CN216696437U - Circuit for improving resistance sampling current precision - Google Patents
Circuit for improving resistance sampling current precision Download PDFInfo
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- CN216696437U CN216696437U CN202122781006.5U CN202122781006U CN216696437U CN 216696437 U CN216696437 U CN 216696437U CN 202122781006 U CN202122781006 U CN 202122781006U CN 216696437 U CN216696437 U CN 216696437U
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Abstract
The utility model provides a circuit for improving the precision of resistance sampling current, which comprises a current sampling resistance unit, a sampling resistance heating unit, a temperature sampling unit and a constant temperature control unit, wherein the current sampling resistance unit is provided with a heating unit of a current sampling resistance and a temperature sampling unit, the constant temperature control unit is respectively connected with the sampling resistance heating unit and the temperature sampling unit through circuits, the temperature sampling unit samples the temperature of the current sampling resistance unit and inputs the temperature into the constant temperature control unit, and the constant temperature control unit controls the sampling resistance heating unit to heat the current sampling resistance unit, and the circuit has the advantages that: this application has simple structure, with low costs and the high advantage of precision, heats current sampling resistance unit through the circuit for the constancy of temperature of current sampling resistance unit is at application scope, thereby reduces the precision error that current sampling resistance unit appears because of temperature variation.
Description
[ technical field ] A method for producing a semiconductor device
The utility model relates to a high-precision current measuring method, in particular to a circuit for improving the precision of resistance sampling current.
[ background of the utility model ]
In high-precision current measurement in a circuit, high-precision current sampling resistance measurement is generally applied, but the environmental temperature and heat generated by a sampling resistance body have serious influence on the measurement precision, so that an important measure of high-precision current sampling is to control the change of the temperature of the body; in the prior art, the size of a sampling resistor is increased, the thermal resistance to the environment is reduced, the sampling resistor works in a smaller temperature range, or measures such as air cooling and the like are taken, and then the adopted data is compensated in a later period.
[ Utility model ] content
The utility model aims to solve the problems existing in the current high-precision current measurement, and provides a circuit for improving the precision of resistance sampling current.
The utility model is realized by the following technical scheme: the utility model provides an improve circuit of resistance sampling current precision, includes heating unit, temperature sampling unit, the constant temperature control unit of current sampling resistance unit, current sampling resistance unit is equipped with the heating unit and the temperature sampling unit of current sampling resistance, the constant temperature control unit respectively with the heating unit of current sampling resistance, temperature sampling unit line connection, the temperature sampling unit is with the temperature sampling of current sampling resistance unit and input constant temperature control unit, the heating unit of constant temperature control unit control current sampling resistance heats current sampling resistance unit.
Furthermore, the body temperature of the current sampling resistance unit is a control object of the circuit.
Further, the heating unit of the current sampling resistor is a resistor or a semiconductor device controlled to generate heat, and the heating unit of the current sampling resistor is a circuit unit for heating the body of the current sampling resistor unit.
Further, the temperature sampling unit is a temperature detection circuit, the temperature sampling unit is an NTC or PTC or semiconductor temperature sensor, and the temperature sampling unit is a circuit unit that collects the body temperature of the current sampling resistance unit.
Furthermore, the constant temperature control unit is a control structure that the heating unit of the current sampling resistor heats the current sampling resistor unit, and the control mode of the constant temperature control unit to the heating unit of the current sampling resistor is a controlled semiconductor analog continuous power heating mode or a pulse width modulation mode to generate an equivalent analog continuous power heating mode.
Further, the body temperature of the current sampling resistance unit is applicable to a range of 55 to 105 ℃.
The utility model has the beneficial effects that: this application has simple structure, with low costs and the high advantage of precision, through temperature sampling unit with the temperature sampling of current sampling resistance unit and input constant temperature control unit, constant temperature control unit controls sampling resistance heating unit through pulse width modulation's mode and heats current sampling resistance unit for the constancy of temperature of current sampling resistance unit is at application scope, thereby reduces the precision error that current sampling resistance unit appears because of the temperature variation.
[ description of the drawings ]
FIG. 1 is a circuit diagram of the present invention;
FIG. 2 is a flow chart of the present invention;
reference numerals: 1. a current sampling resistance unit; 2. a heating unit of a current sampling resistor; 3. a temperature sampling unit; 4. a constant temperature control unit.
