CN101487851A - Test probe apparatus - Google Patents
Test probe apparatus Download PDFInfo
- Publication number
- CN101487851A CN101487851A CNA2008102426499A CN200810242649A CN101487851A CN 101487851 A CN101487851 A CN 101487851A CN A2008102426499 A CNA2008102426499 A CN A2008102426499A CN 200810242649 A CN200810242649 A CN 200810242649A CN 101487851 A CN101487851 A CN 101487851A
- Authority
- CN
- China
- Prior art keywords
- test probe
- needle
- main body
- pressure transducer
- fixator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The invention provides a test probe device comprising a needle bed main body, a test needle, a plastic spring bracket and a pressure sensor, wherein the needle bed main body comprises a fixed seat, a test needle fixer, a U-shaped pressure adjuster and a pressure sensor fixed part; the test needle comprises a knife-type test probe and a signal output line connected with the test probe; the signal output line is connected with the fixed seat at the back end of the main body; the test needle is fixed on the plastic spring bracket, and the plastic spring bracket is fixed at the front end of the needle bed main body; the pressure sensor comprises a pressure sensor main body, a pressure data conducting wire and a pressure data conducting wire connector; the pressure sensor main body is fixed on the upper surface of the needle bed main body via the pressure sensor fixed part; the pressure data conducting wire is connected with the pressure sensor main body and the pressure data conducting wire connector; and light reflected bars are arranged below the induction device of the pressure sensor and at the upper surface of the plastic spring bracket.
Description
Technical field
The present invention relates to a kind of printed circuit board (pcb) proving installation, relate in particular to a kind of test probe apparatus.
Background technology
Existing test probe mainly is made up of three parts: the one, and needle tubing: mainly be to be that the material outside is gold-plated with the aldary.The 2nd, spring: mainly be that qin steel wire and spring steel outside is gold-plated.The 3rd, syringe needle: mainly be tool steel (SK) nickel plating or gold-plated.More than three parts be assembled into a probe.This in test process, be to stay pit at printed circuit board easily, influence the quality of printed circuit board.
Summary of the invention
The present invention is exactly in order to overcome the deficiency of above-mentioned existing test probe apparatus, to provide a kind of and can control printed circuit board test point pressure, is not the test probe apparatus that stays pit at printed circuit board.
Further purpose of the present invention is, the contact resistance that can eliminate sampled point is provided, and judges the high test probe apparatus of precision.
The technical scheme that realizes the object of the invention is:
A kind of test probe apparatus, form by needle stand main body, testing needle, plastics spring support and pressure transducer, wherein the needle stand main body is made up of holder, testing needle fixator, U-shaped pressure governor and pressure transducer fixture, described testing needle comprises cutter type test probe and the output line that is connected on the test probe, and output line is connected on the holder of body rear; Described testing needle is fixed on the plastics spring support, and the plastics spring support is fixed on the needle stand body front end; Described pressure transducer comprises pressure transducer main body, pressure data call wire and pressure data call wire connector, the pressure transducer main body is fixed on the upper surface of needle stand main body by the pressure transducer fixture, and the pressure data call wire connects pressure transducer main body and pressure data call wire connector; Below the induction installation of pressure transducer, the upper surface of plastics spring support is provided with the light reflection bar.
As a further improvement on the present invention, described testing needle comprises two parallel testing needles up and down arranged side by side, the needle body of testing needle is a cutter type test probe up and down, the opposite face mutually insulated of two cutter type test probes, the plastics spring holder combination of two testing needles and is fixed on the holder of needle stand front end together; Output line on the cutter type test probe of two testing needles leads to the holder of the rear end of needle stand main body respectively, is used for carrying out respectively electric current and voltage sample.
The present invention realizes the separation of current/voltage by two settings of two testing needles of insulation side by side, has eliminated contact resistance, makes and judges that precision reaches 2 milliohms.
As a further improvement on the present invention, described needle stand also comprises the testing needle fixator, the plastics spring support of last testing needle is fixed on the holder of needle stand body front end, the plastics spring holder combination that the testing needle fixator will descend the plastics spring support of testing needle and last testing needle together, the testing needle fixator can be regulated the distance of testing needle and following testing needle when mounted easily.
