CN216770981U - Laser testing system - Google Patents

Abstract

The application provides a laser instrument test system, includes: an electronic device; the main control card comprises a first interface, at least two second interfaces and a controller, wherein the first interface is used for being electrically connected with the electronic equipment, and the controller is in communication connection with the first interface and the second interfaces; the system comprises a main control card and multiple types of expansion cards, wherein each type of expansion card comprises a third interface and a fourth interface, the third interface is used for being electrically connected with the second interface of the main control card, and the fourth interface is used for being electrically connected with a corresponding type of laser to be tested. The method and the device can detect parameters of various lasers of different types, so that the detection efficiency is improved.

Description

Laser testing system

Technical Field

The application relates to the field of lasers, in particular to a laser testing system.

Background

Before the laser is used, various parameters of laser emitted by the laser need to be tested, and when a user tests characteristic parameters of lasers of different brands and different types, hardware and software of different types need to be purchased or replaced frequently, so that the mode is low in efficiency, and meanwhile, the accuracy of a test result is easily influenced.

SUMMERY OF THE UTILITY MODEL

In view of the above, there is a need to provide a laser testing system capable of detecting a plurality of different types of lasers, so as to improve the testing efficiency and ensure the accuracy of the testing result.

The application provides laser instrument test system, laser instrument test system includes: an electronic device; the main control card comprises a first interface, at least two second interfaces and a controller, wherein the first interface is used for being electrically connected with the electronic equipment, and the controller is in communication connection with the first interface and the second interfaces; the laser testing system comprises a main control card, a plurality of types of expansion cards and a plurality of testing modules, wherein each type of expansion card comprises a third interface and a fourth interface, the third interface is used for being electrically connected with the second interface of the main control card, and the fourth interface is used for being electrically connected with a corresponding type of laser to be tested.

In a possible implementation manner, the electronic device is configured to display a laser type configuration interface, where a laser type list is displayed on the laser type configuration interface, and is configured to receive a command selected by a user for a laser type, and determine the laser type corresponding to the selected command as a target type.

In a possible implementation manner, the electronic device is further configured to display a laser parameter configuration interface, where multiple laser parameter options are displayed on the laser parameter configuration interface, and are configured to receive a setting instruction of a user on a laser parameter, determine a target parameter of the laser according to the setting specification, receive, by the master card, the target type and the target parameter sent by the electronic device through a first interface, select an expansion card of a corresponding type according to the target type, send the target parameter to the expansion card of the corresponding type through a second interface connected to the expansion card of the selected type, and send the target parameter to the laser to be tested through the expansion card of the corresponding type, so that the laser to be tested emits light according to the target parameter, and the electronic device can obtain an emission parameter of laser emitted by the laser, and determining the test result of the laser according to the target parameter and the emission parameter.

In one possible implementation, the expansion card includes: FIBER expansion card, YAG expansion card, CO2 expansion card, QCW-5V expansion card, QCW-24V expansion card, IPG-E expansion card, IPG-YLP expansion card, the laser includes: FIBER laser, CO2 gas laser, IPG-YLPE laser, IPG-YLM laser, FIBER laser, and solid laser.

In a possible implementation, the fourth interface is a physical interface configured according to different types of lasers, and is capable of matching and communicating with the type of laser to be tested.

In one possible implementation, the interface of the FIBER expansion card is a FIBER laser supporting a DB25 interface; the fourth interface of the YAG expansion card is an interface of a medium solid laser supporting a DB25 interface; the fourth interface of the CO2 expansion card is an interface of a CO2 gas laser supporting a DB25 interface; the fourth interface of the QCW-5V expansion card is an interface supporting an IPG-YLM series DB25 interface laser; the fourth interface of the QCW-24V expansion card is an interface supporting an IPG-YLR series DB25 interface laser; the interface of the IPG-E expansion card is the interface of a pulse laser supporting the IPG-YLP series DB25 interface.

In a possible implementation, the first interface of the main control card is a USB interface.

The application discloses a laser instrument test system, through utilizing master control card to connect polytype expansion card, can realize the test to polytype laser instrument simultaneously. The target parameters of the laser are controlled through the electronic equipment, so that the laser emitted by the laser is accurately controlled, and the laser is more accurately tested.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.

Fig. 1 is a schematic structural diagram of a laser test system according to an embodiment of the present application.

