CN216847517U - Defect detecting device - Google Patents
Defect detecting device Download PDFInfo
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- CN216847517U CN216847517U CN202123073299.8U CN202123073299U CN216847517U CN 216847517 U CN216847517 U CN 216847517U CN 202123073299 U CN202123073299 U CN 202123073299U CN 216847517 U CN216847517 U CN 216847517U
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Abstract
The utility model provides a defect detection device, which comprises a transmission platform, a light source and a camera; the conveying platform is used for placing a workpiece to be measured; the workpiece to be detected is taken as an anchor point, the light source is arranged at the upper left of the workpiece to be detected, and the camera is arranged at the upper right of the workpiece to be detected; the single light beam emitted by the light source irradiates on a workpiece to be measured, and generates mirror reflection and diffuse reflection to form two reflected light beams corresponding to a bright field image and a dark field image respectively, wherein the two reflected light beams are positioned in the visual field range of the camera. Two reflected light beams corresponding to a bright field image and a dark field image generated on a workpiece to be measured by a single light beam emitted by the light source can be simultaneously included by the visual field of the camera. The defect detection device only uses a single camera and a single light source to simultaneously obtain two reflected light beams corresponding to the bright field image and the dark field image, replaces the technical scheme that a plurality of cameras and a plurality of light sources are adopted in the prior art, reduces the equipment cost and the debugging difficulty, and has the advantages of low equipment cost and small debugging difficulty.
Description
Technical Field
The utility model relates to a detection device field especially relates to a defect detection device.
Background
With the development of intelligent manufacturing technology, the automation degree in modern factories is higher and higher, and especially, the traditional artificial product detection production line is gradually replaced by the intelligent technology. For example: in the work of detecting the defects of the panel, high-accuracy detection can be completed based on a visual image technology without manual identification.
Wherein, different types of panel defects can be shown only under a specific light field, defects such as panel scratch, edge breakage and the like are more easily shown under a bright field image, and defects such as panel dust, foreign matters and the like are more easily shown under a dark field image. It is therefore desirable for the camera to capture both bright field image images and dark field image images. In the prior art, a plurality of cameras and a plurality of light sources are adopted, and the cameras and the light sources are in one-to-one correspondence, so that the equipment cost is high, all the light sources and the cameras need to be debugged, and the debugging difficulty is high.
In view of the above, there is a need for a new defect detection apparatus to solve or at least alleviate the above technical drawbacks.
SUMMERY OF THE UTILITY MODEL
The utility model aims at providing a defect detecting device, aim at solving the defect detecting device equipment cost height of panel defect among the prior art, the high technical problem of the debugging degree of difficulty.
In order to achieve the above object, the present invention provides a defect detecting device, including:
a transport platform, a light source, and a camera;
the conveying platform is used for placing a workpiece to be detected;
the workpiece to be detected is taken as an anchor point, the light source is arranged at the upper left of the workpiece to be detected, and the camera is arranged at the upper right of the workpiece to be detected;
the single light beam emitted by the light source irradiates on the workpiece to be detected, and generates specular reflection and diffuse reflection to form two reflected light beams corresponding to a bright field image and a dark field image respectively, wherein the two reflected light beams are positioned in the visual field range of the camera.
In an embodiment, if the width of the light source is d, the working distance of the light source is w, an included angle between the axis direction of the light source and the horizontal line is θ, and an included angle between the shooting direction of the camera and the horizontal line is α, a first position range of the first incident light beam corresponding to the dark field image on the surface of the workpiece to be measured is as follows:
the second position range of the second incident beam corresponding to the bright field image on the surface of the workpiece to be measured is as follows:
wherein d is the width of the light source, w is the working distance of the light source, theta is a first included angle between the axis direction of the light source and a horizontal line, and alpha is a second included angle between the shooting direction of the camera and the horizontal line. Thereby obtaining the relationship between the positional ranges of the first incident light beam and the second incident light beam and the parameters.
In one embodiment, if the first incident light beam and the second incident light beam are adjacent and the first incident light beam is located at the right side of the second incident light beam, the first incident light beam and the second incident light beam satisfy the following condition:
if the first incident light beam and the second incident light beam are adjacent and the first incident light beam is located at the right side of the second incident light beam, the first incident light beam and the second incident light beam satisfy the following condition:
wherein d is the width of the light source, w is the working distance of the light source, theta is a first included angle between the axis direction of the light source and a horizontal line, and alpha is a second included angle between the shooting direction of the camera and the horizontal line.
In one embodiment, if the first incident light beam is right to the second incident light beam, the first incident light beam and the second incident light beam satisfy the following condition:
wherein d is the width of the light source, w is the working distance of the light source, theta is a first included angle between the axis direction of the light source and a horizontal line, and alpha is a second included angle between the shooting direction of the camera and the horizontal line.
