CN216848380U - Heating structure of silicon filter - Google Patents
Heating structure of silicon filter Download PDFInfo
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- CN216848380U CN216848380U CN202220439483.5U CN202220439483U CN216848380U CN 216848380 U CN216848380 U CN 216848380U CN 202220439483 U CN202220439483 U CN 202220439483U CN 216848380 U CN216848380 U CN 216848380U
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Abstract
The utility model discloses a heating structure of a silicon filter, which comprises an a-Si filter, a PD detector, a WDM membrane, a double-fiber collimator at the end to be measured, a double-fiber collimator at the heating end, a light source to be measured and a heating light source; the dual-fiber collimator at the end to be detected, the WDM membrane, the a-Si filter and the PD detector are sequentially arranged at intervals along the light path direction, and the dual-fiber collimator at the heating end is arranged beside the WDM membrane; light to be measured emitted by the light source to be measured is input from the double-optical-fiber collimator at the end to be measured, and reaches the a-Si filter after being transmitted by the WDM membrane; the heating light emitted by the heating light source is input from the double-optical-fiber collimator at the heating end, reflected by the WDM membrane and reaches the a-Si filter plate, wherein the heating light emitted by the heating light source is a flat-top laser beam, and the wavelength of the heating light is shorter than the cut-off absorption wavelength of silicon. The utility model discloses can realize a-Si ultra-thin optical filter's even heating or be close even heating.
Description
Technical Field
The utility model relates to an optical fiber communication field especially relates to a silicon filter's heating structure.
Background
In the field of optical fiber communication, tunable optical filters are widely used for channel monitoring. One implementation of a tunable optical filter is to use a thermo-optically modulated silicon filter, such as the a-Si ultra-thin filters produced in patents US6985281 and US 7304799. The heating method for the silicon optical filter usually adopts electric joule heat, such as a gold-plated ring or a conductive heating layer, but the existing heating structure is difficult to quickly realize uniform heating or nearly uniform heating of the a-Si ultrathin optical filter.
Disclosure of Invention
For overcoming the deficiencies in the prior art, an object of the utility model is to provide a heating structure of silicon filter.
In order to achieve the above purpose, the utility model adopts the following technical scheme:
a heating structure of a silicon filter comprises an a-Si filter, a PD detector, a WDM membrane, a dual-fiber collimator at a to-be-detected end, a dual-fiber collimator at a heating end, a light source to be detected and a heating light source;
the dual-fiber collimator at the end to be detected, the WDM membrane, the a-Si filter and the PD detector are sequentially arranged at intervals along the light path direction, and the dual-fiber collimator at the heating end is arranged beside the WDM membrane;
light to be measured emitted by the light source to be measured is input from the double-optical-fiber collimator at the end to be measured, and reaches the a-Si filter after being transmitted by the WDM membrane;
the heating light emitted by the heating light source is input from the double-optical-fiber collimator at the heating end, reflected by the WDM membrane and reaches the a-Si filter plate, wherein the heating light emitted by the heating light source is a flat-top laser beam, and the wavelength of the heating light is shorter than the cut-off absorption wavelength of silicon.
A heating structure of a silicon filter comprises an a-Si filter, a PD detector, a WDM membrane, a dual-fiber collimator at a to-be-detected end, a to-be-detected light source and a heating light source;
the dual-fiber collimator, the WDM membrane, the a-Si filter and the PD detector of the end to be detected are sequentially arranged at intervals along the light path direction, and the heating light source is arranged beside the WDM membrane;
light to be measured emitted by the light source to be measured is input from the double-optical-fiber collimator at the end to be measured, and reaches the a-Si filter after being transmitted by the WDM membrane;
the heating light source is a high-power LED planar light source, heating light emitted by the heating light source reaches the a-Si filter after being reflected by the WDM membrane, and the wavelength of the heating light is shorter than the cut-off absorption wavelength of silicon.
Furthermore, a collimating lens is arranged between the heating light source and the a-Si filter, and heating light emitted by the heating light source is collimated by the collimating lens and then enters the a-Si filter.
A heating structure of a silicon filter comprises an a-Si filter, a PD detector, a WDM membrane, four optical fiber collimators, a light source to be detected and a heating light source;
the four optical fiber collimators, the a-Si filter and the PD detector are sequentially arranged at intervals along the direction of a light path, light to be detected emitted by a light source to be detected and heating light emitted by a heating light source enter from two independent input optical fibers of the four optical fiber collimators respectively, wherein the input optical fiber corresponding to the light to be detected is a large mode field diameter optical fiber, the input optical fiber corresponding to the heating light adopts a common mode field diameter optical fiber, and the wavelength of the heating light is shorter than the silicon cut-off absorption wavelength; the light to be measured and the heating light are output to the a-Si filter chip after being collimated by the four-fiber collimator.
