CN216847953U

CN216847953U - Multi-channel test equipment for simultaneously testing insulation resistance of multiple ceramic capacitors

Info

Publication number: CN216847953U
Application number: CN202123361258.9U
Authority: CN
Inventors: 吴东锋
Original assignee: Knowles Electronics Suzhou Co ltd
Current assignee: Knowles Electronics Suzhou Co ltd
Priority date: 2021-12-28
Filing date: 2021-12-28
Publication date: 2022-06-28
Anticipated expiration: 2031-12-28

Abstract

The utility model relates to a multichannel test equipment of a plurality of ceramic capacitor's of concurrent test insulation resistance. The multi-channel test apparatus includes: a plurality of test probes arranged in an array of test probes, each probe electrically connected to a respective ceramic capacitor, the plurality of ceramic capacitors arranged in an array of ceramic capacitors; a plurality of micro-current measurement cards arranged in an array of micro-current measurement cards, wherein each micro-current measurement card is electrically connected to each test probe, respectively; the master controller can control the data acquisition card, the plurality of micro-current measurement cards and the plurality of test probes so as to obtain the insulation resistances of the plurality of ceramic capacitors at the same time; and the power supply is a programmable power supply and is used for supplying power to the ceramic capacitor of the multi-channel test equipment.

Description

Multi-channel test equipment for simultaneously testing insulation resistance of multiple ceramic capacitors

Technical Field

The utility model relates to a ceramic capacitor insulation resistance test field specifically, relates to the multichannel test equipment of a plurality of ceramic capacitor's of simultaneous test insulation resistance.

Background

In the industrial technology field, it is often necessary to measure the degree of insulation of a product using an insulation resistance meter. Particularly in the ceramic capacitor manufacturing industry, it is required to simultaneously test the insulation resistance of 4 or 8 ceramic capacitors or more. Most of insulation resistance meters in the prior art are only tested in a single way, and a plurality of insulation resistance meters need to be assembled together when a plurality of products are tested simultaneously. Further, the existing ceramic capacitors have been increasing in size, and for ceramic capacitor products with large size (especially, the size of more than 0.12 inches by 0.1 inches), only a single product or several products can be tested simultaneously, the testing time is long, and the production efficiency is seriously affected, so that these technical limitations need to be overcome, and thus, a multi-way testing apparatus capable of testing the insulation resistance of a plurality of (even up to 400) ceramic capacitors simultaneously, especially, the insulation resistance of a plurality of ceramic capacitors with large size (for example, the size of more than 0.12 inches by 0.1 inches) simultaneously is required.

SUMMERY OF THE UTILITY MODEL

According to the utility model discloses an aspect provides a multichannel test equipment of a plurality of ceramic capacitor's insulation resistance of concurrent test, multichannel test equipment includes: a plurality of test probes arranged in a test probe array, each probe electrically connected to a respective ceramic capacitor, the plurality of ceramic capacitors arranged in a ceramic capacitor array; a plurality of micro-current measurement cards arranged in an array of micro-current measurement cards, wherein each micro-current measurement card is electrically connected to each test probe, respectively; the master controller can control the data acquisition card, the plurality of micro-current measurement cards and the plurality of test probes so as to obtain the insulation resistances of the plurality of ceramic capacitors at the same time; and the power supply is a programmable power supply and is used for supplying power to the ceramic capacitor of the multi-channel test equipment.

According to the utility model discloses a multichannel test equipment of on the other hand still includes: the test tray comprises a test bottom plate and a tray, the test bottom plate is provided with a conductive layer, one end of each ceramic capacitor in the ceramic capacitors is connected to the conductive layer, and the other end of each ceramic capacitor is connected to the test probe.

According to the utility model discloses a multichannel test equipment of on the other hand still includes: and the motor controller is controlled by the master controller so as to drive the test bottom plate to move.