In one embodiment, if the first incident light beam is on the left side of the second incident light beam, the first incident light beam and the second incident light beam satisfy the following condition:
wherein d is the width of the light source, w is the working distance of the light source, theta is a first included angle between the axis direction of the light source and a horizontal line, and alpha is a second included angle between the shooting direction of the camera and the horizontal line.
In one embodiment, the ratio between the working distance of the light source and the width of the light source is 2.5.
In one embodiment, the vertical distance between the camera and the transfer platform is 200 mm to 300 mm, and the third angle between the camera and the horizontal plane is 60 degrees to 90 degrees.
In one embodiment, the vertical distance between the light source and the transfer platform is 9 mm to 45 mm, and the fourth angle between the camera and the horizontal plane is 12 degrees to 66 degrees.
In one embodiment, the horizontal distance between the camera and the light source is 100 mm to 450 mm.
In one embodiment, if the frame rate of the camera is f, the pixel equivalent of the camera is s, and the moving speed of the transfer platform is v, f, s, and v satisfy the following formula:
In the above scheme, the defect detection device comprises a conveying platform, a light source and a camera; the conveying platform is used for placing a workpiece to be detected; the workpiece to be detected is taken as an anchor point, the light source is arranged at the upper left of the workpiece to be detected, and the camera is arranged at the upper right of the workpiece to be detected; the single light beam emitted by the light source irradiates on a workpiece to be measured, and generates mirror reflection and diffuse reflection to form two reflected light beams corresponding to a bright field image and a dark field image respectively, wherein the two reflected light beams are positioned in the visual field range of the camera. Two reflected light beams corresponding to a bright field image and a dark field image generated on a workpiece to be measured by a single light beam emitted by the light source can be simultaneously included by the visual field of the camera. It should be noted that, as the transfer platform moves, the camera may acquire two reflected light beams corresponding to the bright field image and the dark field image at each position of the panel, and transmit the acquired data to the computer, and the computer processes the received data at each position of the workpiece and outputs a complete image of the workpiece under the bright field image and the dark field image. The utility model discloses an in only use single camera and single light source to acquire bright field image and dark field image two kinds of reflected light beams that correspond simultaneously, replaced prior art to adopt the technical scheme of a plurality of cameras and a plurality of light sources, reduced the equipment cost and the debugging degree of difficulty, have the advantage that equipment cost is low and the debugging degree of difficulty is little.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the structures shown in the drawings without creative efforts.
Fig. 1 is a schematic diagram of an optical path and a structure of a first incident beam of a defect detection apparatus according to an embodiment of the present invention;
fig. 2 is a schematic diagram of an optical path and a structure when a second incident beam of the defect detection apparatus according to an embodiment of the present invention is imaged;
fig. 3 is a schematic diagram of an optical path and a structure of the first incident beam on the right side of the second incident beam of the defect detection apparatus according to the embodiment of the present invention;
fig. 4 is a schematic diagram of the optical path and structure of the first incident beam on the left side of the second incident beam in the defect detection apparatus according to the embodiment of the present invention.
The reference numbers illustrate:
1. a light source; 2. a lens; 3. a camera; 4. a workpiece to be tested; 5. and (4) a conveying platform.
The purpose of the present invention, its functional features and advantages will be further described with reference to the accompanying drawings.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
It should be noted that all the directional indicators (such as the upper and lower … …) in the embodiments of the present invention are only used to explain the relative position relationship between the components, the motion situation, etc. in a specific posture (as shown in the drawings), and if the specific posture is changed, the directional indicator is changed accordingly.
In addition, descriptions in the present application as to "first", "second", and the like are for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicit to the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature.
Moreover, the technical solutions of the embodiments of the present invention can be combined with each other, but it is necessary to use a person skilled in the art to realize the basis, and when the technical solutions are combined and contradictory or impossible to realize, the combination of the technical solutions should not exist, and the combination is not within the protection scope of the present invention.
Referring to fig. 1 to 4, the present invention provides a defect detecting apparatus, which includes a conveying platform, a light source and a camera;
the conveying platform 5 is used for placing the workpiece 4 to be measured;
taking a workpiece 4 to be detected as an anchor point, arranging a light source 1 at the upper left of the workpiece 4 to be detected, and arranging a camera 3 at the upper right of the workpiece 4 to be detected;
the single light beam emitted by the light source 1 irradiates on the workpiece 4 to be measured, and generates specular reflection and diffuse reflection to form two reflected light beams corresponding to a bright field image and a dark field image respectively, wherein the two reflected light beams are positioned in the visual field range of the camera. Wherein, bright field image refers to transmitted beam imaging, and dark field image refers to diffracted beam imaging. The bright field image and the dark field image have different physical characteristics, defects such as scratch and edge breakage of the workpiece to be detected are easier to show in the bright field image, and defects such as dust and foreign matters on the surface of the workpiece to be detected are easier to show in the dark field image.
