CN216285496U - On-chip antenna test system - Google Patents
On-chip antenna test system Download PDFInfo
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- CN216285496U CN216285496U CN202120573173.8U CN202120573173U CN216285496U CN 216285496 U CN216285496 U CN 216285496U CN 202120573173 U CN202120573173 U CN 202120573173U CN 216285496 U CN216285496 U CN 216285496U
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Abstract
The utility model provides a system for testing an on-chip antenna, which comprises: the testing robot is arranged above the probe station and fixed with the darkroom, and the testing antenna is connected to the testing robot and can be driven by the testing robot to perform space motion to test the on-chip antenna to be tested. The testing robot is fixedly arranged above the probe station in a side hanging or hanging mode, hemispherical scanning coverage can be achieved in the radiation direction of the antenna to be tested, and far field and near field testing of the antenna is achieved.
Description
Technical Field
The utility model relates to the technical field of antenna testing, in particular to an on-chip antenna testing system.
Background
Antennas are important components of communication systems and radar systems, and antenna testing is crucial in the development and production of antennas. With the development of technology and the improvement of radio frequency, millimeter wave antennas have been widely applied to the fields of wireless communication and automatic driving, and unlike low-frequency antennas, millimeter wave antennas are often integrated on printed boards or chips, and due to the small size, the millimeter wave antennas are sensitive to abnormal tolerance of materials, processes and manufacturing, and the reject ratio of the antennas is high, defective products in batch products need to be found in time to be prevented from entering welding and finished product assembly processes, and further loss expansion is caused. In order to remove defective products in printed board antennas or antennas in chips in time, detection and calibration processes need to be inserted, the performance of the antennas is detected in time, only qualified products flow into the next process, and the detection and calibration equipment with high detection precision is provided.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide an on-chip antenna test system with higher test precision.
In order to achieve the above purpose, the utility model provides the following technical scheme:
the utility model provides a system for testing an on-chip antenna, which comprises: the testing robot is arranged above the probe station and fixed with the darkroom, and the testing antenna is connected to the testing robot and can be driven by the testing robot to perform space motion to test the on-chip antenna to be tested.
Optionally, the test robot is fixed to a wall or ceiling of a darkroom.
Optionally, a spread spectrum module is arranged between the test robot and the test antenna, and the spread spectrum module is in communication connection with the test antenna.
Optionally, a wave absorbing plate is connected between the spread spectrum module and the test antenna.
Optionally, the wave absorbing plate is a pyramid wave absorbing plate, and the tip of the pyramid faces the probe station during testing.
Optionally, the test robot is an industrial six-axis robot or an industrial seven-axis robot.
Optionally, the test robot is wrapped with a wave-absorbing material.
Optionally, the test antenna is a standard gain horn or a radio frequency probe.
The technical scheme provided by the utility model has the beneficial effects that: the testing robot is fixedly arranged above the probe station in a side hanging or hanging mode, hemispherical scanning coverage can be achieved in the radiation direction of the antenna to be tested, and far field and near field testing of the antenna is achieved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the description of the embodiments of the present invention will be briefly described below.
Fig. 1 is a schematic structural diagram of an on-chip antenna testing system according to an embodiment of the present invention, showing a testing robot hanging on a wall of a darkroom;
FIG. 2 is a schematic diagram of an on-chip antenna testing system according to another embodiment of the present invention, showing a testing robot suspended from a darkroom ceiling;
FIG. 3 is a schematic diagram of an on-chip antenna near field scanning performed by the on-chip antenna testing system of the present invention;
FIG. 4 is a diagram illustrating far field scanning of an on-chip antenna by the on-chip antenna testing system according to the present invention.
Detailed Description
Embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While certain embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be embodied in various forms and should not be construed as limited to the embodiments set forth herein, but rather are provided for a more thorough and complete understanding of the present invention. It should be understood that the drawings and the embodiments of the present invention are illustrative only and are not intended to limit the scope of the present invention.
It should be understood that the various steps recited in the method embodiments of the present invention may be performed in a different order and/or performed in parallel. Moreover, method embodiments may include additional steps and/or omit performing the illustrated steps. The scope of the utility model is not limited in this respect.
The term "include" and variations thereof as used herein are open-ended, i.e., "including but not limited to". The term "coupled" may refer to direct coupling or indirect coupling via intermediate members (elements). The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments". Relevant definitions for other terms will be given in the following description.
It should be noted that the terms "first", "second", and the like in the present invention are only used for distinguishing the devices, modules or units, and are not used for limiting the devices, modules or units to be different devices, modules or units, and are not used for limiting the sequence or interdependence relationship of the functions executed by the devices, modules or units.
As shown in fig. 1 and 2, the present invention relates to an on-chip antenna test system, which includes a darkroom 1, and a probe station 2, a test robot 3 and a test antenna 4 all disposed in the darkroom 1. Wave-absorbing materials are attached to the inner wall of the darkroom 1 to avoid signal reflection from influencing the test result. The probe station 2 is used for fixing an on-chip antenna to be tested. The test robot 3 is fixed to a wall or a ceiling of the darkroom 1 and suspended above the probe station 2. The test antenna 4 is fixed on the test robot 3 and can be driven by the test robot 3 to perform space motion, and antenna parameter test is performed on the on-chip antenna 10 on the probe station 2. The on-chip antenna is mounted on the probe station 2 at the time of test with its radiation direction being upward.
