CN215894836U

CN215894836U - Control box and circuit aging test system

Info

Publication number: CN215894836U
Application number: CN202120716123.0U
Authority: CN
Inventors: 张敏环; 刘维斌
Original assignee: Wuhan Liangan Technology Co ltd
Current assignee: Wuhan Liangan Technology Co ltd
Priority date: 2021-04-08
Filing date: 2021-04-08
Publication date: 2022-02-22
Anticipated expiration: 2031-04-08

Abstract

The utility model relates to the technical field of circuit board aging, and discloses a control box and a circuit aging test system, wherein the control box comprises a box body, a control board and at least one switch board are arranged in the box body, and at least one first through hole is formed in the box body; the switch board is used for being connected with at least one aging test device through a first through hole, wherein one first through hole corresponds to one aging test device; and the control board is used for connecting at least one switch board and is used for simultaneously controlling, partially controlling or sequentially controlling the switch boards to be disconnected and connected with the connected aging test device. The utility model solves the technical problems of high hardware cost and easy disordered knotting of wiring in the circuit aging test in the prior art.

Description

Control box and circuit aging test system

Technical Field

The utility model relates to the field of circuit aging, in particular to a control box and a circuit aging test system.

Background

The requirements of automobile electronic products on quality and service life are very strict, and the aging of the electronic products leads semiconductors in the electronic products to carry out overload work, so that the defects of the electronic products appear in a short time, and the electronic products are prevented from being out of order in the using process after leaving factories. In order to improve the yield of the electronic product, the internal circuit board must be subjected to aging test for a certain period of time.

The single computer is connected with a single FCT (Functional Circuit Test) device, the single FCT device is connected with the Circuit board, and the single computer carries out aging Test on the Circuit board through the FCT device. One computer corresponds to one FCT device, and one FCT device corresponds to a limited number of circuit boards, so if aging test is performed on a large number of circuit boards, a plurality of FCT devices and a plurality of corresponding computers are needed, which causes high hardware cost, troublesome operation and time consumption.

And when using many FCT devices to carry out aging testing to a large amount of circuit boards, need artifical manual many FCT devices to be connected to many computers that correspond, after the computer is accomplished circuit board aging testing, because the wiring of a large amount can intertwine knot, lead to the corresponding relation between computer, FCT device and the circuit board can be very chaotic to lead to the wiring misconnection easily, consequently, when the circuit board appears ageing failure, can't find this trouble circuit board fast accurately.

SUMMERY OF THE UTILITY MODEL

Aiming at the defects in the prior art, the utility model provides a control box and a circuit aging test system, which can solve the technical problems that the hardware cost is high and wiring is easy to be disordered and knotted when a large number of circuit boards are subjected to aging test in the prior art.

The utility model provides a control box in a first aspect, which comprises a box body, wherein a control plate and at least one switch plate are arranged in the box body, and at least one first through hole is formed in the box body;

the switch board is used for being connected with at least one aging test device through the first through holes, wherein one first through hole corresponds to one aging test device;

the control board is used for being connected with the at least one switch board and is used for simultaneously controlling, partially controlling or sequentially controlling the switch boards and the aging test device connected with the switch boards to be disconnected and connected.

Optionally, a controller is arranged on the control panel, and a switch panel control switch is arranged on the switch panel; the controller is connected with one end of the switch board control switch on each switch board and is used for simultaneously controlling, partially controlling or sequentially controlling the on-off of each switch board.

Optionally, an enabling selection switch and at least one connection terminal are further arranged on the switch board, the other end of the switch board control switch is connected with one end, corresponding to the enabling selection switch, of the switch board, the other end of the enabling selection switch is respectively connected with the at least one connection terminal corresponding to the switch board, the connection terminal is used for being connected with the aging test device, and the controller is further used for simultaneously controlling, partially controlling or sequentially controlling the enabling selection switch and each connection terminal to be disconnected and connected.

Optionally, the control box further includes a display module disposed outside the box body, the box body is further provided with a second through hole, and the display module is connected to the controller through the second through hole and is configured to display at least one set of status data acquired by the controller from the at least one circuit to be tested.

Optionally, the control box further comprises a prompt module, and the controller is connected to the prompt module and is configured to control the prompt module to generate and send a prompt signal when detecting that the circuit to be tested has a fault.

Optionally, the control box further includes a communication module, and the controller is connected to the communication module and configured to forward at least one set of the status data through the communication module.

Optionally, the control board and the at least one switch board are layered up and down.

