CN216747450U - Defect detection device - Google Patents

Abstract

The utility model discloses a defect detecting device, include: the imaging device is used for collecting light and imaging and comprises a camera and a lens; the first light source is used for emitting first detection light rays, and the first detection light rays are reflected by the first detected workpiece to form first characteristic light rays; the second light source is used for emitting second detection light rays, and the second detection light rays are reflected by the second detected workpiece to form second characteristic light rays; and the reflecting device is used for guiding and reflecting the first characteristic light rays and the second characteristic light rays to the imaging device at the same time, and is arranged on a common light path of the first characteristic light rays and the second characteristic light rays. The utility model discloses can guide the characteristic light that contains two measured workpiece surface characteristics simultaneously and reflect formation of image in image device, reach the purpose of practicing thrift image device and simplifying the detection process to reduce the detection cost, and improved detection efficiency.

Description

Defect detection device

Technical Field

The utility model relates to a machine vision technical field especially relates to a defect detecting device.

Background

With the continuous development of machine vision technology, machine vision inspection is an indispensable important link in intelligent manufacturing nowadays, and in the production stage of products, machine vision is required to be utilized for defect inspection, so that the quality of finished products is ensured.

For some assembled products, each part needs to be subjected to defect detection, and when all parts are qualified, the parts are assembled into a whole to obtain a qualified finished product. At present, when the defect detection is carried out on the assembled product, each component part is required to be respectively arranged in different detection devices for carrying out the defect detection one by one, and finally, the component parts are conveyed to an assembly station by a conveying device for assembly; therefore, a plurality of detection devices need to be arranged to perform imaging analysis one by one, which results in higher detection cost and difficulty in improving detection efficiency.

SUMMERY OF THE UTILITY MODEL

The defect detection device is not enough to prior art, the utility model provides a defect detection device solves prior art, when carrying out the defect detection to the product of assembled, need set up a plurality of image device in order to form images the analysis one by one, leads to detecting the cost higher, and detection efficiency is difficult to the problem that promotes.

In order to achieve the above object, the present invention provides the following technical solutions:

a defect detection apparatus, comprising:

the imaging device is used for collecting light and imaging and comprises a camera and a lens;

the first light source is used for emitting first detection light, and the first detection light is reflected by a first workpiece to be detected to form first characteristic light;

the second light source is used for emitting second detection light rays, and the second detection light rays are reflected by a second detected workpiece to form second characteristic light rays;

and the reflecting device is used for simultaneously guiding and reflecting the first characteristic light ray and the second characteristic light ray to the imaging device, and is arranged on a common light path of the first characteristic light ray and the second characteristic light ray.

Optionally, the defect detecting apparatus further includes:

the light splitting device is used for guiding the light rays emitted by the first light source to the first workpiece to be detected and is arranged on a light path of the first detection light rays;

the optical path of the first detection light is perpendicular to the optical path of the second detection light.

Optionally, the first light source includes a first lamp panel and a first diffusion plate disposed along a light path of the first detection light.

Optionally, the second light source includes a second lamp panel and a second diffuser plate disposed along a light path of the second detection light;

the second lamp plate is of an annular structure.

Optionally, the defect detecting apparatus further includes:

an image analyzer for recognizing a location mark on an image formed by the camera, the image analyzer being connected to the camera;

and the grabbing robot is used for grabbing the first workpiece to be measured or the second workpiece to be measured and adjusting the position of the first workpiece to be measured or the second workpiece to be measured based on the positioning identifier, and is connected to the image analyzer.

Optionally, the defect detection apparatus further includes an apparatus housing, the apparatus housing is provided with a first light outlet, and the first characteristic light enters the reflection device through the first light outlet;

and a first lens is arranged in the first light outlet.

Optionally, a first mounting seat for detachably mounting the light source is arranged on the device housing, and the first light outlet is formed in the first mounting seat;

and a first pressing ring for fixing the first lens increasing body is arranged on the first mounting seat.