As a further improvement on the present invention, have the inductor window on the described pressure transducer fixator, the position is corresponding with light reflection bar position, and sensor is fixed on the pressure transducer fixator, and the pressure sensitive device of sensor faces the inductor window.The inductor window can effectively stop from the reflection sources beyond the light reflection bar, guarantees that signal feedback is accurate, is used for the deformation signal of reflection frames.
As a further improvement on the present invention, be provided with projection at the upper surface of needle stand main body, the pressure transducer fixator is provided with corresponding gathering sill, and gathering sill is enclosed within on the projection, off normal in the time of can avoiding mobile.
As a further improvement on the present invention, be provided with the U-shaped pressure governor in the rear end of needle stand main body, the U-shaped opening is towards the right side, and the upper surface of stretching out needle stand, have breach on the inner edge of U-shaped opening, the adjusting screw of pressure transducer fixator rear end is located in the U-shaped opening by breach, and the U-shaped pressure governor is with the combination of adjusting screw, the Precision trimming that can move forward and backward the pressure transducer fixator, the pressure transducer fixator can carry sensor and do the action that moves forward and backward.
As a further improvement on the present invention, have aperture on the outside of described U-shaped opening, can regulate the adjusting screw that is located in the U-shaped opening.
As a further improvement on the present invention, described cutter type test probe is made at the Hardmetal materials of 0.1-0.3mm by thickness, and preferred thickness is 0.2mm.Hard material can guarantee that cutter type test probe thickness has stronger rigidity at 0.3mm or in less than 0.3mm.
As a further improvement on the present invention, the front edge of described cutter type test probe is oblique sword, or further for having the oblique sword of arc, forms a more elongated point of a knife like this, can test through hole effectively.
Beneficial effect of the present invention is, can effectively test by adopting cutter type test probe through hole, also improved simultaneously test accuracy, pressure sensor apparatus utilizes sensor accurately to measure testing needle and moves forward and backward distance, after converting, draw contact pressure, thereby effectively control contact pressure, make test on printed circuit board (PCB), not stay indenture.
Realize the separation of current/voltage by the mode of double-pole type test probe, eliminated contact resistance, making and judge that precision reaches below 2 milliohms. this combination is by needle stand, carbide cutter tool type test probe, the black plastic spring, the cell pressure induction installation is formed, wherein needle stand is by main body, the U-shaped pressure governor, the pressure transducer fixator, last testing needle fixator is formed, main body can be with carbide cutter tool type test probe, pressure governor, pressure transducer fixator and last testing needle fixator are grouped together, the U-shaped pressure governor is with the Precision trimming that can move forward and backward the pressure transducer fixator after the M2 screw combination, the pressure transducer fixator can carry sensor and do the action that moves forward and backward, off normal when accurate gathering sill can avoid mobile on the pressure transducer, special inductor window can effectively stop from the reflection sources beyond the aluminium foil induction bar, guarantee that signal feedback is accurate, last testing needle fixator can be regulated the distance of testing needle and following testing needle when mounted easily, the carbide cutter tool type test probe of distinctive appearance can improve mechanical precision and intensity, and the thickness of the U-shaped breach on the black plastic spring and longitudinal separation can effectively improve its elasticity and serviceable life.
Description of drawings
Fig. 1 is the structural representation of the test probe apparatus of the embodiment of the invention 1
Fig. 2 is the structural representation of the test probe apparatus of the embodiment of the invention 2
Fig. 3 has U-shaped pressure governor needle stand structural representation in the embodiment of the invention 1
Fig. 4 is a pressure transducer fixer structure synoptic diagram in the inventive embodiments 1
Fig. 5 is inventive embodiments 1 a middle probe structural representation
Embodiment
Be described further below in conjunction with embodiment.
