CN215768858U - Tension applying device - Google Patents

Abstract

The present invention relates to a tension applying apparatus, comprising: a base; a stand comprising two half bodies slidably coupled to the base; a hold-down assembly coupled to the half-body and capable of providing a hold-down force to a sample supported by the stage to position it relative to the stage; a first force applying mechanism configured to provide a force to the stage to linearly move the two half bodies away from each other with respect to the base to stretch the sample. The tension applying device provided by the utility model has reasonable structural design, provides components which are simple in structure and easy to assemble and manufacture, and can apply uniform tension to a sample aimed at by the device, so that the phenomenon that the sample is not uniform or irreversibly deformed due to nonuniform tension application in the prior art, and further the progress of testing work is influenced, is avoided. Because no complex gear, connecting rod and other mechanisms are adopted, the device is particularly suitable for a test environment with small size and limited space.

Description

Tension applying device

Technical Field

The utility model relates to the technical field of machinery, in particular to a tension applying device applied to a micro-nano device such as a flexible film.

Background

With the improvement of material performance and preparation technology, the micro-nano device has an increasingly large effect in life of people, and flexible devices such as flexible wearable materials have wide development prospects. The flexible device is developed from a traditional rigid substrate device, and has the characteristics of light weight, transparence, flexibility and the like on the basis of keeping the performance of the device.

The influence of tensile forces on physical properties such as mechanical properties, electrical properties, and electromagnetic properties of single crystal thin films prepared on flexible substrates and self-supporting thin films obtained by removing the constraint of conventional epitaxial thin film substrates remains to be further investigated.

However, the apparatus used for the performance research of such nano devices in the prior art is generally complex, and particularly, the apparatus for applying a tensile force thereto generally employs a relatively complex mechanism such as a gear, a connecting rod, etc., which results in a high space occupation ratio of the apparatus, so that the apparatus is limited in space when used in combination with other measuring apparatuses, resulting in poor applicability.

Based on the above, a tension applying device is provided to facilitate the study of the influence of tension on the physical properties of the film, thereby overcoming the defects of the prior art.

SUMMERY OF THE UTILITY MODEL

It is therefore the object of the present invention to provide a tension applying device, by means of which the above-mentioned disadvantages of the prior art are overcome.

In order to accomplish the above object, the present invention provides a tension applying apparatus, comprising: a base; a stand comprising two half bodies slidably coupled to the base; a hold-down assembly coupled to the half-body and capable of providing a hold-down force in a face-contact manner to a sample supported by the stage to position it relative to the stage; a first force application mechanism configured to provide the stage with a force that linearly moves the two half bodies away from each other with respect to the base to uniformly stretch the sample.

In a preferred embodiment, the first force applying mechanism includes: a first positioning plate disposed on the base between the two half bodies; a first threaded bar, each of said half-bodies being provided with at least one of said first threaded bars in rotational engagement therewith; the first screw is configured to abut against the first positioning plate under an external force and to rotate relative to the half body in an axial direction thereof without displacement, thereby moving the half body screwed with the first screw away from the first positioning plate.

In a preferred embodiment, the first force applying mechanism includes: a first positioning plate disposed on the base between the two half bodies, the first positioning plate providing a tool engagement hole in a direction perpendicular to a movement direction of the half bodies to engage an external force applying tool; a first threaded bar, provided with at least one said first threaded bar in rotational engagement with said first positioning plate on the side facing said half-body; the first screw is configured to be displaced in its own axial direction and without departing from the first positioning plate when the external force applying tool engages the tool engaging hole to apply an external force to the first screw to cause it to be unscrewed out of the first positioning plate and abut the half body, thereby moving the half body abutting the first screw away from the first positioning plate.

In a preferred embodiment, the first positioning plate is centrally arranged on the base.

In a preferred embodiment, the compression assembly comprises: a body slidably engaged to the half-body; a second force applying mechanism configured to provide a pressing force to the body to slide it relative to the mount toward and against the sample, thereby enabling the mount to position the sample.

In a preferred embodiment, the second force applying mechanism includes: a second positioning plate fixed to said pedestal opposite said base, one for each of said half bodies; a second threaded rod, each of said second positioning plates being provided with at least one of said second threaded rods in rotational engagement therewith; the second screw is configured to rotate relative to the second positioning plate under an external force to abut the body to slide relative to the half body until abutting and positioning the sample.

