CN215728621U

CN215728621U - Integrated circuit test fixture of module

Info

Publication number: CN215728621U
Application number: CN202121773737.9U
Authority: CN
Inventors: 徐志明
Original assignee: JIANGSU HUAXING ELECTRONICS CO Ltd
Current assignee: JIANGSU HUAXING ELECTRONICS CO Ltd
Priority date: 2021-07-30
Filing date: 2021-07-30
Publication date: 2022-02-01
Anticipated expiration: 2031-07-30

Abstract

The utility model discloses an integrated circuit test fixture of a module, which relates to the field of integrated circuits and aims to solve the problem of low manual test efficiency.

Description

Integrated circuit test fixture of module

Technical Field

The utility model relates to the technical field of integrated circuits, in particular to an integrated circuit testing jig of a module.

Background

The ICT test fixture finds defects of a manufacturing process and defects of components through directly testing electrical performance of an on-line device. The component class may check for out-of-tolerance, failure or corruption of component values, program errors in the Memory class, etc. Faults such as short circuit of soldering tin, wrong insertion, reverse insertion, neglected mounting, tilting and rosin joint of pins, short circuit and disconnection of a PCB (printed circuit board) and the like can be found in the process. The tested fault is directly positioned on a specific element, a device pin and a network point, and the fault positioning is accurate. No professional knowledge is needed for fault maintenance. The automatic test controlled by a program is adopted, the operation is simple, the test is rapid, and the test time of the single board is generally from several seconds to dozens of seconds.

Referring to fig. 1, the conventional ic test is usually performed manually, and a tester holds a test pen to perform a contact test on a test point on the ic board.

However, manual testing has great instability, and a tester works for a long time to easily cause physical fatigue, so that the testing speed is reduced, and the testing efficiency of the integrated circuit board is further reduced.

SUMMERY OF THE UTILITY MODEL

In view of the deficiencies of the prior art, the present invention provides a module ic testing fixture, which has the advantage of improving the testing efficiency of an ic board.

In order to achieve the purpose, the utility model provides the following technical scheme:

the utility model provides an integrated circuit test fixture of module, includes the workstation of fixed integrated circuit board, be provided with the support frame on the workstation, the support frame perpendicular to workstation sets up, be provided with the movable plate that parallel table set up on the support frame, the movable plate slides along the support frame direction of height and sets up, the one end that the workstation was kept away from to the support frame is provided with and drives the gliding operating means of movable plate, the one end that the support frame was kept away from to the movable plate is provided with the test head that contacts integrated circuit board.

Through adopting above-mentioned technical scheme, the circuit board is placed on the workstation, the tester uses operating means to remove the movable plate, operating means's action bars wears to establish in the sleeve, break the spanner off with the fingers and thumb and make the action bars lapse in the sleeve, and the sleeve has restricted the distance of action bars lapse, test head on the movable plate corresponds the integrated circuit board on the workstation, after the movable plate slipped certain distance down, test point on the circuit board was touched to the test head, thereby the test procedure has been accomplished, replace manual with machinery, the energy that the tester spent has been saved, and then can improve integrated circuit board's efficiency of software testing.

Furthermore, a placing plate is arranged on the workbench, and a placing groove for placing the integrated circuit board is formed in the placing plate.

By adopting the technical scheme, on one hand, the placing plate is raised to the placing height, so that the sliding distance of the moving plate is reduced, the angle for wrenching the wrench is further reduced, the strength is saved, and the operation of a tester is facilitated; on the other hand sets up the standing groove that matches the circuit board size, prevents that the circuit board from unexpected the sliding when the test to make things convenient for the tester to test more.

Further, the two sides of the width direction of the placing plate are provided with long-strip-shaped connecting holes, and the placing plate is connected with the workbench through the connecting holes in a bolt mode.

Through adopting above-mentioned technical scheme, then when placing the board with the bolt installation, rectangular form connector has bigger connection space, the tester installation of being convenient for more.

Further, the length direction both sides of standing groove are provided with the draw-in groove, the draw-in groove intercommunication standing groove sets up.

Through adopting above-mentioned technical scheme, the tester can take from the draw-in groove of both sides when taking out the circuit board from the standing groove, provides the space of dialling, is convenient for more the tester takes out the circuit board.

Further, be provided with the gag lever post on the support frame, the gag lever post sets up along the support frame direction of height, the movable plate cover is established on the gag lever post.

