CN216351072U - Diagnosis circuit based on PWM drive intelligent high-side drive chip - Google Patents
Diagnosis circuit based on PWM drive intelligent high-side drive chip Download PDFInfo
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- CN216351072U CN216351072U CN202122577320.1U CN202122577320U CN216351072U CN 216351072 U CN216351072 U CN 216351072U CN 202122577320 U CN202122577320 U CN 202122577320U CN 216351072 U CN216351072 U CN 216351072U
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Abstract
The embodiment of the utility model provides a diagnosis circuit based on a PWM driving intelligent high-side driving chip, which comprises: the circuit comprises a driving circuit, a current limiting circuit, a first diagnostic circuit and a second diagnostic circuit; the driving circuit comprises an intelligent high-side driving chip U1; an input port of the intelligent high-side driving chip U1 Is connected with an IN port of the MCU through a current limiting circuit, and a first output port Is connected with an Is port of the MCU through a first diagnosis circuit; a second output port of the intelligent high-side driving chip U1 is connected with a load, and the second diagnosis circuit is arranged between the intelligent high-side driving chip U1 and the load; the second diagnostic circuit comprises a resistor R5 and a resistor R6; one end of the resistor R5 is connected with the second output port of the intelligent high-side driving chip U1 and the load respectively, and the other end of the resistor R5 is connected with one end of the resistor R6 and the AD acquisition port of the MCU respectively; the other end of the resistor R6 is connected to ground. The utility model solves the problem that the PWM driving intelligent high-side driving chip can not be correctly diagnosed due to the poor time sequence of current feedback.
Description
Technical Field
The utility model relates to the technical field of automatic control, in particular to a diagnosis circuit based on a PWM driving intelligent high-side driving chip.
Background
At present, intelligent high-side driving chips of the english flying Infineon and the STMicroelectronics, which are commonly adopted in automobile electronic controllers of commercial vehicles, for example: the BTT60xx series of Infineon and the VND5Txxx series of STMicroelectronics can realize the diagnosis and protection functions of open circuit and short circuit of the driving load. A Micro Control Unit (MCU) inputs a control command at an IN port, outputs a high level signal with driving capability through an intelligent high-side driving chip, and collects working current flowing through the high-side driving chip by using an IS port when the intelligent high-side driving chip works, so that diagnosis and protection functions of open circuit and short circuit are realized.
Because the intelligent high-side driving chip realizes the diagnosis of open circuit and short circuit and the protection function by diagnosing the working current of the load, the intelligent high-side driving chip Is only suitable for diagnosing whether the input command Is effective for a long time or invalid for a long time, such as loads with working states and non-working states, such as daytime running lights, high beam lights, dipped headlights and the like of the whole vehicle, and the input command Is effective for a long time when the loads work, so that the IS port can accurately collect the working current of the loads. However, for a load whose control command Is a PWM (pulse width modulation) signal and needs to adjust the output voltage, such as a backlight, the scheme of collecting the operating current through the Is port may cause a diagnostic error of the controller, resulting in that the load cannot operate normally. The input and output of the load in the ideal working condition and the working oscillogram of the Is are shown in fig. 1, and at the moment, the MCU can accurately collect the working current flowing through the intelligent high-side driving new product in the working process of the load. However, in the practical application process, since the inductive component exists in the load, the current value acquired by Is has a significant time difference with the input signal and the output signal, as shown in fig. 2, the Is cannot accurately acquire the working current of the chip, and therefore, the controller Is often diagnosed incorrectly in the real vehicle, and the load cannot work normally.
SUMMERY OF THE UTILITY MODEL
The present description provides a diagnostic circuit based on a PWM-driven intelligent high-side driver chip to overcome at least one technical problem in the prior art.
