CN216209662U - Test system for digital isolation chip - Google Patents
Test system for digital isolation chip Download PDFInfo
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- CN216209662U CN216209662U CN202122467711.8U CN202122467711U CN216209662U CN 216209662 U CN216209662 U CN 216209662U CN 202122467711 U CN202122467711 U CN 202122467711U CN 216209662 U CN216209662 U CN 216209662U
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Abstract
The utility model relates to the technical field of chip testing, and particularly discloses a testing system for a digital isolation chip, which comprises: the power supply conversion device is used for processing the power grid voltage in the primary power supply loop to obtain the test voltage required by the secondary power supply loop; the leakage signal testing device is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for detecting the leakage current value when the testing voltage in the secondary power supply loop is increased; the partial discharge signal testing device is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for detecting a discharge signal in the secondary power supply loop when the testing voltage is increased; and the pulse calibration device is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for sending a pulse signal to carry out calibration. The test system for the digital isolation chip provided by the utility model can realize the test of the partial discharge charge quantity and the isolation voltage of the digital isolation chip.
Description
Technical Field
The utility model relates to the technical field of chip testing, in particular to a testing system for a digital isolation chip.
Background
With the continuous expansion of the isolation application field, the digital isolation chip is gradually replacing the traditional optical coupler because of the obvious characteristics of small volume, high integration level, low power consumption, high communication speed and the like, and people have improved attention to the digital isolation chip. The digital isolation chip is a core device related to high voltage safety in a system, and has strict requirements on the factory test of the isolation chip, wherein the partial discharge charge amount and the isolation voltage are two key parameters of the chip, so how to accurately and reliably realize the test of the partial discharge charge amount and the isolation voltage of the digital isolation chip becomes a technical problem to be solved urgently by technical personnel in the field.
Disclosure of Invention
The utility model provides a test system for a digital isolation chip, which solves the problem that the test of the partial discharge charge quantity and the isolation voltage of the digital isolation chip cannot be reliably realized in the related technology.
As an aspect of the present invention, there is provided a test system for a digital isolated chip, comprising:
the power conversion device comprises a primary power circuit and a secondary power circuit, wherein the primary power circuit is used for connecting a power grid, the secondary power circuit is used for connecting a digital isolation chip to be tested, and the power conversion device is used for processing the voltage of the power grid in the primary power circuit to obtain the test voltage required by the secondary power circuit;
the leakage signal testing device is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for detecting the leakage current value of the secondary power supply loop when the testing voltage is increased;
the partial discharge signal testing device is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for detecting a discharge signal in the secondary power supply loop when the testing voltage is increased;
and the pulse calibration device is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for sending a pulse signal to carry out calibration.
Further, the power conversion apparatus includes:
the power supply module is connected to the primary power supply loop and used for filtering the power grid voltage in the primary power supply loop to obtain a steady voltage and regulating the voltage of the steady voltage;
the boosting module is respectively connected with the primary power supply loop and the secondary power supply loop and used for boosting the voltage subjected to voltage regulation processing to obtain the test voltage;
and the high-voltage detection module is connected to the secondary power supply loop, is electrically connected with the boosting module and is used for detecting the voltage value when the test voltage is boosted.
Further, the power supply module includes:
the alternating current filter is connected to the primary power supply loop and used for filtering the power grid voltage in the primary power supply loop to obtain a stable voltage;
and the voltage regulator is connected into the primary power supply loop, is electrically connected with the alternating current filter and is used for regulating the voltage of the stable voltage.
Further, the boosting module comprises a transformer, a primary winding of the transformer is connected with the primary power circuit, and a secondary winding of the transformer is connected with the secondary power circuit.
Further, the high voltage detection module includes:
the high-voltage detection equipment is electrically connected with the boosting module;
the two ends of the first resistor and the two ends of the second resistor after being connected in series are respectively connected with the two ends of the boosting module, and the connecting ends of the first resistor and the second resistor are connected with the high-voltage detection equipment.
Further, the leakage signal testing apparatus includes:
the secondary power supply comprises leakage detection equipment, a third resistor and a second capacitor, wherein the leakage detection equipment is connected with the boosting module, the third resistor is connected with the second capacitor in parallel and then connected into the secondary power supply loop, and the leakage detection equipment is respectively connected with the third resistor and the two ends of the second capacitor in parallel.
Further, the partial discharge signal detection apparatus includes:
the secondary power supply circuit comprises partial discharge detection equipment and a fourth resistor, wherein the fourth resistor is connected in the secondary power supply circuit, and two ends of the fourth resistor are connected with the partial discharge signal detection equipment.
Further, the secondary power supply circuit further includes:
and two ends of the first capacitor are respectively connected with two ends of the secondary power supply loop.