In a preferred embodiment, a first guide groove and a first guide block which are matched with each other are arranged on the opposite surfaces of the body and the half body, and the half body slides relative to the body by utilizing the matching of the first guide block and the first guide groove.

In a preferred embodiment, the half body is of L-shaped configuration and comprises a vertical portion on which the first guide block or first guide groove is provided, and a horizontal portion on which the sample is supported.

In a preferred embodiment, the body is in a convex-shaped configuration and comprises a base portion and a protruding portion, the base portion is provided with the first guide groove or the first guide block which is in sliding fit with the vertical portion, the second screw abuts against the protruding portion, and the area of the base portion contacting the sample is smaller than or equal to the area of the horizontal portion contacting the sample side.

In a preferred embodiment, a second guide groove and a second guide block which are matched with each other are arranged on the opposite surfaces of the base and the pedestal, and the pedestal slides relative to the base by utilizing the matching of the second guide block and the second guide groove.

The tension applying device provided by the utility model has reasonable structural design, provides components which are simple in structure and easy to assemble and manufacture, and can apply uniform tension to a sample aimed at by the device, so that the phenomenon that the sample is not uniform or irreversibly deformed due to nonuniform tension application in the prior art, and further the progress of testing work is influenced, is avoided. Because no complex gear, connecting rod and other mechanisms are adopted, the device is particularly suitable for a test environment with small size and limited space.

Additional features and advantages of the utility model will be set forth in part in the description which follows, and in part will be readily apparent to those having ordinary skill in the art upon examination of the following or may be learned from the practice of the utility model.

Drawings

Embodiments of the utility model are described in detail below with reference to the attached drawing figures, wherein:

fig. 1 is a perspective view of a tensile force applying apparatus according to the present invention;

fig. 2 is an initial state diagram of a tensile force applying apparatus according to the present invention;

fig. 3 is a drawing state diagram of the tensile force applying means according to the present invention;

fig. 4 is an exploded view of a tension applying apparatus according to the present invention;

fig. 5 is a perspective view of a base of the tensile force applying apparatus according to the present invention;

fig. 6 is a perspective view of a stand of the tensile force applying apparatus according to the present invention;

fig. 7 is a perspective view of a body of the tensile force applying apparatus according to the present invention.

Description of the reference numerals

1-a tension applying device; 10-a base; 100-a second channel; 12-a pedestal; 120-half body; 120 a-a first guide block; 120 b-vertical section; 120 c-horizontal portion; 122-a second guide block; 14-a first force applying mechanism; 140-a first positioning plate; 142-a first screw; 16-a compression assembly; 160-a body; 160 a-first guide groove; 160 b-a base; 160 c-a protrusion; 162-a second force applying mechanism; 162 a-a second positioning plate; 162 b-a second screw; 2-sample.

Detailed Description

An exemplary embodiment of a tensile force applying apparatus according to the present invention will now be described in detail with reference to the accompanying drawings. The drawings are provided to present embodiments of the utility model, but the drawings are not necessarily to scale of the particular embodiments, and certain features may be exaggerated, removed, or partially sectioned to better illustrate and explain the present disclosure. The position of some components in the drawings can be adjusted according to actual requirements on the premise of not influencing the technical effect. The appearances of the phrase "in the drawings" or similar language in the specification are not necessarily referring to all of the drawings or the examples.

Certain directional terms used hereinafter to describe the drawings, such as "inner", "outer", "upper", "lower", and other directional terms, will be understood to have their normal meaning and refer to those directions as they relate to when the drawings are normally viewed. Unless otherwise indicated, the directional terms described herein are generally in accordance with conventional directions as understood by those skilled in the art.

The terms "first," "second," and the like, as used herein, do not denote any order, quantity, or importance, but rather are used to distinguish one element from another.

As shown in fig. 1 to 4, the present invention provides a tension applying apparatus 1 including a base 10, a pedestal 12, a pressing assembly 16, and a first force applying mechanism 14. As shown in fig. 5, the base 10 is, for example, rectangular in configuration, and other suitable shapes may be devised by those skilled in the art depending on the actual situation. The size (diagonal length) of the base 10 is preferably not more than 25 mm. The base 10 may be made of a metal material having high hardness and good heat transfer properties, such as copper, aluminum, iron, steel, etc., to have small variations during the test. Other materials may be selected according to experimental requirements.

