CN215493719U

CN215493719U - Vacuum tester for semiconductor

Info

Publication number: CN215493719U
Application number: CN202121805159.2U
Authority: CN
Inventors: 刘国清; 胡旭伟
Original assignee: Hangzhou Bigeng Automation Equipment Co ltd
Current assignee: Hangzhou Bigeng Automation Equipment Co ltd
Priority date: 2021-08-04
Filing date: 2021-08-04
Publication date: 2022-01-11
Anticipated expiration: 2031-08-04

Abstract

The utility model discloses a vacuum tester for semiconductors, which comprises a portable box and a test piece, wherein a clamping mechanism is arranged at the front part of the right side of the upper surface of the test piece, the clamping mechanism comprises a fixed box seat and an adjusting disc, the bottom of the fixed box seat is rotatably connected with the adjusting disc, a plurality of groups of sliding seats are arranged in the fixed box seat, a first spring is fixedly connected between the sliding seats and the fixed box seat, and a plurality of groups of limiting sliding grooves are formed in the upper surface and the lower surface of the fixed box seat. This vacuum test meter to semiconductor drives the adjustment disk through rotating the handspike and rotates to make the arc channel drive the slide that the push rod is connected and move to the outside, place the semiconductor that awaits measuring, first spring promotes the slide and moves to the inboard, makes the cassette block the semiconductor, presses the seat to support through rotating and presses on the upper portion of semiconductor, makes the semiconductor that awaits measuring fixed stable, is applicable to the product of different dimensions, can reduce the cost, convenient operation and use.

Description

Vacuum tester for semiconductor

Technical Field

The utility model relates to the technical field of semiconductor detection, in particular to a vacuum tester for a semiconductor.

Background

With the development of technology, the functions of chips become more and more complex, and semiconductor testing of integrated circuits or chips is necessary at different stages of the manufacturing process to ensure the functions.

In the existing semiconductor testing instrument, a testing device with a corresponding size is basically manufactured according to the size requirement of a semiconductor to be actually detected, if the semiconductor of other models needs to be tested, the testing device needs to be manufactured again, on one hand, the testing cost is increased, on the other hand, the detection efficiency can be greatly reduced, and in the carrying and transporting process of the existing testing instrument, internal elements are easy to damage, and the service life of equipment is shortened.

SUMMERY OF THE UTILITY MODEL

Aiming at the defects of the prior art, the utility model provides a vacuum tester for a semiconductor, which solves the problems that the cost is increased, the detection efficiency is reduced and internal elements of the tester are easily damaged in the carrying and transporting process because the conventional semiconductor tester is not suitable for testing products with different sizes and specifications.

In order to achieve the purpose, the utility model is realized by the following technical scheme: a vacuum tester for semiconductor comprises a portable box and a test piece, wherein a clamping mechanism is arranged at the front part of the right side of the upper surface of the test piece, the clamping mechanism comprises a fixed box seat and an adjusting disc, the bottom of the fixed box seat is rotationally connected with the adjusting disc, a plurality of groups of sliding seats are arranged in the fixed box seat, and a first spring is fixedly connected between the sliding seat and the fixed box seat, a plurality of groups of limiting sliding grooves are arranged on the upper and lower surfaces of the fixed box seat, the upper part and the lower part of the sliding seat are respectively fixedly connected with a clamping seat and a push rod, the clamping seat and the push rod respectively penetrate through the limiting sliding grooves on the upper side surface and the lower side surface of the fixed box seat, the clamping seat and the push rod are respectively connected with the limiting sliding chutes on the upper side surface and the lower side surface of the fixed box seat in a sliding way, the upper part of the clamping seat is rotationally connected with a pressing seat, a plurality of groups of arc-shaped channels are formed in the surface of the adjusting disc, and the bottom end of the push rod penetrates through the arc-shaped channels.

Preferably, the rear part of the adjusting disc is fixedly connected with a connecting rod, and the upper part of the rear end of the connecting rod is fixedly connected with a hand push rod.

Preferably, the rear portion on the right side of the upper surface of the test piece is provided with a push rod arc-shaped groove, the upper end of the hand push rod penetrates through the push rod arc-shaped groove, and the hand push rod is connected with the push rod arc-shaped groove in a sliding mode.

Preferably, the right side of the upper surface of the test piece is provided with a display control mechanism, and the display control mechanism comprises a display panel and a key.

Preferably, the two sides of the test piece are connected with the left side and the right side of the inner cavity of the portable box in a sliding mode through sliding groups, and a second spring is fixedly connected between the bottom of the test piece and the bottom of the inner cavity of the portable box.

Preferably, the portable case comprises a case body and a case cover, the upper part of the case body is hinged with the case cover, and the center of the upper surface of the case cover is hinged with a handle.

