CN216595364U - Middle and low voltage distribution board testing device - Google Patents
Middle and low voltage distribution board testing device Download PDFInfo
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- CN216595364U CN216595364U CN202123004067.7U CN202123004067U CN216595364U CN 216595364 U CN216595364 U CN 216595364U CN 202123004067 U CN202123004067 U CN 202123004067U CN 216595364 U CN216595364 U CN 216595364U
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Abstract
The utility model discloses a middle and low voltage distribution board testing device, which comprises a shell, and a current circuit, an insulation and voltage resistance testing circuit, an interface circuit, a communication circuit, a first accommodating space, a second accommodating space, an isolating plate, a ventilating duct, a ventilating hole and a ventilating device which are arranged in the shell, wherein the current circuit, the insulation and voltage resistance testing circuit, the interface circuit, the communication circuit, the first accommodating space, the second accommodating space, the isolating plate, the ventilating duct, the ventilating hole and the ventilating device are arranged in the shell; the current circuit and the insulation and voltage resistance test circuit are connected with a medium and low voltage distribution board to be tested through the interface circuit, and a control command of the upper computer is sent to the current circuit and the insulation and voltage resistance test circuit through the communication circuit to enable the communication circuit to output a current signal and a current signal required by the test so as to measure related parameters in the medium and low voltage distribution board.
Description
Technical Field
The utility model relates to the technical field of switchgear testing, in particular to a testing device for a medium and low voltage switchboard.
Background
The current standards for the protection and functionality of electrical equipment in power stations include testing one or more of the resistance, insulation resistance and voltage withstand characteristics of devices or paths within the low voltage distribution board. The traditional test method needs to carry out a large amount of wire disconnecting work on test equipment on site to complete the test work. Due to the limited operation space, the risk of misconnection, short circuit, grounding and the like is high due to the error risk of people in the wiring process. The test equipment comprises high-voltage equipment, so that potential safety hazards exist, and the problem of serious heating exists in the high-frequency test process.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve the technical problem of providing a testing device for a medium and low voltage distribution board, aiming at least one defect in the prior art.
The technical scheme adopted by the utility model for solving the technical problems is as follows: the testing device for the medium and low voltage distribution board comprises a shell, a current circuit, an insulation and withstand voltage testing circuit, an interface circuit, a communication circuit, a first accommodating space, a second accommodating space and a partition board, wherein the current circuit is arranged in the shell and used for outputting adjustable current, the insulation and withstand voltage testing circuit is used for outputting adjustable voltage, the interface circuit is used for connecting the medium and low voltage distribution board, the communication circuit is used for communicating with an upper computer, the first accommodating space is used for accommodating the current circuit, the second accommodating space is used for accommodating the insulation and withstand voltage testing circuit, and the partition board is used for isolating the first accommodating space from the second accommodating space;
a ventilating pipeline is arranged between the first accommodating space and the second accommodating space; the ventilating duct is provided with ventilating holes, and a ventilating device is arranged in the ventilating duct;
the communication circuit is connected with the input end of the current circuit, the input end of the voltage-withstand-voltage insulation test circuit and the interface circuit, and the output end of the current circuit and the output end of the voltage-withstand-voltage insulation test circuit are respectively connected with the interface circuit.
Preferably, in the middle and low voltage distribution board testing device of the present invention, temperature sensors are disposed in the first accommodating space and the second accommodating space, and a master controller for controlling the ventilating device according to feedback information of the temperature sensors is disposed in the first accommodating space; the controller is connected with the temperature sensor and the air interchanger.
Preferably, in the apparatus for testing a medium and low voltage distribution board according to the present invention, the current circuit includes a power circuit for outputting an adjustable current signal, a voltage sampling circuit for collecting voltage information output by the power circuit, and a current information current sampling circuit for collecting current information output by the power circuit;
the first sampling end in the voltage sampling circuit is connected with the negative pole of the power circuit, the second sampling end in the voltage sampling circuit is connected with the positive pole of the power circuit, the positive pole of the power circuit is connected with the second sampling end of the current sampling circuit through the interface circuit, the first sampling end of the current sampling circuit is connected with the negative pole of the power circuit, the output end of the current sampling circuit is connected with the current feedback input end of the voltage sampling circuit, and the output end of the voltage sampling circuit is connected with the input end of the power circuit.