In the above embodiment, two reflected light beams corresponding to the bright field image and the dark field image generated on the workpiece 4 to be measured by the single light beam emitted from the light source 1 can be simultaneously included in the field of view of the camera 3. It should be noted that, as the transfer platform 5 moves, the camera 3 may acquire two reflected light beams corresponding to the bright field image and the dark field image at each position of the panel, and transmit the acquired data to the computer, and the computer processes the received data at each position of the workpiece to output a complete image of the workpiece under the bright field image and the dark field image. In the embodiment, two reflected light beams corresponding to the bright field image and the dark field image are obtained simultaneously by using only a single camera and a single light source, so that the technical scheme that a plurality of cameras and a plurality of light sources are adopted in the prior art is replaced, the equipment cost and the debugging difficulty are reduced, and the method has the advantages of low equipment cost and small debugging difficulty. It should be noted that the light beam emitted by the light source in the present application is divergent. The workpiece 4 to be measured may be a glass panel or other glass product, the camera 3 may include a body and a lens 2, the lens 2 is disposed toward the glass panel, and the camera 3 may be a video camera, a photographing camera, a scanner, or a mobile phone or a tablet computer with a photographing function.
Specifically, to obtain the position ranges of the first incident light beam and the second incident light beam, let us assume that the width of the light source is d, the working distance of the light source is w, the included angle between the axis direction of the light source and the horizontal line is θ, and the included angle between the shooting direction of the camera and the horizontal line is α, then the first position range of the first incident light beam on the surface of the workpiece 4 to be measured corresponding to the dark field image is as follows:
wherein d is the width of the light source 1, w is the working distance of the light source 1, and theta is a first included angle between the axis direction of the light source 1 and a horizontal line;
the second position range of the second incident beam corresponding to the bright field image on the surface of the workpiece to be measured is as follows:
specifically, as shown in fig. 1, the horizontal line refers to a straight line parallel to the workpiece 4 to be measured, as shown in a line a in fig. 1, the straight line of the placement plane of the workpiece to be measured is taken as a numerical axis, the central projection point of the light source 1 is taken as an origin, that is, "0" in fig. 1, the position range of the first incident light beam is from point B to point C, and the distance between point B and the origin on the horizontal line is taken as
The distance of the point C on the horizontal line from the origin is
That is, the range of positions of the first incident light beam is:
as shown in fig. 2, if the straight line of the placement plane of the panel to be measured is the axis and the central projection point of the light source 1 is the origin, i.e., "0" in fig. 1, the position range of the second incident light beam is from point D to point E, and the distance between point D and the origin on the horizontal line is
The distance of the E point on the horizontal line from the origin is
That is, the position range of the second incident light beam is:
in one embodiment, if the first incident light beam and the second incident light beam are adjacent to each other and the first incident light beam is located at the right side of the second incident light beam, the first incident light beam and the second incident light beam satisfy the following condition:
a critical value is obtained:
therefore, the following condition is satisfied when the first incident light beam is right side of the second incident light beam:
wherein d is the width of the light source 1, w is the working distance of the light source 1, θ is a first angle between the axis direction of the light source 1 and the horizontal line, and α is a second angle between the shooting direction of the camera 3 and the horizontal line.
Similarly, in another embodiment, when the first incident beam and the second incident beam are adjacent to each other and the first incident beam is on the left side of the second incident beam, the first incident beam and the second incident beam satisfy the following condition:
the critical value is obtained:
therefore, the following condition is satisfied when the first incident light beam is on the left side of the second incident light beam:
wherein d is the width of the light source 1, w is the working distance of the light source 1, θ is a first angle between the axis direction of the light source 1 and the horizontal line, and α is a second angle between the shooting direction of the camera 3 and the horizontal line.
In one embodiment, the imaging result is more desirable when the parameters of the imaging system are in the following ranges: the ratio of the working distance of the light source to the width of the light source is 2.5; the vertical distance between the camera 3 and the conveying platform is 200 mm-300 mm, and a third included angle between the camera 3 and the horizontal plane is 60 degrees-90 degrees; the vertical distance between the light source 1 and the transmission platform 5 is 9-45 mm, and the fourth included angle between the camera 3 and the horizontal plane is 12-66 degrees; the horizontal distance between the camera 3 and the light source 1 is 100 mm to 450 mm.
In one embodiment, if the frame rate of the camera 3 is f, the pixel equivalent of the camera 3 is s, and the moving speed of the transfer platform 5 is v, f, s, and v satisfy the following formula:
Because the image of the panel is obtained by obtaining the bright field image area image and the dark field image area image (the image obtained by reflecting the received first incident light beam and the second incident light beam) of each position of the panel through the camera 3, and transmitting the image data to the computer, the computer obtains the complete image of the panel under the bright field image area image and the dark field image area image through cutting and splicing the multiple images. k is an integer, which means that the panel is divided into an integer number of regions, avoiding repetition and omission of panel region shots. And through adjusting light source length and camera parameter, can adapt to the panel defect detection scene of different sizes, the commonality is high. The driving member can be connected with the conveying platform 5, and can further control the moving speed of the conveying platform 5, and the driving member can be a driving motor.