According to an embodiment of the present specification, there is provided a diagnostic circuit for driving an intelligent high-side driver chip based on PWM, the diagnostic circuit including: the circuit comprises a driving circuit, a current limiting circuit, a first diagnostic circuit and a second diagnostic circuit;
the driving circuit comprises an intelligent high-side driving chip U1; the input port of the intelligent high-side driving chip U1 is connected with the IN port of the MCU through the current limiting circuit; a first output port of the intelligent high-side driving chip U1 Is connected with an Is port of the MCU through the first diagnosis circuit; a second output port of the intelligent high-side driver chip U1 is connected to a load, and the second diagnostic circuit is disposed between the intelligent high-side driver chip U1 and the load;
the first diagnostic circuit comprises a resistor R2 and a resistor R3; one end of the resistor R2 Is connected with the Is port of the MCU, and the other end of the resistor R2 Is respectively connected with the first output port of the intelligent high-side driving chip U1 and one end of the resistor R3; the other end of the resistor R3 is grounded;
the second diagnostic circuit comprises a resistor R5, a resistor R6; one end of the resistor R5 is connected with the second output port of the intelligent high-side driving chip U1 and the load respectively, and the other end of the resistor R5 is connected with one end of the resistor R6 and the AD acquisition port of the MCU respectively; the other end of the resistor R6 is grounded.
Optionally, the current limiting circuit comprises a resistor R1; one end of the resistor R1 is connected with the IN port of the MCU, and the other end of the resistor R1 is connected with the input port of the intelligent high-side driving chip U1.
Optionally, the driving circuit further comprises a diode D1, a resistor R4; one end of the resistor R4 is connected with the grounding end of the intelligent high-side driving chip U1, and the other end of the resistor R4 is grounded; the anode of the diode D1 is connected to the ground terminal of the intelligent high-side driver chip U1 and one end of the resistor R4, respectively, and the cathode of the diode D1 is grounded.
Optionally, the diagnostic circuit further comprises a filtering circuit; the filter circuit is arranged between the intelligent high-side driving chip U1 and the load.
Further optionally, the filtering circuit comprises a capacitor C1; one end of the capacitor C1 is respectively connected with the second output port of the intelligent high-side driving chip U1 and the load, and the other end of the capacitor C1 is grounded.
Optionally, the intelligent high-side driver chip U1 is powered by a 24V power supply.
Optionally, the resistance ratio of the resistor R5 to the resistor R6 is 1-5.
The beneficial effects of the embodiment of the specification are as follows:
this diagnostic circuit based on PWM drive intelligence high limit driver chip utilizes MCU's Is port to gather the operating current of load, diagnose through judging whether the electric current of driving intelligence high limit driver chip U1 Is very little open a way, and gather the resistance partial pressure of bipartition piezo-resistor through MCU's AD collection mouth and carry out the short circuit diagnosis, and the diagnosis of short circuit Is independent each other with opening a way between the diagnosis, mutual noninterference, effectively solved because current feedback has the problem that PWM drive intelligence high limit driver chip can not the correct diagnosis that the chronogenesis difference leads to, realized opening a way of intelligence high limit driver chip, the diagnosis and the protect function of short circuit.
The innovation points of the embodiment of the specification comprise:
1. in the embodiment, short-circuit diagnosis is performed through resistor voltage division acquisition of two voltage division resistors, the resistance ratio of the two resistors is 1-5, and when an output port is short-circuited to the ground, the voltage acquired by an AD acquisition port of the MCU is almost 0V, so that a short-circuit fault of a load can be accurately diagnosed and protected, the problem that a PWM driving intelligent high-side driving chip cannot be correctly diagnosed due to time sequence difference existing in current feedback is effectively solved, and the method is one of innovation points of the embodiment of the specification.
2. In this embodiment, the first diagnostic circuit and the second diagnostic circuit, which are independent of each other, are used to perform open-circuit diagnosis and short-circuit diagnosis of the intelligent high-side driver chip, and only the second diagnostic circuit may be added to the conventional high-side driver circuit, so that the intelligent high-side driver circuit is applicable to a load whose control command is a PWM signal and whose output voltage needs to be adjusted.
Drawings
In order to more clearly illustrate the embodiments of the present disclosure or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present disclosure, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a timing diagram of the signals of an intelligent high-side driver chip in an ideal state;
FIG. 2 is a timing diagram of the signal of the intelligent high-side driver chip in practical application;
fig. 3 is a schematic structural diagram of a diagnostic circuit based on a PWM-driven intelligent high-side driver chip provided in an embodiment of the present disclosure;
description of reference numerals: reference numeral 101 denotes a current limiting circuit, 102 denotes a first diagnostic circuit, 103 denotes a driving circuit, 104 denotes a filter circuit, and 105 denotes a second diagnostic circuit.
Detailed Description
The technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the drawings in the embodiments of the present disclosure, and it is obvious that the described embodiments are only a part of the embodiments of the present disclosure, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without inventive effort based on the embodiments of the present invention, are within the scope of the present invention.