The test robot 3 is an industrial six-axis robot or an industrial seven-axis robot, and the test robot 3 is suspended above the probe station 2, so that the six-axis freedom degree can be fully exerted, the test antenna 4 can be carried to realize hemispherical scanning coverage in the radiation direction of the antenna to be tested, and the far field and near field tests of the antenna are met.
The periphery of the test robot 3 is wrapped with the wave-absorbing material, so that the electromagnetic field interference of the test robot 3 body to the test environment is reduced, and the accuracy of the detection result is ensured.
The test system of the example can realize the antenna parameter test of the frequency band of 18-50 GHz. When the test of the 50-110 GHz frequency band is carried out, furthermore, a spread spectrum module 5 is arranged between the test robot 3 and the test antenna 4, and the spread spectrum module 5 is in communication connection with the test antenna 4.
Furthermore, a wave absorption plate 6 is connected between the spread spectrum module 5 and the test antenna 4. The wave absorbing plate 6 is a pyramid wave absorbing plate 6, and the tip of the pyramid faces the probe station 2 during testing.
Optionally, the test antenna 4 is a standard gain horn or a radio frequency probe.
It should be understood that in order to perform the test, a network analyzer or a radio frequency receiver is also required to analyze the received signal and obtain a corresponding value. The on-chip antenna to be tested is generally placed on the probe station 2 as a transmitting antenna, the probe is connected with a feed port of the on-chip antenna, and the other end of the probe is connected with a signal transmitting end of a radio frequency testing instrument, generally a network analyzer or a radio frequency signal source, through a radio frequency cable. The on-chip antenna radiates electromagnetic waves, the electromagnetic waves are received by a standard gain horn or a radio frequency probe carried by a robot flange after being radiated in space, and then the electromagnetic waves are transmitted to a network analyzer or a radio frequency receiver through a radio frequency cable.
Referring to fig. 3 and 4, with the on-chip antenna testing system of the present invention, near-field scanning or far-field scanning may be performed on the on-chip antenna according to a predetermined path to obtain corresponding antenna parameter information. Fig. 3 is a schematic diagram of near field scanning of an on-chip antenna, and the testing robot moves the test antenna according to the planar coordinate system 20 to scan the on-chip antenna to be tested, so as to complete the near field test. The diagram is a schematic diagram of far field scanning of the on-chip antenna, and the testing robot moves the testing antenna according to the spherical coordinate system 25 to scan the on-chip antenna to be tested, so as to complete far field testing.
The foregoing description is only exemplary of the preferred embodiments of the utility model and is illustrative of the principles of the technology employed. It will be understood by those skilled in the art that the scope of the present invention is not limited to the specific combination of the above-mentioned features, and other embodiments can be made by combining the above-mentioned features or their equivalents without departing from the spirit of the present invention. For example, the above features are replaced with (but not limited to) features having similar functions of the present invention.
Although the subject matter has been described in language specific to structural features and/or methodological acts, it is to be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claims.
Claims (8)
1. An on-chip antenna test system, comprising: the testing robot is arranged above the probe station and fixed with the darkroom, and the testing antenna is connected to the testing robot and can be driven by the testing robot to perform space motion to test the on-chip antenna to be tested.
2. The system of claim 1, wherein the test robot is fixed to a wall or ceiling of a dark room.
3. The system for testing the on-chip antenna according to claim 1, wherein a spectrum spreading module is arranged between the test robot and the test antenna, and the spectrum spreading module is in communication connection with the test antenna.
4. The system of claim 3, wherein a wave absorption plate is connected between the spread spectrum module and the test antenna.
5. The system of claim 4, wherein the wave absorption plate is a pyramid wave absorption plate, and the tip of the pyramid is directed to the probe station during testing.
6. The system of claim 1, wherein the test robot is an industrial six-axis robot or an industrial seven-axis robot.
7. The system for testing the on-chip antenna according to claim 1, wherein the test robot is wrapped with a wave-absorbing material.
8. The system of claim 1, wherein the test antenna is a standard gain horn or a radio frequency probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120573173.8U CN216285496U (en) | 2021-03-19 | 2021-03-19 | On-chip antenna test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202120573173.8U CN216285496U (en) | 2021-03-19 | 2021-03-19 | On-chip antenna test system |
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| Publication Number | Publication Date |
|---|---|
| CN216285496U true CN216285496U (en) | 2022-04-12 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202120573173.8U Active CN216285496U (en) | 2021-03-19 | 2021-03-19 | On-chip antenna test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116953297A (en) * | 2023-07-26 | 2023-10-27 | 中国计量科学研究院 | Antenna back feed measuring device on millimeter wave plate |
-
2021
- 2021-03-19 CN CN202120573173.8U patent/CN216285496U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116953297A (en) * | 2023-07-26 | 2023-10-27 | 中国计量科学研究院 | Antenna back feed measuring device on millimeter wave plate |
| CN116953297B (en) * | 2023-07-26 | 2024-02-20 | 中国计量科学研究院 | Antenna back feed measuring device on millimeter wave plate |
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