CN215866503U - Probe system for improving accuracy rate of eddy current detection metal defects - Google Patents
Probe system for improving accuracy rate of eddy current detection metal defects Download PDFInfo
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- CN215866503U CN215866503U CN202122162844.4U CN202122162844U CN215866503U CN 215866503 U CN215866503 U CN 215866503U CN 202122162844 U CN202122162844 U CN 202122162844U CN 215866503 U CN215866503 U CN 215866503U
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Abstract
The utility model relates to a probe system for improving the accuracy of eddy current detection on metal defects, which comprises an eddy current detection system, a central processing unit, an infrared distance sensor and an acceleration and gyroscope sensor, wherein the eddy current detection system comprises a central processing unit, a central processing unit and a probe; the probe is divided into an upper part and a lower part, wherein the upper part is provided with a central processing unit, the lower part is provided with an infrared distance sensor and an acceleration and gyroscope sensor near the bottom, the middle part of the lower part is provided with an eddy current detection system, and the eddy current detection system is provided with an exciting coil and a receiving coil. The utility model has the beneficial effects that: the probe system is provided with the eddy current detection system, the motion state and lift-off height sensing module and the central processing unit, and the motion state data, the lift-off distance data and other data are measured through the infrared distance sensor and the acceleration and gyroscope sensor, so that the detection accuracy is improved.
Description
Technical Field
The utility model relates to a system for improving the accuracy of eddy current testing technology, in particular to a probe system for improving the accuracy of eddy current testing metal defect testing based on various sensors.
Background
The method for detecting and alarming the defects and cracks on the near surface of the conductor by using the electromagnetic eddy current is a common nondestructive detection method for metal materials. The method has the characteristics of high sensitivity, wide test object and high response speed, and can quickly detect the defect condition and characteristic information of the surface or shallow surface of the metal object to be tested. At present, for a limited detection space, a large-volume auxiliary detection tool is difficult to place, a handheld detection probe is usually needed, and for an electromagnetic eddy current detection method, a lift-off effect, a detection scanning rate and an angle all have obvious influences on a detection result and detection accuracy, and false alarm and wrong report conditions are often caused by improper operation mode during detection, so that a detection signal needs to be compensated according to motion state data of the detection probe, the false alarm rate of detection is reduced, and the detection accuracy rate is improved.
The existing anti-lift-off effect method generally adopts a method of multiple reference coils or multiple excitation frequencies for compensation, the method has high requirements on signal processing, and a processing chip is required to simultaneously process multiple paths of frequency data and simultaneously perform multiple paths of modulation and demodulation processing. This method has very limited compensation for scanning speed, still has a high false alarm rate, and still needs a test auxiliary device to assist the measurement process.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a probe system for improving the accuracy of eddy current detection on metal defects, aiming at the defect of high false alarm rate caused by probe motion change in scanning operation in the existing electromagnetic eddy current detection technology.
The probe system for improving the accuracy of eddy current detection on metal defects comprises an eddy current detection system, a central processing unit, an infrared distance sensor and an acceleration and gyroscope sensor; the probe is divided into an upper part and a lower part, wherein the upper part is provided with a central processing unit, the lower part is provided with an infrared distance sensor and an acceleration and gyroscope sensor near the bottom, the middle part of the lower part is provided with an eddy current detection system, and the eddy current detection system is provided with an exciting coil and a receiving coil.
Preferably, the method comprises the following steps: the central processing unit is connected with the eddy current detection system.
Preferably, the method comprises the following steps: the data interface of the acceleration and gyro sensor is connected to the central processing unit.
Preferably, the method comprises the following steps: the data interface of the infrared distance sensor is connected to the central processing unit.
Preferably, the method comprises the following steps: the infrared distance sensor is positioned on the bottom surface of the probe.
Preferably, the method comprises the following steps: the acceleration and the gyroscope sensor are positioned on one side of the bottom of the probe.
The utility model has the beneficial effects that: the probe system is provided with the eddy current detection system, the motion state and lift-off height sensing module and the central processing unit, and the motion state data, the lift-off distance data and other data are measured through the infrared distance sensor and the acceleration and gyroscope sensor, so that the detection accuracy is improved.
Drawings
FIG. 1 is a schematic mechanical diagram of a probe;
FIG. 2 is a block diagram of the probe structure.
Description of reference numerals: the device comprises an eddy current detection system 1, a central processing unit 2, an infrared distance sensor 3, an acceleration and gyroscope sensor 4, an exciting coil 5, a receiving coil 6, a probe 7 and a measured piece 8.
Detailed Description
The present invention will be further described with reference to the following examples. The following examples are set forth merely to aid in the understanding of the utility model. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
As an embodiment, the present application provides a probe system for eddy current testing accuracy of metal defects, which includes an eddy current testing system 1, a motion state and lift-off height sensing module, and a central processing unit 2.
