CN216558774U

CN216558774U - Probe fixing rack for automatic infrared detector of PCB (printed circuit board)

Info

Publication number: CN216558774U
Application number: CN202220119826.XU
Authority: CN
Inventors: 张国平
Original assignee: Zhongxin Century Electronic Materials Shixing Co ltd
Current assignee: Zhongxin Century Electronic Materials Shixing Co ltd
Priority date: 2022-01-18
Filing date: 2022-01-18
Publication date: 2022-05-17
Anticipated expiration: 2032-01-18

Abstract

The utility model discloses a probe fixing rack for an automatic infrared detector of a PCB (printed circuit board), which comprises a bracket, wherein a transverse plate is arranged on the inner side wall of the bracket, and a thickness measuring adjusting mechanism is arranged outside the transverse plate; thickness measurement adjustment mechanism sets up the guide rail outside the diaphragm including the symmetry, the outside bilateral symmetry that lies in two guide rails of diaphragm installs the locating plate, it is connected with the screw thread regulation pole to rotate between two locating plates of homonymy, it is connected with the connecting rod to rotate jointly between the locating plate that both sides are close to each other, the connecting rod is connected with the screw thread regulation pole of both sides, wherein the screw thread regulation pole of one side is kept away from the one end of connecting rod and is installed the knob, the outside threaded connection of screw thread regulation pole has fixed joint, fixed joint and guide rail sliding connection. The utility model can change the measuring position, can measure the thickness of the plate on a plurality of straight lines, greatly reduces the cost of plate measurement, does not need to be debugged again, is simpler and quicker, and improves the efficiency of plate processing.

Description

Probe fixing rack for automatic infrared detector of PCB (printed circuit board)

Technical Field

The utility model relates to the technical field of probe fixing frames, in particular to a probe fixing frame for an automatic infrared detector of a PCB (printed circuit board).

Background

In recent years, with the precision of PCB circuits, the requirements of PCBs on dielectric layers are higher and higher, and the market MIN I-LED is in the rise, the overall uniformity of the board thickness is stricter and stricter, so that all methods must be used to meet the requirements of customers when the market share is better occupied, and the requirements of more rigorous, efficient and accurate processing board thickness detection procedures are required. The thickness detection of the copper-clad plate is also measured by an original pure manual micrometer, namely probe type mechanical single-point measurement, and is basically replaced into multi-point multi-probe infrared automatic plate thickness detection on a single straight line nowadays.

The automatic infrared detectors are composed of an upper probe and a lower probe, the infrared automatic thickness gauge installed on the original assembly line framework has more limitations, the measuring position is fixed, the thickness of the plate on one fixed straight line can be measured, if multi-position measurement is needed, the detection probe set can be added at different positions, the cost is higher, or the probes are disassembled and assembled to different positions, but debugging is needed again, and the consumed time is longer; the lower probe is difficult to clean, the detection result is often influenced by dust accumulation for a certain time, the influence of the stability in the plate conveying process is also large, the plate transmission jumping can directly influence the test result, and therefore a probe fixing rack for the automatic infrared detector of the PCB circuit board is needed

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the defects that in the prior art, the measuring position is fixed, the cost is high, the time consumption is long, the lower probe is difficult to clean, the stability influence is large, and the test result is influenced by the transmission jitter of a plate.

In order to achieve the purpose, the utility model adopts the following technical scheme:

a probe fixing rack for an automatic infrared detector of a PCB (printed circuit board) comprises a bracket, wherein a transverse plate is arranged on the inner side wall of the bracket, and a thickness measuring adjusting mechanism is arranged outside the transverse plate;

thickness measurement adjustment mechanism sets up the guide rail outside the diaphragm including the symmetry, the outside bilateral symmetry that is located two guide rails of diaphragm installs the locating plate, rotates between two locating plates of homonymy and is connected with the screw thread regulation pole, and both sides are close to each other rotate jointly between the locating plate and be connected with the connecting rod, the connecting rod is connected with the screw thread regulation pole of both sides, one of them side the screw thread regulation pole is kept away from the one end of connecting rod and is installed the knob, the outside threaded connection of screw thread regulation pole has fixed joint, fixed joint and guide rail sliding connection, one side that the screw thread regulation pole was kept away from to fixed joint is installed U type fixed disk, the thickness measurement probe is installed to the outside symmetry of U type fixed disk.

The above technical solution further comprises:

preferably, one side of the U-shaped fixed disc, which is close to the thickness measuring probe, is provided with an air blowing copper pipe, and the end part of the air blowing copper pipe is positioned above the thickness measuring probe.

Preferably, two sliding grooves are formed in one side, close to the thickness measuring probe, of the support, and two fixing screws are connected to the inside of each sliding groove in a sliding mode.

