CN216052046U

CN216052046U - Pin test fixture for integrated circuit sorting machine

Info

Publication number: CN216052046U
Application number: CN202121979174.9U
Authority: CN
Inventors: 王佳; 顾卫民; 吴卓鸿; 曹必红
Original assignee: Wuxi Xinqibo Electronics Co ltd
Current assignee: Wuxi Xinqibo Electronics Co ltd
Priority date: 2021-08-23
Filing date: 2021-08-23
Publication date: 2022-03-15
Anticipated expiration: 2031-08-23

Abstract

The utility model discloses a pin testing jig for an integrated circuit sorting machine, which comprises a bottom box, wherein a pressing plate is fixedly arranged on the upper surface of the bottom box, four groups of mounting grooves are formed in the upper surface of the pressing plate, a hollow pipe is fixedly arranged on the pressing plate through the mounting grooves, a sealing ring is movably arranged in the hollow pipe, a vertical rod is fixedly arranged on the upper surface of the sealing ring, a positioning plate is fixedly arranged on the outer surface of the vertical rod, and a compression spring is fixedly arranged between the lower surface of the positioning plate and the upper surface of the pressing plate. The pin test fixture for the integrated circuit sorting machine can effectively buffer the impulsive force during the test work period, so that the stress of the pins of the integrated circuit sorting machine during the test is reduced, the moving track of a needle plate can be effectively fixed during the use period, the possibility of deviation is reduced, and the accuracy of the test points and the accuracy of the test structure are improved.

Description

Pin test fixture for integrated circuit sorting machine

Technical Field

The utility model relates to the technical field of test jigs, in particular to a pin test jig for an integrated circuit sorting machine.

Background

A jig is a tool of the general type used by carpenters, ironmen, and other handicrafts, and is used mainly as a tool to assist in controlling position or motion or both. Jigs have been widely used in industrial times, including mechanical jigs, woodworking jigs, welding jigs, jewelry jigs, and other fields. Some types of tools, also called "dies" or "aids", are mainly intended to repeat a certain part of the reproduction in a repetitive and accurate manner, while test tools belong to a category under the tools, which are specially designed to test and test the functions, power calibration, life, performance, etc. of the product. The test fixture is mainly used for testing various indexes of products on a production line, so the test fixture is called.

Traditional pin test fixture for integrated circuit sorter is when using, can't effectually cushion the atress to the faller, the pin that makes its integrated circuit sorter easily receives external force when testing and damages, thereby make it reduce its efficiency of software testing, simultaneously test for a long time and use the messenger, the removal orbit of its faller also easily produces the skew because of long-term work, thereby make its test point squint, it is the degree of accuracy reduction of testing, thereby very big influence the use that is used for pin test fixture of integrated circuit sorter.

SUMMERY OF THE UTILITY MODEL

The utility model mainly aims to provide a pin test fixture for an integrated circuit sorting machine, which can effectively solve the problems in the background technology.

In order to achieve the purpose, the utility model adopts the technical scheme that:

a pin testing jig for an integrated circuit sorting machine comprises a bottom box, wherein a pressing plate is fixedly arranged on the upper surface of the bottom box, four groups of mounting grooves are formed in the upper surface of the pressing plate, a hollow pipe is fixedly arranged on the pressing plate through the mounting grooves, a sealing ring is movably arranged in the hollow pipe, a vertical rod is fixedly arranged on the upper surface of the sealing ring, a positioning plate is fixedly arranged on the outer surface of the vertical rod, a compression spring is fixedly arranged between the lower surface of the positioning plate and the upper surface of the pressing plate, a silica gel pad is fixedly arranged between the upper surface positions of the four groups of vertical rods, a support plate is fixedly arranged on the upper surface of the silica gel pad, a needle plate is arranged on the upper surface of the support plate, a fixing block is fixedly arranged on the upper surface of the needle plate, mounting frames are fixedly arranged on the outer walls of two sides of the fixing block, gears are movably arranged on the outer surface of the mounting frames, and the equal fixed mounting of both sides inner wall of end box has the pinion rack, the front surface fixed mounting of end box has the regulating block, and the inside movable mounting of regulating block has the test head.

Preferably, two sets of gears are horizontally distributed, and the mounting rack is vertically connected with the gears in a penetrating mode.

Preferably, the fixed block is vertically connected with the bottom box in a penetrating manner, and the gear is meshed with the toothed plate.

Preferably, the silica gel pad and the support plate are horizontally distributed, and the support plate and the needle plate are positioned on the same longitudinal axis.

Preferably, the sealing ring and the vertical rod are vertically distributed, and the vertical rod is vertically connected with the hollow pipe in a penetrating mode.

Preferably, the positioning plate and the pressing plate are horizontally distributed, and the positioning plate and the pressing plate are vertically distributed with the compression spring.

Preferably, the adjusting block and the needle plate are vertically connected with the test head in a penetrating manner, and a groove is formed in the upper surface of the carrier plate.