Advantageous effects

The utility model provides a vacuum tester for a semiconductor. Compared with the prior art, the method has the following beneficial effects:

(1) the vacuum tester for the semiconductor is characterized in that the bottom of a fixed box seat is rotatably connected with an adjusting disc, a first spring is fixedly connected between a sliding seat and the fixed box seat, a clamping seat and a push rod respectively penetrate through limiting sliding grooves on the upper surface and the lower surface of the fixed box seat, the clamping seat and the push rod are respectively in sliding connection with the limiting sliding grooves on the upper surface and the lower surface of the fixed box seat, the upper part of the clamping seat is rotatably connected with a pressing seat, the surface of the adjusting disc is provided with a plurality of groups of arc-shaped channels, the bottom end of the push rod penetrates through the arc-shaped channels, the upper part at the rear end of a connecting rod is fixedly connected with a hand push rod, the adjusting disc is driven to rotate by rotating the hand push rod, so that the sliding seat connected with the push rod is driven to move outwards by the arc-shaped channels, the semiconductor to be tested is placed, the first spring pushes the sliding seat to move inwards, the clamping seat clamps the semiconductor, and is supported on the upper part of the semiconductor by rotating the pressing seat, the semiconductor to be tested is fixed stably, can be suitable for products with different sizes and specifications, can reduce the cost and is convenient to operate and use.

(2) This vacuum test meter to semiconductor, left and right sides sliding connection through sliding group and portable box inner chamber is passed through in the both sides of test piece, fixedly connected with second spring between the bottom of test piece and the bottom of portable box inner chamber, portable box includes box and case lid, the upper portion and the case lid of box are articulated, the center of case lid upper surface articulates there is the handle, it is stable at box upper portion and hasp with the case lid, get handle department through carrying, can carry, the second spring cushions the test piece, reduce the jolt of test piece and shake, reduce the damage rate of instrument, improve equipment's life.

Drawings

FIG. 1 is a perspective view of the present invention in an expanded configuration;

FIG. 2 is a perspective view of the present invention in a closed position;

FIG. 3 is a perspective view of the latch mechanism of the present invention;

FIG. 4 is a bottom sectional view of the fixed base of the present invention;

FIG. 5 is a top view of the structure of the conditioning disk of the present invention;

fig. 6 is a structural sectional view showing the developed state of the present invention.

In the figure: 1. a portable case; 11. a box body; 12. a box cover; 2. testing the piece; 21. a push rod arc-shaped groove; 3. a clamping mechanism; 31. fixing a box seat; 311. a slide base; 312. a limiting chute; 313. a card holder; 314. a push rod; 315. a first spring; 316. pressing a base; 32. an adjusting disk; 321. an arc-shaped channel; 322. a connecting rod; 323. a handspike; 4. a display control mechanism; 41. a display panel; 42. pressing a key; 5. a sliding group; 6. a second spring.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1-6, the present invention provides a technical solution: a vacuum tester for semiconductor comprises a portable box 1 and a test piece 2, two sides of the test piece 2 are connected with the left side and the right side of the inner cavity of the portable box 1 in a sliding way through a sliding group 5, a second spring 6 is fixedly connected between the bottom of the test piece 2 and the bottom of the inner cavity of the portable box 1, the portable box 1 comprises a box body 11 and a box cover 12, the upper part of the box body 11 is hinged with the box cover 12, the center of the upper surface of the box cover 12 is hinged with a handle 121, the box cover 12 is covered on the upper part of the box body 11 and is locked stably, the portable tester can be carried by lifting the handle 121, the second spring 6 buffers the test piece 2, the jolt of the test piece 2 is reduced, the damage rate of the tester is reduced, the service life of the device is prolonged, a clamping mechanism 3 is arranged at the front part of the right side of the upper surface of the test piece 2, a display and control mechanism 4 is arranged at the right side of the upper surface of the test piece 2, the display and control mechanism 4 comprises a display panel 41 and a key 42, the clamping mechanism 3 comprises a fixed box seat 31 and an adjusting disk 32, the bottom of the fixed box seat 31 is rotatably connected with the adjusting disk 32, a plurality of groups of sliding seats 311 are arranged in the fixed box seat 31, a first spring 315 is fixedly connected between the sliding seats 311 and the fixed box seat 31, a plurality of groups of limiting sliding chutes 312 are respectively arranged on the upper and lower surfaces of the fixed box seat 31, the upper and lower parts of the sliding seats 311 are respectively and fixedly connected with a clamping seat 313 and a push rod 314, the clamping seat 313 and the push rod 314 respectively penetrate through the limiting sliding chutes 312 on the upper and lower side surfaces of the fixed box seat 31, the clamping seat 313 and the push rod 314 are respectively and slidably connected with the limiting sliding chutes 312 on the upper and lower side surfaces of the fixed box seat 31, the upper part of the clamping seat 313 is rotatably connected with a pressing seat 316, a plurality of groups of arc-shaped grooves 321 are arranged on the surface of the adjusting disk 32, the bottom end of the push rod 314 penetrates through the arc-shaped grooves 321, a connecting rod 322 is fixedly connected with the rear part of the adjusting disk 32, and a hand push rod 323 is fixedly connected with the upper part of the rear end of the connecting rod 322, the rear portion on test piece 2 upper surface right side is equipped with push rod arc wall 21, the upper end of handspike 323 runs through in push rod arc wall 21 department, and handspike 323 and push rod arc wall 21 sliding connection, it rotates to drive adjusting disk 32 through rotating handspike 323, thereby make arc channel 321 drive the slide 311 that push rod 314 connects and move to the outside, place the semiconductor that awaits measuring, first spring 315 promotes slide 311 and moves to the inside, make cassette 313 block the semiconductor, press seat 316 to support on the upper portion of semiconductor through rotating, it is fixed stable to make the semiconductor that awaits measuring, can be applicable to the product of different dimensions, can reduce the cost, convenient operation and use.