According to the utility model discloses a multichannel test equipment of on the other hand still includes: an input-output interface to receive an input signal and output an output signal, wherein the input signal comprises a signal produced by at least one of: the device comprises a start button, a stop button, an emergency button, a motor limit switch, a test cylinder in-place switch, a material distribution box in-place switch and a test head in-place switch.

According to the utility model discloses a multichannel test equipment of on the other hand, wherein: the output signal (108) is used to control at least one of: the non-defective products blow the material solenoid valve, withstand high pressure bad solenoid valve, the bad solenoid valve of insulation resistance, measure and keep off the position and switch, blow and keep off the position.

According to the utility model discloses a multichannel test equipment of on the other hand, wherein: the array of test probes, the array of micro-current measurement cards and the array of ceramic capacitors are in the form of M N, where M is an integer greater than or equal to 2 and N is an integer greater than or equal to 2.

According to the utility model discloses a multichannel test equipment of on the other hand, wherein: wherein M is an integer of 20 and N is an integer of 20.

According to the utility model discloses a multichannel test equipment of on the other hand, wherein: the minimum resolution of the micro-current measuring card is 0.001nA, and the micro-current measuring card has a plurality of gears, including: the first gear is 0.01 nA-10 nA, the second gear is 0.001 uA-1 uA, the third gear is 0.1 uA-10 uA, and the fourth gear is 0.001 mA-1 mA.

According to the utility model discloses a multichannel test equipment of on the other hand still includes: and the display device displays the test data output by each probe in the plurality of test probes in a graphic mode, wherein the characteristic of the graphic display of the test data is used for judging whether the corresponding ceramic capacitor is good or not.

Drawings

The objects, features and advantages of the present invention will become apparent from the following detailed description of the various aspects of the invention, when taken in conjunction with the following drawings:

fig. 1 is a schematic system configuration diagram of a multi-channel testing apparatus for simultaneously testing insulation resistances of a plurality of ceramic capacitors according to an embodiment of the present invention.

Fig. 2 is a schematic structural diagram of a micro-current measurement card of a multi-channel test device according to an embodiment of the present invention.

Fig. 3 is a schematic diagram of the test connection of the ceramic capacitor, the test probe and the test base plate of the multi-channel test device according to an embodiment of the present invention.

Fig. 4 is an array schematic of a micro-current measurement card of a multi-way test apparatus according to one embodiment of the invention.

Fig. 5 is a flow chart of a testing process of a multi-channel testing device according to an embodiment of the present invention.

Fig. 6 is a schematic diagram of a test result of a multi-channel test device according to an embodiment of the present invention.

Fig. 7 is a diagram illustrating another test result of a multi-channel testing apparatus according to an embodiment of the present invention.

Detailed Description

The inventive concept will now be described more fully hereinafter with reference to the accompanying drawings, in which embodiments of the inventive concept are shown. However, the present application should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the embodiments to those skilled in the art. Like numbers refer to like elements throughout.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of those embodiments. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used herein, specify the presence of stated features, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, steps, operations, elements, components, and/or groups thereof.

It will be understood that when an element is referred to as being "coupled to," "connected to," or "responsive to" another element, it can be directly coupled to, connected to, or responsive to the other element or intervening elements may also be present. In contrast, when an element is referred to as being "directly coupled to," "directly connected to," or "directly responsive to" another element, there are no intervening elements present. As used herein, the terms "and/or" include any and all combinations of one or more of the associated listed items.

Spatially relative terms, such as "above," "below," "upper," "lower," "top," "bottom," and the like, may be used herein for ease of description to describe one element or feature's relationship to another element or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "below" other elements or features would then be oriented "above" the other elements or features. Thus, the term "below" can encompass both an orientation of above and below. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly. Well-known functions or constructions may not be described in detail for brevity and/or clarity.

It will be understood that although the terms "first," "second," etc. may be used herein to describe various components, these components should not be limited by these terms. These terms are only used to distinguish one element from another. Thus, a first component may be termed a second component without departing from the teachings of the present embodiments.

Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which these embodiments belong. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.

System components of multi-way test apparatus 100

Fig. 1 is a schematic diagram of a system structure of a multi-channel testing apparatus 100 for simultaneously testing insulation resistance of a plurality of ceramic capacitors 303 according to an embodiment of the present invention, wherein the multi-channel testing apparatus 100 includes a power supply 111, a motor controller 101, a general controller 102, a data acquisition card 103, an input/output interface 104 for receiving input signals 107 and output signals 108, a display device 105 for displaying test data and test reports, a micro-current measuring card 106, and a test panel 110.

The power supply 111 is a programmable dc power supply that can output a dc voltage of 800V or more at maximum for powering the various components of the multiplexing test equipment 100 as well as the individual ceramic capacitors 303. The programmable power supply may be programmed to control the rise time, test time, fall time of the voltage output, and in particular may control the period of time that the voltage rises. The programmable power supply 111 can determine whether the ceramic capacitor 303 exists in the system or not according to the characteristic that the charging current is larger when the ceramic capacitor 303 exists in the test tray and is smaller when the ceramic capacitor 303 does not exist in the test tray, so that the programmable power supply is particularly favorable for effectively detecting whether the ceramic capacitor 303 exists in the system or not.

The data acquisition card 103 has a plurality of acquisition channels, wherein each of the micro-current measurement cards 106 is electrically connected to each of the acquisition channels, respectively, and a plurality of data acquisition cards 103 may be combined for data acquisition. The shape, parameters and configuration of each acquisition card can be the same or different. For example, the acquisition channel of the data acquisition card 103 may have 32 channels, and a non-limiting embodiment of the present invention may employ 13 data acquisition cards, providing 416 acquisition channels altogether. But is not limited thereto and any number of data acquisition cards may be used as desired.

The data acquisition card 103 may acquire the output voltage of the micro-current measurement card 106, convert the analog voltage signal into a digital signal, and provide the digital signal to the general controller 102 or other suitable components. The data acquisition card 103 may also perform operations such as digital filtering, arithmetic mean, etc. on the signals.

Input-output interface 104 is configured to receive input signal 107 and output a control signal (i.e., output signal 108) issued by overall controller 102, input signal 107 including signals generated by at least one of: the device comprises a start button, a stop button, an emergency button, a motor limit switch, a test cylinder in-place switch, a material distribution box in-place switch and a test head in-place switch.

The output signal 108 may be used to control at least one of: good product blowing electromagnetic valve, high-pressure resistant bad electromagnetic valve, insulation resistance bad electromagnetic valve, measurement gear switching, and blowing gear (blowing pressure). The input/output interface 104 may include one or more input/output cards, and one non-limiting embodiment of the present invention preferably employs 3 input/output cards, but any number of input/output cards may be used as desired. The input-output card may be an analog or digital input-output card. Preferably, a digital input-output card is used.

The required data may be displayed on the display device 105, for example, a test report may be displayed or printed by the display device 105. For example, test data output from each test probe 304 is graphically displayed on the display device 105, and the characteristics of the graphical display of the test data are used to determine whether the corresponding ceramic capacitor is good.

Fig. 2 is a schematic diagram of the structure of the micro-current measurement card 106 of the multi-channel test apparatus 100 according to an embodiment of the present invention. The micro-current measurement card 106 includes a current-to-voltage converter 201, a voltage signal amplifier 202, a low pass filter 203, and the like. The micro-current measurement card 106 may receive the micro-current input from the test probes 304 and convert the micro-current input to a voltage signal via the current to voltage converter 201, which is then amplified by the voltage signal amplifier 202 and then output to the data acquisition card 103 via the low pass filter 203.

Fig. 3 is a schematic diagram of the test connections of the ceramic capacitor 303, the test probe 304, and the test substrate 301 of the multi-way test apparatus 100 according to an embodiment of the present invention.

