CN216434276U

CN216434276U - Voltage limiting test device for detecting performance of light emitting diode

Info

Publication number: CN216434276U
Application number: CN202122845617.1U
Authority: CN
Inventors: 方林; 胡建海; 叶军
Original assignee: Shenzhen Tianying Shenyuan Technology Co ltd
Current assignee: Shenzhen Tianying Shenyuan Technology Co ltd
Priority date: 2021-11-19
Filing date: 2021-11-19
Publication date: 2022-05-03
Anticipated expiration: 2031-11-19

Abstract

The utility model discloses a voltage limiting testing arrangement of emitting diode performance detection usefulness, including the test box, the front end both sides movable mounting of test box has the handle, the upper surface of test box is close to front end fixed mounting has the cardboard, the preceding terminal surface of test box is equipped with the instrument pointer, one side that the preceding terminal surface of test box is located the instrument pointer is equipped with the display screen, the below both sides that the preceding terminal surface of test box is located the display screen are equipped with the detection jack, the one end surface activity of cardboard inlays and is equipped with the locking knob, the both sides surface activity of handle inlays and is equipped with the location bolt. A voltage limiting testing arrangement that emitting diode performance detected usefulness, through mutually supporting of the cardboard that sets up and locking knob, can fix the test after placing a plurality of emitting diode, through the location bolt that sets up, can carry out the fixed of different angles to the handle to carry out stable support to the test box.

Description

Voltage limiting test device for detecting performance of light emitting diode

Technical Field

The utility model relates to a voltage limiting testing arrangement field, in particular to voltage limiting testing arrangement of emitting diode performance detection usefulness.

Background

The diode is an electronic device made of semiconductor material (silicon, selenium, germanium, etc.), and has unidirectional conductivity, that is, when a forward voltage is applied to the anode and cathode of the diode, the diode is turned on, and when a reverse voltage is applied to the anode and cathode, the diode is turned off, and thus, the diode is turned on and off, which corresponds to the on and off of a switch, a diode is one of the earliest semiconductor devices, the application is very wide, especially in various electronic circuits, the reasonable connection is carried out by utilizing components such as a diode, a resistor, a capacitor, an inductor and the like to form circuits with different functions, can realize a plurality of functions such as rectification of alternating current, detection of modulation signals, amplitude limiting and clamping, voltage stabilization of power supply voltage and the like, detecting the forward or reverse voltage limiting voltage of the diode by a withstand voltage tester so as to determine whether the quality of the diode is qualified;

however, the voltage limiting testing device for detecting the performance of the light emitting diode in the current stage has some disadvantages, for example, application No. 202021933383.5 discloses a "voltage limiting testing device for a light emitting diode of an LED street lamp", in which a supporting device for supporting a detecting instrument body cannot be hidden when not in use, and the detecting instrument body cannot effectively fix and test the light emitting diode, and can only hold the light emitting diode by hand for testing.

SUMMERY OF THE UTILITY MODEL

A primary object of the present invention is to provide a voltage limiting testing apparatus for detecting led performance, which can effectively solve the technical problem in the background art.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides a voltage limiting testing arrangement that emitting diode performance detected usefulness, includes the test box, the front end both sides movable mounting of test box has the handle, the upper surface of test box is close to front end fixed mounting has the cardboard, the preceding terminal surface of test box is equipped with the instrument pointer, one side that the preceding terminal surface of test box is located the instrument pointer is equipped with the display screen, the below both sides that the preceding terminal surface of test box is located the display screen are equipped with the detection jack, the one end surface activity of cardboard inlays and is equipped with the locking knob, the both sides surface activity of handle inlays and is equipped with the location bolt.

Preferably, the surfaces of the two sides of the test box are close to the rear end and provided with heat dissipation ports, the rear end face of the test box is fixedly provided with a cushion block, the surfaces of the two sides of the test box are close to the front end and provided with positioning grooves, and the rear end face of the test box is close to one side and is movably provided with a power supply cover.

Preferably, the surface cover of handle is equipped with the sheath, the both sides surface of handle is seted up and is inlayed the hole, the internal surface of inlaying the hole and has seted up the rebound groove, the location bolt is inlayed and is established in inlaying the hole, the handle passes through loose axle and test box swing joint.

Preferably, the upper surface of cardboard is located the rear end and has seted up the diode groove, the pin groove has been seted up to the front end both sides that the upper surface of cardboard is located the diode groove, pin groove and diode groove intercommunication, the last movable surface of cardboard has the apron, diode groove and pin groove have also been seted up to the lower surface of apron, the upper surface of cardboard is close to one end and has been seted up the slot, the groove has been seted up on the inside one end surface of slot, the lower surface of apron is close to one end fixed mounting and has the picture peg, the locked groove has been seted up on the one end surface of picture peg, the revolution groove has been seted up to the inside of picture peg, revolution groove and locked groove intercommunication.

Preferably, the rear end face fixed mounting of locking knob has the lock post, the rear end face fixed mounting of lock post has the locking piece, the rear end of lock post extends in the inside of slot.