Through adopting above-mentioned technical scheme, then the gag lever post prevents that the movable plate from appearing the change of other directions when sliding from top to bottom for the movable plate remains the direction slip that is on a parallel with the workstation throughout, and then is inaccurate when preventing the test head contact circuit board, thereby influences integrated circuit test effect.

Further, the limiting rod is sleeved with a limiting ring, the outer side wall of the limiting ring is provided with an annular groove, and the moving plate is sleeved on the limiting ring.

Through adopting above-mentioned technical scheme, then the movable plate need not with gag lever post direct contact, wearing and tearing appear after preventing that the movable plate from sliding for a long time, and then influence the parallel position of movable plate and workstation, the movable plate is fixed to be inlayed in the annular groove, slides through the upper and lower slip that drives the movable plate of spacing collar to can realize the effect of circuit test.

Furthermore, supporting rods are uniformly distributed on one side, close to the ground, of the workbench, and the supporting rods are perpendicular to the workbench.

Through adopting above-mentioned technical scheme, then the height of whole device has been raised to the bracing piece for the device more accords with tester's use height, and the tester operation of being convenient for more is used.

Furthermore, a supporting plate is arranged at one end, far away from the workbench, of the supporting rod, and the supporting plate is perpendicular to the supporting rod.

Through adopting above-mentioned technical scheme, then the bracing piece is established in the backup pad, has increased the area of contact with the desktop to it is more stable to make the device place.

In conclusion, the beneficial technical effects of the utility model are as follows:

1. the moving plate, the operating device and the test head are adopted, so that the effect of improving the test efficiency of the integrated circuit board is achieved;

2. the limiting rod and the limiting ring are adopted, so that the effect of ensuring the movable plate to slide up and down in parallel is achieved;

3. the supporting rod and the supporting plate are adopted, so that the effect of improving the stability of the device is achieved.

Drawings

FIG. 1 is a schematic diagram of a background art structure;

FIG. 2 is a schematic diagram of the overall structure of the present case;

FIG. 3 is a schematic plan view of the placement board in this embodiment;

FIG. 4 is a schematic diagram of the explosive structure of the present case;

FIG. 5 is an enlarged view of portion A of FIG. 4;

in the figure, 1, a workbench; 2. a support frame; 3. moving the plate; 4. an operating device; 5. a test head; 6. placing the plate; 7. a placement groove; 8. connecting holes; 9. a card slot; 10. a limiting rod; 11. A limiting ring; 12. an annular groove; 13. a support bar; 14. and a support plate.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings.

Example (b):

referring to fig. 2, the module ic testing fixture disclosed by the present invention comprises a workbench 1 for fixing an ic board, a supporting frame 2 is arranged on the workbench, the supporting frame 2 is arranged perpendicular to the workbench 1, a moving plate 3 arranged parallel to the workbench 1 is arranged on the supporting frame 2, the moving plate 3 is arranged in a sliding manner along the height direction of the supporting frame 2, an operating device 4 for driving the moving plate 3 to slide is arranged at one end of the supporting frame 2 away from the workbench 1, a testing head 5 contacting the ic board is arranged at one end of the moving plate 3 away from the supporting frame 2, the circuit board is placed on the workbench 1, a tester uses the operating device 4 to move the moving plate 3, an operating rod of the operating device 4 is arranged in a sleeve in a penetrating manner, a wrenching wrench enables the operating rod to slide downwards in the sleeve, the sleeve limits the downward sliding distance of the operating rod, the testing head 5 on the moving plate 3 corresponds to the ic board on the workbench 1, after the moving plate 3 slides downwards to a certain distance, the test head 5 touches a test point on the circuit board, so that the test process is completed, the machine replaces the manual work, the effort of a tester is saved, and the test efficiency of the integrated circuit board can be improved. One side evenly distributed that workstation 1 is close to ground has bracing piece 13, and bracing piece 13 sets up with workstation 1 is perpendicular, then the height of whole device has been raised to bracing piece 13 for the device more accords with tester's use height, and the tester of being convenient for more operates and uses. One end of the support rod 13 far away from the workbench 1 is provided with a support plate 14, the support plate 14 is perpendicular to the support rod 13, and the support rod 13 is arranged on the support plate 14, so that the contact area with a desktop is increased, and the device is placed more stably.

