CN216696643U - Active virtual channel parameter configuration magnetic sensor chip testing device - Google Patents
Active virtual channel parameter configuration magnetic sensor chip testing device Download PDFInfo
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- CN216696643U CN216696643U CN202122928338.1U CN202122928338U CN216696643U CN 216696643 U CN216696643 U CN 216696643U CN 202122928338 U CN202122928338 U CN 202122928338U CN 216696643 U CN216696643 U CN 216696643U
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Abstract
The utility model discloses an active virtual channel parameter configuration magnetic sensor chip testing device which comprises a testing frame, transverse strips and a testing table, wherein the transverse strips are arranged in parallel on the outer walls of two sides of the testing frame, outer side conveying rollers are rotatably connected between the side walls of the transverse strips, a belt is connected between rotating shafts of the outer side conveying rollers, a speed reducing motor is installed on the side wall of each transverse strip, an output shaft of the speed reducing motor is fixedly connected with the rotating shaft of one of the outer side conveying rollers, inner side conveying rollers are rotatably connected between the inner walls of the testing frame, the testing table is installed inside the testing frame, stand columns distributed in a rectangular array are installed at the top of the testing table, and a top plate is installed at the top of each stand column. The magnetic sensor chip can be automatically conveyed and positioned at a test position, the magnetic sensor chip does not need to be manually placed, the artificial error is avoided, the test efficiency is improved, and the test accuracy is higher.
Description
Technical Field
The utility model relates to the technical field of magnetic sensor testing, in particular to a testing device for an active virtual channel parameter configuration magnetic sensor chip.
Background
Magnetic sensor chips, one of the important classes of semiconductor sensors, are suitable for various consumer electronics, medical and industrial applications. According to different application scenes, the magnetic sensor chip is combined with a peripheral control circuit, a signal conditioning circuit, a power supply and other modules to form a complete control circuit. The active virtual channel parameter configuration magnetic sensor chip needs to be detected by means of a testing device before production and delivery, and bad influences caused by the fact that defective products flow into the market are prevented.
When the existing active virtual channel parameter configuration magnetic sensor chip testing device is used, the active virtual channel parameter configuration magnetic sensor chip needs to be manually taken and placed, so that the testing efficiency is low, and the artificial deviation is easy to occur.
Therefore, the active virtual channel parameter configuration magnetic sensor chip testing device is provided.
SUMMERY OF THE UTILITY MODEL
The utility model mainly aims to provide a testing device for an active virtual channel parameter configuration magnetic sensor chip, which can effectively solve the problems in the background technology.
In order to achieve the purpose, the utility model adopts the technical scheme that:
the active virtual channel parameter configuration magnetic sensor chip testing device comprises a testing frame, and further comprises cross bars and a testing table, wherein the outer walls of two sides of the testing frame are respectively provided with the cross bars which are arranged in parallel, outer side conveying rollers are rotatably connected between the side walls of the cross bars, a belt is connected between rotating shafts of the outer side conveying rollers, the side walls of the cross bars are provided with a speed reducing motor, an output shaft of the speed reducing motor is fixedly connected with the rotating shaft of one of the outer side conveying rollers, the inner side conveying rollers are rotatably connected between the inner walls of the testing frame, the testing table is installed inside the testing frame, stand columns distributed in a rectangular array mode are installed at the top of the testing table, a top plate is installed at the top of each stand column, an electric rod is installed at the top of each top plate, and a detector is installed at the bottom of each electric rod;
horizontal telescopic link is installed to the inner wall of test frame, the connecting block is installed to horizontal telescopic link's tip, the lateral part push pedal is installed to the lateral wall of connecting block, the lateral wall of lateral part push pedal bonds and has rubber buffering strip.
Furthermore, the bottom of the test frame is provided with an angle adjusting rod, two ends of the angle adjusting rod are connected with U-shaped plates through pin shafts in a rotating mode, and the U-shaped plates above the angle adjusting rod are installed at the bottom of the test frame.
Furthermore, the side wall of the test frame is connected with a side baffle through a hinge, and the side baffle is convenient to maintain the parts inside the test frame after being detached.
Further, the top of test frame is installed the cooling ring, the internally mounted of cooling ring has radiator fan, the shielding net is installed to the inner week of cooling ring, the shielding net sets up in radiator fan's top, and radiator fan during operation can drive the air in the test frame and flow to the outside, and the heat in the test frame is discharged.
