CN215601324U - Testing device of communication module - Google Patents
Testing device of communication module Download PDFInfo
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- CN215601324U CN215601324U CN202121832224.0U CN202121832224U CN215601324U CN 215601324 U CN215601324 U CN 215601324U CN 202121832224 U CN202121832224 U CN 202121832224U CN 215601324 U CN215601324 U CN 215601324U
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Abstract
The utility model discloses a testing device of a communication module, which comprises: a power source; the clamp comprises an upper clamping plate and a lower clamping plate, wherein the lower clamping plate is provided with an upward thimble; a protection circuit including a control switch; the input end of the protection circuit is connected with the output end of the power supply, and the output end of the protection circuit is connected with the thimble of the clamp; when the upper clamping plate is pressed down, the control switch is conducted, so that the power supply is electrically connected with the communication module to be tested through the ejector pin of the clamp to supply power to the communication module to be tested; when the upper clamping plate is lifted, the control switch is turned off, so that the power supply is electrically disconnected with the tested communication module; according to the utility model, the power supply of the tested communication module is controlled and protected through the arrangement of the control switch in the protection circuit, so that the on-off control of the electrical connection between the output of the power supply and the tested communication module can be associated with the pressing action of the upper clamping plate of the clamp, the damage risk of the communication module during testing is reduced, and the damage rate of the communication module is reduced.
Description
Technical Field
The utility model relates to the technical field of testing, in particular to a testing device of a communication module.
Background
At present, a communication module packaged in a packaging manner such as LGA (land grid array package), m.2 (one packaging manner), and LCC (one chip packaging manner) needs to use a fixture during production test, and as shown in fig. 1, the fixture may include a box body and an upper clamp plate. The case of the fixture may be provided with a thimble for guiding the pins of the communication modules packaged differently to the lower plate, a lower plate having an external circuit for testing the communication modules, and various accessories (such as lines, switches, etc.). The upper clamping plate is used for pressing the placed communication module to be tested when the upper clamping plate is pressed down, so that the communication module is contacted with the thimble; when the thimble is lifted, the communication module is not contacted with the thimble any more.
In the prior art, as shown in fig. 1, a test scheme of a communication module may be that an upper clamp plate of a fixture is pressed down, pins of communication modules packaged differently can be led into the lower clamp plate through ejector pins, and the communication modules are tested by using tool software of a PC (personal computer). However, in the existing technical solution, the live-line operation of the communication module is not linked with the pressing action of the upper clamp plate of the clamp, that is, the power supply is not related to the power supply of the communication module through the top of the lower clamp plate and the pressing action of the upper clamp plate, so that the live-line operation of the communication module is not controlled, and there is a risk of damaging the tested communication module, for example, when the communication module is replaced, the top pin of the lower clamp plate is electrified, if the communication module is slightly placed with a deviation, the pin of the communication module can be misplaced, which results in the situation that the pin of the communication module is burned out. Therefore, how to control and protect the power supply of the tested communication module and reduce the damage rate of the communication module during testing is a problem which needs to be solved urgently nowadays.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a testing device of a communication module, which is used for controlling and protecting the power supply of the tested communication module and reducing the damage rate of the communication module during testing.
To solve the above technical problem, the present invention provides a testing apparatus for a communication module, comprising:
a power source;
the clamp comprises an upper clamping plate and a lower clamping plate, wherein the lower clamping plate is provided with an upward thimble;
a protection circuit including a control switch; the input end of the protection circuit is connected with the output end of the power supply, and the output end of the protection circuit is connected with the thimble of the clamp;
when the upper clamping plate is pressed downwards, the control switch is conducted, so that the power supply is electrically connected with the communication module to be tested through the ejector pin of the clamp to supply power to the communication module to be tested; and when the upper clamping plate is lifted, the control switch is turned off, so that the power supply is electrically disconnected with the tested communication module.