Further, the secondary power supply circuit further includes:
the third capacitor is connected with the fifth resistor in parallel and then connected to one end of the secondary power supply loop, and the sixth resistor is connected with the fourth capacitor in parallel and then connected to the other end of the secondary power supply loop.
According to the test system for the digital isolation chip, provided by the utility model, the partial discharge charge quantity can be effectively observed in real time through the partial discharge signal test device, the isolation voltage of the digital isolation chip to be tested can be accurately tested, the test of the highest 10KV high voltage and uA level leakage current is supported, the partial discharge charge quantity of the system under a certain high voltage is ensured to be less than 5pC, and the test system for the digital isolation chip has the advantages of safety and reliability.
Drawings
The accompanying drawings, which are included to provide a further understanding of the utility model and are incorporated in and constitute a part of this specification, illustrate embodiments of the utility model and together with the description serve to explain the principles of the utility model and not to limit the utility model. In the drawings:
fig. 1 is a block diagram of a test system for a digital isolated chip according to the present invention.
Fig. 2 is a specific operation schematic diagram of the test system for the digital isolation chip provided by the utility model.
Detailed Description
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict. The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged under appropriate circumstances in order to facilitate the description of the embodiments of the utility model herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
In this embodiment, a test system for a digital isolated chip is provided, and fig. 1 is a block diagram of a test system for a digital isolated chip according to an embodiment of the present invention, as shown in fig. 1, including:
the power conversion device 100 comprises a primary power circuit and a secondary power circuit, wherein the primary power circuit is used for connecting a power grid, the secondary power circuit is used for connecting a digital isolation chip to be tested, and the power conversion device 100 is used for processing the power grid voltage in the primary power circuit to obtain the test voltage required by the secondary power circuit;
the leakage signal testing device 200 is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for detecting the leakage current value of the secondary power supply loop when the testing voltage is increased;
the partial discharge signal testing device 300 is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for detecting a discharge signal in the secondary power supply loop when the testing voltage is increased;
and the pulse calibration device 400 is connected to the secondary power supply loop and is connected with the digital isolation chip to be tested, and is used for sending a pulse signal to calibrate.
It should be understood that before the test system works, the pulse calibration device sends out a pulse signal, and then the partial discharge signal test device performs test comparison to determine whether there is interference of other partial discharge signals, so that the test accuracy can be improved.
After determining that no other partial discharge signal is interfered, the power conversion device 100 provides a required test voltage by processing the alternating current of the power grid, and continuously changes the voltage values applied to the two ends of the digital isolation chip to be tested according to the test requirement, the leakage signal test device 200 detects whether the instantaneous abrupt current change exists in real time, if the instantaneous abrupt current change is not detected, the voltage parameter of the digital isolation chip to be tested is judged to be qualified, and if a large current is detected, the voltage resistance of the insulating layer of the digital isolation chip to be tested cannot bear the corresponding high voltage, namely the voltage parameter of the digital isolation chip to be tested is judged to be unqualified.
When a partial discharge detection test is performed, due to the high-frequency characteristic of partial discharge, a path completely different from a test leakage current is provided. When the test voltage continuously rises to reach the designed partial discharge test voltage and lasts for a certain time, at this time, if the test value of the partial discharge signal test device 300 is smaller than the preset threshold value, the partial discharge parameter of the digital isolation chip to be tested is judged to be qualified, and if the test value is not smaller than the preset threshold value, the partial discharge parameter of the digital isolation chip to be tested is judged to be unqualified.
Therefore, the test system for the digital isolation chip provided by the embodiment of the utility model can effectively observe the amount of partial discharge charge in real time through the partial discharge signal test device 300, accurately test the isolation voltage of the digital isolation chip to be tested, support the highest 10KV high voltage and uA level leakage current test, ensure that the amount of partial discharge charge of the system under a certain high voltage is less than 5pC, and have the advantages of safety and reliability.
Specifically, as shown in fig. 2, the power conversion apparatus 100 includes:
the power module 110 is connected to the primary power supply loop, and is configured to filter a power grid voltage in the primary power supply loop to obtain a steady voltage, and regulate the steady voltage;
the boosting module 120 is respectively connected with the primary power supply loop and the secondary power supply loop and is used for boosting the voltage subjected to voltage regulation processing to obtain the test voltage;
and the high-voltage detection module 130 is connected to the secondary power supply loop, is electrically connected with the boosting module, and is used for detecting the voltage value when the test voltage is boosted.
In an embodiment of the present invention, the power module 110 includes:
the alternating current filter 111 is connected to the primary power supply loop and used for filtering the power grid voltage in the primary power supply loop to obtain a stable voltage;
and the voltage regulator 112 is connected to the primary power supply loop, is electrically connected with the alternating current filter and is used for regulating the voltage of the stable voltage.
It should be appreciated that the ac filter 111 is capable of filtering the mains voltage and then obtaining a smooth band that enters the regulator 112 and is regulated for use in the secondary power loop.