Compared with the prior art, the utility model has the following beneficial effects:

1. the faller passes through hollow tube and montant connection has the support plate of silica gel pad, when test fixture carried out work, pressure will act on the silica gel pad through the support plate, the silica gel pad cushions it, transmit the power after will cushioning on the montant, make the montant along the hollow tube to inside removal, and the sealing washer on the montant will contact with the hollow tube, its friction will be confronted with the impact, thereby carry out the shock attenuation, and compression spring atress produces deformation and shortens the back, its reaction force acts on the silica gel pad, make it drive montant and support plate return to the normal position, thereby make the support plate and the pin of the integrated circuit sorter of inside remain stable.

2. The faller passes through fixed block and end box swing joint, and when the faller moved, its shifting force will be transmitted to the gear through fixed block and mounting bracket for gear and pinion rack carry out the meshing motion, thereby the effectual removal orbit of confirming its fixed block reduces the faller and removes the possibility that the in-process takes place the skew and make its stability increase.

Drawings

FIG. 1 is a schematic diagram of an overall structure of a pin testing fixture for an IC handler according to the present invention;

FIG. 2 is a schematic diagram of a pin plate connection structure of a pin testing fixture for an IC handler according to the present invention;

FIG. 3 is a schematic structural diagram of a fixing plate used in a pin testing fixture of an IC handler according to the present invention;

FIG. 4 is a schematic view of a compression spring connection structure used in a pin testing fixture of an IC handler according to the present invention.

In the figure: 1. a bottom case; 2. pressing a plate; 3. mounting grooves; 4. a hollow tube; 5. a seal ring; 6. a vertical rod; 8. positioning a plate; 9. a compression spring; 10. a silica gel pad; 11. a carrier plate; 12. a needle plate; 13. a fixed block; 14. a mounting frame; 15. a gear; 16. a toothed plate; 17. an adjusting block; 18. and (6) testing the head.

Detailed Description

In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the utility model easy to understand, the utility model is further described with the specific embodiments.

In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", "front", "rear", "both ends", "one end", "the other end", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "disposed," "connected," and the like are to be construed broadly, such as "connected," which may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood according to specific situations by those of ordinary skill in the art.

As shown in fig. 1-4, a pin testing jig for an integrated circuit sorting machine comprises a bottom box 1, a pressing plate 2 is fixedly installed on the upper surface of the bottom box 1, four sets of installation grooves 3 are formed in the upper surface of the pressing plate 2, a hollow tube 4 is fixedly installed on the pressing plate 2 through the installation grooves 3, a sealing ring 5 is movably installed inside the hollow tube 4, a vertical rod 6 is fixedly installed on the upper surface of the sealing ring 5, a positioning plate 8 is fixedly installed on the outer surface of the vertical rod 6, a compression spring 9 is fixedly installed between the lower surface of the positioning plate 8 and the upper surface of the pressing plate 2, a silica gel pad 10 is fixedly installed between the upper surface positions of the four sets of vertical rods 6, a support plate 11 is fixedly installed on the upper surface of the silica gel pad 10, a needle plate 12 is arranged on the upper surface of the support plate 12, a fixing block 13 is fixedly installed on the outer walls of two sides of the fixing block 13, and an installation frame 14 is fixedly installed on the outer walls of the two sides of the fixing block 13, the outer surface of the mounting frame 14 is movably provided with a gear 15, the inner walls of two sides of the bottom box 1 are fixedly provided with toothed plates 16, the front surface of the bottom box 1 is fixedly provided with an adjusting block 7, and the inside of the adjusting block 7 is movably provided with a test head 18.

Two sets of gears 15 are horizontally distributed, and the mounting rack 14 is vertically connected with the gears 15 in a penetrating manner, so that the fixing block 13 can be always in a horizontal state by the two sets of gears 15 which are horizontally distributed, and the possibility of inclination of the fixing block is avoided.

The fixed block 13 is vertically connected with the bottom box 1 in a penetrating manner, the gear 15 is meshed with the toothed plate 16, when the needle plate 12 is stressed, the force is transmitted to the gear 15 through the fixed block 13 and the mounting frame 14, so that the gear 15 and the toothed plate 16 perform meshing movement, and the moving track of the fixed block 13 is effectively determined.

Silica gel pad 10 and support plate 11 horizontal distribution, and support plate 11 and faller 12 are located same vertical axis, can be effectual when faller 12 pushes down, can be even act on silica gel pad 10 with its pressure through support plate 11, silica gel pad 10 cushions it.

Sealing washer 5 and montant 6 vertical distribution, and montant 6 and hollow tube 4 perpendicular through connection, when montant 6 atress, montant 6 will be followed hollow tube 4 and to its inside removal, and sealing washer 5 on the montant 6 will contact with hollow tube 4, and its frictional force will be confronted with the impact to carry out the shock attenuation.

