CN216350331U - Visual vertical reflection measuring device for terahertz nondestructive testing - Google Patents
Visual vertical reflection measuring device for terahertz nondestructive testing Download PDFInfo
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- CN216350331U CN216350331U CN202122275085.2U CN202122275085U CN216350331U CN 216350331 U CN216350331 U CN 216350331U CN 202122275085 U CN202122275085 U CN 202122275085U CN 216350331 U CN216350331 U CN 216350331U
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Abstract
The utility model relates to the technical field of terahertz detection, in particular to a visual vertical reflection measuring device for terahertz nondestructive detection, which comprises a shell, a visible light source assembly, a terahertz emitting assembly, a terahertz receiving assembly, a reflecting mirror, a first beam splitter and a second beam splitter, wherein the shell is provided with a first reflecting surface and a second reflecting surface; a cavity is arranged in the shell, and a first terahertz lens is arranged on the side wall surface of the cavity. The visible light source component is fixedly arranged on the shell; the terahertz transmitting assembly is fixedly arranged between the terahertz receiving assembly and the visible light source assembly and is used for transmitting terahertz wave beams to the first beam splitter; the reflecting mirror and the second beam splitter are respectively arranged on two sides of the cavity, the first beam splitter is located between the reflecting mirror and the second beam splitter, the first beam splitter is used for reflecting the terahertz wave beam to the second beam splitter, the reflecting mirror is used for reflecting visible light to the second beam splitter and enabling the visible light to coincide with the terahertz wave beam, and the second beam splitter is used for reflecting the visible light and the terahertz wave beam to the first terahertz lens.
Description
Technical Field
The utility model relates to the technical field of terahertz detection, in particular to a visual vertical reflection measuring device for terahertz nondestructive detection.
Background
The terahertz nondestructive testing technology (THZ-NDT) is a non-contact testing method, and due to the properties of high resolution, strong stability, strong penetrating power and high signal-to-noise ratio of terahertz, and the advantages of simple testing method, high frequency, broadband and the like, terahertz nondestructive testing has been developed into one of the most widely applied nondestructive testing methods in various fields. The photon energy of the terahertz wave is very low, about the meV amount, and is far lower than the X-ray energy, so that the material cannot be damaged and destroyed.
However, the construction of a common nondestructive testing system needs a certain light path system construction foundation, and a great deal of time and energy are consumed; because the terahertz magnetic wave is invisible to naked eyes, the accurate positions of the terahertz wave beam and the detected target cannot be accurately positioned during detection and analysis, and whether the terahertz magnetic wave is accurately incident on an object to be detected is difficult to ensure; and the calibration of the detection system is troublesome, and the calibration of the detection system can be realized only by matching with various devices.
SUMMERY OF THE UTILITY MODEL
The utility model provides a visual vertical reflection measuring device for terahertz nondestructive testing, which is used for solving the defects that a terahertz nondestructive testing system in the prior art needs to consume a large amount of time and energy, is difficult to accurately position a terahertz wave beam, is difficult to ensure the accuracy of measurement, is difficult to calibrate the system and the like.
The utility model provides a visual vertical reflection measuring device for terahertz nondestructive testing, which comprises a shell, a visible light source assembly, a terahertz emitting assembly, a terahertz receiving assembly, a reflector, a first beam splitter and a second beam splitter, wherein the shell is provided with a first light source and a second light source;
a cavity is arranged in the shell, and a first terahertz lens is arranged on the side wall surface of the cavity. The visible light source assembly is fixedly arranged on the shell and is used for emitting visible light to the reflector;
the terahertz transmitting assembly is fixedly arranged between the terahertz receiving assembly and the visible light source assembly and is used for transmitting terahertz wave beams to the first beam splitter;
the reflector and the second beam splitter are respectively arranged on two sides of the cavity, and the first beam splitter is positioned between the reflector and the second beam splitter; the first beam splitter is used for reflecting a terahertz beam to the second beam splitter; the reflector is used for reflecting visible light to the first beam splitter, transmitting the visible light to the second beam splitter and enabling the visible light to coincide with a terahertz wave beam; the second beam splitter is used for reflecting visible light and terahertz beams to the first terahertz lens.
According to the visual vertical reflection measuring device for terahertz nondestructive testing, the visible light source assembly, the terahertz emitting assembly and the terahertz receiving assembly are parallel to each other and are located at the same horizontal position.
According to the visual vertical reflection measurement device for terahertz nondestructive testing, the terahertz receiving assembly, the second beam splitter and the first terahertz lens are located on the same straight line.
According to the visual vertical reflection measuring device for terahertz nondestructive testing, the reflecting mirror and the first beam splitter are parallel to each other.
