CN212540620U

CN212540620U - Reliability analysis's test structure among integrated circuit

Info

Publication number: CN212540620U
Application number: CN202020702111.8U
Authority: CN
Inventors: 王�忠
Original assignee: Shanghai Magic Valley Ic Technology Co ltd
Current assignee: Shanghai Magic Valley Ic Technology Co ltd
Priority date: 2020-04-30
Filing date: 2020-04-30
Publication date: 2021-02-12
Anticipated expiration: 2030-04-30

Abstract

The utility model discloses a reliability analysis's test structure among integrated circuit, bottom plate including being fixed in ground, the shape of bottom plate is the square of rectangle, the upper end of bottom plate is equipped with integrated circuit board, integrated circuit board's upper end fixedly connected with apron, integrated circuit board is equipped with the detection mechanism who is used for testing the integrated circuit reliability in the below of apron, the edge of bottom plate is equipped with a plurality of block mechanisms that are used for chucking integrated circuit board. The utility model discloses it is rational in infrastructure, can detect its inside electric current through the universal meter after internal circuit circular telegram, simplify the testing process and firmly be fixed in the top of bottom plate with integrated circuit board, reduce the influence that produces the test result of reliability analysis among the integrated circuit.

Description

Reliability analysis's test structure among integrated circuit

Technical Field

The utility model relates to an integrated circuit technical field especially relates to a reliability analysis's test structure among integrated circuit.

Background

An integrated circuit is a microelectronic device or component. The transistor, the resistor, the capacitor, the inductor and other elements and wires required in a circuit are interconnected together by adopting a certain process, are manufactured on a small or a plurality of small semiconductor wafers or medium substrates, and are then packaged in a tube shell to form a micro structure with the required circuit function; all the elements are structurally integrated, so that the electronic elements are greatly miniaturized, low in power consumption, intelligent and high in reliability. It is denoted by the letter "IC" in the circuit.

Most of the present semiconductor industry uses silicon-based integrated circuits, which are electronic devices that are manufactured by processes of semiconductor manufacturing such as oxidation, photolithography, diffusion, epitaxy, and aluminum evaporation, and in which elements such as semiconductors, resistors, and capacitors, which are required for forming circuits with certain functions, are soldered and packaged in a package. The packaging shell has various forms such as round shell type, flat type or dual in-line type. The reliability of the circuit inside the integrated circuit is analyzed in the production process of the integrated circuit, but the reliability analysis test structure in the existing integrated circuit is easy to be fixed and infirm, and then the reliability analysis test result in the integrated circuit is influenced.

SUMMERY OF THE UTILITY MODEL

The utility model aims at solving the shortcomings existing in the prior art, and providing a test structure for reliability analysis in an integrated circuit.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

the utility model provides a reliability analysis's test structure among integrated circuit, is including the bottom plate that is fixed in ground, the shape of bottom plate is the square of rectangle, the upper end of bottom plate is equipped with integrated circuit board, integrated circuit board's upper end fixedly connected with apron, integrated circuit board is equipped with the detection mechanism who is used for testing the integrated circuit reliability in the below of apron, the edge of bottom plate is equipped with a plurality of block mechanisms that are used for chucking integrated circuit board.

Preferably, detection mechanism is including setting up in the inside integrated circuit of integrated circuit board, two multimeter sockets of integrated circuit board's right side fixedly connected with, two the rear end of multimeter socket all passes through wire and integrated circuit's inside electric connection, integrated circuit board's left side is equipped with the integrated circuit board socket that is used for the integrated circuit circular telegram, the upper end of apron be equipped with two multimeter socket complex be used for detecting the multimeter of the inside electric current of integrated circuit.

Preferably, block mechanism includes a plurality of dead levers with the edge fixed connection of bottom plate, integrated circuit board's edge is equipped with a plurality of round mouths, and is a plurality of the top of dead lever all runs through the round mouth and extends to integrated circuit board's outside, the fixed block fixedly connected with solid fixed ring that the inside of dead lever set up through two symmetries, gu fixed ring's middle part symmetry is equipped with two recesses, two the outer fringe of recess all rotates and is connected with the bull stick, two the equal fixedly connected with stationary blade in bottom of bull stick, two the rear end of stationary blade passes through spring elastic connection, two the equal fixedly connected with in bottom of bull stick is used for chucking integrated circuit board's fixture block.