Optionally, the device housing is further provided with a second light outlet, the second light outlet and the first light outlet are oppositely arranged, and the second characteristic light enters the reflection device through the second light outlet;

and a second lens is arranged in the second light outlet.

Optionally, a second mounting seat for detachably mounting a light source is arranged on the device housing, the second light source is detachably mounted on the second mounting seat, and the second light outlet is formed in the second mounting seat;

and a second pressing ring for fixing the second lens increasing body is arranged on the second mounting seat.

Optionally, a spare part accommodating cavity for accommodating a spare part is further arranged on the device shell.

Compared with the prior art, the utility model discloses following beneficial effect has:

the utility model provides a defect detecting device can guide and reflect the formation of image to image device in containing two measured workpiece surface characteristics's characteristic light simultaneously, reaches the purpose of practicing thrift image device and simplifying the detection process to reduce the detection cost, and improved detection efficiency.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without inventive exercise.

Fig. 1 is a schematic view of a partial structure of a defect detection apparatus provided by the present invention;

fig. 2 is a schematic diagram of an optical path of a defect detection apparatus provided by the present invention;

fig. 3 is an exploded view of a partial structure of a defect detecting apparatus provided by the present invention;

fig. 4 is an exploded view of a second light source in a defect detection apparatus provided by the present invention;

fig. 5 is a schematic diagram of a wiring of a lamp bead in the defect detection apparatus provided by the present invention;

fig. 6 is a chip distribution diagram of lamp beads in the defect detection apparatus provided by the present invention;

fig. 7 is a further chip distribution diagram of lamp beads in the defect detection apparatus provided by the present invention;

fig. 8 is an exploded view of a partial structure at another viewing angle of the defect detection apparatus provided by the present invention;

FIG. 9 is a schematic diagram of a universal ring light source;

FIG. 10 is a schematic diagram of an annular unidirectional diffuse light source;

FIG. 11 is a schematic diagram of an annular bi-directional diffuse light source;

FIG. 12 is a schematic diagram of an annular multi-directional diffuse light source;

FIG. 13 is a schematic view of an annular shadowless light source;

FIG. 14 is a schematic view of a spherically distributed symmetric shadowless light source;

FIG. 15 is a schematic view of a light source with an annular integrating sphere;

FIG. 16 shows an AOI inspection light source.

In the above figures: 10. a device housing; 11. a first light outlet; 111. a first mounting seat; 112. a first booster lens; 113. a first clamping ring; 12. a second light outlet; 121. a second mounting seat; 122. a second booster lens; 123. a second clamping ring; 13. a third mounting seat; 14. a fourth mounting seat; 15. a fifth mounting seat; 16. a spare part accommodating chamber; 161. a first antireflection mirror backup member; 162. a second antireflection mirror backup member; 163. a light source spare; 17. a first light source line; 171. a positive common line; 172. a red light emitting chip cathode line; 173. a green light emitting chip cathode line; 174. a blue light emitting chip negative electrode line; 18. a side mounting plate; 21. a first light source; 211. a first lamp panel; 212. a first diffusion plate; 22. a light-splitting device; 23. a second light source; 231. a light source main body; 232. a second lamp panel; 233. a second diffusion plate; 234. a light source circumference; 24. a reflective device; 25. a second light source line; 31. a camera; 32. a lens; 41. a first workpiece to be tested; 42. and a second workpiece to be measured.

Detailed Description

In order to make the objects, features and advantages of the present invention more obvious and understandable, the embodiments of the present invention are clearly and completely described with reference to the drawings in the embodiments of the present invention, and obviously, the embodiments described below are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.

In the description of the present invention, it is to be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. When a component is referred to as being "disposed on" another component, it can be directly on the other component or intervening components may also be present.

Furthermore, the terms "long", "short", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships illustrated in the drawings, and are only for convenience of describing the present invention, but do not indicate or imply that the device or element referred to must have the specific orientation, operate in the specific orientation configuration, and thus, should not be construed as limiting the present invention.