According to the visual vertical reflection measuring device for terahertz nondestructive testing, provided by the utility model, a reflector frame, a first mirror frame and a second mirror frame are further arranged in the cavity, the reflector frame, the first mirror frame and the second mirror frame are all in sliding connection with the bottom of the cavity, the reflector is mounted on the reflector frame, the first beam splitter is mounted on the first mirror frame, and the second beam splitter is mounted on the second mirror frame.
According to the visual vertical reflection measuring device for terahertz nondestructive testing, provided by the utility model, the bottom of the cavity is provided with a plurality of clamping grooves, and the bottoms of the reflector frame, the first frame and the second frame are provided with clamping blocks matched with the clamping grooves.
According to the visual vertical reflection measuring device for terahertz nondestructive testing, the visible light source assembly comprises a laser indicator, the laser indicator is installed in the shell, a through hole is formed in the side wall surface of the cavity, and the laser indicator is communicated with the through hole.
According to the visual vertical reflection measuring device for terahertz nondestructive testing, the visible light source assembly further comprises a collimating lens, and the collimating lens is located between the laser indicator and the through hole.
According to the visual vertical reflection measuring device for terahertz nondestructive testing, the terahertz transmitting assembly comprises a terahertz transmitting antenna and a second terahertz lens, the terahertz transmitting antenna is fixedly installed in the shell, and the second terahertz lens is located between the terahertz transmitting antenna and the cavity.
According to the visual vertical reflection measuring device for terahertz nondestructive testing, provided by the utility model, the cavity is coated with the wave absorbing material for absorbing stray waves.
According to the visual vertical reflection measuring device for terahertz nondestructive testing, terahertz waves are transmitted to the first beam splitter through the terahertz transmitting assembly, and the terahertz waves are reflected to the second beam splitter by the first beam splitter. And meanwhile, visible light is emitted to the reflector through the visible light source assembly, and the visible light is reflected by the reflector and then passes through the first beam splitter to be incident on the second beam splitter. At the moment, the visible light and the terahertz waves are overlapped, the transmission path of the visible light is consistent with that of the terahertz waves, the visible light and the terahertz waves are incident on the second beam splitter, the second beam splitter reflects the visible light and the terahertz waves to the first terahertz lens together, the visible light and the terahertz waves are incident on an article to be detected after passing through the first terahertz lens, and the terahertz waves with the information of the detected article are reflected and transmitted to the terahertz receiving component for receiving. The position of terahertz wave beams can be known by observing visible light beams, the system is convenient to calibrate, the terahertz waves can be accurately incident on an object to be detected, the detection accuracy is guaranteed, and only corresponding spread spectrum modules and a vector network analyzer are required to be connected with a measuring system, so that the measuring system is not required to be built by consuming a large amount of time and energy.
Drawings
In order to more clearly illustrate the technical solutions of the present invention or the prior art, the drawings needed for the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
FIG. 1 is one of schematic structural diagrams of a visual vertical reflection measurement device for terahertz nondestructive testing provided by the utility model;
FIG. 2 is a second schematic structural diagram of a visual vertical reflection measurement apparatus for terahertz nondestructive testing provided by the present invention;
reference numerals:
1: a housing; 2: a visible light source assembly; 3: a terahertz emission component;
4: a terahertz receiving component; 5: a mirror; 6: a first beam splitter;
7: a second beam splitter; 11: a cavity; 12: a first terahertz lens;
13: a mirror frame; 14: a first frame; 15: a second frame;
16: a card slot; 21: a laser pointer; 22: a through hole;
31: a terahertz transmitting antenna; 41: terahertz receiving antenna.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
A visual vertical reflection measurement device for terahertz nondestructive testing according to the present invention is described below with reference to fig. 1 and 2.
As shown in fig. 1 and fig. 2, a visual vertical reflection measurement device for terahertz nondestructive testing includes a housing 1, a visible light source assembly 2, a terahertz emission assembly 3, a terahertz receiving assembly 4, a reflector 5, a first beam splitter 6, and a second beam splitter 7.
