CN216285401U

CN216285401U - High-voltage large-current test clamp

Info

Publication number: CN216285401U
Application number: CN202122597920.4U
Authority: CN
Inventors: 文柳华
Original assignee: Zhuhai Benpu Electronics Co ltd
Current assignee: Zhuhai Benpu Electronics Co ltd
Priority date: 2021-10-27
Filing date: 2021-10-27
Publication date: 2022-04-12
Anticipated expiration: 2031-10-27

Abstract

The application provides a high-voltage large-current test clamp which comprises an upper clamp plate, a lower clamp plate and an upper terminal piece, wherein the lower clamp plate is arranged below the upper clamp plate; the lower terminal piece is arranged below the upper terminal piece and is detachably connected to one side, close to the upper clamping plate, of the lower clamping plate; the buffer support assembly is arranged between the upper clamping plate and the lower clamping plate and used for keeping the distance between the upper clamping plate and the lower clamping plate in a non-working state; the conflict adjusting component is arranged at the mounting section of the lower clamping plate, and the adjusting end is movably connected with the upper clamping plate. This application clamping force degree is stable, and the buffer function among the clamping process effectively avoids the problem of the too big damage that causes of clamping force degree.

Description

High-voltage large-current test clamp

Technical Field

The utility model relates to the field of test equipment, in particular to a high-voltage large-current test clamp.

Background

After the production and processing of some electric energy devices such as batteries, circuit boards and the like, high-voltage testing is required to be carried out on the electric energy devices so as to calculate various physical quantities, material components and physical parameters.

The test wire clamp in the prior art can be because the wire clamp tip is too big, thickness is too high during the clamp, thereby take place two poles of the earth short circuit easily, again because the wire clamp mouth is narrower, take place electrified mouthful situation of taking off easily in the pressurization in-process, bring the electric shock danger for the field work, influence personnel's personal safety, and when testing to thin-film solar cell high pressure, because of its special material and shape, when carrying out the centre gripping to it, both need guarantee intact physics fixed, can not make the pressure of attaching to it too big simultaneously and lead to it to break or suffer destruction, the wire clamp among the prior art is not suitable for. We therefore improve on this and propose a high voltage high current test clip.

SUMMERY OF THE UTILITY MODEL

The utility model aims to: the problem of the too big damage that causes of fastener centre gripping dynamics that exists at present.

In order to realize the purpose of the utility model, the utility model provides the following technical scheme:

a high voltage and high current test clip is provided to improve the above problems.

The present application is specifically such that:

comprises an upper clamping plate, a lower clamping plate arranged below the upper clamping plate and a clamping device

The upper end sub-piece is detachably connected to one side of the upper clamping plate, which is close to the lower clamping plate;

the lower terminal piece is arranged below the upper terminal piece and is detachably connected to one side, close to the upper clamping plate, of the lower clamping plate;

the buffer support assembly is arranged between the upper clamping plate and the lower clamping plate and used for keeping the distance between the upper clamping plate and the lower clamping plate in a non-working state;

the conflict adjusting component is arranged at the mounting section of the lower clamping plate, and the adjusting end is movably connected with the upper clamping plate.

As the preferred technical scheme of this application, buffering supporting component is including offering at the guide way of punch holder and lower plate centre gripping section, sliding connection at the T type guide bar of guide way in and connecting between punch holder and lower plate and the pressure spring of cover at T type guide bar outer wall.

As the preferred technical scheme of this application, conflict adjusting part includes can dismantle the connection at the symmetrical distribution of punch holder installation section installation piece, rotates the kayser subassembly of connection between the installation piece.

As the preferred technical scheme of this application, the kayser subassembly is including rotating last trip and lower trip of connecting between the installation piece, the link and the punch holder activity of going up the trip link to each other, go up trip and lower trip counterpoint block.

As the preferable technical scheme of the application, the installation end of the lower clamping plate is also provided with a slot matched with the clamping part of the lower clamping hook.