Fig. 1 is a schematic diagram of a mechanical structure of a probe, the probe is divided into an upper part and a lower part, wherein the upper part is mainly a central processing unit 2 of the system, the lower part is provided with an infrared distance sensor 3, an acceleration sensor and a gyroscope sensor 4 near the bottom, the middle position of the lower part is provided with an eddy current detection system 1, and the eddy current detection system 1 is provided with an exciting coil 5 and a receiving coil 6. The infrared distance sensor 3 is positioned on the bottom surface of the probe 7, and the acceleration and gyroscope sensor 4 is positioned on one side of the bottom of the probe 7.
Fig. 2 is a frame diagram of a probe structure, which includes an eddy current detection system 1, a central processing unit 2, an infrared distance sensor 3, and an acceleration and gyro sensor 4. The eddy current testing system 1 is provided with an exciting coil 5 and a receiving coil 6, and basic eddy current sensing is realized by using the exciting coil 5 and the receiving coil 6. The infrared distance sensor 3, the acceleration and the gyroscope sensor 4 form a motion state and lift-off height sensing module. The acceleration and gyro sensor 4 is mainly used to measure motion data, including three-axis acceleration data and three-axis position data, and its data interface is connected to the central processing unit 2. The infrared distance sensor 3 is connected to the central processing unit 2 after performing preliminary signal processing, and its function is to measure the lift-off distance in the scanning process and feed back to the central processing unit 2.
The user only needs to use the detection probe to carry out handheld scanning work on the metal surface, and the part provided with the infrared distance sensor 3 and the acceleration and gyroscope sensor 4 faces downwards and is close to the surface of the measured piece 8. The system can ensure the detection accuracy in the detection work, and maximally reduces the training difficulty and workload of daily detection personnel.
The system of the utility model is provided with a motion state and distance detection sensor on the electromagnetic eddy current detection probe, and compensates the data of metal defect detection by using data of motion state, lifting distance and the like, thereby improving the detection accuracy.
Claims (6)
1. A probe system for eddy current testing metal defect accuracy rate is characterized in that: the system comprises an eddy current detection system (1), a central processing unit (2), an infrared distance sensor (3) and an acceleration and gyroscope sensor (4); the probe (7) is divided into an upper part and a lower part, wherein the upper part is provided with a central processing unit (2), the lower part is provided with an infrared distance sensor (3) and an acceleration and gyroscope sensor (4) near the bottom, the middle position of the lower part is provided with an eddy current detection system (1), and the eddy current detection system (1) is provided with an exciting coil (5) and a receiving coil (6).
2. The eddy current inspection metal defect accuracy probe system of claim 1, wherein: the central processing unit (2) is connected with the eddy current detection system (1).
3. The eddy current inspection metal defect accuracy probe system of claim 1, wherein: the data interface of the acceleration and gyroscope sensor (4) is connected to the central processing unit (2).
4. The eddy current inspection metal defect accuracy probe system of claim 1, wherein: the data interface of the infrared distance sensor (3) is connected to the central processing unit (2).
5. The eddy current inspection metal defect accuracy probe system of claim 1, wherein: the infrared distance sensor (3) is positioned on the bottom surface of the probe (7).
6. The eddy current inspection metal defect accuracy probe system of claim 1, wherein: the acceleration and gyroscope sensor (4) is positioned on one side of the bottom of the probe (7).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122162844.4U CN215866503U (en) | 2021-09-08 | 2021-09-08 | Probe system for improving accuracy rate of eddy current detection metal defects |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122162844.4U CN215866503U (en) | 2021-09-08 | 2021-09-08 | Probe system for improving accuracy rate of eddy current detection metal defects |
Publications (1)
| Publication Number | Publication Date |
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| CN215866503U true CN215866503U (en) | 2022-02-18 |
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| CN202122162844.4U Active CN215866503U (en) | 2021-09-08 | 2021-09-08 | Probe system for improving accuracy rate of eddy current detection metal defects |
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| CN (1) | CN215866503U (en) |
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2021
- 2021-09-08 CN CN202122162844.4U patent/CN215866503U/en active Active
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Effective date of registration: 20220826 Address after: Room 307, No. 32, Gaoji Street, Xihu District, Hangzhou City, Zhejiang Province, 310002 Patentee after: Zhejiang Zheneng Digital Technology Co.,Ltd. Patentee after: ZHEJIANG ENERGY R & D INSTITUTE Co.,Ltd. Address before: 5 / F, building 1, No. 2159-1, yuhangtang Road, Wuchang Street, Yuhang District, Hangzhou City, Zhejiang Province Patentee before: ZHEJIANG ENERGY R & D INSTITUTE Co.,Ltd. |