Optionally, the protection circuit further includes any one or more of an overvoltage protection circuit, an ESD protection circuit, an LC filter circuit, and a residual current discharge circuit; the overvoltage protection circuit, the ESD protection circuit or the LC filter circuit are connected with the control switch in series, and the residual current discharge circuit is connected with the control switch in parallel.
Optionally, the control switch includes a PMOS transistor, a first resistor, a second resistor, a diode, and a voltage-down signal control device;
the source electrode of the PMOS tube is connected with the grid electrode of the PMOS tube through the first resistor, the common end of the source electrode of the PMOS tube, which is connected with the first resistor, is connected with the output end of the power supply, the drain electrode of the PMOS tube is connected with the thimble of the clamp, the common end of the grid electrode of the PMOS tube, which is connected with the first resistor, is connected with the anode of the diode through the second resistor, the cathode of the diode is connected with the first input end of the push-down signal control device, and the second input end of the push-down signal control device is grounded;
the control end of the pressing signal control device is connected with the pressing signal output end of the upper clamping plate and is used for controlling the connection and conduction of the first input end and the second input end of the pressing signal control device when a pressing signal is detected so as to conduct the PMOS tube; and when the press-down signal is not detected, controlling the connection of the first input end and the second input end to be switched off so as to switch off the PMOS tube.
Optionally, when the protection circuit includes the residual current discharging circuit, the residual current discharging circuit includes a switching device and a discharging circuit;
the common end of the control switch connected with the thimble of the clamp is connected with the input end of the bleeder circuit through the switch device; the bleeder circuit comprises a third resistor, a first end of the third resistor is used as an input end of the bleeder circuit and is connected with the control switch through the switching device, and a second end of the third resistor is grounded.
Optionally, a control end of the switching device is connected to a push-down signal output end of the upper clamp plate, and is configured to control to turn off connection between the control switch and the leakage circuit when a push-down signal is detected; and when the press-down signal is not detected, controlling to conduct the connection between the control switch and the drain circuit.
Optionally, when the protection circuit includes the overvoltage protection circuit or the ESD protection circuit, the overvoltage protection circuit or the ESD protection circuit includes: a TVS diode;
the common end of the control switch connected with the thimble of the clamp is connected with the cathode of the TVS diode, and the anode of the TVS diode is grounded.
Optionally, when the protection circuit includes the LC filter circuit, the LC filter circuit includes: an inductor and a capacitor;
the control switch is connected with the ejector pin of the clamp through the inductor, the common end of the inductor connected with the ejector pin of the clamp is connected with the first end of the capacitor, and the second end of the capacitor is grounded.
The utility model provides a testing device of a communication module, which comprises: a power source; the clamp comprises an upper clamping plate and a lower clamping plate, wherein the lower clamping plate is provided with an upward thimble; a protection circuit including a control switch; the input end of the protection circuit is connected with the output end of the power supply, and the output end of the protection circuit is connected with the thimble of the clamp; when the upper clamping plate is pressed down, the control switch is conducted, so that the power supply is electrically connected with the communication module to be tested through the ejector pin of the clamp to supply power to the communication module to be tested; when the upper clamping plate is lifted, the control switch is turned off, so that the power supply is electrically disconnected with the tested communication module;
therefore, the power supply of the tested communication module is controlled and protected through the arrangement of the control switch in the protection circuit, so that the on-off control of the electrical connection between the output of the power supply and the tested communication module can be associated with the pressing action of the upper clamping plate of the clamp, the damage risk of the communication module during testing is reduced, and the damage rate of the communication module is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a schematic diagram of a prior art communication module testing scheme;
fig. 2 is a schematic structural diagram of a testing apparatus for a communication module according to an embodiment of the present invention;
fig. 3 is a schematic diagram of a communication module testing scheme according to an embodiment of the present invention;
fig. 4 is a schematic circuit diagram of a protection circuit of a testing apparatus of another communication module according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 2, fig. 2 is a schematic structural diagram of a testing apparatus for a communication module according to an embodiment of the present invention. The apparatus may include:
a power supply 10;
the clamp 20 comprises an upper clamp plate and a lower clamp plate, wherein the lower clamp plate is provided with an upward thimble;
a protection circuit 30 including a control switch 31; the input end of the protection circuit is connected with the output end of the power supply 10, and the output end of the protection circuit is connected with the thimble of the clamp 20;
when the upper clamping plate is pressed down, the control switch 31 is conducted, so that the power supply 10 is electrically connected with the communication module to be tested through the ejector pin of the clamp 20 to supply power to the communication module to be tested; when the upper clamping plate is lifted, the control switch 31 is turned off, so that the power supply 10 is electrically disconnected with the tested communication module.
