CN216052059U

CN216052059U - Automatic tester for digital chips

Info

Publication number: CN216052059U
Application number: CN202122194959.1U
Authority: CN
Inventors: 魏亨儒; 刘雄丰
Original assignee: Shenzhen Tangcheng Technology Co ltd
Current assignee: Shenzhen Tangcheng Technology Co ltd
Priority date: 2021-09-11
Filing date: 2021-09-11
Publication date: 2022-03-15
Anticipated expiration: 2031-09-11

Abstract

The utility model discloses an automatic digital chip testing machine, which relates to the technical field of chip testing and comprises a box body, wherein a top plate is arranged on the box body, a plurality of clamping assemblies are arranged in the box body and used for clamping a chip to be tested, each clamping assembly respectively comprises a group of clamping plates and a driving mechanism, the driving mechanism is used for driving the two clamping plates to move oppositely to clamp the chip, working grooves with the same number as the clamping assemblies are formed in the top plate, each clamping assembly moves in the corresponding working groove, and a testing device is vertically and upwardly arranged on the top plate in a sliding manner. Through the cooperation between box, centre gripping subassembly, grip block, actuating mechanism, work groove, the testing arrangement, through two grip blocks of actuating mechanism drive relative motion, through the grip block to the chip centre gripping, at the in-process that utilizes the testing arrangement to test the chip, the condition that the chip can not appear rocking to improve the accuracy of this testing arrangement result.

Description

Automatic tester for digital chips

Technical Field

The utility model relates to the technical field of chip testing, in particular to an automatic digital chip testing machine.

Background

With the growth of emerging industries such as mobile internet, cloud computing, internet of things, big data and the like, the electronic information industry enters a new development stage. Control, communication, man-machine interaction, network interconnection and the like are integrated into a large number of emerging electronic technologies, the functions of equipment are more and more complex, and the system integration level is more and more complex. The development of new electronic information technology depends on the continuous push of the semiconductor industry, so that the use of chips as a core technology becomes more and more frequent and important, the chips generally refer to integrated circuit carriers, which are separated by wafers, and also refer to the results of the integrated circuits after design, manufacture, packaging and testing, after the mass production of the chips is completed, the basic functions of the chips need to be detected, so as to select the unqualified chips, and thus the qualified chips are retained.

An existing digital chip automatic testing machine, such as a chinese patent with application number CN202020579208.4 entitled "an automatic chip testing device", discloses an automatic chip testing device, which includes a testing machine body provided with a sliding slot along a length direction and a chip mounting seat arranged on the sliding slot and movably connected with the sliding slot; the testing machine body is provided with a feeding port and a detection port which are communicated with the sliding groove along the vertical direction, and the upper end of the detection port is provided with a chip testing seat; the utility model provides an automatic chip testing device, which aims to achieve the aim of efficiently testing a chip.

The defects of the prior art are as follows: in the existing chip detection device, no device is used for fixing the position of the chip, and the chip can shake in the detection process, so that the detection result of the chip is influenced.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide an automatic digital chip testing machine to overcome the defects in the prior art.

In order to achieve the above purpose, the utility model provides the following technical scheme: the utility model provides a digital chip automated testing machine, includes the box, be provided with the roof on the box, the box is inside to be provided with a plurality of centre gripping subassemblies, the centre gripping subassembly is used for the centre gripping chip that awaits measuring, every the centre gripping subassembly includes a set of grip block and actuating mechanism respectively, actuating mechanism is used for driving two the grip block moves the centre gripping chip in opposite directions, set up the work groove unanimous with centre gripping subassembly quantity on the roof, every the centre gripping subassembly moves in the work groove that corresponds, vertical upwards slip is provided with the testing arrangement unanimous with centre gripping subassembly quantity on the roof, testing arrangement is used for testing the chip on the grip block.

Further, actuating mechanism is including the installation piece, the installation piece is installed inside the box, equal fixedly connected with dead lever, two on the both sides of installation piece all rotate on the dead lever and be connected with the hinge bar, the grip block sets up the one end of keeping away from the dead lever at the hinge bar, every the hinge bar inboard all rotates and is connected with the actuating lever, two the one end that the hinge bar was kept away from to the actuating lever rotates and is connected with the drive block.

Further, a second electric telescopic rod is arranged inside the box body, a second driving frame is fixedly connected with the fixing portion of the second electric telescopic rod, and each driving block is fixedly connected with the second driving frame.