It should be noted that the terms "including" and "having" and any variations thereof in the embodiments of the present specification and the drawings are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.
The embodiment of the specification discloses a diagnosis circuit based on a PWM (pulse-width modulation) drive intelligent high-side drive chip, which can accurately diagnose the short-circuit and open-circuit faults of a load and protect the fault, and solves the problem that the PWM drive intelligent high-side drive chip cannot be correctly diagnosed due to the fact that the current feedback has poor time sequence in the prior art. The following are detailed below.
Fig. 3 is a schematic structural diagram of a diagnostic circuit based on a PWM-driven intelligent high-side driver chip according to an embodiment of the present disclosure. The diagnostic circuit may include: a driver circuit 103, a current limiting circuit 101, a first diagnostic circuit 102, a second diagnostic circuit 105, and a filter circuit 104.
The driving circuit 103 is configured to output a high-level signal having a driving capability to drive the load according to a control command input from the MCU. IN a specific embodiment, the driving circuit 103 includes an intelligent high-side driving chip U1, and the MCU inputs a control command at the IN port and outputs a high-level signal with driving capability via an intelligent high-side driving chip U1. In the embodiment of the present specification, the smart high-side driver chip U1 includes, but is not limited to, a BTT60xx series driver chip of Infineon and a VND5Txxx series driver chip of STMicroelectronics, and is powered by a 24V power supply.
Further, the driving circuit 103 further includes a diode D1 and a resistor R4, which together form a ground terminal of the intelligent high-side driving chip U1. The resistor R4 is a grounding resistor of the intelligent high-side driving chip U1, one end of the resistor R4 is connected with the grounding end of the intelligent high-side driving chip U1, the other end of the resistor R4 is grounded and used for grounding the intelligent high-side driving chip U1, a diode D1 is connected in parallel with the resistor R4, the anode of the diode D1 is connected with the grounding end of the intelligent high-side driving chip U1 and one end of the resistor R4 respectively, and the cathode of the diode D1 is grounded. The resistor R4 and the diode D1 are connected in parallel between the ground terminal of the intelligent high-side driver chip U1 and the intelligent high-side driver chip U1, so that the resistor R4 and the diode D1 jointly play a role in preventing the intelligent high-side driver chip U1 from being burnt out due to reverse connection between the power supply of the intelligent high-side driver chip U1 and the ground.
The current limiting circuit 101 is configured to limit an overcurrent, so that the input port of the intelligent high-side driver chip U1 is connected to the IN port of the MCU through the current limiting circuit 101, thereby performing a protection function. IN a specific embodiment, the current limiting circuit 101 includes, but is not limited to, a resistor R1, one end of the resistor R1 is connected to the IN port of the MCU, and the other end is connected to the input port of the intelligent high-side driver chip U1, so as to increase the resistance IN the circuit, further reduce the current, and perform a protection function.
In the embodiment of the present specification, the second OUTPUT port of the intelligent high-side driver chip U1 is the OUTPUT port, i.e., the driver OUTPUT port, of the intelligent high-side driver chip U1, and the second OUTPUT port of the intelligent high-side driver chip U1 is connected to a load, which may be an inductive load.
In order to make the load connected to the output port driven by the intelligent high-side driver chip U1 obtain the required effective signal, a filter circuit 104 is disposed between the intelligent high-side driver chip U1 and the load. In a specific embodiment, the filter circuit 104 includes a capacitor C1, the capacitor C1 is a filter capacitor, one end of the capacitor C1 is connected to the second output port of the intelligent high-side driver chip U1 and the load, respectively, and the other end of the capacitor C1 is grounded.
In order to implement the diagnosis and protection functions of open circuit and short circuit, the diagnosis circuit based on the PWM-driven intelligent high-side driver chip in the embodiment of the present disclosure includes a first diagnosis circuit 102 and a second diagnosis circuit 105, wherein a first output port of the intelligent high-side driver chip U1 Is connected to an Is port of the MCU through the first diagnosis circuit 102, the first diagnosis circuit 102 implements the diagnosis and protection functions of open circuit and short circuit by diagnosing an operating current of a load, the second diagnosis circuit 105 Is disposed between the intelligent high-side driver chip U1 and the load, and the second diagnosis circuit 105 performs short circuit diagnosis by using resistance voltage division.