It is understood that the testing device of the communication module provided in this embodiment may be a device for testing the communication module to be tested. In the present embodiment, a circuit, which is provided between the lower plate of the fixture 20 and the power supply 10 and is used for supplying power to the communication module (i.e., the communication module to be tested) connected to the thimble on the lower plate during testing, that is, the protection circuit may transmit the electric energy output by the power supply 10 to the lower plate, so as to supply power to the communication module connected to the thimble, which is pressed down during testing, through the thimble on the lower plate.
The communication module under test in this embodiment may be a communication module that needs to be tested on the fixture 20, such as a module packaged in a packaging manner, such as LGA, m.2, and LCC. In this embodiment, by setting the control switch 31 (i.e., the control switch circuit) in the protection circuit, the output of the power supply 10 can be connected to the thimble of the lower clamp plate through the control switch 31, so as to supply power to the communication module to be tested through the thimble of the lower clamp plate during testing. The control switch 31 can be pressed down on the upper clamping plate of the clamp 20, that is, when the tested communication module needs to be tested, the power supply 10 is conducted to electrically connect the output of the tested communication module, so as to supply power to the tested communication module; when the upper clamping plate is lifted, namely the tested communication module is not required to be tested, the power supply 10 is turned off to electrically connect the output of the power supply with the tested communication module; therefore, the connection and disconnection of the control switch 31 are associated with the pressing and lifting of the upper clamping plate in the clamp 20, when the upper clamping plate of the clamp 20 is pressed down, the output end of the protection circuit can have voltage immediately, the tested communication module is tested normally, when the upper clamping plate of the clamp 20 is lifted up, the output end of the protection circuit can have no voltage, the condition that the thimble of the clamp 20 is electrified when the tested communication module is replaced is avoided, and the damage risk of the tested communication module is reduced.
Correspondingly, for the specific control manner of turning on and off the control switch 31 in this embodiment, the specific control manner can be set by a designer according to a practical scene and a user requirement, as shown in fig. 3, the protection circuit can control the turning on and off of the control switch 31 according to a pressing signal of the upper plate, that is, the protection circuit provided in this embodiment can include: a press-down signal control device for controlling the control switch 31 to be turned on when a press-down signal of the upper plate is detected; when the push-down signal is not detected, the control switch 31 is controlled to be turned off. The protection circuit may also control the control switch 31 to be turned on and off according to other signals such as a test enable signal. The present embodiment does not limit the switch 31 to be turned on when the upper plate of the clamp 20 is pressed down and to be turned off when the upper plate is lifted.
Specifically, in this embodiment, it is shown that the protection circuit protects the power supply from one output of the power supply 10 to the corresponding thimble on the lower clamp plate, that is, the number of the control switches 31 in the protection circuit in this embodiment may be 1, and the protection circuit may protect the power supply from one output of the power supply 10 to the corresponding communication module to be tested by using the control switches 31. Correspondingly, the protection circuit may also protect the power supplied by the multiplexed output of the power supply 10 to the corresponding thimble on the lower clamp plate, that is, the number of the control switches 31 in the protection circuit in this embodiment may be n, where n is a positive integer greater than or equal to 2, and this embodiment does not limit this. As shown in fig. 4, when n is 2, the 2-way output (H301 and H303) of the power supply 10 may be a power supply input (H302 and H304) connected to a corresponding thimble in the lower plate of the jig 20 through 2 control switches 31.
