CN216251235U

CN216251235U - Spring probe

Info

Publication number: CN216251235U
Application number: CN202122830874.8U
Authority: CN
Inventors: 鹿梅
Original assignee: Shanghai Zhanqi Electronics Co ltd
Current assignee: Shanghai Zhanqi Electronics Co ltd
Priority date: 2021-11-12
Filing date: 2021-11-12
Publication date: 2022-04-08
Anticipated expiration: 2031-11-12

Abstract

The present invention provides a spring probe, comprising: the needle tube comprises a needle tube body and a needle body contraction part integrally formed on one axial side of the needle tube body; the upper needle head comprises a base and an upper needle head body arranged on one axial side of the base, the upper needle head body is used for contacting with a piece to be detected, and the base is clamped in an opening of the needle tube body, which is far away from the needle body contraction part; the spring is arranged in the needle tube body and is positioned between the needle body contraction part and the upper needle head. The three-piece spring probe provided by the utility model can reduce the processing difficulty of the needle body contraction part on the probe and reduce the material consumption; and in the process of large-scale production and test of the semiconductor chip, the overall cost is reduced.

Description

Spring probe

Technical Field

The utility model relates to the field of integrated circuit testing, in particular to a spring probe.

Background

With the rapid development of the semiconductor integrated circuit industry, the demand for spring probes for integrated circuit testing is also rapidly increasing. Spring probes used in the semiconductor testing field are generally composed of three or more components, and in order to meet the testing requirements of semiconductor integrated circuits for higher and higher signal rates, the overall dimension of the spring probe is shorter and shorter. With the probe length becoming shorter and shorter, a three-piece structure in which the upper needle and the needle tube are integrated is widely used, and a common three-piece spring probe is shown in fig. 1. The three-piece spring probe of fig. 1 is assembled from upper and lower needles and a spring. The upper needle head is contacted with the pins of the semiconductor chip and is used as a container to contain the spring and the lower needle head, and the spring and the lower needle head are limited in the container through a sealing curled edge at the tail end of the container. In use, the probes are mounted within the probe cavities of the test fixture, as shown in figure 2. When the clamp and the PCB are installed, the large-diameter part outside the upper needle container can not move upwards any more after contacting with the step of the probe cavity. So that the lower needle is compressed inwardly and pre-compressed after contacting the PCB. Such spring probes have two disadvantages: because the upper needle head is used as a container at the same time, unless the structure of the tip part of the upper needle head is simple, such as a cone, a semicircle and the like, can be finished by drilling a container hole firstly and then milling an outer contour, the turning and milling composite equipment needs to be provided with a back shaft, and the processing of the characteristics of the two sides of the top surface and the bottom surface can be finished only by the back shaft; secondly, in order to improve the overall electrical property of the probe, when a metal coating is added to the upper needle head, the condition that the plating solution cannot enter the blind hole is easy to happen due to the fact that the upper needle head container is of a blind hole structure, and therefore parts are scrapped.

Therefore, the utility model provides a novel three-piece spring probe, which can reduce the processing difficulty of the upper and lower needle heads of the probe and reduce the material consumption; and in the process of large-scale production and test of the semiconductor chip, the overall cost is reduced.

SUMMERY OF THE UTILITY MODEL

In view of the above disadvantages of the prior art, an object of the present invention is to provide a spring probe, which is used to solve the problems of the prior art that the spring probe is difficult to process and has high cost.

To achieve the above and other related objects, the present invention provides a spring probe, comprising:

the needle tube comprises a needle tube body and a needle body contraction part which is integrally formed on one axial side of the needle tube body.

Go up the syringe needle, including base and integrated into one piece in the last syringe needle body of base axial one side, go up the syringe needle body and be used for contacting with the piece that awaits measuring, the base card is located the needle tubing body is kept away from in the opening of needle body constriction part.

The spring is arranged in the needle tube body and is positioned between the needle body contraction part and the upper needle head.

Optionally, a small hole is formed in the central position of one side of the needle body contraction part away from the needle tube body.

Optionally, the shape of the needle body constriction includes a right angle constriction head, a tapered constriction head, or a pointed right angle constriction head.

Optionally, the outer diameter of the side, away from the needle tube body, of the needle body contraction part is smaller than the diameter of the needle tube body.

Optionally, a limiting protrusion is arranged in the middle of the upper needle body, the diameter of the protrusion is larger than the diameter of the needle tube body in the closed-up state, and the protrusion is located outside the needle tube body.

Optionally, the shape of the upper needle head comprises a crown head, a cone-shaped crown head, a cone head or a pyramid-shaped four-claw head.

Optionally, the piece to be tested is a chip.

Optionally, the outer diameter of the base is larger than the closing diameter of the needle tube body and smaller than the diameter of the needle tube body.

As described above, the spring probe according to the present invention has the following advantageous effects:

1. the processing difficulty of the upper needle head in the spring probe is reduced, complex processing equipment is not needed, and the processing cost of the upper needle head is reduced.

2. The needle body contraction part in the spring probe is formed by a tubular structure through a closing-in process, the closing-in action can be quickly completed through equipment during shape cutting, and the assembling work content of the probe can be reduced.

