CN216285477U - Test system of electronic product - Google Patents

Abstract

The application discloses electronic product's test system includes: the measuring interface is used for receiving a signal to be measured of the electronic product; the switching devices only work after receiving the working signals, the input end of each switching device is connected with the measuring interface, the output end of each switching device is connected with the monitoring device, and the testing ranges of the switching devices are different; and the monitoring device is used for determining a target test range according to the signal to be tested output by the switching device which works currently and sending a working signal to the switching device corresponding to the target test range. The method and the device can automatically adjust the current test range to adapt to different working conditions of the electronic product, so that the test precision of the to-be-tested signal of the electronic product is improved.

Description

Test system of electronic product

Technical Field

The present disclosure relates to testing, and particularly to a testing system for electronic products.

Background

With continuous progress of electronic technology, power consumption tests of electronic products are stricter and stricter, an ammeter, a voltmeter and/or a multimeter are mainly connected to the electronic products to be tested on the market at present, but current and voltage of the electronic products to be tested are also distinguished under different working conditions, for example, when an intelligent lock works, the current of the intelligent lock is in a range of A, when the intelligent lock is in a dormant state, the current of the intelligent lock is in a range of muA, but an ordinary multimeter cannot realize automatic switching between mu A, mA and A or between mV and V in the test process, so that the accuracy of test results is influenced.

Therefore, how to provide a solution to the above technical problem is a problem that needs to be solved by those skilled in the art.

SUMMERY OF THE UTILITY MODEL

The application aims at providing a test system of electronic product, can automatic adjustment current test range to adapt to electronic product's different operating modes, thereby improve electronic product's the test accuracy of the signal that awaits measuring.

In order to solve the above technical problem, the present application provides a test system for an electronic product, including:

the measuring interface is used for receiving a signal to be measured of the electronic product;

the switching devices only work after receiving working signals, the input end of each switching device is connected with the measuring interface, the output end of each switching device is connected with the monitoring device, and the testing ranges of the switching devices are different;

the monitoring device is used for determining a target test range according to a signal to be tested output by the switching device which works currently, and sending the working signal to the switching device corresponding to the target test range.

Optionally, each switching device includes a switching circuit and a sampling resistor circuit connected in series with the switching circuit.

Optionally, the switching circuit is a relay.

Optionally, the test system further includes:

and the first amplifying circuit is arranged between each switching device and the monitoring device and is used for amplifying the signal to be detected to a first preset range.

Optionally, the test system further includes:

and the analog sampling circuit is arranged between the first amplifying circuit and the monitoring device.

Optionally, the monitoring device includes a processor and a communication module connected to the processor;

the test system further comprises:

and the external terminal is connected with the monitoring device through the communication module and is used for displaying the signal to be detected.

Optionally, the external terminal includes a cloud and/or an upper computer and/or a mobile terminal.

Optionally, the test system further includes:

and the analog-to-digital conversion device is arranged between the switching device and the processor.

Optionally, the communication module is a USB communication module and/or a bluetooth communication module.

Optionally, the test system further includes:

a display and a trigger device connected with the processor.

The application provides a test system of electronic product still is equipped with a plurality of auto-change over devices between measurement interface and monitoring device, and each auto-change over device's test range is all inequality, changes when the operating mode of electronic product, can pass through the auto-change over device work that monitoring device control corresponds to reach the purpose of automatic adjustment current test range, with the different operating modes that adapt to the electronic product, thereby improve the test accuracy of the signal that awaits measuring of electronic product.

Drawings

In order to more clearly illustrate the embodiments of the present application, the drawings needed for the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained by those skilled in the art without inventive effort.

Fig. 1 is a schematic structural diagram of a test system of an electronic product provided in the present application;

fig. 1a is a schematic structural diagram of a current measurement interface provided in the present application;

fig. 1b is a schematic structural diagram of a voltage measurement interface provided in the present application;

FIG. 2a is a schematic diagram of a system according to the present application_μThe structure schematic diagram of the relay circuit corresponding to the A gear;

fig. 2b is a schematic structural diagram of a relay circuit corresponding to the mA range provided in the present application;

fig. 2c is a schematic structural diagram of a relay circuit corresponding to the a gear provided in the present application;

FIG. 3a is a schematic diagram of a system according to the present application_μThe structure schematic diagram of the sampling resistance circuit corresponding to the A gear;

fig. 3b is a schematic structural diagram of a sampling resistor circuit corresponding to the mA range provided in the present application;

fig. 3c is a schematic structural diagram of a sampling resistor circuit corresponding to the a-gear provided in the present application;