[ detailed description ] embodiments
The utility model is further described with reference to the following figures and embodiments:
as shown in fig. 1 and 2, a circuit for improving accuracy of resistance sampling current includes a current sampling resistance unit 1, a heating unit 2 of the current sampling resistance, a temperature sampling unit 3, and a constant temperature control unit 4, wherein the current sampling resistance unit 1 is provided with the heating unit 2 of the current sampling resistance and the temperature sampling unit 3, the constant temperature control unit 4 is respectively connected with the heating unit 2 of the current sampling resistance and the temperature sampling unit 3, the temperature sampling unit 3 samples the temperature of the current sampling resistance unit 1 and inputs the temperature sampling unit 4, and the constant temperature control unit 4 controls the heating unit 2 of the current sampling resistance to heat the current sampling resistance unit 1.
Preferably, the body temperature of the current sampling resistor unit 1 is a control object of the circuit.
Preferably, the heating unit 2 of the current sampling resistor is a resistor or a semiconductor device with controlled heat generation, and the heating unit 2 of the current sampling resistor is a circuit unit for heating the body of the current sampling resistor unit 1.
Preferably, the temperature sampling unit 3 is a temperature detection circuit, the temperature sampling unit 3 is an NTC or PTC or semiconductor temperature sensor, and the temperature sampling unit 3 is a circuit unit that collects the body temperature of the current sampling resistance unit 1.
Preferably, the constant temperature control unit 4 is a control structure in which the heating unit 2 of the current sampling resistor heats the current sampling resistor unit 1, and the control manner of the constant temperature control unit 4 on the heating unit 2 of the current sampling resistor is a controlled semiconductor analog continuous power heating manner or a pulse width modulation manner to generate an equivalent analog continuous power heating manner.
Preferably, the body temperature of the current sampling resistor unit 1 is applicable to a range of 55 degrees celsius to 105 degrees celsius.
Appropriate changes and modifications to the embodiments described above will become apparent to those skilled in the art from the disclosure and teachings of the foregoing description. Therefore, the present invention is not limited to the specific embodiments disclosed and described above, and some modifications and variations of the present invention should fall within the scope of the claims of the present invention. Furthermore, although specific terms are employed herein, they are used in a generic and descriptive sense only and not for purposes of limitation.
Claims (6)
1. The utility model provides a circuit of improvement resistance sampling current precision which characterized in that: heating unit, temperature sampling unit, constant temperature control unit including current sampling resistance unit, current sampling resistance unit is equipped with the heating unit and the temperature sampling unit of current sampling resistance, constant temperature control unit respectively with current sampling resistance's heating unit, temperature sampling unit line connection, the temperature sampling unit is with the temperature sampling of current sampling resistance unit and input constant temperature control unit, the heating unit of constant temperature control unit control current sampling resistance heats current sampling resistance unit.
2. The circuit of claim 1, wherein the circuit for improving the accuracy of the resistance sampling current comprises: the body temperature of the current sampling resistance unit is a control object of the circuit.
3. The circuit of claim 1, wherein the circuit for improving the accuracy of the resistance sampling current comprises: the heating unit of the current sampling resistor is a resistor or a semiconductor device which is controlled to generate heat, and the heating unit of the current sampling resistor is a circuit unit which heats the body of the current sampling resistor unit.
4. The circuit of claim 1, wherein the circuit for improving the accuracy of the resistance sampling current comprises: the temperature sampling unit is a temperature detection circuit, the temperature sampling unit is an NTC or PTC or semiconductor temperature sensor, and the temperature sampling unit is a circuit unit for collecting the body temperature of the current sampling resistance unit.
5. The circuit of claim 1, wherein the circuit for improving the accuracy of the resistance sampling current comprises: the constant temperature control unit is a control structure that the heating unit of the current sampling resistor heats the current sampling resistor unit, and the control mode of the constant temperature control unit to the heating unit of the current sampling resistor is a controlled semiconductor simulation continuous power heating mode or a pulse width modulation mode to generate an equivalent simulation continuous power heating mode.
6. The circuit of claim 1, wherein the circuit for improving the accuracy of the resistance sampling current comprises: the body temperature application range of the current sampling resistance unit is 55-105 ℃.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122781006.5U CN216696437U (en) | 2021-11-15 | 2021-11-15 | Circuit for improving resistance sampling current precision |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122781006.5U CN216696437U (en) | 2021-11-15 | 2021-11-15 | Circuit for improving resistance sampling current precision |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216696437U true CN216696437U (en) | 2022-06-07 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122781006.5U Active CN216696437U (en) | 2021-11-15 | 2021-11-15 | Circuit for improving resistance sampling current precision |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216696437U (en) |
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2021
- 2021-11-15 CN CN202122781006.5U patent/CN216696437U/en active Active
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