As shown in Figure 1, a kind of test probe apparatus 100, form by needle stand main body 1, testing needle 20, plastics spring support 3 and pressure transducer 4, wherein the needle stand main body is made up of holder 10, testing needle holder 11, U-shaped pressure governor 12 and pressure transducer fixture 13, testing needle 2 comprises cutter type test probe 21 and is connected output line 22 on the test probe, and output line 22 is connected on the holder of body rear 10; Testing needle 2 is fixed on the plastics spring support 3, and plastics spring support 3 is fixed on needle stand main body 1 front end by testing needle fixator 11; Pressure transducer 4 comprises pressure transducer main body 40, pressure data call wire 41 and pressure data call wire connector 42, pressure transducer main body 40 is fixed on the upper surface of needle stand main body 1 by pressure transducer fixture 13, and pressure data call wire 41 connects pressure transducer main body 40 and pressure data call wire connectors 42; Below the induction installation 41 of pressure transducer 40, the upper surface of plastics spring support 3 is provided with light reflection bar 26.
As shown in Figure 1 and Figure 4, have inductor window 31 on the pressure transducer fixator 13, the position is corresponding with light reflection bar 26, sensor 4 is fixed on the pressure transducer fixator 13, the pressure sensitive device 41 of sensor 4 faces the inductor window, pressure transducer fixator 13 rear ends be provided with adjusting screw 34.
As shown in figures 1 and 3, U-shaped pressure governor 12 is located at the trailing flank of main body 11, the U-shaped opening is towards top face, and stretch out main body 11 above, have breach 33 on the limit of U-shaped opening, the adjusting screw 34 of pressure transducer fixator 13 rear ends is located in the U-shaped opening by breach 33, is used to regulate the position of inductor window 31.Have aperture 35 on the outside of U-shaped opening, can carry out the front and back adjusting the adjusting screw 34 that is located in the U-shaped opening.
As Fig. 1 and shown in Figure 5, the upper surface of plastics spring support 3 has light reflection bar 26, pressure transducer fixator 13 be fixed on needle stand 1 above, have inductor window 31 on the pressure transducer fixator 13, the position is corresponding with light reflection bar 26, sensor 4 is fixed on the pressure transducer fixator 13, and the pressure sensitive device 41 of sensor 4 faces the inductor window.Be provided with projection 31 on needle stand main body 1, pressure transducer fixator 12 is provided with corresponding gathering sill 32, and gathering sill 32 is enclosed within on the projection 31, off normal in the time of can avoiding mobile.
As shown in Figure 5, test probe 20 is made up of cutter type test probe 2 and plastics spring support 3.Cutter type test probe 2 is made at the Hardmetal materials of 0.1-0.3mm by thickness, and preferred thickness is 0.2mm.The front edge 24 of cutter type test probe 2b is oblique sword.The surface on plastics spring 3 the right 25 is provided with aluminium foil induction bar 26, is used for the deformation signal of reflection plastic spring suppport 3, and then the pressure of control cutter type test probe 2 and surface of contact.
Present embodiment is with the different of last example:
As shown in Figure 2, testing needle 20 comprises two parallel upper and lower testing needle 20a arranged side by side, and 20b, upper and lower testing needle 20a, 20b are cutter type test probe testing needle, two cutter type test probe 2a, the opposite face mutually insulated of 2b.The plastics spring support 3a of last testing needle is fixed on the holder 10 of needle stand front end, and last testing needle fixator 11a will descend the plastics spring support 3b of testing needle and the plastics spring support 3a of last testing needle to combine.Two cutter type test probe 2a, the output line 22 on the 2b leads to the rear end sampled point of needle stand respectively, is used for carrying out respectively electric current and voltage sample.
Claims (9)
1, a kind of test probe apparatus, it is characterized in that, this device is made up of needle stand main body, testing needle, plastics spring support and pressure transducer, wherein the needle stand main body is made up of holder, testing needle fixator, U-shaped pressure governor and pressure transducer fixture, described testing needle comprises cutter type test probe and the output line that is connected on the test probe, and output line is connected on the holder of body rear; Described testing needle is fixed on the plastics spring support, and the plastics spring support is fixed on the needle stand body front end by the testing needle fixator; Described pressure transducer comprises pressure transducer main body, pressure data call wire and pressure data call wire connector, the pressure transducer main body is fixed on the upper surface of needle stand main body by the pressure transducer fixture, and the pressure data call wire connects pressure transducer main body and pressure data call wire connector; Below the induction installation of pressure transducer, the upper surface of plastics spring support is provided with the light reflection bar.