Preferably, the shape of the rotating rod is sickle-shaped.

Preferably, the bottom of the fixed rod is symmetrically provided with two strip-shaped openings, and the front ends of the two clamping blocks penetrate through the strip-shaped openings and extend to the outside of the fixed rod.

Preferably, the lower extreme fixedly connected with of universal meter and universal meter socket complex plug.

The utility model has the advantages that:

1. through the universal meter and the socket electrically connected with the inside of the integrated circuit, the current in the internal circuit can be detected through the universal meter after the internal circuit is electrified, so that the detection process is simplified;

2. through setting up elastic mechanism, can be fixed in the top of bottom plate firmly with integrated circuit board, reduce the influence that produces the test result of reliability analysis among the integrated circuit.

Drawings

Fig. 1 is a schematic structural diagram of a test structure for reliability analysis in an integrated circuit according to the present invention;

fig. 2 is a side view of a test structure for reliability analysis in an integrated circuit according to the present invention;

fig. 3 is an enlarged view of a structure at a position a of a test structure for reliability analysis in an integrated circuit according to the present invention;

fig. 4 is a structure enlarged diagram of a B site of a test structure for reliability analysis in an integrated circuit according to the present invention.

In the figure: 1 bottom plate, 2 integrated circuit boards, 3 integrated circuit board sockets, 4 dead levers, 5 fixed blocks, 6 solid fixed rings, 7 bull sticks, 8 recesses, 9 fixture blocks, 10 stationary blades, 11 round cavities, 12 springs, 13 universal meters, 14 apron, 15 universal meter sockets.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments.

In the description of the present invention, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore, should not be construed as limiting the present invention.

Referring to fig. 1-4, a test structure for reliability analysis in an integrated circuit includes a bottom plate 1 fixed on the ground, the bottom plate 1 is a rectangular square, an integrated circuit board 2 is disposed on the upper end of the bottom plate 1, a cover plate 14 is fixedly connected to the upper end of the integrated circuit board 2, a detection mechanism for testing the reliability of the integrated circuit is disposed below the cover plate 14 of the integrated circuit board 2, and a plurality of clamping mechanisms for clamping the integrated circuit board 2 are disposed at the edge of the bottom plate 1.

The utility model discloses in, detection mechanism is including setting up in the inside integrated circuit of integrated circuit board 2, two universal meter sockets 15 of integrated circuit board 2's right side fixedly connected with, two universal meter sockets 15's rear end all through wire and integrated circuit's inside electric connection, integrated circuit board 2's left side is equipped with the integrated circuit board socket 3 that is used for the integrated circuit circular telegram, apron 14's upper end be equipped with two universal meter sockets 15 complex be used for detecting integrated circuit internal current's universal meter 13.

Specifically, block mechanism includes a plurality of dead levers 4 with the edge fixed connection of bottom plate 1, integrated circuit board 2's edge is equipped with a plurality of round mouths, the outside that the round mouth and extend to integrated circuit board 2 is all run through on the top of a plurality of dead levers 4, the solid fixed ring 6 of 5 fixedly connected with of fixed block that the inside of dead lever 4 set up through two symmetries, gu fixed ring 6's middle part symmetry is equipped with two recesses 8, two recesses 8's outer fringe is all rotated and is connected with bull stick 7, the equal fixedly connected with stationary blade 10 in bottom of two bull sticks 7, the rear end of two stationary blades 10 passes through spring 12 elastic connection, the equal fixedly connected with in bottom of two bull sticks 7 is used for chucking integrated circuit board 2's fixture block 9, can avoid integrated circuit.