Specifically, a cavity 11 is arranged in the housing 1, and a first terahertz lens 12 is arranged on a side wall surface of the cavity 11. The visible light source assembly 2 is fixedly installed on the housing 1, and the visible light source assembly 2 is used for emitting visible light to the reflector 5. The terahertz transmitting assembly 3 is fixedly installed between the terahertz receiving assembly 4 and the visible light source assembly 2, and the terahertz transmitting assembly 3 is used for transmitting terahertz beams to the first beam splitter 6. The reflecting mirror 5 and the second beam splitter 7 are respectively installed on two sides of the cavity 11, the first beam splitter 6 is located between the reflecting mirror 5 and the second beam splitter 7, and the first beam splitter 6 is used for reflecting the terahertz wave beam to the second beam splitter 7. The reflecting mirror 5 is used for reflecting the visible light to the first beam splitter 6, transmitting the visible light through the first beam splitter 6, transmitting the visible light to the second beam splitter 7, and enabling the visible light to coincide with the terahertz wave beam, and the second beam splitter 7 is used for reflecting the visible light and the terahertz wave beam to the first terahertz lens 12.
When the terahertz wave transmitting and receiving device is used, corresponding terahertz devices, such as a spread spectrum module, a vector network analyzer and the like, are connected with the terahertz transmitting assembly 3 and the terahertz receiving assembly 4, terahertz waves are transmitted to the first beam splitter 6 through the terahertz transmitting assembly 3, and the terahertz waves are reflected to the second beam splitter 7 by the first beam splitter 6. Meanwhile, visible light is emitted to the reflector 5 through the visible light source assembly 2, and the visible light is reflected by the reflector 5 and then passes through the first beam splitter 6 to be incident on the second beam splitter 7. At the moment, the visible light and the terahertz wave are overlapped, the transmission path of the visible light is consistent with that of the terahertz wave, the visible light and the terahertz wave are incident on the second beam splitter 7, the second beam splitter 7 reflects the visible light and the terahertz wave to the first terahertz lens 12, the visible light and the terahertz wave are incident on an object to be detected after passing through the first terahertz lens 12, the visible light spot is overlapped with the invisible terahertz light spot, the visible light spot can indicate the position of the terahertz light spot, and the terahertz wave with the information of the detected object is reflected and transmitted to the terahertz receiving assembly 4 to be received. The position of terahertz wave beams can be known by observing visible light beams, the system is convenient to calibrate, the terahertz waves can be accurately incident on an object to be detected, the detection accuracy is guaranteed, and only corresponding spread spectrum modules and a vector network analyzer are required to be connected with a measuring system, so that the measuring system is not required to be built by consuming a large amount of time and energy.
At the installation reflector 5, because the visible light can take place certain degree of skew when inciding to reflector 5, and the skew degree is relevant with the thickness of reflector 5, calculate the offset that obtains the light according to the thickness of reflector 5, then carry out corresponding adjustment to the mounting height of reflector 5 according to the offset for after reflector 5 reflects the visible light, the visible light completely coincides with terahertz wave, makes the position of the instruction terahertz wave that the visible light can be accurate. When the second beam splitter 7 is installed, the terahertz waves carrying the article information need to penetrate through the second beam splitter 7 first to be transmitted to the terahertz receiving assembly 4, and when the terahertz waves penetrate through the second beam splitter 7, the terahertz waves can also deviate to a certain degree, and the installation height of the second beam splitter 7 is correspondingly adjusted according to the offset obtained through pre-calculation, so that the reflected terahertz waves carrying the article information can be accurately received by the terahertz receiving assembly 4 after penetrating through the second beam splitter 7, and the detection accuracy is ensured.
Further, a wave absorbing material for absorbing stray waves is coated in the cavity 11. When the wave absorbing material is used, the wave absorbing material in the cavity 11 can effectively absorb stray waves, so that the influence of the stray waves on measurement is avoided, and the measurement accuracy is ensured.
Further, as shown in fig. 1 and fig. 2, it can be seen that the light source assembly 2, the terahertz emitting assembly 3 and the terahertz receiving assembly 4 are parallel to each other and located at the same horizontal position. When the terahertz wave detector is used, visible light emitted by the visible light source assembly 2 and terahertz waves emitted by the terahertz emitting assembly 3 are in the same horizontal position, and then when the reflector 5 reflects a path of the visible light to the second beam splitter 7 and a path of the terahertz waves to the second beam splitter 7 by the first beam splitter 6 are in the same straight line, so that the visible light and the terahertz waves are coincided. The visible light and the terahertz wave are incident on an article to be detected through the first terahertz lens 12 after being superposed, and then the terahertz wave with article information is reflected, so that the terahertz wave passes through the first terahertz lens 12 and is transmitted to the terahertz receiving component 4, and the measurement of the article is completed. The position of the terahertz wave can be determined by observing the visible light, and meanwhile, the measurement cannot be influenced, so that the measurement accuracy is improved.
