CN215986354U

CN215986354U - Photosensitive transistor I-V test machine

Info

Publication number: CN215986354U
Application number: CN202122479260.XU
Authority: CN
Inventors: 章微; 肖运江
Original assignee: Shenzhen Kaifa Technology Co Ltd
Current assignee: Shenzhen Kaifa Technology Co Ltd
Priority date: 2021-10-14
Filing date: 2021-10-14
Publication date: 2022-03-08
Anticipated expiration: 2031-10-14

Abstract

The utility model discloses a photosensitive transistor I-V testing machine, which comprises a lower die component, an upper die component and a dark box, wherein the upper die component is vertically and slidably arranged above the lower die component, and the dark box is arranged at the periphery of the lower die component and the upper die component.

Description

Photosensitive transistor I-V test machine

Technical Field

The utility model relates to the field of testing of phototransistors, in particular to an I-V testing machine for phototransistors.

Background

The current method for testing the I-V value of the phototransistors is to weld the positive and negative electrodes of the phototransistors with wires, then arrange an LED lamp for providing UV light source for the phototransistors at the position 5-6mm below the phototransistors, weld the wires on the positive and negative electrodes of the LED lamp, find a black shading box to cover the phototransistors and the LED lamp, respectively connect the positive and negative electrodes of the phototransistors and the positive and negative electrodes of the LED lamp to the positive and negative electrodes of a channel 1 and the positive and negative electrodes of a channel 2 of a program control power supply through the black shading box, and judge the quality problem of the incoming materials of the phototransistors by displaying the I-V value of the phototransistors through the program control power supply, the mode for detecting the I-V numerical value of the photosensitive transistor greatly wastes time and labor cost, the labor intensity of workers is large, the consistency of the test numerical value is not high, and the production efficiency is very slow.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the technical problems that aiming at the defects in the prior art, the I-V test of the photosensitive transistor can be rapidly realized, the I-V test consistency of the photosensitive transistor is ensured, the labor intensity of workers is reduced, the production efficiency is improved, and the like, and the I-V test machine of the photosensitive transistor is provided.

The technical scheme adopted by the utility model for solving the technical problems is as follows: a phototransistor I-V tester is constructed comprising:

the lower die assembly comprises an LED lamp positioning plate and a support plate, wherein the LED lamp positioning plate is horizontally arranged and used for arranging an LED lamp, the support plate is fixed above the LED lamp positioning plate and used for arranging a to-be-tested phototransistor facing towards the LED lamp, and the distance between the lower surface of the phototransistor and the upper surface of the LED lamp meets the testing requirement;

the upper die assembly is vertically and slidably arranged above the lower die assembly and comprises a vertical moving mechanism capable of moving back and forth in the vertical direction and a needle plate fixedly connected with the vertical moving mechanism, probes corresponding to the positive and negative electrodes of the photosensitive transistor penetrate through the needle plate, the needle plate is horizontally arranged above the carrier plate and can be driven by the vertical moving mechanism to vertically move so as to drive the probes to be pressed downwards, and the probes are correspondingly communicated with the positive and negative electrodes of the photosensitive transistor;

the camera bellows is arranged at the periphery of the lower die assembly and the upper die assembly and used for providing a shading closed environment for the lower die assembly and the upper die assembly;

and the LED lamp and the probe are respectively connected with the corresponding program-controlled power supply during testing.

Preferably, a limiting block for limiting the needle plate to move downwards continuously is arranged below the needle plate, guide pillars are arranged below the needle plate and close to two ends of the needle plate, guide sleeves matched with the guide pillars are arranged at positions close to two ends of the carrier plate, and the guide pillars move downwards along with the needle plate and are inserted into the guide sleeves.

Preferably, vertical moving mechanism is the cylinder, go up the mould subassembly and still include vertical setting be located two slide rails of the cylinder left and right sides, two respectively set up one on the slide rail and follow the vertical gliding slider of slide rail, two respectively connect a slider fixed plate on the slider, two slider fixed plates with the cylinder all with faller fixed connection.