Specifically, the shape of bull stick 7 is sickle-shaped, and the bottom symmetry of dead lever 4 is equipped with two bar mouths, and the front end of two fixture blocks 9 all runs through the bar mouth and extends to the outside of dead lever 4, and universal meter 13's lower extreme fixedly connected with and universal meter socket 15 complex plug can make things convenient for inserting of universal meter 13 and detect integrated circuit's 2 inside integrated circuit's reliability.

The utility model discloses during the use, only need to place 1 level of bottom plate in suitable position earlier, then aim at the round mouth at 2 edges of integrated circuit board 1 upper end fixed connection's dead lever 4 with the bottom plate and insert, dead lever 4 is inside to rotate two bull sticks 7 of connecting through solid fixed ring 6 afterwards and will be under the elasticity of spring 12 between two stationary blades 10, release two fixture blocks 9 of bull stick 7 lower extreme along the bar mouth, 2 chucking of integrated circuit board in the top of bottom 1 that will have placed, avoid it to appear not hard up. After the fixing is finished, the plug fixedly connected with the lower end of the universal meter 13 is inserted into the two universal meter sockets 15, then the integrated circuit board sockets 3 are electrified, and the reliability of the integrated circuit inside the integrated circuit board sockets can be detected.

The above, only be the concrete implementation of the preferred embodiment of the present invention, but the protection scope of the present invention is not limited thereto, and any person skilled in the art is in the technical scope of the present invention, according to the technical solution of the present invention and the utility model, the concept of which is equivalent to replace or change, should be covered within the protection scope of the present invention.

Claims

1. The utility model provides a reliability analysis's test structure among integrated circuit, is including bottom plate (1) that is fixed in ground, its characterized in that, the shape of bottom plate (1) is the square of rectangle, the upper end of bottom plate (1) is equipped with integrated circuit board (2), the upper end fixedly connected with apron (14) of integrated circuit board (2), integrated circuit board (2) are equipped with the detection mechanism who is used for testing the integrated circuit reliability in the below of apron (14), the edge of bottom plate (1) is equipped with a plurality of block mechanisms that are used for chucking integrated circuit board (2).

2. The structure of claim 1, wherein the detection mechanism comprises an integrated circuit arranged inside the integrated circuit board (2), two multimeter sockets (15) are fixedly connected to the right side of the integrated circuit board (2), the rear ends of the two multimeter sockets (15) are electrically connected to the inside of the integrated circuit through wires, the integrated circuit board socket (3) for energizing the integrated circuit is arranged on the left side of the integrated circuit board (2), and a multimeter (13) matched with the two multimeter sockets (15) and used for detecting the internal current of the integrated circuit is arranged at the upper end of the cover plate (14).

3. The structure of claim 1, wherein the locking mechanism comprises a plurality of fixing rods (4) fixedly connected to the edge of the base plate (1), the edge of the integrated circuit board (2) is provided with a plurality of round openings, the top ends of the fixing rods (4) extend through the round openings and extend to the outside of the integrated circuit board (2), the fixing rings (6) are fixedly connected to the inside of the fixing rods (4) through two symmetrically arranged fixing blocks (5), two grooves (8) are symmetrically arranged in the middle of the fixing rings (6), the outer edges of the two grooves (8) are rotatably connected with rotating rods (7), the bottoms of the two rotating rods (7) are fixedly connected with fixing plates (10), and the rear ends of the two fixing plates (10) are elastically connected through springs (12), two the equal fixedly connected with fixture block (9) that are used for chucking integrated circuit board (2) in the bottom of bull stick (7).

4. A test structure for reliability analysis in integrated circuits according to claim 3, characterized in that the shape of the turning bar (7) is sickle-shaped.

5. The test structure for reliability analysis in integrated circuits according to claim 3, wherein the bottom of the fixing bar (4) is symmetrically provided with two strip-shaped openings, and the front ends of the two clamping blocks (9) penetrate through the strip-shaped openings and extend to the outside of the fixing bar (4).

6. The test structure for reliability analysis in integrated circuits according to claim 2, characterized in that the lower end of the multimeter (13) is fixedly connected with a plug which is matched with a multimeter jack (15).