Nowadays, the electronic industry carries out industry upgrading and product iteration with the situation of rapid development day by day, and electronic products such as mobile phones, computers, household appliances, intelligent vehicles, wearing and the like appear like spring bamboo shoots after rain, so that the work and life of people are enriched. In the automatic production process of these electronic products, there are some processes of pad printing on the surface of the appearance part and cooperative assembly at different stations, and it is necessary to detect surface defects of different workpieces.

In the past, a single detection light source and a single imaging device are arranged aiming at a single station so as to realize the surface characteristic defect detection of a single workpiece. Under this kind of detection mode, need detect one by one to a plurality of work pieces that wait to assemble, lead to that the detection cost is higher, detection efficiency is lower simultaneously. In order to solve the problem, the utility model provides a defect detecting device.

The technical solution of the present invention is further explained by the following embodiments with reference to the accompanying drawings.

Referring to fig. 1 and fig. 2 in combination, an embodiment of the present invention provides a defect detecting apparatus, including:

the imaging device comprises a camera 31 and a lens 32 and is used for collecting light rays and imaging to realize characteristic image shooting and image data transmission of the detected workpiece;

the first light source 21 is configured to emit first detection light to illuminate surface features of the first detected workpiece 41, and the first detection light is reflected by the first detected workpiece 41 to form first feature light;

the second light source 23 is configured to emit a second detection light to illuminate the surface feature of the second workpiece 42 to be detected, and the second detection light is reflected by the second workpiece 42 to form a second feature light;

the reflecting device 24 is used for guiding and reflecting the first characteristic light and the second characteristic light to the imaging device for imaging so as to obtain a first characteristic image and a second characteristic image respectively; the reflection device 24 is disposed on a common optical path of the first characteristic light and the second characteristic light.

Based on the structure, the simultaneous detection imaging of the first detected workpiece 41 and the second detected workpiece 42 can be realized, the cost of the imaging device is saved, the process of detecting each workpiece one by one is omitted, and the detection efficiency is effectively improved.

Referring to fig. 1 to 3, in the present embodiment, the defect detecting apparatus further includes an apparatus housing 10, the apparatus housing 10 is provided with a first light outlet 11 and a second light outlet 12, the second light outlet 12 is opposite to the first light outlet 11, the first characteristic light enters the reflective device 24 through the first light outlet 11, and the second characteristic light enters the reflective device 24 through the second light outlet 12.

The device housing 10 is provided with a first mounting seat 111 for detachably mounting a light source, the first mounting seat 111 can be used for mounting and dismounting the light source, and an annular light source can be mounted on the first mounting seat 111 when necessary to replace the original first light source 21, so that the defect detection of the first workpiece 41 to be detected is realized.

The first light outlet 11 is disposed on the first mounting base 111, a first lens 112 is disposed in the first light outlet 11, and the first mounting base 111 is provided with a first pressing ring 113 for fixing the first lens 112.

The device shell 10 is provided with a second mounting seat 121 for detachably mounting the light source, and the second light source 23 is detachably mounted on the second mounting seat 121; by using the second mounting seat 121, the second light source 23 can be replaced when needed, which is beneficial to adjusting the type of the second light source 23 according to actual detection requirements.

The second light outlet 12 is opened on the second mounting base 121, a second lens 122 is disposed in the second light outlet 12, and a second pressing ring 123 for fixing the second lens 122 is disposed on the second mounting base 121.

Based on the structure, different light source types can be replaced by using the first mounting seat 111 and the second mounting seat 121, the mounting positions of the two light sources can be replaced, and the detection device can adapt to different detection environments, so that functional expansion can be easily realized on the premise of not changing the structure of the detection device, and the application flexibility of the detection device can be improved.

The light path of the first detection light is vertical to the light path of the second detection light; the defect detecting apparatus further includes a light splitter 22 for guiding the light emitted from the first light source 21 to the first workpiece 41 to be detected, wherein the light splitter 22 is specifically a light splitting sheet plated with a semi-transparent and semi-reflective film, is installed in the apparatus housing 10 through the third mounting seat 13, and is disposed on the light emitting path of the first light source 21.