Preferably, in the middle and low voltage distribution board testing apparatus of the present invention, the voltage sampling circuit includes a first differential comparator U1, a first comparator U2, an isolation circuit, a pulse width modulator, and a second resistor R2;
the positive pole of the power circuit is connected with the non-inverting input end of the first differential comparator U1, the negative pole of the power circuit is connected with the inverting input end of the first differential comparator U1, the output end of the first differential comparator U1 is connected with the inverting input end of the first comparator U2, the non-inverting input end of the first comparator U2 is connected with the first end of the second resistor R2 and the output end of the current sampling circuit, the second end of the second resistor R2 is a first reference voltage input end, and the output end of the first comparator U2 is connected with the input end of the power circuit through the isolation circuit and the pulse width modulator.
Preferably, in the middle and low voltage distribution board testing apparatus of the present invention, the current sampling circuit includes a second differential comparator U3, a second comparator U4, a first diode D1, a first resistor R1, and a sampling resistor Rs;
the negative pole of power circuit connects the first end of sampling resistance Rs and the inverting input of second differential comparator U3, the second end of sampling resistance Rs is connected the non inverting input of second differential comparator U3, the output of second differential comparator U3 is connected the inverting input of second comparator U4, the non inverting input of second comparator U4 is second reference voltage input, the output of second comparator U4 is connected the negative pole of first diode D1, the positive pole of first diode D1 is connected the second end of first resistance R1, the first end of first resistance R1 is the output of current sampling circuit.
Preferably, in the apparatus for testing a medium and low voltage distribution board according to the present invention, the withstand voltage testing circuit includes a first controller for receiving a digital signal and outputting a control command signal, a first amplifier for amplifying the control command signal, and a boost rectifier circuit;
the first controller is electrically connected with the first amplifier and the boosting rectifying circuit, and the first amplifier is electrically connected with the boosting rectifying circuit.
Preferably, in the middle and low voltage distribution board testing device of the present invention, the interface circuit includes a switching switch circuit, a network port circuit for connecting the communication circuit, a second controller for controlling the switching switch circuit, a first connector for connecting the current circuit, a second connector for connecting the withstand voltage test circuit, a third connector for connecting the middle and low voltage distribution board, a current measuring terminal for connecting a current measuring device, and a voltage measuring terminal for connecting a voltage measuring device;
the output end of the network port circuit is connected with the input end of the second controller, the output end of the second controller is connected with the switching switch circuit, and the switching switch circuit is respectively connected with the second controller, the first connector, the second connector, the third connector, the current measuring end and the voltage measuring end.
Preferably, in the middle and low voltage distribution board test apparatus of the present invention, the switching circuit includes a first switching element K1, a second switching element K2, a third switching element K3, a fourth switching element K4, a fifth switching element K5, a sixth switching element K6, a seventh switching element K7, an eighth switching element K8, a ninth switching element K9, a tenth switching element K10, an eleventh switching element K11, and a twelfth switching element K12;
the second controller is respectively connected with the control end of the first switch element K1, the control end of the second switch element K2, the control end of the third switch element K3, the control end of the fourth switch element K4, the control end of the fifth switch element K5, the control end of the sixth switch element K6, the control end of the seventh switch element K7, the control end of the eighth switch element K8, the control end of the ninth switch element K9, the control end of the tenth switch element K10, the control end of the eleventh switch element K11 and the control end of the twelfth switch element K12;
the second connector is connected to an input terminal of the first switching element K1, a first output terminal of the first switching element K1 is connected to a first output terminal of the sixth switching element K6 through the second switching element K2 and a seventh switching element K7, a second output terminal of the first switching element K1 is connected to a second output terminal of the sixth switching element K6 through the fourth switching element K4 and a ninth switching element K9, a third output terminal of the first switching element K1 is connected to the third connector through the third switching element K3, and a fourth output terminal of the first switching element K1 is connected to the third connector through the fifth switching element K5;
the current measuring terminal is connected to an input terminal of the sixth switching element K6, a third output terminal of the sixth switching element K6 is connected to the third connector through the eighth switching element K8, and a fourth output terminal of the sixth switching element K6 is connected to the third connector through the tenth switching element K10;
the eleventh switching element K11 between the first connector and the third connector; the twelfth switching element K12 is connected between the voltage measuring terminal and the third connector.
