CN216117714U - Testing device for chip component - Google Patents

Abstract

The utility model provides a testing device for a sheet element, which comprises an insulating seat, a positioning groove arranged on the insulating seat, a support arranged at intervals with the insulating seat, a needle seat arranged on the support in a vertically sliding manner, a testing probe vertically penetrating through the needle seat, a testing tool connected with the testing probe through a lead, a rotating wheel rotatably arranged on the support, a crank with two ends respectively rotatably connected between the rotating wheel and the needle seat and a limiting mechanism arranged on the rotating wheel, wherein the sheet element is arranged in the positioning groove, the needle seat is positioned above the positioning groove, the needle seat is driven by the crank to slide vertically when the rotating wheel rotates, the limiting mechanism limits the sliding stroke of the needle seat, and when the needle seat slides to the lowest end, the testing probe is contacted with an electrode of the sheet element, so that the testing can be carried out. The utility model can conveniently test the chip element and effectively improve the test accuracy and the test efficiency.

Description

Testing device for chip component

Technical Field

The utility model relates to a testing device for chip components.

Background

During the production and manufacturing process of the chip thick film fixed resistor, the resistance value of a product needs to be tested, the pass percent and the quality consistency of the product are ensured according to the resistance value test data of the resistor, and the low-resistance resistor test is easily influenced by external factors. The existing testing method is to use a pincerlike testing clamp to test manually, has higher requirements on an operation method, is easy to cause poor contact and drift resistance when too light force is applied, and is easy to clamp a product and leave testing traces when too strong force is applied. For the resistor with smaller size, the operation difficulty is higher, repeated clamping and testing are often required, the clamping is easy to be misplaced, and even the product is clamped to fly, so that the testing speed is lower and the rejection rate of the product is higher. Moreover, the product is constantly put to the clamp in the test process, and product lower surface and workstation surface friction lead to product surface position wearing and tearing seriously, influence product appearance. Finally, in the testing process, the testing method and the testing strength of each person cannot be unified, and in the long-time continuous testing, the testing personnel cannot guarantee that the testing can be carried out with stable strength all the time, which may also influence the reliability of the testing. Therefore, the conventional test method has a great defect for testing the low-resistance resistor.

SUMMERY OF THE UTILITY MODEL

The utility model provides a testing device for a chip component, which can conveniently test the chip component and effectively improve the testing accuracy and the testing efficiency.

The utility model is realized by the following technical scheme:

the utility model provides a testing arrangement for piece formula component, including insulating seat, the constant head tank of setting on insulating seat, with the support of insulating seat interval arrangement, can set up the needle file on the support with sliding from top to bottom, run through the test probe that the needle file set up from top to bottom, through the testing tool of lead wire and test probe connection, rotationally set up the rotation wheel on the support, both ends are rotationally connected respectively and are rotated the crank between wheel and the needle file and set up the stop gear on rotating the wheel, piece formula component is placed in the constant head tank, the needle file is located the constant head tank top, it slides from top to bottom to drive the needle file through the crank when rotating the wheel, stop gear limits the slip stroke of needle file, when the needle file slides to the bottom, the electrode contact of test probe and piece formula component, can test.

Further, the insulating seat is made of polytetrafluoroethylene materials.

Furthermore, the support includes the montant that sets up with the insulating seat interval and sets up the horizontal pole in the montant upper end, the rotating wheel is the eccentric wheel that sets up at the horizontal pole tip.

Further, the needle file includes two risers, upper and lower interval setting upper needle seat and the lower needle seat between two risers of interval arrangement, and a riser can be connected with the support with sliding from top to bottom, the crank lower extreme rotationally sets up on another riser, and the test probe passes through upper and lower needle seat arrangement from top to bottom, the lead wire lower extreme is fixed on the test probe, and the upper end extends the upper needle seat and is connected with the testing tool.