2, test probe apparatus according to claim 1, it is characterized in that, described testing needle comprises two parallel testing needles up and down arranged side by side and output line separately, the opposite face mutually insulated of two of testing needle cutter type test probes up and down, the plastics spring holder combination of two testing needles and is fixed on the needle stand body front end together; Output line on the cutter type test probe of two testing needles leads to the rear end sampled point of needle stand respectively, is used for carrying out respectively electric current and voltage sample.
3, test probe apparatus according to claim 2, it is characterized in that, described testing needle fixator comprises upper and lower testing needle fixator, the plastics spring support of following testing needle is fixed on the following testing needle fixator of needle stand body front end, and the plastics spring support that last testing needle fixator will be gone up testing needle and the plastics spring holder combination of following testing needle are together.
4, test probe apparatus according to claim 1 and 2, it is characterized in that have the inductor window on the described pressure transducer fixator, the position is corresponding with light reflection bar position, sensor is fixed on the pressure transducer fixator, and the pressure sensitive device of sensor faces the inductor window.
5, test probe apparatus according to claim 1 and 2, it is characterized in that, rear end on described needle stand main body is provided with the U-shaped pressure governor, the U-shaped opening edge stretches out the upper surface of needle stand, have breach on the inner edge of U-shaped opening, the adjusting screw of pressure transducer fixator rear end is located in the U-shaped opening by breach.
6, test probe apparatus according to claim 1 and 2 is characterized in that, has aperture on the outside of described U-shaped opening.
7, test probe apparatus according to claim 1 and 2 is characterized in that, described cutter type test probe is made at the Hardmetal materials of 0.1-0.3mm by thickness.
8, test probe apparatus according to claim 1 and 2 is characterized in that, the front edge of described cutter type test probe is oblique sword.
9, test probe apparatus according to claim 1 and 2 is characterized in that, is provided with projection at the upper surface of described needle stand main body, and described pressure transducer fixator is provided with corresponding gathering sill, and gathering sill is enclosed within on the projection.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008102426499A CN101487851B (en) | 2008-12-30 | 2008-12-30 | Test probe apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2008102426499A CN101487851B (en) | 2008-12-30 | 2008-12-30 | Test probe apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101487851A true CN101487851A (en) | 2009-07-22 |
CN101487851B CN101487851B (en) | 2011-04-13 |
Family
ID=40890822
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2008102426499A Active CN101487851B (en) | 2008-12-30 | 2008-12-30 | Test probe apparatus |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN101487851B (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102520253A (en) * | 2011-12-29 | 2012-06-27 | 深圳市迈创力科技有限公司 | Method, device and system for testing PCB (printed circuit board) guide hole through four wires |
CN103344797A (en) * | 2013-07-04 | 2013-10-09 | 国家电网公司 | GIS ultrasonic sensor universal clamping device |
CN104808030A (en) * | 2015-05-18 | 2015-07-29 | 深圳市泰斯电子有限公司 | Test probe and test fixture provided with same |
CN104865426A (en) * | 2015-05-11 | 2015-08-26 | 南京协辰电子科技有限公司 | Test probe device |
CN106847723A (en) * | 2011-07-06 | 2017-06-13 | 塞莱敦体系股份有限公司 | Test system and indexing mechanism with a probe unit |
CN108562766A (en) * | 2018-03-15 | 2018-09-21 | 昆山精讯电子技术有限公司 | Chip testing crimp head and its probe mechanism |
CN110794176A (en) * | 2018-08-03 | 2020-02-14 | 矽品精密工业股份有限公司 | Detection device |
CN113281396A (en) * | 2021-05-11 | 2021-08-20 | 南京工业大学 | Catalyst performance characterization method based on improved SECM probe |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3648169A (en) * | 1969-05-26 | 1972-03-07 | Teledyne Inc | Probe and head assembly |