Further, be provided with buffering portion on the grip block, buffering portion includes a plurality of dashpots, and is a plurality of the dashpot is all seted up on the grip block, every it is provided with the buffer beam, every to slide in the dashpot all be provided with buffer spring between buffer beam and the dashpot, buffer spring's elasticity orders about the buffer beam and keeps away from the dashpot, buffer beam keeps away from dashpot one end and is provided with the buffer block.

Further, be provided with an electric telescopic handle on the roof, a first drive frame of fixedly connected with is a plurality of on the first electric telescopic handle top equal fixed connection of testing arrangement is on first drive frame, the testing arrangement bottom is provided with a plurality of test heads.

Further, article shelves are arranged on two sides of the box body.

Further, the bottom of the box body is provided with a plurality of supporting legs, and one end, far away from the box body, of each supporting leg is provided with a rubber pad.

Compared with the prior art, the utility model has the beneficial effects that: through the cooperation between box, centre gripping subassembly, grip block, actuating mechanism, work groove, the testing arrangement, through two grip blocks of actuating mechanism drive relative motion, through the grip block to the chip centre gripping, at the in-process that utilizes the testing arrangement to test the chip, the condition that the chip can not appear rocking to improve the accuracy of this testing arrangement result.

Drawings

In order to more clearly illustrate the embodiments of the present application or technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments described in the present invention, and other drawings can be obtained by those skilled in the art according to the drawings.

FIG. 1 is a schematic diagram of an overall structure provided in an embodiment of the present invention;

FIG. 2 is a schematic cross-sectional view of an embodiment of the present invention;

FIG. 3 is a schematic diagram of an internal structure of the case according to the embodiment of the present invention;

FIG. 4 is a schematic structural diagram illustrating a connection manner between a clamping assembly and a second driving frame according to an embodiment of the present invention;

FIG. 5 is a schematic structural diagram of a clamping assembly according to an embodiment of the present invention;

fig. 6 is a schematic structural diagram of a first driving frame according to an embodiment of the present invention;

fig. 7 is a schematic structural diagram of a second driving frame according to an embodiment of the present invention;

fig. 8 is a schematic cross-sectional structural view of a buffer portion according to an embodiment of the present invention.

Description of reference numerals: 1. a box body; 101. a rack; 2. a top plate; 3. a working groove; 4. a clamping assembly; 401. mounting blocks; 402. fixing the rod; 403. a hinged lever; 404. a clamping plate; 405. a drive rod; 406. a drive block; 407. a buffer section; 4071. a buffer tank; 4072. a buffer rod; 4073. a buffer plate; 4074. a buffer spring; 5. a testing device; 501. a test head; 6. a first driving frame; 7. a first electric telescopic rod; 8. a second electric telescopic rod; 9. a second driving frame; 10. supporting legs; 1001. and (7) a rubber pad.

Detailed Description

In order to make the technical solutions of the present invention better understood, those skilled in the art will now describe the present invention in further detail with reference to the accompanying drawings.

Referring to fig. 1 to 8, an automatic digital chip testing machine according to an embodiment of the present invention includes a box 1, a top plate 2 is disposed on the box 1, a plurality of clamping assemblies 4 are disposed inside the box 1, the clamping assemblies 4 are configured to clamp a chip to be tested, each clamping assembly 4 includes a group of clamping plates 404 and a driving mechanism, the driving mechanism is configured to drive the two clamping plates 404 to move oppositely to clamp the chip, working grooves 3 having the same number as the clamping assemblies 4 are formed in the top plate 2, each clamping assembly 4 moves in the corresponding working groove 3, a testing device 5 having the same number as the clamping assemblies 4 is vertically disposed on the top plate 2, and the testing device 5 is configured to test the chip on the clamping plates 404.

Specifically, the digital chip automatic testing machine comprises a box body 1, wherein a plurality of clamping assemblies 4 are arranged in the box body 1, and each clamping assembly 4 clamps a chip, so that the plurality of chips can be tested synchronously, and the working efficiency of the digital chip automatic testing machine is improved conveniently; the driving mechanism can be a driving motor and a positive screw and a negative screw, the two clamping plates 404 are respectively in threaded connection with two ends of the positive screw and the negative screw, the positive screw and the negative screw are driven to rotate through the rotation of the rotating shaft of the driving motor, and then the two clamping plates 404 are driven to oppositely slide to clamp the chip; the box body 1 is provided with a top plate 2, the top plate 2 is provided with working grooves 3, the number of the working grooves 3 is consistent with that of the clamping assemblies 4, each clamping assembly 4 moves in the corresponding working groove 3, the top plate 2 is provided with a plurality of testing devices 5 in a sliding manner, and the testing devices 5 are vertically and upwards arranged on the clamping plate 404 in a sliding manner, so that the chips can be conveniently mounted and dismounted at the later stage; where test apparatus 5 is a prior art apparatus for testing chips on clamping plate 404, test apparatus 5 is used to test both the cover and the chips during the testing process.