Optionally, the control box further comprises at least one connecting piece, and the control panel and the at least one switch board are detachably connected or fixedly connected through the connecting piece.

Optionally, the control box further includes at least one detachable interface, an interface end of the detachable interface is disposed outside the first through hole, and is configured to be connected to the aging test device, and a connection end of the detachable interface is connected to the connection terminal corresponding to the first through hole on the switch board.

The utility model provides a circuit aging test system in a second aspect, which comprises any one of the control box and at least one aging test device; the control box is connected with the aging test device and used for performing aging test on at least one circuit to be tested through the aging test device and acquiring at least one group of state data obtained through the aging test.

The utility model discloses a control box.A control panel and at least one switch board are arranged in a box body of the control box, and the box body is provided with at least one first through hole; the switch board is used for being connected with at least one aging test device through a first through hole, wherein one first through hole corresponds to one aging test device; the control board is connected with at least one switch board and is used for simultaneously controlling, partially controlling or sequentially controlling the switch boards to be disconnected and connected with the connected aging test device. Because the control panel and a plurality of switch boards set up inside the box, only need be connected to the switch board that first through-hole corresponds with aging testing device's wiring, just can be simultaneously, partly or aging testing circuit to be tested in proper order, only use a control panel promptly rather than a plurality of control panels (or many computers) just can pass through a plurality of aging testing device aging testing circuit to be tested. And can realize the orderly management to a large amount of aging testing device's wiring through first through-hole on the box, avoid a large amount of wiring winding to tie a knot, consequently, when the control box is ageing to a plurality of circuit that await measuring when accomplishing, just can find the aging testing device that first through-hole corresponds and the circuit that awaits measuring that corresponds fast. When the circuit to be tested has a fault, the circuit to be tested with the fault can be quickly and accurately found through the first through hole.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.

Fig. 1 is a schematic structural diagram of a circuit to be tested in a control box aging test according to a first embodiment of the present invention;

fig. 2 is a schematic structural diagram of a control box according to a second embodiment of the present invention;

fig. 3 is a schematic structural diagram of a control board and a switch board in a control box according to a third embodiment of the present invention;

fig. 4 is a schematic diagram of the operation of the control box according to the fourth embodiment of the present invention.

Detailed Description

In order to make the objects, features and advantages of the present invention more apparent and understandable, the embodiments of the present invention will be described in detail and completely with reference to the accompanying drawings, and it is to be understood that the embodiments are only a part of the embodiments of the present invention, and not all of the embodiments are described. All other embodiments, which can be obtained by a person skilled in the art without making creative efforts based on the embodiments of the present invention, belong to the protection scope of the present invention.

Referring to fig. 1, fig. 1 is a schematic structural diagram of a circuit to be tested for burn-in test of a control box according to an embodiment of the present invention.

As shown in fig. 1, a first aspect of the present invention provides a control box 10 for connecting with at least one burn-in test apparatus 20, wherein the burn-in test apparatus 20 is connected with at least one circuit under test 30.

In the prior art, the aging test apparatus 20 includes an FCT apparatus, the circuit 30 to be tested is a circuit board, a computer is connected to at least one circuit 30 to be tested through an FCT apparatus, a load end of the FCT apparatus is fixedly connected to a load board, and a plurality of pins on a test end of the FCT apparatus are used for being in contact connection with the contacts to be tested of the plurality of circuits 30 to be tested. The FCT device provides a simulated operating environment (excitation and load) for the circuit 30 to be tested, so that the circuit 30 to be tested can work in various design states, and parameters of various design states are obtained to verify the performance of the circuit 30 to be tested.

After the computer completes the burn-in test of the circuit to be tested 30 through the FCT device, the test end of the FCT device can be separated from the circuit to be tested 30 by manual or machine control. However, the number of interfaces on one computer is limited, and one computer can only be connected with one FCT device, so that only a limited number of circuits to be tested 30 can be burn-in tested, and if a large number of circuits to be tested 30 are to be burn-in tested, the number of computers can only be increased, which increases the hardware cost.

Referring to fig. 2 to fig. 3, fig. 2 is a schematic structural diagram of a control box according to a second embodiment of the present invention; fig. 3 is a schematic structural diagram of a control board and a switch board in a control box according to a third embodiment of the present invention.

As shown in fig. 2 to 3, the control box 10 provided by the present invention includes a box body 3, a control board 1 and at least one switch board 2 are disposed in the box body 3, and at least one first through hole (not shown in fig. 2 to 3) is opened on the box body 3.