Further, the door frame is installed to the inner wall of test frame, sliding connection has the shielding door in the door frame, can avoid external equipment to cause the interference to the test when the shielding door descends, improves the accuracy of test.
Further, the top of the outer side conveying roller is flush with the top of the inner side conveying roller, so that the magnetic sensor chip is conveyed smoothly.
Compared with the prior art, the utility model has the following beneficial effects: the output shaft of the speed reducing motor drives the outer side conveying roller to rotate through a belt and other parts, the magnetic sensor chip can be automatically conveyed without being manually placed, and the magnetic sensor chip can be positioned at a testing position through the transverse telescopic rod, the connecting block, the side push plate and the rubber buffer strip, so that the use is more convenient, the human error is avoided, and the testing efficiency is improved; the arrangement of the shielding net and the shielding door can avoid the interference of external equipment during testing, and the testing accuracy is improved; the two ends of the independently controlled angle adjusting rod can rotate around the pin shaft of the U-shaped plate, the inclination of the test frame is changed, and therefore tests at different angles can be carried out, and the device can be used flexibly.
Drawings
Fig. 1 is a schematic view of the overall structure of an active virtual channel parameter configuration magnetic sensor chip testing device according to the present invention.
Fig. 2 is a cross-sectional view of an active virtual channel parametric configuration magnetic sensor chip testing device according to the present invention.
Fig. 3 is an enlarged view of a structure at a point a in fig. 1 of the active virtual channel parameter configuration magnetic sensor chip testing device according to the present invention.
In the figure: 1. a test frame; 2. a side baffle; 3. a horizontal bar; 4. an outside conveying roller; 5. a reduction motor; 6. a belt; 7. an angle adjusting rod; 8. a U-shaped plate; 9. an inner side; 10. a test bench; 11. a column; 12. a top plate; 13. an electric rod; 14. a detector; 15. a transverse telescopic rod; 16. connecting blocks; 17. a side push plate; 18. a rubber buffer strip; 19. a door frame; 20. a shield door; 21. a heat dissipation ring; 22. a shielding mesh; 23. a heat dissipation fan.
Detailed Description
In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the utility model easy to understand, the utility model is further described with the specific embodiments.
As shown in fig. 1-3, an active virtual channel parameter configuration magnetic sensor chip testing device comprises a testing frame 1, and further comprises a horizontal bar 3 and a testing table 10, wherein the horizontal bar 3 arranged in parallel is installed on the outer walls of the two sides of the testing frame 1, an outer side conveying roller 4 is rotatably connected between the side walls of the horizontal bar 3, a belt 6 is connected between the rotating shafts of the outer side conveying roller 4, a speed reducing motor 5 is installed on the side wall of the horizontal bar 3, the output shaft of the speed reducing motor 5 is fixedly connected with the rotating shaft of one of the outer side conveying rollers 4, an inner side 9 conveying roller is rotatably connected between the inner walls of the testing frame 1, a driving motor is arranged in the inner side 9 conveying roller for driving the inner side 9 conveying roller to rotate, the testing table 10 is installed in the testing frame 1, stand columns 11 distributed in a rectangular array are installed at the top of the testing table 10, and a top plate 12 is installed at the top of the stand columns 11, an electric rod 13 is installed at the top of the top plate 12, and a detector 14 is installed at the bottom of the electric rod 13;
horizontal telescopic link 15 is installed to the inner wall of test frame 1, connecting block 16 is installed to the tip of horizontal telescopic link 15, lateral part push pedal 17 is installed to the lateral wall of connecting block 16, the lateral wall of lateral part push pedal 17 bonds and has rubber buffer strip 18.
The bottom of the test frame 1 is provided with an angle adjusting rod 7, two ends of the angle adjusting rod 7 are connected with U-shaped plates 8 through pin shafts in a rotating mode, and the U-shaped plates 8 above the angle adjusting rod are installed at the bottom of the test frame 1.
The side wall of the test frame 1 is connected with a side baffle 2 through a hinge, and the side baffle 2 is convenient to repair and maintain the parts inside the test frame 1 after being detached.
Wherein, the cooling ring 21 is installed at the top of test frame 1, the internally mounted of cooling ring 21 has radiator fan 23, shielding net 22 is installed to the interior week of cooling ring 21, shielding net 22 sets up the top at radiator fan 23, and radiator fan 23 during operation can drive the air in the test frame 1 and flow to the outside, and the heat in the test frame 1 is discharged.