3. The small hole is reserved in the middle of the needle body contraction part in the spring probe, so that when a plating layer is added to the needle body contraction part integrated part, plating liquid can more easily enter the inside of a product.

Drawings

Fig. 1 shows a schematic diagram of a spring probe in the prior art.

Fig. 2 is a schematic diagram showing a state of use of a spring probe in the prior art.

Fig. 3 is a schematic diagram of the spring probe according to the present invention.

FIG. 4 is a side view of the right angle closing head structure of the needle retraction part of the spring probe according to the present invention.

FIG. 5 is a schematic cross-sectional view of a right-angle closing head structure of a needle body shrinking portion of a spring probe according to the present invention.

FIG. 6 is a side view of the tapered tip structure of the needle retraction portion of the spring probe of the present invention.

FIG. 7 is a schematic cross-sectional view of a tapered closing-in head structure of a needle body shrinkage part of a spring probe according to the present invention.

FIG. 8 is a side view of a needle retraction right angle pointed retraction head structure of a spring probe of the present invention.

FIG. 9 is a schematic cross-sectional view of a needle body retraction structure with a sharp tip for a spring probe according to the present invention.

Fig. 10 shows a top view of the upper crown head of the spring probe of the present invention.

Fig. 11 shows a perspective view of the upper crown head of the spring probe of the present invention.

Fig. 12 shows a side view of the upper crown head of the spring probe of the present invention.

Fig. 13 shows a top view of the conical crown head of the upper needle of the spring probe of the present invention.

Fig. 14 shows a perspective view of the conical crown head of the upper needle of the spring probe of the utility model.

Fig. 15 shows a side view of the conical crown head of the upper needle of the spring probe of the utility model.

Figure 16 shows a top view of the upper spike head of the spring probe of the present invention.

Figure 17 shows a perspective view of the upper spike head of the spring probe of the present invention.

Figure 18 shows a side view of the upper spike head of the spring probe of the present invention.

Fig. 19 shows a top view of the upper needle pyramid four-pronged tip of the spring probe of the present invention.

Fig. 20 is a perspective view of the pyramid-shaped four-prong upper tip of the spring probe of the present invention.

Fig. 21 shows a side view of the upper needle pyramid four-pronged head of the spring probe of the present invention.

FIG. 22 is a schematic view showing the use of the spring probe of the present invention.

Description of the element reference numerals

1 needle tube

11 needle tube body

12 needle body contraction part

2 upper needle

21 upper needle body

22 base

23 limiting bulge

3 spring

4 contact

5 PCB board

Detailed Description

The embodiments of the present invention are described below with reference to specific embodiments, and other advantages and effects of the present invention will be easily understood by those skilled in the art from the disclosure of the present specification. The utility model is capable of other and different embodiments and of being practiced or of being carried out in various ways, and its several details are capable of modification in various respects, all without departing from the spirit and scope of the present invention.

Please refer to fig. 3-22. It should be noted that the drawings provided in the present embodiment are only for illustrating the basic idea of the present invention, and the components related to the present invention are only shown in the drawings rather than drawn according to the number, shape and size of the components in actual implementation, and the type, quantity and proportion of the components in actual implementation may be changed freely, and the layout of the components may be more complicated.

As shown in fig. 3, the present embodiment provides a spring probe, including:

needle tube 1, upper needle 2 and spring 3.

As shown in fig. 3, the needle tube 1 includes a needle tube body 11 and a needle body contraction portion 12 on one axial side of the needle tube body 11.

Specifically, when the needle tube 1 is molded, one end of the needle tube is closed to form the needle body contraction part 12, so that the assembly work content of the probe can be reduced.

More specifically, in the present embodiment, the needle tube body 11 and the needle body contracting portion 12 are integrally formed. The shape of the needle body constriction 12 includes a right angle head (as shown in fig. 4 and 5), a tapered head (as shown in fig. 6 and 7), or a pointed right angle head (as shown in fig. 8 and 9), and other shapes that can form a good contact with the contact point may be applied to the present invention, which is not limited to this embodiment. The right-angle neck head and the pointed right-angle neck head are both provided with a platform which is vertically connected with the needle tube body 11, the axial surface of the right-angle neck head is vertically connected with the platform, and the diameters of the two axial ends of the right-angle neck head are the same; the axial surface of the sharp right-angle closing-in is connected with the platform in an obtuse angle, and the diameter of one end, far away from the needle tube body 11, of the right-angle sharp closing-in head is smaller than that of the other end of the needle tube body. The diameter of one end of the taper head connected with the needle tube body 11 is equal to that of the needle tube body 11, and the diameter of the other end is smaller than that of the needle tube body 11.

More specifically, the needle body contracting portion 12 has a through hole at an end thereof away from the needle tube body 11, so that the needle body contracting portion 12 is communicated with the needle tube body 11. When the needle tube 1 is coated, the solution can enter the interior of the needle tube 1 more easily.

As shown in fig. 3, the upper needle 2 includes a base 22 and an upper needle body 21 integrally formed on one axial side, and the upper needle body 21 is used for contacting with a to-be-tested object. The base 22 is clamped in the opening of the needle tube body far away from the needle body contraction part 12.