And those not described in detail in this specification are well within the skill of those in the art.

When the device is used, the adjusting disc 32 is driven to rotate by rotating the hand push rod 323, so that the arc-shaped channel 321 drives the sliding seat 311 connected with the push rod 314 to move outwards, then a semiconductor to be tested is placed on the position of the limiting sliding groove 312, the sliding seat 311 is pushed to move inwards by the first spring 315, the semiconductor is clamped by the clamping seat 313, and then the semiconductor to be tested is pressed on the upper part of the semiconductor by the rotating pressing seat 316, so that the semiconductor to be tested is fixed stably;

when carrying, it is stable to cover case lid 12 on 11 upper portions of box and hasp, through carrying and get handle 121 department, can carry, carries the in-process, and second spring 6 cushions test piece 2, reduces the jolt of test piece 2 and shakes.

It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.

Claims

1. A vacuum tester for semiconductors, comprising a portable case (1) and a test piece (2), characterized in that: the clamping mechanism (3) is arranged at the front part of the right side of the upper surface of the test piece (2), the clamping mechanism (3) comprises a fixed box seat (31) and an adjusting disc (32), the bottom of the fixed box seat (31) is rotatably connected with the adjusting disc (32), a plurality of groups of sliding seats (311) are arranged inside the fixed box seat (31), a first spring (315) is fixedly connected between the sliding seats (311) and the fixed box seat (31), a plurality of groups of limiting sliding chutes (312) are respectively formed in the upper surface and the lower surface of the fixed box seat (31), clamping seats (313) and push rods (314) are respectively and fixedly connected with the upper part and the lower part of the sliding seats (311), the clamping seats (313) and the push rods (314) respectively penetrate through the limiting sliding chutes (312) on the upper surface and the lower surface of the fixed box seat (31), and the clamping seats (313) and the push rods (314) are respectively and slidably connected with the limiting sliding chutes (312) on the upper surface and the lower surface of the fixed box seat (31), the upper part of the clamping seat (313) is rotatably connected with a pressing seat (316), the surface of the adjusting disc (32) is provided with a plurality of groups of arc-shaped channels (321), and the bottom end of the push rod (314) penetrates through the arc-shaped channels (321).

2. A vacuum test meter for semiconductors as recited in claim 1, wherein: the rear part of the adjusting disc (32) is fixedly connected with a connecting rod (322), and the upper part of the rear end of the connecting rod (322) is fixedly connected with a hand push rod (323).

3. A vacuum test meter for semiconductors as recited in claim 2, wherein: the rear portion on the right side of the upper surface of the test piece (2) is provided with a push rod arc-shaped groove (21), the upper end of the hand push rod (323) penetrates through the push rod arc-shaped groove (21), and the hand push rod (323) is connected with the push rod arc-shaped groove (21) in a sliding mode.

4. A vacuum test meter for semiconductors as recited in claim 1, wherein: the right side of test piece (2) upper surface is equipped with and shows accuse mechanism (4), show accuse mechanism (4) including display panel (41) and button (42).

5. A vacuum test meter for semiconductors as recited in claim 1, wherein: the both sides of test piece (2) are through sliding group (5) and the left and right sides sliding connection of portable case (1) inner chamber, fixedly connected with second spring (6) between the bottom of test piece (2) and the bottom of portable case (1) inner chamber.

6. A vacuum test meter for semiconductors as recited in claim 1, wherein: the portable box (1) comprises a box body (11) and a box cover (12), wherein the upper part of the box body (11) is hinged with the box cover (12), and a handle (121) is hinged to the center of the upper surface of the box cover (12).