CN216979263U - Lamp aging testing device and lamp aging equipment - Google Patents
Lamp aging testing device and lamp aging equipment Download PDFInfo
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- CN216979263U CN216979263U CN202123200893.9U CN202123200893U CN216979263U CN 216979263 U CN216979263 U CN 216979263U CN 202123200893 U CN202123200893 U CN 202123200893U CN 216979263 U CN216979263 U CN 216979263U
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Abstract
The application provides a lamp aging testing device and lamp aging equipment. The lamp aging test device comprises a layered plate and an aging test assembly; the layered plate is provided with a first power supply contact position; the aging test assembly comprises a supporting plate and a lamp socket, the supporting plate is arranged on the layered plate in a sliding mode, the lamp socket is connected with the supporting plate, the lamp socket is provided with a second power supply contact position connected with a power line of each lamp to be tested, and the second power supply contact position is arranged corresponding to the first power supply contact position so as to adjust the current on-off of each lamp to be tested and an external power supply. When unqualified lamps and lanterns appear, only need the backup pad that the push-and-pull is located the layering board for the backup pad takes place the displacement for the layering board, thereby makes the second power contact position on the lamps and lanterns socket and the first power contact position on the layering board break away from the contact, and then makes each lamps and lanterns that await measuring cut off the power supply, is convenient for dismantle unqualified lamps and lanterns from the backup pad fast, has improved the efficiency to the ageing detection of lamps and lanterns.
Description
Technical Field
The utility model relates to the technical field of lighting lamps, in particular to a lamp aging test device and lamp aging equipment.
Background
At present, in the field of LED lamp manufacturing, more and more attention is paid to an aging test of an LED lamp, and defective products in LED lamps can be picked out in batches through the aging test, so that the defective products are prevented from flowing into the market. In a traditional aging table or an aging box, a lamp is usually placed in the aging table or the aging box to be electrified, then the electrified voltage is changed, the aging condition of the lamp in the actual use process is detected, the aging condition of the lamp is simulated to the greatest extent, and the factory yield of the lamp can be effectively ensured.
However, when the traditional aging equipment detects lamps in batch, once unqualified lamps are available, all power-off is needed to ensure that electric shock is avoided when the unqualified lamps are removed, normal aging detection of other lamps is easily affected, and the aging detection efficiency of lamps in batch is low.
SUMMERY OF THE UTILITY MODEL
The utility model aims to overcome the defects in the prior art and provides a lamp aging testing device and lamp aging equipment for improving the lamp aging detection efficiency.
The purpose of the utility model is realized by the following technical scheme:
a lamp burn-in testing apparatus comprising: a laminate and an aging test assembly; the layered plate is used for being connected with the lamp aging cabinet, and is provided with a first power supply contact position which is used for being connected with an external power supply; the aging test assembly comprises a supporting plate and a lamp socket, the supporting plate is arranged on the layered plate in a sliding mode, the supporting plate is used for placing a plurality of lamps to be tested, the lamp socket is connected with the supporting plate and used for connecting power lines of the lamps to be tested, the lamp socket is provided with second power supply contact positions connected with the power lines of the lamps to be tested, the second power supply contact positions are arranged corresponding to the first power supply contact positions so as to adjust the current on-off of the lamps to be tested and the external power supply.
In one embodiment, the layered board includes board bodies and a first conductive member, the board bodies are connected to the lamp aging cabinet, a portion of the first conductive member is located on a side of the board bodies close to the supporting board, the first conductive member is configured to abut against the second power contact, and the first conductive member is further connected to an external power source.
In one embodiment, the board body is provided with a first through hole, and the first conductive member is disposed through the first through hole, so that the first conductive member and the second power contact are electrically conducted.
In one embodiment, the first conductive member includes a mounting portion, a rotating shaft, and a conductive roller, the mounting portion is respectively connected to the supporting plate and the rotating shaft, the conductive roller is rotatably connected to the rotating shaft, the conductive roller is abutted to the second power contact, and the conductive roller is further connected to the external power supply.
In one embodiment, the first conductive member further includes a conductive limiting portion connected to the mounting portion, the conductive limiting portion is located on a side of the conductive roller away from the support plate, the conductive limiting portion is electrically connected to the external power source, the conductive limiting portion is provided with an accommodating groove, and a portion of the conductive roller is accommodated in the accommodating groove, so that the conductive roller is electrically conducted to the conductive limiting portion when the conductive roller contacts the second power source contact portion.
