CN216818278U

CN216818278U - Universal jig for testing PLCC (plastic leaded chip carrier)

Info

Publication number: CN216818278U
Application number: CN202220196901.2U
Authority: CN
Inventors: 付金姣; 毛海燕
Original assignee: Shenzhen Xinsiji Information Technology Co ltd
Current assignee: Shenzhen Xinsiji Information Technology Co ltd
Priority date: 2022-01-24
Filing date: 2022-01-24
Publication date: 2022-06-24
Anticipated expiration: 2032-01-24

Abstract

The application relates to a universal jig for testing PLCC (plastic leaded chip carrier), which comprises a base, an upper cover and a test board; the test board is connected with the lower surface of the base, the upper surface of the base is provided with a placing groove, and the PLCC packaged chip can be placed in the placing groove; the test board is provided with a plurality of pins, and the pins have two or more types; the upper cover is pressed on the upper surface of the base, and the upper cover is matched with the base to press the PLCC packaging chip in the placing groove; and the upper cover is provided with a test port corresponding to the position of the placing groove, and the test port can allow a connecting wire for connecting the PLCC chip and the test board to pass through. The method and the device have the effects of being capable of detecting the PLCC chips with different interfaces and the chips with different sizes.

Description

Universal jig for testing PLCC (plastic leaded chip carrier)

Technical Field

The application relates to the technical field of camera module tooling jigs, in particular to a universal jig for testing PLCC.

Background

The PLCC (Plastic Leaded Chip Carrier) packaging technology is a complex process, belongs to one of surface mount type packages, and is square in appearance, 28-pin, 32-pin and 40-pin packages, and pins are led out from four sides of the packages and are Plastic products. The overall dimension is much smaller than that of DIP packaging, and the PLCC packaging is suitable for being used on the SMT surface mount technology, and has the advantages that: the packaging structure has the advantages of small overall dimension, high reliability and the like, and in the whole packaging process, the PCB has the highest design and wiring requirements, the finest skill and the largest workload.

In the face of market self-purchase PLCC packaging chips and self-sealing PLCC semi-finished products, if the self-purchase PLCC packaging chips and the self-sealing PLCC semi-finished products are directly used for sample preparation, the risk of scrapping or repairing exists. It is often necessary to test it to test for sufficient qualification of the self-purchased PLCC packaged chips. The current method is to test the test object directly by hand, and the method is time-consuming and labor-consuming and has extremely low efficiency.

In order to solve the problems, the related art provides a tool for detecting the PLCC, so that the testing efficiency is improved, but because interfaces of each PLCC finished product or semi-finished product are different, a special tool needs to be manufactured for each PLCC product, the cost is too high, and the practical production is not facilitated.

In view of the above-mentioned related technologies, the inventor considers that the existing tool for testing the PLCC cannot test the PLCC packaged chips with different interfaces.

SUMMERY OF THE UTILITY MODEL

In order to solve the problem that the existing PLCC testing jig can not test PLCC packaged chips with different interfaces manually, the application provides a universal jig for testing PLCC.

The utility model provides a test PLCC universal jig adopts following technical scheme:

a universal fixture for testing PLCC comprises a base, an upper cover and a test board; the test board is connected with the lower surface of the base, the upper surface of the base is provided with a placing groove, and the placing groove can be used for placing a PLCC (plastic leaded chip) packaged chip;

the test board is provided with a plurality of pins, and the pins have two or more types;

the upper cover is pressed on the upper surface of the base, and the upper cover is matched with the base to press the PLCC packaging chip in the placing groove;

the upper cover is provided with a test port corresponding to the position of the placing groove, and the test port can allow a connecting wire for connecting the PLCC chip and the test board to pass through.

By adopting the technical scheme, all pins on the test board form the interfaces of the test board, and different interfaces are formed by the pins with different types, so that PLCC packaged chips with different interfaces can be tested, the defect that the conventional jig can only test the PLCC packaged chip with one type is well overcome, and the cost waste is reduced.

Optionally, the placing groove includes a side wall and a first bottom wall, the opposite side walls are provided with notches, a first accommodating groove is formed between the notches, and the first accommodating groove can accommodate a PLCC packaged chip.

Through adopting above-mentioned technical scheme, set up the breach in the standing groove and form first holding tank, the standing groove is inconsistent with the size of first holding tank, so can hold the PLCC encapsulation chip of different length or width, tests it, has improved the suitability of tool.

Optionally, the first accommodating groove includes a second bottom wall, and the height of the second bottom wall is higher than that of the first bottom wall.