FIG. 4a is a schematic diagram of a system according to the present application_μThe structure schematic diagram of the preceding stage amplifying circuit corresponding to the A gear;

fig. 4b is a schematic structural diagram of a pre-stage amplifying circuit corresponding to the mA range provided in the present application;

fig. 4c is a schematic structural diagram of a pre-stage amplifier circuit corresponding to the a-stage provided in the present application;

fig. 5a is a schematic structural diagram of an analog sampling circuit provided in the present application;

FIG. 5b is a schematic diagram of another analog sampling circuit provided in the present application;

fig. 6a is a schematic structural diagram of a relay circuit for switching a voltage measurement range according to the present application;

fig. 6b is a schematic structural diagram of a sampling circuit corresponding to a voltage measurement range provided in the present application;

fig. 6c is a schematic structural diagram of a sampling circuit corresponding to another voltage measurement range provided in the present application;

fig. 7 is a schematic structural diagram of an analog-to-digital converter circuit provided in the present application;

FIG. 8 is a schematic structural diagram of another electronic product testing system provided in the present application;

FIG. 9 is a block diagram of a related circuit of a processor according to the present application;

fig. 10 is a schematic structural diagram of an OLED, a key and an indicator provided in the present application;

fig. 11 is a schematic diagram of a USB power supply structure provided in the present application.

Detailed Description

The core of the application is to provide a test system of an electronic product, which can automatically adjust the current test range to adapt to different working conditions of the electronic product, thereby improving the test precision of a signal to be tested of the electronic product.

In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

Referring to fig. 1, fig. 1 is a schematic structural diagram of a test system of an electronic product provided in the present application, the test system including:

the measurement interface J is used for receiving a signal to be measured of the electronic product;

the switching devices 1 only work after receiving the working signals, the input end of each switching device 1 is connected with the measuring interface J, the output end of each switching device 1 is connected with the monitoring device 2, and the testing ranges of the switching devices 1 are different;

and the monitoring device 2 is used for determining a target test range according to the signal to be tested output by the switching device 1 which is currently working, and sending a working signal to the switching device 1 corresponding to the target test range.

Specifically, the measurement interface J is connected to an electronic product to be measured, and is configured to obtain a signal to be measured of the electronic product, where the signal to be measured includes, but is not limited to, a voltage signal, a current signal, and the like. It can be understood that the voltage signal and the current signal both have respective corresponding measurement interfaces J, and the structure of the current measurement interface J1 corresponding to the current signal is shown in fig. 1a, in the present application, the current signal is collected by low-side sampling, the power supply supplies power to the electronic product, the positive terminal of the power supply is connected to the positive terminal of the electronic product to be tested, the negative terminal of the electronic product to be tested is connected to the Pin1 of the current measurement interface J1, the Pin3 of the current measurement interface J1 is connected to the negative terminal of the power supply of the electronic product to be tested, and the current to be tested Iout flowing through the Pin1 is connected to the negative terminal of the power supply through the corresponding switching device 1. The voltage measurement interface J2 corresponding to the voltage signal is shown with reference to fig. 1 b.

Specifically, the present embodiment further provides a plurality of switching devices 1 connected to the corresponding measurement interfaces J, and the types of the switching devices 1 are also differentiated according to the different signals to be measured, and the switching devices 1 include but are not limited to a current switching device and a voltage switching device, wherein the current switching device is connected to the current measurement interface J so as to receive the current signal, and the voltage switching device is connected to the voltage measurement interface J so as to receive the voltage signal.

As an optional embodiment, the switching device 1 is composed of a switch circuit 11 and a sampling resistor circuit 12, and the resistance values and the series-parallel relationship of the sampling resistors in the sampling resistor circuits 12 are reasonably selected, that is, each sampling resistor circuit 12 corresponds to one measurement range, the switch circuit 11 is connected in series with the sampling resistor circuit 12, and the sampling resistor circuit 12 currently put into the test system is selected by controlling the on/off of the switch circuit 11, so that the switching of the measurement ranges is realized. The switching circuit 11 may be implemented by a relay circuit.

Specifically, the relay circuit and the sampling resistor circuit 12 corresponding to the current measurement range μ a are shown in fig. 2a and 3a, the relay circuit includes a relay U6, the sampling resistor circuit 12 includes a sampling resistor R6, the relay circuit and the sampling resistor circuit 12 corresponding to the current measurement range mA are shown in fig. 2b and 3b, the relay circuit includes a relay U1, the sampling resistor circuit 12 includes a sampling resistor R11, the relay circuit and the sampling resistor circuit 12 corresponding to the current measurement range a are shown in fig. 2c and 3c, the relay circuit includes a relay U2, and the sampling resistor circuit 12 includes a sampling resistor R7. It can be understood that each relay circuit is connected with the current measurement interface J1, the current to be measured Iout "flowing through the Pin1 of the current measurement interface J1 is switched to a different sampling resistor circuit 12 through the relay circuit to the negative terminal of the power supply, and according to V ═ IR, the sampling resistor is constant, and different voltages can be obtained at two ends of the sampling resistor when different currents flow.