Preferably, the rear end face fixed mounting of location bolt has the reference column, the fixed cover in surface of reference column is equipped with the backstop ring, the surface cover of reference column is equipped with the spring, the backstop ring inlays to be established in the bounce-back groove, the rear end of reference column inlays to be established in the constant head tank.

Compared with the prior art, the utility model discloses following beneficial effect has:

the utility model discloses in, through mutually supporting of the cardboard that sets up and locking knob, can fix the test after placing a plurality of emitting diode, through the location bolt that sets up, can carry out the fixed of different angles to the handle to carry out stable support to the test box.

Drawings

Fig. 1 is a side overall structure diagram of a voltage limiting testing device for detecting the performance of the light emitting diode of the present invention;

fig. 2 is an enlarged view of a portion a in fig. 1 of a voltage limiting testing apparatus for detecting performance of a light emitting diode according to the present invention;

fig. 3 is a partial sectional view of an installation diagram of a locking knob of a voltage limiting testing device for detecting the performance of a light emitting diode according to the present invention;

fig. 4 is an overall structure diagram of the other side of the voltage limiting testing apparatus for testing the performance of the light emitting diode according to the present invention;

fig. 5 is a partial sectional view of the positioning pin installation schematic diagram of the voltage limiting testing apparatus for detecting the performance of the light emitting diode according to the present invention.

In the figure: 1. a test box; 101. a heat dissipation port; 102. cushion blocks; 103. positioning a groove; 104. a power supply cover; 2. a handle; 201. a sheath; 202. embedding holes; 203. a rebound groove; 3. clamping a plate; 301. a cover plate; 302. a diode slot; 303. a lead groove; 304. inserting slots; 305. inserting plates; 306. a receiving groove; 4. a meter pointer; 5. a display screen; 6. detecting the jacks; 7. locking the knob; 701. a lock cylinder; 702. a locking block; 8. positioning a bolt; 801. a positioning column; 802. a stop ring; 803. a spring.

Detailed Description

In order to make the technical means, creation features, achievement purposes and functions of the present invention easy to understand, the present invention is further described below with reference to the following embodiments.

Example 1

As shown in fig. 1-4, a voltage limiting testing device for detecting the performance of a light emitting diode includes a testing box 1, handles 2 are movably mounted on two sides of the front end of the testing box 1, a clamping plate 3 is fixedly mounted on the upper surface of the testing box 1 near the front end, a plurality of light emitting diodes can be fixedly placed by using the clamping plate 3, an instrument pointer 4 is arranged on the front end surface of the testing box 1, a display screen 5 is arranged on one side of the front end surface of the testing box 1, which is located at the instrument pointer 4, detection jacks 6 are arranged on two sides of the front end surface of the testing box 1, a locking knob 7 is movably embedded on one end surface of the clamping plate 3, positioning bolts 8 are movably embedded on two side surfaces of the handles 2, and the handles 2 can be fixed at different positions by using the positioning bolts 8, so as to support the testing box 1;

the surface of both sides of the test box 1 is equipped with the cooling port 101 near the rear end, the rear end surface of the test box 1 is fixedly equipped with the cushion block 102, the surface of both sides of the test box 1 is equipped with the locating slot 103 near the front end, the rear end surface of the test box 1 is equipped with the power cover 104 near one side of activity; the sheath 201 is sleeved on the surface of the handle 2, the embedding holes 202 are formed in the surfaces of the two sides of the handle 2, the rebound grooves 203 are formed in the inner surfaces of the embedding holes 202, the positioning pins 8 are embedded in the embedding holes 202, and the handle 2 is movably connected with the test box 1 through a movable shaft; the upper surface of the clamping plate 3 is positioned at the rear end and is provided with a diode groove 302, the upper surface of the clamping plate 3 is positioned at the two sides of the front end of the diode groove 302 and is provided with pin grooves 303, the pin grooves 303 are communicated with the diode groove 302, the upper surface of the clamping plate 3 is movably provided with a cover plate 301, the lower surface of the cover plate 301 is also provided with the diode groove 302 and the pin grooves 303, the upper surface of the clamping plate 3 close to one end is provided with a slot 304, the surface of one end inside the slot 304 is provided with an accommodating groove 306, the lower surface of the cover plate 301 close to one end is fixedly provided with an inserting plate 305, the surface of one end of the inserting plate 305 is provided with a locking groove, the inside of the inserting plate 305 is provided with a rotary groove, and the rotary groove is communicated with the locking groove; a lock column 701 is fixedly installed on the rear end face of the locking knob 7, a lock block 702 is fixedly installed on the rear end face of the lock column 701, and the rear end of the lock column 701 extends into the slot 304; a positioning column 801 is fixedly installed on the rear end face of the positioning bolt 8, a stop ring 802 is fixedly sleeved on the surface of the positioning column 801, a spring 803 is sleeved on the surface of the positioning column 801, the stop ring 802 is embedded in the rebound groove 203, and the rear end of the positioning column 801 is embedded in the positioning groove 103.