Fig. 2 is a schematic structural diagram of a plurality of expansion cards provided in an embodiment of the present application.

Fig. 3 is a schematic diagram of a laser type configuration interface according to an embodiment of the present disclosure.

Fig. 4 is a schematic view of a first local area of a laser parameter configuration interface according to an embodiment of the present disclosure.

Fig. 5 is a schematic structural diagram of an electronic device implementing a laser testing method according to an embodiment of the present application.

Fig. 6 is a schematic diagram of a second partial area of a laser parameter configuration interface according to an embodiment of the present disclosure.

Detailed Description

In order that the above objects, features and advantages of the present application can be more clearly understood, a detailed description of the present application will be given below with reference to the accompanying drawings and specific embodiments. It should be noted that the embodiments and features of the embodiments of the present application may be combined with each other without conflict.

In the following description, numerous specific details are set forth to provide a thorough understanding of the present application, and the described embodiments are merely a subset of the embodiments of the present application and are not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

As shown in fig. 1, a laser test system 1 of the present application is provided for testing different types of lasers 13. In one embodiment, the laser test system 1 comprises: electronic device 10, main control card 11, multiple types of expansion cards 12.

In one embodiment of the present application, the electronic device 10 may be a computer, a mobile phone, a tablet computer, a Personal Digital Assistant (PDA), or the like, which stores laser testing software.

The main control card 11 includes a first interface 110, at least two second interfaces 111, and a memory 112. The first interface 110 is used for connecting the electronic device 10 and receiving a control instruction from the electronic device 10. Each second interface 111 is used for connecting at least one type of expansion card 12. The memory 112 is used to store control programs for various types of lasers. In an embodiment of the present application, the first interface 110 of the main control card 11 may be a USB interface, and is accessed to the electronic device 10 in a USB mode. In other ways, the first interface 110 may also be other types of interfaces, and the application does not specifically limit the type of interface.

Each type of expansion card 12 includes a third interface 120 and a fourth interface 121, where the third interface 120 is used to connect one second interface of the main control card 11, and the fourth interface 121 is used to electrically connect to a corresponding type of laser 13 to be tested, so as to test the laser 13.

In an embodiment of the present application, the third interface 120 may be a USB interface, or may be any other communication interface capable of electrically connecting the expansion card 12 and the main control card 11, which is not limited in this application. The fourth interface 121 is a physical interface configured according to different types of lasers 13, and can match and communicate with the type of laser 13 to be tested. FIBER lasers supporting a DB25 interface, such as FIBER expansion cards; YAG expansion card: a Yag medium solid laser supporting a DB25 interface; CO2 expansion card: a CO2 gas laser supporting a DB25 interface; QCW-5V expansion card: supports an IPG-YLM series DB25 interface laser; QCW-24V expansion card: supports an IPG-YLR series DB25 interface laser; IPG-E expansion card: a pulsed laser supporting an IPG-YLP series DB25 interface, as shown in fig. 2.

In one embodiment of the present application, the plurality of types of expansion cards 12 may include: an IPG-E expansion card, a QCW-5V expansion card, an IPG-YLP expansion card and a YAG expansion card, the laser 13 may include: IPG-YLPE laser, IPG-YLM laser, FIBER laser and solid laser. Wherein the solid state laser may include: nanosecond lasers, picosecond lasers and femtosecond lasers. It should be noted that different types of expansion cards correspond to different types of lasers, for example, the IPG-E expansion card corresponds to the IPG-ylppe laser, that is, when testing the IPG-ylppe laser, the IPG-ylppe laser needs to be connected with the IPG-E expansion card. For another example, the YAG expansion card corresponds to a solid laser, and when the solid laser is tested, the solid laser needs to be connected to the YAG expansion card. It should be noted that, a main control card is connected with a plurality of expansion cards, and an expansion card is connected with a laser.

Please refer to fig. 4, which is a schematic diagram of the electronic device 10 according to an embodiment of the present application. Referring to fig. 4, the electronic device 10 includes, but is not limited to, a memory 101 and at least one processor 102, which may be connected via a bus (e.g., 103) or directly.

The electronic device 10 may be a computer, a mobile phone, a tablet computer, a Personal Digital Assistant (PDA), or other devices installed with an application program. Those skilled in the art will appreciate that the schematic diagram 5 is merely an example of the electronic device 10, and does not constitute a limitation of the electronic device 10, and may include more or less components than those shown, or combine certain components, or different components, for example, the electronic device 10 may further include input-output devices, network access devices, buses, etc.

