CN216248292U - Hall effect test frame - Google Patents
Hall effect test frame Download PDFInfo
- Publication number
- CN216248292U CN216248292U CN202122825606.7U CN202122825606U CN216248292U CN 216248292 U CN216248292 U CN 216248292U CN 202122825606 U CN202122825606 U CN 202122825606U CN 216248292 U CN216248292 U CN 216248292U
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- adjusting
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- axis
- test assembly
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- 238000012360 testing method Methods 0.000 title claims abstract description 89
- 230000005355 Hall effect Effects 0.000 title claims abstract description 17
- 230000003287 optical effect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
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Abstract
The utility model discloses a Hall effect test frame which comprises a test base, an electromagnet and a Hall test assembly, wherein the electromagnet and the Hall test assembly are installed on the test base; the device is characterized by also comprising a double-rod positioning type adjusting bracket which is arranged on the test base and used for improving the adjusting precision of the Hall test assembly; the Hall test assembly is detachably mounted on the double-rod positioning type adjusting support of the test base through a screw. According to the utility model, the Hall test assembly is adjusted by the double-rod positioning type adjusting support through the arrangement of the double-rod positioning type adjusting support, so that the adjusting precision and the testing accuracy of the Hall test assembly are improved; the Hall test assembly is detachably arranged on the double-rod positioning type adjusting bracket by using a screw, so that the Hall test assembly is convenient to detach and replace; through the setting of adjusting the scale bar on the two pole locate mode regulation supports, utilize and adjust the distance that the two pole locate mode regulation supports adjusted hall test assembly to improve the precision that hall test assembly adjusted.
Description
Technical Field
The utility model relates to the technical field of Hall effect testing, in particular to a Hall effect testing frame.
Background
The Hall effect test jig is commonly used for measuring a magnetic field by a Hall element, the Hall element is small in size, convenient to use and high in measurement accuracy, and can be used for measuring AC and DC magnetic fields widely. Therefore, a Hall effect test frame is provided.
Disclosure of Invention
The utility model aims to solve the problems that in the prior art, a Hall effect test frame is usually provided with a common optical rail for adjusting a Hall element, the common optical rail is suitable for a lock nut to adjust and fix the Hall element, the common optical rail needs to be directly pushed by hands, and the adjusted distance cannot be accurately judged, so that the test accuracy is reduced, or the common optical rail is adjusted by adjusting a rack, but the gap of the adjusting rack is larger, the rack is easy to clamp after being screwed to the bottom, the damage rate is higher, the normal use is influenced, and the existing Hall element is inconvenient to disassemble due to the fact that the existing Hall element is required to be connected through a line during testing.
In order to achieve the purpose, the utility model provides the following technical scheme: the Hall effect test frame comprises a test base, an electromagnet and a Hall test assembly, wherein the electromagnet is installed on the test base; the device is characterized by also comprising a double-rod positioning type adjusting bracket which is arranged on the test base and used for improving the adjusting precision of the Hall test assembly; the Hall test assembly is detachably mounted on the double-rod positioning type adjusting support of the test base through a screw.
Preferably, the Hall effect test frame comprises an X-axis adjusting bracket arranged on the test base and a Z-axis adjusting bracket arranged on the X-axis adjusting bracket; the Hall test assembly is arranged on a Z-axis adjusting support of the double-rod positioning type adjusting support.
Preferably, the X-axis adjusting support and the Z-axis adjusting support both comprise adjusting bases, adjusting guide rods and adjusting screws, wherein the adjusting guide rods and the adjusting screws are installed on the adjusting bases; an X-axis adjusting block and a Z-axis adjusting block are movably arranged on the adjusting screw rod through threads respectively; the Z-axis adjusting block is provided with a conducting block through a screw; an adjusting rod is arranged on the conducting block; the Hall test assembly is arranged on an adjusting rod of the Z-axis adjusting support.
Preferably, an adjusting head is arranged on an adjusting screw rod arranged on the adjusting base; the adjusting base of the Z-axis adjusting bracket is fixedly arranged on the X-axis adjusting block through a screw; the Hall test assembly comprises a Hall element circuit board and a Hall element, wherein the Hall element circuit board is installed on the adjusting rod through a screw, and the Hall element is installed on the Hall element circuit board.
Preferably, the Hall element cable plate and the adjusting base are both provided with adjusting scale strips.
