CN215920026U

CN215920026U - Needle grinding device of probe

Info

Publication number: CN215920026U
Application number: CN202122544693.9U
Authority: CN
Inventors: 严颖杰; 权爱春; 周晓磊; 林志鑫
Original assignee: Zing Semiconductor Corp
Current assignee: Zing Semiconductor Corp
Priority date: 2021-10-21
Filing date: 2021-10-21
Publication date: 2022-03-01
Anticipated expiration: 2031-10-21

Abstract

The application provides a needle grinding device of probe belongs to the needle grinding technical field of section resistance survey probe, specifically includes base and probe installation component, be equipped with exposed grinding table on the base, probe installation component is located grind bench side, probe installation component includes removal subassembly, probe fixed part and probe, the probe install in on the probe fixed part, removal subassembly drive probe fixed part is close to and keeps away from grind the platform. Through the processing scheme of this application, the state and the sharpness of syringe needle when polishing the needle are observed to the in-process that polishes more convenient.

Description

Needle grinding device of probe

Technical Field

The application relates to the field of grinding needles of profile resistance measuring probes, in particular to a needle grinding device of a probe.

Background

The existing needle grinding method for the section resistance measuring probe adopts the steps that a probe is required to be installed and a measuring table is required to grind a needle, a needle grinding person cannot observe the state of a needle head, the needle head is easily abraded excessively, and the sharpness of the needle head cannot be controlled.

SUMMERY OF THE UTILITY MODEL

In view of this, the application provides a needle grinding device of probe, has solved the problem among the prior art, and the state and the sharpness of syringe needle when polishing the needle are observed to the in-process that polishes more convenient.

The application provides a needle grinding device of probe adopts following technical scheme:

the utility model provides a needle grinding device of probe, includes base and probe installation component, be equipped with exposed grinding table on the base, probe installation component is located grinding table top, probe installation component is including removal subassembly, probe fixed part and probe, the probe install in on the probe fixed part, removal subassembly drive probe fixed part is close to and keeps away from grinding table.

Optionally, the polishing machine further comprises a bracket extending from the base to above the polishing table, and the bracket is connected with the probe mounting assembly above the polishing table.

Optionally, the movable assembly comprises a telescopic portion and a rotating portion, the output end of the rotating portion is connected with the probe fixing portion and the probe and drives the probe to rotate in the circumferential direction, the rotating portion is fixed at the output end of the telescopic portion, and the telescopic portion drives the rotating portion, the probe fixing portion and the probe to be close to and far away from the grinding table.

Optionally, the telescopic part is an air cylinder or an electric cylinder, and the telescopic shaft of the air cylinder or the electric cylinder is connected with the rotating part.

Optionally, the moving assembly comprises a telescopic piece arranged on the support, the telescopic piece stretches in the direction perpendicular to the grinding table, and the telescopic piece is provided with a telescopic belt which is connected with one end of the probe mounting assembly through the support and is close to and far away from the grinding table.

Optionally, the grinding table is detachably mounted on the base.

Optionally, the grinding table comprises a rough grinding part and a fine grinding part, and different angles are set, and the angle range is 0-60 °.

Optionally, the base is provided with two sets of translation assemblies, and the two sets of translation assemblies drive the grinding table to translate on the base in the mutually perpendicular direction.

Optionally, the two sets of translation assemblies are two-dimensional translation tables, bases of the two-dimensional translation tables are fixed on the base, and moving ends of the two-dimensional translation tables are connected with the grinding table.

To sum up, the application comprises the following beneficial technical effects:

1. the grinding table is exposed, so that an operator can directly observe the grinding state of the probe in the process of controlling the probe to move and polish; the state and the sharpness of the needle head can be observed more conveniently during needle grinding;

2. the grinding table is detachably mounted on the base, so that the grinding tables of different specifications can be conveniently replaced, and the grinding requirements of different probes are met.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

FIG. 1 is a schematic structural view of a needle sharpening device of the probe of the present application;

fig. 2 is a schematic structural diagram of another embodiment of the probe needle grinding device of the present application.

Description of reference numerals: 1. a base; 2. a grinding table; 3. a support; 31. a telescoping member; 4. a probe mounting assembly; 41. a probe fixing part; 42. a moving assembly; 421. a telescopic part; 422. a rotating part; 43. a probe; 6. a two-dimensional translation stage.