Referring to fig. 6, the stand 12 is provided on the base 10 and can slide with respect to the base 10. The base 10 is provided with a second guide groove 100 on a side (upper side) facing the pedestal 12 in a length direction thereof, the second guide groove 100 having a trapezoidal configuration. The pedestal 12 is provided with a second guide block 122 on a side (lower side) facing the base 10, the second guide block 122 having a trapezoidal configuration to fit the second guide groove 100. In terms of processing, the tolerance of the second guide block 122 and the second guide groove 100 is within +/-0.05mm, and the surface roughness should be lower than Ra3.2. When the second guide block 122 is engaged with the second guide slot 100, a gap is preferably left between the second guide block 122 and the second guide slot 100, so as to prevent the second guide block 122 from moving relative to the second guide slot 100 due to excessive friction.

Of course, those skilled in the art will appreciate that the shape of the second guide slot 100 and the second guide block 122 are not limited thereto, and the trapezoidal shape has the advantage of ensuring that the pedestal 12 slides relative to the base 10 without separating from the base 10 and without having excessive friction therebetween to prevent relative sliding therebetween. In addition, it is also contemplated that the positions of the second guide block 122 and the second guide slot 100 may be interchanged, depending on the requirements of the application.

The pedestal 12 includes two half bodies 120, and the two half bodies 120 are slidably engaged to the base 10 with second guide blocks 122 provided on their lower sides, respectively. The two half bodies 120 of the pedestal 12 are configured to have the same structure.

Now, the details will be described by taking as an example the structural combination and functional cooperation between one half body 120 and the other components on the side where the other half body 120 is located, and the other half body 120 is symmetrically arranged on the base 10 with respect to the half body 120. The half body 120 has an L-shaped configuration and includes a vertical portion 120b and a horizontal portion 120 c. Wherein the horizontal portion 120c is provided with the aforementioned second guide block 122 engaged with the second guide groove 100 at a side facing the base 10, and forms a platform for supporting the sample 2 at a side away from the base 10. The vertical portion 120b is also provided with a first guide block 120a on the side facing the other half body 120 for engaging a body 160 of a pressing mechanism to be mentioned later. Sample 2 mentioned above may be a flexible thin film such as PDMS, PI, PE, chromium nitride, magnesium oxide, etc., and a partially hard material such as a silicon wafer, strontium titanate, aluminum oxide, etc., single crystal substrate, and also a ceramic bulk material such as barium titanate, lead zirconate titanate, etc.

Referring to fig. 1-4, the hold-down assemblies 16 are engaged with the body halves 120 and each body half 120 is provided with a set of hold-down assemblies 16. The hold-down assembly 16 is configured to apply a hold-down force to the sample 2 supported on the platform such that the sample 2 is positioned between the two body halves 120. The sample 2 may be uniformly pulled by the first force applying mechanism 14 described in detail below after being positioned relative to the stage 12 by the hold-down assembly 16.

As shown in fig. 4, the first force application mechanism 14 includes a first positioning plate 140 and a first screw 142. Wherein the first positioning plate 140 is fixed to the base 10, for example, by a threaded connector (e.g., a screw) passing through itself and coupled to the base 10. The first positioning plate 140 is located between the two half bodies 120, and the number of the first positioning plates 140 is optionally one or two. Other possible numbers are also contemplated. When there is one first positioning plate 140, the first positioning plate 140 is disposed on the base 10 in a manner perpendicular to the second guide groove 100 or parallel to the main plane (the side with the largest area, which may also be referred to as the inner side) of the half body 120, that is, the first positioning plate 140 is centrally positioned on the base 10. In order to space the two body halves 120a distance suitable for receiving the sample 2, a first screw 142 having a suitable length may be selected and screwed a distance to form such a space. When the first positioning plates 140 are two, the two first positioning plates 140 are spaced apart by a certain distance and are disposed on the base 10 equidistantly with respect to the respective half bodies 120.