Further, the output terminals of the current switching devices corresponding to the current measurement ranges μ a, mA and a are connected to a pre-sampling circuit, i.e., a first amplifier circuit, and the circuit configuration of the pre-amplifier circuit in μ a is shown in fig. 4a, the circuit configuration of the pre-amplifier circuit in mA is shown in fig. 4b, and the circuit configuration of the pre-amplifier circuit in a is shown in fig. 4 c. Referring to fig. 4a to 4c, U4, U7 and U8 are precision operational amplifiers, the pre-stage amplification circuit adopts the principle of same-direction amplification, the forward input ends of the operational amplifiers are respectively connected with one end of a sampling resistor, the description is made by taking a μ a stage as an example, as shown in fig. 3a and 4a, Isense1 is connected with a sampling resistor R6 and is connected with the forward end of an operational amplifier U4, and Vout is Vin x (Rf/R1+1), namely Vadc1 is Isense1 × R6(R10/R12+1) according to the principle of same-direction amplification. When PIN3 of the relay U6 is conducted with PIN4, the current Isense1 flowing through the two ends of the sampling resistor R6 corresponds to Vadc1, and other current measuring ranges are changed.

As a more preferable embodiment, an analog sampling circuit is further connected to the output terminal of the preceding stage amplification circuit, and as shown in fig. 5a and 5b, the analog sampling circuit also employs a homodromous amplification, the I-ADC is the output terminal of the preceding stage amplification circuit and is connected to one end of a double-pole double-throw relay, the output terminal of the preceding stage amplification circuit is also switched when the sampling resistor is switched, and pin5 and pin6 are turned on when the relay U6 is closed. The I-ADC is conducted with the ADC1, the I-ADC signal is connected to the same-direction ends of U2A and U2B, U2A is an operational amplifier with fixed gain, the output signals AIN0 and U2B are gain-adjusted through a digital potentiometer U5, and the output end AIN1 is connected with the output end AIN 1.

The voltage sampling part is shown in fig. 6a, 6b and 6c, wherein J2 is a voltage measurement interface, U20 is a switching relay, and the input voltage to be tested is switched to be connected to VADC1 or VADC 2. The VADC1 is connected with resistors R47 and R56 so as to divide the input voltage. The output is AIN2 after being followed by an operational amplifier U12B. The VADC2 is connected with a resistor R64 and follows the resistor R64 through an operational amplifier U12B, and the output is AIN 3. AIN2, AIN3 are connected to the six analog-to-digital converters of the figure.

Before the signal to be detected reaches the processor in the monitoring device 2, analog-to-digital conversion needs to be performed on the signal to be detected processed by the analog sampling circuit, the analog-to-digital converter may be the ADS1118, a circuit structure of the analog-to-digital converter is shown in fig. 7, and the analog-to-digital conversion chip of the type is a precise, low-power consumption, 16-bit analog-to-digital converter and has 4 channels, an SPI interface and the like. The two channels of AIN0 and AIN1 are used for collecting current analog quantities, and the channels of AIN2 and AIN3 are used for collecting voltage analog quantities. The analog-to-digital converter may be disposed outside the monitoring device 2, or may be disposed inside the monitoring device 2, and the embodiment is not limited herein.

After the monitoring device 2 acquires the voltage signal and the current signal, the processor inside the monitoring device performs operation processing comparison, and when the current measurement range is determined to be incorrect, the relay circuit can be automatically or manually switched to adjust the sampling resistance accessed to the test system, so that the sampling accuracy is ensured, and further, the automatic switching of the uA, mA and A ranges or mV and V is realized to adapt to different electronic products. Specifically, the processor may determine, according to the determination result, that the sampling resistor circuit of the test system needs to be accessed currently, send a working signal to the switch circuit 11 of the sampling resistor circuit, where the switch circuit 11 that receives the working signal is turned on, and the switch circuit 11 that does not receive the working signal is turned off.

It can be seen that, in this embodiment, still be equipped with a plurality of auto-change over devices 1 between measurement interface J and monitoring device 2, and the test range of each auto-change over device 1 is all inequality, and when the operating mode of electronic product changed, can pass through the work of monitoring device 2 control corresponding auto-change over device 1 to reach the purpose of automatic adjustment current test range, in order to adapt to the different operating modes of electronic product, thereby improve the test accuracy of the signal that awaits measuring of electronic product.