The switch board 2 is used for connecting at least one aging test device 20 through first through holes, wherein one first through hole corresponds to one aging test device 20. Of course, in other embodiments of the present invention, one first through hole may correspond to a plurality of burn-in test apparatuses 20.

And the control board 1 is used for being connected with at least one switch board 2 and is used for simultaneously controlling, partially controlling or sequentially controlling the switch boards 2 to be disconnected and connected with the connected aging test device 20.

The control panel 1 and the plurality of switch boards 2 can be arranged according to a certain rule, preferably, the control panel 1 and the plurality of switch boards 2 can be integrated into an integrated machine, optionally, the control panel 1 can be arranged outside the integrated machine, so that a user can perform aging test on the circuit 30 to be tested through the control panel 1. For example, the plurality of switch boards 2 are attached or arranged at a predetermined distance from left to right or from high to low, and the plurality of switch boards 2 are sequentially numbered from left to right, from right to left, from high to low, or from low to high, or may be randomly numbered, so that the priority from high to low or from low to high is set according to the order of the numbers from small to large. It is of course also possible to set priorities to a plurality of switch boards 2 according to their performance, model, operating speed, etc. The controller 11 controls the on and off of each switch board 2 simultaneously, partially and sequentially according to the priority, and the controller 11 also performs aging test on the plurality of circuits to be tested 30 simultaneously, partially and sequentially according to the priority.

Of course, in other embodiments of the present invention, the control board 1 may also simultaneously control, partially control, and sequentially control the on and off of the power supply of each switch board 2, so as to implement the burn-in test of the corresponding at least one circuit under test 30 simultaneously, partially, and sequentially through each burn-in test apparatus 20.

Each switch board 2 is connected to at least one burn-in test apparatus 20, so that the control board 1 can also control, partially control, and sequentially control the on and off of the power supply of the corresponding burn-in test apparatus 20, thereby implementing simultaneous, partial, and sequential burn-in tests of the plurality of circuits to be tested 30 connected to the burn-in test apparatus 20. Preferably, each switch board 2 may be provided with a plurality of switches, and the plurality of switches may be turned on and off simultaneously, partially, and sequentially, so as to realize simultaneous, partial, and sequential aging testing of the plurality of to-be-tested circuits 30. Preferably, the output of each switch may be configured as a different type of interface to a different type of burn-in tester 20.

The utility model discloses a control box, wherein a control panel and at least one switch board are arranged in a box body of the control box, and the box body is provided with at least one first through hole; the switch board is used for being connected with at least one aging test device through a first through hole, wherein one first through hole corresponds to one aging test device; the control board is connected with at least one switch board and is used for simultaneously controlling, partially controlling or sequentially controlling the switch boards to be disconnected and connected with the connected aging test device. Because the control panel and a plurality of switch boards set up inside the box, only need be connected to the switch board that first through-hole corresponds with aging testing device's wiring, just can be simultaneously, partly or aging testing circuit to be tested in proper order, only use a control panel promptly rather than a plurality of control panels (or many computers) just can pass through a plurality of aging testing device aging testing circuit to be tested. And can realize the orderly management to a large amount of aging testing device's wiring through first through-hole on the box, avoid a large amount of wiring winding to tie a knot, consequently, when the control box is ageing to a plurality of circuit that await measuring when accomplishing, just can find the aging testing device that first through-hole corresponds and the circuit that awaits measuring that corresponds fast. When the circuit to be tested has a fault, the circuit to be tested with the fault can be quickly and accurately found through the first through hole.

Referring to fig. 4, fig. 4 is a schematic diagram of a control box according to a fourth embodiment of the present invention.

Further, as shown in fig. 4, the controller 11 is disposed on the control board 1, and the switch board control switch 21 is disposed on the switch board 2. The controller 11 is connected to one end of the switch board control switch 21 on each switch board 2, and is used for controlling the on and off of each switch board 2 simultaneously, partially or sequentially. Of course, in other embodiments of the present invention, the switch board control switch 21 may also be a power control switch of the switch board 2, and the controller 11 may also control, partially control, or sequentially control the on and off of the power of each switch board 2.

Further, as shown in fig. 4, the switch board 2 is further provided with an enable selection switch 22 and at least one connection terminal 23, the other end of the switch board control switch 21 is connected to one end of the enable selection switch 22 on the corresponding switch board 2, the other end of the enable selection switch 22 is respectively connected to the at least one connection terminal 23 on the corresponding switch board 2, the connection terminal 23 is used for being connected to the aging test device 20, and the controller 11 is further used for simultaneously controlling, partially controlling or sequentially controlling the connection and disconnection between the enable selection switch 22 and each connection terminal 23.