Wherein, a door frame 19 is installed to the inner wall of test frame 1, sliding connection has shielding door 20 in the door frame 19, can avoid external equipment to cause the interference to the test when shielding door 20 descends, improves the accuracy of test.
Wherein the top of the outer conveying roller 4 is flush with the top of the inner conveying roller 9 so as to realize smooth conveying of the magnetic sensor chip.
It should be noted that, the utility model is an active virtual channel parameter configuration magnetic sensor chip testing device, an output shaft of a speed reducing motor 5 drives one of the outer conveying rollers 4 to rotate, and drives the other outer conveying rollers 4 to rotate in the same direction through a belt 6, the magnetic sensor chip on the outer conveying roller 4 is conveyed to a test bench 10, a transverse telescopic rod 15 extends, a side push plate 17 and a rubber buffer strip 18 are driven to transversely move through a connecting block 16, the magnetic sensor chip is pushed to a test position, then a shielding door 20 descends, an electric rod 13 drives a detector 14 to descend to be in contact with the magnetic sensor chip for testing, the electric rod 13 drives the detector 14 to reset after testing, and the outer conveying roller 4 sends the detected magnetic sensor chip out of a test frame 1.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the utility model as claimed. The scope of the utility model is defined by the appended claims and equivalents thereof.
Claims (6)
1. The utility model provides an active virtual passageway parameter configuration magnetic sensor chip testing arrangement, includes test frame (1), its characterized in that still includes horizontal bar (3) and testboard (10), parallel arrangement's horizontal bar (3) is all installed to the both sides outer wall of test frame (1), it is connected with outside conveying roller (4) to rotate between the lateral wall of horizontal bar (3), be connected with belt (6) between the pivot of outside conveying roller (4), gear motor (5) is installed to the lateral wall of horizontal bar (3), the output shaft of gear motor (5) and the pivot fixed connection of one of them outside conveying roller (4), it is connected with inboard (9) conveying roller to rotate between the inner wall of test frame (1), the internally mounted of test frame (1) has testboard (10), stand (11) that the rectangle array distributes are installed to the top of testboard (10), a top plate (12) is installed at the top of the upright post (11), an electric rod (13) is installed at the top of the top plate (12), and a detector (14) is installed at the bottom of the electric rod (13);
horizontal telescopic link (15) are installed to the inner wall of test frame (1), connecting block (16) are installed to the tip of horizontal telescopic link (15), lateral part push pedal (17) are installed to the lateral wall of connecting block (16), the lateral wall of lateral part push pedal (17) bonds and has rubber buffer strip (18).
2. The device for testing the active virtual channel parametric configuration magnetic sensor chip of claim 1, wherein: the bottom of test frame (1) is provided with angle adjusting rod (7), the both ends of angle adjusting rod (7) all are connected with U-shaped plate (8) through round pin axle rotation, and the U-shaped plate (8) of top are installed in the bottom of test frame (1).
3. The device for testing the active virtual channel parametric configuration magnetic sensor chip of claim 1, wherein: the side wall of the test frame (1) is connected with a side baffle (2) through a hinge.
4. The device for testing the active virtual channel parametric configuration magnetic sensor chip of claim 1, wherein: the test frame is characterized in that a radiating ring (21) is installed at the top of the test frame (1), a radiating fan (23) is installed inside the radiating ring (21), a shielding net (22) is installed on the inner periphery of the radiating ring (21), and the shielding net (22) is arranged above the radiating fan (23).
5. The device for testing the active virtual channel parametric configuration magnetic sensor chip of claim 1, wherein: a door frame (19) is installed on the inner wall of the test frame (1), and a shielding door (20) is connected in the door frame (19) in a sliding mode.
6. The device for testing the active virtual channel parametric configuration magnetic sensor chip of claim 1, wherein: the top of the outer conveying roller (4) is flush with the top of the inner conveying roller (9).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122928338.1U CN216696643U (en) | 2021-11-26 | 2021-11-26 | Active virtual channel parameter configuration magnetic sensor chip testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122928338.1U CN216696643U (en) | 2021-11-26 | 2021-11-26 | Active virtual channel parameter configuration magnetic sensor chip testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216696643U true CN216696643U (en) | 2022-06-07 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122928338.1U Active CN216696643U (en) | 2021-11-26 | 2021-11-26 | Active virtual channel parameter configuration magnetic sensor chip testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216696643U (en) |
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2021
- 2021-11-26 CN CN202122928338.1U patent/CN216696643U/en active Active
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