CN215727686U

CN215727686U - Material analyzer based on spectrometer

Info

Publication number: CN215727686U
Application number: CN202122091916.0U
Authority: CN
Inventors: 莫卓亚; 刘元路; 杨日伦
Original assignee: Guangdong Gongye Technology Co Ltd
Current assignee: Guangdong Gongye Technology Co Ltd
Priority date: 2021-08-31
Filing date: 2021-08-31
Publication date: 2022-02-01
Anticipated expiration: 2031-08-31

Abstract

The utility model belongs to the technical field of material analysis instruments, and particularly relates to a material analyzer based on a spectrometer, which comprises a bottom shell, a cover plate, a material analysis unit, the spectrometer, a near-infrared light source, an optical fiber and a test head, wherein the bottom shell is provided with a through hole; the first end of the optical fiber is connected with the near-infrared light source, the second end of the optical fiber is connected with the spectrometer, the test head is connected with the third end of the optical fiber, and the third end of the optical fiber is communicated with the second end and the first end; the apron includes the top plate, and the top plate forms the hang plate with specific angle bending back, the hang plate with the top plate all covers and locates on the drain pan, install the display element on the hang plate. According to the utility model, the display unit is arranged on the inclined plate, so that the function of conveniently checking data by a user is achieved, the material of the recycled material is conveniently and quickly analyzed, the use experience of the user is improved, and the material analysis efficiency of the recycled material is further improved.

Description

Material analyzer based on spectrometer

Technical Field

The utility model belongs to the technical field of material quality analysis instruments, and particularly relates to a material quality analyzer based on a spectrometer.

Background

The renewable resource is one of renewable resources, namely, non-renewable material resources which are developed and used once and discarded in various activities such as production, life, science and education, traffic, national defense and the like of human beings and can be recycled and processed repeatedly, and steel, nonferrous metals, rare metals, alloys, inorganic nonmetals, plastics, rubbers, fibers, paper and the like which are produced and discarded by taking minerals as raw materials are called renewable resources.

At present, in the recyclable industry of renewable resource plastics, the main recyclable materials comprise PVC, HDPE, PVC, PP and the like, and the classification mode of plastics commonly adopted in the market is to judge the classification by means of experienced manual visual inspection, so that the problems of low classification efficiency, low accuracy and low production cost of the plastic materials are caused, and further the production efficiency is influenced.

Therefore, it is necessary to design a material analyzer based on a spectrometer.

SUMMERY OF THE UTILITY MODEL

The utility model aims to provide a material analyzer based on a spectrometer, and aims to solve the technical problem that in the prior art, the classification efficiency is low when plastic classification is carried out.

In order to achieve the above object, an embodiment of the present invention provides a material analyzer based on a spectrometer, including a bottom case and a cover plate; the device also comprises a material analysis unit, a spectrometer, a near infrared light source, an optical fiber and a test head; the material analysis unit, the spectrometer and the near-infrared light source are all arranged in the bottom shell; the first end of the optical fiber is connected with the near-infrared light source, the second end of the optical fiber is connected with the spectrometer, the test head is connected with the third end of the optical fiber, and the third end of the optical fiber is communicated with the second end and the first end; the apron includes the top plate, the top plate forms the hang plate with specific angle bending back, the hang plate with the top plate all covers and locates on the drain pan, install the display element on the hang plate.

Optionally, be equipped with mounting hole and screen mounting panel on the hang plate, the mounting hole runs through the middle part setting of hang plate, the screen mounting panel install in the inboard of hang plate and cover the mounting hole, the display element install in the screen mounting panel and with the mounting hole aligns the setting.

Optionally, both sides of the top plate are provided with concave mounting plates, and the concave mounting plates are respectively connected with the inner walls of both sides of the bottom shell.

Optionally, the bottom end of the inclined plate is provided with a positioning mounting plate, and the positioning mounting plate is connected with the upper end face of the bottom shell.

Optionally, the storage rack is detachably mounted on a side surface of the bottom shell.

Optionally, a test starting switch is arranged on the test head, and the test starting switch is electrically connected with the material analysis unit.