When the electronic device 10 runs the laser test software, a laser type configuration interface may be displayed, and a laser type list is displayed on the laser type configuration interface, and is used to receive a selected instruction of a user for a laser type, determine the laser type corresponding to the selected instruction as the target type, and send the target type to the main control card 11. Such as the interface shown in fig. 2. It should be noted that the electronic device 10 is equipped with laser test software. A laser parameter configuration interface is also displayed on the electronic device 10, and a plurality of laser parameter options are displayed on the laser parameter configuration interface, and are used for receiving a setting instruction of a user on a laser parameter, and determining a target parameter of the laser according to the setting specification. For example, the portion of the display interface shown in FIG. 3. Wherein the target parameter may include: laser power, laser frequency, and pulse width.

When the main control card 11 receives a setting instruction with a target type and/or a target parameter, the target parameter is converted into a corresponding data signal through a stored control program, and the corresponding data signal is transmitted to the laser 13 through the plurality of types of expansion cards 12, so that the laser 13 emits laser according to the target parameter.

The main control card is used for connecting multiple types of expansion cards, so that multiple types of lasers can be tested simultaneously. The target parameters of the laser are controlled through the electronic equipment, so that the laser emitted by the laser is accurately controlled, and the laser is more accurately tested.

In another embodiment of the present application, the electronic device 10 and the main control card 11 may also be integrated in the same device.

When the laser testing device is used for testing a laser, firstly, a target laser is connected through the expansion card.

In one embodiment of the present application, the target laser may be selected according to the actual needs of the user, and may be one or more. And connecting the target laser to different types of expansion cards according to the type of the target laser. For example, the target lasers are a VPFL-ISP-2000 laser and a FIBER laser respectively, the VPFL-ISP-2000 laser is connected to an IPG-E expansion card, and the FIBER laser is connected to an IPG-YLP expansion card.

Different types of lasers can be tested simultaneously by connecting various types of expansion cards, and the testing efficiency can be improved.

And secondly, selecting the type of the target laser through a laser type configuration interface in the electronic equipment, and setting a target parameter of laser emitted by the target laser through the laser parameter configuration interface.

In an embodiment of the present application, the electronic device is equipped with an lzlaser. exe program, and after the user opens the lzlaser. exe program, the user clicks an F3 button to enter the laser type configuration interface, or the user may enter the laser type configuration interface in other manners. Specifically, a laser type list is displayed on the laser type configuration interface, and a user can select a target type through the laser type list according to the type of the target laser. For example, the type of the target laser is an IPG-YLPP laser, and the user can select an IPG-YLPP option in the laser type list.

In an embodiment of the present application, after the target type selection is completed, a main interface of the lzlaser. Specifically, a laser parameter list is displayed on the laser parameter configuration interface, and a user can set target parameters of the target laser through the laser parameters according to actual requirements. For example, the laser frequency is set to 20kHz and the laser power is set to 50%.

In an embodiment of the present application, the target parameter further includes a laser outgoing light, where the outgoing light refers to a light outgoing form of the laser, and the laser emits light according to the outgoing light. Such as the spiral shown in fig. 6.

The target parameters of the target laser are controlled by the electronic equipment, so that the laser emitted by the target laser is accurately controlled, and the laser can be more accurately tested.

And thirdly, controlling the target laser to emit laser by using the electronic equipment.

In an embodiment of the present application, after the target type and the target parameter setting of the target laser are completed, the user may send the light emitting indication and the target parameter through the light emitting control button in the lz laser. Responding to the light-emitting indication and the target parameters, the main control card converts the target parameters into corresponding data signals and transmits the corresponding data signals to the target laser through the plurality of types of expansion cards, and the target laser emits laser according to the data signals.

And fourthly, acquiring emission parameters of the laser emitted by the target laser.

In order to test whether the light emitted by the target laser is normal, the actual parameters of the emitted laser of the target laser need to be acquired.

In an embodiment of the present application, after the target laser emits laser light, a power meter may be used to detect the laser power of the target laser, a spectrometer may detect the laser frequency of the target laser, and an oscilloscope may detect the pulse width of the target laser. And taking the detected laser power, laser frequency and pulse width as the emission parameters.