In a specific embodiment, the first diagnostic circuit 102 includes a resistor R2 and a resistor R3, specifically, one end of the resistor R2 Is connected to an Is port of the MCU, the other end of the resistor R2 Is connected to the first output port of the intelligent high-side driver chip U1 and one end of the resistor R3, respectively, the other end of the resistor R3 Is grounded, and the MCU collects the operating current of the load flowing through the intelligent high-side driver chip U1 through the Is port. When the input command of the intelligent high-side driving chip U1 Is effective for a long time or ineffective for a long time, the load only has two states of working and non-working, the input command Is effective for a long time, and the IS port of the MCU can accurately collect the working current of the load during the working of the load, so that the diagnosis and protection functions of open circuit and short circuit are realized.
However, for a load whose control command Is a PWM signal and whose output voltage needs to be adjusted, in practical application, because an inductive component exists in the load, there Is an obvious time difference between the current value acquired by the Is port and the input signal and the output signal, at this time, the Is port of the MCU cannot accurately acquire the working current of the intelligent high-side driver chip U1, and if only the first diagnostic circuit 102 Is used for diagnosis, a wrong diagnosis of the controller Is often caused in a real vehicle, which results in that the load cannot work normally.
IN the embodiment of the present specification, for the PWM-driven intelligent high-side driver chip U1, the MCU inputs a control command at the IN port, the Is port collects the working current of the load, and the Is port of the MCU cannot accurately feed back the working current of each load, so that the diagnosis circuit based on the PWM-driven intelligent high-side driver chip Is further provided with the second diagnosis circuit 105. In a specific embodiment, the second diagnostic circuit 105 includes a resistor R5 and a resistor R6, specifically, one end of the resistor R5 is connected to the second output port of the intelligent high-side driver chip U1 and the load, the other end of the resistor R5 is connected to one end of the resistor R6 and the AD capture port of the MCU, and the other end of the resistor R6 is grounded, so that voltage capture is performed through the resistor R5 and the resistor R6. In a specific implementation process, the resistance ratio of the resistor R5 to the resistor R6 is 1-5, and when the second output port is short-circuited to the ground, the voltage acquired by an AD acquisition port (namely MCU _ AD) of the MCU is close to 0V, so that the short-circuit fault of the load can be accurately diagnosed and protected.
The connection relationship between the electrical components and the connection relationship between the electrical components of the diagnosis circuit based on the PWM-driven intelligent high-side driver chip provided in this embodiment is described above, and the operation principle of the diagnosis circuit based on the PWM-driven intelligent high-side driver chip is described in detail below with reference to fig. 3.
IN the embodiment of the present specification, the intelligent high-side driver chip U1 Is driven by PWM, the MCU inputs a control command to the IN port, the Is port collects the working current of the load, and the AD collection port of the MCU Is used to collect the voltage.
Open circuit diagnosis: when the intelligent high-side driving chip U1 outputs, whether an open-circuit fault exists is diagnosed by judging whether an external output port is normally connected with a load or disconnected with the load, and if the output port is detected to be disconnected with the load, the open-circuit fault is judged. IN the embodiment of the specification, the working current of the load Is collected through an Is port of the MCU, when the IN port command Is valid, the IN port Is active at a high level, and if the MCU cannot collect the current of the Is port, the intelligent high-side driver chip U1 diagnoses an open-circuit fault.
Short circuit diagnosis: the diagnosis circuit carries out short-circuit diagnosis by using the resistor R5 and the resistor R6, the resistance ratio of the resistor R5 to the resistor R6 is 1-5, when an output port is in short circuit to the ground, the voltage collected by an AD acquisition port of the MCU is close to 0V, so that short-circuit diagnosis can be carried out by using the voltage collected by the AD acquisition port of the MCU, and if the voltage collected by the AD acquisition port of the MCU is almost 0V, the intelligent high-side driving chip U1 diagnoses short-circuit faults.
To sum up, this specification discloses a diagnostic circuit based on high limit driver chip of PWM drive intelligence, this diagnostic circuit based on high limit driver chip of PWM drive intelligence utilizes the Is port of MCU to gather the operating current of load, diagnose open a way through judging whether the electric current of driving intelligence high limit driver chip U1 Is very little, and gather the resistance partial pressure of bipartition voltage resistance through MCU's AD acquisition port and carry out the short-circuit diagnosis, and mutually independent between short-circuit diagnosis and the diagnosis of opening a way, mutual noninterference has effectively solved the problem that the high limit driver chip of PWM drive intelligence that leads to because current feedback has the chronogenesis difference can not diagnose correctly, the diagnosis and the protect function of the open a way, short circuit of intelligence high limit driver chip have been realized.