Optionally, the recycling device further comprises a workbench, wherein the workbench is arranged beside the bottom shell and used for placing the recycling material.

Optionally, the table is white.

Optionally, a first supporting plate is arranged in the bottom shell, the first supporting plate is mounted at the bottom in the bottom shell, and the near-infrared light source is mounted on the first supporting plate.

Optionally, a second support plate is arranged in the bottom shell, the second support plate is mounted at the bottom in the bottom shell, the second support plate is erected on the near-infrared light source, and the spectrometer is mounted on the second support plate.

One or more technical solutions in the spectrometer-based material analyzer provided by the embodiment of the present invention at least have one of the following technical effects:

when the material analyzer based on the spectrograph is used, a user can hold the test head by hand to align the test head with a recovered material to be tested, then the near-infrared light source emits a light source containing near infrared, the light of the light source is transmitted to the third end of the optical fiber through the first end of the optical fiber and then is irradiated onto the recovered material through the test head, the light of the light source is transmitted to the spectrograph through the third end of the optical fiber after being reflected by an object and then is transmitted to the second end of the optical fiber, the spectrograph collects a spectrum curve of the recovered material, the material analyzing unit analyzes according to the spectrum curve collected by the spectrograph, the material of the recovered material is obtained after the analysis is finished and is displayed on the display unit, the display unit is arranged on the inclined plate, and the inclined plate is inclined, so that the material analyzer has the function of facilitating the user to check data, realize convenient and fast ground when carrying out the analysis to the material of retrieving the material, can promote user's use again and experience, further promote the material analysis efficiency to retrieving the material.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.

Fig. 1 is a schematic diagram of an overall structure of a spectrometer-based material analyzer according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of a system configuration connection structure of a spectrometer-based texture analyzer according to an embodiment of the present invention;

FIG. 3 is an exploded view of a spectrometer-based material analyzer according to an embodiment of the present invention;

fig. 4 is another view of fig. 3.

Wherein, in the figures, the respective reference numerals:

110. a first support plate; 120. a second support plate; 130. a bottom case; 140. a cover plate; 141. a top layer plate; 142. an inclined plate; 143. mounting holes; 144. a screen mounting plate; 145. a concave mounting plate; 146. positioning the mounting plate; 150. a display unit; 160. placing a rack;

210. a material analysis unit; 220. a spectrometer; 230. a near-infrared light source; 240. an optical fiber; 250. a test head; 251. testing the starting switch; 310. a work bench.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be illustrative of the embodiments of the present invention, and should not be construed as limiting the utility model.

In the description of the embodiments of the present invention, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the embodiments of the present invention and simplifying the description, but do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the embodiments of the present invention, "a plurality" means two or more unless specifically limited otherwise.

In the embodiments of the present invention, unless otherwise explicitly specified or limited, the terms "mounted," "connected," "fixed," and the like are to be construed broadly, e.g., as being fixedly connected, detachably connected, or integrated; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. Specific meanings of the above terms in the embodiments of the present invention can be understood by those of ordinary skill in the art according to specific situations.

In one embodiment of the present invention, as shown in fig. 1-4, a spectrometer-based texture analyzer is provided that includes a bottom case 130 and a cover plate 140.

The spectrometer-based material analyzer further includes a material analysis unit 210, a spectrometer 220, a near-infrared light source 230, an optical fiber 240, and a test head 250. The material analysis unit 210, the spectrometer 220 and the near infrared light source 230 are all installed in the bottom case 130. The first end of the optical fiber 240 is connected to the near-infrared light source 230, the second end of the optical fiber 240 is connected to the spectrometer 220, the test head 250 is connected to the third end of the optical fiber 240, and the third end and the second end of the optical fiber 240 are both communicated with the first end. The cover plate 140 includes a top plate 141, the top plate 141 is bent at a specific angle to form an inclined plate 142, the inclined plate 142 and the top plate 141 are both covered on the bottom case 130, and the inclined plate 142 is mounted with a display unit 150.