It should be noted that, for the specific circuit structure of the control switch 31 in this embodiment, the designer may set the circuit structure by himself, for example, when the control switch 31 controls the on and off of its own switch element according to the press-down signal of the upper plate, if the switch element in the control switch 31 is specifically a PMOS transistor, the control switch 31 may include a PMOS transistor, a first resistor, a second resistor, a diode, and a press-down signal control device; the source electrode of the PMOS tube is connected with the grid electrode of the PMOS tube through a first resistor, the common end of the source electrode of the PMOS tube, which is connected with the first resistor, is connected with the output end of the power supply 10, the drain electrode of the PMOS tube is connected with the thimble of the clamp 20, the common end of the grid electrode of the PMOS tube, which is connected with the first resistor, is connected with the anode of the diode through a second resistor, the cathode of the diode is connected with the first input end of the push-down signal control device, and the second input end of the push-down signal control device is grounded; the control end of the pressing signal control device is connected with the pressing signal output end of the upper clamping plate and is used for controlling the connection and conduction of the first input end and the second input end of the pressing signal control device when a pressing signal is detected so as to conduct the PMOS tube; and when the press-down signal is not detected, the connection of the first input end and the second input end is controlled to be switched off so as to switch off the PMOS tube. Correspondingly, the control switch 31 may further include a capacitor (e.g., C307 or C308 in FIG. 4) connected between the gate and the source of the PMOS transistor
Correspondingly, when the number of the control switches 31 in the protection circuit can be n, the on and off of the n control switches 31 in the protection circuit can be controlled by one push-down signal control device; as shown in fig. 4, if the switching element in each control switch 31 is specifically a PMOS transistor (e.g., Q301 and Q303 in fig. 4), each control switch 31 may include a PMOS transistor (e.g., Q301 in fig. 4), a first resistor (e.g., R301 in fig. 4), a second resistor (e.g., R302 in fig. 4), and a diode (e.g., D301 in fig. 4); the source electrode of the PMOS transistor is connected with the gate electrode of the PMOS transistor through a first resistor, the common end of the source electrode of the PMOS transistor and the first resistor is connected with the positive output end (such as pin 2 of H301 in fig. 4) of a corresponding output in the power supply 10, the drain electrode of the PMOS transistor is connected with the positive input end (such as pin 2 of H302 in fig. 4) of the power supply input end of a corresponding thimble, the common end of the gate electrode of the PMOS transistor and the first resistor is connected with the anode of the diode through a second resistor, the cathode of the diode is connected with the first input end (such as pin 2 of J301 in fig. 4) of the push-down signal control device, and the second input end of the push-down signal control device, the negative output ends of each output in the power supply 10 and the negative input end of the power supply of the thimble are all grounded; the push-down signal control device can be specifically used for controlling the connection and conduction of a first input end and a second input end of the push-down signal control device when a push-down signal is detected, and controlling the conduction of a PMOS (P-channel metal oxide semiconductor) tube; when the pressing signal is not detected, the connection of the first input end and the second input end is controlled to be switched off, and the PMOS tube is controlled to be switched off. That is, as shown in fig. 4, before the upper plate of the clamp 20 is pressed down, J301 has no pressing signal, Q301 is off, and 2 pins thereof have no voltage output; when the upper clamping plate of the clamp 20 is pressed down, a pressing signal is provided for J301, Q301 is closed, and 2 pins of the Q301 have voltage output; when the upper clamp plate of the clamp 20 is lifted, the J301 has no pressing signal, the Q301 is disconnected, and no voltage is output for the 2 pins. Accordingly, as shown in fig. 4, each control switch 31 may further include a capacitor (e.g., C307 or C308) connected between the gate and the source of the PMOS transistor.