Those of ordinary skill in the art will understand that: the figures are merely schematic representations of one embodiment, and the blocks or flow diagrams in the figures are not necessarily required to practice the present invention.
Those of ordinary skill in the art will understand that: modules in the devices in the embodiments may be distributed in the devices in the embodiments according to the description of the embodiments, or may be located in one or more devices different from the embodiments with corresponding changes. The modules of the above embodiments may be combined into one module, or further split into multiple sub-modules.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (7)
1. A diagnostic circuit based on a PWM driving intelligent high-side driving chip is characterized by comprising: the circuit comprises a driving circuit, a current limiting circuit, a first diagnostic circuit and a second diagnostic circuit;
the driving circuit comprises an intelligent high-side driving chip U1; the input port of the intelligent high-side driving chip U1 is connected with the IN port of the MCU through the current limiting circuit; a first output port of the intelligent high-side driving chip U1 Is connected with an Is port of the MCU through the first diagnosis circuit; a second output port of the intelligent high-side driver chip U1 is connected to a load, and the second diagnostic circuit is disposed between the intelligent high-side driver chip U1 and the load;
the first diagnostic circuit comprises a resistor R2 and a resistor R3; one end of the resistor R2 Is connected with the Is port of the MCU, and the other end of the resistor R2 Is respectively connected with the first output port of the intelligent high-side driving chip U1 and one end of the resistor R3; the other end of the resistor R3 is grounded;
the second diagnostic circuit comprises a resistor R5, a resistor R6; one end of the resistor R5 is connected with the second output port of the intelligent high-side driving chip U1 and the load respectively, and the other end of the resistor R5 is connected with one end of the resistor R6 and the AD acquisition port of the MCU respectively; the other end of the resistor R6 is grounded.
2. The diagnostic circuit based on the PWM-driven intelligent high-side driving chip of claim 1, wherein the current limiting circuit comprises a resistor R1; one end of the resistor R1 is connected with the IN port of the MCU, and the other end of the resistor R1 is connected with the input port of the intelligent high-side driving chip U1.
3. The diagnostic circuit based on the PWM-driven intelligent high-side driving chip of claim 1, wherein the driving circuit further comprises a diode D1, a resistor R4; one end of the resistor R4 is connected with the grounding end of the intelligent high-side driving chip U1, and the other end of the resistor R4 is grounded; the anode of the diode D1 is connected to the ground terminal of the intelligent high-side driver chip U1 and one end of the resistor R4, respectively, and the cathode of the diode D1 is grounded.
4. The diagnostic circuit based on the PWM-driven intelligent high-side driving chip of claim 1, characterized in that the diagnostic circuit further comprises a filter circuit; the filter circuit is arranged between the intelligent high-side driving chip U1 and the load.
5. The diagnostic circuit based on the PWM-driven intelligent high-side driving chip of claim 4, wherein the filter circuit comprises a capacitor C1; one end of the capacitor C1 is respectively connected with the second output port of the intelligent high-side driving chip U1 and the load, and the other end of the capacitor C1 is grounded.
6. The PWM-drive intelligent high-side driver chip-based diagnostic circuit as claimed in claim 1, wherein the intelligent high-side driver chip U1 is powered by a 24V power supply.
7. The diagnostic circuit based on the PWM-driven intelligent high-side driving chip of claim 1, wherein the resistance ratio of the resistor R5 to the resistor R6 is 1-5.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202122577320.1U CN216351072U (en) | 2021-10-26 | 2021-10-26 | Diagnosis circuit based on PWM drive intelligent high-side drive chip |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202122577320.1U CN216351072U (en) | 2021-10-26 | 2021-10-26 | Diagnosis circuit based on PWM drive intelligent high-side drive chip |
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| CN216351072U true CN216351072U (en) | 2022-04-19 |
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| CN202122577320.1U Active CN216351072U (en) | 2021-10-26 | 2021-10-26 | Diagnosis circuit based on PWM drive intelligent high-side drive chip |
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