Referring to fig. 3, the test tray 110 of the multi-way test apparatus 100 includes a test substrate 301 and a tray (not shown) for holding the ceramic capacitors, the test substrate 301 being used to assist in measuring the insulation resistance of the ceramic capacitors 303, and a conductive layer 302 (layer indicated by thick solid lines in the drawing) below the test substrate 301. When testing is performed, one end of each ceramic capacitor 303 is electrically connected to the conductive layer 302 and the other end is electrically connected to the test probe 304. Each test probe 304 is electrically connected to one end of each ceramic capacitor 303, and the micro-current flowing through the ceramic capacitor 303 is left in one end of the test probe 304 (e.g., the upper end of the test probe 303 in fig. 3) and further flows into the input of the data measurement card 106 through the other end of the test probe 304 (e.g., the lower end of the test probe 303 in fig. 3).

Although a test connection example of 5 probes and 5 ceramic capacitors is shown in fig. 3, this is merely exemplary and may include a case of only one probe 304 and only one ceramic capacitor 303. The test probes 304 are arranged in an array, preferably an M x N array, M, N being an integer, M, N being the same or different, preferably an integer greater than or equal to 2, more preferably 5, 10, 15, 20, 25, 30, 40.

Each of the test probes 304 has an input terminal receiving the dc voltage and an output terminal outputting the dc voltage. Each test probe 304 outputs a test data, and the test data is graphically displayed on the display device 105, wherein the insulation resistance of the ceramic capacitor 303 is determined according to the graphical display characteristics of the test data, and whether the corresponding ceramic capacitor is good or not is determined.

The ceramic capacitors 303 may also be arranged in an array, the array of ceramic capacitors 303 may be in the same form as the array of test probes 304, or may be in a different form, preferably, the array of ceramic capacitors 303 may also be in the form of M × N, M, N being an integer, M, N being the same or different, preferably an integer greater than or equal to 2, more preferably 5, 10, 15, 20, 25, 30, 40.

Fig. 4 is a schematic diagram of an array of micro-current measurement cards 106 of the multi-way test apparatus 100, according to one embodiment of the present invention.

The micro-current measurement cards 106 may take one or more form, and when multiple micro-current measurement cards 106 are used, the micro-current measurement cards 106 are arranged in an array, wherein each micro-current measurement card 106 is electrically connected to each test probe 304, the array of micro-current measurement cards 106 may be in the same form as the array of test probes 304, or may be in a different form, preferably, the array of micro-current measurement cards 106 may also be in the form of M N, M, N is an integer, M, N is the same or may be different, preferably an integer greater than or equal to 2, more preferably 5, 10, 15, 20, 25, 30, 40.

Each of the micro-current measurement cards 106 is also electrically connected to a respective acquisition channel of the data acquisition card, and a non-limiting schematic connection of the array of micro-current measurement cards to the respective acquisition channels of the data acquisition card 103 is shown in FIG. 4. Reference numeral 401 denotes the 28 channels of the micro-current measurement card 106 connected to the 12 th data acquisition card 103; reference numeral 402 denotes the 15 channels of the micro-current measurement card 106 connected to the 13 th data acquisition card; reference numeral 403 denotes the micro current measurement card 106 connected to channel 0 of the 1 st data acquisition card; reference numeral 403 indicates that the micro-current measurement card 106 is connected to the 19 channels of the 1 st data acquisition card, but these connection manners are only examples, and any connection manner may be adopted according to actual needs.

The minimum resolution of the microcurrent measurement card 106 is 0.001nA and has a number of gears including: the first gear is 0.01 nA-10 nA, the second gear is 0.001 uA-1 uA, and the third gear is: 0.1uA to 10uA and a fourth gear 0.001mA to 1 mA. The measurement of the ceramic capacitor 303 is mostly required to be between 1nA and 100 nA.