The utility model has the beneficial effects that: the Hall test assembly is adjusted by the double-rod positioning type adjusting support through the arrangement of the double-rod positioning type adjusting support, so that the adjusting precision and the testing accuracy of the Hall test assembly are improved;
the Hall test assembly is detachably arranged on the double-rod positioning type adjusting bracket by using a screw, so that the Hall test assembly is convenient to detach and replace;
through the setting of adjusting the scale bar on the two pole locate mode regulation supports, utilize and adjust the distance that the two pole locate mode regulation supports adjusted hall test assembly to improve the precision that hall test assembly adjusted.
Drawings
Fig. 1 is a schematic structural view of the present invention.
Fig. 2 is a partial structural schematic diagram of the present invention.
Fig. 3 is a front view of the present invention.
Fig. 4 is a side view of the present invention.
Fig. 5 is a schematic structural diagram of a hall test assembly of the present invention.
Illustration of the drawings: 1, testing a base; 2, an electromagnet; 3, a Hall test component; 301 er element circuit board; 302 a Hall element; 4, a double-rod positioning type adjusting bracket; 401X axis adjustment support; 402Z-axis adjustment bracket; 403 adjusting the base; 404 adjusting the guide bar; 405 adjusting the screw; 406X-axis adjustment block; 407Z-axis adjusting block; 408 conducting the block; 409 adjusting a rod; 410 an adjustment head; 5 adjusting the scale bar.
Detailed Description
The hall effect test frame of the present invention will be further described with reference to the accompanying drawings.
Referring to fig. 1-3, the hall effect test fixture in this embodiment includes a test base 1, an electromagnet 2 mounted on the test base 1, and a hall test assembly 3; the device is characterized by also comprising a double-rod positioning type adjusting bracket 4 which is arranged on the testing base 1 and improves the adjusting precision of the Hall testing component 3; the Hall test assembly 3 is detachably mounted on a double-rod positioning type adjusting bracket 4 of the test base 1 through a screw; the Hall test assembly 3 is adjusted by the double-rod positioning type adjusting support 4 through the arrangement of the double-rod positioning type adjusting support 4, so that the adjusting precision and the testing accuracy of the Hall test assembly 3 are improved; through utilizing screw demountable installation hall test assembly 3 on two pole locate mode adjusting bracket 4 to be convenient for hall test assembly 3's dismantlement is changed.
Referring to fig. 1-4, the double-rod positioning type adjusting bracket 4 is mounted on an X-axis adjusting bracket 401 of the testing base 1 and a Z-axis adjusting bracket 402 mounted on the X-axis adjusting bracket 401 through screws; the Hall test assembly 3 is arranged on a Z-axis adjusting bracket 402 of the double-rod positioning type adjusting bracket 4; the X-axis adjusting bracket 401 and the Z-axis adjusting bracket 402 both comprise an adjusting base 403, an adjusting guide rod 404 and an adjusting screw 405, wherein the adjusting guide rod 404 is installed on the adjusting base 403; an X-axis adjusting block 406 and a Z-axis adjusting block 407 are movably mounted on the adjusting screw 405 through threads respectively; the Z-axis adjusting block 407 is provided with a conducting block 408 through a screw; the conducting block 408 is provided with an adjusting rod 409; the Hall test assembly 3 is arranged on an adjusting rod 409 of the Z-axis adjusting bracket 402; an adjusting head 410 is arranged on an adjusting screw 405 arranged on the adjusting base 401 through a screw; an adjusting base 401 of the Z-axis adjusting bracket 402 is fixedly arranged on an X-axis adjusting block 406 through a screw; adjusting heads 410 on the X-axis adjusting support 401 and the Z-axis adjusting support 402 respectively drive an adjusting screw 405 to rotate, the adjusting screw 405 respectively drives an X-axis adjusting block 406 and a Z-axis adjusting block 407 to move along an adjusting guide rod 404, the X-axis adjusting block 406 drives the Z-axis adjusting support 402 and the Hall test assembly 3 to move along the X axis, the Z-axis adjusting block 407 drives the Hall test assembly 3 to move along the Z axis, and the Hall test assembly 3 is adjusted, so that the adjusting precision and the adjusting stability of the Hall test assembly 3 are improved.
Referring to fig. 1 to 5, the hall test assembly 3 includes a hall element circuit board 301 mounted on the adjusting lever 409 by screws and a hall element 302 mounted on the hall element circuit board 301 by soldering; the Hall element cable plate 301 and the adjusting base 401 are both provided with adjusting scale strips 5; through the setting of adjusting scale strip 5, utilize and adjust the distance that two pole locate mode regulation support 4 adjusted hall test assembly 3 of 5 control of scale strip to improve the precision that hall test assembly 3 adjusted.
