CN216209307U

CN216209307U - Sensor test fixture

Info

Publication number: CN216209307U
Application number: CN202122526256.4U
Authority: CN
Inventors: 魏波; 张国良; 王贵松; 王鑫
Original assignee: Chengdu Wanchuang Technology Co ltd
Current assignee: Chengdu Wanchuang Technology Co ltd
Priority date: 2021-10-20
Filing date: 2021-10-20
Publication date: 2022-04-05
Anticipated expiration: 2031-10-20

Abstract

The utility model relates to the technical field of sensor testing, and discloses a sensor testing jig which comprises a circuit board, wherein a micro-processing chip, an expansion chip, a power supply module, a display module and a plurality of IC testing seats are arranged on the circuit board, the micro-processing chip and the expansion chip are connected with the power supply module, the IC testing seats are connected with the micro-processing chip through the expansion chip, the display module is connected with the micro-processing chip, and the IC testing seats are used for placing a sensor to be tested. The sensor testing jig can test a plurality of sensors simultaneously, can quickly acquire the testing result of the sensor to be tested, does not need the participation of an upper computer and the installation of professional testing software, has a compact structure, is convenient to carry, can test in real time, has low testing cost, and is particularly suitable for testing and acceptance when the sensors are purchased in batches and recycled in the market.

Description

Sensor test fixture

Technical Field

The utility model relates to the technical field of sensor testing, in particular to a sensor testing jig.

Background

The existing test jig has low test efficiency, cannot realize simultaneous test on a plurality of triaxial acceleration sensors, and a special test platform is complex and clumsy, needs an upper computer to participate and needs to install special test software, is inconvenient to carry, has slow test result and high test cost.

Current triaxial acceleration sensor's market demand is big, but the condition that the old material renovated is serious, triaxial acceleration sensor's quality is difficult to guarantee, when buying in a large number or retrieving triaxial acceleration sensor in market, need carry out a large amount of tests and acquire the test result fast, and need carry test fixture and be used for going out the purchase, so current test fixture is difficult to satisfy the user demand, and the urgent need is a more practical test fixture is used for the sensor test on the market.

SUMMERY OF THE UTILITY MODEL

The utility model aims to: to the test fixture among the prior art, can't test a plurality of triaxial acceleration sensor simultaneously, there is the test cost high, it is difficult to carry, the test needs the host computer to participate in and installs special test software, the test result is slow scheduling problem, a sensor test fixture is provided, can test a plurality of sensors simultaneously, and can acquire the test result of the sensor that awaits measuring fast, need not the participation of host computer and the installation of professional test software, and is convenient for carry, can real-time test and test cost are low, especially, be applicable to on the market to the sensor and purchase in batches and the test acceptance when retrieving.

In order to achieve the purpose, the utility model adopts the technical scheme that:

the utility model provides a sensor test fixture, includes the circuit board, be equipped with microprocessor chip, extension chip, power module, display module and a plurality of IC test seat on the circuit board, microprocessor chip with the extension chip all with power module connects, a plurality of the IC test seat passes through the extension chip with microprocessor chip connects, display module with microprocessor chip connects, the IC test seat is used for placing the sensor that awaits measuring.

The power module can provide the required power of each chip normal work on the circuit board, the extension chip can be right the bus channel of micro-processing chip expands and selects, realizes discerning simultaneously and testing a plurality of sensors, micro-processing chip is the same on the test principle of sensor with present host computer software, display module is used for showing micro-processing chip's test result, just display module can correspond the state that shows sensor in every IC test seat. The sensor testing jig can test a plurality of sensors simultaneously, can quickly acquire the testing result of the sensor to be tested, does not need the participation of an upper computer and the installation of professional testing software, has a compact structure, is convenient to carry, can test in real time, has low testing cost, and is particularly suitable for testing and acceptance when the sensors are purchased in batches and recycled in the market.

Preferably, the display module is an LED lamp, and each IC test socket corresponds to the LED lamp.