As the preferred technical scheme of this application, under the test condition, go up trip and trip counterpoint block down, go up the link conflict punch holder of trip.

Compared with the prior art, the utility model has the beneficial effects that:

in the scheme of the application:

1. the distance between the upper clamping plate and the lower clamping plate is kept under the non-working state through the arranged buffer supporting assembly, and the function of protecting the clamping of the workpiece to be tested under the non-working state is ensured; meanwhile, the buffer function of the clamping force is realized when the workpiece to be tested is clamped, and the damage caused by overlarge clamping force is avoided.

2. The clamping function of the workpiece to be tested is realized by the pressure on the upper clamping plate when the upper clamping hook and the lower clamping hook are aligned and clamped.

Drawings

FIG. 1 is a schematic diagram of an exploded structure of a high voltage and high current test clip provided in the present application;

fig. 2 is a schematic structural diagram of a high-voltage high-current test clip provided in the present application;

fig. 3 is a second schematic structural diagram of a high-voltage high-current test clip provided in the present application;

fig. 4 is a third schematic structural diagram of a high-voltage and high-current test clip provided in the present application;

fig. 5 is a schematic view of a fastening structure of an upper hook and a lower hook of the high-voltage high-current test clip provided in the present application.

The following are marked in the figure:

10. an upper splint; 20. a lower splint; 30. an upper terminal piece; 40. a lower terminal piece; 510. a guide groove; 520. a guide bar; 530. a pressure spring; 610. mounting blocks; 620. mounting a clamping hook; 630. and a lower hook.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings. It is to be understood that the embodiments described are only a few embodiments of the present invention, and not all embodiments.

Thus, the following detailed description of the embodiments of the utility model is not intended to limit the scope of the utility model as claimed, but is merely representative of some embodiments of the utility model. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

It should be noted that the embodiments of the present invention and the features and technical solutions thereof may be combined with each other without conflict.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.

In the description of the present invention, it should be noted that the terms "upper" and "lower" indicate the orientation or position relationship based on the orientation or position relationship shown in the drawings, or the orientation or position relationship which is usually placed when the utility model is used, or the orientation or position relationship which is usually understood by those skilled in the art, and these terms are only used for convenience of describing the present invention and simplifying the description, but do not indicate or imply that the device or element which is referred to must have a specific orientation, be constructed in a specific orientation and be operated, and therefore, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and the like are used merely to distinguish one description from another, and are not to be construed as indicating or implying relative importance.

As shown in fig. 1, 2, 3, 4 and 5, the present embodiment provides a high-voltage high-current test clip, which includes an upper plate 10, a lower plate 20 disposed below the upper plate 10, and a top plate 10

An upper terminal piece 30 detachably connected to one side of the upper plate 10 adjacent to the lower plate 20;

a lower terminal piece 40 disposed below the upper terminal piece 30 and detachably connected to one side of the lower clamping plate 20 close to the upper clamping plate 10;

the buffering support assembly is arranged between the upper clamping plate 10 and the lower clamping plate 20 and is used for keeping the distance between the upper clamping plate 10 and the lower clamping plate 20 in a non-working state;

the interference adjusting component is arranged at the mounting section of the lower clamping plate 20, and the adjusting end is movably connected with the upper clamping plate 10.

The buffering support assembly comprises a guide groove 510 formed in a clamping section of the upper clamping plate 10 and the lower clamping plate 20, a T-shaped guide rod 520 connected in the guide groove 510 in a sliding manner, and a pressure spring 530 connected between the upper clamping plate 10 and the lower clamping plate 20 and sleeved on the outer wall of the T-shaped guide rod 520.

The interference adjusting assembly includes symmetrically arranged mounting blocks 610 detachably coupled to the mounting section of the upper plate 10, and a latch assembly rotatably coupled between the mounting blocks 610.