US4123706A (en) * | 1975-03-03 | 1978-10-31 | Electroglas, Inc. | Probe construction |
US4709366A (en) * | 1985-07-29 | 1987-11-24 | John Fluke Mfg. Co., Inc. | Computer assisted fault isolation in circuit board testing |
GB2311175A (en) * | 1996-03-15 | 1997-09-17 | Everett Charles Tech | PCB / test circuitry connection interface with short circuiting means |
DE19939955A1 (en) * | 1999-08-23 | 2001-03-01 | Atg Test Systems Gmbh | Test pin for a raster adapter of a device for testing printed circuit boards |
DE10160119A1 (en) * | 2001-12-07 | 2003-10-02 | Atg Test Systems Gmbh | Test probe for a finger tester |
CN201335849Y (en) * | 2008-12-30 | 2009-10-28 | 南京协力多层电路板有限公司 | Test probe needle device |
-
2008
- 2008-12-30 CN CN2008102426499A patent/CN101487851B/en active Active
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106847723A (en) * | 2011-07-06 | 2017-06-13 | 塞莱敦体系股份有限公司 | Test system and indexing mechanism with a probe unit |
CN102520253A (en) * | 2011-12-29 | 2012-06-27 | 深圳市迈创力科技有限公司 | Method, device and system for testing PCB (printed circuit board) guide hole through four wires |
CN103344797A (en) * | 2013-07-04 | 2013-10-09 | 国家电网公司 | GIS ultrasonic sensor universal clamping device |
CN104865426A (en) * | 2015-05-11 | 2015-08-26 | 南京协辰电子科技有限公司 | Test probe device |
CN104865426B (en) * | 2015-05-11 | 2017-11-03 | 南京协辰电子科技有限公司 | A kind of test probe apparatus |
CN104808030A (en) * | 2015-05-18 | 2015-07-29 | 深圳市泰斯电子有限公司 | Test probe and test fixture provided with same |
CN108562766A (en) * | 2018-03-15 | 2018-09-21 | 昆山精讯电子技术有限公司 | Chip testing crimp head and its probe mechanism |
CN110794176A (en) * | 2018-08-03 | 2020-02-14 | 矽品精密工业股份有限公司 | Detection device |
CN113281396A (en) * | 2021-05-11 | 2021-08-20 | 南京工业大学 | Catalyst performance characterization method based on improved SECM probe |
Also Published As
Publication number | Publication date |
---|---|
CN101487851B (en) | 2011-04-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101487851B (en) | Test probe apparatus | |
CN201335849Y (en) | Test probe needle device | |
US9470501B2 (en) | Contact-terminal apparatus with pressure sensor | |
TW200717947A (en) | Electrical connector | |
CN209945703U (en) | Circuit breaker contact spring measuring device | |
CN104049115A (en) | Polymer soft package battery detecting clamp | |
CN109239580B (en) | Flexible electronic power and electric performance testing device | |
CN105866579B (en) | A kind of golden finger contact resistance and plug ageing tester | |
CN204422628U (en) | For the adjustable test electroprobe of resistance that automobile circuit detects | |
CN202204842U (en) | Four-wire test pin module | |
CN102360062A (en) | Chip detector for SMD (Surface Mounted Device) LED (Light-Emitting Diode) chip light spitting machine | |
CN202210136U (en) | Chip detection device for SMD LED paster beam-splitting machine | |
CN210639243U (en) | PCB tester of vehicle speed sensor | |
CN104515628A (en) | Assembling pressure testing device for lead acid battery pole group | |
CN201335848Y (en) | Test probe needle | |
CN205643633U (en) | Oblique pin type test jig of PCB board | |
CN209513853U (en) | A kind of lithium battery test fixture | |
CN204881944U (en) | Relay spring load characteristic testing arrangement | |
CN203798976U (en) | PCB (printed circuit board) testing device | |
CN216117714U (en) | Testing device for chip component | |
CN2856927Y (en) | Extension rod type digital indication internal gage | |
CN205175325U (en) | Portable guide rail NULL device | |
CN220959972U (en) | Linear displacement sensor with overload protection | |
CN214953203U (en) | Detection jig for self-starting trigger device | |
CN117074785B (en) | High-precision resistance value detection equipment |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160622 Address after: 211106, 3 Nanjing, Jiangning economic and Technological Development Zone, Jiangsu, Patentee after: Nanjing Xie Chen Electronic Science and Technology Co., Ltd. Address before: The central city of Nanjing road 210009 Jiangsu xinliji building 1701 No. 258-27 Patentee before: Joint Power Technology Co., Ltd. |