Referring again to FIG. 4, each half body 120 of the stand 12 is provided with at least one first threaded rod 142. Alternatively, a scale may be provided on each first screw 142 to facilitate precise adjustment of the moving distance of the stage. In particular, in the embodiment shown in the figures, each half-body 120 is equipped with only one first screw 142. It will be appreciated, of course, that other numbers of first screws 142 may be selected as desired. The first screw 142 is preferably disposed parallel to the second guide slot 100 of the base 10 and substantially corresponding to the center of the first positioning plate 140, so that the pedestal 12 is forced along the direction parallel to the second guide slot 100 of the base 10, and the condition that the pedestal 12 is deflected in the direction of the force and gets stuck in the second guide slot 100 of the base 10 is avoided.

The first screw 142 is rotatably coupled to the half body 120 with a screw hole provided on the half body 120. After the pressing assembly 16 completes the pressing operation, the user applies an external force to the first screw 142 (e.g., rotates it 1/4 turns, 1/2 turns, 3/4 turns, etc.) so that the first screw 142 starts to rotate against the first positioning plate 140, and the half-body 120 starts to move away from the first positioning plate 140 under the action of the first screw 142 when rotating against the first positioning plate 140 due to the threaded engagement of the first screw 142 with the half-body 120, although the other side also performs the same operation and moves the same at the same time. Thus, as the two body halves 120 move progressively away from each other, the sample 2 they support is stretched by the two body halves 120 under the hold down of the hold down assembly 16. Due to the good positioning of the pressing assembly 16 by surface contact with the sample 2 and the substantially equal distance of movement of the two half bodies 120 (alternatively, the distance of movement of the two half bodies 120 may also be different), the sample 2 between the two half bodies 120 is subjected to substantially uniform tension during this time. The hold-down assembly 16 positions the sample 2 in surface contact such that the hold-down assembly 16 provides a uniform pull force on the sample 2 as the half body 120 moves relative to the base 10. The half bodies 120 on both sides do not need to move simultaneously, and only one half body 120 on one side can be moved while the half body 120 on the other side remains stationary, and the amount of pulling force is determined by the relative distance between the two half bodies 120. The first screw 142 may be generally a cross screw or a hexagonal screw. In the stretching process, the two half bodies 120 move relative to the base 10, so as to simultaneously apply the same tensile force and opposite tensile forces to the sample 2 to be measured on two sides contacting with the pressing component 16, thereby avoiding uneven stretching or irreversible deformation of the sample 2 caused by uneven application of the tensile force. The magnitude of the applied pulling force can be realized by controlling the screw to screw in/out, so that the uniform force applied to the sample by the device is easy to control and operate.

The first force application mechanism 14 rotates the first screw 142 against the first positioning plate 140 to drive the half body 120 away from the first positioning plate 140, thereby stretching the sample 2.

In another embodiment, the first force applying mechanism 14 may also stretch the sample 2 by screwing the first screw into the first positioning plate and by an external force causing the first screw to unscrew against the half body 120 and push it away from the first positioning plate. In this embodiment, a tool engagement hole is provided in the first positioning plate in a direction perpendicular to the moving direction of the half body 120 (i.e., a length direction of the second guide groove 100 to be mentioned later), and the external force applying tool further rotates the first screw by engaging the hole, and the rotated first screw pushes the half body 120 to a side away from the first positioning plate after abutting against it. The first positioning plate may be provided with at least one first screw at a side facing the one half body 120. The number of screws can be selected by those skilled in the art according to the structural strength and the difficulty of arrangement of the first positioning plate.

Referring to fig. 1-4, the compression assembly 16 includes a body 160 and a second force applying mechanism 162. Body 160 is slidably engaged to body half 120. Specifically, as shown in fig. 7, the body 160 is of a convex configuration and includes a base portion 160b and a protrusion portion 160 c. When assembled with the half body 120, the body 160 of the dogbone shape is mounted to the half body 120 turned 90 ° with respect to its flat-lying position. The base 160b of the body 160 is provided with a guide groove on the side facing the half body 120, and the guide groove is particularly provided on the base 160b at a position opposite to the protrusion 160 c. The half body 120 is provided with a first guide block 120a corresponding to the first guide groove 160 a. The body 160 slidably engages the body half 120 of the pedestal 12 with the mating of the first guide block 120a and the first guide groove 160 a. The area of the base 160b of the body 160 in contact with the sample 2 is less than or equal to the contact area of the half body 120 with said sample 2. The body 160 may be made of a metal material such as copper, aluminum, iron, steel, etc., which has a high hardness and a good heat transfer property, so as to have a small variation during the test. Other materials may be selected according to experimental requirements. The shape of the body 160 is not limited to the above shape, and may have a rectangular configuration. Of course, those skilled in the art can select other shapes to construct the body 160 according to actual needs.