Example 2

It should be noted that, the present invention is a voltage limiting testing device for testing the performance of light emitting diode, when in use, a plurality of light emitting diodes to be tested can be placed in the diode slot 302 of the card board 3, then the cover board 301 is covered to make the plug board 305 of the cover board 301 inserted into the slot 304, when the plug board 305 is inserted into the slot 304, the locking knob 7 is pulled outwards to make the locking block 702 embedded in the receiving slot 306, so that the plug board 305 can be smoothly inserted into the plug board 305, after the plug board 305 is inserted into the slot 304, the locking block 702 is pushed into the locking slot of the plug board 305 and the locking knob 7 is rotated to make the locking block 702 clamped in the rotary slot, at this moment, the testing wire is inserted into the testing jack 6, then the light emitting diode can be tested, the laid testing box 1 can be stably supported by using the handle 2, by inserting the positioning pin 8 into the positioning slots 103 at different positions at two sides of the testing box 1, alright with carry out different inclination's support to test box 1, in upset handle 2, in order to make location bolt 8 can not obstruct the activity of handle 2, at first need outside pulling location bolt 8, make reference column 801 income inlay establish in hole 202, alright like this with the constant head tank 103 department that moves handle 2 to different positions, make constant head tank 103 with inlay establish hole 202 and align, then alright with the power of pulling outside the pine, let reference column 801 kick-back inlay establish in constant head tank 103.

The basic principles and the main features of the invention and the advantages of the invention have been shown and described above. It will be understood by those skilled in the art that the present invention is not limited to the above embodiments, and that the foregoing embodiments and descriptions are provided only to illustrate the principles of the present invention without departing from the spirit and scope of the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.

Claims

1. A voltage limiting test device for detecting the performance of a light emitting diode is characterized in that: including test box (1), the front end both sides movable mounting of test box (1) has handle (2), the upper surface of test box (1) is close to front end fixed mounting has cardboard (3), the preceding terminal surface of test box (1) is equipped with instrument pointer (4), one side that the preceding terminal surface of test box (1) is located instrument pointer (4) is equipped with display screen (5), the below both sides that the preceding terminal surface of test box (1) is located display screen (5) are equipped with detection jack (6), the one end surface activity of cardboard (3) inlays and is equipped with locking knob (7), the both sides surface activity of handle (2) inlays and is equipped with positioning pin (8).

2. The voltage limiting test device for detecting the performance of the light emitting diode according to claim 1, wherein: the heat dissipation device is characterized in that the surfaces of two sides of the test box (1) are close to the rear end, a heat dissipation port (101) is formed in the position, close to the rear end, of the test box (1), a cushion block (102) is fixedly mounted on the rear end face of the test box (1), the surfaces of the two sides of the test box (1) are close to the front end, a positioning groove (103) is formed in the position, close to one side, of the rear end face of the test box (1), and a power supply cover (104) is movably mounted on the position, close to one side, of the rear end face of the test box (1).

3. The voltage limiting test device for detecting the performance of the light emitting diode according to claim 2, wherein: the surface cover of handle (2) is equipped with sheath (201), the both sides surface of handle (2) has been seted up and has been inlayed and establish hole (202), inlay the internal surface of establishing hole (202) and seted up rebound groove (203), location bolt (8) are inlayed and are established and establish in inlaying hole (202), handle (2) are through loose axle and test box (1) swing joint.

4. A voltage limiting testing device according to claim 3, wherein: diode groove (302) have been seted up to the upper surface of cardboard (3) is located the rear end, pin groove (303) have been seted up to the front end both sides that the upper surface of cardboard (3) is located diode groove (302), pin groove (303) and diode groove (302) intercommunication, the upper surface movable mounting of cardboard (3) has apron (301), diode groove (302) and pin groove (303) have also been seted up to the lower surface of apron (301), slot (304) have been seted up near one end to the upper surface of cardboard (3), the inside one end surface of slot (304) has been seted up and has been accomodate groove (306), the lower surface of apron (301) is close to one end fixed mounting and has picture peg (305), the locked groove has been seted up on the one end surface of picture peg (305), the gyration groove has been seted up to the inside of picture peg (305), gyration groove and locked groove intercommunication.

5. The voltage limiting test device for detecting the performance of the light emitting diode according to claim 4, wherein: the rear end face fixed mounting of locking knob (7) has lock post (701), the rear end face fixed mounting of lock post (701) has locking piece (702), the rear end of lock post (701) extends in the inside of slot (304).

6. The voltage limiting test device for detecting the performance of the light emitting diode according to claim 5, wherein: the rear end face fixed mounting of location bolt (8) has reference column (801), the fixed surface cover of reference column (801) is equipped with backstop ring (802), the surface cover of reference column (801) is equipped with spring (803), backstop ring (802) inlay and establish in bounce groove (203), the rear end of reference column (801) inlays and establishes in constant head tank (103).