Preferably, the ac filter 111 may be implemented by using an LB-200 model of tianan, tx, and the voltage regulator may be implemented by using a TDGC2-0.5KVA model of edy, zhejiang.
In the embodiment of the present invention, the boosting module 120 includes a transformer, a primary winding of the transformer is connected to the primary power circuit, and a secondary winding of the transformer is connected to the secondary power circuit.
Preferably, the transformer may specifically be a power frequency transformer without a partial discharge signal, and the transformer has a turn ratio of 50, is respectively connected to the primary power supply loop and the secondary power supply loop, and boosts the primary voltage for the secondary to use.
In an embodiment of the present invention, the high voltage detection module 130 includes:
a high voltage detection device 131 electrically connected to the boosting module 120;
the high-voltage detection device comprises a first resistor R1 and a second resistor R2, two ends of the first resistor R1 and two ends of the second resistor R2 after being connected in series are respectively connected with two ends of the boosting module 120, and the connection ends of the first resistor R1 and the second resistor R2 are connected with the high-voltage detection device 131.
It should be understood that the high voltage detection device is capable of detecting the voltage value after boosting.
Preferably, the high voltage detection device 131 may be implemented by a GYD-2006D product of tianan, nyzhou.
In the embodiment of the present invention, the leakage signal testing apparatus 200 includes:
It should be appreciated that the leakage detection device 210 is capable of detecting variations in leakage current throughout the test system as voltage increases.
In the embodiment of the present invention, the partial discharge signal detection apparatus 300 includes:
a partial discharge detection device 310 and a fourth resistor R4, wherein the fourth resistor R4 is connected in the secondary power supply loop, and both ends of the fourth resistor R4 are connected with the partial discharge signal detection device 310.
Preferably, the partial discharge signal detection apparatus 300 comprises a partial discharge detection device 310 and an impedance of less than 1ohm, and is connected to the secondary power circuit for detecting the partial discharge signal test of the whole system with the increasing voltage.
Preferably, the partial discharge detection device 310 may be implemented by a JFD-2006D model of tianan, nyzhou.
In the embodiment of the present invention, the pulse calibration apparatus 400 can emit a pulse signal of 0-50 pC.
Preferably, the pulse calibration device 400 may be implemented by using model JZF-10 of Tianan, Yangzhou.
Preferably, the secondary power supply circuit further comprises:
and two ends of the first capacitor C1 are respectively connected with two ends of the secondary power supply loop.
Preferably, the secondary power supply circuit further comprises:
the secondary power supply circuit comprises a fifth resistor R5, a sixth resistor R6, a third capacitor C3 and a fourth capacitor C4, wherein the third capacitor C3 is connected with the fifth resistor R5 in parallel and then connected to one end of the secondary power supply circuit, and the sixth resistor R6 is connected with the fourth capacitor C4 in parallel and then connected to the other end of the secondary power supply circuit.
Before the system works normally, a pulse signal of 0-50pC is added to the pulse calibration device 400 and is tested by the partial discharge detection equipment 310, the test value is compared with the added pulse value, and if the values are consistent, the system is powered on.
The whole system loop is connected with two 50M omega resistors (R5 and R6) in series, and the current is limited in the whole loop under high voltage, so that personal safety is guaranteed. When the digital isolation chip U1 to be tested is connected to a secondary power supply loop and isolation voltage testing is carried out, the power supply module 110 provides alternating current of 0-220V and 50/60Hz, the alternating current is boosted to high voltage through a transformer, the voltage value is monitored in real time through the high-voltage detection module 130 divided by two resistors (R1 and R2), the voltage value is continuously changed and added to the two ends of the digital isolation chip U1 to be tested according to testing requirements, the leakage detection equipment 210 detects the voltage generated by the leakage current flowing through the resistor (R3) in real time, and when the input voltage continuously rises to reach the designed isolation voltage and lasts for a certain time, the leakage detection equipment 210 judges that the isolation voltage parameter of the digital isolation chip U1 to be tested is qualified if the instantaneous abrupt current change is not tested; if a large current is tested, the withstand voltage of the insulation layer of the digital isolation chip U1 to be tested cannot bear a corresponding high voltage, and the isolation voltage parameter of the digital isolation chip U1 to be tested is judged to be unqualified.
When a partial discharge detection test is carried out, due to the high-frequency characteristic of partial discharge, a path which is completely different from a test leakage current is formed; by utilizing the characteristic of high frequency resistance and low frequency resistance of the capacitor, the current passes through the loops of C4, C3, R4, C2 and C1 and does not pass through a leakage detection test loop, so that the test accuracy is ensured; when the input voltage continuously rises to reach the design partial discharge test voltage and lasts for a certain time, if the test value of the partial discharge detection equipment 310 is smaller than 5pC, the partial discharge parameter of the digital isolation chip U1 to be tested is judged to be qualified; and if the test value is greater than 5pC, judging that the partial discharge parameter of the digital isolation chip U1 to be tested is unqualified.