In one embodiment, the first conductive member further includes a buffer spring, the buffer spring is located on a side of the conductive limiting portion away from the conductive roller, and the buffer spring is connected to the mounting portion and the conductive limiting portion respectively.
In one embodiment, the lamp socket includes a bottom case, a second conductive member, and a plurality of lamp clips, where the plurality of lamp clips are all connected to the bottom case, each lamp clip is used to connect to a power line of a lamp to be tested, the bottom case is used to accommodate a connecting wire connected to each lamp clip, the bottom case is connected to the supporting plate, the bottom case is provided with a second through hole communicated with the inside of the bottom case, the supporting plate is provided with a third through hole corresponding to the second through hole, the second conductive member is sequentially inserted into the second through hole and the third through hole, the second conductive member is connected to the connecting wire in each bottom case, and the second conductive member is used to abut against the first power contact position.
In one embodiment, the lamp aging test device further includes a limiting plate, the limiting plate is connected to the layered plate, and the limiting plate abuts against the supporting plate so as to align the first power contact position with the second power contact position during detection.
In one embodiment, the supporting plate is provided with a plurality of fourth through holes, and the fourth through holes are uniformly distributed on the supporting plate.
A lamp aging device comprises a lamp aging cabinet and at least one lamp aging test device in any one of the embodiments, wherein the lamp aging cabinet is provided with a shelf test space, each lamp aging test device is contained in the shelf test space, and a layered plate of each lamp aging test device is connected with the inner wall of the shelf test space.
Compared with the prior art, the utility model has at least the following advantages:
when unqualified lamps and lanterns appear, only need the backup pad that the push-and-pull is located the layering board for the backup pad takes place the displacement for the layering board, thereby makes the second power contact position on the lamps and lanterns socket and the first power contact position on the layering board break away from the contact, and then makes each lamps and lanterns that await measuring cut off the power supply, is convenient for dismantle unqualified lamps and lanterns from the backup pad fast, has improved the efficiency to the ageing detection of lamps and lanterns.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a diagram illustrating an apparatus for testing lamp aging according to an embodiment;
FIG. 2 is a cross-sectional view of the lamp degradation testing apparatus of FIG. 1 taken along the direction A-A;
FIG. 3 is an enlarged schematic view at A1 of the cross-sectional view of FIG. 2;
FIG. 4 is an exploded view of the lamp burn-in test apparatus shown in FIG. 1;
fig. 5 is a schematic diagram of a lamp aging apparatus in an embodiment.
Detailed Description
To facilitate an understanding of the utility model, the utility model will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the utility model is for the purpose of describing particular embodiments only and is not intended to be limiting of the utility model. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
The utility model relates to a lamp aging test device. In one embodiment, the lamp aging test device comprises a layered board and an aging test component. The layered plate is used for being connected with the lamp aging cabinet and is provided with a first power supply contact position. The first power supply contact position is used for being connected with an external power supply. The aging test assembly comprises a support plate and a lamp socket. The supporting plate is arranged on the layered plate in a sliding mode and used for placing a plurality of lamps to be tested. The lamp socket is connected with the supporting plate and used for connecting power lines of a plurality of lamps to be tested, and the lamp socket is provided with a second power supply contact position connected with the power lines of the lamps to be tested. The second power supply contact position is arranged corresponding to the first power supply contact position so as to adjust the current on-off of each lamp to be tested and the external power supply. When unqualified lamps and lanterns appear, only need the backup pad that the push-and-pull is located the layering board for the backup pad takes place the displacement for the layering board, thereby makes the second power contact position on the lamps and lanterns socket and the first power contact position on the layering board break away from the contact, and then makes each lamps and lanterns that await measuring cut off the power supply, is convenient for dismantle unqualified lamps and lanterns from the backup pad fast, has improved the efficiency to the ageing detection of lamps and lanterns.
Please refer to fig. 1, which is a schematic structural diagram of a lamp aging testing apparatus according to an embodiment of the present invention.