Preferably, the lower die assembly comprises a horizontally arranged panel, the LED lamp positioning plate is fixed on the panel, the upper die assembly comprises a vertically arranged forward plate and two reinforcing plates, the forward plate and the two reinforcing plates are fixedly connected with the panel in a vertical mode, the two reinforcing plates are fixedly connected with the rear of the forward plate in a vertical mode, a supporting plate and two sliding rails are fixedly connected with the front of the forward plate, the air cylinder is fixedly connected to the supporting plate, and the probe is an elastic gold-plating probe.

Preferably, the camera bellows include with the peripheral black sheet metal box of connecting of panel, black sheet metal box front side is equipped with the opening and is used for opening, closes the open-ended baffle, the open-ended both sides set up left slide rail and right slide rail respectively, the side respectively with left side slide rail and right slide rail sliding connection about the baffle, the inside shading bubble that is equipped with of opening is cotton to prevent that backstop board edge light leaks outward.

Preferably, the camera bellows further comprises a pen-shaped cylinder, wherein an upper fixing block and a lower fixing block are arranged on the pen-shaped cylinder, the pen-shaped cylinder is fixed above the opening of the black sheet metal box by the upper fixing block and the lower fixing block, a pen-shaped cylinder connecting block is arranged on the baffle plate, and the pen-shaped cylinder connecting block is connected with the pen-shaped cylinder to vertically move under the driving of the pen-shaped cylinder.

Preferably, the electric control box is used for receiving external electric and carrying internal required electric elements, and the lower die assembly is mounted on the electric control box.

Preferably, the LED lamp positioning plate, the carrier plate and the needle plate are arranged along the left-right direction, the LED lamp positioning plate, the carrier plate and the needle plate are respectively provided with a row of corresponding LED lamps, a row of corresponding phototransistors and a row of corresponding probes at intervals along the length direction of the LED lamp positioning plate, the carrier plate and the needle plate, and the LED lamps, the phototransistors and the probes are arranged from bottom to top;

the rear plate of the electric cabinet is provided with four rows of wiring terminals which correspond to the positive and negative poles of the LED lamps in one row and the positive and negative poles of the phototransistors in one row respectively in a penetrating manner, the LED lamp positioning plate is provided with one row of heavy grooves which are distributed at intervals along the length direction of the LED lamp positioning plate, the heavy grooves extend along the front and rear directions, the positive and negative poles of the LED lamp are respectively welded with the wiring of the LED lamp and are thrown out from the heavy grooves on the LED lamp positioning plate to be connected with the two corresponding rows of wiring terminals on the electric cabinet, and the probes in one row are connected with the other two corresponding rows of wiring terminals on the electric cabinet through wiring.

Preferably, the electric cabinet comprises four anti-static foot pads, a bottom plate, a front panel, a left side plate, a back plate and a right side plate, the bottom of the bottom plate is fixedly connected with the four anti-static foot pads, the bottom plate is fixedly connected with a hinge fixing block, the hinge fixing block is fixedly connected with one end of a hinge, the other end of the hinge is connected with the panel of the lower die assembly, the hinge is used for supporting the panel when the electric cabinet is opened, the periphery of the bottom plate is sequentially connected with the front panel, the left side plate, the back plate and the right side plate, the front panel comprises a front plate and a button mounting plate which is connected with the top edge of the front plate and is obliquely arranged, a starting button and an emergency stop switch are fixedly connected on the button mounting plate, the left side plate is fixedly connected with a time relay and a case snap ring which are used for respectively controlling the delayed reset of a baffle of the camera bellows and controlling the delayed reset of the vertical moving mechanism, the case and bag snap ring is fixedly connected to the right side plate, and the hinge and the wiring terminal are fixedly connected to the rear plate.

Preferably, the lower die assembly further comprises a panel, a case buckle is fixed on each of the left side edge and the right side edge of the panel, the case buckles are meshed with case clamping rings on the left side plate and the right side plate respectively to lock the panel, the rear side edge of the panel is connected with a hinge on the rear plate, and the LED lamp positioning plate is fixedly connected to the panel.