Preferably, in the middle or low voltage distribution board testing apparatus of the present invention, the first switching element K1 and the sixth switching element K6 are double pole double throw type relays; the second switch element K2, the third switch element K3, the fourth switch element K4 and the fifth switch element K5 are single-pole four-throw relays; the seventh switching element K7, the eighth switching element K8, the ninth switching element K9 and the tenth switching element K10 are single-pole triple-throw relays; the eleventh switching element K11 and the twelfth switching element K12 are double pole, triple throw relays.
The implementation of the utility model has the following beneficial effects: the current circuit and the insulation and voltage resistance test circuit are connected with a medium and low voltage distribution board to be tested through an interface circuit, a control command of an upper computer is sent to the current circuit and the insulation and voltage resistance test circuit through a communication circuit to enable the communication circuit to output a current signal and a current signal required by the test, the current value and the voltage value of a device or a loop in the medium and low voltage distribution board to be tested are measured, parameters such as contact resistance, insulation impedance and voltage resistance characteristics of the device or the loop can be measured by using ohm's law, a wiring process is omitted, the test efficiency is high, meanwhile, the current circuit and the insulation and voltage resistance test circuit are isolated to ensure the safety of the test process, a heat dissipation device is additionally arranged to prevent high-frequency test work from enabling the test equipment to rapidly enter an over-temperature working state, and the test efficiency is further improved.
Drawings
The utility model will be further described with reference to the following drawings and examples, in which:
FIG. 1 is a schematic circuit diagram of a low-voltage switch testing apparatus according to the present invention;
FIG. 2 is a schematic view of a housing structure of a middle and low voltage distribution board testing apparatus according to the present invention;
FIG. 3 is a logic diagram of the current circuit in the medium and low voltage distribution board test apparatus of the present invention;
FIG. 4 is a circuit logic diagram of the withstand voltage test circuit in the test device of the medium and low voltage distribution board according to the present invention;
fig. 5 is a circuit logic diagram of an interface circuit in the testing apparatus of the medium and low voltage distribution board according to the present invention.
Detailed Description
For a more clear understanding of the technical features, objects and effects of the present invention, embodiments of the present invention will now be described in detail with reference to the accompanying drawings.
In the related art, medium and low voltage distribution boards include a low voltage distribution board having a voltage level of 380v or less and a medium voltage distribution board having a voltage level of 35kv or less.
As shown in fig. 1 and 2, a middle and low voltage distribution board testing apparatus according to the present invention includes a housing, a current circuit 110 disposed in the housing for outputting an adjustable current, an insulation and withstand voltage testing circuit 120 for outputting an adjustable voltage, an interface circuit 200 for connecting the middle and low voltage distribution board, a communication circuit 500 for communicating with an upper computer, a first accommodating space for accommodating the current circuit 110, a second accommodating space for accommodating the insulation and withstand voltage testing circuit 120, and a partition board for separating the first accommodating space from the second accommodating space;
specifically, a ventilation duct 3 is provided between the first accommodating space and the second accommodating space; the ventilating duct 3 is provided with a ventilating hole, and a ventilating device is arranged in the ventilating duct 3;
the communication circuit 500 is connected to the input terminal of the current circuit 110, the input terminal of the voltage withstand test circuit 120, and the interface circuit 200, and the output terminal of the current circuit 110 and the output terminal of the voltage withstand test circuit 120 are respectively connected to the interface circuit 200.
In the present embodiment, a control command of the upper computer is sent to current circuit 110, dielectric strength test circuit 120, and interface circuit 200 via communication circuit 500, respectively, to control the output current of current circuit 100, the output voltage of dielectric strength test circuit 120, and the loop connection relationship of interface circuit 200.
The current circuit 110 is a high-precision direct current module, and is configured to output a direct current of 0-200A to the middle-low voltage distribution board, measure a voltage value of a device or a circuit in the middle-low voltage distribution board, and calculate a resistance value of the device or the circuit by using ohm's law, that is, a resistance value of a contact resistor and a coil winding of the middle-low voltage distribution board; the insulation and voltage withstand test circuit 120 is used for outputting a direct current voltage of 0-2500V to the medium and low voltage distribution board, measuring the current value of a device or a loop in the medium and low voltage distribution board, and testing the insulation resistance and voltage withstand characteristics of the medium and low voltage distribution board by using ohm's law.