Preferably, the two fixing screws are provided with a mounting plate on the outside, and the mounting plate is provided with holes matched with the fixing screws on the outside.

Preferably, an induction probe is mounted on the exterior of the mounting plate, and the induction probe is positioned below the fixing screw.

Preferably, transition plates are symmetrically arranged on one side, close to the thickness measuring probe, of the transverse plate, and the side faces of the transition plates are in a certain radian.

Compared with the prior art, the utility model has the beneficial effects that:

1. according to the utility model, through the matched use of the transverse plate, the guide rail, the positioning plate, the threaded adjusting rod, the fixed joint, the U-shaped fixed disk and the thickness measuring probe, the measuring position can be changed, the thickness of the plate on a plurality of straight lines can be measured, the plate measuring cost is greatly reduced, the re-debugging is not needed, the plate measuring device is simpler and faster, and the plate processing efficiency is improved.

2. According to the utility model, the blowing copper pipe, the thickness measuring probe, the mounting plate and the induction probe are matched for use, the thickness measuring probe below the blowing copper pipe can be automatically cleaned, the influence of dust accumulation on a measurement result is avoided, meanwhile, under the action of the transition plate, a plate is more stable in the conveying process, the plate is prevented from jumping in the conveying process, and the precision of the plate measurement result is improved.

Drawings

FIG. 1 is a schematic structural view of a probe fixing frame for an automatic infrared detector for PCB circuit boards according to the present invention;

FIG. 2 is a schematic diagram of a rear view structure of a probe fixing rack for an automatic infrared detector for PCB circuit boards according to the present invention;

fig. 3 is a schematic top view of a probe fixing frame for an automatic infrared detector for a PCB circuit board according to the present invention.

In the figure: 1. a support; 2. a transverse plate; 3. a guide rail; 4. positioning a plate; 5. a threaded adjusting rod; 6. a knob; 7. a connecting rod; 8. fixing the joint; 9. a U-shaped fixed disc; 10. a thickness measuring probe; 11. a blowing copper pipe; 12. a chute; 13. a set screw; 14. mounting a plate; 15. an inductive probe; 16. a transition plate.

Detailed Description

The technical solution of the present invention is further explained with reference to the accompanying drawings and specific embodiments.

Example one

As shown in fig. 1-3, the probe fixing frame for the automatic infrared detector of the PCB comprises a bracket 1, wherein a transverse plate 2 is installed on the inner side wall of the bracket 1, and a thickness measuring adjusting mechanism is arranged outside the transverse plate 2;

the thickness measuring and adjusting mechanism comprises guide rails 3 symmetrically arranged on the outer portion of a transverse plate 2, positioning plates 4 are symmetrically arranged on two sides of the two guide rails 3 on the outer portion of the transverse plate 2, a threaded adjusting rod 5 is rotatably connected between the two positioning plates 4 on the same side, a connecting rod 7 is rotatably connected between the positioning plates 4 on two sides close to each other, the connecting rod 7 is connected with the threaded adjusting rods 5 on two sides, wherein the one end that the screw thread adjusting rod 5 of one side kept away from connecting rod 7 is installed knob 6, the outside threaded connection of screw thread adjusting rod 5 has fixed joint 8, fixed

joint

8 and 3 sliding connection of guide rail, fixed joint 8 keeps away from one side of screw thread adjusting rod 5 and installs U type fixed disk 9, thickness measuring probe 10 is installed to the outside symmetry of U type fixed disk 9, support 1 installs in the transmission equipment outside, the externally mounted of diaphragm 2 has thickness measuring probe 10, another corresponding thickness measuring probe 10 is installed in the transmission equipment outside.

The working principle of the probe fixing rack for the PCB automatic infrared detector based on the first embodiment is that during the process of conveying a plate on a conveying device, the thickness of the plate is measured through a plurality of thickness measuring probes 10, when the thickness of different positions of the plate needs to be measured, because the outer part of a transverse plate 2 is symmetrically provided with a guide rail 3, one side of the transverse plate 2 close to the guide rail 3 is provided with a plurality of positioning plates 4, two positioning plates 4 on the same side are jointly and rotatably connected with a thread adjusting rod 5, the two thread adjusting rods 5 are jointly connected with a connecting rod 7, one end of one thread adjusting rod 5 far away from the connecting rod 7 is provided with a knob 6, the outer thread of the thread adjusting rod 5 is connected with a fixed joint 8, the fixed joint 8 is in sliding connection with the guide rail 3, the other side of the fixed joint 8 is connected with a U-shaped fixed disc 9, the thickness measuring probes 10 are arranged outside the U-shaped fixed disc 9, the knob 6 is rotated at the moment, so that the thread adjusting rod 5 can be driven to rotate, the fixed joints 8 on the two sides are driven to synchronously move leftwards or rightwards outside the thread adjusting rod 5, the thickness measuring probes 10 on the two sides are driven to move, thickness measurement is carried out on different positions of the plate, the cost of plate measurement is reduced, re-debugging is not needed, simplicity and rapidness are improved, and the plate processing efficiency is improved.