Further, still be provided with feedstock channel and discharging channel on the insulating seat, feedstock channel is for setting up at the insulating seat upper surface and with the first recess of constant head tank intercommunication, and first recess is the loudspeaker form, and the one end opening of keeping away from the constant head tank is bigger, and discharging channel is including setting up at the insulating seat upper surface and second recess and the third recess with the constant head tank intercommunication respectively.

Further, still include metal base, insulating seat and support all set up on metal base.

Furthermore, the limiting mechanism comprises a protruding block arranged on the rotating wheel.

Furthermore, the test probe comprises a needle tube, a needle point arranged at the lower end of the needle tube, a baffle arranged in the needle tube and a spring vertically arranged between the baffle and the needle point.

Furthermore, a handle is further arranged on the rotating wheel.

Furthermore, the upper needle seat and the lower needle seat are respectively provided with four through holes for the test probes to pass through, and the four through holes are arranged in a matrix.

The utility model has the following beneficial effects:

1. when the utility model is used for testing, the sheet element is placed in the positioning groove, the rotating wheel is rotated, the rotating wheel drives the needle seat to move downwards through the crank, when the needle seat slides to the minimum end, the two testing probes are contacted with the electrodes at the two ends of the sheet element, at the moment, the testing tool can test the sheet element, after the test is finished, the rotating wheel is reversely rotated, the needle seat slides upwards, in the testing process, a clamp is not needed to clamp the sheet element, thereby avoiding a series of problems caused by clamping, further improving the testing accuracy and the testing efficiency, reducing the product rejection rate caused by the test, under the action of the limiting mechanism, the rotating angle of the rotating wheel is the same during each test, namely the lowest end position of the downward sliding of the needle seat is the same, so that the pressure exerted on the sheet element by the testing probes each time is also the same, and the problem that the testing method and the testing force cannot be unified due to individual difference in the prior art is avoided, thereby improving the test accuracy.

2. The insulating seat is made of the polytetrafluoroethylene material, and the polytetrafluoroethylene material has excellent chemical stability, corrosion resistance, sealing property, high lubrication non-stick property, electrical insulation property and good ageing resistance, so that the insulating seat has a smooth surface and a soft texture, does not damage a plating layer of a chip element and a ceramic substrate, and reduces the rejection rate of products.

3. The insulation seat is also provided with a feeding channel and a discharging channel which are respectively communicated with the positioning groove, the feeding channel is horn-shaped, the chip elements can enter the feeding channel from a horn mouth and are arranged in order in the feeding channel, the chip elements to be tested in the feeding channel can be horizontally pushed into the positioning groove through tweezers or other tools, the discharging channel comprises a first groove and a second groove, the chip elements which are qualified in testing are pushed into the first groove, and the chip elements which are unqualified are pushed into the second groove, so that the risk of material mixing is effectively reduced.

Drawings

The present invention will be described in further detail with reference to the accompanying drawings.

FIG. 1 is a schematic structural diagram of the present invention.

FIG. 2 is a schematic view of a positioning groove, a feed channel and a discharge channel.

Fig. 3 is a schematic structural view of a chip thick film fixed resistor.

Wherein, 1, a metal base; 2. an insulating base; 3. positioning a groove; 31. a feed channel; 32. a first groove; 33. a second groove; 41. a vertical rod; 42. a cross bar; 51. an upper needle base; 52. a lower needle seat; 53. a vertical plate; 54. a linear guide rail pair; 61. a needle tube; 62. a needle tip; 7. a lead wire; 8. a rotating wheel; 9. a crank; 10. a protruding block; 11. a handle; 121. a resistor body; 122. a vertical electrode plate; 123. a transverse electrode plate.