The multi-channel test device 100 further comprises a general controller 102, and the general controller 102 can control the data acquisition card 103, the plurality of micro-current measurement cards 106, the plurality of test probes 304 and other components to simultaneously obtain the insulation resistance of the plurality of ceramic capacitors 303. The overall controller 102 can provide system throughput of up to 8GB/s and slot throughput of 2GB/s, and is suitable for synchronously processing a large amount of data.

The multi-channel test device 100 further comprises a motor controller 101, and the overall controller 102 controls the motor controller 101 to drive the test base plate 301 to move.

The multi-way test apparatus 100 also includes a housing (not shown), which may be in the form of a chassis, for example, but not limited to. The chassis may be a multi-slot chassis that uses PXI to trigger the bus to ensure that the transmission delays between each slot match.

The multi-way test apparatus 100 also includes a feed mechanism (not shown) that, in use, can first shake the ceramic capacitors 303 into the test tray 110 and then place the test tray 110 on the feed mechanism.

The multi-channel testing apparatus 100 further includes a solenoid valve set (not shown), and the solenoid valve set can be a high-speed solenoid valve with high speed and long service life.

Test procedure for multiplexing test equipment 100

One non-limiting embodiment of the invention is described below. When the device is used, in order to ensure the consistency of multi-channel test results, firstly, a standard resistor and an operational amplifier with a small temperature drift coefficient are used for ensuring the amplification linearity; the zero of each micro-current measurement card 106 is then adjusted by first coarse tuning the potentiometer to below 0.1V and second storing each zero-shift voltage into the controller, for example but not limited to a total of 400 x 4 to 1600 data. Note that the test software automatically returns to zero in the formal test process, if the zero voltage data needs to be refreshed manually, the operation level needs to be switched, and the operation can be performed only after the correct password is input, so that the safety of the data is ensured, and the consistency and the accuracy of the test result of each data measurement card are also ensured.

Multiple test modes are provided by the multiplexing test device 100. For example, mode one: during testing, as long as the tested product reaches the set good product rate within 20 seconds, the test is stopped, and good products and defective products are blown into the respective distributing boxes. And a second mode: as long as the tested product reaches the set good product rate within 60 seconds, the test is stopped, and good products and defective products are blown into the respective dispensing boxes. And a third mode: and stopping the test as long as the test time reaches the set time, and blowing the good products and the defective products into the respective material distribution boxes. And a fourth mode: the test is performed continuously until the stop key is manually clicked.

Fig. 5 is a flow chart of a testing process of the multi-way testing apparatus 100 according to an embodiment of the present invention.

The basic test procedure of the multi-way test apparatus 100 is described below with reference to fig. 5, and in general, first, the product test parameters need to be set, then, the test mode is selected, and finally, the test is performed to generate and output the test report. A non-limiting test procedure of the present invention is described in detail below.

In step 501, the test is ready to start and the test software is turned on.

In step 502, the multi-way test apparatus 100 is initialized, the first step: checking whether the test head is pressed down and returned normally (driven by the air cylinder); the second step is that: the servomotor returns to the zero position. If the initialization fails, the test software automatically stops running and needs to check the reason of the failure.

In step 503, the test file is opened in the menu bar to ensure that the material number, the batch number, the job number of the operator, and the like are scanned successfully, and then the test file can be loaded and run. If no material number is prompted during scanning, a new material number is needed.

In step 504, the ceramic capacitor 303 is implanted into the test tray 110, placing the test tray 110 in the loading position. If the multi-channel test equipment has no alarm, the test can be started.

In step 505, a test is initiated.

In step 506, the test tray 110 is moved to the test position, causing the set of test probes 304 to be depressed.

In step 507, when it is detected that the test probe 304 is moved into position, the multi-path high voltage withstand test is started. If the relevant parameter is set to be closed, the next step is directly carried out.

In step 508, a test is performed for the presence of material (presence of product under test in test tray 110). In the test voltage rising stage, it is checked whether the charging current of the ceramic capacitor 303 is greater than a set value, and if the charging current is less than the set value, it is determined that there is no material (no product to be tested) in the test tray 110.