As shown in fig. 1 and fig. 2, the terahertz receiving assembly 4, the second beam splitter 7 and the first terahertz lens 12 are located on the same straight line. When the terahertz wave receiving assembly is used, when terahertz waves are incident on an article to be detected and then the terahertz waves with article information are reflected back, the terahertz waves reflected and scattered by a detected object are collected by the first terahertz lens 12 and transmitted to the second beam splitter 7, and the terahertz waves are received by the terahertz receiving assembly 4 through the second beam splitter 7, so that the terahertz receiving assembly 4 is ensured to be capable of receiving the terahertz waves.
Further, as shown in fig. 1 and 2, the mirror 5 and the first beam splitter 6 are parallel to each other. When the terahertz wave measuring device is used, the visible light source assembly 2 emits visible light to the reflector 5, the terahertz wave is emitted to the first beam splitter 6 by the terahertz emitting assembly 3, the incident angle of the visible light incident on the reflector 5 is the same as the incident angle of the terahertz wave incident on the first beam splitter 6, the visible light reflected by the reflector 5 and the terahertz wave reflected by the first beam splitter 6 are in the same straight line, the visible light can coincide with the terahertz wave, the position of the terahertz wave can be determined by observing the visible light, meanwhile, the influence on measurement cannot be caused, and the measuring accuracy is improved.
Further, as shown in fig. 1 and 2, a mirror frame 13, a first mirror frame 14 and a second mirror frame 15 are further arranged in the cavity 11, the mirror frame 13, the first mirror frame 14 and the second mirror frame 15 are all connected with the bottom of the cavity 11 in a sliding manner, the mirror 5 is mounted on the mirror frame 13, the first beam splitter 6 is mounted on the first mirror frame 14, and the second beam splitter 7 is mounted on the second mirror frame 15. When the measuring system is used, an external force is respectively applied to the reflector frame 13, the first lens frame 14 and the second lens frame 15, so that the reflector frame 13, the first lens frame 14 and the second lens frame 15 can move relative to the bottom of the cavity 11, the positions of the reflector 5, the first beam splitter 6 and the second beam splitter 7 are driven to move, and the measuring system is adjusted.
As shown in fig. 1 and 2, a plurality of slots 16 are formed in the bottom of the cavity 11, and the latch blocks matched with the slots 16 are respectively disposed at the bottoms of the mirror holder 13, the first mirror holder 14, and the second mirror holder 15. When the lens splitter is used, the clamping block is clamped into the clamping groove 16, so that the clamping block can move along the clamping groove 16 and cannot be separated from the clamping groove 16, the reflector frame 13, the first lens frame 14 and the second lens frame 15 can move along the clamping groove 16 respectively, and the positions of the reflector 5, the first beam splitter 6 and the second beam splitter 7 are adjusted.
Further, as shown in fig. 1 and 2, it can be seen that the light source assembly 2 includes a laser pointer 21, the laser pointer 21 is installed in the housing 1, a through hole 22 is provided on a side wall surface of the cavity 11, and the laser pointer 21 is communicated with the through hole 22. When the terahertz wave beam splitter is used, the laser indicator 21 emits visible light to the through hole 22, the visible light penetrates through the through hole 22 and then enters the reflector 5, then the reflector 5 reflects the visible light onto the second beam splitter 7 and is overlapped with terahertz waves, and then the position of the terahertz wave beam can be known by observing the visible light.
Wherein, the visible light source component 2 further comprises a collimating lens, and the collimating lens is positioned between the laser pointer 21 and the through hole 22. When the terahertz wave beam indicator is used, the laser indicator 21 emits visible light to the collimating lens, the collimating lens converts the visible light into a parallel collimating light column, and the collimated visible light column penetrates through the through hole 22 and is incident on the reflector 5, so that the visible light can accurately indicate the position of the terahertz wave beam.
Further, as shown in fig. 1 and fig. 2, the terahertz transmitting assembly 3 includes a terahertz transmitting antenna 31 and a second terahertz lens, the terahertz transmitting antenna 31 is fixedly installed in the housing 1, and the second terahertz lens is located between the terahertz transmitting antenna 31 and the cavity 11. When the terahertz wave detector is used, the terahertz wave transmitting antenna 31 transmits terahertz waves to the second terahertz lens, the second terahertz lens collimates the terahertz waves to enable the terahertz waves to become a parallel collimated terahertz wave beam, then the collimated terahertz wave beam is incident on the first beam splitter 6, the terahertz waves are ideal plane wave conditions when reaching the surface of a sample to be detected, the wave beams are more concentrated, and the detection precision is improved.