One of the body 160 facing the sample 2The side is preferably smooth and flat (for example, roughness is not more than ra3.2), and sufficient surface contact between the body 160 and the sample 2 can effectively avoid the situation that the sample 2 is not firmly clamped and falls off during the stretching process, and meanwhile, the second force application mechanism 162 (especially the second screw 162b mentioned below) applies pressing force to the sample 2 by acting on the body 160, so that the sample 2 is kept as far as possible at the position in face-to-face contact with the body 160 without wrinkles, and the situation that the internal stress of the sample is too concentrated and even tears the sample 2 due to uneven application of pulling force during the stretching process is avoided. Wherein, when the sample is a PDMS film, the pressure (controlled by the second screw 162b) from the body 160 does not exceed a limit of 5N (e.g., 4 to 5N), and when the sample is a silicon wafer, the pressure from the body 160 does not exceed 20N. The contact area of the body 160 with the sample is optionally 2.5mm². It is of course conceivable that the contact area may be different for different samples and that the skilled person may adjust it based on the actual situation. Furthermore, one skilled in the art can appreciate that the application of different compressive forces can be selected based on different properties of the sample.

As shown in fig. 2 to 4, the second force application mechanism 162 includes a second positioning plate 162a and a second screw 162 b. The second positioning plate 162a is shown as having a rectangular configuration, although other shapes are contemplated. The second positioning plate 162a is fixed to the upper side of the half body 120 with a screw connector (e.g., a screw) passing through itself. Each half body 120 is provided with a second positioning plate 162a, respectively. The second positioning plate 162a is provided with at least one second screw 162 b. In the illustrated embodiment, the number of the second screws 162b is one corresponding to one second positioning plate 162 a. It will of course be appreciated that other numbers of screws may be selected as desired. The second screw 162b may be made of a metal material having high hardness and good heat transfer property, such as copper, aluminum, iron, steel, etc., to have a small variation during the test. Other materials may be selected according to experimental requirements. The size of the tensile force applying device 1 (i.e., the length of the diagonal line of the side face formed when the outer side face of the pedestal 12 on the side facing away from the body 160 is vertically coplanar with the second positioning plate 162a and the outer side face of the base 10 on that side) does not exceed 25 mm.

The second screw 162b is screwed with a threaded hole provided on the second positioning plate 162 a. Referring to fig. 2 to 3, when the pressing operation of the pressing assembly 16 needs to be performed, a user applies an external force to the second screw 162b to rotate relative to the second positioning plate 162a, and the second screw 162b moves down and abuts against the body 160, especially the protrusion 160c of the body 160. With the threaded engagement of the second screw 162b with the positioning plate, the body 160 is slid by the second screw 162b toward the horizontal portion 120c of the half body 120 (which is formed with a platform for supporting the sample 2) by means of the guidance thereof by the first guide block 120a on the half body 120 until the body 160 abuts and positions the sample 2 supported on the platform with a preset force. Of course, the respective second screws 162b and bodies 160 applied to the other half-body 120 also perform the same operation and undergo the same movement.

The application process of the tension applying apparatus 1 is described in detail below.

Inserting the body 160 of the hold-down assembly 16 onto the base 12 by engagement between the first guide block 120a thereon and the first guide groove 160a on the base 12, placing the second positioning plate 162a on the upper side of the base 12, fixing the second positioning plate 162a to the base 12 using a threaded connection (e.g., a screw), and then rotatably engaging the second screw 162b to the second positioning plate 162 a;

fixing (e.g., by screws) the first positioning plate 140 to the base 10, the previously assembled clamping assembly 16 and base 12 being mounted to the base 10 using the second guide block 122 on the underside of the base 12 and the second guide slot 100 on the base 10, and rotatably engaging the first threaded rod 142 to the base 12;