Referring to fig. 2 and 3, a placing plate 6 is arranged on the workbench 1, and a placing groove 7 for placing the integrated circuit board is arranged on the placing plate 6, so that on one hand, the placing plate 6 is raised to a placing height, the downward sliding distance of the moving plate 3 is reduced, the angle of wrenching the wrench is further reduced, the labor is saved, and the operation of a tester is facilitated; on the other hand sets up the standing groove 7 that matches the circuit board size, prevents that the circuit board from unexpected the sliding when the test to make things convenient for the tester to test more. Place on the board 6 width direction both sides be equipped with rectangular form connecting hole 8, place board 6 and workstation 1 and establish to bolted connection through connecting hole 8, then when placing board 6 with the bolt installation, rectangular form connector has bigger linkage space, the tester installation of being convenient for more. The length direction both sides of standing groove 7 are provided with draw-in groove 9, and draw-in groove 9 intercommunication standing groove 7 sets up, and the tester can take from the draw-in groove 9 of both sides when taking out the circuit board from standing groove 7, provides the space of dialling and get, is convenient for more the tester and takes out the circuit board.

Referring to fig. 4 and 5, a limiting rod 10 is arranged on the support frame 2, the limiting rod 10 is arranged along the height direction of the support frame 2, the moving plate 3 is sleeved on the limiting rod 10, and the limiting rod 10 prevents the moving plate 3 from changing in other directions when sliding up and down, so that the moving plate 3 always keeps sliding in a direction parallel to the workbench 1, and further, the test head 5 is prevented from being inaccurate when contacting a circuit board, and the test effect of the integrated circuit is influenced. The limiting ring 11 is sleeved on the limiting rod 10, the annular groove 12 is formed in the outer side wall of the limiting ring 11, the moving plate 3 is sleeved on the limiting ring 11, the moving plate 3 does not need to be in direct contact with the limiting ring 10, abrasion of the moving plate 3 after long-time sliding is prevented, the parallel position of the moving plate 3 and the workbench 1 is further influenced, the moving plate 3 is fixedly embedded in the annular groove 12, and the moving plate 3 is driven to slide up and down through the limiting ring 11, so that the circuit testing effect can be achieved.

The embodiments of the present invention are preferred embodiments of the present invention, and the scope of the present invention is not limited by these embodiments, so: all equivalent changes made according to the structure, shape and principle of the utility model are covered by the protection scope of the utility model.

Claims

1. The utility model provides an integrated circuit test fixture of module which characterized in that: workstation (1) including fixed integrated circuit board, be provided with support frame (2) on workstation (1), support frame (2) perpendicular to workstation (1) sets up, be provided with movable plate (3) that parallel table (1) set up on support frame (2), movable plate (3) are followed support frame (2) direction of height and are slided and set up, the one end that workstation (1) were kept away from in support frame (2) is provided with and drives gliding operating means (4) of movable plate (3), the one end that support frame (2) were kept away from in movable plate (3) is provided with test head (5) that contact integrated circuit board.

2. The apparatus of claim 1, wherein: a placing plate (6) is arranged on the workbench (1), and a placing groove (7) for placing the integrated circuit board is formed in the placing plate (6).

3. The apparatus of claim 2, wherein: the novel workbench is characterized in that strip-shaped connecting holes (8) are formed in two sides of the placing plate (6) in the width direction, and the placing plate (6) is connected with the workbench (1) through the connecting holes (8) to form a bolt connection.

4. The apparatus of claim 3, wherein: the clamping grooves (9) are formed in two sides of the placing groove (7) in the length direction, and the clamping grooves (9) are communicated with the placing groove (7).

5. The apparatus of claim 4, wherein: the support frame (2) is provided with a limiting rod (10), the limiting rod (10) is arranged along the height direction of the support frame (2), and the limiting rod (10) is sleeved with the movable plate (3).

6. The apparatus of claim 5, wherein: the limiting rod (10) is sleeved with a limiting ring (11), the outer side wall of the limiting ring (11) is provided with an annular groove (12), and the limiting ring (11) is sleeved with the moving plate (3).

7. The apparatus of claim 6, wherein: a plurality of supporting rods (13) are uniformly distributed on one side, close to the ground, of the workbench (1), and the supporting rods (13) are perpendicular to the workbench (1).

8. The apparatus of claim 7, wherein: one end of the support rod (13) far away from the workbench (1) is provided with a support plate (14), and the support plate (14) is perpendicular to the support rod (13).