The test result of the micro-processing chip is displayed through the LED lamp, so that the display of the test result is visual and simple, whether the sensor to be tested fails or not can be determined simply and clearly, and each IC test seat corresponds to the LED lamp, a plurality of sensors tested simultaneously can be judged and screened rapidly, and the test efficiency is improved.

Preferably, the power module is connected with a power interface.

Power source can regard as power module's the mouth that charges or as test fixture's power supply mouth carries test fixture when going out, is convenient for supply power at any time and carries out work, and has reduced power module's electric quantity demand, the trip of being convenient for, like the inspection requirement that electric capacity satisfies the air transportation.

Preferably, the power interface is a Type-C interface. The Type-C interface is strong in universality and good in practicability.

Preferably, a first switch is further arranged between the power interface and the power module.

The first switch serves as a power switch and is used for power management of the test fixture, and convenience in operation of turning on or off equipment and replacing the sensor is improved.

Preferably, the reset control end of the micro-processing chip is connected with a second switch, and the second switch is grounded.

The second switch is used as a reset switch to reset the micro-processing chip at a low level, so that repeated testing of the sensor can be realized without turning off the power supply of the testing jig, and the testing efficiency is improved.

Preferably, the model of the microprocessor chip is MCU STM32F, and the model of the expansion chip is SwitchPCA 9848.

Preferably, the IC test socket comprises a placing table and a top cover, wherein a test slot and the top cover are arranged on the placing table, the top cover can seal the test slot, and the test slot is adapted to a sensor to be tested.

The size of the test slot can accommodate the test part of the sensor to be tested, the top cover and the test slot can provide a closed space for placing the sensor to be tested, so that a stable test environment is provided, the accuracy of a test result is improved, and meanwhile, the sensor to be tested has a protection effect.

Preferably, the test groove is internally provided with a test needle which penetrates through the placing table and then is connected with the expansion chip, the top cover is provided with a pressing block, the pressing block is connected with the top cover through a first spring, and the pressing block is used for pressing the sensor to be tested.

The micro-processing chip passes through the test needle tests, the installation of test needle is simple reliable, and the test connection is stable, the briquetting be used for press the sensor with the contact of test needle guarantees after the top cap is closed, the butt can be stabilized to the sensor that awaits measuring and be fixed in the test needle top, the spring makes the effort of briquetting is pressed for elasticity, avoids the rigidity to press the risk of easily direct damage sensor.

Preferably, one side of the top cover is hinged to one side of the placing table, a hook is arranged on the opposite side of the top cover, a second spring is fixed between the hook and the top cover, and a clamping shaft is arranged on the opposite side of the placing table and used for fixing the hook.

The one end of top cap with it is articulated fixed to place the platform, then only need pass through the swing of top cap is realized opening and closed operation, the top cap passes through the pothook with the joint cooperation of card axle is closed fixed, and easy operation is swift, the spring is used for pressing the pothook breaks away from the card axle is easily in open the operation after the top cap is closed fixed.

Preferably, the bottom of the placing table is also provided with a protruding positioning pin. The positioning pin is convenient for the installation and the positioning of the IC test seat.

Preferably, the placing table is fixed with the circuit board through screws.

The test fixture needs to continuously carry out a large number of tests, the IC test seat needs to be periodically replaced due to test loss, and compared with the IC test seat fixed by welding at present, the IC test seat is fixed on the circuit board through screws, so that the replacement and installation of the IC test seat are facilitated, and the use convenience of the test fixture is improved.

In summary, due to the adoption of the technical scheme, the utility model has the beneficial effects that:

1. the sensor testing jig can test a plurality of sensors simultaneously, can quickly acquire the testing result of the sensor to be tested, does not need the participation of an upper computer and the installation of professional testing software, has compact structure, is convenient to carry, can test in real time and has low testing cost, and is particularly suitable for testing and acceptance when the sensors are purchased and recycled in batches in the market;

2. through the display design of the LED lamp, the display of the test result is visual and simple, whether the sensor to be tested breaks down or not can be simply and clearly determined, the sensors which are tested at the same time can be rapidly judged and screened, and the test efficiency is improved;

3. through the structural design of the IC test seat, a stable test environment is provided, the accuracy of a test result is improved, meanwhile, the protection effect on a sensor to be tested is realized, the replacement and installation of the IC test seat are convenient, and the practicability is enhanced;

4. the sensor testing jig disclosed by the utility model is simple to operate, high in testing efficiency, safe in testing process and reliable in testing result, has both economical efficiency and practicability, and has great popularization value in practical application in the market.