the body 160 of the pressing assembly 16 and the horizontal portion 120c of the pedestal 12 accommodate the sample 2 therebetween, and of course, the gap between the two for storing the sample 2 can be obtained by lifting the body 160 according to actual needs;

after the sample 2 is placed, the second screw 162b is screwed in, so that it pushes the body 160 until the sample 2 is positioned between the horizontal portion 120c (platform for supporting the sample 2) of the pedestal 12 and the body 160;

after the sample 2 is positioned, the first screw 142 is screwed in, and the first screw 142 brings the two half bodies 120 of the pedestal 12 away from each other along the second guide groove 100 against the first positioning plate 140, thereby applying a uniform pulling force to the sample 2.

The device can be suitable for various physical property test systems, such as a comprehensive measurement system (researching the influence of stress on sample electric transportation), polarized neutron scattering (researching the influence of stress on film magnetic property) and the like. The different tests that are applicable will be briefly described below.

In one test, after the device is used to complete the uniform tension application process according to the above steps, the device and the sample carried by the device after the uniform tension treatment can be placed in a physical property testing device together to test the mechanical, optical, electromagnetic and other properties of the sample.

And then, repeating the step of applying uniform tensile force, adjusting the magnitude of the applied tensile force as required (generally, successively applying larger tensile force), and then performing corresponding physical property tests until obtaining the relation that the sample performance is influenced by stress.

In another test, after the device is used to complete the uniform tension applying process according to the above steps, the device and the sample (such as semiconductor, insulator, crystal or metal) carried by the device after uniform tension treatment can be placed in a probe station together to test the electrical or photoelectric properties of the device, such as testing the current, voltage, resistance and other signals under dark state and laser irradiation respectively and obtaining the stress-affected relationship of the properties of the sample.

In yet another test, after the sample pressing process is completed by the device according to the above partial steps, the device and the sample carried by the device (such as micro-nano electronic devices such as a photoelectric detector, a diode, a triode, a solar cell and the like, and electronic devices constructed by two-dimensional materials such as MoS2, WSe2 and the like such as a Field Effect Transistor (FET) are taken as examples) are placed in a probe station, and the electrical properties of the device under the tensile force are measured by contacting a probe with the electronic devices. Then, a laser is used for irradiating the sample, and the photoelectric performance of the electronic device under the action of tensile force can be obtained. It should be noted that when the electronic device is positioned, the damage caused by the contact of the electrode or the conductive material with the body of the pressing component is avoided as much as possible, and the damage to the device is avoided by paying attention to the magnitude of the applied pulling force according to the difference of the positioned samples.

In still another test, after the uniform tension application process was completed using the apparatus according to the above-described procedure and the apparatus and the uniformly stretched sample carried thereon were placed in a property measuring apparatus for measurement, the apparatus carrying the sample was taken out and placed in a tube furnace or other annealing apparatus capable of performing an annealing operation for annealing. After the annealing is finished, the device carrying the sample is placed in the physical property measuring device again for measurement, so that the property change of the sample before and after the annealing under the same tension is obtained. It should be noted that the sample-carrying device should not exhibit a change in the tensile force to which the sample is subjected during testing, transfer and annealing. After the performance test of the sample before and after annealing is completed, the tensile force applied to the sample can be changed, and the performance change of the sample before and after annealing is measured again.

The tension applying device provided by the utility model has reasonable structural design, provides components which are simple in structure and easy to assemble and manufacture, and can apply uniform tension to a sample aimed by the device, so that the uneven or irreversible deformation of the sample caused by uneven tension application (such as uneven contact between a body and the sample or point contact) in the prior art is avoided, and the progress of testing work is further influenced. Since complicated gears, links, etc. are not employed, these complicated mechanisms may cause accumulated errors during manufacturing, and thus the accuracy of the device is affected. The device of the utility model avoids this situation because of the structural proposal and can be well adapted to a test environment with small size and limited space.

While the utility model has been described in detail in connection with only a limited number of embodiments, it should be readily understood that the utility model is not limited to such disclosed embodiments. Rather, the utility model can be modified by incorporating any number of variations, alterations, substitutions or equivalent arrangements not heretofore described, but which are commensurate with the spirit and scope of the utility model. Additionally, while various embodiments of the utility model have been described, it is to be understood that aspects of the utility model may include only some of the embodiments. Accordingly, the utility model is not to be seen as limited by the foregoing description, but is only limited by the scope of the appended claims.