The utility model has the following beneficial effects that: compared with the original pure manual test operation, the automatic photosensitive transistor I-V testing device is simple to operate, the LED lamp and the probe are only required to be connected with the corresponding program-controlled power supply respectively during testing, the vertical moving mechanism directly drives the needle plate to be pressed down to connect the photosensitive transistor, so that the photosensitive transistor I-V testing can be rapidly completed, the testing efficiency is high, the labor intensity of workers is reduced, the consistency of the tested photosensitive transistor I-V is good, and the automatic photosensitive transistor I-V testing device is suitable for wide popularization and application.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts:

FIG. 1 is a schematic diagram of a phototransistor I-V tester according to the present invention;

FIG. 2 is an exploded view of the phototransistor I-V tester of the present invention;

FIG. 3 is an exploded view of the electrical cabinet;

FIG. 4 is an exploded view of the lower die assembly;

FIG. 5 is an exploded view of the upper die assembly;

FIG. 6 is an exploded view of the camera bellows.

Detailed Description

To facilitate an understanding of the utility model, the utility model will now be described more fully with reference to the accompanying drawings. Exemplary embodiments of the utility model are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete. It should be understood that the embodiments and specific features in the embodiments of the present invention are described in detail in the present application, but not limited to the present application, and the features in the embodiments and specific features in the embodiments of the present invention may be combined with each other without conflict.

It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the utility model herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the utility model.

Referring to fig. 1-2, the phototransistor I-V tester of the present invention comprises: electric cabinet 10, lower mould subassembly 40, last mould subassembly 60, camera bellows 80.

The electric cabinet 10 is used for receiving external electric and carrying internal electric elements; the lower die assembly 40 is mounted on the electric cabinet 10, and the lower die assembly 40 is used for bearing a phototransistor 46 to be tested and an LED lamp 47 fixed to the phototransistor for providing a UV light source; the upper die assembly 60 is vertically and slidably mounted above the lower die assembly 40 and used for mounting the probe 63, and the probe 63 is conveniently and accurately connected with the positive electrode and the negative electrode of the phototransistor 46; the camera bellows 80 encloses the lower die assembly 40 and the upper die assembly 60, and mainly plays a role in providing a light-shielding closed environment for a testing machine and ensuring that the I-V value is tested more accurately.

The various structures are described in detail below with reference to the figures.

Referring to fig. 3 in conjunction with fig. 1-2, the electric cabinet 10 includes four anti-static foot pads 12, a bottom plate 11, a front panel, a left side plate 32, a rear plate 23, and a right side plate 19. The bottom plate 11 is a horizontally arranged rectangular plate, and the bottom of the bottom plate is fixedly connected with the four anti-static foot pads 12. The upper surface of the bottom plate 11 is fixedly connected with the two electromagnetic valves 13 and the hinge fixing block 26, and the PLC (not shown in the figure) is also arranged, the hinge fixing block 26 is fixedly connected with one end of a hinge 31, the other end of the hinge 31 is connected with the panel 42 of the lower die assembly 40, and the hinge 31 is used for supporting the panel 42 when the electric cabinet 10 is opened, so that the electric cabinet 10 is convenient to maintain and repair. The bottom plate 11 is vertically connected with the front panel, the left side plate 32, the back plate 23 and the right side plate 19 in turn, and the front panel body comprises a front plate 14 and a button mounting plate 17 which is connected with the top edge of the front plate 14 and is obliquely arranged. Two start button 16 of fixed connection and scram switch 15 on the button mounting panel 17, two time relay 33 of fixed connection, a case and bag snap ring 21 and a handle 20 on the left side board 32, fixed connection air-vent valve 22, pressure regulating meter 18, case and bag snap ring 21, handle 20 on the right side board 19, fixed connection baffle is through 24, 3.5MM banana earth plug 25, ship type switch 27, DC supply socket 28, two hinges 30 and four rows of binding post 29 on the back plate 23.