Referring to fig. 8, fig. 8 is a schematic structural diagram of another testing system for electronic products provided in the present application, the testing system being based on the foregoing embodiments:

as an alternative embodiment, the monitoring device 2 includes a processor and a communication module connected to the processor;

the test system further comprises:

and the external terminal 3 is connected with the monitoring device 2 through a communication module and is used for displaying the signal to be detected.

As an optional embodiment, the external terminal 3 includes a cloud and/or an upper computer and/or a mobile terminal. As an alternative embodiment, the communication module is a USB communication module and/or a bluetooth communication module.

Specifically, the monitoring device 2 that this embodiment provided still includes communication module for with the signal that awaits measuring upload to external terminal 3, external terminal 3 includes high in the clouds and/or host computer and/or mobile terminal. The processor sends out the received current signal and voltage signal through a serial port or a wireless mode through the monitoring device 2. For example, the signal is transmitted to an upper computer through a serial port, and the upper computer processes and displays the received signal, so that an operator can see corresponding information such as collected voltage, current, mean value, root mean square, peak value, maximum value, minimum value, electric quantity and the like on the upper computer. Or send for the bluetooth gateway through wireless mode, the bluetooth gateway uploads the high in the clouds to data, can be in long-range acquisition on cell-phone APP. The circuit structure diagram of the processor is shown in fig. 9, and is a main control bluetooth part, which adopts the bluetooth soc nf52832 of nordic, supports bluetooth 4.0, and supports SPI, sar adc, serial port and I2C communication. The master control chip and the analog-to-digital conversion chip are communicated through the SPI and are processed through acquisition, storage, analysis algorithm and the like to control the on-off of a relay circuit so as to automatically switch the measurement ranges of current and voltage.

As an alternative embodiment, the test system further comprises:

a display and a triggering device connected with the processor.

Specifically, the triggering device may be a key, and the result of the processor after performing operation analysis on the current signal and the voltage signal may be displayed on the OLED screen, so that an operator may see current voltage data, and may set the displayed content through the key.

Referring to fig. 10, fig. 10 is a schematic diagram of an OLED, a key and an indicator. Further, referring to fig. 11, fig. 11 is a schematic structural diagram of the USB power supply, the USB to serial port and the LDO supplying power to the main controller according to the present application.

In conclusion, the scheme of the application can automatically switch among uA, mA, A gear, mV and V, and measure the current and voltage of the electronic product in real time; the upper computer is uploaded with the collected voltage and current signals in a wired mode, the upper computer can analyze the current voltage and the electric quantity of the equipment to be tested in real time, people do not need to see the meter head to judge whether the current voltage reaches the standard or not by naked eyes when testing is conducted, therefore, the testing efficiency is improved, the collected voltage and current signals are uploaded to a remote terminal in a wireless mode, remote detection can be achieved, and the problem that testing personnel cannot test the current and voltage on site is solved.

It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, article, or apparatus that comprises the element.

The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (10)

1. A system for testing an electronic product, comprising:

the measuring interface is used for receiving a signal to be measured of the electronic product;

the switching devices only work after receiving working signals, the input end of each switching device is connected with the measuring interface, the output end of each switching device is connected with the monitoring device, and the testing ranges of the switching devices are different;

the monitoring device is used for determining a target test range according to a signal to be tested output by the switching device which works currently, and sending the working signal to the switching device corresponding to the target test range.

2. The test system of claim 1, wherein each of the switching devices comprises a switching circuit and a sampling resistor circuit in series with the switching circuit.

3. The test system of claim 2, wherein the switching circuit is a relay.

4. The test system of claim 1, further comprising:

and the first amplifying circuit is arranged between each switching device and the monitoring device and is used for amplifying the signal to be detected to a first preset range.

5. The test system of claim 4, further comprising:

and the analog sampling circuit is arranged between the first amplifying circuit and the monitoring device.

6. The test system according to any one of claims 1 to 5, wherein the monitoring device comprises a processor and a communication module connected to the processor;

the test system further comprises:

and the external terminal is connected with the monitoring device through the communication module and is used for displaying the signal to be detected.

7. The test system according to claim 6, wherein the external terminal comprises a cloud and/or an upper computer and/or a mobile terminal.

8. The test system of claim 6, further comprising:

and the analog-to-digital conversion device is arranged between the switching device and the processor.

9. The test system according to claim 6, wherein the communication module is a USB communication module and/or a Bluetooth communication module.

10. The test system of claim 6, further comprising:

a display and a trigger device connected with the processor.

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