Specifically, the power supply 10 in this embodiment may be a dc power supply. Because the output of a common direct current power supply (such as an alternating current power supply) is unstable, at the moment of electrifying, the output end has voltage pulse, and the rear-end load can be damaged; therefore, in order to avoid the influence of the pulse voltage output by the output terminal of the power supply 10 on the communication module under test, so as to reduce the risk of damage to the communication module under test, as shown in fig. 2, the protection circuit provided in this embodiment may further include: and an overvoltage protection circuit 32 connected to the switching circuit for discharging the pulse voltage outputted from the output terminal of the power supply 10.
Correspondingly, the specific circuit structure of the overvoltage protection circuit 32 in this embodiment can be set by a designer, for example, the overvoltage protection circuit 32 may include: a TVS diode; the common end of the control switch 31 connected with the thimble of the clamp 20 is connected with the cathode of the TVS diode, and the anode of the TVS diode is grounded. Accordingly, when the number of the control switches 31 in the protection circuit is n, the overvoltage protection circuit 32 may include: n TVS diodes (transient suppression diodes), a cathode of each TVS diode being connected to a corresponding output terminal of one of the power supplies 10, and an anode of each TVS diode being grounded; as shown in fig. 4, when n is 2, the overvoltage protection circuit 32 may include 2 TVS diodes (TVS301 and TVS 302). The embodiment is not limited as long as the overvoltage protection circuit 32 can release the pulse voltage output by the output terminal of the power supply 10.
Further, in order to reduce the risk of damage to the tested communication module, as shown in fig. 2, the protection circuit provided in this embodiment may further include: and an ESD (Electro-Static discharge) protection circuit connected to the switching circuit for preventing Static electricity in the circuit.
Specifically, for the specific circuit structure of the ESD protection circuit 33 in this embodiment, the specific circuit structure may be set by a designer, and the ESD protection circuit 33 may include: a TVS diode; the common end of the control switch 31 connected with the thimble of the clamp 20 is connected with the cathode of the TVS diode, and the anode of the TVS diode is grounded. That is, in this embodiment, the functions of overvoltage protection and ESD protection can be simultaneously realized through the setting of the TVS diode. As shown in fig. 4, the ESD protection circuit 33 may include 2 TVS diodes (TVS301 and TVS302) to discharge static electricity in a circuit connected thereto by using the TVS diodes.
Further, in order to reduce the risk of damage to the tested communication module, as shown in fig. 2, the protection circuit provided in this embodiment may further include: and an LC filter circuit 34 connected to the switching circuit for filtering voltage spikes in the n-way test output of the power supply 10. Specifically, the present embodiment does not limit the specific circuit structure of the LC filter circuit 34, for example, the LC filter circuit 34 may include an inductor and a capacitor; wherein, the control switch 31 is connected with the thimble of the clamp 20 through an inductor, the common end of the inductor connected with the thimble of the clamp 20 is connected with the first end of the capacitor, and the second end of the capacitor is grounded
Accordingly, when the number of the control switches 31 in the protection circuit is n, the overvoltage protection circuit 32 may include: n inductors and n capacitors, a first end of each inductor may be connected to the output end of the corresponding control switch 31, and a second end of each inductor may be connected to the positive input end of the power supply input end of the corresponding thimble, that is, the output end of each control switch 31 may be connected to the positive input end of the power supply input end of the corresponding thimble through a respective corresponding one of the inductors; the first end of each capacitor can be connected with the second end of the corresponding inductor, the second end of each capacitor is grounded, namely the first end of the ith capacitor is connected with the second end of the ith inductor, and i is more than 0 and less than or equal to n; as shown in fig. 4, the LC filter circuit 34 may include 2 inductors (L301 and L302) and 2 capacitors (C303 and C306).