Above only be the utility model discloses an optional embodiment to do not consequently restrict the utility model discloses a patent range, all be in the utility model discloses a technical idea down, utilize the equivalent structure transform of doing of the contents of description and the attached drawing, or direct/indirect application all is included in other relevant technical field the utility model discloses a patent protection scope.
Claims (10)
1. A defect detection apparatus, comprising:
a transport platform, a light source, and a camera;
the conveying platform is used for placing a workpiece to be detected;
the workpiece to be detected is taken as an anchor point, the light source is arranged at the upper left of the workpiece to be detected, and the camera is arranged at the upper right of the workpiece to be detected;
the single light beam emitted by the light source irradiates on the workpiece to be detected, and generates specular reflection and diffuse reflection to form two reflected light beams corresponding to a bright field image and a dark field image respectively, wherein the two reflected light beams are positioned in the visual field range of the camera.
2. The apparatus of claim 1, wherein if the width of the light source is d, the working distance of the light source is w, the included angle between the axial direction of the light source and the horizontal line is θ, and the included angle between the shooting direction of the camera and the horizontal line is α, the first position range of the first incident light beam corresponding to the dark field image on the surface of the workpiece to be measured is as follows:
wherein d is the width of the light source, w is the working distance of the light source, and theta is a first included angle between the axis direction of the light source and a horizontal line;
the second position range of the second incident beam corresponding to the bright field image on the surface of the workpiece to be measured is as follows:
wherein d is the width of the light source, w is the working distance of the light source, theta is a first included angle between the axis direction of the light source and a horizontal line, and alpha is a second included angle between the shooting direction of the camera and the horizontal line.
3. The defect detection device of claim 2, wherein if the first incident light beam and the second incident light beam are adjacent and the first incident light beam is located at the right side of the second incident light beam, the first incident light beam and the second incident light beam satisfy the following condition:
if the first incident light beam and the second incident light beam are adjacent and the first incident light beam is located at the right side of the second incident light beam, the first incident light beam and the second incident light beam satisfy the following condition:
wherein d is the width of the light source, w is the working distance of the light source, theta is a first included angle between the axis direction of the light source and a horizontal line, and alpha is a second included angle between the shooting direction of the camera and the horizontal line.
4. The defect detection device of claim 3, wherein if the first incident beam is to the right of the second incident beam, the first incident beam and the second incident beam satisfy the following condition:
wherein d is the width of the light source, w is the working distance of the light source, theta is a first included angle between the axis direction of the light source and a horizontal line, and alpha is a second included angle between the shooting direction of the camera and the horizontal line.
5. The defect detection device of claim 3, wherein if the first incident beam is on the left side of the second incident beam, the first incident beam and the second incident beam satisfy the following condition:
wherein d is the width of the light source, w is the working distance of the light source, theta is a first included angle between the axis direction of the light source and a horizontal line, and alpha is a second included angle between the shooting direction of the camera and the horizontal line.
6. The defect detection apparatus of any of claims 1 to 5, wherein a ratio between a working distance of the light source and a width of the light source is 2.5.
7. The defect inspection apparatus of any of claims 1 to 5, wherein the vertical distance between the camera and the transfer platform is 200 mm to 300 mm, and the third angle between the camera and the horizontal plane is 60 degrees to 90 degrees.
8. The apparatus of any of claims 1 to 5, wherein the light source is positioned at a vertical distance of 9 mm to 45 mm from the transport platform, and the camera is positioned at a fourth angle of 12 degrees to 66 degrees from the horizontal.
9. The defect inspection device of any of claims 1 to 5, wherein the horizontal distance between the camera and the light source is 100 mm to 450 mm.
10. The defect detecting apparatus of any one of claims 1 to 5, wherein if the frame rate of the camera is f, the pixel equivalent of the camera is s, and the moving speed of the transfer platform is v, f, s and v satisfy the following equations:
wherein k is an integer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123073299.8U CN216847517U (en) | 2021-12-08 | 2021-12-08 | Defect detecting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123073299.8U CN216847517U (en) | 2021-12-08 | 2021-12-08 | Defect detecting device |
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| CN216847517U true CN216847517U (en) | 2022-06-28 |
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| CN202123073299.8U Active CN216847517U (en) | 2021-12-08 | 2021-12-08 | Defect detecting device |
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2021
- 2021-12-08 CN CN202123073299.8U patent/CN216847517U/en active Active
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