In the utility model, during testing, firstly, the Hall element circuit board 301 welded with the Hall element 302 is fixedly arranged on an adjusting rod 409 through screws, then an adjusting head 410 on a Z-axis adjusting bracket 402 is rotated, the adjusting head 410 drives an adjusting screw rod 405 to rotate, the adjusting screw rod 405 drives a Z-axis adjusting block 407 to slide along an adjusting guide rod 404, the Z-axis adjusting block 407 drives the adjusting rod 409, the Hall element circuit board 301 arranged on the adjusting rod 409 and the Hall element 302 arranged on the Hall element circuit board 301 to move, the height of the Hall element 302 in the Z-axis direction is adjusted through an adjusting scale strip 5 on an adjusting base 401, so that the Hall element 302 is aligned with the tested height of an electromagnet 2, then the adjusting head 410 on the X-axis adjusting bracket 401 is rotated, the adjusting head 410 drives the adjusting screw rod 405 to rotate, and the adjusting screw rod 405 drives an X-axis adjusting block 406 to slide along the adjusting guide rod 404, the X-axis adjusting block 406 drives the Z-axis adjusting support 402 and the Hall element 302 arranged on the Z-axis adjusting support 402 to be adjusted along the X-axis direction, the Hall element 302 is moved to the inside of the electromagnet 2 along the X-axis direction, the length of the Hall element 302 extending into the electromagnet 2 is accurately adjusted by adjusting the base 401 and the adjusting scale strips 5 on the Hall element circuit board 301, and therefore the Hall element 302 is tested.
The above embodiments are illustrative of the present invention, and are not intended to limit the present invention, and any simple modifications of the present invention are within the scope of the present invention.
Claims (5)
1. The Hall effect test frame comprises a test base (1), an electromagnet (2) and a Hall test assembly (3), wherein the electromagnet (2) is installed on the test base (1); the device is characterized by also comprising a double-rod positioning type adjusting bracket (4) which is arranged on the testing base (1) and improves the adjusting precision of the Hall testing component (3); the Hall test assembly (3) is detachably mounted on the double-rod positioning type adjusting support (4) of the test base (1) through screws.
2. The Hall effect test stand of claim 1, wherein: the double-rod positioning type adjusting support (4) comprises an X-axis adjusting support (401) arranged on the testing base (1) and a Z-axis adjusting support (402) arranged on the X-axis adjusting support (401); the Hall test assembly (3) is arranged on a Z-axis adjusting bracket (402) of the double-rod positioning type adjusting bracket (4).
3. The Hall effect test stand of claim 2, wherein: the X-axis adjusting bracket (401) and the Z-axis adjusting bracket (402) respectively comprise an adjusting base (403), an adjusting guide rod (404) arranged on the adjusting base (403) and an adjusting screw rod (405); an X-axis adjusting block (406) and a Z-axis adjusting block (407) are movably mounted on the adjusting screw (405) through threads respectively; a conduction block (408) is mounted on the Z-axis adjusting block (407) through a screw; an adjusting rod (409) is arranged on the conducting block (408); the Hall test assembly (3) is arranged on an adjusting rod (409) of the Z-axis adjusting bracket (402).
4. The Hall effect test rack of claim 3, wherein: an adjusting head (410) is arranged on an adjusting screw (405) arranged on the adjusting base (403); an adjusting base (403) of the Z-axis adjusting bracket (402) is fixedly arranged on an X-axis adjusting block (406) through a screw; the Hall test assembly (3) comprises a Hall element circuit board (301) arranged on the adjusting rod (409) through screws and a Hall element (302) arranged on the Hall element circuit board (301).
5. The Hall effect test stand of claim 4, wherein: and the Hall element circuit board (301) and the adjusting base (403) are both provided with adjusting scale strips (5).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122825606.7U CN216248292U (en) | 2021-11-18 | 2021-11-18 | Hall effect test frame |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122825606.7U CN216248292U (en) | 2021-11-18 | 2021-11-18 | Hall effect test frame |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216248292U true CN216248292U (en) | 2022-04-08 |
Family
ID=80945608
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122825606.7U Active CN216248292U (en) | 2021-11-18 | 2021-11-18 | Hall effect test frame |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216248292U (en) |
-
2021
- 2021-11-18 CN CN202122825606.7U patent/CN216248292U/en active Active
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