Detailed Description

The embodiments of the present application will be described in detail below with reference to the accompanying drawings.

The following description of the embodiments of the present application is provided by way of specific examples, and other advantages and effects of the present application will be readily apparent to those skilled in the art from the disclosure herein. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. The present application is capable of other and different embodiments and its several details are capable of modifications and/or changes in various respects, all without departing from the spirit of the present application. It is to be noted that the features in the following embodiments and examples may be combined with each other without conflict. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It is noted that various aspects of the embodiments are described below within the scope of the appended claims. It should be apparent that the aspects described herein may be embodied in a wide variety of forms and that any specific structure and/or function described herein is merely illustrative. Based on the present application, one skilled in the art should appreciate that one aspect described herein may be implemented independently of any other aspects and that two or more of these aspects may be combined in various ways. For example, an apparatus may be implemented and/or a method practiced using any number of the aspects set forth herein. Additionally, such an apparatus may be implemented and/or such a method may be practiced using other structure and/or functionality in addition to one or more of the aspects set forth herein.

It should be noted that the drawings provided in the following embodiments are only for illustrating the basic idea of the present application, and the drawings only show the components related to the present application rather than the number, shape and size of the components in actual implementation, and the type, amount and ratio of the components in actual implementation may be changed arbitrarily, and the layout of the components may be more complicated.

In addition, in the following description, specific details are provided to facilitate a thorough understanding of the examples. However, it will be understood by those skilled in the art that the aspects may be practiced without these specific details.

The embodiment of the application provides a needle grinding device of a probe.

As shown in fig. 1, a needle grinding device for a probe 43 comprises a base 1 and a probe mounting assembly 4, wherein an exposed grinding table 2 is arranged on the base 1, the probe mounting assembly 4 is located above the grinding table 2, the probe mounting assembly 4 comprises a moving assembly 42, a probe fixing portion 41 and a probe 43, the probe 43 is mounted on the probe fixing portion 41, and the moving assembly 42 drives the probe fixing portion 41 to approach and depart from the grinding table 2.

In the embodiment of the present application, the base 1 is in a horizontal state, the polishing table 2 is located on the top surface of the base 1, and the moving assembly 42 drives the probe fixing portion 41 to move up and down, so that the probe fixing portion 41 and the probe 43 are far away from and close to the polishing table 2. The moving assembly 42 drives the probe 43 to move downwards, the needle head contacts the grinding table 2, and the grinding table 2 grinds the probe 43. Since the grinding table 2 is exposed, an operator can directly observe the grinding state of the probe 43 in the process of controlling the probe 43 to move and grind; the state and the sharpness of the needle head can be observed more conveniently during needle grinding.

The needle grinding device further comprises a support 3, the support 3 extends from the base 1 to the position above the grinding table 2, and the support 3 is connected with the probe mounting assembly 4 above the grinding table 2. Support 3 in this application embodiment is the shape of falling L, and the side of base 1 is connected to one end, and the other end is located grinding table 2 directly over, is located the distolateral probe installation component 4 of connecting of grinding table 2 top. In other embodiments, the probe mounting assembly 4 may be fixed above the polishing table 2 by an additional mounting bracket, and the additional mounting bracket is not connected to the base 1 and the polishing table 2, but fixed on a ceiling or a wall in a room, or may extend from a desktop on which the polishing needle device is placed to above the polishing table 2.

The movable assembly 42 comprises a telescopic part 421 and a rotating part 422, the output end of the rotating part 422 is connected with the probe fixing part 41 and the probe 43, the probe 43 is driven to rotate in the circumferential direction, and when the probe 43 is in contact with the grinding table 2, the probe 43 rotates to grind the probe 43. The rotating portion 422 is fixed at the output end of the telescopic portion 421, and the telescopic portion 421 drives the rotating portion 422, the probe fixing portion 41 and the probe 43 to approach and separate from the polishing table 2.

The expansion part 421 is a cylinder or an electric cylinder, and the expansion shaft of the cylinder or the electric cylinder is connected with the rotating part 422.