Further, the diameter of the large mode field diameter optical fiber is more than 3 times of the diameter of the common mode field diameter optical fiber.
The utility model adopts the above technical scheme, the light irradiation a-Si filter piece that the interior is shorter than silicon by absorption wavelength to heat a-Si filter piece, realize the adjustable filtering effect to waiting to measure the light through a-Si filter piece. The light source for heating adopts a flat-topped laser light source, a high-power LED planar light source, or the light to be measured for filtering adopts an optical fiber with a large mode field diameter for transmission, so that the spot size of the light to be measured on the a-Si filter is smaller than that of the heating light by more than 3 times, namely the spot of the light to be measured is almost positioned on the flat-topped part of the spot of the heating light, and the spot area of the light to be measured can be uniformly heated.
Drawings
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments;
fig. 1 is a schematic view of embodiment 1 of the present invention;
fig. 2 is a schematic view of embodiment 2 of the present invention;
fig. 3 is a schematic view of embodiment 3 of the present invention;
FIG. 4 is a schematic diagram of a light spot to be measured and a heating light spot;
FIG. 5 is a Gaussian beam plot;
FIG. 6 is a schematic diagram of a 7 fiber collimator;
FIG. 7 is a schematic diagram of a 9 fiber collimator.
Detailed Description
Embodiment 1, please refer to fig. 1, a heating structure of a silicon filter includes an a-Si filter 11, a PD detector 12, a WDM film 13, a dual-fiber collimator 14 at a to-be-measured end, a dual-fiber collimator 15 at a heating end, a to-be-measured light source, and a heating light source;
the dual-fiber collimator 14 at the end to be measured, the WDM membrane 13, the a-Si filter 11 and the PD detector 12 are arranged at intervals in sequence along the optical path direction, and the dual-fiber collimator 15 at the heating end is arranged beside the WDM membrane 13;
light to be measured emitted by a light source to be measured is input from the dual-optical-fiber collimator 14 at the end to be measured, and reaches the a-Si filter 11 after being transmitted through the WDM membrane 13;
heating light emitted by the heating light source is input from the heating end double-fiber collimator 15, reflected by the WDM membrane 13 and reaches the a-Si filter 11, wherein the heating light emitted by the heating light source is flat-topped laser beam (adopting the flat-topped laser beams in the patents US9971159 and US 10688561), and the wavelength of the heating light is shorter than the silicon cut-off absorption wavelength (such as 980 nm).
The WDM diaphragm 13 is a partial wave plate that reflects the wavelength of the heating light and transmits the wavelength of the light to be measured. The light to be measured and the heating light reach the a-Si filter plate simultaneously after passing through the WDM membrane 13, the heating light uniformly irradiates the a-Si filter plate, the filter plate absorbs the heating light energy and then is heated, the filter plate carries out filtering of different wavelengths on the light to be measured along with temperature change, and the filtered wavelengths are finally detected by the light detector PD, so that spectral analysis of the light to be measured can be obtained.
Embodiment 2, please refer to fig. 2, a heating structure of a silicon filter includes an a-Si filter 21, a PD detector 22, a WDM film 23, a dual-fiber collimator 24 at a to-be-detected end, a to-be-detected light source, and a heating light source;
the dual-optical fiber collimator 24, the WDM membrane 23, the a-Si filter 21 and the PD detector 22 at the end to be detected are sequentially arranged at intervals along the optical path direction, and the heating light source is arranged beside the WDM membrane 23;
light to be measured emitted by a light source to be measured is input from the dual-fiber collimator 24 at the end to be measured, and reaches the a-Si filter 21 after being transmitted through the WDM membrane 23;
the heating light source is a high-power LED planar light source 25, heating light emitted by the heating light source reaches the a-Si filter 21 after being reflected by the WDM membrane 23, and the wavelength of the heating light is shorter than the cut-off absorption wavelength of silicon.
Further, a collimating lens 26 is disposed between the heating light source and the a-Si filter 21, and the heating light emitted from the heating light source is collimated by the collimating lens 26 and then enters the a-Si filter 21.
Embodiment 2 is basically the same as embodiment 1 in structure, except that only the light source portion is heated, and other configurations and principles are the same.
Embodiment 3, referring to fig. 3, a heating structure of a silicon filter includes an a-Si filter 31, a PD detector 32, a four-fiber collimator 34, a light source to be detected, and a heating light source;
the four optical fiber collimators 34, the a-Si filter 31 and the PD detector 32 are sequentially arranged at intervals along the optical path direction, light to be detected emitted by the light source to be detected and heating light emitted by the heating light source enter from two independent input optical fibers of the four optical fiber collimators 34 respectively, wherein the input optical fiber corresponding to the light to be detected is a large mode field diameter optical fiber, the input optical fiber corresponding to the heating light adopts a common mode field diameter optical fiber, and the wavelength of the heating light is shorter than the silicon cut-off absorption wavelength; the light to be measured and the heating light are output to the a-Si filter chip after being collimated by the four-fiber collimator 34.