Preferably, in an embodiment of the present invention, the controller 11 simultaneously or sequentially turns on the switch boards 2, and then controls the terminals 23 on each switch board 2 to be sequentially turned on and off. That is, one connection terminal 23 is connected in an on-state, after the controller 11 acquires the state data corresponding to at least one circuit to be tested 30 through the connection terminal 23, the connection terminal 23 is disconnected, another connection terminal 23 is connected in an on-state to acquire the state data, and then the connection terminal is disconnected, so that the connection terminal 23 is sequentially switched on or off. Of course, in other embodiments of the present invention, the connection terminals 23 may be turned on simultaneously or partially, and the state data of the circuit 30 under test corresponding to the connection terminals 23 may be acquired simultaneously or partially.

Further, as shown in fig. 2, the control box 10 further includes a display module 4 disposed outside the box 3, the box 3 is further provided with a second through hole (not shown in fig. 2 to 3), the display module 4 is connected to the controller 11 through the second through hole, and is configured to display at least one set of status data acquired by the controller 11 from at least one circuit to be tested 30, so that a user can intuitively know various statuses of the circuit to be tested 30, and modify an operation instruction or replace the circuit to be tested 30. Preferably, the display module 4 may include a display screen such as a touch screen, and a user may directly send various instructions through the touch screen to implement the aging test on the circuit to be tested 30, where the various instructions include instructions to start, stop, end, test, and age.

The state data here includes the first state data and the second state data described above.

The first status data includes data on whether the circuit under test 30 is properly connected, whether an initial fault has occurred, whether aging is required, and the like. The improper connection of the circuit under test 30 includes no connection between the circuit under test 30 and the burn-in tester 20, bad contact, open circuit of the wire, short circuit of the wire, mismatch of the model, and the like. The initial faults include faults such as short circuit, open circuit, ground, connection, and polarity of the circuit under test 30 itself.

The second state data includes data such as whether the circuit 30 to be tested has completed aging or has an aging fault, which is a fault occurring due to aging, wear, fatigue, etc. of an element on the circuit 30 to be tested, thereby causing the function of the circuit 30 to be tested to be deteriorated or lost.

Further, the control box 10 further includes a prompt module (not shown in fig. 2 to 3), and the controller 11 is connected to the prompt module, and is configured to control the prompt module to generate and send a prompt signal when detecting that the circuit 30 to be tested has a fault. The first signal to the fifth signal sent by the prompting module comprise various signals such as sound, video screen, image, character, symbol, light, vibration and the like.

Further, the control box 10 further comprises a communication module (not shown in fig. 2 to 3), and the controller 11 is connected with the communication module wirelessly and/or by wire, and is used for forwarding at least one set of status data through the communication module.

The communication module has wireless communication and wired communication functions, and the controller 11 can send status data to a communication device of a user, such as a notebook computer, a mobile phone, a tablet computer, etc., through the communication module to prompt the user whether the circuit 30 to be tested is aged or not and whether a fault occurs or not, so that the user can conveniently process the circuit 30 to be tested in time under the inconvenient conditions of long distance, etc.

Further, the control box 10 further includes at least one timer (not shown in fig. 2 to 3) disposed outside the box 3, the box 3 further has a third through hole (not shown in fig. 2 to 3), and the timer is connected to the controller 11 through the third through hole for timing when the aging test apparatus 20 performs aging. And the position of the third through hole is arranged corresponding to the position of the first through hole.

In an embodiment of the present invention, the plurality of connection terminals 23 on each switch board 2 correspond to a horizontal row or a vertical row of first through holes on the box 3, respectively, and the timer is disposed at the head end or the tail end of the horizontal row or the vertical row of first through holes, and the aging test time of the circuit 30 to be tested corresponding to each row of first through holes can be set by each row of timer, and since the aging time of the circuit 30 to be tested corresponding to each row of first through holes may be different, when the aging or the second test of the circuit 30 to be tested corresponding to a certain row of first through holes is completed, the user can be prompted whether the circuit 30 to be tested corresponding to the row of first through holes is aged or fails.

Further, the control box 10 further includes a power supply module (not shown in fig. 2 to 3) for supplying power to the control board 1, the switch board 2, the display module 4, the prompt module, the communication module, and the timer. The aging test devices 20 are connected to the switch board 2 corresponding to the first through hole of the control box 10, and when the aging test devices 20 are connected with the circuits 30 to be tested, the power module supplies power to the aging test devices 20 and the circuits 30 to be tested, so that the condition that the aging test devices 20 are additionally connected with the power supply is avoided, and the phenomenon that a plurality of power lines and a plurality of wires are wound and knotted is avoided.