The actuating mechanism includes installation piece 401, and installation piece 401 is installed inside box 1, and equal fixedly connected with dead lever 402 on the both sides of installation piece 401 all rotates on two dead levers 402 and is connected with hinge bar 403, and grip block 404 sets up the one end of keeping away from dead lever 402 at hinge bar 403, and every hinge bar 403 inboard all rotates and is connected with actuating lever 405, and the one end rotation that hinge bar 403 was kept away from to two actuating levers 405 is connected with drive block 406.

Preferably, the drive mechanism provides another embodiment: the driving mechanism comprises a mounting block 401, wherein the mounting block 401 is mounted inside the box body 1, both sides of the mounting block 401 are fixedly connected with fixing rods 402, two hinge rods 403 are respectively hinged on the corresponding fixing rods 402, one ends of the two hinge rods 403 far away from the fixing rods 402 are fixedly connected with the corresponding clamping plates 404, the inner side of each hinge rod 403 is rotatably connected with a driving rod 405, and the driving block 406 is rotatably connected with one ends of the two driving rods 405 far away from the hinge rods 403; when the test machine is used, the driving block 406 is driven up and down, the driving block 406 slides to drive the driving rod 405 to slide, so that the two hinge rods 403 are driven to move oppositely, and the clamping plates 404 are driven to move oppositely, so that the chip is mounted and dismounted, and the practicability of the test machine is improved; the structure of each clamping assembly 4 is identical, and only one of them will be described in detail herein, and the rest will not be described again.

The inside second electric telescopic handle 8 that is provided with of box 1, 8 portion fixedly connected with second driving racks 9 of second electric telescopic handle, every driving block 406 all with second driving rack 9 fixed connection.

Preferably, a second electric telescopic rod 8 is arranged inside the box body 1, wherein the second electric telescopic rod 8 extends and retracts vertically and upwards, a second driving frame 9 is arranged on the second electric telescopic rod 8, and each driving block 406 is fixedly connected with the second driving frame 9; during the use, second electric telescopic handle 8 drives second mount 9 and slides from top to bottom, and then drives a plurality of drive blocks 406 and upwards slides in step, drives actuating lever 405 through drive block 406 and slides, and then drives two hinge bar 403 and move in opposite directions, drives grip block 404 and moves in opposite directions to realize the installation and the dismantlement of chip.

Be provided with buffering portion 407 on the grip block 404, buffering portion 407 includes a plurality of dashpot 4071, a plurality of dashpots 4071 are all seted up on grip block 404, it is provided with buffering pole 4072 to slide in every dashpot 4071, all be provided with buffer spring 4074 between every buffering pole 4072 and the dashpot 4071, buffer pole 4072 is kept away from dashpot 4071 to buffer spring 4074's elasticity orders about, buffer pole 4072 is kept away from dashpot 4071 one end and is provided with buffer board 4073.

Preferably, all be provided with the buffer portion in the inboard of two grip blocks 404, through setting up buffer portion 407, can be applicable to the chip of equidimension not, two buffer boards 4073 receive when the extrusion, can drive corresponding buffering pole 4072 and slide in buffer slot 4071 to can the chip of centre gripping variation in size, widen the application range of this test machine.

Be provided with first electric telescopic handle 7 on roof 2, the first drive frame 6 of fixedly connected with on the 7 tops of first electric telescopic handle, the equal fixed connection of a plurality of testing arrangement 5 is on first drive frame 6, and testing arrangement 5 bottom is provided with a plurality of test heads 501.

Preferably, the first driving frame 6 of fixedly connected with on the first electric telescopic handle 7, the equal fixed connection of a plurality of testing arrangement 5 is on first driving frame 6, first driving frame 6 slides from top to bottom and drives testing arrangement 5 to slide from top to bottom, during the use, drive first driving frame 6 through first telescopic handle 7 and slide from top to bottom, and then drive testing arrangement 5 to slide from top to bottom, test operation, in the test work process, test head 501 and the chip butt on grip block 4, when installing or pulling down the chip, slide testing arrangement 5 upwards through first electric telescopic handle 7, make testing arrangement 5 keep away from grip block 4, be convenient for going on of follow-up work.

Both sides of the box body 1 are provided with a commodity shelf 101.