Wherein, the two actuating buttons 16 are used for the user to input information to the PLC to indicate whether to open the baffle 84 of the camera bellows 80 and whether to actuate the vertical moving mechanism 66. The emergency stop switch 15 is electrically connected with the PLC and used for controlling the whole testing machine to stop working. Two solenoid valves 13 in the electric cabinet 10 are concrete cylinder control switches, controlled by the PLC, one solenoid valve 13 controls the pen-shaped cylinder 82 of the baffle 84, and the other solenoid valve 13 controls the cylinder of the needle plate 71. And the two time relays 33 are arranged in the power supply circuits of the two cylinders and are used for being turned off in a delayed manner for a certain time after the power supply circuits of the two cylinders are turned on (namely, the two electromagnetic valves 13 are turned on), so that the baffle 84 of the camera bellows 80 is controlled to be reset in a delayed manner (namely, the pen-shaped cylinder 82 is reset in a delayed manner) and the vertical moving mechanism 66 is controlled to be reset in a delayed manner respectively. The DC power socket 28 is plugged into an external power source, and the boat switch 27 is connected to the DC power socket 28 for controlling whether the external power source is connected for use.

Referring to fig. 4 in conjunction with fig. 1-2, the lower mold assembly 40 includes a horizontally disposed panel 42, an LED lamp positioning plate 43, and a carrier plate 44. The LED lamp positioning plate 43 and the carrier plate 44 are disposed along the left-right direction. Respectively fixed one case and bag buckle 41, two on the panel 42 left and right sides limit case and bag buckle 41 respectively with the case and bag snap ring 21 on left side board 32 and the right side board 19 interlock mutually thereby with panel 42 locking, the panel 42 back side is connected with two hinges 30 on the back plate 23, hinge 30, case and bag buckle 41 and the cooperation of case and bag snap ring 21 can realize that panel 42 and electric cabinet 10 open and closed. Fixedly connected LED lamp locating plate 43 on the panel 42, LED lamp locating plate 43 is used for setting up LED lamp 47, support plate 44 is fixed in LED lamp locating plate 43 top, for example can fix through modes such as bolt, support plate 44 is used for facing LED lamp 47 sets up the phototransistor 46 that awaits measuring and the interval of phototransistor 46 lower surface and LED lamp 47 upper surface satisfies the test requirement distance, for example can set up one row of recess on support plate 44, and a phototransistor 46 that awaits measuring is placed to each recess.

The number of the LED lamps 47 and the number of the photo transistors 46 are the same, and may be one or more than one, in order to improve the testing efficiency, in this embodiment, the LED lamp positioning plate 43 and the carrier plate 44 are respectively arranged in a row of the LED lamps 47 and a row of the photo transistors 46 at intervals along the length direction thereof, so that one row of the photo transistors 46 can be tested at a time. Four rows of wiring terminals 29 on the back plate 23 of the electric cabinet 10 correspond to the positive and negative poles of the LED lamp 47 and the positive and negative poles of the phototransistor 46 respectively. Specifically, a row of sinking grooves are formed in the LED lamp positioning plate 43 and are arranged at intervals along the length direction of the LED lamp positioning plate, the sinking grooves extend along the front-back direction, the positive and negative electrodes of the LED lamp are respectively welded with the LED lamp connection wires 48, and are thrown out from the sinking grooves in the LED lamp positioning plate 43 and then are connected with two corresponding rows of the connection terminals 29 on the electric cabinet 10, the row of the probes 63 in the upper die assembly 60 is connected with the other two corresponding rows of the connection terminals 29 on the electric cabinet 10 through connection wires, that is, the probes 63 are a bridge for realizing connection between the positive and negative electrodes of the phototransistors 46 and the positive and negative electrodes of the programmable power supply, and the number of the probes 63 is twice the number of the phototransistors 46 because the positive electrode of each phototransistors 46 is connected with one probe 63, and the negative electrode of each phototransistors 46 is also connected with one probe 63.

Referring to fig. 5 in conjunction with fig. 1-2, an upper die assembly 60 is vertically slidably disposed above the lower die assembly 40. The upper die assembly 60 includes a vertical movement mechanism 66 movable back and forth in the vertical direction and a needle plate 71 fixedly connected to the vertical movement mechanism 66. Needle board 71 sets up along the left-right direction, wear to establish the probe 63 that corresponds with the positive negative pole of phototransistor 46 on the needle board 71, specifically, needle board 71 arranges one row of correspondence along self length direction interval LED lamp 47, just LED lamp 47 phototransistor 46 probe 63 is from supreme just setting up down. In this embodiment, the probe 63 is an elastic gold-plated probe.