The lamp burn-in apparatus 10 of an embodiment includes a layered board 100 and a burn-in test assembly 200. The layered plate 100 is used for being connected with a lamp aging cabinet. Referring to fig. 2 and 3, the laminate 100 has a first power contact 102. The first power contact 102 is used for connecting with an external power source. The burn-in test assembly 200 includes a support plate 210 and a lamp socket 220. The supporting plate 210 is slidably disposed on the layered plate 100, and the supporting plate 210 is used for placing a plurality of lamps to be tested. The lamp socket 220 is connected to the supporting plate 210, the lamp socket 220 is used for connecting power lines of a plurality of lamps to be tested, and the lamp socket 220 has a second power contact position 202 connected to the power line of each lamp to be tested. The second power source contact position 202 is arranged corresponding to the first power source contact to adjust the current on-off of each lamp to be tested and the external power source.
In this embodiment, when an unqualified lamp occurs, only the supporting plate 210 on the layered plate 100 needs to be pushed and pulled, so that the supporting plate 210 is displaced relative to the layered plate 100, and the second power contact position 202 on the lamp socket 220 is separated from the first power contact position 102 on the layered plate 100, so that each lamp to be tested is powered off, the unqualified lamp can be rapidly detached from the supporting plate 210, and the efficiency of lamp aging detection is improved. Wherein the first power contact 102 is electrically connected to the second power contact 202.
In one embodiment, referring to fig. 3, the layered board 100 includes a board body 110 and a first conductive member 120, the board body 110 is connected to the lamp aging cabinet, a portion of the first conductive member 120 is located on a side of the board body 110 close to the supporting plate 210, the first conductive member 120 is configured to abut against the second power contact 202, and the first conductive member 120 is further connected to an external power source. In this embodiment, the board 110 serves as the entire bottom board of the lamp aging testing apparatus, and supports all other components of the lamp aging testing apparatus. The first conductive member 120 serves as a first power contact 102 on the layered board 100, one end of the first conductive member 120 is connected to an output line of an external power source, the other end of the first conductive member 120 corresponds to the second power contact 202, and the first conductive member 120 serves as a conductive connection portion for electrically connecting a lamp to be tested and the external power source. Thus, when an unqualified lamp needs to be disassembled, the supporting plate 210 is pushed to make the second power supply contact position 202 misplaced with the first conductive member 120, that is, the second power supply contact position 202 is separated from the first conductive member 120, so that each lamp to be tested is powered off, and the unqualified lamp on the supporting plate 210 is convenient to disassemble.
Further, referring to fig. 3 and fig. 4, the board body 110 is provided with a first through hole 112, and the first conductive member 120 is disposed through the first through hole 112, so that the first conductive member 120 and the second power contact 202 are electrically connected. In this embodiment, the first through hole 112 penetrates through the board body 110, and a portion of the first conductive member 120 is located in the first through hole 112, so that the first conductive member 120 penetrates through the first through hole 112, and a portion of the first conductive member 120 is located outside the first through hole 112, for example, the portion of the first conductive member 120 is located outside the first through hole 112 and close to the supporting plate 210. In this way, the output line of the external power source may be connected to the first conductive member 120 from the side of the layered plate 100 away from the supporting plate 210, so that the output line of the external power source is located below the layered plate 100, and the contact between the output line of the external power source and the supporting plate 210 is avoided, thereby avoiding the damage of the output line of the external power source caused by friction between the supporting plate 210 and the layered plate 100.
Still further, referring to fig. 3, the first conductive member 120 includes a mounting portion 122, a rotating shaft 124 and a conductive roller 126, the mounting portion 122 is respectively connected to the supporting plate 210 and the rotating shaft 124, the conductive roller 126 is rotatably connected to the rotating shaft 124, the conductive roller 126 is abutted to the second power contact position 202, and the conductive roller 126 is further connected to the external power. In this embodiment, the mounting portion 122 is used as a fixing mounting portion 122 of the first conductive member 120, and the mounting portion 122 is used for mounting the rotating shaft 124 and the conductive roller 126 on the layered board 100. The rotating shaft 124 is fixedly connected to the mounting portion 122, and the conductive roller 126 is rotatably connected to the rotating shaft 124, so that the conductive roller 126 rotates around the rotating shaft 124. The conductive roller 126 serves as a conductive portion between the external power source and the second power source contact position 202, and the conductive roller 126 is used for guiding current on the external power source to the second power source contact position 202 so as to conduct each lamp to be tested. The conductive roller 126 is disposed in the first through hole 112 in a penetrating manner, for example, a portion of the conductive roller 126 is located outside the first through hole 112 and is disposed toward the supporting plate 210, so that the conductive roller 126 is connected to the supporting plate 210 in a rolling manner, and the supporting plate 210 slides on the layered plate 100, thereby reducing rolling friction between the supporting plate 210 and the layered plate 100, effectively protecting the supporting plate 210, and reducing the damage probability of the supporting plate 210. In another embodiment, the metal roller of the conductive roller 126, that is, the conductive roller 126 is made of metal and serves as a conducting wire between the external power supply and the second power supply contact position 202, so as to conveniently power on or off each lamp to be tested.