Claims (10)

1. A tension applying device (1) characterized by comprising:

a base (10);

a stand (12), said stand (12) comprising two half-bodies (120) slidably coupled to said base (10);

a hold-down assembly (16) coupled to the half-body (120) and capable of providing a hold-down force in a surface-contact manner to a sample supported by the stage (12) to position it relative to the stage (12);

a first force application mechanism (14) configured to provide the stand (12) with a force that linearly moves the two half bodies (120) away from each other with respect to the base (10) to uniformly stretch the sample.

2. The tension applying device (1) according to claim 1, wherein the first force applying mechanism (14) comprises:

a first positioning plate (140), said first positioning plate (140) being arranged on said base (10) and between two of said half-bodies (120);

-first screws (142), each of said half-bodies (120) being provided with at least one of said first screws (142) in rotational engagement therewith;

the first screw (142) is configured to abut against the first positioning plate (140) under the action of an external force and to rotate in its own axial direction without displacement relative to the half-body (120), so that the half-body (120) screwed with the first screw (142) is moved away from the first positioning plate (140).

3. The tension applying device (1) according to claim 1, wherein the first force applying mechanism (14) comprises:

a first positioning plate disposed on the base (10) between the two half bodies (120), the first positioning plate providing a tool engagement hole in a direction perpendicular to a direction in which the half bodies (120) move to engage an external force applying tool;

-a first screw equipped with at least one said first screw in rotational engagement with said half-body (120) on the side facing said half-body;

the first screw is configured to be displaced axially along itself and without disengaging from the first positioning plate when the external force applying tool engages the tool engaging hole to provide an external force to the first screw to unscrew it out of the first positioning plate and abut the half body (120), thereby moving the half body in abutment with the first screw away from the first positioning plate.

4. The tension applying device (1) according to claim 2 or 3, wherein the first positioning plate (140) is arranged centrally on the base (10).

5. The tension applying device (1) according to any one of claims 1 to 3, wherein the pressing assembly (16) comprises:

a body (160), said body (160) being slidably engaged to said half-body (120);

a second force applying mechanism (162) configured to provide a pressing force to the body (160) to slide it relative to the mount (12) towards and against the sample, thereby enabling the mount (12) to position the sample.

6. The tension applying device (1) according to claim 5, wherein the second force applying mechanism (162) comprises:

a second positioning plate (162a), said second positioning plate (162a) being fixed to said base (12) opposite to said base (10), one said second positioning plate (162a) being provided for each said half-body (120);

a second threaded rod (162b), each of said second positioning plates (162a) being provided with at least one of said second threaded rods (162b) in rotational engagement therewith;

the second screw (162b) is configured to rotate under an external force relative to the second positioning plate (162a) to abut the body (160) to slide it relative to the half-body (120) until abutting and positioning the sample.

7. The pulling force applying device (1) according to claim 6, wherein the body (160) and the half body (120) are provided with a first guide groove (160a) and a first guide block (120a) which are engaged with each other on opposite surfaces, and the half body (120) slides relative to the body (160) by the engagement of the first guide block (120a) and the first guide groove (160 a).

8. The pulling force applying device (1) according to claim 7, characterized in that the half body (120) is of L-shaped configuration and comprises a vertical portion (120b) on which the first guide block (120a) or the first guide groove (160a) is provided and a horizontal portion (120c) on which the sample is supported.

9. The tension applying device (1) according to claim 8, wherein the body (160) is of a zigzag configuration and includes a base portion (160b) and a protruding portion (160c), the base portion (160b) is provided with the first guide groove (160a) or the first guide block (120a) which is slidably fitted with the vertical portion, the second screw (162b) abuts against the protruding portion (160c), and an area of the base portion (160b) contacting the sample is smaller than or equal to an area of the horizontal portion (120c) contacting the sample side.

10. The pulling force applying device (1) according to claim 1, wherein the base (10) and the pedestal (12) are provided with a second guide groove (100) and a second guide block (122) on opposite surfaces thereof, which are engaged with each other, and the pedestal (12) slides relative to the base (10) by the engagement of the second guide block (122) with the second guide groove (100).

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