Since the voltage withstand test circuit 120 is a high-voltage device and the current circuit 110 is a high-current device, there are risks such as electric shock and creepage, and therefore the current circuit 110 and the voltage withstand test circuit 120 are both disposed in the housing, and a separation plate is disposed between the two, on one hand, to eliminate potential safety hazards, and on the other hand, to prevent mutual interference between the two. In addition, the communication circuit 500 and the device of the interface circuit 200 connected to the current circuit 110 may be disposed in the first accommodation space, and the device of the interface circuit 200 connected to the dielectric breakdown voltage test circuit 120 may be disposed in the second accommodation space. In order to avoid high-frequency test work, the test equipment is enabled to rapidly enter an over-temperature working state, the test efficiency is reduced, and the ventilation pipeline, the ventilation holes and the ventilation device can be arranged to improve the heat dissipation efficiency. Wherein, the ventilation device is a fan.
In this embodiment, the outer casing includes upper casing 1 and lower casing 2, and upper casing 1 and lower casing 2 are connected with the mode of dismantling, and the space between upper casing 1 and lower casing 2 is for holding the chamber.
Optionally, temperature sensors are arranged in the first accommodating space and the second accommodating space, and a master controller for controlling the air interchanger according to feedback information of the temperature sensors is arranged in the first accommodating space; specifically, the controller is connected to the temperature sensor and the ventilator.
The temperature sensor monitors the temperature change in the shell, and then the master controller is utilized to control the air interchanger. For example, when the temperature exceeds a preset value, the ventilation device is started; otherwise, the ventilation device is closed. By adopting the arrangement, active heat exchange control can be carried out according to the temperature requirements of the first accommodating space and the second accommodating space, so that the temperature of the use environment can be automatically adjusted.
As shown in fig. 3, the current circuit 110 includes a power circuit for outputting an adjustable current signal, a voltage sampling circuit 112 for collecting voltage information output by the power circuit, and a current information current sampling circuit 113 for collecting current information output by the power circuit;
specifically, a first sampling end in the voltage sampling circuit 112 is connected to a negative electrode of the power circuit, a second sampling end in the voltage sampling circuit 112 is connected to a positive electrode of the power circuit, the positive electrode of the power circuit is connected to a second sampling end of the current sampling circuit 113 through the interface circuit 200, the first sampling end of the current sampling circuit 113 is connected to the negative electrode of the power circuit, an output end of the current sampling circuit 113 is connected to a current feedback input end of the voltage sampling circuit 112, and an output end of the voltage sampling circuit 112 is connected to an input end of the power circuit.
In some embodiments, the power circuit is a silicon controlled power module of MCC 19-12 IO1B type for generating and outputting a direct current; the magnitude of the direct current is modulated through the voltage sampling circuit and the current sampling circuit.
As shown in fig. 3, the voltage sampling circuit 112 includes a first differential comparator U1, a first comparator U2, an isolation circuit, a pulse width modulator, and a second resistor R2; the current sampling circuit 113 includes a second differential comparator U3, a second comparator U4, a first diode D1, a first resistor R1, and a sampling resistor Rs;
specifically, an inverting input terminal of the first differential comparator U1 is a first sampling terminal of the voltage sampling circuit 112, a non-inverting input terminal of the first differential comparator U1 is a second sampling terminal of the voltage sampling circuit 112, an inverting input terminal of the second differential comparator U3 is a first sampling terminal of the current sampling circuit 113, a non-inverting input terminal of the second differential comparator U3 is a second sampling terminal of the current sampling circuit 113, a first terminal of the first resistor R1 is an output terminal of the current sampling circuit 113, a non-inverting input terminal of the first comparator U2 is a current feedback input terminal of the voltage sampling circuit 112, and an output terminal of the pulse width modulator is an output terminal of the voltage sampling circuit 112;
the positive pole of the power circuit is connected with the non-inverting input end of a first differential comparator U1, the negative pole of the power circuit is connected with the inverting input end of a first differential comparator U1, the output end of the first differential comparator U1 is connected with the inverting input end of a first comparator U2, the non-inverting input end of a first comparator U2 is connected with the first end of a second resistor R2 and the output end of a current sampling circuit 113, the second end of the second resistor R2 is a first reference voltage input end, and the output end of the first comparator U2 is connected to the input end of the power circuit through an isolation circuit and a pulse width modulator;
the positive electrode of the power circuit can be connected to the second end of the sampling resistor Rs through the interface circuit 200, the negative electrode of the power circuit is connected to the first end of the sampling resistor Rs and the inverting input end of the second differential comparator U3, the second end of the sampling resistor Rs is connected to the non-inverting input end of the second differential comparator U3, the output end of the second differential comparator U3 is connected to the inverting input end of the second comparator U4, the non-inverting input end of the second comparator U4 is a second reference voltage input end, the output end of the second comparator U4 is connected to the cathode of the first diode D1, the anode of the first diode D1 is connected to the second end of the first resistor R1, and the first end of the first resistor R1 is connected to the non-inverting input end of the first comparator U2; wherein the first reference voltage and the second reference voltage can be provided by the communication circuit 500.