The locking assembly comprises an upper hook 620 and a lower hook 630 which are rotatably connected between the mounting blocks 610, the connecting end of the upper hook 620 is movably connected with the upper clamp plate 10, and the upper hook 620 and the lower hook 630 are in alignment clamping.

The mounting end of the lower plate 20 is also provided with a slot matched with the clamping part of the lower hook 630.

Under the test state, the upper hook 620 and the lower hook 630 are aligned and engaged, and the connecting end of the upper hook 620 abuts against the upper clamp plate 10.

Specifically, this high-voltage heavy current test presss from both sides when during operation/use: separating the upper clamping hook 620 from the lower clamping hook 630, keeping a certain vertical distance between the upper clamping plate 10 and the lower clamping plate 20 under the action of the resilience force of the pressure spring 530, then sending a workpiece to be tested between the upper terminal piece 30 and the lower terminal piece 40 between the upper clamping plate 10 and the lower clamping plate 20, aligning and clamping the upper clamping hook 620 and the lower clamping hook 630, pressing the upper clamping plate 10 by the connecting end of the upper clamping hook 620, and keeping the clamping force of the upper clamping plate 10 and the lower clamping plate 20 on the tested workpiece, thereby completing clamping;

after the test is finished, the upper hook 620 is separated from the lower hook 630 in a manual assistance mode, the upper clamp plate 10 is separated from the lower clamp plate 20 under the effect of the resilience force of the pressure spring 530, and then the workpiece to be tested is taken out.

The above embodiments are only used for illustrating the utility model and not for limiting the technical solutions described in the utility model, and although the present invention has been described in detail in the present specification with reference to the above embodiments, the present invention is not limited to the above embodiments, and therefore, any modification or equivalent replacement of the present invention is made; all the technical solutions and modifications without departing from the spirit and scope of the present invention are within the scope of the claims of the present invention.

Claims

1. A high-voltage large-current test clamp comprises an upper clamp plate (10) and a lower clamp plate (20) arranged below the upper clamp plate (10), and is characterized by further comprising an upper terminal piece (30) detachably connected to one side, close to the lower clamp plate (20), of the upper clamp plate (10);

a lower terminal piece (40) which is arranged below the upper terminal piece (30) and is detachably connected to one side of the lower clamping plate (20) close to the upper clamping plate (10);

the buffer support assembly is arranged between the upper clamping plate (10) and the lower clamping plate (20) and is used for keeping the distance between the upper clamping plate (10) and the lower clamping plate (20) in a non-working state;

the abutting adjusting component is arranged at the mounting section of the lower clamping plate (20), and the adjusting end is movably connected with the upper clamping plate (10).

2. The high-voltage high-current test clamp according to claim 1, wherein the buffer support assembly comprises a guide groove (510) formed in the clamping section of the upper clamping plate (10) and the lower clamping plate (20), a T-shaped guide rod (520) slidably connected in the guide groove (510), and a compression spring (530) connected between the upper clamping plate (10) and the lower clamping plate (20) and sleeved on the outer wall of the T-shaped guide rod (520).

3. The high voltage high current test clip of claim 1, wherein said interference adjustment assembly comprises symmetrically disposed mounting blocks (610) removably attached to said mounting section of said upper clamping plate (10), and a latch assembly pivotally attached between said mounting blocks (610).

4. The high-voltage high-current test clip as claimed in claim 3, wherein the latching assembly comprises an upper latch (620) and a lower latch (630) rotatably connected between the mounting blocks (610), the connecting end of the upper latch (620) is movably connected to the upper clamping plate (10), and the upper latch (620) and the lower latch (630) are engaged in an aligned manner.

5. The high-voltage high-current test clip as claimed in claim 4, wherein the mounting end of the lower clip plate (20) is further provided with a slot for engaging with the engaging portion of the lower hook (630).

6. The clamp according to claim 5, wherein the upper hook (620) is engaged with the lower hook (630) in an aligned manner, and the connecting end of the upper hook (620) abuts against the upper clamp plate (10) in a testing state.