Detailed Description

In the present embodiment, the chip component is a chip thick film fixed resistor, as shown in fig. 3, the chip thick film fixed resistor includes a resistor body 121 and electrodes disposed at two ends of the resistor body 121, the electrodes include a vertical electrode piece 122 disposed at an end of the resistor body 121 and two lateral electrode pieces 123 disposed at upper and lower ends of the vertical electrode piece 122, the two lateral electrode pieces 123 are respectively disposed on an upper surface and a lower surface of the resistor body 121, and the vertical electrode piece 122 and the two lateral electrode pieces 123 are integrally formed. As shown in fig. 1 to 2, a testing device for chip components, which can test whether the resistance value of a chip thick film fixed resistor meets the requirement, comprises a metal base 1, an insulating base 2 made of polytetrafluoroethylene material and arranged on the metal base 1, a positioning groove 3 arranged on the insulating base 2, a feeding channel 31 and a discharging channel which are arranged on the insulating base 2 and are communicated with the positioning groove 3, a support arranged on the metal base 1 and spaced from the insulating base 2, a needle base arranged on the support in a vertically sliding manner, a testing probe arranged vertically through the needle base, a testing tool connected with the testing probe through a lead 7, a rotating wheel 8 rotatably arranged on the support, a handle 11 arranged on the rotating wheel 8, a crank 9 with two ends respectively rotatably connected between the rotating wheel 8 and the needle base, and a limiting mechanism arranged on the rotating wheel 8, the piece formula component is placed in constant head tank 3, and the needle file is located constant head tank 3 top, during the test, makes through handle 11 and rotates wheel 8 and rotate, rotates wheel 8 and passes through crank 9 and drive the needle file and slide from top to bottom, and stop gear limits the slip stroke of needle file, and when the needle file slided to the lower extreme, the test probe contacted with the transverse electrode piece 123 at piece formula component upper surface both ends, can test. The stability of the whole testing device can be guaranteed by the metal base 1. The shape and size of the positioning slot 3 depend on the chip component to be tested.

The support comprises a vertical rod 41 arranged at an interval with the insulating base 2 and a cross rod 42 arranged at the upper end of the vertical rod 41, and the rotating wheel 8 is an eccentric wheel arranged at the end part of the cross rod 42. The needle seat comprises two vertical plates 53 which are arranged at intervals left and right, an upper needle seat 51 and a lower needle seat 52 which are arranged between the two vertical plates 53 at intervals up and down, one vertical plate 53 is connected with the vertical rod 41 in a vertically sliding mode through a linear guide rail pair 54, the upper end of the crank 9 is rotatably arranged on the eccentric wheel, and the lower end of the crank 9 is rotatably arranged on the other vertical plate 53. The resistance value of the sheet type thick film fixed resistor is tested by adopting a four-wire system, therefore, four through holes for test probes to pass through are arranged on the upper needle seat 51 and the lower needle seat 52, the four through holes are arranged in a matrix manner, each test probe corresponds to one lead 71, the lower end of each lead 71 is fixed on the corresponding test probe, the upper end of each lead 71 extends out of the upper needle seat 51 and is connected with a test tool, wherein the two leads 71 are used as power supply wires, and the two leads 71 are used as signal wires, so that the power supply and the signals can work separately, the influence of impedance in the circuit on test data is greatly reduced, each lead 71 is connected with the test tool, and in the embodiment, the test tool is a desk multimeter. The test probe includes needle tubing 61, set up needle point 62 at the needle tubing 61 lower extreme, set up baffle and the vertical spring that sets up between baffle and needle point 62 in needle tubing 61, and needle point 62 is "V" font, and with the electrode phase-match of piece formula thick film resistor, the test is more accurate, and the setting of spring makes the test probe not excessively extrude the product when pushing down, the cladding material of difficult loss product. The structure of the baffle inside the needle tube 61 and the connection between the baffle and the needle tube 61 are the prior art.

The feeding channel 31 is a first groove 32 which is arranged on the upper surface of the insulating base 2 and communicated with the positioning groove 3, the first groove 32 is trumpet-shaped, and an opening at one end far away from the positioning groove 3 is larger, namely the trumpet-shaped opening. Discharging channel is including setting up second recess 33 and the third recess at 2 upper surfaces of insulator seat and respectively with constant head tank 3 intercommunication, and current piece formula component is being tested the back, and whether the test tool can send the prompt tone qualified, and in the test personnel pushed qualified piece formula component into second recess 33 according to the prompt tone with tweezers, pushes unqualified piece formula component into the third recess.