Through adopting above-mentioned technical scheme, because the second diapire is higher than first diapire, so the thickness of the PLCC encapsulation chip that first holding tank and standing groove can hold is inconsistent, has further improved the test suitability of tool to the encapsulation chip of equidimension not promptly.

Optionally, a through hole is formed in the first bottom wall, and a through groove is formed in a position, corresponding to the through hole, of the test board.

Through adopting above-mentioned technical scheme, the existence that leads to groove and through-hole makes standing groove and outside air intercommunication, when putting PLCC encapsulation chip in the standing groove, will lead to the air of groove and through-hole and manage to find time, reaches vacuum adsorption's effect, makes the close quilt of PLCC encapsulation chip adsorb in the standing groove, has greatly reduced in the test process, because PLCC encapsulation chip rocks and leads to the inaccurate probability of test.

Optionally, a first mounting groove is formed in the lower surface of the base, and a short circuit needle seat is arranged in the first mounting groove; a needle hole is arranged on the short circuit needle base;

the dorsal part of first mounting groove is provided with the second mounting groove, short circuit needle file passes first mounting groove and extends to in the second mounting groove the lower surface of upper cover corresponds the position of short circuit needle file is equipped with the conducting block, the second mounting groove can hold the conducting block.

Through adopting above-mentioned technical scheme, when carrying out test work, base and upper cover are the lid and close the state, and the conducting block can be held by the second mounting groove just to with the contact of the short circuit needle on the short circuit needle file, realize the function of test short circuit.

Optionally, the lower surface of the upper cover is provided with a second receiving groove.

Through adopting above-mentioned technical scheme, testing at the PLCC encapsulation chip to the camera module, first holding tank and the cooperation of second holding tank can hold and fix the camera.

Optionally, an adapter plate is arranged on the upper surface of the upper cover, the adapter plate is provided with a first interface area and a second interface area, the first interface area is located above the test port and corresponds to the second interface area, and threading ports are formed in the upper cover and the base.

Through adopting above-mentioned technical scheme, the existence of keysets, play switching PLCC chip and survey the effect of board, need connect plug chip interface many times when testing PLCC chip, can lead to the interface on the chip to damage, so set up the keysets, first interface district is connected with PLCC encapsulation chip, second interface district is connected with surveying the board, through will survey many times plug connection transfer between board and the chip to, survey many times plug connection between the second interface district of board and keysets, protect the interface of chip, also can accomplish test work smoothly.

Optionally, the upper surface of the upper cover is provided with an engagement groove, and the engagement groove enables the adapter plate to be engaged with the upper surface of the upper cover.

Through adopting above-mentioned technical scheme, can be with the firm fixed of keysets on the upper cover for it can be stable signal between switching PLCC chip and the test panel.

Optionally, the upper cover is further provided with a focusing ring, and the focusing ring penetrates through the upper cover and can focus the PLCC packaged chip in the placing groove.

By adopting the technical scheme, the product to be tested is focused in the testing link, so that the product to be tested is clearer.

Optionally, the test board, the base and the upper cover are provided with fixing grooves, and the fixing grooves are used for fixing the test board, the base and the upper cover.

Through adopting above-mentioned technical scheme, when testing the chip, need will survey the test panel and fix at the base lower surface to and pass through the base with the chip and the upper cover is fixed in standing groove or first holding tank, so set up the fixed slot, fix it together through the bolt, so that accomplish test work.

To sum up, the application comprises the following beneficial technical effects: the PLCC packaging chip with different pins or a semi-finished product thereof can be tested; the PLCC chip testing device can test PLCC chips with different lengths, widths and thicknesses and can also focus the PLCC chips of the camera module; whole tool simple structure, the simple operation, the suitability is very high.

Drawings

Fig. 1 is a schematic structural diagram of a universal fixture for testing a PLCC according to an embodiment of the present application;

FIG. 2 is an exploded view of a universal fixture for testing PLCC according to an embodiment of the present application;

FIG. 3 is an enlarged view at A in FIG. 2;

fig. 4 is a schematic structural diagram of a base of a universal fixture for testing PLCC according to an embodiment of the present application;

fig. 5 is a schematic structural diagram of an upper cover of a universal fixture for testing PLCC according to an embodiment of the present application;

fig. 6 is a schematic structural diagram of an interposer for testing a PLCC universal fixture according to an embodiment of the present application;

description of reference numerals: 1. a base; 10. a placement groove; 11. a first bottom wall; 110. a through hole; 111. a notch; 1110. a first accommodating groove; 112. a second bottom wall; 12. a short circuit needle seat; 120. a pinhole; 13. a first mounting groove; 14. a second mounting groove;

2. an upper cover; 20. a test port; 21. a second accommodating groove; 22. a fitting groove; 23. a conductive block;

3. a test board; 31. a pin; 32. a through groove;

4. an adapter plate; 41. a first interface region; 42. a second interface region;

5. a focusing ring; 6. a threading opening.