As shown in fig. 2, the moving assembly 42 may also be a telescopic member 31 disposed on the bracket 3, the telescopic member 31 extends and contracts in a direction perpendicular to the polishing table 2, and the telescopic member 31 extends and contracts to bring one end of the bracket 3, which is connected to the probe mounting assembly 4, closer to and farther away from the polishing table 2. The specific telescopic member 31 may be an air cylinder, and the air cylinder is used as a section of the vertical portion of the bracket 3, so that the length of the vertical portion of the bracket 3 is increased or decreased, and thus one end of the bracket 3, which is connected with the probe mounting assembly 4, is raised or lowered, and the probe 43 is driven to be close to or far away from the grinding table 2. In other embodiments, the telescopic member 31 may be a telescopic sleeve or a hydraulic cylinder or other structures capable of increasing or decreasing the length of the vertical portion of the bracket 3.

In the embodiment of the present application, the probe fixing portion 41 is a clip, in other embodiments, the probe fixing portion 41 may also be a fixing sleeve, and the end of the probe 43 extends into the sleeve and is fastened in the sleeve by a bolt.

The grinding table 2 is detachably mounted on the base 1. The grinding table 2 comprises a rough grinding part and a fine grinding part, and is provided with different angles, wherein the angle range is 0-60 degrees. The grinding table 2 with different angles and different thicknesses can be conveniently replaced to meet different grinding requirements of the probe 43. Specifically, the grinding table 2 may be fixed to the base by a plurality of bolts.

Two sets of translation assemblies are arranged on the base 1, and the two sets of translation assemblies drive the grinding table 2 to translate on the base 1 in the mutually perpendicular direction. The two sets of translation assemblies drive the grinding table 2 to move left and right, and the probe 43 is polished according to different requirements by moving the grinding table 2.

Two sets of translation subassemblies are two-dimensional translation platform 6, and the upper strata of two-dimensional translation platform 6 can move on two directions of mutually perpendicular for the base of self, drives grinding table 2 and carries out the translation, and the base of two-dimensional translation platform 6 is fixed on base 1, and grinding table 2 is connected to the removal end of two-dimensional translation platform 6.

The above description is only for the specific embodiments of the present application, but the scope of the present application is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present application should be covered within the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims

1. The utility model provides a needle grinding device of probe, its characterized in that includes base and probe installation component, be equipped with exposed grinding table on the base, probe installation component is located grinding table top, probe installation component includes removal subassembly, probe fixed part and probe, the probe install in on the probe fixed part, removal subassembly drive probe fixed part is close to and keeps away from grinding table.

2. The needle sharpening apparatus for a probe of claim 1 further comprising a bracket extending from said base to above a grinding table, said bracket being connected to said probe mounting assembly above said grinding table.

3. The needle grinding device of the probe as claimed in claim 2, wherein the moving assembly comprises a telescopic part and a rotating part, the output end of the rotating part is connected with the probe fixing part and the probe to drive the probe to rotate circumferentially, the rotating part is fixed at the output end of the telescopic part, and the telescopic part drives the rotating part, the probe fixing part and the probe to approach and leave the grinding table.

4. The needle grinding device of the probe according to claim 3, wherein the telescopic part is a cylinder or an electric cylinder, and the telescopic shaft of the cylinder or the electric cylinder is connected with the rotating part.

5. The needle sharpening apparatus for a probe of claim 2, wherein said moving assembly comprises a telescopic member disposed on a support, said telescopic member being telescopic in a direction perpendicular to said grinding table, said telescopic member being adapted to extend and retract along an end of said support, which is connected to said probe mounting assembly, toward and away from said grinding table.

6. The probe pin grinding apparatus according to claim 1, wherein the grinding table is detachably mounted on the base.

7. The needle grinding apparatus of the probe according to claim 6, wherein the grinding table comprises a rough grinding part and a fine grinding part, and different angles are provided, and the angle range is 0 ° to 60 °.

8. The probe pin grinding device according to claim 1, wherein the base is provided with two sets of translation assemblies, and the two sets of translation assemblies drive the grinding table to translate on the base in mutually perpendicular directions.

9. The probe pin grinding device according to claim 8, wherein the two sets of translation assemblies are two-dimensional translation stages, bases of the two-dimensional translation stages are fixed on the bases, and moving ends of the two-dimensional translation stages are connected with the grinding stage.