By using the light splitting device 22, a part of the first detection light is reflected to the first workpiece 41 to be detected, so as to realize the surface detection of the first workpiece 41 to be detected. It will be appreciated that the first characteristic ray is transmitted through the light splitting device 22 to be incident on the reflecting device 24.

Further, in the present embodiment, the reflection device 24 is a triangular total reflection prism, which is installed in the device housing 10 through the fourth installation seat 14 and has the shape of an isosceles right triangle; therefore, the first workpiece to be measured 41, the second workpiece to be measured 42 and the reflecting device 24 can be coaxially arranged, and the assembling process of the device is facilitated to be simplified.

Further, the image forming apparatus is mounted in the apparatus case 10 through a fifth mount 15; it will be appreciated that the fifth mount 15 is provided with a plurality of mounting holes for adjusting the mounting height of the image forming apparatus and the distance between the image forming apparatus and the reflection device 24.

Referring to fig. 3, the first light source 21 further includes a first lamp panel 211 and a first diffusion plate 212 disposed along the optical path of the first detection light. The first light source 21 is powered and controlled by a first light source 21 line 17.

Referring to fig. 4, the second light source 23 includes a light source main body 231, and a second lamp panel 232 and a second diffusion plate 233 disposed along the light path of the second detection light are disposed on the light source main body 231.

The first diffusion plate 212 and the second diffusion plate 233 can form a smaller divergence angle with light passing through the surfaces thereof, so that the light is more concentrated and tends to be parallel to a light band, and the light emitting uniformity is higher, thereby improving the utilization rate of the light, and preventing particles formed by the light from projecting to the surface of a highly reflective workpiece to influence the image recognition.

The second light source 23 further includes a light source circumference 234 enclosing the second lamp panel 232 and the second diffusion plate 233 therein, and a diffusion plate pressing ring for fixing the second diffusion plate 233 is disposed at the top of the light source circumference 234. The second light source 23 is powered and controlled by a second light source line 25.

Wherein, this second lamp plate 232 is the loop configuration, forms the light via hole in the center of second lamp plate 232, and first characteristic light can penetrate into reflection device 24 through this light via hole.

A plurality of lamp beads are uniformly distributed on the first lamp panel 211 and the second lamp panel 232; the lamp beads are RBG three-color LED lamp beads with red light-emitting chips R, green light-emitting chips G and blue light-emitting chips B. Therefore, in practical application, the colors of the first lamp panel 211 and the second lamp panel 232 can be freely selected and adjusted according to the surface characteristics and the colors of the workpiece to be measured, so that the colors of the first lamp panel 211 and the second lamp panel 232 can be one color or the mixture of multiple colors.

Specifically, as shown in fig. 5, taking the first light source 21 line 17 as an example, the anodes of the red light emitting chip R, the green light emitting chip G and the blue light emitting chip B are connected together by the anode common line 171, and the red light emitting chip cathode line 172, the green light emitting chip cathode line 173 and the blue light emitting chip cathode line 174 are separately connected, so that the lighting modes of different colors in the lamp bead can be realized; finally, the required color, color temperature and brightness can be prepared according to different detection requirements by adjusting the input current of each color chip.

In the first light source 21, the first lamp panel 211 may adopt a plug-in lamp panel as shown in fig. 6, and the red light emitting chip R, the green light emitting chip G and the blue light emitting chip of the lamp bead are distributed in a triangular manner; or selecting a patch lamp panel as shown in fig. 7, wherein the red light emitting chip R, the green light emitting chip G and the blue light emitting chip of the lamp bead can be distributed in a linear manner; the method can be selected according to actual detection requirements. It can be understood that no matter be plug-in components lamp plate or paster lamp plate, all can be in order to realize fast switch over through quick plug terminal.

Further, the device housing 10 may further be provided with a heat dissipation device, such as a heat dissipation plate, a water-cooling heat sink or an air-cooling heat sink, to achieve heat dissipation of the lamp panel, thereby improving the service life of the lamp panel, ensuring stable and durable illumination of the lamp panel, and saving the investment of production and inspection costs.