Further, referring to fig. 3, the first conductive member 120 further includes a conductive limiting portion 128 connected to the mounting portion 122, the conductive limiting portion 128 is located on a side of the conductive roller 126 away from the supporting plate 210, the conductive limiting portion 128 is electrically connected to the external power source, the conductive limiting portion 128 is provided with a receiving groove 1282, and a portion of the conductive roller 126 is received in the receiving groove 1282, so that when the conductive roller 126 contacts the second power source contact portion 202, the conductive roller 126 and the conductive limiting portion 128 are electrically connected. In this embodiment, one end of the conductive limiting portion 128 is connected to the mounting portion 122, and the other end of the conductive limiting portion 128 is used for abutting against the conductive roller 126, so that when the supporting plate 210 rolls on the conductive roller 126, the conductive roller 126 distributes part of the gravity of the supporting plate 210 to the layered plate 100 through the conductive limiting portion 128, thereby reducing the extrusion force applied to the conductive roller 126. The opening of the receiving slot 1282 faces the supporting plate 210, so that when the conductive roller 126 contacts the second power contact 202, a portion of the conductive roller 126 is limited in the receiving slot 1282, displacement and deviation of the conductive roller 126 under the pushing of the second power contact 202 are reduced, and the position of the conductive roller 126 on the layered plate 100 is fixed after each pushing and pulling of the supporting plate 210, so that the position of the first power contact 102 on the layered plate 100 is fixed, and further, the second power contact 202 is accurately contacted with the first power contact 102 each time the supporting plate 210 is pushed.
Still further, referring to fig. 3, the first conductive member 120 further includes a buffer spring 121, the buffer spring 121 is located on a side of the conductive limiting portion 128 away from the conductive roller 126, and the buffer spring 121 is connected to the mounting portion 122 and the conductive limiting portion 128 respectively. In this embodiment, the conductive roller 126 is configured to abut against the supporting plate 210, that is, the supporting plate 210 rolls on the conductive roller 126, so that the conductive roller 126 bears partial gravity extrusion of the supporting plate 210, the buffer spring 121 is located between the mounting portion 122 and the conductive limiting portion 128, and provides a reverse buffer elastic force for the conductive limiting portion 128, thereby avoiding the situation that the conductive roller 126 is deformed and damaged due to too large extrusion force, and effectively protecting the conductive roller 126.
In one embodiment, referring to fig. 3, the lamp socket 220 includes a bottom case 222, a second conductive member 224, and a plurality of lamp clips 226, the plurality of lamp clips 226 are connected to the bottom case 222, each lamp clip 226 is used for connecting to a power line of a lamp to be tested, the bottom case 222 has an interior for receiving connecting wires connected to the lamp clips 226, the bottom case 222 is connected to the supporting plate 210, the bottom case 222 is provided with a second through hole 2222 communicated with the inside thereof, the supporting plate 210 is provided with a third through hole 212 corresponding to the second through hole 2222, the second conductive member 224 is sequentially inserted into the second through hole 2222 and the third through hole 212, the second conductive member 224 is connected to a connecting wire in each of the bottom cases 222, and the second conductive member 224 is adapted to abut against the first power source contact 102. In this embodiment, the lamp clips 226 correspond to lamps to be tested one to one, each lamp clip 226 is configured to clamp a power line of one lamp to be tested, the lamp clip 226 is further connected to the second conductive member 224 through a connecting wire in the bottom case 222, so that each lamp to be tested is electrically connected to the second conductive member 224, and each lamp to be tested is conveniently turned on when the second conductive member 224 contacts the first power contact position 102, where the second conductive member 224 serves as the second power contact position 202. The second through hole 2222 is formed in the bottom case 222, the third through hole 212 is formed in the supporting plate 210, and the second through hole 2222 and the third through hole 212 are aligned with each other, so that the second conductive member 224 can simultaneously penetrate through the second through hole 2222 and the third through hole 212, the second conductive member 224 can be simultaneously clamped in the second through hole 2222 and the third through hole 212, and further, a part of the second conductive member 224 can protrude toward the layered plate 100, so that the second conductive member 224 can be in contact with the first power contact position 102, and thus, voltage and current output of each lamp to be tested by an external power supply is realized, and further, an aging test of each lamp to be tested is realized. In another embodiment, the number of the first conductors 120 and the number of the second conductors 224 are two for connecting the neutral line and the live line.
