing device comprises a testing base (200), wherein the testing base (200) is provided with a positioning groove (211) arranged along a first direction and a mounting groove (230) communicated with the positioning groove (211), the testing mechanism is mounted in the mounting groove (230), and a chip (300) can penetrate through the positioning groove (211) so that pins of the chip (300) can abut against the spring piece (140);
when the chip (300) is pressed in the first direction, the pins abut against the spring pieces (140) and press the spring pieces (140), the elastic member (100) is forced to accumulate elastic force, and when the pressure applied to the chip (300) is released, the elastic member (100) releases the accumulated elastic force and ejects the chip (300) out of the positioning groove (211).
2. The socket of claim 1, wherein the resilient member (100) comprises:
the first elastic piece (110) is installed in the installation groove (230), the spring piece (140) is arranged on the first elastic piece (110), and the spring piece (140) forms a lever structure by taking the first elastic piece (110) as a fulcrum;
the floating ring (120) is movably arranged in the mounting groove (230), the floating ring (120) can move along the first direction, the first end of the spring piece (140) is connected with the floating ring (120), and the second end of the spring piece (140) can abut against the pin;
a second elastic member (130) disposed between the floating ring (120) and the test base (200).
3. The socket according to claim 2, wherein the testing base (200) comprises an upper base (210) and a lower base (220) connected to the upper base (210), and the positioning groove (211) is disposed on the upper base (210).
4. The chip testing socket according to claim 3, wherein a first groove (121) is formed on one side of the floating ring (120), the second elastic member (130) is installed in the first groove (121), a first protrusion (122) is formed on the other side of the floating ring (120), and the first protrusion (122) penetrates through the lower base (220) and is connected with the spring plate (140).
5. The socket of claim 4, wherein the first end of the spring plate (140) is provided with a second groove (141), and the first protrusion (122) is disposed in the second groove (141).
6. The chip testing seat according to claim 4, wherein the mounting groove (230) comprises a first accommodating groove (212) disposed on the upper base (210) and a second accommodating groove (221) disposed on the lower base (220), the first accommodating groove (212) and the second accommodating groove (221) are arranged in a communicating manner, one side of the floating ring (120) on which the second elastic member (130) is mounted is disposed in the first accommodating groove (212), the second elastic member (130) abuts against the bottom of the first accommodating groove (212), the first protrusion (122) penetrates through the second accommodating groove (221) to be connected with the spring plate (140), and both the first accommodating groove (212) and the second accommodating groove (221) are communicated with the positioning groove (211).
7. The socket according to claim 6, wherein the mounting groove (230) further comprises a third receiving groove (222) disposed on the lower base (220), the spring plate (140) is disposed in the third receiving groove (222), and the third receiving groove (222), the positioning groove (211), and the second receiving groove (221) are communicated with each other.
8. The socket according to claim 7, wherein the mounting groove (230) further comprises a fourth receiving groove (223) communicated with the third receiving groove (222), the fourth receiving groove (223) is disposed on a side of the lower base (220) facing away from the upper base (210), and the first resilient member (110) is disposed in the fourth receiving groove (223).
9. The socket according to claim 2, wherein the first elastic member (110) is cylindrical, a third groove (142) is formed in the middle of the spring plate (140), the first elastic member (110) is disposed in the third groove (142), and the spring plate (140) is rotatable around the first elastic member (110).
10. The socket of claim 2, wherein the second end of the spring plate (140) is provided with a second protrusion (143) for mating with the pin of the chip (300), and the second protrusion (143) extends to the inside of the positioning groove (211).
CN202122383969.XU 2021-09-29 2021-09-29 Chip testing seat Active CN217034016U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202122383969.XU CN217034016U (en) 2021-09-29 2021-09-29 Chip testing seat

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202122383969.XU CN217034016U (en) 2021-09-29 2021-09-29 Chip testing seat

Publications (1)

Publication Number Publication Date
CN217034016U true CN217034016U (en) 2022-07-22

Family

ID=82411477

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202122383969.XU Active CN217034016U (en) 2021-09-29 2021-09-29 Chip testing seat

Country Status (1)

Country Link
CN (1) CN217034016U (en)

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