The needle plate 71 is horizontally disposed above the carrier 44 and can be driven by the vertical moving mechanism 66 to vertically move so as to drive the probe 63 to press down, and then the positive and negative electrodes of the phototransistor 46 are connected. Preferably, the vertical moving mechanism 66 is an air cylinder, the upper die assembly 60 further includes two vertically arranged slide rails 65 located at the left and right sides of the air cylinder, two slide rails 65 are respectively provided with a slide block 64 capable of vertically sliding along the slide rail 65, two slide blocks 64 are respectively connected with an L-shaped slide block fixing plate 68, and the two slide block fixing plates 68 and the air cylinder are both fixedly connected with the needle plate 71.

More specifically, go up mould assembly 60 including vertical setting forward board 70 and two reinforcing plates 69, forward board 70 and two reinforcing plates 69 with the perpendicular fixed connection of panel 42, two reinforcing plates 69 with the perpendicular fixed connection in back of forward board 70, the preceding fixed connection backup pad 67 of forward board 70 and two that are located the backup pad 67 left and right sides the slide rail 65, fixed connection is in the backup pad 67 the cylinder.

Preferably, a stop block 61 for limiting the downward movement of the needle plate 71 is arranged below the needle plate, and once the stop block 61 contacts the panel 42, the air cylinder stops pushing downwards. Furthermore, two guide posts 62 are arranged below the needle plate 71 and near to two ends, two guide sleeves 45 matched with the guide posts 62 are arranged near to two ends of the carrier plate 44, and the guide posts 62 move downwards along with the needle plate 71 and are inserted into the guide sleeves 45.

Referring to fig. 6 in conjunction with fig. 1-2, a camera bellows 80 is disposed around the lower and

upper mold assemblies

40, 60 for providing a light-tight and sealed environment for the lower and

upper mold assemblies

40, 60.

Dark box 80 include with the peripheral black sheet metal box 81 of connecting of panel 42, black sheet metal box 81 front side is equipped with the opening and is used for opening, closes open-ended baffle 84, the open-ended both sides set up left slide rail 85 and right slide rail 83 respectively, the side respectively with left side slide rail 85 and right slide rail 83 sliding connection about baffle 84, the inside shading bubble cotton 87 that is equipped with of opening is leaked outside with preventing stopper 84 marginal light.

In order to realize automatic opening of the baffle, the camera bellows 80 further comprises a pen-shaped air cylinder 82, an upper fixing block 88 and a lower fixing block 89 are arranged on the pen-shaped air cylinder 82, the pen-shaped air cylinder 82 is fixed above the opening of the black sheet metal box 81 by the upper fixing block 88 and the lower fixing block 89, a pen-shaped air cylinder connecting block 86 is arranged on the baffle 84, and the pen-shaped air cylinder connecting block 86 is connected with the pen-shaped air cylinder 82 to vertically move under the driving of the pen-shaped air cylinder 82.

The operation of the present embodiment will be described below.

Before the test, the following preparation before the test is needed:

1. the LED lamp 47 is welded with the LED lamp wiring 48 and is arranged on the LED lamp positioning plate 43, the LED lamp wiring 48 is thrown out of the sinking groove of the LED lamp positioning plate 43 and is connected to the corresponding wiring terminal 29 on the rear plate 23, and here, it should be noted that the action of welding the LED lamp wiring 48 on the LED lamp 47 and arranging the LED lamp wiring 48 on the LED lamp positioning plate 43 is disposable until the service life of the LED lamp 47 is up, and otherwise, the LED lamp 47 is not required to be replaced. Then the carrier plate 44 is fixed on the LED lamp positioning plate 43, and the effective distance between the upper surface of the LED lamp 47 and the lower surface of the phototransistor 46 arranged on the carrier plate 44 is kept at 5-6MM required by the test;

2. connecting the positive and negative electrode wires of each probe 63 of the upper die assembly 60 to the corresponding connecting terminals 29 on the rear plate 23;

3. the positive and negative clamps of the program control power supply channel 1 are respectively connected to the connecting terminals 29 connected with the positive and negative poles of the LED lamp 47 corresponding to the rear plate 23 of the testing machine, and the program control power supply channel 1 mainly supplies power to the LED lamp 47 to enable the LED lamp 47 to emit light. The positive and negative clamps of the program control power supply channel 2 are respectively connected to the connecting terminals 29 connected with the positive and negative electrodes of the probe 63 corresponding to the rear plate 23 of the testing machine, and the program control power supply channel 2 mainly tests the voltage and the current of the photosensitive transistor 46 connected with the positive and negative electrodes of the program control power supply channel to obtain I-V data.