In step 509, an insulation resistance test is performed. For example, in mode one: the test is stopped as long as the yield reaches the set target value within 20 seconds.

In step 510, the test tray 110 is moved to an air blowing sorting position, and good products, high voltage resistant defective products, and insulation resistance defective products are blown into the corresponding material distribution boxes respectively.

In step 510, the test disc 110 is returned to the load position and the test is ended.

Fig. 6 is a schematic diagram of the test result of the multi-channel testing apparatus 100 according to an embodiment of the present invention. Fig. 7 is a diagram illustrating another test result of the multi-channel testing apparatus 100 according to an embodiment of the present invention.

As shown in fig. 6, different voltage values represent different test results. As indicated by the portion of the curve designated by reference numeral 601, if the voltage is approximately equal to zero, it indicates that there is no material in the test tray 110 (no product under test); as shown in the curve part indicated by reference numeral 602, if the leakage current of the product to be tested is small, the insulation resistance is high; as shown in the curve portion of reference numeral 603, if the leakage current of the product to be tested is large, it indicates that the insulation resistance is low.

Referring to fig. 7, a portion 701 is a result of a first multi-pass (400-pass) ceramic capacitor high voltage withstand and insulation resistance test, and a portion 702 is a result of a second multi-pass (400-pass) ceramic capacitor high voltage withstand and insulation resistance test.

The curve part denoted by reference numeral 703 in fig. 7 indicates a test voltage rising stage during the insulation resistance test, and if the current value is greater than the set charging current value, it indicates that there is material in the test tray 110 (there is a product to be tested), otherwise, it indicates that there is no material (there is no product to be tested). The portion of the curve denoted by reference numeral 704 in fig. 7 indicates that the current value decreases sharply and the insulation resistance value increases after the product to be measured (ceramic capacitor) is fully charged.

Advantageous effects of the multi-path test apparatus 100

By the multi-way test apparatus of the present invention, the range of ceramic capacitor sizes that can be measured is wider, including but not limited to capacitor sizes from 0.08 inches by 0.05 inches to 0.25 inches by 0.2 inches. Since the test can be performed as long as the ceramic capacitor can be smoothly implanted into the test tray.

Because the test parameters are stored in a test database (such as a test table) and each material number related to the ceramic capacitor has related test parameters, an operator only needs to input the material number, and the multi-channel test equipment automatically calls out the related test parameters, so that the product quality problem caused by manual operation errors and introduction of wrong test conditions can be prevented. The multi-channel test equipment can test a plurality of products as high as 400 at the same time, and compared with single test, the test efficiency is greatly improved, so that the test time can be greatly reduced, and the labor cost is saved. And the multi-channel test equipment has multiple test modes and is flexible to use.

The testing precision of each testing channel of the multi-channel testing equipment is high, and the testing capacity value range is wide. The distinguishing ability of material and non-material is strong, all the test results are stored in the database, and the user can check the printed report at any time. Because the product analysis can be powerfully and rapidly assisted by a user, when the insulation performance analysis needs to be performed on hundreds of samples, the analysis which can be completed within 1 to 2 weeks can be completed within hours at present.

Many variations and modifications may be made to the embodiments without substantially departing from the principles of the present invention. All such variations and modifications are intended to be included within the scope of the present invention. Accordingly, the above disclosed subject matter is to be considered illustrative, and not restrictive, and the intention is to cover all such modifications, enhancements, and other embodiments, which fall within the spirit and scope of the present invention.