The operating principle of the current circuit 110 is: the first differential comparator U1 collects a voltage signal output by the power circuit, the voltage signal is input to the inverting input terminal of the first comparator U2 after differential amplification, a first reference voltage is input to the non-inverting input terminal of the first comparator U2 through the second resistor R2, and when the first reference voltage is a fixed value, the voltage of the non-inverting input terminal of the first comparator U2 changes along with the voltage change of the output terminal of the current sampling circuit 113; for example, when the output current of the power circuit is greater than the preset voltage value, the voltage value at both ends of the sampling voltage Rs increases, the voltage value output by the second differential comparator U3 increases, if the second reference voltage is a fixed value, the voltage value output by the second comparator U4 also decreases at this time, the voltage value at the non-inverting end of the first comparator U2 decreases, the voltage value output by the first comparator U2 decreases, the voltage value input to the pulse width modulator after the voltage signal output by the first comparator U2 is processed by the isolation circuit decreases, which results in a decrease in the duty cycle output by the pulse width modulator, and thus the current output by the power circuit decreases, when the voltage value output by the second differential comparator U3 is equal to the second reference voltage, the decrease in the current output by the power circuit will not decrease, that is the current source function is realized, and the output current of the current circuit can be adjusted by setting the value of the second reference voltage, i.e. to achieve an adjustable function.
As shown in fig. 4, the withstand voltage test circuit 120 includes a first controller for receiving a digital signal and outputting a control command signal, a first amplifier for amplifying the control command signal, and a boost rectifier circuit;
the first amplifier is electrically connected with the boost rectifying circuit.
In the embodiment, the first controller decodes the digital signal from the upper computer; the control command signal is converted into a power signal after being processed by the first amplifier and is input into the boost rectifying circuit, and the power signal can reach 2500V after being boosted, rectified and filtered by the boost rectifying circuit; and the first controller also establishes a digital-analog communication channel with the first amplifier and the boost rectifying circuit so as to monitor the first amplifier and the boost rectifying circuit in real time.
In some embodiments, the first controller 121 includes an FPGA chip of the type Xilinx ZYNQ7000 for receiving a digital signal and outputting a control signal, which can be converted into a high-precision analog signal; the first amplifier can be an amplifier with the model of PIV120, and has the advantages of high response speed, high stability, high precision and the like.
As shown in fig. 5, the interface circuit 200 includes a switching switch circuit 204, a network interface circuit for connecting the communication circuit 500, a second controller for controlling the switching switch circuit, a first connector 201 for connecting the current circuit 110, a second connector 202 for connecting the withstand voltage test circuit 120, a third connector 203 for connecting the medium and low voltage distribution board, a current measurement terminal 206 for connecting the current measurement device, and a voltage measurement terminal 207 for connecting the voltage measurement device;
specifically, the output end of the network port circuit is connected to the input end of the second controller, the output end of the second controller is connected to the switching switch circuit 204, and the switching switch circuit 204 is respectively connected to the second controller, the first connector 201, the second connector 202, the third connector 203, the current measuring terminal 206 and the voltage measuring terminal 207.
In this embodiment, the switching instruction data of the communication circuit 500 is sent to the switching switch circuit 204 through the network port circuit 200 and the second controller, so as to control the conduction structure of the loop in the switching switch circuit 204, so as to correspondingly test parameters such as the insulation resistance, the contact resistance, the voltage withstanding characteristic, and the like of the medium-low voltage distribution board.