And fifthly, determining a test result of the target laser according to the target parameter and the emission parameter.

In an embodiment of the present application, the determining the test result of the target laser according to the target parameter and the emission parameter includes: judging whether the target parameter is the same as the transmitting parameter; when the target parameter is the same as the emission parameter, generating a normal test result of the laser; and when the target parameter is different from the emission parameter, generating an abnormal test result of the laser. For example, the laser frequency set in the second step is 20kHz, the laser power is 50%, the laser frequency detected in the fourth step is 20kHz, and the laser power is 45%, obviously, the target parameter is inconsistent with the emission parameter, and a test result of laser power abnormality is output.

By comparing the target parameter with the emission parameter, the abnormal item of the target laser can be acquired, and the acquired test result is more accurate.

Referring to fig. 4, in the present embodiment, the memory 101 may be an internal memory of the electronic device 10, that is, a memory built in the electronic device 10. In other embodiments, the memory 101 may also be an external memory of the electronic device 10, i.e., a memory externally connected to the electronic device 10.

In some embodiments, the memory 101 is used for storing program codes and various data, and for implementing high-speed and automatic access to programs or data during operation of the electronic device 10.

The memory 101 may include random access memory, and may also include non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), at least one magnetic disk storage device, a Flash memory device, or other volatile solid state storage device.

In some embodiments, the Processor 102 may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic device, discrete hardware component, or the like. A general purpose processor may be a microprocessor or the processor may be any other conventional processor or the like.

The program code and various data in the memory 101 may be stored in a computer-readable storage medium if they are implemented in the form of software functional units and sold or used as separate products. Based on such understanding, all or part of the processes in the methods of the embodiments described above, for example, the steps in the methods for prolonging the service life of the battery, may also be implemented by a computer program, which may be stored in a computer-readable storage medium and can be executed by a processor to implement the steps of the embodiments of the methods described above. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, U disk, removable hard disk, magnetic disk, optical disk, computer Memory, Read-Only Memory (ROM), or the like.

It is understood that the above described division of modules is a logical division, and there may be other divisions when the module is actually implemented. In addition, functional modules in the embodiments of the present application may be integrated into the same processing unit, or each module may exist alone physically, or two or more modules are integrated into the same unit. The integrated module can be realized in a hardware form, and can also be realized in a form of hardware and a software functional module.

Finally, it should be noted that the above embodiments are only used for illustrating the technical solutions of the present application and not for limiting, and although the present application is described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that modifications or equivalent substitutions can be made on the technical solutions of the present application without departing from the spirit and scope of the technical solutions of the present application.

Claims (5)

1. A laser testing system, comprising:

an electronic device;

the main control card comprises a first interface, at least two second interfaces and a controller, wherein the first interface is used for being electrically connected with the electronic equipment, and the controller is in communication connection with the first interface and the second interfaces;

the system comprises a main control card and multiple types of expansion cards, wherein each type of expansion card comprises a third interface and a fourth interface, the third interface is used for being electrically connected with the second interface of the main control card, and the fourth interface is used for being electrically connected with a corresponding type of laser to be tested.

2. The laser test system of claim 1, wherein the expansion card comprises: FIBER expansion card, YAG expansion card, CO2 expansion card, QCW-5V expansion card, QCW-24V expansion card, IPG-E expansion card, IPG-YLP expansion card, the laser includes: the laser comprises a FIBER laser, a CO2 gas laser, an IPG-YLPE laser, an IPG-YLM laser, a FIBER laser and a solid laser.

3. The laser test system of claim 2, wherein the fourth interface is a physical interface configured for different types of lasers, and is capable of matching and communicating with the type of laser to be tested.

4. The laser test system of claim 3, wherein the interface of the FIBER expansion card is a FIBER laser supporting a DB25 interface; the fourth interface of the YAG expansion card is an interface of a medium solid laser supporting a DB25 interface; the fourth interface of the CO2 expansion card is an interface of a CO2 gas laser supporting a DB25 interface; the fourth interface of the QCW-5V expansion card is an interface supporting an IPG-YLM series DB25 interface laser; the fourth interface of the QCW-24V expansion card is an interface supporting an IPG-YLR series DB25 interface laser; the interface of the IPG-E expansion card is the interface of a pulse laser supporting the IPG-YLP series DB25 interface.

5. The laser test system of claim 1, wherein the first interface of the host card is a USB interface.

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