Detailed Description

The present application is described in further detail below with reference to figures 1-6.

The embodiment of the application discloses a universal fixture for testing PLCC. Referring to fig. 1 and 2, the universal fixture for testing PLCC includes a base 1, an upper cover 2 and a test board 3. The upper surface of the base 1 is provided with a placing groove 10, the placing groove 10 can accommodate a PLCC chip, and the upper cover 2 is provided with a test port 20 corresponding to the position of the placing groove 10; the test board 3 is provided with two or more different types of pins 31. When testing the PLCC encapsulation chip, the test board 3 is connected with the lower surface of the base 1, and the base 1 and the upper cover 2 cover and fix the PLCC encapsulation chip to be tested in the placing groove 10; different pins 31 on the test board 3 can be subjected to wire jumper welding with PLCC chips of different interfaces through the test port 20, so that the purpose of testing the PLCC chips of different interfaces is achieved.

In the testing process, the stability of the chip to be tested is ensured, and the condition that the test is inaccurate due to the shaking is reduced. Fixing grooves (not numbered) are formed in the test board 3, the base 1 and the upper cover 2, and the three are fixed by screws (not shown) penetrating through the fixing grooves.

Referring to fig. 2 and 3, the placement groove 10 includes a first bottom wall 11 and side walls, and notches 111 are provided on the three side walls. A first receiving groove 1110 is formed between the notches 111. First holding tank 1110 includes second diapire 112, because the existence of breach 111, so the length and the width of first holding tank 1110 and standing groove 10 are inconsistent, so can place the PLCC chip of different length and or width and test it, the height of second diapire 112 is higher than first diapire 11, the degree of depth of first holding tank 1110 is less than standing groove 10, so standing groove 10 and first holding tank 1110 can hold the PLCC chip of different thickness, greatly improved the suitability of tool.

Referring to fig. 2 and 3, the first bottom wall 11 is provided with a plurality of through holes 110, and a through slot 32 is disposed on the test board 3 corresponding to the through holes 110. The through groove 32 and the through hole 110 exist, so that the placement groove 10 and the first accommodation groove 1110 communicate with the atmosphere. The purpose of this setting is that, when testing the PLCC chip, it needs to be stably fixed in the placing groove 10 or the first accommodating groove 1110, and the air in the through hole 110 and the through groove 32 can be evacuated to generate a vacuum adsorption effect, so that the PLCC chip to be tested is firmly adsorbed on the first bottom wall 11. In this embodiment, the number of the through holes 110 may be 1, 2, or more, and the number is not limited.

Referring to fig. 2, 4 and 5, the lower surface of the base 1 is provided with a first mounting groove 13, a second mounting groove 14 is provided at the back side of the first mounting groove 13, and a hole is provided at the bottom of the first mounting groove 13 to communicate the first mounting groove 13 with the second mounting groove 14. A short circuit needle seat 12 is arranged in the first mounting groove 13, a needle hole 120 is arranged on the short circuit needle seat 12, a short circuit needle (not shown) passes through the needle hole 120, and the short circuit needle on the short circuit needle seat 12 penetrates through the first mounting groove 13 and extends to the second mounting groove 14. The lower surface of upper cover 2 is provided with conducting block 23 to the position of second mounting groove 14, and when base 1 and upper cover 2 lid, conducting block 23 can get into second mounting groove 14 and contact with the short circuit needle, and then tests the short circuit function.

Referring to fig. 2, 3 and 5, the lower surface of the upper cover 2 is provided with a second receiving groove 21 at a position corresponding to the placement groove 10, and when the base 1 and the upper cover 2 are closed, the second receiving groove 21 cooperates with the first receiving groove 1110 or the placement groove 10 to fix and receive the PLCC chip to be tested.

Referring to fig. 2 and 6, the upper surface of the upper cover 2 is provided with an adaptor plate 4. Specifically, the upper cover 2 is provided with a fitting groove 22, and the shape of the fitting groove 22 matches the adaptor plate 4. In the present embodiment, the fitting groove 22 and the interposer 4 are L-shaped. The lower surface of keysets 4 is equipped with first interface district 41 and second interface district 42, and first interface district 41 corresponds with test port 20, and the PLCC chip of being convenient for is connected with keysets 4, corresponds second interface district 42, has seted up through wires mouth 6 on base 1 and upper cover 2, and the keysets 4 of being convenient for is connected with survey test panel 3. Such as: when a computer motherboard is produced, a PCI function needs to be tested, and then a PCI card is required to be inserted into a PCI slot of the motherboard. In the long-time plugging process, the PCI device card which is frequently inserted is worn. The adapter plate 4 now functions. When the fixture is used to test the PLCC chip, the first interface area 41 is connected to the PLCC chip, and the second interface area 42 is connected to the test board 3.