As shown in fig. 5, the switching switch circuit 204 includes a first switch element K1, a second switch element K2, a third switch element K3, a fourth switch element K4, a fifth switch element K5, a sixth switch element K6, a seventh switch element K7, an eighth switch element K8, a ninth switch element K9, a tenth switch element K10, an eleventh switch element K11, and a twelfth switch element K12;
specifically, the second controller is connected to the control terminal of the first switching element K1, the control terminal of the second switching element K2, the control terminal of the third switching element K3, the control terminal of the fourth switching element K4, the control terminal of the fifth switching element K5, the control terminal of the sixth switching element K6, the control terminal of the seventh switching element K7, the control terminal of the eighth switching element K8, the control terminal of the ninth switching element K9, the control terminal of the tenth switching element K10, the control terminal of the eleventh switching element K11, and the control terminal of the twelfth switching element K12, respectively;
the second connector 202 is connected to the input terminal of the first switching element K1, the first output terminal of the first switching element K1 is connected to the first output terminal of the sixth switching element K6 via the second switching element K2 and the seventh switching element K7, the second output terminal of the first switching element K1 is connected to the second output terminal of the sixth switching element K6 via the fourth switching element K4 and the ninth switching element K9, the third output terminal of the first switching element K1 is connected to the third connector 203 via the third switching element K3, and the fourth output terminal of the first switching element K1 is connected to the third connector 203 via the fifth switching element K5;
the current measuring terminal 206 is connected to the input terminal of the sixth switching element K6, the third output terminal of the sixth switching element K6 is connected to the third connector 203 through the eighth switching element K8, and the fourth output terminal of the sixth switching element K6 is connected to the third connector 203 through the tenth switching element K10;
the eleventh switching element K11 is provided between the first connector 201 and the third connector 203; the twelfth switching element K12 is connected between the voltage measuring terminal 207 and the third connector 203.
As shown in fig. 5, the fixed contact on the right side of the switch element in the figure is an input end, and the fixed contact is a first input end and a second input end from top to bottom; the moving contact on the left side is an output end, and the moving contact is respectively a first output end, a second output end and a third output end from top to bottom, and so on. For example, the first switching element K1 has a first input terminal and a first output terminal which are closed and form a first channel, a first input terminal and a second output terminal which are closed and form a second channel, a second input terminal and a third output terminal which are closed and form a third channel, and a second input terminal and a fourth output terminal which are closed and form a fourth channel. For the definition of the channels of other switch elements, reference is made to the above example, but not to be described here, and the specific circuit connection relationship can be referred to fig. 5.
Taking the measurement of the insulation resistance of the a-phase line loop in the medium and low voltage distribution board as an example, the voltage measurement signal returns to the negative electrode of the insulation and withstand voltage test circuit 120 from the positive electrode of the insulation and withstand voltage test circuit 120 through the first channel of the first switching element K1, the first channel of the second switching element K2, the first channel of the seventh switching element K7, the first channel of the sixth switching element K6, the current measurement end 206, the third channel of the sixth switching element K6, the a-phase loop in the medium and low voltage distribution board to be tested, the second channel of the fifth switching element K5, and the fourth channel of the first switching element K1; in this process, the leakage current flowing through the a-phase line loop measured by the current measuring device is obtained, the output voltage value of the withstand voltage testing circuit 120 is obtained, and the insulation resistance of the a-phase line loop can be calculated by using ohm's law. The principle of measuring the insulation resistance of other phases or devices is the same as the method, and is not described herein.
Taking the measurement of the contact resistance of the a-phase line loop in the middle and low voltage distribution board as an example, the current measurement signal returns to the negative electrode of the current circuit from the positive electrode of the current circuit through the first channel and the second channel in the eleventh switching element K11, wherein the two ends of the voltage measurement end 207 are connected in parallel to the input end and the output end of the a-phase line loop through the first channel and the second channel in the twelfth switching element K12, so as to measure the voltage value at the two ends of the a-phase line loop, obtain the output current value of the current circuit 110, and calculate the contact resistance of the a-phase line loop by using the ohm's law. The measurement principle of the resistance value test of the contact resistors of other phase lines or devices is the same as that of the method, and is not described in detail herein.
In some embodiments, the first switching element K1 and the sixth switching element K6 are double pole double throw type relays, the second switching element K2, the third switching element K3, the fourth switching element K4, and the fifth switching element K5 are single pole four throw type relays, the seventh switching element K7, the eighth switching element K8, the ninth switching element K9, and the tenth switching element K10 are single pole three throw type relays, and the eleventh switching element K11 and the twelfth switching element K12 are double pole three throw type relays.