Referring to fig. 8, in the present embodiment, the device housing 10 is further provided with a spare part accommodating cavity 16 for accommodating a spare part. In practical applications, the spare part receiving cavity 16 can accommodate the following components: a first spare part 161 and a second spare part 162 for antireflection lenses, which are used for being replaced conveniently when the lenses are dirty, scratched and damaged; the light source spare part 163 is used for responding to different detection requirements so as to replace the first light source 21 or the second light source 23.

Specifically, two receiving grooves are formed in the device housing 10, the side mounting plates 18 are mounted on the outer sides of the two receiving grooves in a covering manner, the first mounting seat 111 is formed in a portion of the side mounting plate 18 in one of the receiving grooves, and the side mounting plate 18 and the other receiving groove surround to form an equipment part receiving cavity.

It will be appreciated that in practice the types of first and second light sources 21, 23 within the device may be changed as required.

For example:

as shown in fig. 9, a general-purpose annular light source is employed as the first light source 21 or the second light source 23; in this general type annular light source, lamp plate P is the round platform form, and the lamp pearl distributes in the medial surface of lamp plate P for the light slope that lamp plate P sent shines in being surveyed product 50. Based on the method, illumination at different angles can be realized, so that the three-dimensional information of the curved surface on the tested product 50 is highlighted, and the problem of diagonal illumination shadow is effectively solved; this general type annular light source collocation is on a parallel with the diffuser plate PC of lamp plate P and uses, can be applicable to the appearance defect detection under most demands.

As shown in fig. 10, a ring-shaped unidirectional diffusion light source is employed as the first light source 21 or the second light source 23; in this cyclic annular one-way diffusion light source, the light that lamp plate P sent is perpendicular with the place plane of surveyed surface, and diffuser plate DP is the round platform form, and sets up in lamp plate P setting aslope, can realize the illuminating effect of cyclic annular shadowless.

The annular one-way diffusion light source is suitable for a detected surface with a large breadth and a circular shape, is more uniform in light emitting effect than a general annular light source, and can form different illumination covering environments and illumination effects according to different working distances and different types of detected products 50.

As shown in fig. 11, a ring-shaped bidirectional diffusion light source is employed as the first light source 21 or the second light source 23; in the annular bidirectional diffuse light source, a lamp panel P is cylindrical, and lamp beads are distributed on the inner side surface of the lamp panel P and arranged along the radial direction of the column formed by the lamp panel P; the diffusion plate DP is round platform form, and sets up in lamp plate P setting aslope.

In the annular bidirectional diffusion light source, light forms a bidirectional highly-uniform symmetrical light field through reflection and scattering, so that tiny defects on the surface to be measured are illuminated, interference of slight differences on the surface of an object can be filtered, and the characteristics of excessive arc surface and steep change of gradient are highlighted.

As shown in fig. 12, an annular multi-directional diffusion light source is employed as the first light source 21 or the second light source 23; in the annular multidirectional diffusion light source, the lamp panel P is annular, and the lamp beads are distributed on the lamp panel P and positioned on the same plane and emit light outwards in the same direction; the diffusion plate DP is spherical and is arranged on the light-emitting path of the lamp panel P, so that light rays irradiating the plane to be measured along a plurality of directions are formed.

The annular multi-directional diffusion light source can enable light rays to form a bidirectional high-uniformity circularly symmetric light field through reflection and scattering, provide uniform illumination for multi-slope objects, and eliminate differences caused by different reflection angles.

As shown in fig. 13, an annular shadowless light source is used as the first light source 21 or the second light source 23; in the annular shadowless light source, a lamp panel P is annular, and lamp beads are distributed on the lamp panel P and are positioned on the same plane and emit light outwards in the same direction; the diffuser plate PC is arc-shaped, and the diffuser plate PC is a high haze diffuser plate PC, which can provide a high-brightness shadowless illumination effect.

The annular shadowless light source can fully utilize light to realize uniform covering irradiation, and is suitable for high-speed assembly line surface detection and cylindrical inner wall surface detection.