It should be noted that one LED lamp 47 corresponds to one phototransistor 46 to be tested on the carrier plate 44, corresponds to four terminals 29 on the rear plate 23, and corresponds to one group of programmable power channels 1 and 2, and if a plurality of phototransistors 46I-V values need to be tested at the same time, a plurality of groups of programmable power channels 1 and 2 are needed.

The phototransistor 46I-V test is started after the preparation before the above test is completed. Firstly, a photosensitive transistor 46 to be tested is placed in a groove of a support plate 44 through an opening position at the front end of a black sheet metal box 81 by using tweezers, then a start button 16 is pressed by two hands, a baffle 84 on a camera bellows 80 blocks the opening of the black sheet metal box 81 under the motion of a pen-shaped air cylinder 82, then the air cylinder in an upper die assembly 60 moves to drive a needle plate 71 to move downwards, a guide pillar 62 of the upper die assembly 60 penetrates through a guide sleeve 45 of a lower die assembly 40 until two limiting blocks 61 of the upper die assembly 60 are contacted with the support plate 44, at the moment, the upper die assembly 60 stops moving towards the lower die assembly 40, a probe 63 on the needle plate 71 is accurately pricked on a positive gold finger and a negative gold finger corresponding to the photosensitive transistor 46 to be tested, and an I-V value on a corresponding program control power supply is read and recorded. The cylinder 66 automatically resets under the time delay action of the time relay 33, the pen-shaped cylinder 82 automatically opens the opening of the black sheet metal box 81 with the baffle 84 under the time delay action of the time relay 33, the tested phototransistor 46 is taken out, the I-V test of the phototransistor 46 is completed, and the next phototransistor 46 to be tested is executed.

In summary, the phototransistor I-V tester of the present invention has the following advantages: compared with the original pure manual test operation, the automatic photosensitive transistor I-V testing device is simple to operate, the LED lamp and the probe are only required to be connected with the corresponding program-controlled power supply respectively during testing, the vertical moving mechanism directly drives the needle plate to be pressed down to connect the photosensitive transistor, so that the photosensitive transistor I-V testing can be rapidly completed, the testing efficiency is high, the labor intensity of workers is reduced, the consistency of the tested photosensitive transistor I-V is good, and the automatic photosensitive transistor I-V testing device is suitable for wide popularization and application.

It should be noted that the present invention focuses on providing such a hardware structure of a tester, and provides a hardware basis for implementing the above-mentioned workflow. Therefore, the utility model is an improvement of the prior art, and is essentially in the connection relationship between hardware, not in the function and method. The above description of the method flow in the above working principle of the present invention is for better illustration of the present invention so as to better understand the present invention.

While the illustrative embodiment of the present invention 68 has been described above with reference to the accompanying drawings, the present invention is not limited to the above-described embodiment, which is illustrative only and not restrictive, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the utility model as defined in the appended claims.

Claims

1. A phototransistor I-V tester, comprising:

2. The phototransistor I-V tester as recited in claim 1, wherein a limiting block is disposed below the needle plate to limit the needle plate to move downward, guide posts are disposed below the needle plate at two ends, guide sleeves matching with the guide posts are disposed at two ends of the carrier plate, and the guide posts are inserted into the guide sleeves as the needle plate moves downward.

3. The phototransistor I-V testing machine as set forth in claim 1, wherein said vertical moving mechanism is an air cylinder, said upper die assembly further comprises two vertically disposed slide rails disposed on left and right sides of said air cylinder, each of said two slide rails is provided with a slide block capable of vertically sliding along said slide rail, each of said two slide blocks is connected to a slide block fixing plate, and said two slide block fixing plates and said air cylinder are both fixedly connected to said needle plate.