The positioning plate 8 and the pressing plate 2 are horizontally distributed, the positioning plate 8 and the pressing plate 2 are vertically distributed with the compression spring 9, when the compression spring 9 is stressed, deformation can be generated under the action of force, and after the deformation is shortened, the reaction force acts on the silica gel pad 10, so that the silica gel pad drives the vertical rod 6 and the support plate 11 to return to the original position, and the support plate 11 and pins of the integrated circuit sorting machine inside the support plate 11 are kept stable.

The adjusting block 17 and the needle plate 12 are vertically connected with the test head 18 in a penetrating way, the upper surface of the carrier plate 11 is provided with a groove, and the position of the pin of the integrated circuit sorting machine during the test can be effectively determined by the groove on the carrier plate 11.

It should be noted that, before use, the bottom box 1 is placed horizontally, the testing fixture can be opened for use, the needle plate 12 moves, the moving force is transmitted to the gear 15 through the fixing block 13 and the mounting frame 14, the gear 15 and the toothed plate 16 perform meshing motion, so that the moving track of the fixing block 13 is effectively determined, the possibility of deviation of the needle plate 12 in the moving process is reduced, the stability of the needle plate is increased, the pressure of the needle plate 12 acts on the silica gel pad 10 through the support plate 11, the silica gel pad 10 buffers the force, the buffered force is transmitted to the vertical rod 6, the vertical rod 6 moves towards the inside along the hollow tube 4, the sealing ring 5 on the vertical rod 6 is in contact with the hollow tube 4, the friction force of the sealing ring is confronted with the impact force, so as to absorb shock, and after the compression spring 9 is deformed and shortened, the reaction force acts on the silica gel pad 10, so that the vertical rod 6 and the carrier plate 11 are driven to return to the original position, and the carrier plate 11 and the pins of the integrated circuit sorting machine inside the carrier plate are kept stable. The pin test fixture for the integrated circuit sorting machine can effectively buffer the impulsive force during the test work period, so that the stress of the pins of the integrated circuit sorting machine during the test is reduced, the moving track of a needle plate can be effectively fixed during the use period, the possibility of deviation is reduced, and the accuracy of the test points and the accuracy of the test structure are improved.

The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the utility model as claimed. The scope of the utility model is defined by the appended claims and equivalents thereof.

Claims

1. The utility model provides a pin test fixture for integrated circuit sorter, includes end box (1), its characterized in that: the upper surface fixing of the bottom box (1) is provided with a pressing plate (2), the upper surface of the pressing plate (2) is provided with four groups of mounting grooves (3), the pressing plate (2) is fixedly provided with a hollow tube (4) through the mounting grooves (3), the inner part of the hollow tube (4) is movably provided with a sealing ring (5), the upper surface fixing of the sealing ring (5) is provided with a vertical rod (6), the outer surface fixing of the vertical rod (6) is provided with a positioning plate (8), a compression spring (9) is fixedly arranged between the lower surface of the positioning plate (8) and the upper surface position of the pressing plate (2), a silica gel pad (10) is fixedly arranged between the upper surface positions of the four groups of vertical rods (6), the upper surface fixing of the silica gel pad (10) is provided with a support plate (11), the upper surface of the support plate (11) is provided with a needle plate (12), the upper surface fixing of the needle plate (12) is provided with a fixing block (13), and the equal fixed mounting in both sides outer wall of fixed block (13) has mounting bracket (14), the surface movable mounting of mounting bracket (14) has gear (15), and the equal fixed mounting in both sides inner wall of end box (1) has pinion rack (16), the front fixed surface of end box (1) installs regulating block (17), and the inside movable mounting of regulating block (17) has test head (18).

2. The pin testing fixture for the IC handler of claim 1, wherein: the two groups of gears (15) are horizontally distributed, and the mounting rack (14) is vertically connected with the gears (15) in a penetrating manner.

3. The pin testing fixture for the IC handler of claim 1, wherein: the fixed block (13) is vertically connected with the bottom box (1) in a penetrating manner, and the gear (15) is meshed with the toothed plate (16).

4. The pin testing fixture for the IC handler of claim 1, wherein: the silica gel pad (10) and the carrier plate (11) are horizontally distributed, and the carrier plate (11) and the needle plate (12) are located on the same longitudinal axis.

5. The pin testing fixture for the IC handler of claim 1, wherein: the sealing ring (5) and the vertical rod (6) are vertically distributed, and the vertical rod (6) is vertically connected with the hollow pipe (4) in a penetrating manner.

6. The pin testing fixture for the IC handler of claim 1, wherein: the positioning plate (8) and the pressing plate (2) are horizontally distributed, and the positioning plate (8) and the pressing plate (2) are vertically distributed with the compression spring (9).

7. The pin testing fixture for the IC handler of claim 1, wherein: the adjusting block (17) and the needle plate (12) are vertically connected with the test head (18) in a penetrating manner, and a groove is formed in the upper surface of the carrier plate (11).