As shown in fig. 14, a spherically distributed symmetrical shadowless light source is used as the first light source 21 or the second light source 23; in the spherically distributed symmetrical shadowless light source, the lamp panel P is cylindrical, and the lamp beads are distributed on the inner side surface of the lamp panel P and are arranged along the radial direction of the column formed by the lamp panel P; the diffuser plate PC is circular arc-shaped.

The spherical distribution symmetrical shadowless light source scatters light to different directions to form gradual change spherical distribution, so that the reflecting intensities of different radians of the whole spherical target are consistent, local reflecting interference is filtered, and the interference formed by surface reflection of small devices can be effectively removed.

As shown in fig. 15, an annular integrating sphere light source is employed as the first light source 21 or the second light source 23; in the annular integrating sphere light source, a lamp panel P is annular, and lamp beads are distributed on the lamp panel P and are positioned on the same plane and emit light outwards in the same direction; the diffusion plate DP is in a complete spherical shape and irradiates the outside of the lamp panel P.

The annular integrating sphere light source can enable light rays to be uniformly distributed in the whole observation visual field, can eliminate interference caused by uneven surfaces, and is mainly used for detecting curved surfaces, irregular surfaces, concave-convex surfaces and arc surfaces, such as surface defects of substances with strong light reflection, laser engraving character detection, silk-screen character detection and the like on metal glass surfaces.

As shown in fig. 16, an AOI detection light source is employed as the first light source 21 or the second light source 23; in this cyclic annular integrating sphere light source, lamp plate P is hemispherical, and the lamp pearl distributes in lamp plate P's inner wall, and divides into at least three light-emitting region along lamp plate P's warp, and the colour of lighting of lamp pearl is different in the adjacent light-emitting region. Diffuser plate PC is hemispherical with lamp plate P assorted.

The AOI detection light source can realize multicolor irradiation and uniform irradiation of multi-angle coverage, so that the information of the surface gradient of an object can be accurately reflected; the AOI detection light source is mainly used for SMT soldering effect detection of circuit boards, shape defect detection of rotating bodies and multilayer object detection.

Considering that the orientations of different workpieces need to be determined after the defects are detected so as to realize accurate positioning during assembly; in this embodiment, the defect detection apparatus further includes:

and an image analyzer connected to the camera 31, the image analyzer being configured to analyze images (in this embodiment, the first characteristic image and the second characteristic image) formed by the camera 31, and process and recognize the images to obtain the positioning identifier. It is understood that positioning patterns may be previously provided on the first workpiece 41 and the second workpiece 42 to obtain positioning marks.

The grabbing robot is configured to grab the first workpiece 41 to be measured or the second workpiece 42 to be measured, and adjust the orientation of the first workpiece 41 to be measured or the second workpiece 42 to be measured based on the positioning identifiers of the first workpiece 41 to be measured and the second workpiece 42 to be measured, so as to accurately position the first workpiece 41 to be measured and the second workpiece 42 to be measured, which is beneficial to improving the assembly accuracy of the first workpiece 41 to be measured and the second workpiece 42 to be measured.

Taking two workpieces as an example, a workpiece to be placed above (hereinafter referred to as an upper workpiece) corresponds to the first workpiece 41 to be measured, a workpiece to be placed below (hereinafter referred to as a lower workpiece) corresponds to the second workpiece 42 to be measured, the upper workpiece and the lower workpiece are respectively aligned with the first light outlet 11 and the second light outlet 12, the first light source 21 and the second light source 23 are turned on, so that the first characteristic light and the second characteristic light are reflected by the reflecting device 24 to the imaging device at the same time to form a first characteristic image and a second characteristic image;

then, analyzing by using a background image analyzer and processing software, and feeding back a judgment result in real time; if one of the upper workpiece and the lower workpiece has a defect and does not meet the assembly requirement, the conveying device or the gripping mechanism (such as the above-mentioned gripping robot) on one side of the defective workpiece may be used to replace the defective workpiece with the same type of workpiece, and the above-mentioned inspection steps are repeated until both workpieces are qualified, so that the subsequent assembly process can be performed.