The implementation of the utility model has the following beneficial effects: the current circuit and the insulation and voltage resistance test circuit are connected with a medium and low voltage distribution board to be tested through an interface circuit, a control command of an upper computer is sent to the current circuit and the insulation and voltage resistance test circuit through a communication circuit to enable the communication circuit to output a current signal and a current signal required by the test, the current value and the voltage value of a device or a loop in the medium and low voltage distribution board to be tested are measured, parameters such as contact resistance, insulation impedance and voltage resistance characteristics of the device or the loop can be measured by using ohm's law, a wiring process is omitted, the test efficiency is high, meanwhile, the current circuit and the insulation and voltage resistance test circuit are isolated to ensure the safety of the test process, a heat dissipation device is additionally arranged to prevent high-frequency test work from enabling the test equipment to rapidly enter an over-temperature working state, and the test efficiency is further improved.
It is to be understood that the foregoing examples, while indicating the preferred embodiments of the utility model, are given by way of illustration and description, and are not to be construed as limiting the scope of the utility model; it should be noted that, for those skilled in the art, the above technical features can be freely combined, and several changes and modifications can be made without departing from the concept of the present invention, which all belong to the protection scope of the present invention; therefore, all equivalent changes and modifications made within the scope of the claims of the present invention should be covered by the claims of the present invention.
Claims (9)
1. The testing device for the medium and low voltage distribution board comprises a shell, and is characterized in that a current circuit (110) for outputting adjustable current, an insulation and withstand voltage testing circuit (120) for outputting adjustable voltage, an interface circuit (200) for connecting the medium and low voltage distribution board, a communication circuit (500) for communicating with an upper computer, a first accommodating space for accommodating the current circuit (110), a second accommodating space for accommodating the insulation and withstand voltage testing circuit (120), and a partition board for isolating the first accommodating space from the second accommodating space are arranged in the shell;
a ventilation pipeline (3) is arranged between the first accommodating space and the second accommodating space; the ventilating duct (3) is provided with ventilating holes, and a ventilation device is arranged in the ventilating duct (3);
the communication circuit (500) is connected with the input end of the current circuit (110), the input end of the voltage-withstand-voltage testing circuit (120) and the interface circuit (200), and the output end of the current circuit (110) and the output end of the voltage-withstand-voltage testing circuit (120) are respectively connected with the interface circuit (200).
2. The middle and low voltage distribution board testing device of claim 1, wherein a temperature sensor is arranged in each of the first accommodating space and the second accommodating space, and a master controller for controlling the ventilation device according to feedback information of the temperature sensor is arranged in the first accommodating space; the controller is connected with the temperature sensor and the air interchanger.
3. The medium and low voltage switchboard test device according to claim 1, characterized in that said current circuit (110) comprises a power circuit for outputting an adjustable current signal, a voltage sampling circuit (112) for collecting voltage information outputted by said power circuit and a current information current sampling circuit (113) for collecting current information outputted by said power circuit;
the first sampling end in the voltage sampling circuit (112) is connected with the negative pole of the power circuit, the second sampling end in the voltage sampling circuit (112) is connected with the positive pole of the power circuit, the positive pole of the power circuit is connected with the second sampling end of the current sampling circuit (113) through the interface circuit (200), the first sampling end of the current sampling circuit (113) is connected with the negative pole of the power circuit, the output end of the current sampling circuit (113) is connected with the current feedback input end of the voltage sampling circuit (112), and the output end of the voltage sampling circuit (112) is connected with the input end of the power circuit.
4. The medium and low voltage switchboard test device according to claim 3, characterized in that said voltage sampling circuit (112) comprises a first differential comparator U1, a first comparator U2, an isolation circuit, a pulse width modulator and a second resistor R2;
the positive pole of the power circuit is connected with the non-inverting input end of the first differential comparator U1, the negative pole of the power circuit is connected with the inverting input end of the first differential comparator U1, the output end of the first differential comparator U1 is connected with the inverting input end of the first comparator U2, the non-inverting input end of the first comparator U2 is connected with the first end of the second resistor R2 and the output end of the current sampling circuit (113), the second end of the second resistor R2 is a first reference voltage input end, and the output end of the first comparator U2 is connected with the input end of the power circuit through the isolation circuit and the pulse width modulator.
5. The medium and low voltage switchboard test device according to claim 4, characterized in that said current sampling circuit (113) comprises a second differential comparator U3, a second comparator U4, a first diode D1, a first resistor R1 and a sampling resistor Rs;
the negative pole of power circuit connects the first end of sampling resistance Rs and the inverting input of second differential comparator U3, the second end of sampling resistance Rs is connected the non inverting input of second differential comparator U3, the inverting input of second differential comparator U4 is connected to the output of second differential comparator U3, the non inverting input of second comparator U4 is second reference voltage input, the output of second comparator U4 is connected the negative pole of first diode D1, the second end of first resistance R1 is connected to the positive pole of first diode D1, the first end of first resistance R1 is the output of current sampling circuit (113).