Further, as shown in fig. 3, the control board 1 and the at least one switch board 2 are layered on top of each other. Preferably, the control board 1 is disposed on the top of at least one switch board 2, and of course, the control board 1 may be disposed between a plurality of switch boards 2 or on the bottom of at least one switch board 2. Preferably, the switch boards 2 may be numbered sequentially from small to large or from large to small in order from top to bottom, from bottom to top, from left to right or from right to left. The terminals 23 on the switchboard 2 may also be numbered. Of course, the first through holes corresponding to the connection terminals 23 may also be numbered in a one-to-one correspondence. The switch board 2, the connection terminal 23 and the first through hole are labeled so that a user can conveniently and quickly find the failed circuit 30 to be tested.

Further, as shown in fig. 3, the control box 10 further includes at least one connection member 5, the control panel 1 is connected with the at least one switch panel 2, and the connection member 5 is detachably connected or fixedly connected. Preferably, the control panel 1 and the plurality of switch boards 2 are square plates or rectangular plates, fourth through holes are formed in the right angles of four corresponding positions of the control panel 1 and the plurality of switch boards 2, the preferred fourth through holes are threaded holes, and the connecting piece 5 is a stud. Preferably, four supporting sleeves are further arranged between each two plates and are respectively sleeved on the four studs to support the control plate 1 and the switch plates 2, so that short circuit or collision damage caused by direct contact between the plates is avoided.

Further, as shown in fig. 2, the control box 10 further includes at least one detachable interface 6, an interface end of the detachable interface 6 is disposed outside the first through hole and is used for being connected to the aging test device 20, and a connection end of the detachable interface is connected to a connection terminal 23 on the switch board 2 corresponding to the first through hole. It should be noted that different types of the detachable interfaces 6 can be replaced on the first through holes according to different types of the burn-in test apparatuses 20, so as to burn-in test different types of the circuits 30 to be tested.

Preferably, the control box 10 can also be connected to a PCI (Peripheral Component Interconnect) board connector of a computer through a DB25 connector, so as to perform data transmission.

In one embodiment of the present invention, as shown in fig. 3, a control board 1 and a plurality of switch boards 2 are fixedly installed in a control box 10 in a stacked manner layer by layer, and the connection terminals 23 are sequentially numbered from top to bottom according to the stacking order of the switch boards 2. Each switchboard 2 has 8 terminals 23, each terminal 23 being connected to a DC3-12 connection. A plurality of DB15 male connectors are fixedly installed on the opening of the control box 10, the DB15 male connectors are connected to the DC3-12 connectors of each switch board 2 inside the control box 10 through DB15 connecting lines, and the communication lines of each switch board 2 are connected in parallel to the control board 1 on the top layer by layer through pin headers.

8 DC3-12 connectors of each switch board 2 are correspondingly connected to 8 DB15 male connectors on the box body 3, communication wires of 8 FCT devices are led out and then are connected to corresponding DB15 male connectors on the control box 10 through DB15 connectors, namely, each switch board 2 can be connected with 8 FCT devices, and each FCT device can detect 6 circuit boards.

Each circuit board communication line is a high-bit data line and a low-bit data line. Each of the terminals 23 has 6 sets of corresponding high and low data pins, and 6 sets of communication lines of 6 circuit boards connected to the FCT device, respectively, connected to the FCT device so as to correspond to the switch board 2.

The power line and the communication line of each switch board 2 are connected in parallel, the bases are welded on the front and back surfaces of each switch board 2, the switch boards are connected in parallel layer by layer through contact pins, and finally the switch boards are connected to the control board 1 on the uppermost layer. Referring to fig. 3 to 4, 8 sets of communication lines corresponding to 8 connection terminals 23 on each switch board 2 are connected to a PCI board of a CAN (controller area network) port of a computer terminal for data transmission.

Each switch board 2 has a switch board control switch 21, the control lines are led out by connectors, and finally the control lines of all switch boards 2 are connected to the corresponding interfaces on the control board 1 by using DC3-34 terminals.

Each switch board 2 is represented by B0-B31, switch board control switches 21 for storing 32 switch single boards are reserved, 256 FCT devices can be connected and controlled, and 1536 circuit boards can be subjected to aging test.