Further, in order to reduce the live-line operation condition of the tested communication module and reduce the damage risk of the tested communication module, as shown in fig. 2, the protection circuit provided in this embodiment may further include: and the residual electricity DISCHARGE circuit 35 is connected with the switch circuit and used for discharging residual electric energy in the protection circuit after the upper clamping plate is lifted, for example, after the upper clamping plate of the clamp 20 in the figure 4 is lifted, a J301 does not have a pressing signal, a Q301 is disconnected, 2 pins of the Q301 do not have voltage output, and residual electricity in the circuit of the clamp 20 can be discharged from the DISCHARGE _1 and the DISCHARGE _2 (namely, the residual electricity DISCHARGE circuit 35).
Specifically, the specific circuit structure of the residual current discharging circuit 35 in this embodiment may be set by a designer, and the residual current discharging circuit 35 includes a switching device and a discharging circuit; wherein, the common end of the control switch 31 connected with the thimble of the clamp 20 is connected with the input end of the bleeder circuit through a switch device; the bleeder circuit may comprise a third resistor, a first terminal of the third resistor being connected as an input terminal of the bleeder circuit to the control switch 31 via the switching device, and a second terminal of the third resistor being connected to ground. Residual current drain circuit 35 may also include only a drain circuit. Accordingly, the bleeder circuit may further comprise a fourth resistor connected in parallel with the third resistor.
Correspondingly, when the number of the control switches 31 in the protection circuit is n, the residual current discharging circuit 35 may include a switching device, and n discharging circuits; wherein, the common end of each control switch 31 connected with the positive input of the power supply input end of the corresponding thimble is connected with the input end of a corresponding bleeder circuit through a switching device (for example, SW2 in fig. 4); each bleeder circuit comprises a third resistor (such as R303 or R304 in FIG. 4), a first end of the third resistor is connected with the corresponding control switch 31 as an input end of the bleeder circuit, and a second end of the third resistor is grounded; that is, in this embodiment, the on and off of the residual current discharging circuit 35 can be controlled by the setting of the switching device. The residual current discharging circuit 35 may only include n discharging circuits, as long as the residual current discharging circuit 35 can release the residual electric energy in the protection circuit after the upper board is lifted, which is not limited in this embodiment. Accordingly, as shown in fig. 4, each bleeder circuit may further comprise a fourth resistor (e.g., R307 or R308) connected in parallel with the third resistor.
Further, the control end of the switch device in this embodiment may be connected to the push-down signal output end of the upper clamp plate, and is configured to control the connection of the turn-off control switch 31 and the drain circuit when the push-down signal is detected; when the press-down signal is not detected, the connection between the conduction control switch 31 and the current leakage circuit is controlled to associate the start and stop of the residual current leakage circuit 35 with the press-down action of the upper clamping plate of the clamp 20, so that the automatic control of the switch device is realized, and the loss of electric energy is reduced.
Accordingly, as shown in fig. 4, the protection circuit provided in this embodiment may further include a filter capacitor (e.g., C301, C302, C304, and C305) connected to the control switch 31 for smoothing the output of the power supply 10; a first terminal of each filter capacitor may be connected to one terminal (e.g., an input terminal or an output terminal) of the corresponding control switch 31, and a second terminal of each filter capacitor is grounded.
In the embodiment of the utility model, the power supply of the tested communication module is controlled and protected by setting the control switch 31 in the protection circuit, so that the on-off control of the electrical connection between the output of the power supply 10 and the tested communication module can be associated with the pressing action of the upper clamping plate of the clamp 20, the damage risk of the communication module during testing is reduced, and the damage rate of the communication module is reduced.