The application examples of the defect detection device provided by the embodiment are explained below by taking "character pad printing of the automobile gear adjusting knob", "SMT (surface mount technology) mounting of integrated circuit board components", "laminating and assembling of a mobile phone screen and a mobile phone outer frame" as examples.

1) Automobile gear adjusting knob character pad printing

In the automobile gear adjusting knob character pad printing, an upper workpiece is a spherical printing block made of rubber, and printing pattern grooves are processed on the surface of the printing block and used for dipping pad printing ink; the lower workpiece is an automobile gear adjusting knob of the pattern to be pad printed;

before the upper workpiece and the lower workpiece are subjected to contact pad printing, the grabbing robot enables the surface of the upper workpiece with the printing pattern groove to face the first light outlet 11, enables the surface of the lower workpiece to be printed to face the second light outlet 12, and carries out surface defect characteristic detection on the upper workpiece and the lower workpiece respectively according to the previous description. After the detection is qualified, the image analyzer identifies coaxial matching mark points/graphs preset on the upper workpiece and the lower workpiece, the coordinates of the coaxial matching mark points/graphs are extracted to serve as the positioning marks, the positioning marks are transmitted to the grabbing controller, the controller records and forms instructions to be sent to the grabbing robot, and therefore accurate positioning of pad printing of the upper workpiece and the lower workpiece is achieved.

It should be noted that in the automobile gear adjustment knob character pad printing process, items requiring defects for the mating surfaces of the upper workpiece and the lower workpiece include: whether the pad printing rubber block has defects or not, whether burrs exist on the edge or not, whether a pad printing pattern groove is flat or not, whether ink overflows or not, whether defects exist on the surface of the gear adjusting knob or not, whether scratches exist, whether a plated film is poor (bottom color leaks), whether demolding marks exist on the edge or not, and the like.

The coaxial alignment guide is realized aiming at the coaxial matching mark points/graphs, and the specific implementation principle of the coaxial alignment guide is as follows: because the defect detection device can shoot the images of the matching surfaces of the upper workpiece and the lower workpiece, the background image processing software program is matched with the motion control program of the machine mechanism, and the accurate coordinates of the coaxial matching mark points/graphs of the upper workpiece and the lower workpiece can be integrated into an X, Y value; the controller records the value, controls the upper and lower grabbing robots to synchronously and accurately move to the position corresponding to the X, Y value, and ensures that the Z axes are consistent, so that the upper and lower workpieces can be accurately attached.

It will be appreciated that the defect detection apparatus may also be used to perform inspection after the assembled workpieces are formed by bonding, thereby determining the surface quality of the assembled workpieces.

In addition, the positioning and guiding process does not need to be performed before each assembly, and the positioning instruction operation can be performed only by accurately positioning the first assembly and continuing to use the data recorded for the first time subsequently. Based on this, can practice thrift production inspection man-hour greatly, also realize saving of cost and the improvement of efficiency when guaranteeing the equipment precision.

2) SMT (surface mount technology) mounting of integrated circuit board components

In integrated circuit board components and parts SMT pastes dress process, top work piece be for devices such as resistance, IC, to the content of detection of top work piece fitting surface including before the laminating: size, contact point oxidation contamination detection, surface scratch crack detection, and the like. The below work piece is the PCB circuit board, and the content of detecting to below work piece fitting surface before the laminating includes: the size of a bonding pad of the circuit board, the open circuit copper leakage of the bonding pad circuit, the scratch, the crack, the oxidation and the dirt of the bonding pad and the like. Specifically, the defect detection of the PCB can be realized by utilizing the AOI detection light source.

After the defect detection of the joint surfaces of the upper workpiece and the lower workpiece is completed, the precise joint of the upper workpiece and the lower workpiece is realized based on the positioning and guiding process in the example 1).

3) Mobile phone screen and mobile phone outer frame fitting assembly

In cell-phone screen and cell-phone frame laminating equipment process, the top work piece is the cell-phone screen, and the content of detecting to top work piece fitting surface includes before the equipment: scratch defects of the mobile phone screen, circuit connection of the mobile phone screen, surface dirt and the like. The below work piece is the cell-phone frame, and the content of detecting to below work piece fitting surface includes before the equipment: frame burr defect scratch, size of a joint edge and the like.