Each switch board 2 is provided with an enable selection switch 22 for selecting and switching 8 connection terminals 23, and the enable selection switches 22 of each switch board 2 are connected in parallel layer by layer through pins and connected to the control board 1 to be controlled by the controller 11.

The main switches B0-B31 on the control panel 1 respectively control the switch boards 2 of No. 1-32, the enabling selection switch 22 is an analog switch of 1-8, 8 connection terminals 23 on the switch board 212 are sequentially opened, and each connection terminal 23 controls 1 FCT device.

The master switch B0-B31 controls the switch board 2 and the connecting terminal 23 which need to be tested, sequentially turns on the enable selection switch 22 on the B0 and the No. 1 switch board 2, reads the state data of the 6 circuit boards corresponding to the No. 1 connecting terminal 23 on the No. 1 switch board 2, then reads the state data of the 6 circuit boards corresponding to the No. 2 connecting terminal 23 on the No. 1 switch board 2, … …, and finally reads the state data of the 6 circuit boards corresponding to the No. 8 connecting terminal 23 on the No. 1 switch board 2.

The B1 and the enable selection switch 22 on the switch board No. 2-32 are sequentially turned on, and the reading process sequentially reads the status data of the 6 circuit boards corresponding to the 8 connection terminals 23 on the switch board No. 2-32 as described above.

The status data of all circuit boards corresponding to all the connection terminals 23 on the 32 switch boards 2 are sequentially switched and read, and the process is controlled by the controller 11, and is automatically switched, and one set of data is updated every 50 milliseconds. Since 50 milliseconds is very small, it can be seen that 8 terminals 23 on each switch board 2 are open simultaneously.

It should be noted that the control box 10 provided by the present invention also corresponds to a burn-in test method, which includes:

s101, responding to an instruction of a user for aging testing of the circuit to be tested 30, and simultaneously, partially or sequentially carrying out first testing on a plurality of circuits to be tested 30; the instructions of the user burn-in test of the circuit under test 30 include: start, stop, end, test, burn-in, etc.

S102, judging whether each circuit to be tested 30 is connected correctly according to first state data obtained by carrying out first test on each circuit to be tested 30; the first state data includes data of whether each circuit under test 30 is correctly connected, whether an initial fault occurs, whether aging is required, and the like. The improper connection of the circuit under test 30 includes no connection between the circuit under test 30 and the burn-in tester 20, bad contact, open circuit of the wire, short circuit of the wire, mismatch of the model, and the like.

S103, if the circuit to be tested 30 is incorrectly connected, sending a first prompt signal to prompt a user to correctly connect the circuit to be tested 30 to the corresponding aging test device 20 according to parameters such as the model of the circuit to be tested 30; if the circuit to be tested 30 is still incorrectly connected after prompting for n times, marking the circuit to be tested 30 and not sending out the first prompt signal; preferably, n is selected to be 3.

S104, if the circuit to be tested 30 is correctly connected, whether the circuit to be tested 30 has an initial fault or not is continuously judged according to the first state data;

s105, if the circuit to be tested 30 has an initial fault, sending a second prompt signal to prompt a user that the circuit to be tested 30 has the initial fault, and automatically disconnecting the circuit to be tested 30 having the initial fault; the initial faults include faults such as short circuit, open circuit, ground, connection, and polarity of the circuit under test 30 itself. Whether the circuit to be tested 30 has an initial fault or not is judged through the first test, and the circuit to be tested is prevented from being aged again.

S106, if the circuit to be tested 30 does not have the initial fault, continuously judging whether other circuits to be tested 30 need to be aged or not according to the first state data;

s107, if the circuit to be tested 30 does not need to be aged, automatically disconnecting the circuit to be tested 30 which does not need to be aged;

s108, if the circuit 30 to be tested needs to be aged, obtaining preset aging time of different circuits 30 to be tested according to the first state data, and aging the corresponding circuits 30 to be tested simultaneously, partially or sequentially;

different circuits to be tested 30 are suitable for electrical equipment with different powers, some circuits to be tested 30 such as mobile phone circuits and the like only need to be tested once and do not need to be aged, and other circuits to be tested 30 such as automobile circuits and the like need to be aged at different degrees and different times.

S109, judging whether the aging time of each circuit to be tested 30 reaches the corresponding preset aging time, and if so, performing a second test on the corresponding circuit to be tested 30 simultaneously, partially or sequentially;

different circuits to be tested 30 need different aging times, and the preset aging times are also different, and if the aging times of different circuits to be tested 30 exceed or are less than the corresponding preset aging times, the yield of the circuits to be tested 30 may be reduced.