In one embodiment, referring to fig. 1 and fig. 4, the lamp aging test apparatus 10 further includes a limiting plate 300, the limiting plate 300 is connected to the layered plate 100, and the limiting plate 300 abuts against the supporting plate 210, so as to align the first power contact 102 and the second power contact 202 during the test. In this embodiment, the position-limiting plate 300 is located at the edge of the layered plate 100, the position-limiting plate 300 is configured to abut against the supporting plate 210, for example, the position-limiting plate 300 is located in the moving direction of the supporting plate 210, and the position-limiting plate 300 is located at a side away from the push-pull grasping end of the supporting plate 210, that is, the supporting plate 210 has two ends oppositely disposed in the moving direction, one end is configured to be a grasping end during pushing and pulling, and the other end is configured to abut against the position-limiting plate 300, so that the situation that the supporting plate 210 excessively moves, that is, the probability that the supporting plate 210 is separated from the layered plate 100, is effectively avoided.
In one embodiment, referring to fig. 4, the supporting plate 210 is provided with a plurality of fourth through holes 214, and the plurality of fourth through holes 214 are uniformly distributed on the supporting plate 210. In this embodiment, the supporting plate 210 is used to support a plurality of lamps to be tested, and the fourth through hole 214 penetrates through the supporting plate 210. On one hand, due to the arrangement of the fourth through hole 214, an uneven structure appears on the surface of the supporting plate 210, so that the friction force between the supporting plate 210 and the lamp to be tested is effectively increased, and the placing stability of the lamp to be tested on the supporting plate 210 is improved; on the other hand, the fourth through holes 214 are uniformly distributed, for example, the fourth through holes 214 are distributed on the supporting plate 210 in an array manner, so that the supporting plate 210 is a hollow structure, the weight of the supporting plate 210 is effectively reduced, and the supporting plate 210 is conveniently pushed on the layered plate 100. In addition, the fourth through hole 214 increases the heat dissipation area of the supporting plate 210, increases the heat exchange rate of the supporting plate 210, facilitates the rapid guiding of the heat on the lamp to be tested to the surrounding environment, and effectively increases the heat dissipation efficiency of the lamp aging test device.
In one embodiment, please refer to fig. 5, the present application further provides a lamp aging apparatus 20, which includes a lamp aging cabinet 400 and at least one lamp aging test device 10 according to any one of the above embodiments, where the lamp aging cabinet 400 has a shelf test space 402, each lamp aging test device 10 is accommodated in the shelf test space 402, and a layered plate of each lamp aging test device 10 is connected to an inner wall of the shelf test space 402. In this embodiment, the lamp aging test device includes a layered board and an aging test assembly. The layered plate is used for being connected with the lamp aging cabinet and provided with a first power supply contact position. The first power supply contact position is used for being connected with an external power supply. The aging test assembly comprises a support plate and a lamp socket. The supporting plate is arranged on the layered plate in a sliding mode and used for placing a plurality of lamps to be tested. The lamp socket is connected with the supporting plate and used for connecting power lines of a plurality of lamps to be tested, and the lamp socket is provided with a second power supply contact position connected with the power lines of the lamps to be tested. The second power supply contact position is arranged corresponding to the first power supply contact position so as to adjust the current on-off of each lamp to be tested and the external power supply. When unqualified lamps and lanterns appear, only need the backup pad that the push-and-pull is located the layering board for the backup pad takes place the displacement for the layering board, thereby makes the second power contact position on the lamp socket and the first power contact position on the layering board break away from the contact, and then makes each lamps and lanterns that await measuring outage, is convenient for dismantle unqualified lamps and lanterns from the backup pad fast, has improved the efficiency to lamps and lanterns ageing detection.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is specific and detailed, but not to be construed as limiting the scope of the utility model. It should be noted that various changes and modifications can be made by those skilled in the art without departing from the spirit of the utility model, and these changes and modifications are all within the scope of the utility model. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A lamp aging testing device is characterized by comprising:
the laminated board is used for being connected with the lamp aging cabinet and is provided with a first power supply contact position which is used for being connected with an external power supply;
the aging testing assembly comprises a supporting plate and a lamp socket, the supporting plate is arranged on the layered plate in a sliding mode, the supporting plate is used for placing a plurality of lamps to be tested, the lamp socket is connected with the supporting plate and used for connecting power lines of the lamps to be tested, the lamp socket is provided with second power supply contact positions connected with the power lines of the lamps to be tested, the second power supply contact positions are correspondingly arranged in contact with the first power supply to adjust the current on-off of the lamps to be tested and the external power supply.