In this embodiment, the eccentric wheel is rotatably disposed at the front end of the cross bar 42, the limiting mechanism is a protruding block 10 disposed at the rear end of the eccentric wheel, and when the rotating wheel 8 rotates to a certain angle, the protruding block 10 is blocked by the cross bar 42, so that the rotating wheel 8 can not rotate any more, thereby achieving the limiting effect.

In other embodiments, the chip component may be other devices, such as a capacitor, etc., and the test apparatus may be used for testing as long as the electrode arrangement method of these devices is the same as that of the chip thick film fixed resistor.

The above description is only a preferred embodiment of the present invention, and therefore should not be taken as limiting the scope of the utility model, which is defined by the appended claims and their equivalents and modifications within the scope of the description.

Claims (10)

1. A test apparatus for a chip component, characterized by: including insulating seat, the constant head tank of setting on insulating seat, with insulating seat interval arrangement's support, can set up the needle file on the support with sliding from top to bottom, run through the test probe that the needle file set up from top to bottom, the test instrument through lead wire and test probe connection, rotationally set up the rotation wheel on the support, both ends are rotationally connected respectively and are rotating the crank between wheel and the needle file and set up the stop gear on rotating the wheel, the piece formula component is placed in the constant head tank, the needle file is located the constant head tank top, it slides from top to bottom to drive the needle file through the crank when rotating the wheel, stop gear limits the slip stroke of needle file, when the needle file slides to the bottom, test probe and the electrode contact of piece formula component, can test.

2. A testing device for chip components according to claim 1, characterized in that: the insulating seat is made of polytetrafluoroethylene materials.

3. A testing device for chip components according to claim 1, characterized in that: the support comprises a vertical rod and a cross rod, wherein the vertical rod and the cross rod are arranged at the upper end of the vertical rod, the vertical rod and the cross rod are arranged at intervals on the insulating base, and the rotating wheel is an eccentric wheel arranged at the end part of the cross rod.

4. A testing device for chip components according to claim 1 or 2 or 3, characterized in that: the needle file includes two risers, the upper and lower interval setting of interval arrangement and is connected with the support ground that can slide from top to bottom, the crank lower extreme rotationally sets up on another riser, and the test probe runs through upper and lower needle file arrangement from top to bottom, the lead wire lower extreme is fixed on the test probe, the upper end extends the needle file and is connected with the testing tool.

5. A testing device for chip components according to claim 1 or 2 or 3, characterized in that: still be provided with feedstock channel and discharging channel on the insulating seat, feedstock channel is for setting up at the insulating seat upper surface and with the first recess of constant head tank intercommunication, and first recess is the loudspeaker form, and the one end opening of keeping away from the constant head tank is bigger, and discharging channel is including setting up at the insulating seat upper surface and second recess and the third recess with the constant head tank intercommunication respectively.

6. A testing device for chip components according to claim 1 or 2 or 3, characterized in that: still include metal base, insulating seat and support all set up on metal base.

7. A testing device for chip components according to claim 1 or 2 or 3, characterized in that: the limiting mechanism comprises a protruding block arranged on the rotating wheel.

8. A testing device for chip components according to claim 1 or 2 or 3, characterized in that: the test probe comprises a needle tube, a needle point arranged at the lower end of the needle tube, a baffle arranged in the needle tube and a spring vertically arranged between the baffle and the needle point.

9. A testing device for chip components according to claim 1 or 2 or 3, characterized in that: the rotating wheel is also provided with a handle.

10. A testing device for chip components according to claim 1 or 2 or 3, characterized in that: the upper needle seat and the lower needle seat are respectively provided with four through holes for the test probes to pass through, and the four through holes are arranged in a matrix.

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