Drawings

FIG. 1 is a front view of a sensor testing fixture according to an embodiment;

FIG. 2 is a perspective view of a sensor testing fixture according to an embodiment;

FIG. 3 is a circuit diagram of a sensor testing fixture according to an embodiment;

FIG. 4 is a perspective view of an IC test socket according to an embodiment;

FIG. 5 is a schematic cross-sectional view of an embodiment of an IC test socket in open and closed positions;

FIG. 6 is a flow chart of a test of a sensor testing fixture according to an embodiment;

the labels in the figure are: 1-circuit board, 2-IC test seat, 21-top cover, 22-placing table, 23-test groove, 24-test needle, 25-pressing block, 26-spring I, 27-clamping hook, 28-clamping shaft, 29-spring II, 3-micro-processing chip, 4-expansion chip, 5-power module, 6-LED lamp, 7-power interface, 8-switch I, 9-switch II, 10-positioning pin and 11-sensor.

Detailed Description

The present invention will be described in detail below with reference to the accompanying drawings.

For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, the present invention will be further described in detail with reference to the accompanying drawings and embodiments, it being understood that the specific embodiments described herein are only for the purpose of explaining the present invention and are not intended to limit the present invention.

Examples

As shown in fig. 1-3, the sensor testing jig of the present invention includes a circuit board 1, the circuit board 1 is provided with a microprocessor chip 3, an expansion chip 4, a power module 5, a display module and a plurality of IC testing seats 2, the microprocessor chip 3 and the expansion chip 4 are both connected to the power module 5, the plurality of IC testing seats 2 are connected to the microprocessor chip 3 through the expansion chip 4, the display module is connected to the microprocessor chip 3, and the IC testing seats 2 are used for placing a sensor 11 to be tested.

In the embodiment, when purchasing is required in the market, whether the triaxial acceleration sensor is damaged or not is mainly tested, so that the performances of the triaxial acceleration sensor, such as precision, sensitivity and the like, do not need to be tested in detail and comprehensively as in the factory manufacture, and complicated human-computer interaction test is not needed, so that the micro-processing chip 3 is tested by replacing upper computer software;

power module 5 still is connected with power source 7 and is used for the power supply, the Type-C interface that power source 7 chooseed for use, still be equipped with Switch 8 between Type-C interface and power module 5, the model that microprocessor chip 3 chooseed for use is MCU STM32F, the model that extension chip 4 chooseed for use is Switch PCA9848, the extension chip 4 of this model can be with eight passageways of bus channel extension, LED lamp 6 that display module chooseed for use, microprocessor chip 3 is connected with eight IC test sockets 2 respectively through extension chip 4, microprocessor chip 3 also is connected with eight LED lamps 6 simultaneously, every IC test socket 2 all corresponds an LED lamp 6 and shows the test result, the reset control end at microprocessor chip 3 still is connected with reset Switch two 9, reset Switch two 9's other end ground connection.

As shown in fig. 4 and 5, the IC test socket 2 includes a placing table 22 and a top cover 21, the size of the top cover 21 is equivalent to the size of the placing table 22, the top cover 21 is hinged to the placing table 22 at one side by a pin, the top cover 21 swings around the pin, the opened and closed states of IC test socket 2 can be changed with respect to placing table 22, top cover 21 is fixed to placing table 22 by snap-fitting at the opposite side, top cover 21 is provided with hook 27 at the opposite side, placing table 22 is provided with latch shaft 28 at the opposite side, when the top cover 21 completely covers the placing table 22, the hook 27 can be clamped just below the clamping shaft 28, thereby realizing that the IC test seat 2 is kept fixed after being closed, a second spring 29 is connected between the hook 27 and the top cover 21, the connecting part of the hook 27 and the second spring 29 is pressed, so that the hook 27 can be further pressed and deflected, and is separated from the restraint of the clamping shaft 28, and the top cover 21 can be conveniently opened;