Claims

1. A multi-way test device (100) for simultaneously testing the insulation resistance of a plurality of ceramic capacitors (303), the multi-way test device (100) comprising:

a plurality of test probes (304), the plurality of test probes (304) arranged in an array of test probes, each probe electrically connected to a respective ceramic capacitor (303), the plurality of ceramic capacitors (303) arranged in an array of ceramic capacitors;

a plurality of micro-current measurement cards (106), the plurality of micro-current measurement cards (106) arranged in an array of micro-current measurement cards, wherein each micro-current measurement card (106) is electrically connected to each test probe (304), respectively;

a master controller (102), said master controller (102) being capable of controlling a data acquisition card (103), said plurality of micro-current measurement cards (106) and said plurality of test probes (304) to obtain simultaneously the insulation resistance of said plurality of ceramic capacitors (303); and

a power supply (111), the power supply (111) being a programmable power supply for powering a ceramic capacitor (303) of the multi-way test apparatus (100).

2. The multi-way test apparatus (100) for simultaneously testing insulation resistance of a plurality of ceramic capacitors (303) according to claim 1, wherein the multi-way test apparatus (100) further comprises:

a test tray (110), the test tray (110) comprising a test base plate (301) and a tray, the test base plate (301) having a conductive layer (302), one end of each ceramic capacitor (303) of the plurality of ceramic capacitors (303) being connected to the conductive layer (302), the other end of each ceramic capacitor (303) being connected to the test probe (304).

3. The multi-circuit test device (100) for simultaneously testing insulation resistance of a plurality of ceramic capacitors (303) according to claim 1, wherein the multi-circuit test device (100) further comprises:

a motor controller (101), wherein the master controller (102) controls the motor controller (101) to drive the test base plate (301) to move.

4. The multi-way test apparatus (100) for simultaneously testing insulation resistance of a plurality of ceramic capacitors (303) according to claim 1, wherein the multi-way test apparatus (100) further comprises:

an input-output interface (104), the input-output interface (104) for receiving an input signal (107) and outputting an output signal (108),

wherein the input signal (107) comprises a signal resulting from at least one of: the device comprises a start button, a stop button, an emergency button, a motor limit switch, a test cylinder in-place switch, a material distribution box in-place switch and a test head in-place switch.

5. The multiplexing test apparatus (100) for simultaneously testing insulation resistances of a plurality of ceramic capacitors (303) according to claim 4, characterized in that:

the output signal (108) is used to control at least one of: the non-defective products blow the material solenoid valve, withstand high pressure bad solenoid valve, the bad solenoid valve of insulation resistance, measure and keep off the position and switch, blow and keep off the position and blow the pressure size promptly.

6. The multiplexing test apparatus (100) for simultaneously testing insulation resistances of a plurality of ceramic capacitors (303) according to claim 1, characterized in that:

the array of test probes, the array of micro-current measurement cards and the array of ceramic capacitors are in the form of M N, where M is an integer greater than or equal to 2 and N is an integer greater than or equal to 2.

7. The multiplexing test apparatus (100) for simultaneously testing insulation resistances of a plurality of ceramic capacitors (303) according to claim 6, characterized in that:

wherein M is an integer of 20 and N is an integer of 20.

8. The multiplexing test apparatus (100) for simultaneously testing insulation resistances of a plurality of ceramic capacitors (303) according to claim 1, characterized in that:

the power supply (111) can be programmed to control a rise time, a test time, a fall time, and a time period of voltage rise of the voltage output.

9. The multiplexing test apparatus (100) for simultaneously testing insulation resistances of a plurality of ceramic capacitors (303) according to claim 1, characterized in that:

the minimum resolution of the micro-current measurement card (106) is 0.001nA, and the micro-current measurement card has a plurality of gears, including: the first gear is 0.01 nA-10 nA, the second gear is 0.001 uA-1 uA, the third gear is 0.1 uA-10 uA, and the fourth gear is 0.001 mA-1 mA.

10. The multi-way test apparatus (100) for simultaneously testing insulation resistance of a plurality of ceramic capacitors (303) according to claim 1, wherein the multi-way test apparatus (100) further comprises:

a display device (105), wherein test data output by each of the plurality of test probes (304) is graphically displayed on the display device (105), wherein the characteristic of the graphical display of the test data is used for judging whether the corresponding ceramic capacitor (303) is good or not.