When the material analyzer based on the spectrometer is used, a user can hold the test head 250 by hand, align the test head 250 with a recycled material to be tested, then the near-infrared light source 230 emits a light source containing near infrared, the light of the light source is transmitted to the third end of the optical fiber 240 through the first end of the optical fiber 240 and then is irradiated onto the recycled material through the test head 250, the light of the light source is transmitted to the spectrometer 220 through the third end of the optical fiber 240 after being reflected by an object and then is transmitted to the second end of the optical fiber 240, the spectrometer 220 collects a spectrum curve of the recycled material, the material analyzing unit 210 analyzes according to the spectrum curve collected by the spectrometer 220, the material of the recycled material is obtained after the analysis is completed and is displayed on the display unit 150, the display unit 150 is arranged on the inclined plate 142, and the inclined plate 142 is inclined, consequently have the function that the person of facilitating the use looks over the data, when realizing convenient and fast ground and carrying out the analysis to the material of retrieving the material, can promote user's use again and experience, further promote the material analysis efficiency to retrieving the material.

In another embodiment of the present invention, the specific angle ranges from greater than 90 ° to less than 180 °. This allows the user to comfortably view the numbers displayed on the display unit 150 after the display unit 150 is mounted.

In another embodiment of the present invention, the material analyzing unit 210 may be configured as a main control board (not shown), and a circuit structure is set by a person skilled in the art, so as to perform analysis according to a spectral curve collected by the spectrometer 220, and obtain the material of the recycled material after the analysis is completed. The material analyzing unit 210 is installed in the bottom case 130 as needed.

In addition, how to analyze the spectral curve should be programmed by those skilled in the art, and the present application is intended to protect the entity structure, and the data processing and analyzing part is not the focus included in the present application, so that the present application is not specifically described.

In another embodiment of the present invention, the near-infrared light source 230 is a halogen lamp light source capable of providing light containing near-infrared light.

In another embodiment of the present invention, as shown in fig. 1-2, the inclined plate 142 is provided with a mounting hole 143 and a screen mounting plate 144, the mounting hole 143 is disposed through a middle portion of the inclined plate 142, the screen mounting plate 144 is mounted on an inner side of the inclined plate 142 and covers the mounting hole 143, and the display unit 150 is mounted on the screen mounting plate 144 and aligned with the mounting hole 143. Specifically, the screen mounting plate 144 is screwed with the inclined plate 142, so that the mounting and dismounting are convenient. Meanwhile, the installation hole 143 is provided such that the display unit 150 is exposed through the installation hole 143 after the display unit 150 is installed, to display the number displayed on the display unit 150.

In another embodiment of the present invention, as shown in fig. 3-4, concave mounting plates 145 are disposed on both sides of the top plate 141, and the concave mounting plates 145 are respectively connected to inner walls of both sides of the bottom shell 130. Specifically, the concave mounting plate 145 is arranged in a concave manner, so that after the top plate 141 is connected with the bottom shell 130, the outer walls of the top plate 141 on the side of the bottom shell 130 are located on the same vertical horizontal plane, and the spectrometer-based material analyzer is integrated.

Further, the concave mounting plate 145 is screwed to the inner walls of the two sides of the bottom case 130, respectively.

In another embodiment of the present invention, as shown in fig. 1 to 2, a positioning mounting plate 146 is provided at a bottom end of the inclined plate 142, and the positioning mounting plate 146 is coupled to an upper end surface of the bottom case 130. Specifically, the positioning mounting plate 146 can function as a positioning element when the tilt plate 142 is mounted.

In another embodiment of the present invention, as shown in fig. 1-3, the spectrometer-based material analyzer further includes a placing frame 160, and the placing frame 160 is detachably mounted on a side surface of the bottom case 130. Specifically, when the placing frame 160 is used for not using the test head 250, the test head 250 is placed on the placing frame 160, so that the test head 250 can be placed in a suspended manner, the problem that the test head 250 is damaged due to random placement of the test head 250 is solved, and the service life of the material analyzer based on the spectrometer is prolonged.

In another embodiment of the present invention, as shown in fig. 1, a test start switch 251 is disposed on the test head 250, and the test start switch 251 is electrically connected to the material analysis unit 210. Specifically, by setting the test starting switch 251, the test can be performed after the test starting switch 251 is started, so that the test starting can be quickly and conveniently controlled.