a test slot 23 is further arranged at the center of the placing table 22, the size of the test slot 23 can accommodate the test part of the triaxial acceleration sensor 11 to be tested, a test needle 24 is installed in the test slot 23, the test needle 24 penetrates through the placing table 22 and is electrically contacted with the circuit board 1, so that the micro-processing chip 3 can test the triaxial acceleration sensor 11 through the circuit of the circuit board 1, the central position of the top cover 21 is provided with a pressing block 25, the size of the bottom surface of the pressing block 25 is equivalent to the size of the triaxial acceleration sensor 11 to be tested, when the IC test seat 2 is closed, the pressing block 25 of the top cover 21 can press the triaxial acceleration sensor 11 to be stably contacted with the test needle 24, and the pressing block 25 is fixed on the top cover 21 through the first spring 26, the pressing block 25 applies elastic pressure to the triaxial acceleration sensor 11, so that the pressing damage is not easily caused while the stable test is kept;

the bottom of placing platform 22 still is equipped with two convex locating pins 10, and circuit board 1 has the locating hole of IC test seat 2 correspondingly, and IC test seat 2 is through the fix with screw on circuit board 1, and when regularly changing IC test seat 2, only need open top cap 21 back, twist the screw and can pull down IC test seat 2, then can install new IC test seat 2 fast through locating pin 10 location and with the fix with screw can.

As shown in fig. 6, during testing, eight to-be-tested triaxial acceleration sensors 11 may be placed on the placing tables 22 of the eight IC test seats 2, and a part of the to-be-tested triaxial acceleration sensor 11, which contains a test point, is placed in the test slot 23 and contacts the test pin 24, then the top covers 21 of all the IC test seats 2 are closed, and the hooks 27 are clamped below the clamp shafts 28 to form a fixed state, and the pressing block 25 gradually presses the triaxial acceleration sensor 11 to make it stably contact with the test pin 24 in the closing process;

the first switch 8 is closed to be powered on, the micro-processing chip 3 synchronously tests the three-axis acceleration sensors 11 in the eight IC test seats 2 through the expansion chip 4, firstly, the addresses of the three-axis acceleration are identified, if the addresses of the three-axis acceleration sensors 11 in a certain IC test seat 2 are identified to be passed, the corresponding LED lamp 6 is lightened and continues for 3S, if the addresses are identified to be failed, the three-axis acceleration sensors 11 of the IC test seat 2 are unqualified in test, and can be directly replaced to wait for the next round of synchronous test;

after the address test is finished, checking and ensuring that the test fixture is horizontally placed, determining the X, Y, Z three-sensitive-axis zero point of the three-axis acceleration sensor 11, then continuously testing the three-axis acceleration sensor 11 passing the address identification by the micro-processing chip 3, sequentially testing the X-axis, the Y-axis and the Z-axis of the three-axis acceleration sensor 11, totaling three times of test, wherein each time of test is passed, the corresponding LED lamp 6 flickers once every 200ms, and is turned off after 2S of test duration, if any one of the three times of test is not passed, namely the LED lamp 6 does not flicker and display, or does not complete 2S of flicker for three times, the test is unqualified, and if all the three times of test are passed, namely the LED lamp 6 flickers and displays for 2S for three times, the three-axis acceleration sensor 11 in the IC test socket 2 corresponding to the LED lamp 6 is tested to be qualified;

and (3) replacing the triaxial acceleration sensors 11 which finish the test in the IC test seat 2, preparing to perform the next round of synchronous test, simultaneously, when the address identification fails, entering the next round of test by the triaxial acceleration sensors 11 which are replaced in advance, pressing the second switch 9 to reset the micro-processing chip 3 after the triaxial acceleration sensors 11 of all the IC test seats 2 are replaced, immediately disconnecting the second switch 9, finishing the initialization work, and then circularly entering the next round of test.