Further, as shown in fig. 1 and fig. 2, the terahertz receiving assembly 4 includes a terahertz receiving antenna 41 and a third terahertz lens, the terahertz receiving antenna 41 is fixedly installed in the housing 1, and the third terahertz lens is located between the terahertz receiving antenna 41 and the cavity 11. When the terahertz wave detector is used, terahertz waves carrying information of a sample to be detected are transmitted to the third terahertz lens, the third terahertz lens collimates the terahertz waves, the terahertz waves are changed into a parallel collimated terahertz wave beam, and then the collimated terahertz wave beam is transmitted to the terahertz receiving antenna 41, so that the terahertz antenna can accurately receive the information of the sample to be detected, and the detection accuracy is guaranteed.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A visual vertical reflection measuring device for terahertz nondestructive testing is characterized by comprising a shell, a visible light source assembly, a terahertz emitting assembly, a terahertz receiving assembly, a reflecting mirror, a first beam splitter and a second beam splitter;
a cavity is arranged in the shell, a first terahertz lens is arranged on the side wall surface of the cavity, the visible light source assembly is fixedly arranged on the shell, and the visible light source assembly is used for emitting visible light to the reflector;
the terahertz transmitting assembly is fixedly arranged between the terahertz receiving assembly and the visible light source assembly and is used for transmitting terahertz wave beams to the first beam splitter;
the reflector and the second beam splitter are respectively arranged on two sides of the cavity, and the first beam splitter is positioned between the reflector and the second beam splitter; the first beam splitter is used for reflecting a terahertz beam to the second beam splitter; the reflector is used for reflecting visible light to the first beam splitter, transmitting the visible light to the second beam splitter and enabling the visible light to coincide with a terahertz wave beam; the second beam splitter is used for reflecting visible light and terahertz beams to the first terahertz lens.
2. The visual vertical reflection measurement device for terahertz nondestructive testing according to claim 1, wherein the visible light source assembly, the terahertz emitting assembly and the terahertz receiving assembly are parallel to each other and located at the same horizontal position.
3. The visual vertical reflection measurement device for terahertz nondestructive testing according to claim 2, wherein the terahertz receiving assembly, the second beam splitter and the first terahertz lens are located on the same straight line.
4. The visual perpendicular reflection measurement device for terahertz nondestructive testing according to any one of claims 1 to 3, characterized in that the mirror and the first beam splitter are parallel to each other.
5. The visual vertical reflection measurement device for terahertz nondestructive testing according to any one of claims 1 to 3, characterized in that a mirror frame, a first mirror frame and a second mirror frame are further disposed in the cavity, the mirror frame, the first mirror frame and the second mirror frame are all slidably connected with the bottom of the cavity, the mirror is mounted on the mirror frame, the first beam splitter is mounted on the first mirror frame, and the second beam splitter is mounted on the second mirror frame.
6. The visual vertical reflection measurement device for terahertz nondestructive testing according to claim 5 is characterized in that a plurality of clamping grooves are formed in the bottom of the cavity, and clamping blocks matched with the clamping grooves are arranged at the bottoms of the reflector frame, the first mirror frame and the second mirror frame.
7. The visual vertical reflection measurement device for the terahertz nondestructive testing according to any one of claims 1 to 3, wherein the visible light source assembly includes a laser pointer, the laser pointer is installed in the housing, a through hole is provided on a side wall surface of the cavity, and the laser pointer is communicated with the through hole.
8. The visual vertical reflection measurement device for terahertz nondestructive testing according to claim 7, wherein the visible light source assembly further comprises a collimating lens, and the collimating lens is located between the laser pointer and the through hole.
9. The visual vertical reflection measurement device for terahertz nondestructive testing according to any one of claims 1 to 3, wherein the terahertz transmission assembly includes a terahertz transmission antenna fixedly installed in the housing and a second terahertz lens located between the terahertz transmission antenna and the cavity.
10. The visual vertical reflection measurement device for terahertz nondestructive testing according to any one of claims 1 to 3, characterized in that the cavity is coated with a wave-absorbing material for absorbing stray waves.
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| CN202122275085.2U CN216350331U (en) | 2021-09-18 | 2021-09-18 | Visual vertical reflection measuring device for terahertz nondestructive testing |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111950351A (en) * | 2020-06-29 | 2020-11-17 | 北京农业智能装备技术研究中心 | Agricultural machinery strain early diagnosis inspection system based on terahertz and visible light |
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2021
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111950351A (en) * | 2020-06-29 | 2020-11-17 | 北京农业智能装备技术研究中心 | Agricultural machinery strain early diagnosis inspection system based on terahertz and visible light |
| CN111950351B (en) * | 2020-06-29 | 2024-03-08 | 北京农业智能装备技术研究中心 | Agricultural machinery strain early diagnosis inspection system based on terahertz and visible light |
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