Example two

As shown in fig. 1-2, based on the first embodiment, an air blowing copper tube 11 is installed on one side of a U-shaped fixed disk 9 close to a thickness measuring probe 10, an end of the air blowing copper tube 11 is located above the thickness measuring probe 10, two sliding grooves 12 are formed on one side of a bracket 1 close to the thickness measuring probe 10, two fixing screws 13 are slidably connected inside the sliding grooves 12, a mounting plate 14 is commonly installed outside the two fixing screws 13, holes matched with the fixing screws 13 are formed outside the mounting plate 14, an induction probe 15 is installed outside the mounting plate 14, the induction probe 15 is located below the fixing screws 13, transition plates 16 are symmetrically installed on one side of a transverse plate 2 close to the thickness measuring probe 10, the side surfaces of the transition plates 16 are in a certain radian, the air blowing copper tube 11 is connected with an external air compression device, the induction probe 15 is used for sending signals to induce the in and out of a plate, and the induction probe 15 is electrically connected with an external electromagnetic valve and the air compression device, realize the discharge of gas, carry out self-cleaning.

In the embodiment, when a plate passes through the inductive probe 15 on the transmission equipment, the inductive probe 15 sends a signal, when the plate passes through the inductive probe 15, the electromagnetic valve controls the gas compression device to discharge gas, the gas blowing copper pipe 11 cleans dust on the surface of the thickness measuring probe 10 below, the dust accumulation is prevented from influencing a detection result, the position of the inductive probe 15 can be adjusted through the fixing screw 13, and the inductive probe 15 is convenient to sense plates of various sizes; when the plate is transmitted to the support 1, the plate is prevented from jumping in the transmission process under the action of the transition plate 16, the transition of the thick plate is suitable, the stability of the plate when the plate passes through the area of the thickness measuring probe 10 is ensured, and the precision of the plate measuring result is improved.

The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and equivalent alternatives or modifications according to the technical solution of the present invention and the inventive concept thereof should be covered by the scope of the present invention.

Claims

1. A probe fixing rack for an automatic infrared detector of a PCB (printed circuit board) comprises a bracket (1) and is characterized in that a transverse plate (2) is installed on the inner side wall of the bracket (1), and a thickness measuring adjusting mechanism is arranged outside the transverse plate (2);

the thickness measuring adjusting mechanism comprises guide rails (3) symmetrically arranged on the outer portion of a transverse plate (2), positioning plates (4) are symmetrically arranged on two sides of the outer portion of the transverse plate (2) located on the two guide rails (3), a threaded adjusting rod (5) is rotatably connected between the two positioning plates (4) on the same side, two sides of the transverse plate are close to each other, a connecting rod (7) is rotatably connected between the positioning plates (4) on the two sides, the connecting rod (7) is connected with the threaded adjusting rods (5) on the two sides, one end, far away from the connecting rod (7), of the threaded adjusting rod (5) on one side is provided with a knob (6), the outer portion of the threaded adjusting rod (5) is in threaded connection with a fixed joint (8), the fixed joint (8) is slidably connected with the guide rails (3), one side, far away from the threaded adjusting rod (5), of the fixed joint (8) is provided with a U-shaped fixed disc (9), and thickness measuring probes (10) are symmetrically arranged outside the U-shaped fixed disc (9).

2. The probe fixing rack for the PCB automatic infrared detector according to claim 1, wherein a blowing copper tube (11) is installed on one side of the U-shaped fixing disk (9) close to the thickness measuring probe (10), and the end of the blowing copper tube (11) is located above the thickness measuring probe (10).

3. The probe fixing rack for the PCB automatic infrared detector is characterized in that two sliding grooves (12) are formed in one side, close to the thickness measuring probe (10), of the support (1), and two fixing screws (13) are connected to the inside of each sliding groove (12) in a sliding mode.

4. The probe fixing rack for the PCB automatic infrared detector is characterized in that the two fixing screws (13) are provided with a mounting plate (14) at the outer part, and the mounting plate (14) is provided with holes matched with the fixing screws (13).

5. The probe fixing frame for the PCB automatic infrared detector is characterized in that an induction probe (15) is installed outside the installation plate (14), and the induction probe (15) is located below the fixing screw (13).

6. The probe fixing rack for the PCB automatic infrared detector according to claim 1, characterized in that transition plates (16) are symmetrically installed on one side of the transverse plate (2) close to the thickness measuring probe (10), and the side surfaces of the transition plates (16) are in a certain radian.