4. The phototransistor I-V tester as set forth in claim 3, wherein the lower die assembly comprises a horizontally disposed panel, the LED positioning plate is fixed on the panel, the upper die assembly comprises a vertically disposed forward plate and two reinforcing plates, the forward plate and the two reinforcing plates are vertically and fixedly connected to the panel, the two reinforcing plates are vertically and fixedly connected to the rear of the forward plate, the front of the forward plate is fixedly connected to a support plate and the two slide rails, the support plate is fixedly connected to the cylinder, and the probe is an elastic gold-plated probe.

5. The phototransistor I-V testing machine as set forth in claim 4, wherein the dark box comprises a black sheet metal box connected to the periphery of the panel, an opening and a baffle for opening and closing the opening are provided on the front side of the black sheet metal box, a left slide rail and a right slide rail are provided on the two sides of the opening, the left and right sides of the baffle are slidably connected to the left slide rail and the right slide rail, respectively, and light-shielding foam is provided inside the opening to prevent light from leaking from the edge of the baffle.

6. The phototransistor I-V tester as recited in claim 5, wherein said camera bellows further comprises a pen-shaped cylinder, said pen-shaped cylinder having an upper fixed block and a lower fixed block, said upper fixed block and said lower fixed block fixing said pen-shaped cylinder above said black sheet metal box opening, said baffle having a pen-shaped cylinder connection block, said pen-shaped cylinder connection block being connected to said pen-shaped cylinder for vertical movement under the drive of said pen-shaped cylinder.

7. The phototransistor I-V tester as set forth in claim 1, further comprising an electrical cabinet for receiving external electrical components and for carrying internal required electrical components, wherein said lower die assembly is mounted to said electrical cabinet.

8. The phototransistor I-V testing machine as recited in claim 7, wherein the LED lamp positioning plate, the carrier plate, and the needle plate are disposed along a left-right direction, the LED lamp positioning plate, the carrier plate, and the needle plate are respectively arranged with a row of corresponding LED lamps, a row of corresponding phototransistors, and a row of corresponding probes along a length direction thereof, and the LED lamps, the phototransistors, and the probes are disposed opposite to each other from bottom to top;

the rear plate of the electric cabinet is provided with four rows of wiring terminals which correspond to the positive and negative poles of the LED lamps and the positive and negative poles of the phototransistors respectively in a row in a penetrating manner, the LED lamp positioning plate is provided with a row of heavy grooves which are distributed at intervals along the length direction of the LED lamp positioning plate, the heavy grooves extend along the front and rear directions, the positive and negative poles of the LED lamp are respectively welded with the wiring terminals which correspond to the electric cabinet after the wiring of the LED lamp is thrown out of the heavy grooves on the LED lamp positioning plate, and the probes are connected with the corresponding wiring terminals on the electric cabinet through wiring.

9. The phototransistor I-V testing machine as set forth in claim 7, wherein the electric cabinet comprises four anti-static pads, a bottom plate, a front plate, a left side plate, a back plate, and a right side plate, wherein the bottom of the bottom plate is fixedly connected to the four anti-static pads, the bottom plate is fixedly connected to a hinge fixing block, the hinge fixing block is fixedly connected to one end of a hinge, the other end of the hinge is connected to the panel of the lower mold assembly, the hinge is used for supporting the panel when the electric cabinet is turned over, the periphery of the bottom plate is sequentially connected to the front plate, the left side plate, the back plate, and the right side plate, the front plate comprises a front plate and a button mounting plate connected to the top edge of the front plate, the button mounting plate is obliquely arranged, the button mounting plate is fixedly connected to a start button and an emergency stop switch, and the left side plate is fixedly connected to a baffle plate for respectively controlling the delayed reset of the camera bellows, The time relay and the luggage snap ring are used for controlling the time delay reset of the vertical moving mechanism, the luggage snap ring is fixedly connected to the right side plate, and the hinge and the wiring terminal are fixedly connected to the rear plate.

10. The phototransistor I-V tester as recited in claim 9, wherein said lower die assembly further comprises a panel, wherein a case buckle is fixed to each of the left and right sides of said panel, said case buckles respectively engage with case buckles on the left and right sides of said panel to lock said panel, said rear side of said panel is connected to a hinge on the rear panel, and said panel is fixedly connected to an LED light positioning plate.