Referring to fig. 2 and 3, the upper surface of the upper cover 2 is further provided with a focusing ring 5, specifically, the focusing ring 5 is a horn-shaped ring, and a mounting hole is formed in the back side of the second accommodating groove 21 for the focusing ring 5 to penetrate through, so that the focusing ring 5 can contact with the first accommodating groove 1110 or the PLCC chip in the accommodating groove 10, and then focus is performed on the focusing ring.

The implementation principle of the universal fixture for testing the PLCC in the embodiment of the application is as follows: by arranging the test board 3 and arranging different pins 31 on the test board 3, different PLCC chips are adapted to be in jumper wire welding, so that the PLCC chips with different interfaces can be tested; in addition, through the arrangement of the first accommodating groove 1110 and the placing groove 10, PLCC chips with different sizes can be accommodated, so that the PLCC chips are detected, and the applicability of the jig is improved.

The above embodiments are preferred embodiments of the present application, and the protection scope of the present application is not limited by the above embodiments, so: all equivalent changes made according to the structure, shape and principle of the present application shall be covered by the protection scope of the present application.

Claims

1. A test PLCC universal tool which characterized in that: comprises a base (1), an upper cover (2) and a test board (3); the test board (3) is connected with the lower surface of the base (1), a placing groove (10) is formed in the upper surface of the base (1), and the PLCC packaged chip can be placed in the placing groove (10); a plurality of pins (31) are arranged on the test board (3), and the pins (31) have two or more types; the upper cover (2) is pressed on the upper surface of the base (1), and the upper cover (2) is matched with the base (1) to press the PLCC packaging chip in the placing groove (10); the upper cover (2) is provided with a test port (20) corresponding to the position of the placing groove (10), and the test port (20) can allow a connecting line for connecting the PLCC chip and the test board (3) to pass through.

2. The universal fixture for testing PLCC according to claim 1, wherein: the placing groove (10) comprises side walls and a first bottom wall (11), notches (111) are formed in the opposite side walls, a first containing groove (1110) is formed between the notches (111), and the first containing groove (1110) can contain PLCC packaged chips.

3. The universal fixture for testing PLCC according to claim 2, wherein: the first accommodating groove (1110) comprises a second bottom wall (112), and the height of the second bottom wall (112) is higher than that of the first bottom wall (11).

4. The universal fixture for testing PLCC according to claim 2 or 3, wherein: a through hole (110) is formed in the first bottom wall (11), and a through groove (32) is formed in the position, corresponding to the through hole (110), of the test board (3).

5. The universal fixture for testing PLCC according to claim 1, wherein: a first mounting groove (13) is formed in the lower surface of the base (1), and a short circuit needle seat (12) is arranged in the first mounting groove (13); a needle hole (120) is arranged on the short circuit needle seat (12); the dorsal part of first mounting groove (13) is provided with second mounting groove (14), short circuit needle file (12) pass first mounting groove (13) and extend to in second mounting groove (14) the lower surface of upper cover (2) corresponds the position of short circuit needle file (12) is equipped with conducting block (23), second mounting groove (14) can hold conducting block (23).

6. The universal fixture for testing PLCC according to claim 1, wherein: the lower surface of upper cover (2) is provided with second holding tank (21).

7. The universal fixture for testing PLCC according to claim 1, wherein: the upper surface of the upper cover (2) is provided with an adapter plate (4), the adapter plate (4) is provided with a first interface area (41) and a second interface area (42), the first interface area (41) is located above the test port (20) and corresponds to the second interface area (42), and the upper cover (2) and the base (1) are both provided with threading ports (6).

8. The universal fixture for testing PLCC according to claim 1, wherein: the upper surface of the upper cover (2) is provided with an embedding groove (22), and the embedding groove (22) enables the adapter plate (4) to be just embedded on the upper surface of the upper cover (2).

9. The universal fixture for testing PLCC of claim 6, wherein: the upper cover (2) is further provided with a focusing ring (5), the focusing ring (5) penetrates through the upper cover (2) and can focus PLCC packaging chips in the placing groove (10).

10. The universal fixture for testing PLCC according to claim 1, wherein: survey test panel (3), base (1) and upper cover (2) and all be equipped with the fixed slot, the fixed slot is used for fixed survey test panel (3), base (1) and upper cover (2).