6. The middle and low voltage switchboard testing device of claim 1, characterized in that said withstand voltage testing circuit (120) comprises a first controller for receiving digital signals and outputting control command signals, a first amplifier for amplifying control command signals and a boost rectifying circuit;
the first controller is electrically connected with the first amplifier and the boosting rectifying circuit, and the first amplifier is electrically connected with the boosting rectifying circuit.
7. The medium and low voltage switchboard testing device of claim 1, characterized in that said interface circuit (200) comprises a fling-cut switch circuit (204), a network port circuit for connecting said communication circuit (500), a second controller for controlling said fling-cut switch circuit, a first connector (201) for connecting said current circuit (110), a second connector (202) for connecting said withstand voltage testing circuit (120), a third connector (203) for connecting said medium and low voltage switchboard, a current measuring terminal (206) for connecting a current measuring device and a voltage measuring terminal (207) for connecting a voltage measuring device;
the output end of the network port circuit is connected with the input end of the second controller, the output end of the second controller is connected with the switching switch circuit (204), and the switching switch circuit (204) is respectively connected with the second controller, the first connector (201), the second connector (202), the third connector (203), the current measuring end (206) and the voltage measuring end (207).
8. The medium and low voltage switchboard test device according to claim 7, characterized in that said fling-cut switch circuit (204) comprises a first switch element K1, a second switch element K2, a third switch element K3, a fourth switch element K4, a fifth switch element K5, a sixth switch element K6, a seventh switch element K7, an eighth switch element K8, a ninth switch element K9, a tenth switch element K10, an eleventh switch element K11, a twelfth switch element K12;
the second controller is respectively connected with the control end of the first switch element K1, the control end of the second switch element K2, the control end of the third switch element K3, the control end of the fourth switch element K4, the control end of the fifth switch element K5, the control end of the sixth switch element K6, the control end of the seventh switch element K7, the control end of the eighth switch element K8, the control end of the ninth switch element K9, the control end of the tenth switch element K10, the control end of the eleventh switch element K11 and the control end of the twelfth switch element K12;
the second connector (202) is connected to an input terminal of the first switching element K1, a first output terminal of the first switching element K1 is connected to a first output terminal of the sixth switching element K6 through the second switching element K2 and a seventh switching element K7, a second output terminal of the first switching element K1 is connected to a second output terminal of the sixth switching element K6 through the fourth switching element K4 and a ninth switching element K9, a third output terminal of the first switching element K1 is connected to the third connector (203) through the third switching element K3, and a fourth output terminal of the first switching element K1 is connected to the third connector (203) through the fifth switching element K5;
the current measuring terminal (206) is connected to the input terminal of the sixth switching element K6, the third output terminal of the sixth switching element K6 is connected to the third connector (203) via the eighth switching element K8, and the fourth output terminal of the sixth switching element K6 is connected to the third connector (203) via the tenth switching element K10;
the eleventh switching element K11 is connected between the first connector (201) and the third connector (203); the twelfth switching element K12 is connected between the voltage measurement terminal (207) and the third connector (203).
9. Medium and low voltage switchboard test device according to claim 8, characterized in that said first switching element K1 and sixth switching element K6 are relays of the double pole double throw type; the second switch element K2, the third switch element K3, the fourth switch element K4 and the fifth switch element K5 are single-pole four-throw relays; the seventh switching element K7, the eighth switching element K8, the ninth switching element K9 and the tenth switching element K10 are single-pole triple-throw relays; the eleventh switching element K11 and the twelfth switching element K12 are double pole triple throw relays.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123004067.7U CN216595364U (en) | 2021-12-01 | 2021-12-01 | Middle and low voltage distribution board testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123004067.7U CN216595364U (en) | 2021-12-01 | 2021-12-01 | Middle and low voltage distribution board testing device |
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| Publication Number | Publication Date |
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| CN216595364U true CN216595364U (en) | 2022-05-24 |
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| CN202123004067.7U Active CN216595364U (en) | 2021-12-01 | 2021-12-01 | Middle and low voltage distribution board testing device |
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| Country | Link |
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| CN (1) | CN216595364U (en) |
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