It will be understood that the above embodiments are merely exemplary embodiments taken to illustrate the principles of the present invention, which is not limited thereto. It will be apparent to those skilled in the art that various modifications and improvements can be made without departing from the spirit and substance of the utility model, and these modifications and improvements are also considered to be within the scope of the utility model.
Claims (9)
1. A test system for a digital isolated chip, comprising:
the power conversion device comprises a primary power circuit and a secondary power circuit, wherein the primary power circuit is used for connecting a power grid, the secondary power circuit is used for connecting a digital isolation chip to be tested, and the power conversion device is used for processing the voltage of the power grid in the primary power circuit to obtain the test voltage required by the secondary power circuit;
the leakage signal testing device is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for detecting the leakage current value of the secondary power supply loop when the testing voltage is increased;
the partial discharge signal testing device is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for detecting a discharge signal in the secondary power supply loop when the testing voltage is increased;
and the pulse calibration device is connected to the secondary power supply loop, is connected with the digital isolation chip to be tested, and is used for sending a pulse signal to carry out calibration.
2. The test system for the digital isolator chip as claimed in claim 1, wherein the power conversion apparatus comprises:
the power supply module is connected to the primary power supply loop and used for filtering the power grid voltage in the primary power supply loop to obtain a steady voltage and regulating the voltage of the steady voltage;
the boosting module is respectively connected with the primary power supply loop and the secondary power supply loop and used for boosting the voltage subjected to voltage regulation processing to obtain the test voltage;
and the high-voltage detection module is connected to the secondary power supply loop, is electrically connected with the boosting module and is used for detecting the voltage value when the test voltage is boosted.
3. The test system for the digital isolated chip according to claim 2, wherein the power supply module comprises:
the alternating current filter is connected to the primary power supply loop and used for filtering the power grid voltage in the primary power supply loop to obtain a stable voltage;
and the voltage regulator is connected into the primary power supply loop, is electrically connected with the alternating current filter and is used for regulating the voltage of the stable voltage.
4. The test system for the digital isolation chip as claimed in claim 2, wherein the voltage boosting module comprises a transformer, a primary winding of the transformer is connected with the primary power loop, and a secondary winding of the transformer is connected with the secondary power loop.
5. The test system for the digital isolator chip as claimed in claim 2, wherein the high voltage detection module comprises:
the high-voltage detection equipment is electrically connected with the boosting module;
the two ends of the first resistor and the two ends of the second resistor after being connected in series are respectively connected with the two ends of the boosting module, and the connecting ends of the first resistor and the second resistor are connected with the high-voltage detection equipment.
6. The test system for the digital isolator chip as set forth in claim 2, wherein said leakage signal test means comprises:
the secondary power supply comprises leakage detection equipment, a third resistor and a second capacitor, wherein the leakage detection equipment is connected with the boosting module, the third resistor is connected with the second capacitor in parallel and then connected into the secondary power supply loop, and the leakage detection equipment is respectively connected with the third resistor and the two ends of the second capacitor in parallel.
7. The test system for the digital isolator chip according to any one of claims 1 to 5, wherein the partial discharge signal detection apparatus comprises:
the secondary power supply circuit comprises partial discharge detection equipment and a fourth resistor, wherein the fourth resistor is connected in the secondary power supply circuit, and two ends of the fourth resistor are connected with the partial discharge signal detection equipment.
8. The test system for the digital isolated chip according to any of the claims 1 to 5, wherein the secondary power supply loop further comprises:
and two ends of the first capacitor are respectively connected with two ends of the secondary power supply loop.
9. The test system for the digital isolated chip according to any of the claims 1 to 5, wherein the secondary power supply loop further comprises:
the third capacitor is connected with the fifth resistor in parallel and then connected to one end of the secondary power supply loop, and the sixth resistor is connected with the fourth capacitor in parallel and then connected to the other end of the secondary power supply loop.
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| CN202122467711.8U CN216209662U (en) | 2021-10-13 | 2021-10-13 | Test system for digital isolation chip |
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| CN202122467711.8U CN216209662U (en) | 2021-10-13 | 2021-10-13 | Test system for digital isolation chip |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117054861A (en) * | 2023-10-12 | 2023-11-14 | 苏州四方杰芯电子科技有限公司 | Isolation test method for multichannel digital isolation chip |
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2021
- 2021-10-13 CN CN202122467711.8U patent/CN216209662U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117054861A (en) * | 2023-10-12 | 2023-11-14 | 苏州四方杰芯电子科技有限公司 | Isolation test method for multichannel digital isolation chip |
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