In the process of testing the X axis, the Y axis and the Z axis of the triaxial acceleration sensor 11, the reason that the test is unqualified can be further analyzed, and if the LED lamp 6 does not flicker, the X axis test of the triaxial acceleration sensor 11 corresponding to the test is not passed; if the LED lamp 6 flashes for 2S only once, it indicates that the X-axis test of the corresponding tested triaxial acceleration sensor 11 passes, but the Y-axis test does not pass, and if the LED lamp 6 flashes for 2S only twice, it indicates that the corresponding tested triaxial acceleration sensor 11 only fails in the Z-axis test.

In this embodiment, if the test fixture needs to test more IC test sockets 2 synchronously, the model of the expansion chip 4 capable of expanding more channels may be selected, or a plurality of expansion chips 4 are used to expand the bus channel at the same time;

when the X-axis, the Y-axis and the Z-axis of the three-axis acceleration sensor 11 are tested, the interval time of each test can be set as required, and if the next test is performed at the interval of 3S, after the LED finishes one 2S continuous flashing, the next test is passed, and then the 3S continuous 2S flashing is finished again at the interval of 3S; meanwhile, the flashing frequency and duration of the LED lamp 6 can also be adjusted according to requirements.

And a plurality of LED lamps can be used for displaying corresponding to each IC test seat, for example, each IC test seat has two red and green LED lamps for displaying test results, the green LED lamps display that the test is passed, and the red LED lamps display that the test is not passed.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the utility model, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.

Claims

1. The utility model provides a sensor test fixture, its characterized in that, includes circuit board (1), be equipped with microprocessor chip (3), extension chip (4), power module (5), display module and a plurality of IC test seat (2) on circuit board (1), microprocessor chip (3) with extension chip (4) all with power module (5) are connected, a plurality of IC test seat (2) pass through extension chip (4) with microprocessor chip (3) are connected, display module with microprocessor chip (3) are connected, IC test seat (2) are used for placing sensor (11) that await measuring.

2. The fixture for testing sensors according to claim 1, wherein the display module is an LED lamp (6), and each IC testing socket (2) corresponds to the LED lamp (6).

3. A sensor testing jig according to claim 1 characterized in that the power module (5) is connected with a power interface (7).

4. A tool according to claim 3, wherein a first switch (8) is further provided between the power interface (7) and the power module (5).

5. The fixture for testing the sensor according to claim 1, wherein a second switch (9) is connected to the reset control end of the microprocessor chip (3), and the second switch (9) is grounded.

6. The sensor testing jig according to claim 1, characterized in that the model of the microprocessor chip (3) is MCU STM32F, and the model of the expansion chip (4) is Switch PCA 9848.

7. The sensor testing fixture according to any one of claims 1 to 6, wherein the IC testing socket (2) comprises a placing table (22) and a top cover (21), a test slot (23) and the top cover (21) are arranged on the placing table (22), the top cover (21) can seal the test slot (23), and the test slot (23) is adapted to a sensor (11) to be tested.

8. The sensor testing jig according to claim 7, wherein a testing needle (24) is arranged in the testing slot (23), the testing needle (24) penetrates through the placing table (22) and then is connected with the expansion chip (4), the top cover (21) is provided with a pressing block (25), the pressing block (25) is connected with the top cover (21) through a first spring (26), and the pressing block (25) is used for pressing the sensor (11) to be tested.

9. The sensor testing jig according to claim 7, wherein one side of the top cover (21) is hinged to one side of the placing table (22), a hook (27) is arranged on the opposite side of the top cover (21), a second spring (29) is fixed between the hook (27) and the top cover (21), and a clamping shaft (28) is arranged on the opposite side of the placing table (22), and the clamping shaft (28) is used for fixing the hook (27).

10. The fixture for testing sensors according to claim 7, wherein the placing table (22) is screwed to the circuit board (1).