The diameter of the large mode field diameter fiber is more than 33 times of the diameter of the common mode field diameter fiber. If the diameter of the large mode field diameter optical fiber is 30um @1550nm, the diameter of the common mode field diameter optical fiber is 10um @1550 nm. The light spot of the heating light is about three times larger than the light spot of the light to be measured (as shown in fig. 4), that is, the light spot of the light to be measured is close to the gaussian beam flat top portion of the heating light spot (as shown in fig. 5), and it can be approximately considered that the light region to be measured is uniformly heated by the heating light. Wherein, the heating light source can adopt a 1064nm fiber laser with the power of more than 1W/10W.
From the viewpoint of energy distribution, besides the four optical fiber collimators 34, 7-9 optical fiber collimators (as shown in fig. 6 and 7) may be adopted, so that a plurality of light sources with lower energy, such as a 980nm laser with 500mW, may be adopted as the heating light source.
The practice of the present invention has been described with reference to the accompanying drawings, but the invention is not limited to the embodiments described above, which are illustrative rather than limiting, and it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the scope of the embodiments of the present invention, and are intended to be covered by the claims and the specification.
Claims (5)
1. A heating structure of a silicon filter, characterized in that: the device comprises an a-Si filter, a PD detector, a WDM membrane, a double-fiber collimator at a to-be-detected end, a double-fiber collimator at a heating end, a light source to be detected and a heating light source;
the dual-fiber collimator at the end to be detected, the WDM membrane, the a-Si filter and the PD detector are sequentially arranged at intervals along the light path direction, and the dual-fiber collimator at the heating end is arranged beside the WDM membrane;
light to be measured emitted by the light source to be measured is input from the double-optical-fiber collimator at the end to be measured, and reaches the a-Si filter after being transmitted by the WDM membrane;
the heating light emitted by the heating light source is input from the double-optical-fiber collimator at the heating end, reflected by the WDM membrane and reaches the a-Si filter plate, wherein the heating light emitted by the heating light source is a flat-top laser beam, and the wavelength of the heating light is shorter than the cut-off absorption wavelength of silicon.
2. A heating structure of a silicon filter, characterized in that: the device comprises an a-Si filter, a PD detector, a WDM membrane, a dual-fiber collimator at the end to be measured, a light source to be measured and a heating light source;
the dual-fiber collimator, the WDM membrane, the a-Si filter and the PD detector of the end to be detected are sequentially arranged at intervals along the light path direction, and the heating light source is arranged beside the WDM membrane;
light to be measured emitted by the light source to be measured is input from the double-optical-fiber collimator at the end to be measured, and reaches the a-Si filter after being transmitted by the WDM membrane;
the heating light source is a high-power LED planar light source, heating light emitted by the heating light source reaches the a-Si filter after being reflected by the WDM membrane, and the wavelength of the heating light is shorter than the cut-off absorption wavelength of silicon.
3. A heating structure of a silicon filter according to claim 2, characterized in that: and a collimating lens is arranged between the heating light source and the a-Si filter plate, and heating light emitted by the heating light source is collimated by the collimating lens and then is incident to the a-Si filter plate.
4. A heating structure of a silicon filter, characterized in that: the device comprises an a-Si filter, a PD detector, four optical fiber collimators, a light source to be detected and a heating light source;
the four optical fiber collimators, the a-Si filter and the PD detector are sequentially arranged at intervals along the direction of a light path, light to be detected emitted by a light source to be detected and heating light emitted by a heating light source enter from two independent input optical fibers of the four optical fiber collimators respectively, wherein the input optical fiber corresponding to the light to be detected is a large mode field diameter optical fiber, the input optical fiber corresponding to the heating light adopts a common mode field diameter optical fiber, and the wavelength of the heating light is shorter than the silicon cut-off absorption wavelength; the light to be measured and the heating light are output to the a-Si filter chip after being collimated by the four-fiber collimator.
5. A heating structure of a silicon filter according to claim 4, characterized in that: the diameter of the large mode field diameter optical fiber is more than 3 times of that of the common mode field diameter optical fiber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220439483.5U CN216848380U (en) | 2022-03-02 | 2022-03-02 | Heating structure of silicon filter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202220439483.5U CN216848380U (en) | 2022-03-02 | 2022-03-02 | Heating structure of silicon filter |
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| Publication Number | Publication Date |
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| CN216848380U true CN216848380U (en) | 2022-06-28 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| CN202220439483.5U Active CN216848380U (en) | 2022-03-02 | 2022-03-02 | Heating structure of silicon filter |
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| CN (1) | CN216848380U (en) |
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