Preferably, through being provided with supporter 101 in box 1 both sides, be convenient for place hand tool and article in the course of the work, simple structure convenient to use.

A plurality of supporting legs 10 are arranged at the bottom of the box body 1, and a rubber pad 1001 is arranged at one end, far away from the box body 1, of each supporting leg 10.

Preferably, the stability of the testing machine can be improved by the engagement between the support legs 10 and the rubber pad 1001.

The working principle is as follows: when the automatic digital chip testing machine is used, a chip is firstly installed in the clamping component 4, then the second electric telescopic rod 8 is started, the second electric telescopic rod 8 drives the second fixing frame 9 to slide up and down, and further drives the plurality of driving blocks 406 to slide upwards synchronously, the driving rods 405 are driven by the driving blocks 406 to slide, and further drives the two hinge rods 403 to move oppositely, so that the clamping plates 404 are driven to move oppositely, the clamping of the chip is realized, the chip cannot shake in the testing process, and the testing work is facilitated; then, the first telescopic rod 7 drives the first driving frame 6 to slide downwards, and further drives the testing device 5 to slide up and down, so that the testing head 501 is abutted to the chip on the clamping plate 404 to perform testing operation; the use process need not dependent manual operation, improves work efficiency.

While certain exemplary embodiments of the present invention have been described above by way of illustration only, it will be apparent to those of ordinary skill in the art that the described embodiments may be modified in various different ways without departing from the spirit and scope of the utility model. Accordingly, the drawings and description are illustrative in nature and should not be construed as limiting the scope of the utility model.

Claims

1. The utility model provides a digital chip automatic test machine, includes box (1), be provided with roof (2), its characterized in that on box (1): a plurality of clamping assemblies (4) are arranged in the box body (1), and the clamping assemblies (4) are used for clamping a chip to be tested;

each clamping assembly (4) comprises a group of clamping plates (404) and a driving mechanism respectively, and the driving mechanism is used for driving the two clamping plates (404) to move oppositely to clamp the chip;

working grooves (3) with the same number as the clamping assemblies (4) are formed in the top plate (2), and each clamping assembly (4) moves in the corresponding working groove (3);

the test device is characterized in that the top plate (2) is vertically and upwards provided with test devices (5) with the same number as the clamping assemblies (4) in a sliding mode, and the test devices (5) are used for testing chips on the clamping plate (404).

2. The digital chip automated testing machine of claim 1, wherein: the driving mechanism comprises an installation block (401), the installation block (401) is installed inside the box body (1), fixing rods (402) are fixedly connected to two sides of the installation block (401), hinged rods (403) are rotatably connected to the two fixing rods (402), and the clamping plate (404) is arranged at one end, away from the fixing rods (402), of the hinged rods (403);

every articulated rod (403) inboard all rotates and is connected with actuating lever (405), two the one end rotation that articulated rod (403) was kept away from in actuating lever (405) is connected with drive block (406).

3. The digital chip automated testing machine of claim 2, wherein: the box (1) is internally provided with a second electric telescopic rod (8), the second electric telescopic rod (8) is fixedly connected with a second driving frame (9) in a fixing part, and each driving block (406) is fixedly connected with the second driving frame (9).

4. The digital chip automated testing machine of claim 1, wherein: a buffer part (407) is arranged on the clamping plate (404);

buffer portion (407) includes a plurality of dashpot (4071), and is a plurality of on grip block (404) is all seted up in dashpot (4071), every it is provided with buffering pole (4072), every to slide in dashpot (4071) between buffering pole (4072) and dashpot (4071) all be provided with buffer spring (4074), buffer block (4071) is kept away from in buffer rod (4072) is ordered to buffer spring's (4074) elasticity, buffer block (4071) is kept away from in buffer rod (4072), buffer block (4071) one end is provided with buffer board (4073) is kept away from in buffer rod (4072).

5. The digital chip automated testing machine of claim 1, wherein: be provided with first electric telescopic handle (7) on roof (2), the first drive frame (6) of fixedly connected with is a plurality of on first electric telescopic handle (7) top the equal fixed connection of testing arrangement (5) is on first drive frame (6), testing arrangement (5) bottom is provided with a plurality of test heads (501).

6. The digital chip automated testing machine of claim 1, wherein: both sides of the box body (1) are provided with a commodity shelf (101).

7. The digital chip automated testing machine of claim 1, wherein: the box body (1) bottom is provided with a plurality of supporting legs (10), every the one end of keeping away from box body (1) on supporting leg (10) is provided with rubber pad (1001).