Specifically, go up syringe needle body 21 outer wall and be provided with a spacing arch 23, in this embodiment, spacing arch 23 encircles last syringe needle body 21 a week, forms a ring, the needle tubing 11 is kept away from the one end binding off of needle body shrink 12 is in spacing arch 23 with between the base 22, in the in-service use, can set up the arch that has limit function according to the circumstances, does not use this embodiment as the limit. The diameter of the limiting bulge 23 is larger than the closing diameter of the needle tube body 11, when the needle tube is in a pre-pressing state (as shown in fig. 4C, when the spring probe is in contact with the PCB), the limiting bulge 23 is in contact with the upper needle bed of the probe cavity, and the upper needle head 2 cannot move upwards continuously.

More specifically, the shape of the upper needle head includes, but is not limited to, a crown head (as shown in fig. 10-12), a cone-shaped crown head (as shown in fig. 13-15), a cone head (as shown in fig. 16-18), or a pyramid-shaped four-claw head (as shown in fig. 19-21), but is not limited to this embodiment, and other upper needle head shapes that can make good contact with the contact point may also be suitable for the present invention.

More specifically, when the spring probe is assembled, the end of the needle tube body 11 away from the needle body contraction part 12 clamps the base 22 inside the needle tube body 11 through a crimping closing-up; so that the upper needle 2 does not eject the needle cannula 1 in an untested state with the spring 3 fully deployed.

More specifically, the to-be-tested component is a to-be-tested component suitable for contact of a contact, such as a chip or a motherboard, and is not described herein in detail.

As shown in fig. 3, the spring 3 is disposed in the needle tube body 11 and located between the needle body contracting portion 12 and the upper needle head 2.

The working principle is as follows: as shown in fig. 22, the spring probe is installed in the probe cavity (a), and B is a cross-sectional view of the spring probe installed in the probe cavity. When testing, firstly, the pin body contraction part 12 of the spring probe contacts the PCB board 5, and the whole spring probe moves upwards due to the extrusion of the PCB board 5 until the limiting bulge 23 in the upper pin head 2 contacts the upper pin bed, which is in a pre-pressing state (C). Then, the contact with the contact 4 of the piece to be tested is started, the upper needle head 2 of the spring probe is pressed and contacted with the contact 4 of the piece to be tested by pressing, and the upper needle head 2 moves downwards until the test socket (semiconductor IC test seat) is closed, and the test state (D) is realized. Because the inner surface and the outer surface of the spring probe and the surfaces of the upper needle head 2 and the spring 3 are provided with the coatings, the electric conductivity is good, an electric connection loop is formed, and whether the function of the piece to be tested is normal can be tested.

In summary, the present invention provides a spring probe, comprising: the needle tube comprises a needle tube body and a needle body contraction part integrally formed on one axial side of the needle tube body; the upper needle head comprises a base and an upper needle head body integrally formed on one axial side, the upper needle head body is used for contacting with a piece to be detected, and the base is clamped in an opening of the needle tube body, which is far away from the contraction part of the needle body; the spring is arranged in the needle tube body and is positioned between the needle body contraction part and the upper needle head. The utility model reduces the processing difficulty of the upper needle head and the processing cost; secondly, the integrally formed needle body contraction part can reduce the assembly work content; and finally, the small holes are reserved on the contraction part of the needle body, so that plating solution can enter the interior more easily when a plating layer is added. Therefore, the utility model effectively overcomes various defects in the prior art and has high industrial utilization value.

The foregoing embodiments are merely illustrative of the principles and utilities of the present invention and are not intended to limit the utility model. Any person skilled in the art can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical spirit of the present invention be covered by the claims of the present invention.

Claims

1. A spring probe, characterized in that it comprises at least:

the needle tube comprises a needle tube body and a needle body contraction part at one axial side of the needle tube body;

the upper needle head comprises a base and an upper needle head body integrally formed on one axial side of the base, the upper needle head body is used for contacting with a piece to be detected, and the base is clamped in an opening of the needle tube body, which is far away from the contraction part of the needle body;

2. The spring probe of claim 1, wherein: one side of the needle body contraction part, which is far away from the needle tube body, is provided with a small hole.

3. The spring probe of claim 1, wherein: the shape of the needle body contraction part comprises a right-angle contraction head, a taper contraction head or a pointed right-angle contraction head.

4. The spring probe of claim 1, wherein: the outside diameter of one side of the needle body contraction part far away from the needle tube body is smaller than the diameter of the needle tube body.

5. The spring probe of claim 1, wherein: the outer wall of the upper needle body is provided with a limiting bulge, and the diameter of the limiting bulge is larger than the closing diameter of the needle tube body.

6. The spring probe of claim 1, wherein: the shape of the upper needle head comprises a crown head, a conical head or a pyramid-shaped four-claw head.

7. The spring probe of claim 1, wherein: the piece to be tested is a chip.

8. The spring probe of claim 1, wherein: the outer diameter of the base is larger than the diameter of the closing-in of the needle tube body and smaller than the diameter of the needle tube body.