2. The lamp aging test device of claim 1, wherein the layered board comprises a board body and a first conductive member, the board body is connected to the lamp aging cabinet, a portion of the first conductive member is located on a side of the board body close to the support board, the first conductive member is configured to abut against the second power contact, and the first conductive member is further connected to an external power supply.
3. The lamp aging testing device of claim 2, wherein the board body is provided with a first through hole, and the first conductive member is disposed in the first through hole, so that the first conductive member and the second power contact are electrically conducted.
4. The lamp aging testing device of claim 2, wherein the first conductive member comprises an installation portion, a rotating shaft and a conductive roller, the installation portion is respectively connected with the supporting plate and the rotating shaft, the conductive roller is rotatably connected with the rotating shaft, the conductive roller is abutted against the second power supply contact position, and the conductive roller is further connected with the external power supply.
5. The lamp aging testing device of claim 4, wherein the first conductive member further comprises a conductive limiting portion connected to the mounting portion, the conductive limiting portion is located on a side of the conductive roller away from the supporting plate, the conductive limiting portion is electrically connected to the external power source, the conductive limiting portion is provided with an accommodating groove, and a portion of the conductive roller is accommodated in the accommodating groove, so that when the conductive roller contacts the second power source contact portion, the conductive roller is electrically conducted to the conductive limiting portion.
6. The lamp aging testing device of claim 5, wherein the first conductive member further comprises a buffer spring, the buffer spring is located on a side of the conductive limiting portion away from the conductive roller, and the buffer spring is connected to the mounting portion and the conductive limiting portion respectively.
7. The lamp aging test device according to claim 1, wherein the lamp socket includes a bottom case, a second conductive member, and a plurality of lamp clips, the plurality of lamp clips are connected to the bottom case, each lamp clip is used for connecting to a power line of a lamp to be tested, the bottom case is used for accommodating a connecting wire connected to each lamp clip, the bottom case is connected to the supporting plate, the bottom case is provided with a second through hole communicated with the inside of the bottom case, the supporting plate is provided with a third through hole corresponding to the second through hole, the second conductive member sequentially penetrates through the second through hole and the third through hole, the second conductive member is connected to the connecting wire in each bottom case, and the second conductive member is used for abutting against the first power contact.
8. The lamp aging test device according to claim 1, further comprising a limiting plate connected to the layered plate, the limiting plate abutting against the supporting plate so as to align the first power contact position with the second power contact position when detecting.
9. The lamp aging testing device of claim 1, wherein the supporting plate is provided with a plurality of fourth through holes, and the plurality of fourth through holes are uniformly distributed on the supporting plate.
10. A lamp aging apparatus, comprising a lamp aging cabinet and at least one lamp aging test device according to any one of claims 1 to 9, wherein the lamp aging cabinet has a shelf test space, each lamp aging test device is accommodated in the shelf test space, and a layered plate of each lamp aging test device is connected to an inner wall of the shelf test space.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202123200893.9U CN216979263U (en) | 2021-12-17 | 2021-12-17 | Lamp aging testing device and lamp aging equipment |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202123200893.9U CN216979263U (en) | 2021-12-17 | 2021-12-17 | Lamp aging testing device and lamp aging equipment |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116699455A (en) * | 2023-08-04 | 2023-09-05 | 常州风光车辆饰件有限公司 | Car light test fixture |
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2021
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116699455A (en) * | 2023-08-04 | 2023-09-05 | 常州风光车辆饰件有限公司 | Car light test fixture |
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