S110, judging whether the time of the circuit to be tested 30 for completing the second test reaches the maximum preset test time, and if not, judging whether the corresponding circuit to be tested 30 has an aging fault according to second state data obtained by performing the second test on the corresponding circuit to be tested 30; the maximum preset test time is greater than the maximum preset aging time, the second state data is the final state data of the circuit to be tested 30 after aging is completed, the second state data includes data of whether the circuit to be tested 30 completes aging or not, whether an aging fault occurs or not, and the aging fault refers to a fault occurring when an element on the circuit to be tested 30 ages, wears, fatigues, and the like, so that the function of the circuit to be tested 30 is deteriorated or lost.

S111, if the corresponding circuit to be tested 30 has an aging fault, sending a third prompt signal to prompt a user that the corresponding circuit to be tested 30 has the aging fault, and executing the step S109 on the next circuit to be tested 30;

s112, if the corresponding circuit to be tested 30 has no aging fault, executing the step S109 on the next circuit to be tested 30;

s113, if the time for the circuit to be tested 30 to complete the second test reaches the maximum preset test time, stopping aging all the circuits to be tested 30, and sending a fourth prompt signal to prompt the user that all the circuits to be tested 30 have completed aging.

The first signal to the fifth signal sent by the prompting module comprise various signals such as sound, video screen, image, character, symbol, light, vibration and the like.

Through steps S109 to S113, the second test can be performed on the circuit to be tested 30 that has completed the aging earlier, and certainly in other embodiments of the present invention, when other circuits to be tested 30 still undergo aging, the circuit to be tested 30 that has completed the second test can be replaced with other circuits to be tested 30 in time, and the aging test is continued on the replaced circuit to be tested 30.

The utility model discloses a control box, which comprises a control board and at least one switch board arranged in a box body of the control box, wherein the box body is provided with at least one first through hole; the switch board is used for being connected with at least one aging test device through a first through hole, wherein one first through hole corresponds to one aging test device; the control board is connected with at least one switch board and is used for simultaneously controlling, partially controlling or sequentially controlling the switch boards to be disconnected and connected with the connected aging test device. Because the control panel and a plurality of switch boards set up inside the box, only need be connected to the switch board that first through-hole corresponds with aging testing device's wiring, just can be simultaneously, partly or aging testing circuit to be tested in proper order, only use a control panel promptly rather than a plurality of control panels (or many computers) just can pass through a plurality of aging testing device aging testing circuit to be tested. And can realize the orderly management to a large amount of aging testing device's wiring through first through-hole on the box, avoid a large amount of wiring winding to tie a knot, consequently, when the control box is ageing to a plurality of circuit that await measuring when accomplishing, just can find the aging testing device that first through-hole corresponds and the circuit that awaits measuring that corresponds fast. When the circuit to be tested has a fault, the circuit to be tested with the fault can be quickly and accurately found through the first through hole. In the second aspect, the control box is further provided with a prompting module and a communication module which can prompt a user whether the circuit to be tested is aged or not and whether the circuit to be tested breaks down or not, and the communication module is convenient for the user to timely process the circuit to be tested under the inconvenient conditions of long distance and the like. In the third aspect, the detachable interfaces of different types are replaced on the first through hole to match with the corresponding aging test device, so that the circuits to be tested of different types can be simultaneously subjected to aging test.

In a second aspect of the present invention, with reference to fig. 1, the apparatus includes the above-mentioned control box 10 and at least one burn-in testing apparatus 20, where the control box 10 is connected to the burn-in testing apparatus 20, and is configured to perform a burn-in test on at least one circuit under test 30 through the burn-in testing apparatus 20, and obtain at least one set of status data obtained by the burn-in test.

The circuit aging test system provided by the utility model can also increase, reduce or replace aging test devices 20 of various types, thereby correspondingly increasing, reducing or replacing the circuits to be tested 30 of corresponding types. One burn-in test apparatus 20 is connected to correspond to one or more circuits under test 30. Preferably, the same type of circuit under test 30 can be docked to the same type of burn-in tester 20.

The circuit aging test system provided by the utility model can adopt a test-aging-test process to age a single or a plurality of circuits to be tested 30, wherein the aging state data is not acquired and displayed in real time in the aging process because the aging state data generated when the plurality of circuits to be tested 30 are aged is overlarge, and the controller 11 acquires and displays the final second state data of the plurality of circuits to be tested 30 only during the second test.