The above describes the testing device of a communication module provided by the present invention in detail. The principles and embodiments of the present invention are explained herein using specific examples, which are presented only to assist in understanding the method and its core concepts. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
Claims (7)
1. A test apparatus for a communication module, comprising:
a power source;
the clamp comprises an upper clamping plate and a lower clamping plate, wherein the lower clamping plate is provided with an upward thimble;
a protection circuit including a control switch; the input end of the protection circuit is connected with the output end of the power supply, and the output end of the protection circuit is connected with the thimble of the clamp;
when the upper clamping plate is pressed downwards, the control switch is conducted, so that the power supply is electrically connected with the communication module to be tested through the ejector pin of the clamp to supply power to the communication module to be tested; and when the upper clamping plate is lifted, the control switch is turned off, so that the power supply is electrically disconnected with the tested communication module.
2. The testing device of the communication module according to claim 1, wherein the protection circuit further comprises any one or more of an overvoltage protection circuit, an ESD protection circuit, an LC filter circuit and a residual current discharge circuit; the overvoltage protection circuit, the ESD protection circuit or the LC filter circuit are connected with the control switch in series, and the residual current discharge circuit is connected with the control switch in parallel.
3. The testing device of the communication module according to claim 1, wherein the control switch comprises a PMOS transistor, a first resistor, a second resistor, a diode, and a push-down signal control device;
the source electrode of the PMOS tube is connected with the grid electrode of the PMOS tube through the first resistor, the common end of the source electrode of the PMOS tube, which is connected with the first resistor, is connected with the output end of the power supply, the drain electrode of the PMOS tube is connected with the thimble of the clamp, the common end of the grid electrode of the PMOS tube, which is connected with the first resistor, is connected with the anode of the diode through the second resistor, the cathode of the diode is connected with the first input end of the push-down signal control device, and the second input end of the push-down signal control device is grounded;
the control end of the pressing signal control device is connected with the pressing signal output end of the upper clamping plate and is used for controlling the connection and conduction of the first input end and the second input end of the pressing signal control device when a pressing signal is detected so as to conduct the PMOS tube; and when the press-down signal is not detected, controlling the connection of the first input end and the second input end to be switched off so as to switch off the PMOS tube.
4. The testing apparatus of claim 2, wherein when the protection circuit comprises the residual current discharging circuit, the residual current discharging circuit comprises a switching device and a discharging circuit;
the common end of the control switch connected with the thimble of the clamp is connected with the input end of the bleeder circuit through the switch device; the bleeder circuit comprises a third resistor, a first end of the third resistor is used as an input end of the bleeder circuit and is connected with the control switch through the switching device, and a second end of the third resistor is grounded.
5. The testing device of the communication module as claimed in claim 4, wherein the control terminal of the switch device is connected to the push-down signal output terminal of the upper clamp plate, for controlling to turn off the connection of the control switch and the leakage circuit when the push-down signal is detected; and when the press-down signal is not detected, controlling to conduct the connection between the control switch and the drain circuit.
6. The testing device of claim 2, wherein when the protection circuit comprises the over-voltage protection circuit or the ESD protection circuit, the over-voltage protection circuit or the ESD protection circuit comprises: a TVS diode;
the common end of the control switch connected with the thimble of the clamp is connected with the cathode of the TVS diode, and the anode of the TVS diode is grounded.
7. The testing device of claim 2, wherein when the protection circuit comprises the LC filter circuit, the LC filter circuit comprises: an inductor and a capacitor;
the control switch is connected with the ejector pin of the clamp through the inductor, the common end of the inductor connected with the ejector pin of the clamp is connected with the first end of the capacitor, and the second end of the capacitor is grounded.
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| CN202121832224.0U CN215601324U (en) | 2021-08-06 | 2021-08-06 | Testing device of communication module |
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| CN202121832224.0U CN215601324U (en) | 2021-08-06 | 2021-08-06 | Testing device of communication module |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113507400A (en) * | 2021-08-06 | 2021-10-15 | 深圳市广和通无线股份有限公司 | Testing device and method for communication module |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113507400A (en) * | 2021-08-06 | 2021-10-15 | 深圳市广和通无线股份有限公司 | Testing device and method for communication module |
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