After the defect detection of the matching surfaces of the upper workpiece and the lower workpiece is completed, the positioning and guiding process in the example 1) is further based, so that the upper workpiece and the lower workpiece are accurately assembled.

It can be understood that, when the detection and assembly of a plurality of workpieces are required, the detection and positioning of two workpieces can be realized in the defect detection device provided in this embodiment, after the assembly, the assembled workpiece is obtained, and then the defect and positioning are performed on the two assembled workpieces again, so that the detection and assembly of a plurality of workpieces can be realized; compared with the mode of detecting and positioning single workpieces one by one in the prior art, the method still has higher production efficiency.

The above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art will understand that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.

Claims (10)

1. A defect detection apparatus, comprising:

the imaging device is used for collecting light and imaging and comprises a camera (31) and a lens (32);

the first light source (21) is used for emitting first detection light rays, and the first detection light rays form first characteristic light rays after being reflected by a first workpiece to be detected (41);

the second light source (23) is used for emitting second detection light rays, and the second detection light rays form second characteristic light rays after being reflected by a second workpiece to be detected (42);

and the reflecting device (24) is used for simultaneously guiding and reflecting the first characteristic light ray and the second characteristic light ray to the imaging device, and the reflecting device (24) is arranged on a common optical path of the first characteristic light ray and the second characteristic light ray.

2. The defect detection apparatus of claim 1, further comprising:

a light splitting device (22) for guiding the light emitted by the first light source (21) to the first workpiece (41) to be detected, wherein the light splitting device (22) is arranged on the light path of the first detection light;

the optical path of the first detection light is perpendicular to the optical path of the second detection light.

3. A defect detecting apparatus according to claim 2, wherein the first light source (21) comprises a first lamp panel (211), and a first diffuser panel (212) disposed along the optical path of the first detection light.

4. The defect detection apparatus according to claim 1, wherein the second light source (23) comprises a second lamp panel (232), and a second diffusion plate (233) disposed along an optical path of the second detection light;

second lamp plate (232) are the loop configuration.

5. The defect detection apparatus of claim 1, further comprising:

an image analyzer for recognizing a positioning mark on an image made by the camera (31), the image analyzer being connected to the camera (31);

and the grabbing robot is used for grabbing the first measured workpiece (41) or the second measured workpiece (42) and adjusting the position of the first measured workpiece (41) or the second measured workpiece (42) based on the positioning mark, and the grabbing robot is connected to the image analyzer.

6. The defect detecting apparatus according to claim 1, further comprising an apparatus housing (10), wherein the apparatus housing (10) is provided with a first light outlet (11), and the first characteristic light ray is emitted into the reflecting device (24) through the first light outlet (11);

a first lens (112) is arranged in the first light outlet (11).

7. The defect detecting device according to claim 6, wherein a first mounting seat (111) for detachably mounting a light source is provided on the device housing (10), and the first light outlet (11) is opened on the first mounting seat (111);

and a first pressing ring (113) for fixing the first booster lens (112) is arranged on the first mounting seat (111).

8. The defect detecting apparatus according to claim 6, wherein the apparatus housing (10) further has a second light outlet (12), the second light outlet (12) is opposite to the first light outlet (11), and the second characteristic light enters the reflecting device (24) through the second light outlet (12);

and a second lens (122) is arranged in the second light outlet (12).

9. The defect detecting device according to claim 8, wherein a second mounting seat (121) for detachably mounting the light source is provided on the device housing (10), the second light source (23) is detachably mounted on the second mounting seat (121), and the second light outlet (12) is opened on the second mounting seat (121);

and a second pressing ring (123) for fixing the second lens increasing body (122) is arranged on the second mounting seat (121).

10. A defect detection apparatus as claimed in claim 6, wherein said apparatus housing (10) is further provided with a spare part receiving cavity (16) for receiving a spare part.

Images