The single FCT device is low in testing efficiency, the circuit aging testing system provided by the utility model meets the requirement of multi-channel CAN data communication, CAN be used for aging testing of 1536 circuit boards simultaneously, and CAN be used for checking channel data corresponding to each circuit board (namely status data of a plurality of circuit boards corresponding to each wiring terminal 23) at any time to know a testing result and testing data in time.

The utility model discloses a circuit aging test system.A control board and at least one switch board are arranged in a box body of a control box, and the box body is provided with at least one first through hole; the switch board is used for being connected with at least one aging test device through a first through hole, wherein one first through hole corresponds to one aging test device; the control board is connected with at least one switch board and is used for simultaneously controlling, partially controlling or sequentially controlling the switch boards to be disconnected and connected with the connected aging test device. Because the control panel and a plurality of switch boards set up inside the box, only need be connected to the switch board that first through-hole corresponds with aging testing device's wiring, just can be simultaneously, partly or aging testing circuit to be tested in proper order, only use a control panel promptly rather than a plurality of control panels (or many computers) just can pass through a plurality of aging testing device aging testing circuit to be tested. And can realize the orderly management to a large amount of aging testing device's wiring through first through-hole on the box, avoid a large amount of wiring winding to tie a knot, consequently, when the control box is ageing to a plurality of circuit that await measuring when accomplishing, just can find the aging testing device that first through-hole corresponds and the circuit that awaits measuring that corresponds fast. When the circuit to be tested has a fault, the circuit to be tested with the fault can be quickly and accurately found through the first through hole. In the second aspect, the control box is further provided with a prompting module and a communication module which can prompt a user whether the circuit to be tested is aged or not and whether the circuit to be tested breaks down or not, and the communication module is convenient for the user to timely process the circuit to be tested under the inconvenient conditions of long distance and the like. In the third aspect, the detachable interfaces of different types are replaced on the first through hole to match with the corresponding aging test device, so that the circuits to be tested of different types can be simultaneously subjected to aging test.

In the above embodiments, the description of each embodiment has its own emphasis, and for parts not described in detail in a certain embodiment, reference may be made to the description of other embodiments. In view of the above description of the control box and the circuit aging test system provided by the present invention, those skilled in the art will recognize that there are variations in the embodiments and applications of the concept of the present invention, and in summary, the present disclosure should not be construed as limiting the present invention.

Claims

1. A control box is characterized by comprising a box body, wherein a control panel and at least one switch board are arranged in the box body, and at least one first through hole is formed in the box body;

2. The control box of claim 1, wherein the control panel is provided with a controller, and the switch board is provided with a switch board control switch; the controller is connected with one end of the switch board control switch on each switch board and is used for simultaneously controlling, partially controlling or sequentially controlling the on-off of each switch board.

3. The control box according to claim 2, wherein an enable selection switch and at least one connection terminal are further disposed on the switch board, another end of the switch board control switch is connected to one end of the enable selection switch on the corresponding switch board, another end of the enable selection switch is respectively connected to the at least one connection terminal on the corresponding switch board, the connection terminals are used for being connected to the aging test device, and the controller is further used for simultaneously controlling, partially controlling or sequentially controlling the enabling selection switch and each connection terminal to be turned off and on.

4. The control box of claim 3, further comprising a display module disposed outside the box body, wherein the box body is further provided with a second through hole, and the display module is connected to the controller through the second through hole and is configured to display at least one set of status data acquired by the controller from the at least one circuit to be tested.

5. The control box of claim 4, further comprising a prompt module, wherein the controller is connected to the prompt module and is configured to control the prompt module to generate and send a prompt signal when a fault is detected in the circuit to be tested.

6. The control box of claim 5, further comprising a communication module, wherein the controller is coupled to the communication module for forwarding at least one set of the status data through the communication module.

7. The control box of claim 6, wherein the control board and the at least one switch board are layered above one another.

8. The control box of claim 7, further comprising at least one connector, wherein the control board is detachably or fixedly connected with the at least one switch board through the connector.

9. The control box of claim 8, further comprising at least one detachable interface, wherein an interface end of the detachable interface is disposed outside the first through hole for connecting with the burn-in tester, and a connection end of the detachable interface is connected with the connection terminal corresponding to the first through hole on the switch board.

10. A circuit burn-in test system comprising a control box according to any one of claims 1 to 9 and at least one burn-in test apparatus; the control box is connected with the aging test device and used for performing aging test on at least one circuit to be tested through the aging test device and acquiring at least one group of state data obtained through the aging test.