In another embodiment of the present invention, as shown in fig. 1 and 4, the spectrometer-based material analyzer further includes a worktable 310, and the worktable 310 is disposed beside the bottom case 130 and is used for placing recycled materials. Specifically, the table 310 is configured to facilitate placement of recycled materials to be tested.

In another embodiment of the present invention, as shown in fig. 1-2, the table 310 is white. That is, the background color of the workbench 310 is white, so that when the transparent recycled material is tested, the light of the light source is irradiated to the transparent object and then reflected by the white workbench 310 and transmitted to the spectrometer 220, and further the spectrum of the material of the white recycled material is obtained.

In another embodiment of the present invention, the shape of the table 310 is a square or a circle. In this embodiment, the shape of the table 310 is circular. Of course, other shapes can be set according to actual requirements.

In another embodiment of the present invention, as shown in fig. 3 to 4, a first support plate 110 is disposed in the bottom case 130, the first support plate 110 is mounted at the bottom of the bottom case 130, and the near-infrared light source 230 is mounted on the first support plate 110. The near infrared light source 230 is supported by the first support plate 110.

In another embodiment of the present invention, as shown in fig. 3, a second supporting plate 120 is disposed in the bottom case 130, the second supporting plate 120 is mounted at the bottom of the bottom case 130, the second supporting plate 120 is mounted on the near-infrared light source 230, and the spectrometer 220 is mounted on the second supporting plate 120. By erecting the second supporting plate 120 on the near-infrared light source 230, the space in the bottom case 130 is efficiently utilized, and the volume of the entire spectrometer-based material analyzer is reduced.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the utility model, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.

Claims

1. A material analyzer based on a spectrometer comprises a bottom shell and a cover plate; the device is characterized by also comprising a material analysis unit, a spectrometer, a near-infrared light source, an optical fiber and a test head; the material analysis unit, the spectrometer and the near-infrared light source are all arranged in the bottom shell; the first end of the optical fiber is connected with the near-infrared light source, the second end of the optical fiber is connected with the spectrometer, the test head is connected with the third end of the optical fiber, and the third end of the optical fiber is communicated with the second end and the first end; the apron includes the top plate, the top plate forms the hang plate with specific angle bending back, the hang plate with the top plate all covers and locates on the drain pan, install the display element on the hang plate.

2. The spectrometer-based material analyzer of claim 1, wherein the tilt plate is provided with a mounting hole and a screen mounting plate, the mounting hole is disposed through a middle portion of the tilt plate, the screen mounting plate is mounted on an inner side of the tilt plate and covers the mounting hole, and the display unit is mounted on the screen mounting plate and aligned with the mounting hole.

3. The spectrometer-based material analyzer of claim 1, wherein both sides of the top plate are provided with recessed mounting plates, the recessed mounting plates being connected to inner walls of both sides of the bottom shell, respectively.

4. The spectrometer-based material analyzer of claim 1, wherein a positioning mounting plate is disposed at a bottom end of the inclined plate, and the positioning mounting plate is connected to an upper end surface of the bottom case.

5. The spectrometer-based material analyzer of claim 1, further comprising a holding frame detachably mounted to a side of the bottom housing.

6. The spectrometer-based material analyzer of any of claims 2-5, wherein the test head is provided with a test enable switch, and the test enable switch is electrically connected to the material analysis unit.

7. The spectrometer-based material analyzer of any one of claims 2-5, further comprising a table disposed beside the bottom housing and configured to hold recycled material.

8. The spectrometer-based material analyzer of claim 7, wherein the platen is white.

9. The spectrometer-based material analyzer of any one of claims 2-5, wherein a first support plate is disposed in the bottom housing, the first support plate is mounted at a bottom portion of the bottom housing, and the near-infrared light source is mounted on the first support plate.

10. The spectrometer-based material analyzer of claim 9, wherein a second support plate is disposed within the bottom shell, the second support plate is mounted to a bottom portion of the bottom shell, the second support plate is mounted to the near-infrared light source, and the spectrometer is mounted to the second support plate.